CN113588094A - High-low temperature comprehensive infrared test system - Google Patents
High-low temperature comprehensive infrared test system Download PDFInfo
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- CN113588094A CN113588094A CN202110932038.2A CN202110932038A CN113588094A CN 113588094 A CN113588094 A CN 113588094A CN 202110932038 A CN202110932038 A CN 202110932038A CN 113588094 A CN113588094 A CN 113588094A
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- 238000012360 testing method Methods 0.000 title claims abstract description 62
- 230000005457 Black-body radiation Effects 0.000 claims abstract description 34
- 238000000034 method Methods 0.000 claims abstract description 14
- 230000033001 locomotion Effects 0.000 claims abstract description 12
- 230000003287 optical effect Effects 0.000 claims abstract description 5
- 239000002184 metal Substances 0.000 claims description 16
- 239000000523 sample Substances 0.000 claims description 9
- 230000005855 radiation Effects 0.000 claims description 8
- 230000003014 reinforcing effect Effects 0.000 claims description 8
- 238000012544 monitoring process Methods 0.000 claims description 3
- 230000008054 signal transmission Effects 0.000 claims description 3
- 238000003384 imaging method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000017525 heat dissipation Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000036760 body temperature Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Abstract
The application discloses high-low temperature comprehensive infrared test system relates to the optical test field. The blackbody temperature control device comprises a supporting device, a driving device, a blackbody radiation source, a controller and a blackbody temperature control system, and has the advantages of simple structure and low cost. This application is supported and is fixed through strutting arrangement. The controller controls the driving device to move, so as to drive the blackbody radiation source to rotate and enable the blackbody radiation source to have different positions and movement speeds. And controlling and feeding back the temperature parameters of the blackbody radiation source through a blackbody temperature control system. Through the structure, the infrared detector is used in the high-low temperature test process, a moving target can be simulated, the target temperature can be accurately adjusted, and the high-low temperature test of the infrared detector is realized.
Description
Technical Field
The application relates to the field of optical testing, in particular to a high-low temperature comprehensive infrared testing system.
Background
The infrared detector can react to the received heat radiation and convert the heat radiation into an electric signal to output, and is widely applied to a plurality of fields of industry, military, scientific research and the like. In order to ensure that the infrared detector can still work normally under different temperature environments, the infrared detector needs to be tested under high-temperature, low-temperature and temperature impact environments, and relevant data is acquired to evaluate the influence of the high-temperature, low-temperature and temperature impact conditions on the safety, integrity and performance of the infrared detector. Currently, high and low temperature comprehensive infrared tests are performed by using a high and low temperature chamber.
Since high and low temperature chambers are expensive, micro-enterprises cannot afford to bear high testing costs. Therefore, the detection system in the high and low temperature test process of the micro enterprise cannot check the imaging of the infrared detector in the high and low temperature test process.
Therefore, it is highly desirable to develop a comprehensive infrared testing system with high and low temperature, which is inexpensive, can be used in the high and low temperature testing process, can simulate a moving target, and can precisely adjust the target temperature.
Disclosure of Invention
It is an object of the present application to overcome the above problems or to at least partially solve or mitigate the above problems.
The application provides a high low temperature synthesizes infrared test system for test infrared detector includes:
the supporting device is used for being fixed on the test platform and supporting and fixing the high-low temperature comprehensive infrared test system;
the driving device is fixed on the supporting device and comprises a motor for providing rotary power, and the motor is provided with a motor shaft;
the blackbody radiation source is fixed on the driving device and configured to do circular motion by taking the axis of the motor shaft as the center of a circle, so that the blackbody radiation source has adjustable position and motion speed;
the controller is connected with the motor and is configured to control the motor to move so as to control the position and the moving speed of the blackbody radiation source; and
and the blackbody temperature control system is connected with the blackbody radiation source and is configured to control and feed back the temperature parameters of the blackbody radiation source.
Optionally, the motor is fixed to the supporting device, a hollow metal tube is provided at a central position of the motor, and the driving device further includes:
the rocker arm adapter sleeve is fixedly connected with the hollow metal tube of the motor and can rotate along with the motor shaft;
the rocker arm is fixedly connected with the rocker arm adapter sleeve, and one end of the rocker arm is fixedly connected with the black body radiation source;
when the motor works, the hollow metal pipe of the motor rotates along with the motor shaft to drive the rocker arm adapter sleeve and the rocker arm to rotate together.
Optionally, the driving device further comprises:
the central supporting tube penetrates through a hollow metal tube of the motor;
a holding sleeve for holding the central supporting tube and fixed on the supporting device,
and the conductive slip ring is fixed on the rocker arm switching sleeve, and a lead of the conductive slip ring is led out from the central supporting tube, so that power and signal transmission are not influenced when the hollow metal tube of the motor and the rocker arm rotate.
Optionally, the driving device further comprises an adjusting counterweight fixed at the other end of the rocker arm, and the weights at the two ends of the rocker arm are balanced by adjusting the weight of the counterweight, so that when the motor stops, the rocker arm stops swinging, and the rotating circumferential position of the black body emission source is adjustable when the black body emission source performs circular motion along with the rocker arm by taking the axis of the motor shaft as the center of a circle.
Optionally, the blackbody radiation source comprises:
the black body is fixed on the driving device and used for emitting infrared radiation;
and the lens is arranged at the black body and is configured to receive the infrared radiation emitted by the black body in a form of parallel light incidence by the infrared detector.
Optionally, the lens is an optical athermalization lens.
Optionally, the blackbody temperature control system comprises:
a Peltier mounted on the black body for changing a temperature of the black body;
the temperature measuring probe is arranged on the black body and used for monitoring and feeding back the temperature of the black body to the adjusting module;
the adjusting module is configured to receive and process the temperature signal fed back by the temperature measuring probe, so as to control the direction and the magnitude of the input Peltier current and control the temperature of the Peltier, thereby controlling the temperature of the black body;
the heat dissipation device comprises a heat dissipation sheet and a fan, wherein the heat dissipation sheet is fixed on the Peltier, and the fan is fixed on the heat dissipation sheet and used for dissipating heat.
Optionally, the controller comprises:
the control panel is used for displaying a control state;
and the driver is connected with the motor so as to control the rotating speed and the direction of the motor.
Optionally, the support device comprises:
the bottom plate support is used for being arranged on the test platform;
and the vertical support is fixed on the bottom plate support and used for mounting the driving device.
Optionally, the supporting device further comprises a reinforcing block supported between the floor support and the vertical support for reinforcing the connection of the floor support and the vertical support.
The high-low temperature comprehensive infrared test system comprises a supporting device, a driving device, a blackbody radiation source, a controller and a blackbody temperature control system, and therefore the high-low temperature comprehensive infrared test system has the advantages of being simple in structure and low in cost. This application is supported and is fixed through strutting arrangement. The controller controls the driving device to move, so as to drive the blackbody radiation source to rotate and enable the blackbody radiation source to have different positions and movement speeds. And controlling and feeding back the temperature parameters of the blackbody radiation source through a blackbody temperature control system. Through the structure, the infrared detector is used in the high-low temperature test process, a moving target can be simulated, the target temperature can be accurately adjusted, and the high-low temperature test of the infrared detector is realized. The problem that the imaging of the infrared detector cannot be checked in the high-low temperature test process of a detection system in the high-low temperature test process of a micro enterprise is solved.
The above and other objects, advantages and features of the present application will become more apparent to those skilled in the art from the following detailed description of specific embodiments thereof, taken in conjunction with the accompanying drawings.
Drawings
Some specific embodiments of the present application will be described in detail hereinafter by way of illustration and not limitation with reference to the accompanying drawings. The same reference numbers in the drawings identify the same or similar elements or components. Those skilled in the art will appreciate that the drawings are not necessarily drawn to scale. In the drawings:
FIG. 1 is a schematic block diagram of a high and low temperature integrated infrared test system according to one embodiment of the present application;
FIG. 2 is a schematic cross-sectional view taken along section line A-A in FIG. 1;
fig. 3 is a schematic block diagram of the controller of fig. 1.
The reference numerals in the figures denote the following:
1 supporting device, 11 bottom plate supporting, 12 vertical supporting, 13 reinforcing blocks,
2 driving device, 21 central supporting tube, 22 motor, 221 hollow metal tube, 23 conductive slip ring, 24 rocker arm adapter sleeve, 25 rocker arm, 26 holding sleeve, 27 adjusting counterweight,
a 3 blackbody radiation source, 31 blackbody, 32 lens,
4 controllers, 41 control panels, 42 drivers,
5 black body temperature control system, 51 Peltier, 52 temperature measuring probe, 53 adjusting module, 54 radiating fins and 55 fan.
Detailed Description
FIG. 1 is a schematic block diagram of a high and low temperature integrated infrared test system according to one embodiment of the present application. Fig. 2 is a schematic cross-sectional view taken along a sectional line a-a in fig. 1.
Referring to fig. 1 and also to fig. 2, the present embodiment provides a high and low temperature integrated infrared testing system for testing an infrared detector, which may generally include: the blackbody temperature control device comprises a supporting device 1, a driving device 2, a blackbody radiation source 3, a controller 4 and a blackbody temperature control system 5. The supporting device 1 is used for being fixed on a test platform and used for supporting and fixing the high-low temperature comprehensive infrared test system. The driving device 2 is used for being fixed on the supporting device 1. The drive means 2 comprise a motor 22 for providing rotational power. The motor 22 has a motor shaft. The blackbody radiation source 3 is fixed on the driving device 2 and configured to perform circular motion by taking the axis of the motor shaft as the center of a circle, so that the blackbody radiation source 3 has adjustable position and movement speed. The controller 4 is connected to the motor 22 and configured to control the movement of the motor 22, and thus the position and the moving speed of the blackbody radiation source 3. The blackbody temperature control system 5 is connected to the blackbody radiation source 3 and configured to control and feed back temperature parameters of the blackbody radiation source 3.
The high-low temperature comprehensive infrared test system is simple in structure, and therefore the high-low temperature comprehensive infrared test system has the advantage of being low in price. The present application is supported and fixed by the support device 1. The controller 4 controls the driving device 2 to move, so as to drive the blackbody radiation source 3 to rotate and enable the blackbody radiation source to have different positions and moving speeds. The temperature parameters of the blackbody radiation source 3 are controlled and fed back by the blackbody temperature control system 5. Through the structure, the infrared detector is used in the high-low temperature test process, a moving target can be simulated, the target temperature can be accurately adjusted, and the high-low temperature test of the infrared detector is realized. The problem that the imaging of the detector cannot be checked in the high-low temperature test process of a detection system in the high-low temperature test process of a micro enterprise is solved.
Specifically, as shown in fig. 1, the support device 1 includes: a floor support 11, a vertical support 12 and a reinforcing block 13. The base support 11 is for mounting on a test platform. The bottom plate support 11 is provided with a through hole for fixing a test system. A vertical support 12 is fixed to the floor support 11 for mounting the drive means 2. A reinforcing block 13 is supported between the floor support 11 and the vertical support 12 for reinforcing the connection of the floor support 11 and the vertical support 12.
Specifically, as shown in fig. 1 and also see fig. 2, the motor 22 is fixed on the supporting device 1, and a hollow metal pipe 221 is provided at the center of the motor 22. Preferably, the motor 22 is a hollow stepper motor. Through high and low temperature tests, the selected hollow stepping motor can work normally within the range of minus 40 ℃ to 70 ℃. The drive device 2 further includes: the rocker arm adapter sleeve 24, the rocker arm 25, the central support tube 21, the embracing sleeve 26, the conductive slip ring 23 and the adjusting counterweight 27. The rocker arm adapter sleeve 24 is fixedly connected with the hollow metal tube 221 of the motor 22 and can rotate along with the motor shaft. The rocker arm 25 is fixedly connected with the rocker arm adapter sleeve 24, and one end of the rocker arm 25 is fixedly connected with the blackbody radiation source 3. When the motor 22 works, the hollow metal pipe 221 of the motor 22 rotates along with the motor shaft to drive the rocker arm adapter sleeve 24 and the rocker arm 25 to rotate together. The central support tube 21 passes through the hollow metal tube 221 of the motor 22. The clasping sleeve 26 clasps the central support tube 21 and is fixed on the support device 1. The conductive slip ring 23 is fixed on the rocker arm adapter sleeve 24, and a lead of the conductive slip ring 23 is led out from the central support tube 21, so that power and signal transmission are not influenced when the hollow metal tube 221 of the motor 22 and the rocker arm 25 rotate. The adjusting counterweight 27 is fixed at the other end of the rocker arm 25, and the weights at the two ends of the rocker arm 25 are balanced by adjusting the weight of the counterweight 27, so that the stop position of the rocker arm 25 is controllable, namely, when the motor 22 stops, the rocker arm 25 also stops swinging, and further, the rotating circumferential position of the black body emission source along with the rocker arm 25 when the black body emission source performs circular motion by taking the axis of the motor shaft as the center of a circle is adjustable.
Specifically, as shown in fig. 1, the blackbody radiation source 3 includes: a black body 31 and a lens 32. A black body 31 is fixed to the driving device 2 for emitting infrared radiation. The lens 32 is installed at the black body 31 and configured to receive the infrared radiation emitted from the black body 31 as parallel light incident on the infrared detector, providing a condition for the detector to closely observe a target. Preferably, the lens 32 is an optical athermal lens, which can ensure that the infrared detector can clearly image the black body 31 even under high and low temperature conditions.
Specifically, as shown in fig. 1, the blackbody temperature control system 5 includes: peltier 51, temperature probe 52, adjusting module 53, cooling fin 54 and fan 55. A peltier 51 is mounted on the black body 31 for changing the temperature of the black body 31. The temperature measuring probe 52 is installed on the black body 31 and used for monitoring and feeding back the temperature of the black body 31 to the adjusting module 53. The adjusting module 53 is configured to receive the temperature signal fed back by the temperature probe 52 and process the temperature signal, so as to control the direction and magnitude of the input peltier 51 current, and control the temperature of the peltier 51, and thus the temperature of the black body 31. The heat sink 54 is fixed to the peltier element 51, the fan 55 is fixed to the heat sink 54, and both the heat sink 54 and the fan 55 are used for dissipating heat from the peltier element 51. Through high and low temperature tests, the fan 55, the Peltier 51 and the temperature measuring probe 52 work normally within the range of minus 40 ℃ to 70 ℃.
Fig. 3 is a schematic block diagram of the controller of fig. 1. The controller 4 includes: a control panel 41 and a driver 42. The control panel 41 is used to display the control state. The driver 42 is connected to the motor 22 to control the rotation direction and speed of the motor 22 and stop. The motor 22 can normally operate in a high-temperature and low-temperature state through a high-temperature and low-temperature test.
More specifically, the testing method of the high and low temperature infrared testing system described in this embodiment includes the following steps:
step 100
The blackbody temperature control system 5 is powered up but the drive means 2 is not powered. The position of the infrared detector is fixed, the distance between a high-temperature and low-temperature infrared testing system (hereinafter referred to as a testing system) and the infrared detector is adjusted, so that the infrared detector can image clearly, and the positions of the testing system and the infrared detector are fixed, and the focal length of a lens is adjusted, so that the infrared detector can image clearly.
Step 200
In the high-low temperature test process, the temperature of the black body 31 can be changed through the black body temperature control system 5, and the imaging conditions of different temperature targets of the infrared detector are examined. The driving device 2 supplies power, the position or the moving speed of the black body 31 is changed through the driving state, and the imaging condition of the infrared detector on the moving target is examined.
It is to be noted that, unless otherwise specified, technical or scientific terms used herein shall have the ordinary meaning as understood by those skilled in the art to which this application belongs.
In the description of the present application, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present application and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the present application.
Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. In the description of the present application, "a plurality" means two or more unless specifically defined otherwise.
In this application, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can include, for example, fixed connections, removable connections, or integral parts; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
The above description is only for the preferred embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A high and low temperature comprehensive infrared test system is used for testing an infrared detector and is characterized by comprising:
the supporting device (1) is fixed on the test platform and used for supporting and fixing the high-low temperature comprehensive infrared test system;
a drive means (2) for securing to said support means, comprising a motor (22) for providing rotary power, the motor having a motor shaft;
the blackbody radiation source (3) is fixed on the driving device and is configured to do circular motion by taking the axis of the motor shaft as the center of a circle, so that the blackbody radiation source has adjustable position and motion speed;
the controller (4) is connected with the motor and is configured to control the motor to move so as to control the position and the moving speed of the blackbody radiation source; and
and the blackbody temperature control system (5) is connected with the blackbody radiation source and is configured to control and feed back the temperature parameters of the blackbody radiation source.
2. The integrated infrared testing system of claim 1, wherein the motor is fixed on the supporting device, a hollow metal tube (221) is provided at a central position of the motor, and the driving device further comprises:
the rocker arm adapter sleeve (24) is fixedly connected with the hollow metal tube of the motor and can rotate along with the motor shaft;
the rocker arm (25) is fixedly connected with the rocker arm adapter sleeve, and one end of the rocker arm is fixedly connected with the black body radiation source;
when the motor works, the hollow metal pipe of the motor rotates along with the motor shaft to drive the rocker arm adapter sleeve and the rocker arm to rotate together.
3. The high and low temperature integrated infrared test system of claim 2, wherein the driving device further comprises:
a central support tube (21) passing through the hollow metal tube of the motor;
a holding sleeve (26) which holds the central supporting tube and is fixed on the supporting device,
and the conductive slip ring (23) is fixed on the rocker arm adapter sleeve, and a lead of the conductive slip ring is led out from the central supporting tube (21), so that power and signal transmission are not influenced when the hollow metal tube of the motor and the rocker arm rotate.
4. The high-low temperature comprehensive infrared test system according to claim 3, wherein the driving device further comprises an adjusting counterweight (27) fixed at the other end of the rocker arm, and the weight at the two ends of the rocker arm is balanced by adjusting the weight of the counterweight, so that when the motor (22) stops, the rocker arm stops swinging, and further, the rotating circumferential position of the black body emission source along with the rocker arm when the black body emission source makes a circular motion with the axis of the motor shaft as the center of circle is adjustable.
5. High and low temperature integrated infrared test system according to claim 1, characterized in that the blackbody radiation source (3) comprises:
a black body (31) fixed to the driving device for emitting infrared radiation;
and a lens (32) mounted at the black body and configured to receive infrared radiation emitted by the black body as parallel light incident on the infrared detector.
6. The high and low temperature comprehensive infrared test system of claim 5, wherein the lens is an optical athermalization lens.
7. The high and low temperature integrated infrared test system of claim 5, wherein the blackbody temperature control system comprises:
a Peltier (51) mounted on the black body for changing a temperature of the black body;
the temperature measuring probe (52) is arranged on the black body and used for monitoring and feeding back the temperature of the black body to the adjusting module (53);
the adjusting module (53) is configured to receive and process the temperature signal fed back by the temperature measuring probe, so as to control the direction and the magnitude of the input Peltier current and control the temperature of the Peltier, thereby controlling the temperature of the black body;
a heat sink (54) fixed to the Peltier, and a fan (55) fixed to the heat sink for dissipating heat.
8. The high-low temperature comprehensive infrared test system according to claim 1, wherein the controller (4) comprises:
a control panel (41) for displaying a control state;
a driver (42) coupled to the motor to control the speed and direction of the motor.
9. The high and low temperature integrated infrared test system of any one of claims 1 to 8, wherein the support means comprises:
a base plate support (11) for mounting on a test platform;
and the vertical support (12) is fixed on the bottom plate support and used for mounting the driving device.
10. The integrated high and low temperature infrared test system as set forth in claim 9, wherein said support means further comprises a reinforcing block (13) supported between said floor support and said vertical support for reinforcing the connection of said floor support and said vertical support.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110932038.2A CN113588094A (en) | 2021-08-13 | 2021-08-13 | High-low temperature comprehensive infrared test system |
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| CN202110932038.2A CN113588094A (en) | 2021-08-13 | 2021-08-13 | High-low temperature comprehensive infrared test system |
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| KR20100124150A (en) * | 2009-05-18 | 2010-11-26 | 한국광기술원 | Infrared ray detector inspection equipment |
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