CN113539768A - Preheating method and device for X-ray tube filament and imaging equipment - Google Patents
Preheating method and device for X-ray tube filament and imaging equipment Download PDFInfo
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- H—ELECTRICITY
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- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
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- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
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Abstract
The invention provides a preheating method and a preheating device for a filament of an X-ray tube and imaging equipment, wherein the preheating method comprises the following steps: acquiring exposure parameters in the filament exposure process; wherein the exposure parameters at least include: exposure parameters of previous exposure, interval time of two exposures and exposure parameters of the current exposure; determining a preheating value of the filament for the current exposure based on the exposure parameters; based on the preheating value, the filament is preheated within a fixed preheating time. The invention improves the accuracy of the preheating value and can ensure that the current of the filament reaches the set value in the shortest time.
Description
Technical Field
The invention relates to the technical field of imaging equipment, in particular to an X-ray tube filament preheating method and device and imaging equipment.
Background
When the X-ray machine performs the fluoroscopy operation, the filament current needs to be increased to reach the level of the current output value of the set tube, but the filament cannot reach the current output value of the set tube immediately due to the heating process from the quiescent current to the set tube current. In order to avoid the filament from breaking due to the sudden increase of the filament current, the X-ray tube must be preheated before scanning, so that the filament is gradually heated to the working state. In the prior art, the X-ray tube is generally preheated by the voltage and the current of the next exposure tube, and the preheating value is inaccurate.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a method and an apparatus for preheating a filament of an X-ray tube, and an imaging device, so as to improve the accuracy of a preheating value and enable a filament current to reach a set value in a shortest time.
In order to achieve the above purpose, the embodiment of the present invention adopts the following technical solutions:
in a first aspect, an embodiment of the present invention provides an X-ray tube filament preheating method, including: acquiring exposure parameters in the filament exposure process; wherein the exposure parameters at least include: exposure parameters of previous exposure, interval time of two exposures and exposure parameters of the current exposure; determining a preheating value of the filament for the current exposure based on the exposure parameters; based on the preheating value, the filament is preheated within a fixed preheating time.
In one embodiment, the step of determining the preheating value of the current exposure of the filament based on the exposure parameters includes: determining a first calorific value and a correction value of the current filament exposure based on the exposure parameters; and correcting the first preheating value based on the correction value to obtain the preheating value of the filament for the current exposure.
In one embodiment, the correction value includes: the accumulated filament heat of the previous exposure, the filament heat reduction value of the two-time exposure interval and the offset of the current exposure; the exposure parameters of the current exposure at least comprise: the tube current value of the current exposure and the tube voltage value of the current exposure; the step of determining a first calorific value and a correction value of the current filament exposure based on the exposure parameters comprises the following steps: determining a first calorific value of the filament in the current exposure based on the current value of the tube in the current exposure; determining the accumulated filament heat of the previous exposure based on the exposure parameters of the previous exposure; determining a filament heat reduction value of the two-time exposure interval based on the two-time exposure interval time; and determining the offset of the calorific value required by the exposure based on the tube voltage value of the exposure.
In one embodiment, the exposure parameters of the previous exposure include at least: the tube current value of the previous exposure and the accumulated exposure time of the previous exposure; the step of determining the accumulated filament heat of the previous exposure based on the exposure parameters of the previous exposure comprises the following steps:
the accumulated filament heat of the previous exposure is determined according to the following formula:
Fpre＝a×Ipre+b×Tpre
wherein, FpreIndicating the accumulated filament heat of the previous exposure, IpreIndicates the tube current value, T, of the previous exposurepreThe integrated exposure time of the previous exposure is shown, a is a coefficient of influence of the tube current of the previous exposure on the heating of the filament, and b is a coefficient of influence of the integrated exposure time of the previous exposure on the heating of the filament.
In one embodiment, the step of determining the first calorific value of the current exposure of the filament based on the current value of the current exposure includes:
determining a first calorific value of the filament exposure according to the following formula:
Fnext＝d×Inext
wherein, FnextDenotes a first calorific value, InextThe current value of the tube exposed at this time is shown, and d shows the coefficient of the influence of the current value of the tube exposed at this time on the first preheating value;
the step of determining a filament heat reduction value for the two-exposure interval based on the two-exposure interval time includes: the filament heat reduction value between two exposures is determined according to the following formula:
Fcooling＝c×Tcooling
Wherein, FcoolingIndicating the filament heat reduction value, T, between two exposurescoolingThe two-exposure interval time is shown, and c is the coefficient of the effect of the two-exposure interval time on the heat of the filament.
In one embodiment, the step of determining the offset of the calorific value required for the current exposure based on the tube voltage value of the current exposure includes: determining the offset of the calorific value required by the exposure according to the following formula:
Fvoltage＝e×Vnext
wherein, FvoltageOffset, V, representing the calorific value required for this exposurenextAnd e represents the coefficient of the influence of the tube voltage value of the current exposure on the first preheating value.
In one embodiment, the step of correcting the first preheat value based on the correction value to obtain the preheat value of the current filament exposure includes: and correcting the first preheating value based on the correction value according to the following formula to obtain the preheating value of the filament for the current exposure:
F＝Fpre-Fcooling+Fnext+Fvoltage
wherein F represents the preheating value of the current exposure of the filament, and FpreIndicating the accumulated filament heat of the previous exposure, FcoolingRepresents the filament heat reduction value, F, between two exposuresnextDenotes a first calorific value, FvoltageAn offset representing the calorific value required for this exposure.
In a second aspect, an embodiment of the present invention provides an X-ray tube filament preheating device, including: the parameter acquisition module is used for acquiring exposure parameters in the filament exposure process; wherein the exposure parameters at least include: exposure parameters of previous exposure, interval time of two exposures and exposure parameters of the current exposure; the preheating value determining module is used for determining the preheating value of the filament for the current exposure based on the exposure parameters; and the preheating module is used for preheating the lamp filament within a fixed preheating time based on the preheating value.
In a third aspect, embodiments of the present invention provide an imaging device, including a processor and a memory, where the memory stores computer-executable instructions capable of being executed by the processor, and the processor executes the computer-executable instructions to implement the steps of any one of the methods provided in the first aspect.
In a fourth aspect, the present invention provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to perform the steps of any one of the methods provided in the first aspect.
The embodiment of the invention has the following beneficial effects:
the embodiment of the invention provides a method, a device and an imaging device for preheating a filament of an X-ray tube, which can firstly obtain exposure parameters (at least comprising the exposure parameters of previous exposure, the interval time of two exposures and the exposure parameters of the current exposure) in the filament exposure process; then determining a preheating value of the filament for the current exposure based on the exposure parameters; and finally preheating the lamp filament within a fixed preheating time based on the preheating value. When the preheating value of the filament for the current exposure is determined, the method fully considers the exposure parameter of the previous exposure, the interval time of the two exposures and the influence of the exposure parameter of the current exposure on the temperature of the filament, thereby improving the accuracy of the preheating value; meanwhile, the method preheats the filament within a fixed preheating time, so that the current of the filament can reach a set value within the shortest time, and the imaging stabilization time is shortened.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flow chart of a method for preheating a filament of an X-ray tube according to an embodiment of the present invention;
FIG. 2 is a flowchart illustrating an embodiment of a method for preheating a filament of an X-ray tube according to the present invention;
FIG. 3 is a schematic structural diagram of an X-ray tube filament preheating device according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of an imaging apparatus according to an embodiment of the present invention.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
At present, a filament of an X-ray tube maintains a quiescent current standby state under the condition of no loading, the quiescent current can keep the filament to be maintained at a normal level, and the quiescent current is not suitable to be too large, otherwise, the aging of the filament can be accelerated; when the X-ray machine performs perspective operation, the filament current needs to be increased to reach the level of the current output value of the set tube, but the filament is heated from the static current to the current of the set tube and cannot reach the current output value of the set tube immediately, and the process is reflected on an image and has an obvious process from dark to bright. In the prior art, the filament cannot be preheated when the X-ray machine performs the perspective operation, the exposure is directly performed according to the set loading condition, and the filament is heated in the exposure process, so that the actual tube current at the initial stage of the exposure is inconsistent with the set tube current; or the X-ray tube is preheated only by the voltage and the current of the next exposure tube, and the preheating value is inaccurate.
Based on this, the method and the device for preheating the filament of the X-ray tube and the imaging device provided by the embodiment of the invention improve the accuracy of the preheating value and enable the filament current to reach the set value in the shortest time.
To facilitate understanding of the present embodiment, a detailed description will be first given of an X-ray tube filament preheating method disclosed in the present embodiment, which may be executed by an imaging device, such as a CT device, with reference to a flowchart of the X-ray tube filament preheating method shown in fig. 1, which illustrates that the method mainly includes the following steps S102 to S106:
step S102: acquiring exposure parameters in the filament exposure process; wherein the exposure parameters at least include: exposure parameters of the previous exposure, the interval time of the two exposures and the exposure parameters of the current exposure.
In specific implementation, the imaging device can record and store exposure parameters in the exposure process, and an operator can set the exposure parameters such as tube current and tube voltage before the next exposure.
Step S104: and determining the preheating value of the filament for the current exposure based on the exposure parameters.
Specifically, in the embodiment, the influence of the exposure parameter of the previous exposure, the interval time of the two exposures, and the exposure parameter of the current exposure on the filament temperature is considered, and the filament preheating value is determined by calculation under the fixed filament preheating time.
Step S106: based on the preheating value, the filament is preheated within a fixed preheating time.
In specific implementation, assuming that the fixed preheating time is 200ms, the calculated preheating value is 500, and then the filament is preheated for 200ms by the preheating value of 500.
According to the preheating method for the filament of the X-ray tube, provided by the embodiment of the invention, when the preheating value of the filament for the current exposure is determined, the exposure parameters of the previous exposure, the interval time of the two exposures and the influence of the exposure parameters of the current exposure on the temperature of the filament are fully considered, so that the accuracy of the preheating value can be improved; meanwhile, the method preheats the filament within a fixed preheating time, so that the current of the filament can reach a set value within the shortest time, and the imaging stabilization time is shortened.
In order to improve the accuracy of the preheating value, in the embodiment of the present invention, the preheating value of the filament is corrected according to the exposure parameter of the previous exposure, the interval time of the two exposures, and the influence of the exposure parameter of the current exposure on the filament temperature, and specifically, the step S104 may be implemented according to the following steps 1 to 2:
step 1: and determining a first calorific value and a correction value of the current filament exposure based on the exposure parameters.
In particular implementations, the correction value includes: the accumulated filament heat of the previous exposure, the filament heat reduction value of the two-time exposure interval and the offset of the current exposure; the exposure parameters of the current exposure at least comprise: the tube current value of the current exposure and the tube voltage value of the current exposure; the exposure parameters of the previous exposure at least include: the tube current value of the previous exposure and the accumulated exposure time of the previous exposure. Specifically, when step 1 is performed, the following methods can be adopted, but not limited to:
firstly, determining a first calorific value of the filament exposed at this time based on the tube current value of the exposure at this time. In specific implementation, the first calorific value of the current filament exposure may be determined according to the following formula:
Fnext＝d×Inext
wherein, FnextDenotes a first calorific value, InextAnd d represents the coefficient of the influence of the tube current value of the current exposure on the first preheating value.
Then, based on the exposure parameters of the previous exposure, the accumulated filament heat of the previous exposure is determined.
In particular implementation, the accumulated filament heat of the previous exposure can be determined according to the following formula:
Fpre＝a×Ipre+b×Tpre
wherein, FpreIndicating the accumulated filament heat of the previous exposure, IpreIndicates the tube current value, T, of the previous exposure preRepresents the cumulative exposure time of the previous exposure, considering that when the cumulative exposure time exceeds T1Then, the temperature of the filament tends to be stableAnd then, the rise is continued, and therefore,
a represents a coefficient of influence of the tube current of the previous exposure on the heating of the filament, and b represents a coefficient of influence of the integrated exposure time of the previous exposure on the heating of the filament.
Then, based on the two-exposure interval time, a two-exposure interval filament heat reduction value is determined.
In particular implementation, the filament heat reduction value between two exposures can be determined according to the following formula:
Fcooling＝c×Tcooling
wherein, FcoolingIndicating the filament heat reduction value, T, between two exposurescoolingRepresenting the time between two exposures, taking into account that when the time between two exposures exceeds T2Then, the temperature of the filament is stabilized in the static current condition and does not decrease any more, therefore,
c represents the coefficient of the influence of the two exposure interval time on the heat of the filament.
And finally, determining the offset of the calorific value required by the current exposure based on the tube voltage value of the current exposure.
Considering that the filament has different electron emission characteristics under different tube voltages, the tube voltage may cause a certain deviation of the preheating value, and in order to improve the accuracy of the preheating value, the offset generated by the tube voltage needs to be corrected. In specific implementation, the offset of the calorific value required for the exposure may be determined according to the following formula:
Fvoltage＝e×Vnext
Wherein, FvoltageOffset, V, representing the calorific value required for this exposurenextAnd e represents the coefficient of the influence of the tube voltage value of the current exposure on the first preheating value.
A, b, c, d, e, and T1、T2Can be preliminarily measured by experimentsIt is determined that the method is not limited herein.
Step 2: and correcting the first preheating value based on the correction value to obtain the preheating value of the filament for the current exposure.
In specific implementation, the first preheating value can be corrected based on the correction value according to the following formula to obtain the preheating value of the filament in this exposure:
F＝Fpre-Fcooling+Fnext+Fvoltage
wherein F represents the preheating value of the current exposure of the filament, and FpreIndicating the accumulated filament heat of the previous exposure, FcoolingRepresents the filament heat reduction value, F, between two exposuresnextDenotes a first calorific value, FvoltageAn offset representing the calorific value required for this exposure.
For convenience of understanding, for the above-mentioned X-ray tube filament preheating method, an embodiment of the present invention further provides a specific implementation manner, and referring to a flowchart of a specific example of the X-ray tube filament preheating method shown in fig. 2, the method mainly includes the following steps S202 to S212:
step S202: and determining the accumulated filament heat of the previous exposure based on the exposure parameters of the previous exposure.
In particular implementation, the accumulated filament heat of the previous exposure can be determined according to the following formula:
Fpre＝a×Ipre+b×Tpre
let us assume that a is 3, b is 4, and T is obtained in advance through experiments1The exposure parameter I of the previous exposure acquired as 3pre＝5mA，Tpre8 s. Due to Tpre＞T1So that TpreIf 3, then Fpre＝a×Ipre+b×Tpre＝3×5+4×3＝27。
Step S204: based on the two-exposure interval time, a two-exposure interval filament heat reduction value is determined.
In particular implementation, the filament heat reduction value between two exposures can be determined according to the following formula:
Fcooling＝c×Tcooling
assuming that c is 7, T is obtained in advance through experiments2Two-exposure interval T obtained as 3cooling10 s. Due to Tcooling＞T2So that TcoolingIf 3, then Fcooling＝c×Tcooling＝7×3＝21。
Step S206: and determining a first calorific value of the filament in the current exposure based on the current value of the tube in the current exposure.
In specific implementation, the first calorific value of the current filament exposure may be determined according to the following formula:
Fnext＝d×Inext
assuming that d is 5, the tube current value I of this exposure is obtained in advance through experimentsnextThe first preheating value F of the current filament exposure is 8mAnext＝d×Inext＝5×8＝40。
Step S208: and determining the offset of the calorific value required by the exposure based on the tube voltage value of the exposure.
In specific implementation, the offset of the calorific value required for the exposure may be determined according to the following formula:
Fvoltage＝e×Vnext
Assuming that e is 0.2, which is obtained in advance through experiments, the tube current value V of this exposure isnext70kV, the offset F of the preheating value required by the exposurevoltage＝e×Vnext＝0.2×70＝14。
Step S210: and determining the preheating value of the filament for the current exposure based on the accumulated filament heat of the previous exposure, the filament heat reduction value at the interval of two exposures, the first preheating value of the current exposure of the filament and the offset of the preheating value required by the current exposure.
In specific implementation, the preheating value of the current exposure of the filament is as follows: f ═ Fpre-Fcooling+Fnext+Fvoltage＝27-21+40+14＝60。
Step S212: based on the preheating value, the filament is preheated within a fixed preheating time.
It should be noted that, there is no necessary sequence between the steps S202 to S210, and the sequence may be arbitrarily selected, which is not limited herein.
According to the preheating method for the filament of the X-ray tube, provided by the embodiment of the invention, when the preheating value of the filament for the current exposure is determined, the influences of the previous exposure, the interval time of the two exposures and the exposure parameter of the current exposure on the temperature of the filament are fully considered, so that the accuracy of the preheating value can be improved; meanwhile, the device preheats the filament within fixed preheating time, so that the current of the filament can reach a set value within the shortest time, the filament can be preheated under the optimal preheating condition during exposure at any moment, the imaging stabilization time is shortened, and the service life of the filament is prolonged.
For the foregoing method for preheating the filament of the X-ray tube, an embodiment of the present invention further provides an apparatus for preheating the filament of the X-ray tube, referring to a schematic structural diagram of the apparatus for preheating the filament of the X-ray tube shown in fig. 3, which is shown to mainly include:
a parameter obtaining module 301, configured to obtain an exposure parameter in a filament exposure process; wherein the exposure parameters at least include: exposure parameters of the previous exposure, the interval time of the two exposures and the exposure parameters of the current exposure.
And the preheating value determining module 302 is used for determining the preheating value of the filament for the current exposure based on the exposure parameters.
And the preheating module 303 is used for preheating the lamp filament within a fixed preheating time based on the preheating value.
When the preheating value of the filament at this time of exposure is determined, the preheating device for the filament of the X-ray tube provided by the embodiment of the invention fully considers the influences of the exposure parameters of the previous exposure, the two exposure intervals and the current exposure on the temperature of the filament, so that the accuracy of the preheating value can be improved; meanwhile, the device preheats the filament within fixed preheating time, so that the current of the filament can reach a set value within the shortest time, and the imaging stabilization time is shortened.
In an embodiment, when determining the preheating value of the filament in the current exposure based on the exposure parameter, the preheating value determining module 302 is specifically configured to: determining a first calorific value and a correction value of the current filament exposure based on the exposure parameters; and correcting the first preheating value based on the correction value to obtain the preheating value of the filament for the current exposure.
In one embodiment, the correction value includes: the accumulated filament heat of the previous exposure, the filament heat reduction value of the two-time exposure interval and the offset of the current exposure; the exposure parameters of the current exposure at least comprise: the tube current value of the current exposure and the tube voltage value of the current exposure; when determining the first calorific value and the correction value of the current filament exposure based on the exposure parameter, the calorific value determination module 302 is specifically configured to: determining a first calorific value of the filament in the current exposure based on the current value of the tube in the current exposure; determining the accumulated filament heat of the previous exposure based on the exposure parameters of the previous exposure; determining a filament heat reduction value of the two-time exposure interval based on the two-time exposure interval time; and determining the offset of the calorific value required by the exposure based on the tube voltage value of the exposure.
In one embodiment, the exposure parameters of the previous exposure include at least: the tube current value of the previous exposure and the accumulated exposure time of the previous exposure; when determining the filament heat accumulated in the previous exposure based on the exposure parameter of the previous exposure, the previous heat value determining module 302 is specifically configured to:
The accumulated filament heat of the previous exposure is determined according to the following formula:
Fpre＝a×Ipre+b×Tpre
wherein, FpreIndicating the accumulated filament heat of the previous exposure, IpreIndicates the tube current value, T, of the previous exposurepreThe integrated exposure time of the previous exposure is shown, a is a coefficient of influence of the tube current of the previous exposure on the heating of the filament, and b is a coefficient of influence of the integrated exposure time of the previous exposure on the heating of the filament.
In an embodiment, when determining the first calorific value of the filament in the current exposure based on the current value of the tube in the current exposure, the calorific value determining module 302 is specifically configured to:
determining a first calorific value of the filament exposure according to the following formula:
Fnext＝d×Inext
wherein, FnextDenotes a first calorific value, InextThe current value of the tube exposed at this time is shown, and d shows the coefficient of the influence of the current value of the tube exposed at this time on the first preheating value;
when determining the filament heat reduction value of the two-exposure interval based on the two-exposure interval time, the calorific value determination module 302 is specifically configured to: the filament heat reduction value between two exposures is determined according to the following formula:
Fcooling＝c×Tcooling
wherein, FcoolingIndicating the filament heat reduction value, T, between two exposurescoolingThe two-exposure interval time is shown, and c is the coefficient of the effect of the two-exposure interval time on the heat of the filament.
In an embodiment, when determining the offset of the calorific value required for the current exposure based on the tube voltage value of the current exposure, the calorific value determination module 302 is specifically configured to: determining the offset of the calorific value required by the exposure according to the following formula:
Fvoltage＝e×Vnext
wherein, FvoltageOffset, V, representing the calorific value required for this exposurenextAnd e represents the coefficient of the influence of the tube voltage value of the current exposure on the first preheating value.
In an embodiment, when the first preheat value is corrected based on the correction value to obtain the preheat value of the filament for the current exposure, the preheat value determining module 302 is specifically configured to: and correcting the first preheating value based on the correction value according to the following formula to obtain the preheating value of the filament for the current exposure:
F＝Fpre-Fcooling+Fnext+Fvoltage
wherein F represents the preheating value of the current exposure of the filament, and FpreIndicating the accumulated filament heat of the previous exposure, FcoolingRepresents two timesExposure interval filament heat reduction value, FnextDenotes a first calorific value, FvoltageAn offset representing the calorific value required for this exposure.
The device provided by the embodiment of the present invention has the same implementation principle and technical effect as the method embodiments, and for the sake of brief description, reference may be made to the corresponding contents in the method embodiments without reference to the device embodiments.
In the description of the present invention, it should be noted that the terms "first", "second", and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
The embodiment of the invention also provides imaging equipment, which specifically comprises a processor and a storage device; the storage means has stored thereon a computer program which, when executed by the processor, performs the method of any of the above embodiments.
Fig. 4 is a schematic structural diagram of an image forming apparatus 100 according to an embodiment of the present invention, where the image forming apparatus 100 includes: a processor 40, a memory 41, a bus 42 and a communication interface 43, wherein the processor 40, the communication interface 43 and the memory 41 are connected through the bus 42; the processor 40 is arranged to execute executable modules, such as computer programs, stored in the memory 41.
The Memory 41 may include a high-speed Random Access Memory (RAM) and may also include a non-volatile Memory (non-volatile Memory), such as at least one disk Memory. The communication connection between the network element of the system and at least one other network element is realized through at least one communication interface 43 (which may be wired or wireless), and the internet, a wide area network, a local network, a metropolitan area network, etc. may be used.
The bus 42 may be an ISA bus, PCI bus, EISA bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one double-headed arrow is shown in FIG. 4, but that does not indicate only one bus or one type of bus.
The memory 41 is used for storing a program, the processor 40 executes the program after receiving an execution instruction, and the method executed by the apparatus defined by the flow process disclosed in any of the foregoing embodiments of the present invention may be applied to the processor 40, or implemented by the processor 40.
The processor 40 may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware or instructions in the form of software in the processor 40. The Processor 40 may be a general-purpose Processor, and includes a Central Processing Unit (CPU), a Network Processor (NP), and the like; the device can also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA), or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components. The various methods, steps and logic blocks disclosed in the embodiments of the present invention may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present invention may be directly implemented by a hardware decoding processor, or implemented by a combination of hardware and software modules in the decoding processor. The software module may be located in ram, flash memory, rom, prom, or eprom, registers, etc. storage media as is well known in the art. The storage medium is located in a memory 41, and the processor 40 reads the information in the memory 41 and completes the steps of the method in combination with the hardware thereof.
The computer program product of the readable storage medium provided in the embodiment of the present invention includes a computer readable storage medium storing a program code, where instructions included in the program code may be used to execute the method described in the foregoing method embodiment, and specific implementation may refer to the foregoing method embodiment, which is not described herein again.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, which are used for illustrating the technical solutions of the present invention and not for limiting the same, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. An X-ray tube filament preheating method, comprising:
acquiring exposure parameters in the filament exposure process; wherein the exposure parameters include at least: exposure parameters of previous exposure, interval time of two exposures and exposure parameters of the current exposure;
Determining a preheating value of the filament for the current exposure based on the exposure parameters;
preheating the filament for a fixed preheating time based on the preheating value.
2. The method for preheating the filament of the X-ray tube according to claim 1, wherein the step of determining the preheating value of the current exposure of the filament based on the exposure parameter comprises:
determining a first calorific value and a correction value of the current filament exposure based on the exposure parameters;
and correcting the first preheating value based on the correction value to obtain the preheating value of the filament for the current exposure.
3. The X-ray tube filament preheating method according to claim 2, wherein the correction values include: the accumulated filament heat of the previous exposure, the filament heat reduction value of the two-time exposure interval and the offset of the current exposure; the exposure parameters of the current exposure at least comprise: the tube current value of the current exposure and the tube voltage value of the current exposure;
the step of determining the first calorific value and the correction value of the current filament exposure based on the exposure parameters comprises the following steps:
determining a first calorific value of the filament in the current exposure based on the current value of the tube in the current exposure;
determining the accumulated filament heat of the previous exposure based on the exposure parameter of the previous exposure;
Determining the two-exposure interval filament heat reduction value based on the two-exposure interval time;
and determining the offset of the calorific value required by the current exposure based on the tube voltage value of the current exposure.
4. The X-ray tube filament preheating method according to claim 3, wherein the exposure parameters of the previous exposure at least include: the tube current value of the previous exposure and the accumulated exposure time of the previous exposure;
the step of determining the accumulated filament heat of the previous exposure based on the exposure parameter of the previous exposure comprises:
determining the accumulated filament heat of the previous exposure according to the following formula:
Fpre＝a×Ipre+b×Tpre
wherein, FpreIndicating the accumulated filament heat of the previous exposure, IpreIndicates the tube current value, T, of the previous exposurepreThe integrated exposure time of the previous exposure is shown, a is a coefficient of influence of the tube current of the previous exposure on the heating of the filament, and b is a coefficient of influence of the integrated exposure time of the previous exposure on the heating of the filament.
5. The method for preheating the filament of the X-ray tube according to claim 3, wherein the step of determining the first preheating value of the current exposure of the filament based on the tube current value of the current exposure comprises:
Determining a first calorific value of the filament exposure according to the following formula:
Fnext＝d×Inext
wherein, FnextDenotes a first calorific value, InextThe current value of the tube exposed at this time is shown, and d shows the coefficient of the influence of the current value of the tube exposed at this time on the first preheating value;
the step of determining the two-exposure interval filament heat reduction value based on the two-exposure interval time comprises:
determining the two-exposure interval filament heat reduction value according to the following formula:
Fcooling＝c×Tcooling
wherein, FcoolingIndicating the filament heat reduction value, T, between two exposurescoolingThe two-exposure interval time is shown, and c is the coefficient of the effect of the two-exposure interval time on the heat of the filament.
6. The method according to claim 3, wherein the step of determining the offset of the preheating value required for the current exposure based on the tube voltage value of the current exposure comprises:
determining the offset of the calorific value required by the exposure according to the following formula:
Fvoltage＝e×Vnext
wherein, FvoltageOffset, V, representing the calorific value required for this exposurenextAnd e represents the coefficient of the influence of the tube voltage value of the current exposure on the first preheating value.
7. The method for preheating the filament of the X-ray tube according to claim 3, wherein the step of correcting the first preheating value based on the correction value to obtain the preheating value of the current exposure of the filament comprises:
And correcting the first preheating value based on the correction value according to the following formula to obtain the preheating value of the filament for the current exposure:
F＝Fpre-Fcooling+Fnext+Fvoltage
wherein F represents the preheating value of the current exposure of the filament, and FpreIndicating the accumulated filament heat of the previous exposure, FcoolingRepresents the filament heat reduction value, F, between two exposuresnextDenotes a first calorific value, FvoltageAn offset representing the calorific value required for this exposure.
8. An X-ray tube filament preheating device, comprising:
the parameter acquisition module is used for acquiring exposure parameters in the filament exposure process; wherein the exposure parameters include at least: exposure parameters of previous exposure, interval time of two exposures and exposure parameters of the current exposure;
the preheating value determining module is used for determining the preheating value of the filament for the current exposure based on the exposure parameters;
and the preheating module is used for preheating the lamp filament within a fixed preheating time based on the preheating value.
9. An imaging device comprising a processor and a memory, the memory storing computer-executable instructions executable by the processor, the processor executing the computer-executable instructions to implement the steps of the method of any one of claims 1 to 7.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method according to any one of the claims 1 to 7.
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