CN113541690A - Calibration method and analog-to-digital conversion calibration system for production line detection equipment - Google Patents
Calibration method and analog-to-digital conversion calibration system for production line detection equipment Download PDFInfo
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
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Abstract
The invention discloses a calibration method and an analog-to-digital conversion calibration system of production line detection equipment, wherein the calibration method of the production line detection equipment comprises the steps of inputting the voltage of a direct-current power supply module to equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to a first input voltage and a second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through a universal meter; and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected, so that the equipment to be detected is calibrated before leaving a factory, and when the equipment to be detected is used, the detection error is reduced, and the true value of the signal is reflected.
Description
Technical Field
The invention relates to the technical field of production, in particular to a calibration method and an analog-to-digital conversion calibration system for production line detection equipment.
Background
Some detection devices include an Analog-to-Digital Converter (ADC), before the detection device leaves a factory, the ADC needs to be calibrated, and if the ADC is directly used without calibration, an error occurs between an actual voltage signal value and a test result, which may cause the test result to fail to correctly reflect an actual value of the signal, and the detection error is relatively large.
Disclosure of Invention
Aiming at the technical problem, the invention provides a calibration method and an analog-to-digital conversion calibration system for production line detection equipment.
The first aspect of the present invention provides a calibration method for a production line inspection apparatus, which is applied to an analog-to-digital conversion calibration system, where the analog-to-digital conversion calibration system includes a dc power supply module, a multimeter and an inspection apparatus, where the inspection apparatus includes a voltage division module and a processor, and includes:
inputting the voltage of the direct-current power supply module to the equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to a first input voltage and a second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through the universal meter;
and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected.
Optionally, the determining a target gain according to the first adjustment voltage and the second adjustment voltage includes:
calculating a difference value between the first adjusting voltage and the second adjusting voltage to obtain a first voltage difference;
calculating a difference value between the first input voltage and the second input voltage to obtain a second voltage difference value;
and determining the ratio of the first voltage value and the second voltage difference as the target gain.
Optionally, the determining a target offset according to the first adjustment voltage and the second adjustment voltage includes:
and determining the target offset according to the first adjusting voltage, the second adjusting voltage, the first input voltage, the second input voltage and the target gain.
Optionally, the target offset amount is calculated as follows:
Offset＝[(M1+M2)/Gain-(F1+F2)]/2；
wherein Offset is a target Offset; gain is a target Gain; m1 is a first adjustment voltage; m2 is the second adjustment voltage; f1 is a first input voltage; f2 is the second input voltage.
Optionally, the voltage dividing module includes a first resistor and a second resistor, a first end of the first resistor is connected to the output end of the dc power supply module, a second end of the first resistor is connected to a first end of the second resistor and to a test pin of the processor of the device to be tested, and a second end of the second resistor is connected to ground.
Optionally, the method further comprises:
and determining the maximum working voltage value of the processor according to the maximum voltage value of the direct-current power supply module and the voltage division circuit.
Optionally, the determining a maximum operating voltage value of the processor according to the maximum voltage value of the dc power supply module and the voltage dividing circuit includes:
and determining the ratio of the product of the maximum voltage value of the direct current power supply module and the first resistor to the sum of the first resistor and the second resistor as the maximum working voltage value of the processor, wherein the resistance value of the first resistor is smaller than that of the second resistor.
Optionally, the method further comprises:
acquiring a third adjustment voltage;
and determining a calibration voltage according to the third adjustment voltage, the target gain and the target offset.
Optionally, the calibration voltage is obtained by:
V2＝V1/Gain–Offset；
wherein V2 is a calibration voltage; v1 is the third adjustment voltage.
The invention also provides an analog-to-digital conversion calibration system, which comprises the calibration method of the production line detection equipment of the first aspect.
The embodiment of the invention provides a calibration method and an analog-to-digital conversion calibration system of production line detection equipment, which comprises the steps of inputting the voltage of a direct-current power supply module to equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to a first input voltage and a second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through a universal meter; and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected, so that the equipment to be detected is calibrated before leaving a factory, and when the equipment to be detected is used, the detection error is reduced, and the true value of the signal is reflected.
Drawings
FIG. 1 is a schematic diagram of a calibration method for a production line inspection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an analog-to-digital conversion calibration system according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a calibration method of the production line inspection apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, an embodiment of the present invention provides a calibration method for a production line inspection apparatus, which is applied to an analog-to-digital conversion calibration system, as shown in fig. 2, fig. 2 shows a schematic structural diagram of the analog-to-digital conversion calibration system, where the analog-to-digital conversion calibration system includes a dc power supply module, a multimeter and an inspection apparatus;
the processor is a single chip microcomputer, which is not specifically limited in the embodiment of the invention, and the single chip microcomputer is specifically ATSAMD21G 18A-MU;
the direct-current power supply module is a direct-current power supply Agilent 66319B; for providing an external input voltage value;
multimeter Fluke 8846A: the measuring device is used for measuring the output voltage of the direct-current power supply Agilent 66319B and is used as a standard value;
the equipment to be detected is specifically a product needing calibration in a factory, and the standard input voltage is 0-10V;
the device to be detected comprises a voltage division module and a processor, the voltage division module comprises a first resistor and a second resistor, the first end of the first resistor is connected with the output end of the direct-current power supply module, the second end of the first resistor is connected with the first end of the second resistor and is connected with a test pin of the processor of the device to be detected, and the second end of the second resistor is connected with the ground.
The first resistor and the second resistor are used for voltage division, and because the standard input voltage of a product needing to calibrate the ADC is 0V-10V, but the analog voltage measurable by the single-chip microcomputer ATSAMD21G18A-MU is 2.5V at most, the input voltage of the product needing to calibrate the ADC needs to be divided; when the DC power supply Aglient 66319B outputs the maximum voltage of 10V, the voltage is 2.2603V after being divided by the two divider resistors and is in the measurable range of the single chip microcomputer; the resistance value of the first resistor is 3.3V, the resistance value of the second resistor is 11.3V, and the calculation formula is as follows:
the input voltage of the singlechip is 10 × 3.3/(11.3+3.3) ═ 2.2603;
the components related to ADC calibration in the equipment to be detected are 11.3K and 3.3K voltage dividing resistors, the input voltage of a product is divided and then is transmitted to a single chip microcomputer ADC test pin PA02, and the LM4030 voltage reference chip outputs 2.5V to a single chip microcomputer PA03 pin to serve as the single chip microcomputer ADC reference voltage.
The calibration method of the production line detection equipment comprises the following steps:
s101, inputting the voltage of the direct current power supply module to the equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to a first input voltage and a second input voltage of the direct current power supply module, wherein the first input voltage and the second input voltage are obtained through the universal meter;
specifically, a direct current power supply is arranged to output two groups of voltage signals; the multimeter reads the two sets of voltage signals and records the two sets of voltage signals as a first input voltage F1 and a second input voltage F2;
the product that needs the calibration ADC is that the inside partial pressure module that is with DC power supply output voltage signal through divider resistance circuit promptly of equipment to be detected divides the voltage, gives singlechip ADC pin after dividing the voltage, and the singlechip reads its voltage value and records as first adjustment voltage M1 and second adjustment voltage M2.
S102, determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected.
Specifically, the device to be detected calculates theoretical Gain values, i.e., target Gain and Offset values, i.e., target Offset, by using the acquired F1, F2, M1 and M2.
And writing the calculated Gain and Offset into a memory of a single chip microcomputer, and calibrating an ADC value through the stored Gain and Offset when an ADC function is actually used by an end user.
The invention has simple calculation, easy operation and low cost, and can effectively improve the precision of the ADC and reduce the detection error.
On the basis of the above embodiments, the calibration method of the production line inspection apparatus will be further explained.
Optionally, the determining a target gain according to the first adjustment voltage and the second adjustment voltage includes:
calculating a difference value between the first adjusting voltage and the second adjusting voltage to obtain a first voltage difference;
calculating a difference value between the first input voltage and the second input voltage to obtain a second voltage difference value;
and determining the ratio of the first voltage value and the second voltage difference as the target gain.
Specifically, M1 is set to (F1+ Offset) Gain — formula (i)
M2 ═ F2+ Offset ═ Gain — formula (c)
Since F1, F2 are read by a multimeter, and M1 and M2 are read by a singlechip ADC, the data are known data.
The unknowns that need to be calculated are Gain and Voffset, which are also data that need to be calibrated.
According to the formula I and the formula II, the target Gain is calculated:
the formula I is a formula II,
M1-M2＝(F1–F2)*Gain
gain ═ (M1-M2)/(F1-F2); namely, the target gain is the ratio of the first voltage value and the second voltage difference, the first voltage value is M1-M2, and the second voltage value is F1-F2.
Optionally, the determining a target offset according to the first adjustment voltage and the second adjustment voltage includes:
and determining the target offset according to the first adjusting voltage, the second adjusting voltage, the first input voltage, the second input voltage and the target gain.
Optionally, the target offset amount is calculated as follows:
Offset＝[(M1+M2)/Gain-(F1+F2)]/2；
wherein Offset is a target Offset; gain is a target Gain; m1 is a first adjustment voltage; m2 is the second adjustment voltage; f1 is a first input voltage; f2 is the second input voltage.
Specifically, the formula (i) plus the formula (ii) is obtained:
(M1+M2)＝(F1+F2+2*Offset)*Gain
(M1+M2)/Gain＝F1+F2+2*Offset
offset ═ [ (M1+ M2)/Gain- (F1+ F2) ]/2; i.e. the target offset.
Since Gain has been calculated in the previous step, the value of Offset can also be calculated.
Optionally, the method further comprises:
and determining the maximum working voltage value of the processor according to the maximum voltage value of the direct-current power supply module and the voltage division circuit.
Optionally, the determining a maximum operating voltage value of the processor according to the maximum voltage value of the dc power supply module and the voltage dividing circuit includes:
and determining the ratio of the product of the maximum voltage value of the direct current power supply module and the first resistor to the sum of the first resistor and the second resistor as the maximum working voltage value of the processor, wherein the resistance value of the first resistor is smaller than that of the second resistor.
Specifically, because the acceptable input voltage range of the ADC of the single chip microcomputer is limited (the maximum power supply voltage or the external ADC reference voltage), if the signal to be tested is large, the input voltage needs to be divided, in the invention, the ADC selects the external 2.5V as the ADC reference voltage, so the maximum test voltage value of the ADC is 2.5V.
According to the hardware connection of the figure 2, the voltage of the ADC pin of the final input single chip microcomputer is 3.3/(3.3+11.3) of the output voltage of the direct current power supply, so that the maximum input voltage of the ADC is 10, 3.3/14.6, 2.260274(V)
Optionally, the method further comprises:
acquiring a third adjustment voltage;
and determining a calibration voltage according to the third adjustment voltage, the target gain and the target offset.
Optionally, the calibration voltage is obtained by:
V2＝V1/Gain–Offset；
wherein V2 is a calibration voltage; v1 is the third adjustment voltage.
Specifically, after the target gain and the target offset are determined, in actual use, a third adjustment voltage is obtained, and then the calibration voltage is calculated according to the third adjustment voltage, the target gain and the target offset by using the formula, so that the detection error is reduced, and the calibration accuracy is improved.
Fig. 3 is a schematic flow chart of a calibration method of a production line inspection apparatus in an embodiment of the present invention, which specifically includes:
the input voltage range of the equipment to be detected is 0V-10V;
output voltage point 1: 25% × 10(V) ═ 2.5V of dc power supply Agilent 66319B
Output voltage point 2: 90%. multidot.10 (V). multidot.9.0V of DC power supply Agilent 66319B
First input voltage F1, second input voltage F2: the universal meter Fluke 8846A reads the output voltage value of the direct current power supply Agilent 66319B;
first adjustment voltage M1, second adjustment voltage M2: the voltage value digital quantity read by a singlechip ADC pin PA 02;
v is the digital quantity of the calibrated ADC value;
the target Gain is the ADC calibration Gain value which needs to be written into the memory of the singlechip;
and the target Offset is an ADC calibration Offset value which needs to be written into a memory of the singlechip.
Because the acceptable input voltage range of the ADC of the single chip microcomputer is limited (the maximum power supply voltage or the external ADC reference voltage), if a signal to be tested is larger, the input voltage needs to be divided, in the invention, the ADC selects the external 2.5V as the ADC reference voltage, so the maximum test voltage value of the ADC is 2.5V.
According to the hardware connection of the figure 2, the voltage finally input into the ADC pin of the singlechip is the output voltage of the direct-current power supply 3.3/(3.3+11.3)
So that the maximum input voltage of the ADC is 10 × 3.3/14.6 ═ 2.260274(V)
1. The set voltage source outputs 2.5V, the multimeter reads data and records as F1, and the singlechip ADC reads data and records as M1.
2. The set voltage source outputs 9.0V, the multimeter reads data and records as F2, and the singlechip ADC reads data and records as M2.
3. Setting M1 to (F1+ Offset) Gain formula (i)
M2 ═ F2+ Offset ═ Gain — formula (c)
Because F1, F2, M1 and M2 can be obtained by multimeter reading and single chip ADC reading,
the unknowns that need to be calculated are Gain and Voffset, which are also data that need to be calibrated.
4. And (3) calculating Gain:
formula I
M1-M2＝(F1–F2)*Gain
Gain＝(M1–M2)/(F1-F2)
5. Calculating Offset:
formula (I) plus formula (II)
(M1+M2)＝(F1+F2+2*Offset)*Gain
(M1+M2)/Gain＝F1+F2+2*Offset
Offset＝[(M1+M2)/Gain–(F1+F2)]/2
Since Gain has been calculated in the previous step, the value of Offset can also be calculated.
6. Gain and Offset obtained using ADC calibration are verified.
Assuming that the value of the ADC read normally by the single chip ADC is V1, and the calibrated voltage is V2;
the calibrated voltage is V2 ═ V1/Gain-Offset.
The following table is the results of a number of tests taken over the entire range, as shown in table 1:
from table 1, it can be seen that:
F1＝927.2,M1＝920,F2＝3333.8,M2＝3325
gain was calculated according to the following formula:
Gain＝(M1–M2)/(F1-F2)
Gain＝(920-3325)/(927.2-3333.8)＝0.999334566
voffset is calculated according to the following equation:
Offset＝[(M1+M2)/Gain–(F1+F2)]/2
Offset＝[(920+3325)/0.999334566–(927.2+3333.8)]/2＝-6.584324958；
the calibrated value is calculated from the Gain and offset calculated above.
V2＝V1/Gain–Offset
Error calculation formula before calibration:
Error1＝(M1-F1)/4096
error calculation formula after calibration:
Error2＝(V2-F1)/4096。
TABLE 1
Average error: 0.1847% and 0.0598%
Since the single-chip ADC is 12-bit, the maximum digital value read by the ADC is 212 — 4096, so 4096 is used in calculating the error. The error before calibration and the error after calibration are added to the test data, and as shown in table 1, the error after calibration is reduced in detail.
The embodiment of the invention provides a calibration method of production line detection equipment, which comprises the steps of inputting the voltage of a direct-current power supply module to equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to the first input voltage and the second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through a universal meter; and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected, so that the equipment to be detected is calibrated before leaving a factory, and when the equipment to be detected is used, the detection error is reduced, and the true value of the signal is reflected.
The invention also provides an analog-to-digital conversion calibration system which comprises a direct-current power supply module, a multimeter and a device to be detected; the processor is a single chip microcomputer, which is not specifically limited in the embodiment of the invention, and the single chip microcomputer is specifically ATSAMD21G 18A-MU;
the direct-current power supply module is a direct-current power supply Agilent 66319B; for providing an external input voltage value;
the equipment to be detected is specifically a product needing calibration in a factory, and the standard input voltage is 0-10V;
the device to be detected comprises a voltage division module and a processor, the voltage division module comprises a first resistor and a second resistor, the first end of the first resistor is connected with the output end of the direct-current power supply module, the second end of the first resistor is connected with the first end of the second resistor and is connected with a test pin of the processor of the device to be detected, and the second end of the second resistor is connected with the ground.
The processor is used for executing the calibration method of the production line detection equipment.
The embodiment of the invention provides an analog-to-digital conversion calibration system, which comprises a direct-current power supply module, a first voltage regulator, a second voltage regulator and a first voltage regulator, wherein the voltage of the direct-current power supply module is input to equipment to be detected, and the first voltage regulator and the second voltage regulator of the equipment to be detected are determined according to a first input voltage and a second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through a universal meter; and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected, so that the equipment to be detected is calibrated before leaving a factory, and when the equipment to be detected is used, the detection error is reduced, and the true value of the signal is reflected.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A calibration method of detection equipment is applied to an analog-to-digital conversion calibration system, the analog-to-digital conversion calibration system comprises a direct-current power supply module, a multimeter and equipment to be detected, wherein the equipment to be detected comprises a voltage division module and a processor, and the method comprises the following steps:
inputting the voltage of the direct-current power supply module to the equipment to be detected, and determining a first adjustment voltage and a second adjustment voltage of the equipment to be detected according to a first input voltage and a second input voltage of the direct-current power supply module, wherein the first input voltage and the second input voltage are obtained through the universal meter;
and determining a target offset and a target gain according to the first adjusting voltage and the second adjusting voltage, wherein the target offset and the target gain are used for calibrating the equipment to be detected.
2. The method of calibrating a production line inspection apparatus as recited in claim 1, wherein said determining a target gain based on said first adjusted voltage and said second adjusted voltage comprises:
calculating a difference value between the first adjusting voltage and the second adjusting voltage to obtain a first voltage difference;
calculating a difference value between the first input voltage and the second input voltage to obtain a second voltage difference value;
and determining the ratio of the first voltage value and the second voltage difference as the target gain.
3. The method for calibrating production line inspection equipment according to claim 2, wherein the determining a target offset amount based on the first adjustment voltage and the second adjustment voltage comprises:
and determining the target offset according to the first adjusting voltage, the second adjusting voltage, the first input voltage, the second input voltage and the target gain.
4. The calibration method for a production line inspection apparatus according to claim 3, wherein the calculation formula of the target offset amount is as follows:
Offset＝[(M1+M2)/Gain-(F1+F2)]/2；
wherein Offset is a target Offset; gain is a target Gain; m1 is a first adjustment voltage; m2 is the second adjustment voltage; f1 is a first input voltage; f2 is the second input voltage.
5. The calibration method for the production line detection equipment as claimed in claim 1, wherein the voltage dividing module comprises a first resistor and a second resistor, a first end of the first resistor is connected with the output end of the DC power supply module, a second end of the first resistor is connected with a first end of the second resistor and is connected with a test pin of a processor of the equipment to be detected, and a second end of the second resistor is connected with ground.
6. The method for calibrating a production line inspection apparatus as recited in claim 5, further comprising:
and determining the maximum working voltage value of the processor according to the maximum voltage value of the direct-current power supply module and the voltage division circuit.
7. The method for calibrating production line inspection equipment according to claim 6, wherein the determining the maximum operating voltage value of the processor according to the maximum voltage value of the DC power module and the voltage divider circuit comprises:
and determining the ratio of the product of the maximum voltage value of the direct current power supply module and the first resistor to the sum of the first resistor and the second resistor as the maximum working voltage value of the processor, wherein the resistance value of the first resistor is smaller than that of the second resistor.
8. The method for calibrating a production line inspection apparatus as recited in claim 1, further comprising:
acquiring a third adjustment voltage;
and determining a calibration voltage according to the third adjustment voltage, the target gain and the target offset.
9. The calibration method of production line inspection equipment according to claim 1, wherein the calibration voltage is obtained by:
V2＝V1/Gain–Offset；
wherein V2 is a calibration voltage; v1 is the third adjustment voltage.
10. An analog-to-digital conversion calibration system comprising a dc power supply module, a multimeter and a device under test, wherein the device under test comprises a voltage divider module and a processor for performing the method of calibrating a production line inspection apparatus as recited in any one of claims 1-9.
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