CN113570550A - Gold wire bonding size detection method based on three-dimensional point cloud - Google Patents
Gold wire bonding size detection method based on three-dimensional point cloud Download PDFInfo
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Abstract
The invention discloses a gold wire bonding size detection method based on three-dimensional point cloud, which comprises the following steps: step 1, performing component detection on input integral point clouds based on a point cloud deep learning method, and extracting gold wire point clouds, welding spot point clouds, chip point clouds and bottom plate point clouds according to detection results; step 2, respectively dividing single gold wire point clouds and single welding point clouds from the extracted gold wire point clouds and welding point clouds, and then carrying out gold wire-welding point pairing according to the single gold wire point clouds and welding point clouds; and 3, constructing a gold wire bonding size calculation model, and calculating gold wire bonding size parameters according to the gold wire-welding point pairing combination and the gold wire bonding size calculation model. The gold wire bonding size detection method based on the three-dimensional point cloud aims to solve the problem of automatic detection of gold wire bonding size, is used for automatic detection of gold wire morphology characteristics, and is high in detection precision and simple and convenient to implement.
Description
Technical Field
The invention belongs to the technical field of gold wire morphology feature detection, and particularly relates to a gold wire bonding size detection method based on three-dimensional point cloud.
Background
With the rapid development of microelectronic industry in China, significant progress is made in the research and integrated manufacturing of microelectronic chips in China. Microelectronic packaging is used as a key technology influencing the performance of microelectronic devices, and more than 90% of later packaging in the manufacturing process of semiconductor integrated circuits adopts a gold wire bonding technology, so the quality of gold wire bonding seriously influences the performance of the microelectronic devices. The integrated circuit is very small in size, so that the appearance and size of the gold wire bonding structure are difficult to detect, and at present, a high-precision camera is mostly adopted to collect pictures of the integrated circuit, and then welding points and the gold wires are positioned through an image processing algorithm for detection. However, the image as two-dimensional data cannot represent height information, and therefore, the gold wire morphology and the arc height cannot be measured.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a gold wire bonding dimension measurement and detection method based on three-dimensional point cloud, and aiming at the problem that gold wire bonding appearance dimension parameters are difficult to measure, the invention applies a three-dimensional laser scanning technology to gold wire bonding appearance measurement, and aims to realize automatic measurement of gold wire bonding dimensions, improve the gold wire bonding dimension measurement efficiency and simultaneously improve the accuracy and precision of gold wire bonding dimension measurement.
In order to achieve the purpose, the invention adopts the following technical scheme:
a gold wire bonding size detection method based on three-dimensional point cloud comprises the following steps:
and 3, constructing a gold wire bonding size calculation model, and calculating gold wire bonding size parameters according to the gold wire-welding point pairing combination and the gold wire bonding size calculation model.
Further, step 1 specifically includes:
step 11, constructing a deep learning input data set, selecting at least 3 different pieces of point cloud data which respectively comprise gold wires, welding points, chips and a bottom plate as training data, verification data and test data, dividing the training data, the verification data and the test data into four parts of the gold wires, the welding points, the chips and the bottom plate, labeling corresponding data, and constructing a training set, a verification set and a test set based on the labeled data;
step 12, building a deep learning network framework PointNet + +, wherein the network comprises 3 SA layers, namely a Set Abstraction layer, used for feature extraction, and an FC layer, namely a full connected layer, used for feature classification;
step 13, inputting the training set data into the deep learning network for iterative training, inputting the verification data set into the PointNet + + network to verify the training model after finishing the training of the training set each time, and storing the training model with the best verification effect;
and step 14, inputting the test data into the training model with the best effect to predict the component category of the point cloud to be detected, and dividing the point cloud to be detected into gold wire point cloud, welding point cloud, chip point cloud and bottom plate point cloud according to the component detection classification result.
Further, the step 11 of marking data to construct a training set, a verification set and a test set specifically includes:
1) for the training set, respectively sampling 1024 points in each type of point set as points to be tested by adopting a random sampling method in four types of point sets of a gold wire, a welding point, a chip and a bottom plate; regarding the test set, taking each point in the test point cloud data as a point to be tested;
2) taking a point to be measured as a center and taking R as a radius structure in the original integral point cloudCreating a bounding sphere and obtaining a point cloud P in the bounding sphereRFor the point cloud P surrounding the interior of the ballR512 points are sampled by adopting a farthest point sampling method and are used as input data of the deep learning network PointNet + +.
Further, step 2 specifically includes:
step 21, fitting a plane gamma of the chip by using random sampling consistency, namely RANSAC (random sample consensus) plane fitting algorithm based on the point cloud of the chip detected in the step 1;
step 22, based on the gold wire point clouds and the welding spot point clouds detected in the step 1, adopting an European clustering algorithm to respectively cluster single gold wire point clouds and single welding spot point clouds to obtain a single gold wire point cloud setAnd single solder joint point cloudWherein, WiThe point cloud is the ith gold wire point cloud, Sj is the jth welding point cloud, i is the serial number of the gold wire point cloud, and j is the serial number of the welding point cloud;
step 23, projecting the single gold wire point cloud in the single gold wire point cloud set and the single welding point cloud in the single welding point cloud set on the plane gamma to obtain a gold wire projection point cloud setCloud collection of projection points of welding spots Wherein, Wi'is the ith gold wire projection point cloud, S'jJ is the j projection point cloud, k is the total number of gold wire point clouds, and k' is the total number of welding point clouds;
step 24, calculating the mass center s of the projection point cloud of each welding pointjAnd the mass center wi of each gold wire projection point cloud, and performing principal component analysis on each gold wire projection point cloud to calculate each gold wire projection point cloudMain direction of
Step 25, using the centroid w of the single gold wire projection pointiAnd a main directionLine l where the projection of the ceramic gold wire is locatediBy calculating the centroid of the spot to the line liThe distance of the gold wire and the welding spot are matched.
Further, step 25 specifically includes:
251, projecting the centroid w with the gold wireiAs a starting point, the projected centroid s of any welding pointjConstructing a direction vector for the endpointAccording to the main direction of the wireAnd the direction vector pointing to the welding pointThe included angle θ divides all solder joints into two groups: the welding points with the included angle theta of 0 degrees and 90 degrees are divided into a group of welding points with the included angle theta of 90 degrees and 180 degrees]Dividing the welding spots in the range into another group;
step 252, for each group of welding points, calculating the projected centroid s of the single welding pointjLine l where projection to gold wire is locatediAnd d, taking the welding spot corresponding to the minimum distance as the welding spot distributed on one side of the gold wire, respectively finding the welding spot closest to the projection straight line where the gold wire is located in the two groups of welding spots as a matching welding spot of the gold wire to complete gold wire-welding spot matching, wherein one group of gold wire-welding spot matching comprises one gold wire, one welding spot connected with the gold wire on the bottom plate and one welding spot connected with the gold wire on the chip.
Further, step 3 specifically includes:
step 31, gold wire bonding size parameters are defined as gold wire arc height H, welding point height difference H and gold wire span L in a group of gold wire-welding point matching points;
step 32, for a set of gold wire-solder joint matchingCalculating point cloud W of gold wireiHighest point w oftpCalculating the point cloud of the welding spots on the chipLowest point of (2)Calculating the point cloud of welding spots on the bottom plateLowest point of (2)
Step 33, based on the normal vector of the plane Γ where the chip is locatedWith the highest point w of the gold wiretpLowest point of chip padAnd the lowest point of the welding spot of the bottom plateDefining the gold wire arc height H as the distance from the highest point of the gold wire to the plane of the chip, defining the height difference H of welding points as the vertical distance between two welding points, and defining the gold wire span L as the horizontal distance between the two welding points:
wherein the content of the first and second substances,for the lowest point cloud of chip welding spots in a gold wire bonding structurePointing to the highest point w of the gold wiretpThe direction vector of (a) is,is the lowest point of a base plate welding spot point cloud in a gold wire bonding structurePoint cloud lowest point of pointing chipDirection vector of
The invention has the beneficial effects that: the method and the device aim at solving the problems that the gold wire bonding morphology is difficult to detect and accurate in determining the height, can realize automatic measurement of the gold wire bonding size, and are high in automation degree, high in measurement precision and simple and convenient to realize.
The method is used for establishing a mathematical model for the butt joint of the aircraft skin based on the three-dimensional point cloud data to calculate the butt joint step difference and the gap so as to judge the assembling quality of the aircraft skin.
The invention establishes a mathematical model for the gold wire bonding structure based on the three-dimensional point cloud data to calculate the arc height, the span and the height difference of the welding points of the gold wire so as to judge the connection quality of the gold wire bonding structure.
Drawings
FIG. 1 is a schematic representation of a gold wire bonding structure in an embodiment of the present invention;
FIG. 2 is a schematic diagram of a circuit board according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a piece of point cloud data of a circuit board according to an embodiment of the invention;
FIG. 4 is a flowchart of a method for detecting bonding size of gold wire based on three-dimensional point cloud according to an embodiment of the present invention;
FIG. 5 is a diagram of a point cloud deep learning network framework in an embodiment of the invention;
fig. 6 is a schematic point cloud diagram of each component of a circuit board detected according to an embodiment of the present invention, in which fig. 6(a) is a schematic point cloud diagram of a chip, fig. 6(b) is a schematic point cloud diagram of a gold wire, fig. 6(c) is a schematic point cloud diagram of a bottom plate, and fig. 6(d) is a schematic point cloud diagram of a solder joint;
FIG. 7 shows the result of gold wire-matching performed according to an embodiment of the present invention;
fig. 8 is a model of gold wire bond size calculation according to an embodiment of the present invention.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings.
In order to solve the problem that the shape, the size and the parameters of a gold wire bonding structure in the prior art are difficult to measure, the invention provides a gold wire bonding size detection method based on three-dimensional point cloud, fig. 1 shows an optional gold wire bonding model structure, fig. 2 shows a schematic diagram of a local entity of a circuit board in the embodiment of the invention, and fig. 3 shows a schematic diagram of a three-dimensional point cloud structure of the circuit board.
An optional flowchart of the gold wire bonding size detection method based on three-dimensional point cloud is shown in fig. 4, and the method includes:
and 3, constructing a gold wire bonding size calculation model, and calculating gold wire bonding size parameters according to the gold wire-welding point pairing combination and the gold wire bonding size calculation model.
By applying the technical scheme of the invention, the automatic measurement of the gold wire bonding structure can be realized. The invention establishes a mathematical model for the gold wire bonding structure to calculate the gold wire bonding appearance size based on the actually measured three-dimensional point cloud data of the circuit board so as to realize the appearance characteristic detection of the gold wire bonding structure and judge whether the gold wire bonding structure meets the design requirements. The detection method is high in automation degree and detection precision. FIG. 3 is a schematic diagram of a point cloud of a circuit board acquired using a three-dimensional scanner.
In a possible embodiment, the method for performing component detection on the whole input point cloud based on the point cloud deep learning method in step 1, and extracting point clouds of a gold wire, a welding point, a chip and a bottom plate according to detection results respectively, includes:
step 11, constructing a deep learning input data set, selecting at least 3 different pieces of point cloud data which respectively comprise four parts of a gold wire, a welding point, a chip and a bottom plate as training data, verification data and test data, dividing the four parts of the gold wire, the welding point, the chip and the bottom plate from the training data, the verification data and the test data, carrying out corresponding data labeling, and constructing the training set, the verification set and the test set based on the labeled data:
1) for the training set and the test set, respectively sampling 1024 points in each type of point set by adopting a random sampling method in the four types of point sets of a gold wire, a welding point, a chip and a bottom plate to be used as points to be tested, and for the test set, taking each point in test data as the points to be tested;
2) constructing a bounding sphere by taking the point to be measured as the center and taking R as the radius in the original point cloud, and acquiring a point cloud P in the bounding sphereRFor the point cloud P surrounding the interior of the ballR512 points are sampled by adopting a farthest point sampling method to serve as input data of the deep learning network, namely the dimension of the data input into the network is 512 x (3+3), wherein 512 represents the number of points, and (3+3) represents coordinate information and color information (xyz + rgb).
Step 12, building a deep learning network framework PointNet + +, wherein the network comprises 3 SA layers, namely a Set Abstraction layer, for feature extraction and one FC layer, namely a full connected layer, for feature classification, as shown in FIG. 5, the input feature dimension of SA1 is 512 x (3+3), the output feature dimension is 512 x (320+3), the output feature dimension of SA1 is 128 x (640+3) after SA2 downsampling and high-dimensional mapping, SA3 continues downsampling and high-dimensional mapping to obtain 1 x 1024-dimensional features, and continues to input into a full connection layer FC for regression to obtain the scores of input data belonging to each category;
step 13, inputting training set data into the deep learning network for iterative training, inputting a verification data set into the network to verify a training model after finishing training of the training set once, storing the training model with the best verification effect, and iterating the whole training process for 100 times and consuming 5.2 hours;
step 14, inputting the test data into the training model with the best verification effect to predict the component category of the point cloud to be tested, and dividing the point cloud to be tested into a gold wire point cloud, a welding point cloud, a chip point cloud and a bottom plate point cloud according to the component detection classification result, wherein the extraction result schematic diagram of each component of the test data is shown in fig. 6, wherein fig. 6(a) is a chip point cloud schematic diagram, fig. 6(b) is a gold wire point cloud schematic diagram, fig. 6(c) is a bottom plate point cloud schematic diagram, and fig. 6(d) is a welding point cloud schematic diagram.
In a possible embodiment, the step 2 of dividing a single gold wire point cloud and a single welding point cloud from the detected gold wire point cloud and welding point cloud respectively, and then performing gold wire-welding point pairing according to the single gold wire and welding point cloud includes:
step 21, fitting a plane gamma of the chip by using random sampling consistency, namely RANSAC (random sample consensus) plane fitting algorithm based on the point cloud of the chip detected in the step 1;
step 22, based on the gold wire point clouds and the welding spot point clouds detected in the step 1, adopting an European clustering algorithm to respectively cluster single gold wire point clouds WiAnd a single spot cloud SiObtaining a single gold wire point cloud setAnd single solder joint point cloud
Step 23, projecting the single gold wire point cloud in the single gold wire point cloud set and the single welding point cloud in the single welding point cloud set on the plane gamma to obtain a gold wire projection point cloud setCloud collection of projection points of welding spots
Step 24, calculating the projection point cloud S of each welding pointj' center of mass sjAnd each gold wire projection point cloud Wi' center of mass wiAnalyzing the main components of each gold wire projection point cloud to calculate the main direction of each gold wire projection point cloud
Step 25, using the centroid w of the single gold wire projection pointiAnd a main directionConstructing a line l where the projection of the gold wire is locatediBy calculating the centroid of the spot to the line liPerforming gold wire-solder joint matching:
1) using gold wire to project centroid wiAs a starting point, the projected centroid s of any welding pointjConstructing a direction vector for the endpointAccording to the main direction of the wireAnd the direction vector pointing to the welding pointThe included angle θ divides all solder joints into two groups: corresponding welding point with included angle theta in the range of 0 DEG and 90 DEGDivided into one group at 90 deg. and 180 deg. °]Dividing the corresponding welding spots in the range into another group;
2) for each set of welding points, calculating the projected centroid s of the welding pointsjLine l where projection to gold wire is locatediThe distance d is the welding point S corresponding to the minimum distanceiAs the welding spots distributed on one side of the gold wire, the welding spots closest to the straight line where the gold wire is located are respectively found in two groups of welding spots as the matching welding spots of the gold wire to complete gold wire-welding spot matching, wherein one group of gold wire-welding spot matching comprises one gold wire, one welding spot connected with the gold wire on the bottom plate and one welding spot connected with the gold wire on the chip, the gold wire-welding spot matching result is shown in figure 7, and a group of gold wires and welding spot point cloud in a dotted line frame represents a gold wire bonding structure.
In one possible embodiment, step 3 is to construct a gold wire bonding size calculation model, and to calculate gold wire bonding size parameters based on the gold wire-pad and gold wire bonding size calculation model, including:
step 31, gold wire bonding size parameters are defined as gold wire arc height H, welding point height difference H, gold wire span L and size parameters in a group of gold wire-welding point matching points as shown in figure 1;
step 32, matching a set of gold wire solder jointsCalculating point cloud W of gold wireiHighest point w oftpCalculating the point cloud of the welding spots on the chipLowest point of (2)Calculating the point cloud of welding spots on the bottom plateLowest point of (2)The model for calculating the gold wire bonding size is shown in FIG. 8;
step 33, based on the normal vector of the plane Γ where the chip is locatedWith the highest point w of the gold wiretpLowest point of chip padAnd the lowest point of the welding spot of the bottom plateDefining the gold wire arc height H as the distance from the highest point of the gold wire to the plane of the chip, defining the height difference H of welding points as the vertical distance between two welding points, and defining the gold wire span L as the horizontal distance between the two welding points:
wherein the content of the first and second substances,for the lowest point cloud of chip welding spots in a gold wire bonding structurePointing to the highest point w of the gold wiretpThe direction vector of (a) is,is the lowest point of a base plate welding spot point cloud in a gold wire bonding structurePoint of directionChip point cloud lowest pointThe direction vector of (2).
In the data used in this example, measurements of gold wire bond feature dimensions are shown in table 1, where the combined effect is shown in fig. 7:
TABLE 1 gold wire morphology dimension measurement results (unit: micrometer)
Combination of | | h | L | |
① | 283.669 | 246.462 | 225.184 | |
② | 320.768 | 242.242 | 561.889 | |
③ | 333.655 | 196.641 | 1295.283 | |
④ | 315.946 | 225.872 | 1063.518 | |
⑤ | 397.504 | 235.456 | 1151.535 | |
⑥ | 273.577 | 183.345 | 515.740 | |
⑦ | 321.020 | 205.005 | 387.145 | |
⑧ | 265.040 | 207.416 | 169.946 | |
⑨ | 273.556 | 198.099 | 352.932 |
The method for detecting the bonding size of gold wire based on three-dimensional point cloud of the present invention is not limited to the precise structure that has been described above and shown in the drawings, and various modifications and changes can be made without departing from the scope thereof.
It should be noted that the terms "upper", "lower", "left", "right", "front", "back", etc. used in the present invention are for clarity of description only, and are not intended to limit the scope of the present invention, and the relative relationship between the terms and the terms is not limited by the technical contents of the essential changes.
The above is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above-mentioned embodiments, and all technical solutions belonging to the idea of the present invention belong to the protection scope of the present invention. It should be noted that modifications and embellishments within the scope of the invention may be made by those skilled in the art without departing from the principle of the invention.
Claims (6)
1. A gold wire bonding size detection method based on three-dimensional point cloud is characterized by comprising the following steps:
step 1, performing component detection on input integral point clouds based on a point cloud deep learning method, and extracting gold wire point clouds, welding spot point clouds, chip point clouds and bottom plate point clouds according to detection results;
step 2, respectively dividing single gold wire point clouds and single welding point clouds from the extracted gold wire point clouds and welding point clouds, and then carrying out gold wire-welding point pairing according to the single gold wire point clouds and welding point clouds;
and 3, constructing a gold wire bonding size calculation model, and calculating gold wire bonding size parameters according to the gold wire-welding point pairing combination and the gold wire bonding size calculation model.
2. The method for detecting the bonding size of the gold wire based on the three-dimensional point cloud as claimed in claim 1, wherein the step 1 is specifically as follows:
step 11, constructing a deep learning input data set, selecting at least 3 different pieces of point cloud data which respectively comprise gold wires, welding points, chips and a bottom plate as training data, verification data and test data, dividing the training data, the verification data and the test data into four parts of the gold wires, the welding points, the chips and the bottom plate, labeling corresponding data, and constructing a training set, a verification set and a test set based on the labeled data;
step 12, building a deep learning network framework PointNet + +, wherein the network comprises 3 Set Abstraction layers, namely a Set Abstraction layer, used for feature extraction, and a full connected layer, namely a full connection layer, used for feature classification;
step 13, inputting the training set data into the deep learning network for iterative training, inputting the verification data set into the PointNet + + network to verify the training model after finishing the training of the training set each time, and storing the training model with the best verification effect;
and step 14, inputting the test data into the training model with the best effect to predict the component category of the point cloud to be detected, and dividing the point cloud to be detected into gold wire point cloud, welding point cloud, chip point cloud and bottom plate point cloud according to the component detection classification result.
3. The method as claimed in claim 2, wherein the step 11 of constructing a training set, a verification set and a test set by labeling data specifically comprises:
1) for the training set, respectively sampling 1024 points in each type of point set as points to be tested by adopting a random sampling method in four types of point sets of a gold wire, a welding point, a chip and a bottom plate; regarding the test set, taking each point in the test point cloud data as a point to be tested;
2) constructing a bounding sphere by taking the point to be measured as the center and taking R as the radius in the original integral point cloud, and acquiring a point cloud P in the bounding sphereRFor the point cloud P surrounding the interior of the ballR512 points are sampled by adopting a farthest point sampling method and are used as input data of the deep learning network PointNet + +.
4. The method as claimed in claim 1, wherein the step 2 comprises:
step 21, fitting a plane gamma of the chip by using random sampling consistency, namely RANSAC (random sample consensus) plane fitting algorithm based on the point cloud of the chip detected in the step 1;
step 22, based on the gold wire point clouds and the welding spot point clouds detected in the step 1, adopting an European clustering algorithm to respectively cluster single gold wire point clouds and single welding spot point clouds to obtain a single gold wire point cloud setAnd single solder joint point cloudWherein, WiAs the ith point cloud of gold wire, SjIs the jth welding point cloud, i is the serial number of the gold wire cloud, j is the serial number of the welding point cloud;
step 23, projecting the single gold wire point cloud in the single gold wire point cloud set and the single welding point cloud in the single welding point cloud set on the plane gamma to obtain a gold wire projection point cloud setCloud collection of projection points of welding spots Wherein, W'iProjecting point cloud, S 'for the ith gold wire'jJ is the j projection point cloud, k is the total number of gold wire point clouds, and k' is the total number of welding point clouds;
step 24, calculating the mass center s of the projection point cloud of each welding pointjAnd the centroid w of each gold wire projection point cloudiAnalyzing the main components of each gold wire projection point cloud to calculate the main direction of each gold wire projection point cloud
5. The method as claimed in claim 4, wherein the step 25 specifically comprises:
251, projecting the centroid w with the gold wireiAs a starting point, the projected centroid s of any welding pointjConstructing a direction vector for the endpointAccording to the main direction of the wireAnd the direction vector pointing to the welding pointThe included angle θ divides all solder joints into two groups: the welding points with the included angle theta of 0 degrees and 90 degrees are divided into a group of welding points with the included angle theta of 90 degrees and 180 degrees]Dividing the welding spots in the range into another group;
step 252, for each group of welding points, calculating the projected centroid s of the single welding pointjLine l where projection to gold wire is locatediAnd d, taking the welding spot corresponding to the minimum distance as the welding spot distributed on one side of the gold wire, respectively finding the welding spot closest to the projection straight line where the gold wire is located in the two groups of welding spots as a matching welding spot of the gold wire to complete gold wire-welding spot matching, wherein one group of gold wire-welding spot matching comprises one gold wire, one welding spot connected with the gold wire on the bottom plate and one welding spot connected with the gold wire on the chip.
6. The method as claimed in claim 1, wherein the step 3 specifically comprises:
step 31, gold wire bonding size parameters are defined as gold wire arc height H, welding point height difference H and gold wire span L in a group of gold wire-welding point matching points;
step 32, for a set of gold wire-solder joint matchingCalculating point cloud W of gold wireiHighest point w oftpCalculating the point cloud of the welding spots on the chipLowest point of (2)Calculating the point cloud of welding spots on the bottom plateLowest point of (2)
Step 33, based on the normal vector of the plane Γ where the chip is locatedWith the highest point w of the gold wiretpLowest point of chip padAnd the lowest point of the welding spot of the bottom plateDefining the gold wire arc height H as the distance from the highest point of the gold wire to the plane of the chip, defining the height difference H of welding points as the vertical distance between two welding points, and defining the gold wire span L as the horizontal distance between the two welding points:
wherein the content of the first and second substances,for the lowest point cloud of chip welding spots in a gold wire bonding structurePointing to the highest point w of the gold wiretpThe direction vector of (a) is,is the lowest point of a base plate welding spot point cloud in a gold wire bonding structurePoint cloud lowest point of pointing chipThe direction vector of (2).
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