CN113506223A - Image defect detection method and device, storage medium and medical imaging system - Google Patents
Image defect detection method and device, storage medium and medical imaging system Download PDFInfo
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Abstract
The invention relates to an image defect detection method and device, a storage medium and a medical imaging system. According to one embodiment, the image defect detection method of the flat panel detector comprises the following steps: determining a suspected defect pixel on an image acquired by a flat panel detector; marking the suspected defect pixels on a suspected defect map; determining a defective pixel based on the suspected defect map; and marking the defective pixel in a defect map. According to the scheme provided by the invention, under the condition that normal medical use is not influenced, newly-appeared defective pixels can be automatically identified and added into the defect map for correction, so that the use experience of a user is improved, and the maintenance cost is reduced.
Description
Technical Field
The invention relates to the technical field of medical instruments, in particular to an image defect detection method of a flat panel detector, a computer storage medium, an image defect detection device of the flat panel detector and an X-ray medical imaging system.
Background
The flat panel detector is an imaging component commonly used for X-ray medical imaging, and defective pixels (such as pixels which do not display dead pixels of images at all or normally image only under a specific exposure dose and have poor linearity and abnormal performances under other doses) caused by the production process, component aging and the like are problems that the flat panel detector is difficult to avoid and the imaging quality is affected. Thus, the flat panel detector needs to be calibrated.
At present, the conventional calibration process is divided into a calibration before the flat panel detector leaves the factory and a calibration in the use stage. Prior to shipment, existing defective pixels may be identified and calibration completed. In the use stage, calibration is still required to be carried out continuously over time to improve the image quality, and an engineer is often required to complete relevant calibration work on site. However, this calibration method is time-consuming and labor-consuming, and new defective pixels are generated before the next calibration, resulting in image quality.
In view of the above problems, it is necessary to provide a corresponding solution to complete the defect detection and calibration of the flat panel detector in a time and labor saving manner.
Disclosure of Invention
In view of the above, an aspect of the present invention provides an image defect detecting method for a flat panel detector, including: determining a suspected defect pixel on an image acquired by a flat panel detector; marking the suspected defect pixels on a suspected defect map; determining a defective pixel based on the suspected defect map; and marking the defective pixel in a defect map.
Wherein the step of determining the defective pixel comprises: respectively determining suspected defect pixels on each image aiming at different images acquired by the flat panel detector for preset times; marking each suspected defect pixel on the suspected defect map; and determining the suspected defect pixel marked on the suspected defect map for the number of times meeting the preset condition as the defect pixel.
Wherein the image is an exposure image or a dark field image, and the step of determining the suspected defect pixel comprises: and determining pixels with abrupt gray values on the exposure image or the dark field image as suspected defect pixels.
And the difference value between the gray value of the pixel with the sudden change of the gray value and the average gray value of the pixels in the preset neighborhood exceeds a preset threshold value.
Wherein the image is an exposure image, and the step of determining the suspected defective pixel comprises: and inspecting abnormal response pixels inside and outside the exposure area of the flat panel detector, and determining the abnormal response pixels as suspected defect pixels.
Wherein the image is a dark field image, and the step of determining the suspected defective pixel comprises: and identifying suspected defective pixels or suspected defective pixel segments based on the read gain characteristics of the dark-field image.
The image defect detection method of the flat panel detector further comprises the following steps: and correcting subsequent exposure images of the flat panel detector based on the defect map.
In another aspect, the present invention provides a computer storage medium having stored therein program instructions executable to implement any of the methods described above.
In another aspect, the present invention provides an image defect detecting apparatus for a flat panel detector, including: the detection unit is used for determining suspected defective pixels on an image acquired by the flat panel detector; a first marking unit, configured to mark the suspected-defect pixel on a suspected-defect map; a determining unit for determining a defective pixel based on the suspected defect map; and the second marking unit is used for marking the defective pixel on a defect map.
In another aspect, the present invention provides an X-ray medical imaging system, comprising: a flat panel detector; an image defect detecting device of the flat panel detector; and the control system is used for correcting the subsequent exposure image of the flat panel detector according to the defect map fed back by the image defect detection device.
According to the scheme provided by the invention, under the condition that normal medical use is not influenced, newly-appeared defective pixels can be automatically identified and added into the defect map for correction, so that the use experience of a user is improved, and the maintenance cost is reduced.
Drawings
The above and other features and advantages of the present invention will become more apparent to those of ordinary skill in the art by describing in detail embodiments thereof with reference to the attached drawings in which:
fig. 1 is a schematic flow chart of an image defect detection method of a flat panel detector according to an embodiment of the invention.
Fig. 2 is a schematic diagram of a defect map according to an embodiment of the invention.
FIG. 3 is a diagram illustrating a predetermined neighborhood according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of a dark field image according to an embodiment of the present invention.
FIG. 5 is a diagram illustrating a suspected defect map according to an embodiment of the invention.
Fig. 6 is a schematic block diagram of an image defect detecting apparatus of a flat panel detector according to an embodiment of the present invention.
FIG. 7 is a schematic block diagram of an X-ray medical imaging system according to an embodiment of the present invention.
Wherein the reference numbers are as follows:
image defect detection method of 100 flat panel detector
S110-S140 method
P defect map
R1 suspected defect pixel segment
Image defect detection device of 600 flat panel detector
610 detection unit
620 first marking unit
630 determination unit
640 second marking element
700X-ray medical imaging system
710 flat panel detector
Image defect detection device of 720 flat panel detector
730 control system
Detailed Description
In order to more clearly understand the technical features, objects, and effects of the present invention, embodiments of the present invention will now be described with reference to the accompanying drawings, in which like reference numerals refer to like parts throughout.
"exemplary" means "serving as an example, instance, or illustration" herein, and any illustration, embodiment, or steps described as "exemplary" herein should not be construed as a preferred or advantageous alternative.
For the sake of simplicity, the drawings only schematically show the parts relevant to the present invention, and they do not represent the actual structure as a product. In addition, in order to make the drawings concise and understandable, components having the same structure or function in some of the drawings are only schematically illustrated or only labeled.
In this document, "a" or "an" means not only "but also" more than one ". In this document, "first", "second", and the like are used only for distinguishing one from another, and do not indicate the degree of importance and order thereof, and the premise that each other exists, and the like.
As used herein, a "defective pixel" or "suspected defective pixel" may have a variety of representations, such as a single pixel point, a cluster of pixels, a stripe of pixels, and the like, and the invention is not limited in this respect.
Herein, "calibration" or "defect calibration" or the like means an overall calibration process including detection and image correction of defective pixels.
First, see fig. 1. Fig. 1 is a schematic flow chart of an image defect detection method of a flat panel detector according to an embodiment of the invention. As shown in fig. 1, the image defect detecting method 100 of the flat panel detector includes the following steps:
step S110: determining a suspected defective pixel;
step S120: marking the suspected defect pixels on the suspected defect image;
step S130: determining a defective pixel; and
step S140: and marking the defective pixel in the defect map.
In step S110, suspected defective pixels on an image acquired by the flat panel detector are determined. In an embodiment, all pixel points of the image acquired by the flat panel detector may be traversed to determine the suspected-defect pixel. Alternatively, the pixel points that have been determined to be suspected defective pixels may be excluded from the record. For example, the pixel points which are determined before the flat panel detector leaves the factory, or the defective pixel points which are found in the previous calibration process, and the like, so that the calculation amount can be reduced, and the algorithm can be optimized. The determined pixel before leaving the factory and the information of the defective pixel found in the previous calibration process are recorded in a defect map. Referring to fig. 2 in combination, fig. 2 is a schematic diagram of a defect map according to an embodiment of the invention. As shown in fig. 2, the defect map P includes pixel maps corresponding to pixels of the flat panel detector, wherein pixel point information that has been determined as a defective pixel is recorded in the defect map P, for example, four pixel points marked in black.
In an embodiment, the image acquired in step S110 may be an exposure image and/or a dark field image (dark image), which is not limited in the invention. Wherein, the dark field image refers to an image generated when the flat panel detector is in a non-exposure state. The dark field image may be acquired while the apparatus is idle, for example, during patient registration, organ procedure selection, interval of two exposures, etc.
In an embodiment, when the image acquired in step S110 is an exposure image or a dark field image, the step S110 of determining the suspected-defect pixel may include: and determining pixels with abrupt gray values on the exposure image or the dark field image as suspected defect pixels. For example, the difference between the gray value of the pixel with the abrupt change of gray value and the average gray value of the pixels in the predetermined neighborhood exceeds a predetermined threshold. By way of further example, the range of the predetermined neighborhood may be set to 3 × 3 pixel range, and the predetermined threshold may be set to ± 20% of the average gray scale value of the pixels in the predetermined neighborhood, which is not limited by the invention. Referring to fig. 3 in combination, fig. 3 is a schematic diagram of a predetermined neighborhood according to an embodiment of the present invention. As shown in fig. 3, the neighborhood range is 3 × 3 pixel range, and those skilled in the art can select and set an appropriate neighborhood range and a predetermined threshold according to actual needs.
In an embodiment, when the image acquired in step S110 is an exposure image, the step S110 of determining the suspected-defective pixel may include: and inspecting abnormal response pixels inside an exposure area and outside the exposure area of the flat panel detector, and determining the abnormal response pixels as suspected defect pixels. Before using the flat panel detector, for example, in a development or testing stage, response characterization values of pixels inside and outside an exposure area of the flat panel detector for relevant parameters (e.g., according to exposure dose, beam size, selected organ program and source image distance SID, etc.) may be acquired for determination of defective pixels.
In an embodiment, when the image acquired in step S110 is a dark-field image, the step S110 of determining the suspected-defect pixel may include: a suspected defective pixel or a suspected defective pixel segment is identified based on a read-out gain feature of the dark-field image. Referring to fig. 4 in combination, fig. 4 is a schematic diagram of a dark field image according to an embodiment of the present invention. As shown in fig. 4, the feature information read in a stripe shape along the longitudinal direction of dark-field image 400, i.e., the read-out strip (read-out strip) feature, may be used to identify a suspected-defective pixel or suspected-defective pixel segment R1. The normal information value regarding the read band characteristic may be recorded in advance and used for judgment of a defective pixel. It will be readily appreciated that the foregoing read band characteristics result from the different read gains of each read channel of the dark-field image 400, such that suspected defective pixels or suspected defective pixel segments can be identified based on the read gain characteristics of the dark-field image.
In step S120, the suspected defect pixels are marked on a suspected defect map. Referring to fig. 5, fig. 5 is a schematic diagram of a suspected defect map according to an embodiment of the invention. As shown in fig. 5, the suspected defect map 500 includes a pixel map corresponding to each pixel of the flat panel detector. After the suspected-defective pixel is determined, the suspected-defective pixel is marked on the graph of suspected-defective pixels 500 through S110 and S120. For example, six pixels are marked in black in the figure. In an embodiment, a suspected defect map may be set for a series of images, that is, the suspected defect pixels determined for each image are recorded in the same suspected defect map, and the number of times that the relevant pixels are marked as suspected defect pixels is recorded. Alternatively, a suspected defect map may be configured for each image, a suspected defect map group for a series of images may be generated, and subsequent steps, such as determining defective pixels, may be performed based on the suspected defect map group.
Next, in step S130, a defective pixel is determined based on the suspected defect map. In an embodiment, the suspected defective pixel and the final defective pixel may be determined in various ways. For example, the step S130 of determining the defective pixel may include: respectively determining suspected defect pixels on each image aiming at different images acquired by the flat panel detector by preset times; marking each suspected defect pixel on a suspected defect map; and determining the suspected defective pixel marked on the suspected defect map by the times meeting the preset condition as the defective pixel. For example, the number of times of image acquisition for each calibration may be preset, for example, 100 images are acquired, the suspected-defect pixels on the 100 images are determined respectively, and each suspected-defect pixel is marked on the suspected-defect map. When the number of times that a certain suspected defective pixel on the suspected defect map is marked meets a predetermined condition, such as 80 times, the pixel is determined to be a defective pixel. Those skilled in the art can select and set a suitable threshold of the image capturing times and the marking times as a condition for determining whether the pixel is a defective pixel according to the actual application requirements, and the present invention is not limited in this respect.
In step S140, the defective pixel is marked in a defect map. The defective pixels determined by the previous steps are marked on a defect map, and the defects found in each calibration process can be recorded on the defect map, so that the record of the defective pixels is continuously updated and can be used in the subsequent calibration process.
In an embodiment, the method 100 for detecting image defects of a flat panel detector further includes correcting subsequent exposure images of the flat panel detector based on the defect map. The correction of the image can be performed in various ways by those skilled in the art, and the correction of the image is not a main improvement of the present invention and will not be described herein.
The entire defect detection and image correction process may be configured to run automatically in the background or may be configured to be initiated manually by the user. For example, the user may be prompted at the interactive interface whether to initiate the calibration process, or after determining the defective pixel, the suspect map may be set to be updated automatically or set to be asked for the user to see whether to update the suspect map, etc. In an embodiment, when the number of defective pixels recorded in the suspect map exceeds a predetermined threshold, the user may be prompted to replace the flat panel detector.
The defect detection and image correction processes may be optionally set to run at intervals or for a preset period of time, or may be set to run the entire calibration process continuously in the background, taking into account the frequency of defective pixels occurring with the flat panel detector, as the invention is not limited in this respect.
In embodiments, the defect detection and image correction processes may be run as a background program in a workstation of the X-ray medical system, or may be run in a cloud environment. For example, once a new defective pixel is detected in the cloud, the defective pixel may be pushed to a workstation of the X-ray medical system for correction. For example, the flat panel detectors of a plurality of X-ray medical systems or the flat panel detectors of one X-ray medical system may share the same cloud end, and when a new defective pixel is detected, the relevant information may be pushed to the workstation of the corresponding X-ray medical system. Further, the information of the defective pixels of a plurality of flat panel detectors of the same or different models can be analyzed in a unified manner, and the processing or testing process can be adjusted in a factory or the recording of the defective pixels can be carried out in advance according to the common problem. For example, by monitoring the growth rate of defective pixels, the contact manufacturer can be directly prompted to replace the detector during the warranty period when an anomaly (such as an image quality problem exceeding the quality standard, for example, a clustered defective pixel cluster or a continuous defective pixel line or a defective pixel segment) occurs, and the user can be prompted to replace the detector in time outside the warranty period.
The image defect detection methods of various flat panel detectors as described above may be calibrated using an image acquired every normal exposure as an input, or may be calibrated by detecting an operating state of the relevant medical device and acquiring a dark field image as an input when the system is idle. In other words, the scheme provided by the invention can automatically identify the newly appeared defective pixels and add the defective pixels to the defect map for correction without influencing the normal medical use. The overall calibration process, including the detection of defective pixels and the image correction process, may be configured to run entirely in the background without any apparent daily use, and the user may not even be aware of the existence of this background process. The defect calibration of the flat panel detector is realized in the mode, the field support of engineers can be greatly reduced, the maintenance and research and development cost is saved, and the use experience of users is improved.
The invention also provides an image defect detection device of the flat panel detector. The following description is made in conjunction with fig. 6, and similar contents to those of the method described above in conjunction with fig. 1 to 5 are omitted or only briefly described.
Fig. 6 is a schematic block diagram of an image defect detecting apparatus of a flat panel detector according to an embodiment of the present invention. As shown in fig. 6, the image defect detecting apparatus 600 of the flat panel detector includes: a detecting unit 610, a first marking unit 620, a determining unit 630 and a second marking unit 640.
The detecting unit 610 is configured to determine suspected defective pixels on an image acquired by the flat panel detector, the first marking unit 620 is configured to mark the suspected defective pixels on a suspected defect map, the determining unit 630 is configured to determine defective pixels based on the suspected defect map, and the second marking unit 640 is configured to mark the defective pixels on a defect map.
The invention also provides an X-ray medical imaging system. The following description is made with reference to fig. 7, and similar contents to those of the method described above with reference to fig. 1 to 5 and the apparatus described with reference to fig. 6 are omitted or only briefly described.
FIG. 7 is a schematic block diagram of an X-ray medical imaging system according to an embodiment of the present invention. As shown in fig. 7, an X-ray medical imaging system 700 includes: a flat panel detector 710, an image defect detecting apparatus 720 of the flat panel detector as described above, and a control system 730. The control system 730 is configured to correct a subsequent exposure image of the flat panel detector 710 according to the defect map fed back by the image defect detecting device 730. In an embodiment, the control system 730 may be a control system of an X-ray medical imaging system, but the invention is not limited thereto.
The present invention also provides a computer storage medium having stored therein program instructions executable to implement any of the methods described above, as well as any of the methods described above, which may be applied to any of the medical devices disclosed herein. Specifically, a system or an apparatus equipped with a storage medium on which a software program code that realizes the functions of any one of the above-described embodiments is stored may be provided, and a computer (or a CPU or MPU) of the system or the apparatus is caused to read out and execute the program code stored in the storage medium.
In this case, the program code itself read from the storage medium can realize the functions of any of the above-described embodiments, and thus the program code and the storage medium storing the program code constitute a part of the present invention.
Examples of the storage medium for supplying the program code include a floppy disk, a hard disk, a magneto-optical disk, an optical disk (e.g., CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD + RW), a magnetic tape, a nonvolatile memory card, and a ROM. Alternatively, the program code may be downloaded from a server computer by a communications network.
Further, it should be clear that the functions of any of the above-described embodiments can be implemented not only by executing the program code read out by the computer, but also by causing an operating system or the like operating on the computer to perform a part or all of the actual operations based on instructions of the program code.
Further, it is to be understood that the functions of any of the above-described embodiments are realized by writing the program code read out from the storage medium into a memory provided in an expansion board inserted into the computer or into a memory provided in an expansion unit connected to the computer, and then causing a CPU or the like mounted on the expansion board or the expansion unit to perform part or all of the actual operations based on the instructions of the program code.
The invention relates to an image defect detection method and device, a storage medium and a medical imaging system. According to one embodiment, the image defect detection method of the flat panel detector comprises the following steps: determining a suspected defect pixel on an image acquired by a flat panel detector; marking the suspected defect pixels on a suspected defect map; determining a defective pixel based on the suspected defect map; and marking the defective pixel in a defect map. According to the scheme provided by the invention, under the condition that normal medical use is not influenced, newly-appeared defective pixels can be automatically identified and added into the defect map for correction, so that the use experience of a user is improved, and the maintenance cost is reduced.
The above description is only exemplary of the present invention and should not be taken as limiting the invention, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. An image defect detection method of a flat panel detector comprises the following steps:
determining a suspected defect pixel on an image acquired by a flat panel detector;
marking the suspected defect pixels on a suspected defect map;
determining a defective pixel based on the suspected defect map; and
and marking the defective pixel in a defect map.
2. The image defect detecting method of the flat panel detector as claimed in claim 1, wherein the step of determining the defective pixel comprises:
respectively determining suspected defect pixels on each image aiming at different images acquired by the flat panel detector for preset times;
marking each suspected defect pixel on the suspected defect map; and
and determining the suspected defective pixel marked on the suspected defect map for the number of times meeting the preset condition as the defective pixel.
3. The image defect detecting method of claim 1, wherein the image is an exposure image or a dark field image, and the step of determining the suspected defect pixel comprises:
and determining pixels with abrupt gray values on the exposure image or the dark field image as suspected defect pixels.
4. The image defect detecting method of claim 3, wherein the difference between the gray value of the pixel with the abrupt change of gray value and the average gray value of the pixels in the predetermined neighborhood exceeds a predetermined threshold.
5. The method of claim 1, wherein the image is an exposure image, and the step of determining the suspected defective pixels comprises:
and inspecting abnormal response pixels inside and outside the exposure area of the flat panel detector, and determining the abnormal response pixels as suspected defect pixels.
6. The image defect detecting method of claim 1, wherein the image is a dark field image, and the step of determining the suspected defect pixel comprises:
and identifying suspected defective pixels or suspected defective pixel segments based on the read gain characteristics of the dark-field image.
7. The image defect detecting method of the flat panel detector as claimed in any one of claims 1 to 6, further comprising:
and correcting subsequent exposure images of the flat panel detector based on the defect map.
8. A computer storage medium having stored therein program instructions executable to implement the method of any one of claims 1-7.
9. An image defect detecting apparatus of a flat panel detector, comprising:
the detection unit is used for determining suspected defective pixels on an image acquired by the flat panel detector;
a first marking unit, configured to mark the suspected-defect pixel on a suspected-defect map;
a determining unit for determining a defective pixel based on the suspected defect map; and
and the second marking unit is used for marking the defective pixel on a defect map.
10. An X-ray medical imaging system comprising:
a flat panel detector;
an image defect detecting apparatus of a flat panel detector as claimed in claim 9; and
and the control system is used for correcting the subsequent exposure image of the flat panel detector according to the defect map fed back by the image defect detection device.
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