CN113552154A - Preparation method of fresh oolong head xylem scanning electron microscope sample - Google Patents

Preparation method of fresh oolong head xylem scanning electron microscope sample Download PDF

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Publication number
CN113552154A
CN113552154A CN202110913929.3A CN202110913929A CN113552154A CN 113552154 A CN113552154 A CN 113552154A CN 202110913929 A CN202110913929 A CN 202110913929A CN 113552154 A CN113552154 A CN 113552154A
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China
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sample
xylem
electron microscope
scanning electron
fresh
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CN202110913929.3A
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Inventor
李艳杰
赵恒�
王彦君
张谷春
徐辉
王�琦
章梅
黄文魁
王莉
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Sinochem Jiangsu Geology And Mineral Resources Design And Research Institute Co ltd
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Sinochem Jiangsu Geology And Mineral Resources Design And Research Institute Co ltd
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Publication of CN113552154A publication Critical patent/CN113552154A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2202Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]

Abstract

The invention discloses a preparation method of a fresh xylem scanning electron microscope sample of an oolong head, which comprises the following steps: (1) sample preparation: cutting a fresh sample of xylem of Umbelliferae into small samples by using a razor blade, and then drying the samples in an oven at 42 ℃ for 10 hours; (2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape; (3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; the method has the advantages that the gold film with the thickness of 10-20 nm is uniformly plated on the surface of the sample, the preparation method is simple, convenient and safe to operate, the cost is saved, the tissue structure of the xylem section is clear during observation, the image stereoscopic impression is strong, and the observation and analysis of the ultra-micro structure of the xylem of Umbelliferae are facilitated.

Description

Preparation method of fresh oolong head xylem scanning electron microscope sample
Technical Field
The invention belongs to the technical field of microscopic observation samples, relates to a preparation method of a scanning electron microscope sample, and particularly relates to a preparation method of a fresh xylem scanning electron microscope sample of an oolong head.
Background
The Aralia chinensis, belonging to Aralia of Araliaceae, has high economic value and medicinal value, and the tender bud of Wushui is famous first-class green health-care wild vegetable known as 'the king of wild vegetable', deeply favored by consumers, continuously expanded in consumption demand, and greatly incapable of meeting the market demand, has good development prospect, and is a new way for planting and enriching by people in poor mountainous areas. Therefore, the research on the physicochemical properties and the microscopic properties of the oolong is especially important for understanding the ecological habits and the growth rules of the Wubi organisms and further enlarging the planting scale. The sample of the wood part of the oolong head is subjected to flaking, then the micro-anatomical structure of the sample is observed under a scanning electron microscope and a microscope, and relevant data of the structural characteristics of the sample are measured and recorded.
When a traditional scanning electron microscope sample of fresh plant xylem is prepared, the wood is usually soaked in an ethylenediamine aqueous solution to enable the wood to have certain toughness, then a wood slicer, a single-sided blade or a sliding slicer and the like are adopted to cut and take materials, and organic solvents with specific concentration such as dimethylbenzene, acetone or alcohol and the like are used for gradient dehydration, drying, flaking, dyeing and the like, so that observation can be carried out. The operation is complex, the cost is high, the time consumption is long, and the harm to the human health is large due to the use of the organic volatile solvent.
Therefore, the preparation method of the sample of the wood part of the oolong, which is simple and convenient to operate, low in cost, safe, clear in the structure of the wood part section tissue when observed by a scanning electron microscope and strong in image stereoscopic impression, is provided.
Disclosure of Invention
In order to solve the technical problems, the technical scheme provided by the invention is as follows: a preparation method of a fresh xylem scanning electron microscope sample of an oolong head comprises the following steps:
(1) sample preparation: cutting a fresh sample of the xylem of the Umbelliferae tree into small samples by using a razor blade, cutting the surface to be observed to be flat and smooth, and then drying the samples in an oven at 42 ℃ for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; and uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, wherein the sample can be observed under the scanning electron microscope.
Preferably, the Ubbelohde xylem is cut into 1cm × 1cm × 1cm blocks in step (1).
Preferably, the dried Umbelliferae xylem block body in the step (1) is taken out of a chord section, and the back of the chord section is repaired to be flat so as to be conveniently adhered to a sample table.
Preferably, the radial section of the dried xylem block of the Umbilicaria pubescens in the step (1) is taken, and the back of the radial section is repaired to be flat, so that the dried xylem block is conveniently adhered to a sample table.
Preferably, the cross section of the dried xylem block of Umbilicaria prostrata in step (1) is taken, and the back of the cross section is repaired to be flat, so that the dried xylem block is conveniently adhered to a sample table.
Preferably, the ion sputtering coating instrument has the following types: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
After the scheme is adopted, the invention has the following advantages: compared with the prior art, the method has the advantages of simple, convenient and safe operation, no pollution, cost saving, clear structure of the section tissue of the xylem during observation, strong stereoscopic impression of the image and contribution to the development of observation and analysis of the ultra-micro structure of the xylem of Wushui.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic view of the cross-section duct, growth ring, ray, medullary heart, etc. of the oolong stem prepared by the present invention observed by electron microscope.
FIG. 2 is a schematic view of the ducts and the pits of the oolong head stem prepared by the present invention observed by electron microscope.
FIG. 3 is a schematic view of the present invention showing the stepped pores of the oolong stem prepared by the present invention under an electron microscope.
FIG. 4 is a schematic view of a scanning electron microscope according to an embodiment of the present invention.
FIG. 5 is a schematic view of a scanning electron microscope of example two of the present invention.
FIG. 6 is a schematic view of an example of the present invention observed under a scanning electron microscope.
FIG. 7 is a schematic view of an example of the present invention observed under a four-scanning electron microscope.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Example one
A preparation method of a fresh xylem scanning electron microscope sample of an oolong head is characterized by comprising the following steps:
(1) sample preparation: cutting a fresh sample of xylem of Umbelliferae into a block body with the thickness of 1cm multiplied by 1cm by using a razor blade, taking a cross section, repairing and flattening the back surface of the cross section, and then placing the block body in an oven at 42 ℃ for drying for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, and observing under the scanning electron microscope; the ion sputtering coating instrument has the following usage models: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
Example two
A preparation method of a fresh xylem scanning electron microscope sample of an oolong head is characterized by comprising the following steps:
(1) sample preparation: cutting a fresh sample of xylem of Umbelliferae with a razor blade into a block body of 1cm multiplied by 1cm, taking a radial section, repairing the back of the radial section to be flat, and then placing the block body in an oven at 42 ℃ for drying for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, and observing under the scanning electron microscope; the ion sputtering coating instrument has the following usage models: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
EXAMPLE III
A preparation method of a fresh xylem scanning electron microscope sample of an oolong head is characterized by comprising the following steps:
(1) sample preparation: cutting a fresh sample of xylem of Wushui into a block body with the thickness of 1cm multiplied by 1cm by a razor blade, taking a string section of the block body, repairing and flattening the back surface of the string section, and then placing the block body in an oven at 42 ℃ for drying for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, and observing under the scanning electron microscope; the ion sputtering coating instrument has the following usage models: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
Example four
A preparation method of a fresh xylem scanning electron microscope sample of an oolong head comprises the following steps:
(1) sample preparation: cutting a fresh sample of xylem of Umbelliferae into a block body with the thickness of 1cm multiplied by 1cm by using a razor blade, taking a cross section, repairing and flattening the back surface of the cross section, and then placing the block body in an oven at 42 ℃ for drying for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, and observing under the scanning electron microscope; the ion sputtering coating instrument has the following usage models: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
The method has the advantages of simple and safe operation, cost saving, clear xylem section tissue structure during observation and strong image stereoscopic impression, and is favorable for carrying out observation and analysis on the Wubi xylem ultrastructure.
The present invention and its embodiments have been described above, and the description is not intended to be limiting, and the drawings are only one embodiment of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should appreciate that they can readily use the disclosed conception and specific embodiments as a basis for designing or modifying other structures for carrying out the same purposes of the present invention without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (6)

1. A preparation method of a fresh xylem scanning electron microscope sample of an oolong head is characterized by comprising the following steps:
(1) sample preparation: cutting a fresh sample of the xylem of the Umbelliferae tree into small samples by using a razor blade, cutting the surface to be observed to be flat and smooth, and then drying the samples in an oven at 42 ℃ for 10 hours;
(2) sample sticking: sticking a carbon-plated conductive adhesive tape on a sample table, and sticking the dried small sample on the conductive adhesive tape;
(3) coating a sample: setting the current of 20mA and spraying gold for 30s by using an ion sputtering coating instrument for the stuck small sample; and uniformly plating a layer of gold film with the thickness of 10-20 nm on the surface of the sample to obtain a scanning electron microscope sample of the xylem of Umbelliferae, wherein the sample can be observed under the scanning electron microscope.
2. The method for preparing a scanning electron microscope sample of fresh xylem of oolong head as claimed in claim 1, wherein in step (1), xylem of Umbelliferae is cut into 1cm x 1cm blocks.
3. The method for preparing a sample of fresh xylem of oolong head under scanning electron microscope as claimed in claim 1, wherein the dried xylem block of oolong head in step (1) is obtained by taking a string-cut surface, and the back surface of the string-cut surface is repaired to be flat for easy adhesion to a sample stage.
4. The method for preparing a sample of fresh xylem of oolong head as claimed in claim 1, wherein the dried xylem of Umbilicaria foetida in step (1) is prepared by taking a diametric section of the dried xylem of Umbilicaria foetida, and repairing the back of the diametric section to be flat for adhesion to a sample stage.
5. The method for preparing a scanning electron microscope sample of fresh xylem of oolong head as claimed in claim 1, wherein in step (1), the dried xylem block of oolong head is taken out, and its cross section is repaired to be flat and smooth on the back surface, so that it can be adhered to the sample stage.
6. The method of claim 1, wherein the ion sputter coating apparatus is of the type: quorum SC7620 SPUTTER COATER ion sputtering coating machine in UK.
CN202110913929.3A 2021-08-10 2021-08-10 Preparation method of fresh oolong head xylem scanning electron microscope sample Pending CN113552154A (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103760000A (en) * 2014-01-26 2014-04-30 中国热带农业科学院椰子研究所 Preparation method for elaeis guineensis leaf scanning electron microscope sample
CN105158515A (en) * 2015-08-14 2015-12-16 石河子大学 Method for preparing xylem sample of haloxylon ammodendron for scanning electronic microscope
CN106053178A (en) * 2016-07-28 2016-10-26 广西医科大学 Preparation method of boat-fruited sterculia seed scanning electron microscope samples
WO2017092120A1 (en) * 2015-11-30 2017-06-08 江苏大学 Method for determining puncture position of probe during measurement of concentration of ions in leaf

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103760000A (en) * 2014-01-26 2014-04-30 中国热带农业科学院椰子研究所 Preparation method for elaeis guineensis leaf scanning electron microscope sample
CN105158515A (en) * 2015-08-14 2015-12-16 石河子大学 Method for preparing xylem sample of haloxylon ammodendron for scanning electronic microscope
WO2017092120A1 (en) * 2015-11-30 2017-06-08 江苏大学 Method for determining puncture position of probe during measurement of concentration of ions in leaf
CN106053178A (en) * 2016-07-28 2016-10-26 广西医科大学 Preparation method of boat-fruited sterculia seed scanning electron microscope samples

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
李永敬等: "扫描电镜木材研究初步", 电子显微学报, 31 December 1985 (1985-12-31), pages 13 - 21 *

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