CN113514699A - Thermal control system, thermal control method and temperature correction device - Google Patents

Abstract

A thermal control system, a thermal control method and a temperature correction device are provided. The temperature correction device includes a plurality of resistors. The thermal control device is used for measuring the resistors to obtain a plurality of corresponding measured resistance values, and generating a plurality of resistance correction parameters according to the measured resistance values and the resistance values of the resistors. The thermal control device is further configured to adjust a plurality of first measured temperature values corresponding to a plurality of first locations in the thermal control device according to the plurality of resistance calibration parameters, so as to obtain a plurality of first temperature values corresponding to the plurality of first locations.

Description

Thermal control system, thermal control method and temperature correction device

Technical Field

The present invention relates to thermal control systems, and particularly to a temperature calibration device in a thermal control system.

Background

With technological advances, the convenience of vehicles has accelerated the rate of transmission of infectious diseases. Infection of diseases such as SARS, avian influenza, dengue and the like is a challenge that needs to be faced globally today. How to construct an effective prevention and treatment strategy, rapidly detect and confirm suspected cases, and perform early isolation or confirmation treatment is an object of current detection medicine efforts. Therefore, the development of real-time in-situ detection means for infectious diseases is a very important issue.

Although rapid screening immunology is frequently used at present, the method can perform primary screening within 30 minutes, but is only suitable for detecting high-concentration antigen samples and only suitable for a few infectious diseases, so the method has limitation. If a molecular detection method is adopted, relatively speaking, high-accuracy detection and analysis can be provided, but in the prior art, due to the fact that a plurality of large and expensive machines are needed for operation, and a professional is needed to operate a complex program, the technology can only carry out detection in a small number of large research and development centers and clinical analysis laboratories. Moreover, the current calibration technology needs to connect the machine and the external calibration device through computer calibration software to transmit calibration data, and the setup for performing calibration is complex and the operation is complicated. Therefore, how to develop a related art capable of overcoming the above problems is an important issue in the art.

Disclosure of Invention

An embodiment of the invention discloses a thermal control system, which comprises a temperature correction device and a thermal control device. The temperature correction device includes a plurality of resistors. The thermal control device is used for measuring the resistors to obtain a plurality of corresponding measured resistance values, and generating a plurality of resistance correction parameters according to the measured resistance values and the resistance values of the resistors. The thermal control device is further configured to adjust a plurality of first measured temperature values corresponding to a plurality of first locations in the thermal control device according to the plurality of resistance correction parameters, so as to obtain a plurality of first temperature values corresponding to the plurality of first locations.

Another embodiment of the present invention discloses a thermal control method, comprising the following operations. A plurality of positions in a thermal control device are measured by a plurality of temperature sensors to obtain a plurality of measured temperature values. A plurality of resistance correction parameters are obtained based on a plurality of resistance values corresponding to a plurality of resistors in a temperature correction device and a plurality of measured resistance values obtained by measuring the plurality of resistors through a thermal control device. And calculating the resistance correction parameters and the measured temperature values to obtain a plurality of temperature values corresponding to a plurality of positions.

In another embodiment of the present invention, a temperature calibration device is applied to a thermal control device, and the temperature calibration device includes a plurality of first temperature sensors and a plurality of resistors. The first temperature sensors are used for measuring a plurality of first positions in the thermal control device to obtain a plurality of first measured temperature values. The plurality of resistors have a plurality of resistance values and a plurality of measured resistance values measured by the thermal control device. The thermal control device is used for generating a plurality of resistance correction parameters according to a plurality of resistance values and a plurality of measured resistance values, and adjusting a plurality of first measured temperature values according to the plurality of resistance correction parameters to obtain a plurality of first temperature values corresponding to a plurality of first positions in the thermal control device.

Drawings

Fig. 1 is a functional block diagram of an analytical instrument according to an embodiment of the present disclosure.

Fig. 2 is a functional block diagram of a thermal control system according to an embodiment of the present disclosure.

Fig. 3 is a flowchart illustrating a thermal control method according to an embodiment of the disclosure.

Description of reference numerals:

10: analytical instrument

100: thermal control system

110: temperature correction device

120: thermal control device

112: resistor group

114. 212 a: temperature sensor group

210: heating and cooling unit

220: control unit

222: processor with a memory having a plurality of memory cells

224: controller

224 a: analog-to-digital converter

226: memory unit

226 a: volatile memory

226 b: nonvolatile memory

212: substrate

Z1-Zk, S1-Sm: temperature sensor

Q1-Qk, P1-Pm: position of

TQ 1-TQk, TP 1-TPm: measuring temperature values

T1 to Tj: heating and refrigerating device

R1-Rn: resistor with a resistor element

b 1: resistance correction parameter set

b 2: internal temperature correction parameter set

b 3: external temperature correction parameter set

S310, S320, S330: step (ii) of

Detailed Description

Unless defined otherwise herein, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and the present invention and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein. Moreover, although terms such as "first," "second," …, etc., may be used herein to describe various elements, these terms are used merely to distinguish one element or operation from another element or operation described in similar technical terms. Unless the context clearly dictates otherwise, the terms do not specifically refer or imply an order or sequence nor are they intended to limit the invention.

In the following description, numerous implementation details are set forth in order to provide a more thorough understanding of the present disclosure. It should be understood, however, that these implementation details should not be used to limit the disclosure. That is, in some embodiments of the disclosure, such practical details are not necessary.

Fig. 1 is a functional block diagram of an analytical instrument according to an embodiment of the present disclosure. As shown in fig. 1, the analyzer 10 includes a thermal control system 100, and the thermal control system 100 includes a temperature calibration device 110 and a thermal control device 120. In some embodiments, the analysis instrument 10 may be a nucleic acid detector or a fully automated nucleic acid analyzer or other analysis instrument. In some embodiments, the thermal control system 100 is not limited to use with analytical instruments 10, and the thermal control system 100 may be used with any other type of instrument requiring temperature control.

The temperature calibration device 110 includes a resistor group 112 and a temperature sensor group 114. In some embodiments, the set of temperature sensors 114 is used to measure a plurality of locations in the thermal control device 120 to obtain a corresponding plurality of measured temperature values. In some embodiments, the thermal control device 120 obtains a plurality of corresponding measured resistance values by measuring a plurality of thermistors in the temperature sensor group 114, and calculates the plurality of measured resistance values of the plurality of thermistors to obtain the plurality of measured temperature values.

In general, the measured resistance values obtained when the thermal control device 120 measures the set of temperature sensors 114, the set of resistors 112, or other resistors are not necessarily accurate. For example, the measured resistance of the thermistor may be greater or less than the actual resistance of the thermistor.

Compared with the above method, the embodiment of the invention adjusts the plurality of measured resistance values according to the plurality of resistance calibration parameters to obtain the corresponding plurality of resistance values, and then calculates the plurality of resistance values to obtain the plurality of temperature values. In other words, in some embodiments, the resistance calibration parameters and the measured temperature values are calculated to obtain actual temperature values, and the specific manner will be described below with reference to the embodiment shown in fig. 2.

In some embodiments, the resistance values of the resistor bank 112 are known information, such as information provided by a manufacturer purchasing the resistor bank 112, or other accurate measurements of the resistor bank 112 from a utility meter. In some embodiments, the thermal control device 120 is configured to measure the resistor group 112 to obtain a plurality of measured resistance values, and generate a plurality of resistance calibration parameters according to the plurality of measured resistance values and the plurality of resistance values of the resistor group 112. In some embodiments, the resistance calibration parameters may include differences between the resistance values and the measured resistance values, and may also include other parameters that can describe the relationship between the resistance values and the measured resistance values. In some embodiments, the resistor bank 112 may include a plurality of high precision resistors or other types of resistors.

In some embodiments, the resistance value and the temperature value may be converted to each other, and if one is known, the other can be calculated by a mathematical relationship between the two. In some embodiments, the plurality of measured temperature values are scaled from a plurality of measured resistance values, and the actual plurality of temperature values are scaled from an actual plurality of resistance values, wherein the plurality of resistance values may be different from the plurality of measured resistance values, and thus the plurality of temperature values may be different from the plurality of measured temperature values.

Fig. 2 is a functional block diagram of a thermal control system according to an embodiment of the present disclosure. As shown in fig. 2, the thermal control system 100 includes a temperature calibration device 110 and a thermal control device 120, wherein the functions and the mutual operation relationship of the temperature calibration device 110 and the thermal control device 120 are as described above, and therefore, the description thereof is omitted here. In some embodiments, as shown in fig. 2, the thermal control device 120 includes a heating and cooling unit 210 and a control unit 220. The heating and cooling unit 210 is used to heat or cool a plurality of locations on the substrate 212. The control unit 220 is used to control the heating and cooling unit 210 so that the temperature values of a plurality of positions on the substrate 212 reach the temperature values desired by the user. The control unit 220 is further configured to measure a plurality of measured temperature values at a plurality of positions, and generate a plurality of actual temperature values according to the plurality of measured temperature values.

Next, as shown in fig. 2, in some embodiments, the control unit 220 includes a processor 222, a controller 224 and a memory unit 226. The controller 224 is configured to receive a plurality of signals from the heating and cooling unit 210 and the temperature calibration device 110, and transmit a control signal to the heating and cooling unit 210, wherein the plurality of signals include a plurality of measured resistance values of the resistor group 112 and a plurality of measured temperature values of the substrate 212. The processor 222 is configured to operate on the signals and the parameters in the memory unit 226 to obtain a plurality of temperature values. The memory unit 226 is used for storing a plurality of parameters and providing the plurality of parameters to the processor 222.

In some embodiments, the controller 224 may be a microcontroller (microcontroller), but the invention is not limited thereto, and the controller 224 may be other electronic components with control functions. In some embodiments, the processor 222 may be a central processing unit (cpu), a general-purpose processor (general-purpose processor), or a Digital Signal Processor (DSP), but the invention is not limited thereto. In some embodiments, the functions of the processor 222 may be performed by the controller 224.

In some embodiments, the controller 224 includes an analog-to-digital converter 224 a. The analog-to-digital converter 224a is used for converting the signals, especially converting the analog signal into a digital signal, so as to facilitate the operation of the processor 222.

In some embodiments, the memory unit 226 includes a volatile memory 226a and a non-volatile memory 226 b. In some embodiments, the volatile memory 226a may be a Static Random Access Memory (SRAM) or a Dynamic Random Access Memory (DRAM), but the invention is not limited thereto. In some embodiments, the non-volatile memory 226b may be a Read Only Memory (ROM), an Electrically Erasable Programmable Read Only Memory (EEPROM), a hard disk (hard disk), or a solid-state disk (solid-state disk), but the invention is not limited thereto.

In some embodiments, the heating and cooling unit 210 includes a substrate (heating base)212, a plurality of thermal cooling devices (TEC devices) T1-Tj, and a temperature sensor group 212 a. In some embodiments, the temperature sensor set 212a includes a plurality of temperature sensors Z1 Zk, where j and k are positive integers. The temperature sensors Z1-Zk are used to measure a plurality of positions Q1-Qk on the substrate 212 to obtain a plurality of measured temperature values TQ 1-TQk corresponding to the positions Q1-Qk. For example, the temperature sensor Z1 is used for measuring the position Q1 to obtain a measured temperature value TQ1 corresponding to the position Q1, the temperature sensor Z2 is used for measuring the position Q2 to obtain a measured temperature value TQ2 corresponding to the position Q2, and so on, the temperature sensor Zk is used for measuring the position Qk to obtain a measured temperature value TQk corresponding to the position Qk.

In some embodiments, the substrate 212, also referred to as a heating substrate, may be made of a material that is easily heat conductive, such as metal, but the invention is not limited thereto. In some embodiments, the heating refrigerators T1-Tj heat or cool the substrate 212 in accordance with control signals from the controller 224. In some embodiments, the heating and cooling units T1-Tj may be heating and cooling chips (thermal cooling ICs), heating and cooling devices implemented by conventional electric heaters and fans, or other devices with temperature adjusting function.

In some embodiments, the number of heating refrigerators T1-Tj is equal to the number of locations Q1-Qk, i.e., j is equal to k, heating refrigerator T1 heats location Q1, heating refrigerator T2 heats location Q2, and so on, heating refrigerator Tj heats location Qj.

It should be noted that the positions of the heating refrigerators T1 to Tj do not necessarily correspond to the positions Q1 to Qk. In the embodiment of the present invention, the relationship between the positions of the heating refrigerators T1 to Tj and the positions Q1 to Qk is not limited to the above-described embodiment. Other relationships of the positions of the heating and cooling units T1-Tj to the positions Q1-Qk are also within the scope of the present disclosure. For example, in some embodiments, the positions Q1 and Q2 may be heated together by a heating refrigerator T1. In some embodiments, heating refrigerators T1 and T2 may heat position Q1 in common. In some embodiments, the locations Q1 Qk are all heated by the same heating refrigerator T1.

In some embodiments, the temperature calibration device 110 includes a resistor bank 112 and a temperature sensor bank 114. In some embodiments, the resistor bank 112 includes a plurality of resistors R1-Rn. In some embodiments, the temperature sensor group 114 includes a plurality of temperature sensors S1-Sm. Wherein n and m are both positive integers.

In some embodiments, the temperature sensors S1 Sm are configured to measure a plurality of positions P1 Pm of the substrate 212 to obtain a plurality of measured temperature values TP1 TPm corresponding to the positions P1 Pm. For example, the temperature sensor S1 is used to measure the position P1 to obtain a measured temperature value TP1 corresponding to the position P1, the temperature sensor S2 is used to measure the position P2 to obtain a measured temperature value TP2 corresponding to the position P2, and so on, the temperature sensor Sm is used to measure the position Pm to obtain a measured temperature value TPm corresponding to the position Pm.

In some embodiments, the positions P1 Pm are used to place some experimental objects, and the positions P1 Pm are, for example, the positions of the respective bottoms of the respective test tubes, but the invention is not limited thereto. In some embodiments, the locations Q1 Qk are configured to be heated by the heating refrigerators T1 Tj and conduct thermal energy to the locations P1 Pm. In some embodiments, the temperature values for positions P1 Pm may be calculated from the temperature values for positions Q1 Qk through a mathematical model.

It should be noted that, as described above, in the embodiment of the present invention, the relationship between the positions of the heating refrigerators T1 to Tj and the positions Q1 to Qk is not limited to the embodiment described herein. In the embodiment of the present invention, the relationship between the positions of the resistors R1-Rn, the positions of the heating refrigerators T1-Tj, the positions Q1-Qk and the positions P1-Pm is not limited to the embodiment described herein. Other relationships between the positions of the resistors R1-Rn, the positions of the heating and cooling refrigerators T1-Tj, the positions Q1-Qk and the positions P1-Pm are also within the scope of this disclosure. In addition, in the embodiment of the present invention, the number of the heating refrigerators T1-Tj, the number of the positions Q1-Qk, the number of the positions P1-Pm and the number of the resistors R1-Rn are not limited to the embodiments described herein. In different embodiments, m, n, j, k may be the same positive integer or different positive integers.

In some embodiments, the non-volatile memory 226b is used to store the resistance correction parameter set b1, the internal temperature correction parameter set b2, and the external temperature correction parameter set b 3. In some embodiments, the temperature sensor measures the temperature by using the characteristic that the resistance of the thermistor varies with the temperature, so that the thermal control device 120 measures the thermistor in the temperature sensor to obtain a corresponding measured resistance, and converts the measured resistance to obtain a measured temperature. In some embodiments, the external temperature calibration parameter set b3 is used to describe the corresponding relationship between the measured resistance of the thermistor in the temperature sensors S1 Sm and the measured temperature TP1 TPm. In other words, the measured temperature values TP1 to TPm can be obtained by performing calculation based on the measured resistance values of the thermistors in the temperature sensors S1 to Sm and the external temperature correction parameter group b3, and the measured resistance values of the thermistors in the temperature sensors S1 to Sm can be obtained by performing calculation based on the measured temperature values TP1 to TPm and the external temperature correction parameter group b3 by the thermal control device 120. Similarly, in some embodiments, the internal temperature correction parameter set b2 represents the correspondence between the measured resistance values of the thermistors in the temperature sensors Z1 Zk and the measured temperature values TQ1 TQk at the corresponding positions Q1 Qk. In some embodiments, the above-described operations of scaling and arithmetic are performed by the processor 222.

In a general practice, the measured resistance value obtained by the thermal control device 120 measuring the thermistor in the temperature sensor may be inaccurate, so that the corresponding measured temperature value is inaccurate. Compared with the above method, the embodiment of the invention adjusts the measured resistance value, i.e. adjusts the corresponding measured temperature value, by the resistance calibration parameter set b1, so as to obtain the correct temperature value. In some embodiments, the temperature sensors can be the temperature sensors Z1-Zk, and can also be the temperature sensors S1-Sm.

In some embodiments, the resistance values corresponding to the resistors R1-Rn are known information, the resistance correction parameter set b1 is generated according to the resistance values and the measured resistance values obtained by the thermal control device 120 measuring the resistors R1-Rn, and the actual temperature value can be obtained by calculating the resistance correction parameter set b1 and the measured temperature value. In some embodiments, the operations of the above operations are performed by the processor 222.

For example, in some embodiments, the resistance value of the resistor R1 is 10k ohms (10 k ohms), but the measured resistance value obtained by the thermal control device 120 measuring the resistor R1 is 12k ohms, so the resistance correction parameter group b1 stores the information that the actual resistance value should be 10k ohms when the measured resistance value is 12k ohms, then the measured resistance value obtained by the thermal control device 120 measuring the thermal resistance in the temperature sensor S1 is 12k ohms, and the external temperature correction parameter group b3 can convert the measured resistance value TP1 obtained by the temperature sensor S1 measuring the position P7 when the measured resistance value is 12k ohms into 1 degrees celsius, but the actual resistance value is 10k ohms when the measured resistance value is 12k ohms, so the actual temperature value corresponding to 10k ohms is 25 degrees celsius by the external temperature correction parameter group b3, in summary, it can be known that the actual temperature value at the position P1 is 25 degrees celsius instead of 28 degrees celsius. To summarize, in some embodiments, the actual temperature value may be obtained by adjusting the measured temperature value by the resistance correction parameter set b 1.

In some embodiments, the processor 222 is configured to access the resistance correction parameter set b1 stored in the memory 226, receive a plurality of measured temperature values TP 1-TPm or TQ 1-TQk transmitted by the temperature correction device 110, and perform operations on the resistance correction parameter set b1 and the plurality of measured temperature values TP 1-TPm or TQ 1-TQk to generate a plurality of temperature values.

In some embodiments, thermal control system 100 includes temperature sensors Z1 Zk, but not temperature sensors S1 Sm. In some embodiments, thermal control system 100 includes temperature sensors S1-Sm, but does not include temperature sensors Z1-Zk. In some embodiments, thermal control system 100 includes both temperature sensors S1-Sm and Z1-Zk.

In some embodiments, the control unit 220 controls the heating and cooling unit 210 to heat or cool one or more locations on the substrate to a plurality of target temperatures through a calibration process. In some embodiments, the one or more positions may be at least one of the positions P1-Pm, or at least one of the positions Q1-Qk. The first column of table 1 presents the plurality of target temperatures. The second column of table 1 presents a plurality of measured temperature values measured by the temperature sensors corresponding to the one or more locations. The third column of table 1 presents a plurality of temperature values resulting from adjusting a plurality of measured temperature values by the resistance correction parameter set b 1. As shown in table 1, in some embodiments, the temperature value obtained by adjusting the resistance correction parameter set b1 is closer to the target temperature value than the measured temperature value.

Target temperature value	95.0	50.0	58.0	60.0	42.0
						Measuring temperature values	94.9	50.8	58.5	60.5	42.8
Adjusted temperature value	94.9	49.9	57.9	59.9	41.9

TABLE 1

In summary, in some embodiments, the temperature calibration device 110 can assist the thermal control device 120 in calibration. In some embodiments, the temperature correction device 110 has a size that can be easily carried, and thus, convenience in maintaining the thermal control device 120 can be improved. In some embodiments, the user only needs to execute the built-in automatic calibration procedure of the analyzer 10 to complete the detection and calibration, thereby improving the ease of maintenance of the thermal control device 120.

Fig. 3 is a flowchart illustrating a thermal control method according to an embodiment of the disclosure. In some embodiments, the thermal control method illustrated in FIG. 3 may be applied to the thermal control system 100 illustrated in FIG. 2. Referring to fig. 3 and fig. 2, in step S310, a plurality of positions in the thermal control device 120 are measured by a plurality of temperature sensors to obtain a plurality of measured temperature values. In some embodiments, the plurality of temperature sensors can be the temperature sensors S1-Sm or the temperature sensors Z1-Zk. In some embodiments, the plurality of positions can be positions P1-Pm or positions Q1-Qk. In some embodiments, the plurality of measured temperature values may be measured temperature values TP 1-TPm or measured temperature values TQ 1-TQk.

In step S320, a plurality of resistance correction parameters are obtained based on a plurality of resistance values corresponding to the plurality of resistors R1 to Rn in the temperature correction device 110 and a plurality of measured resistance values obtained by measuring the plurality of resistors R1 to Rn by the thermal control device 120. In some embodiments, the resistance correction parameter set b1 includes a plurality of resistance correction parameters as described above.

In step S330, a plurality of resistance calibration parameters and a plurality of measured temperature values are calculated to obtain a plurality of temperature values corresponding to a plurality of positions.

In some embodiments, the thermal control method of FIG. 3 further includes heating or cooling the plurality of locations Q1 Qk via a plurality of heating refrigerators T1 Tj, measuring the plurality of locations Q1 Qk within the thermal control device 120 via a plurality of temperature sensors Z1 Zk within the thermal control device 120 to obtain a plurality of measured temperature values TQ1 TQk.

In some embodiments, the thermal control method shown in FIG. 3 further includes measuring a plurality of positions P1 Pm in the thermal control device 120 by a plurality of temperature sensors S1 Sm in the temperature calibration device 110 to obtain a plurality of measured temperature values TP1 TPm.

In summary, the thermal control system, the thermal control method and the temperature calibration device according to the embodiments of the invention can improve the accuracy of temperature control and improve the convenience and simplicity of maintaining the thermal control device.

Although the present invention has been described with reference to the above embodiments, it should be understood that various changes and modifications can be made therein by those skilled in the art without departing from the spirit and scope of the invention.

Claims (10)

1. A thermal control system, comprising:

a temperature correction device comprising a plurality of resistors; and

a thermal control device for measuring the resistors to obtain corresponding measured resistance values and generating resistance correction parameters according to the measured resistance values and the resistance values of the resistors;

the thermal control device is further configured to adjust a plurality of first measured temperature values corresponding to a plurality of first locations in the thermal control device according to the plurality of resistance calibration parameters, so as to obtain a plurality of first temperature values corresponding to the plurality of first locations.

2. The thermal control system of claim 1, wherein the temperature calibration device is configured to measure the plurality of first locations to obtain the plurality of first measured temperature values.

3. The thermal control system of claim 2, wherein the thermal control device comprises:

a memory for storing the plurality of resistance calibration parameters; and

the processor is used for accessing the plurality of resistance correction parameters stored in the memory, receiving the plurality of first measured temperature values transmitted by the temperature correction device, and calculating the plurality of resistance correction parameters and the plurality of first measured temperature values to generate the plurality of first temperature values.

4. The thermal control system of claim 1, wherein the thermal control device comprises:

a plurality of heating refrigerators for heating or cooling the plurality of first locations; and

the first temperature sensors are used for measuring the first positions to obtain first measured temperature values.

5. The thermal control system of claim 4, wherein the temperature correction device further comprises:

a plurality of second temperature sensors for measuring a plurality of second locations in the thermal control device to obtain a plurality of second measured temperature values;

the thermal control device is further configured to adjust the second measured temperature values according to the resistance correction parameters to obtain second temperature values corresponding to the second locations.

6. A method of thermal control, comprising:

measuring a plurality of positions in a thermal control device through a plurality of temperature sensors to obtain a plurality of measured temperature values;

obtaining a plurality of resistance correction parameters based on a plurality of resistance values corresponding to a plurality of resistors in a temperature correction device and a plurality of measured resistance values obtained by measuring the plurality of resistors through the thermal control device; and

and calculating the resistance correction parameters and the measured temperature values to obtain a plurality of temperature values corresponding to the positions.

7. The thermal control method of claim 6, further comprising:

heating or cooling the plurality of locations by a plurality of heating and cooling devices; and

the plurality of positions are measured by the plurality of temperature sensors in the thermal control device to obtain a plurality of measured temperature values.

8. The thermal control method of claim 6, further comprising:

the plurality of positions are measured by the plurality of temperature sensors in the temperature correction device to obtain a plurality of measured temperature values.

9. A temperature correction device is applied to a thermal control device and comprises:

a plurality of first temperature sensors for measuring a plurality of first locations in the thermal control device to obtain a plurality of first measured temperature values; and

a plurality of resistors having a plurality of resistance values and a plurality of measured resistance values measured by the thermal control device;

the thermal control device is used for generating a plurality of resistance correction parameters according to the plurality of resistance values and the plurality of measured resistance values, and adjusting the plurality of first measured temperature values according to the plurality of resistance correction parameters to obtain a plurality of first temperature values corresponding to the plurality of first positions in the thermal control device.

10. The temperature correction device of claim 9, the thermal control device comprising:

a plurality of heating refrigerators for heating or cooling a plurality of second locations in the thermal control device; and

a plurality of second temperature sensors for measuring the second positions to obtain a plurality of second measured temperature values;

the thermal control device is further configured to calculate the plurality of second measured temperature values and the plurality of resistance correction parameters to generate a plurality of second temperature values corresponding to the plurality of second locations.

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