CN1135430C - 计算机层析x射线摄影机 - Google Patents

计算机层析x射线摄影机 Download PDF

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CN1135430C
CN1135430C CNB981057578A CN98105757A CN1135430C CN 1135430 C CN1135430 C CN 1135430C CN B981057578 A CNB981057578 A CN B981057578A CN 98105757 A CN98105757 A CN 98105757A CN 1135430 C CN1135430 C CN 1135430C
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scintillation crystal
detector
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tomograph
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CN1195787A (zh
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��˹��ŵ��
阿诺夫·奥佩尔特
ʩ�ٶ�˹�и�
卡尔·施蒂尔斯托弗
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Siemens AG
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations

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Abstract

一种X射线探测器,其中为消除闪烁晶体里的光散射或直接转换半导体内的串扰,X射线转换器,例如闪烁晶体(12)与多个信号转换器,例如光电二极管(13)建立联系。不清晰度可以通过信号转换器的输出信号计算出来。

Description

计算机层析X射线摄影机
技术领域
在X射线技术领域使用X射线探测器是众所周知的,在X射线探测器里闪烁晶体将X射线转变成可见光,可见光通过一个光电转换器被转变成一电信号。由此得到一个被检查物体的图像。在此位置分辨率通常是下降的,因为在闪烁晶体里光的传播会导致图像模糊。例如在闪烁晶体下部的点的图像就会出现点的边缘被抹去的现象。
背景技术
在数字X射线照相领域,作为X射线转换器的一个闪烁晶体配置有多个用于产生相应图像电信号的光电转换器也是众所周知的。由此可得到所需的图像分辨率(US 5587591;物理研究中的核仪器及方法,A310,1991,471至474页;DE 1952 4858A1;DE 4420603C1)。然而我们所熟知的X射线转换器在计算机层析X射线摄影方面却是不适用的。
发明内容
本发明要解决的技术问题在于,针对计算机层析X射线摄影机中设置的X射线探测器来设计一个计算机层析X射线摄影机,以改善现有技术的图像清晰度。
上述技术问题按照本发明通过这样一种计算机层析X射线摄影机来解决,它带有一个X射线放射源,该放射源发射扇面状的X射线束,射线束撞击到一探测器上,该探测器由一排单个探测元件所组成,其中每单个探测元件具有一个X射线转换器,这些X射线转换器与多个信号转换器接触。
对于本发明重要的是,设置一个配置多个信号转换器的X射线转换器。由信号转换器的输出信号可以重现一个清晰的测量信号。X射线转换器可以是闪烁晶体,信号转换器可以是光电转换器,例如光电二极管。
附图说明
下面借助附图对本发明作进一步的详细说明,附图中:
图1所示为带有一X射线探测器的计算机层析X射线摄影机的主要部件;
图2至图5所示为图1所示计算机层析X射线摄影机的X射线探测器的变型。
具体实施方式
图1所示的计算机层析X射线摄影机具有一由X射线源1和一探测器3组成的检测单元1,3,X射线源发射扇形的X射线束2,探测器由一排,例如512个单个探测元件所组成。焦点用11来表示。被检查的病人4躺在病榻5上。为了对病人进行扫描,检测单元1,3环绕病人4所在的检测域9作360度旋转。转轴用10来表示。在此由X射线发生器6供给的X射线放射源1发出脉动的或连续的放射线。当检测单元1,3位于预定的角位置时产生多组数据,这些数据由探测器3传送到计算机7,计算机从所产生的数据组中计算出预定图像点的衰减系数,并在显示器8上再现图像。在显示器8上相应的出现病人透视层图像。
由图2可知,探测器3由一排闪烁晶体12所组成,光电二极管层13与其建立光学接触。光电二极管层13在图2的右边单独示出。由此可见,沿放射线方向看过去,在每个闪烁晶体12后面都有一排光电二极管。按照图2的实施例,沿Z向,亦即沿转轴10的方向,探测器3没有形成结构,而在ψ向具有结构。
在图3所示实施例中,探测器3由闪烁晶体14构成的矩阵所组成。在每个闪烁晶体14后面有与之光学接触的光电二极管15组成的矩阵。
在图4所示的实施例中,探测器3结构中的闪烁晶体12具有如图2所示的那种结构。在每个闪烁晶体12后面有一个由光电二极管16构成的矩阵。
图5所示的探测器3由直接转换的半导体17构成,该半导体位于一偏压V下。半导体17带有象素接点18(Pixelkontakt)。许多象素接点18位于唯一的一个例如碲化镉制的半导体17上。
对于图2至图4重要的是,一个没有其它结构的闪烁晶体与一光电二极管矩阵光学耦合在一起。
由于闪烁晶体不清晰,对于闪烁晶体来说信号M被如此测定,来替代清晰度(理论上是以一个不模糊的闪烁晶体来测定的)信号: M i = Σ j A ij S j
耦合矩阵Aij包括了系统的不清晰度。如果耦合矩阵是已知的和可逆的,则S可以用来测定信号M来重现: S i = Σ j ( A - 1 ) ij M j
人们可以通过下面的方法得到耦合矩阵A:如果这样来照射系统,使每次(如第K次)只有一部分屏段被照射(Sj= S当j=k,0除外),得到Mi=Aik;测定信号正好是矩阵A的k列。如果对于所有的k重复这一过程,则可得到全部的耦合矩阵。如果在每列中对角元素是最大的,则耦合矩阵A是可逆的这个先决条件得以满足。这种情况发生在,闪烁晶体不模糊的时候,即点像函数的范围位于屏的数量级范围内的时候。

Claims (4)

1.一种计算机层析X射线摄影机,它带有一个X射线放射源(1),该放射源发射扇面状的X射线束(2),射线束撞击到一探测器(3)上,该探测器由一排单个探测元件所组成,其中每单个探测元件具有一个X射线转换器(12,14),这些X射线转换器与多个信号转换器(13,15,16)接触。
2.按照权利要求1所述的计算机层析X射线摄影机,其中X射线转换器由至少一个闪烁晶体(12,14)构成,该闪烁晶体与多个光传感器(13,15,16)建立光学接触。
3.按照权利要求2所述的计算机层析X射线摄影机,其中每个闪烁晶体(12)配有一排光传感器(13)。
4.按照权利要求2所述的计算机层析X射线摄影机,其中每个闪烁晶体(12,14)配有一个光传感器(15,16)矩阵。
CNB981057578A 1997-04-09 1998-03-23 计算机层析x射线摄影机 Expired - Fee Related CN1135430C (zh)

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Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6198791B1 (en) * 1998-08-25 2001-03-06 General Electric Company Scalable multislice imaging system
DE19842947B4 (de) 1998-09-18 2004-07-01 Siemens Ag Verfahren zum Herstellen eines Strahlendetektors
US6175611B1 (en) * 1998-10-06 2001-01-16 Cardiac Mariners, Inc. Tiered detector assembly
US6418185B1 (en) * 1999-08-18 2002-07-09 General Electric Company Methods and apparatus for time-multiplexing data acquisition
DE10024489B4 (de) * 2000-05-18 2007-01-04 Siemens Ag Detektor für ein Röntgen-Computertomographiegerät
DE10110673A1 (de) * 2001-03-06 2002-09-26 Siemens Ag Röntgendetektorarray und Verfahren zu seiner Herstellung
US6993110B2 (en) * 2002-04-25 2006-01-31 Ge Medical Systems Global Technology Company, Llc Collimator for imaging systems and methods for making same
JP4247017B2 (ja) * 2003-03-10 2009-04-02 浜松ホトニクス株式会社 放射線検出器の製造方法
US6901135B2 (en) * 2003-08-28 2005-05-31 Bio-Imaging Research, Inc. System for extending the dynamic gain of an X-ray detector
US20070194242A1 (en) * 2003-11-25 2007-08-23 Koninklijke Philips Electronics Nv Scintillation Layer For A Pet-Detector
US7298816B2 (en) * 2005-08-02 2007-11-20 The General Hospital Corporation Tomography system
US20070086565A1 (en) * 2005-10-13 2007-04-19 Thompson Richard A Focally aligned CT detector
DE102005049228B4 (de) * 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
JP2009512502A (ja) * 2005-10-19 2009-03-26 ザ・ゼネラル・ホスピタル・コーポレーション 画像化システム及び関連する技術
WO2013188498A2 (en) * 2012-06-12 2013-12-19 Arizona Board Of Regents Acting For And On Behalf Of Arizona State University Imaging system and methods of manufacturing and using the same
CN104665859B (zh) * 2013-11-29 2017-12-15 通用电气公司 成像系统
US9788804B2 (en) * 2014-07-22 2017-10-17 Samsung Electronics Co., Ltd. Anatomical imaging system with improved detector block module
US10646176B2 (en) * 2015-09-30 2020-05-12 General Electric Company Layered radiation detector
CN110582708A (zh) * 2017-05-01 2019-12-17 皇家飞利浦有限公司 多层辐射探测器
US10145964B1 (en) * 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4872188A (en) * 1987-11-27 1989-10-03 Picker International, Inc. Registration correction for radiographic scanners with sandwich detectors
JPH06109855A (ja) * 1992-09-30 1994-04-22 Shimadzu Corp X線検出器
US5587591A (en) * 1993-12-29 1996-12-24 General Electric Company Solid state fluoroscopic radiation imager with thin film transistor addressable array
GB2289981A (en) * 1994-06-01 1995-12-06 Simage Oy Imaging devices systems and methods
DE4420603C1 (de) * 1994-06-13 1995-06-22 Siemens Ag Röntgendetektor und Verfahren zu seinem Betrieb
US5528043A (en) * 1995-04-21 1996-06-18 Thermotrex Corporation X-ray image sensor
DE19524858A1 (de) * 1995-07-07 1997-01-09 Siemens Ag Röntgenbilderzeugungssystem
US5818898A (en) * 1995-11-07 1998-10-06 Kabushiki Kaisha Toshiba X-ray imaging apparatus using X-ray planar detector

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US6005908A (en) 1999-12-21
EP0871044B1 (de) 2005-11-23
CN1494872A (zh) 2004-05-12
DE59813208D1 (de) 2005-12-29
CN1195787A (zh) 1998-10-14
EP0871044A2 (de) 1998-10-14
JPH10339778A (ja) 1998-12-22

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