CN113504418A - Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna - Google Patents
Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna Download PDFInfo
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- CN113504418A CN113504418A CN202110714275.1A CN202110714275A CN113504418A CN 113504418 A CN113504418 A CN 113504418A CN 202110714275 A CN202110714275 A CN 202110714275A CN 113504418 A CN113504418 A CN 113504418A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
Abstract
The invention relates to a broadband passive intermodulation characterization method of a conductive material based on an elliptical monopole patch antenna, which comprises the following steps of: 1) calibration: connecting the calibration copper foil patch to an antenna feeder line through soldering tin, testing antenna electrical parameters and reflection PIM, and ensuring a loop connection state and low intermodulation characteristics; 2) replacement of the material to be tested: cleaning a connecting material between an antenna feeder and a copper foil patch, taking down a calibration copper foil, cleaning and assembling a material to be tested; 3) characterizing MUT intermodulation characteristics; 4) testing all the materials to be tested; 5) and (4) checking: observing whether more than two MUTs' reflected PIMs fall below the receiver system sensitivity, and if so, increasing the input power in 1dB steps until the PIM amplitude of the MUT falls within a PIM test system test threshold; 6) normalization: and according to the test result of 3), normalizing the test results of all MUTs according to a formula of PIM test result + (43-test input power) × 2.5 to approximately obtain the PIM test result of all DUTs under the excitation of 43dBm double carriers.
Description
Technical Field
The invention belongs to the technical field of radio frequency passive intermodulation testing, and particularly relates to a conductive material broadband passive intermodulation characterization method based on an elliptical monopole patch antenna.
Background
Due to the potential risk of material non-linearity and the risk of contact non-linearity in the rf device, multiple carrier signals passing through the device may excite some interference signals in the loop, wherein the third order intermodulation signals may seriously deteriorate the signal-to-noise ratio of the system. Contact non-linear PIM-induced test platform most of which are based on a conduction type PIM test method, and the corresponding contact state is measured by comparing PIM levels under different contact interfaces and contact pressures. During the measurement, the contact pressure is achieved by means of a torque wrench or a mechanical arm loaded with a force sensor. Material non-linearity testing in the field of passive intermodulation often lacks established, universally applicable characterization methods, as compared to contact non-linearity. For example, for the radio frequency front end, when comparing the PIM levels of the conductive cloths with different components, the test comparison can be performed only after the whole machine is assembled. Meanwhile, a direct and effective comparison method is lacked for intermodulation performance among conductive materials such as conductive cloth, foam, silver paste and the like.
Disclosure of Invention
The invention aims to provide a conductive material broadband passive intermodulation characterization method based on an elliptical monopole patch antenna aiming at the technical problem of material nonlinear test in the prior art. By adjusting the physical size of the conductive material, the reflective PIM under different frequency bands can be tested. The antenna main body part is composed of a low intermodulation copper clad laminate with a single side coated with copper, and an antenna feeder line is connected with a signal source through an RG141 low intermodulation cable. Four connection modes are arranged between the reconfigurable radiation patch and the antenna feeder, the four connection modes comprise conductive paint, soldering tin, soldering paste and gallium-indium alloy, and the connection modes can be selected according to sample materials and temperature resistance.
The invention is realized by adopting the following technical scheme:
a conductive material broadband passive intermodulation characterization method based on an elliptical monopole patch antenna comprises the following steps:
1) calibration: connecting the calibration copper foil patch to an antenna feeder line through soldering tin, testing antenna electrical parameters and reflection PIM, and ensuring a loop connection state and low intermodulation characteristics; when the return loss of the antenna is less than-10 dB in the test frequency band and the reflection intermodulation is less than-115 dBm under the condition that the two-path carrier waves are input at 30dBm, the calibration is finished;
2) replacement of the material to be tested: cleaning a connecting material between an antenna feeder and a copper foil patch, taking down a calibration copper foil, cleaning and assembling a material to be tested;
3) characterization of MUT intermodulation characteristics: firstly, testing the electrical parameters of the assembled antenna, accessing the antenna into a PIM test system to continuously test the PIM of the antenna when the return loss of the antenna is less than-10 dB in a test frequency band, setting carrier excitation as 30dBm to read a test result, and if the return loss of the antenna is more than or equal to-10 dBm in the test frequency band, indicating that the shape deviation of the patch is large and needing to be manufactured and pasted again;
4) repeating the steps 2) and 3), and testing all the materials to be tested;
5) and (4) checking: observing whether more than two MUTs' reflected PIMs fall below the sensitivity of the receiving system, if so, increasing the input power in 1dB steps until the PIM amplitude of the MUT falls within a PIM test system test threshold, retesting MUTs without test results, and repeating 2) and 3) until intermodulation levels of all DUTs are distinguished;
6) normalization: and according to the test result of 3), normalizing the test results of all MUTs according to a formula of PIM test result + (43-test input power) × 2.5 to approximately obtain the PIM test result of all DUTs under the excitation of 43dBm double carriers.
The invention is further improved in that in the step 1), the shape of the copper foil patch is oval.
The further improvement of the invention is that in the step 1), the copper foil patch is made of copper foil with adhesive on one surface or high-temperature insulating adhesive tape.
The further improvement of the invention is that in the step 2), when the connecting material between the antenna feeder and the copper foil patch is cleaned, the conductive paint is wiped by dipping clean non-woven fabric into absolute ethyl alcohol, the soldering tin and the soldering paste are cleaned by using an iron, and the gallium-indium alloy is stripped and cleaned by using an adhesive tape.
The further improvement of the invention is that in the step 2), the copper foil is calibrated, the term clean non-woven fabric is dipped in absolute ethyl alcohol to wipe off the residual colloid on the antenna substrate, and the absolute ethyl alcohol on the surface of the substrate is cleaned by adopting an ear washing ball.
A further development of the invention is that in step 3) the excitation of the assembled antenna with a two-way 30dBm carrier is carried out in open ground or in a low intermodulation darkroom.
The invention has at least the following beneficial technical effects:
experience has shown that an effective material nonlinear PIM characterization method should have the following four characteristics. Firstly, potential other contact nonlinear risks cannot exist in a test loop except for a material to be tested; secondly, the testing device is as simple and reliable as possible, and testing errors caused by assembly are reduced; then, the test device itself should be low PIM and bottom noise is easily calibrated during the test; finally, the resolution of PIM testing is high enough between different test frequency bands and different conductive materials.
The conductive material multi-band passive intermodulation characterization method based on the elliptical monopole patch antenna can be used for prejudging the nonlinearity of materials in the radio frequency field, is low in test cost and short in test period, and reduces the research and development cost of products. Meanwhile, the test platform is built without involving complex processes and connection technologies, so that the controllability of the test process is high, the test threshold is low, and large-scale sample test is facilitated. The test link has no potential other contact nonlinear risks, the test device is simple and reliable, and the noise of the test device is easy to calibrate in the test process. The attenuation of the intermodulation signal excited by the carrier wave to the receiving end is 3dB, which is far lower than that of the electromagnetic probe. Can be adapted to the PIM calibration of conductive MUT with various different forms. The property of MUT is not damaged in the whole testing process, and the subsequent MUT component analysis or surface morphology characterization is facilitated. MUT clipping error tolerance in 6 test PIM test frequency bands is higher than +/-2 mm. The material nonlinear PIM calibration method based on the elliptical monopole antenna provides a powerful early-stage judgment scheme for low PIM process control in a product line, is beneficial to control and elimination of PIM sources in a production link, and improves the product yield.
In summary, the present invention provides a characterization method of nonlinear passive intermodulation of materials for conductive materials commonly used in the field of radio frequency. The method is based on a planar elliptical monopole antenna structure and a printed circuit manufacturing process, and can effectively, reliably and inexpensively quantify the PIM level of a conductive material. The method has the characteristics of the four material nonlinear PIM characterization methods, and also has the characteristics of low attenuation, high adaptability, repeatability, wide process tolerance, accuracy controllability and the like.
Drawings
FIG. 1 is a diagram of an antenna reflection PIM test framework proposed in the present invention;
fig. 2 is a schematic diagram of the distribution of intermodulation signals of the antenna in the present invention;
FIG. 3 is an exploded view of the disclosed reconfigurable antenna for characterizing nonlinear PIMs of materials;
FIG. 4 is an assembled view of the disclosed reconfigurable antenna for characterizing nonlinear PIMs of materials;
FIG. 5 is a flow chart of antenna-based nonlinear PIM characterization as disclosed herein;
FIG. 6 is a schematic diagram of the antenna patch size error tolerance (+ -2 mm);
FIG. 7 is a plot of antenna S-parameter versus patch size;
FIG. 8 is a graph of antenna S parameters with different adhesion layers;
FIG. 9 is a schematic illustration of the effect of different connection materials on the electrical characteristics of an antenna;
FIG. 10 is a graph comparing intermodulation characteristics of different interconnect materials;
fig. 11 is an actual measurement result of electrical parameters of an elliptical monopole antenna with a 2.6G frequency band prepared based on different MUTs;
fig. 12 is a PIM measurement result of an elliptical monopole antenna of 2.6G band prepared based on different MUTs.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
Fig. 1 shows an antenna reflection PIM test framework, in which a carrier wave is transmitted to an antenna through a power amplifier, a combiner and a duplexer, and a part of intermodulation wave signals excited on the antenna is radiated into a free space and a part of intermodulation wave signals is reflected back to a frequency spectrograph. The test environment of the antenna may be in a dark room or open free space.
Fig. 2 is a schematic diagram of the distribution of intermodulation signals of the antenna during PIM test. Wherein the carrier wave is transferred to the antenna patches via the antenna feed. If the intermodulation frequency is within the radiation frequency band of the antenna, half of the intermodulation signals accumulated on the antenna patch are radiated to the free space, and the other half is reflected back to the receiving system along the antenna feeder.
The antenna patch is equally divided into N differential elements, each having coordinates (x, y), and dimensions Δ x and Δ y in and perpendicular to the current direction, respectively, and the longitudinal thickness of each differential element is approximately one skin depth δ. The electric field strength of the third-order intermodulation product contributed by each small differential element in the patch antenna can be expressed as:
where χ is the nonlinear coefficient associated with MUT, J1(x, y) is the surface current density of the excitation of carrier 1 at the differential element, J2(x, y) is the surface current density of the excitation of carrier 2 at the differential element. The third order intermodulation current and voltage contributed by each small differential element in the patch antenna according to (1) can be expressed as:
where R (x, y) is the resistance at (x, y) and ρ is the MUT resistivity.
In the working frequency band of the antenna, the intermodulation signals accumulated on the antenna patch are:
the overall intermodulation power (including transmit intermodulation and reflected intermodulation) on the antenna patch is:
the intermodulation signal power received by the frequency spectrograph is half of the intermodulation signal generated on the patch:
fig. 3 and 4 are an exploded view and an assembled view, respectively, of an antenna structure employed in the present invention. The antenna main body part is composed of 6 parts of a low intermodulation 141 cable, a radio frequency ground, a dielectric substrate, an antenna feeder, a reconfigurable connecting material and an antenna radiation patch. The reconfigurable connecting material comprises conductive paint, lead-free soldering paste, lead-free soldering tin and gallium-indium alloy, and can be selected according to the physical characteristics and temperature resistance characteristics of a sample to be tested in actual operation. Table 1 shows the proposed bonding materials for different samples to be tested. The antenna feeder line and the antenna radio frequency ground are prepared on the double-sided copper-clad plate through the traditional printed circuit manufacturing process, and only the reconfigurable connecting material and the MUT need to be reconnected and replaced in the testing process.
Fig. 5 is a flow chart of material nonlinear PIM characterization based on antenna structure. The method mainly comprises three steps of calibration, MUT assembly, electrical parameter testing and PIM testing. Where antenna parameters and dimensions are given in table 2. It should be noted that the antenna patch sizes within different PIM test bands differ. The size clipping error of the MUT is greater than ± 2mm within the PIM test band of interest. Fig. 6 is a schematic diagram of antenna dimensioning and patch size error tolerance. FIG. 7 is the simulation result of the S parameter of the antenna varying with the patch size in the 2.6GHz test frequency band, wherein the return loss of the antenna is kept below-15 dB when the MUT size error is within +/-2 mm.
The MUT and the substrate material are fixed by an adhesive layer. The thickness of the adhesive layer of the common high-temperature insulating adhesive tape, the high-temperature insulating double-sided adhesive tape and part of the MUT self-tape is not more than 0.05 mm. Simulation results show that the radiation characteristics and the electrical characteristics of the antenna are hardly affected by the adhesion layers. Fig. 8 shows the electrical parameters of the antenna with different adhesion layers.
The invention provides a passive intermodulation characterization method for common conductive materials in the field of radio frequency microwaves. The method takes the material to be tested as a part of the antenna patch, and the size of the material to be tested is adjusted so as to adapt to the test requirements of different frequency bands. The present invention overcomes the contact PIM risk of conductive PIM testing and the high attenuation of non-contact PIM testing. The broadband PIM calibration of the radio frequency connection material is realized. The design and material optimization of high linearity systems in the radio frequency field and the electric connection field are promoted.
Taking a 2.6G frequency band as an example, the reliability and the effectiveness of the test method are verified through an electrical parameter test and a PIM test. In order to ensure the conductive property and the low intermodulation property of the connecting material between the antenna feeder and the MUT, the antenna connected by the four materials is subjected to an electrical parameter test and a PIM test respectively, wherein the MUT is copper foil. Fig. 9 shows the effect of different 2.6GHz connection materials on the electrical characteristics of the antenna, and the test results show that the electrical characteristics of the antenna including these four connection materials are almost the same. FIG. 10 is a comparison of intermodulation characteristics of different 2.6GHz connection materials with an input power of 30dBm, showing that the intermodulation characteristics at PIM level of the three connection materials except for the gallium-indium alloy (-119dBm) are very close (-125 dBm). Fig. 11 shows electrical parameters of an antenna prepared from 5 materials to be tested in a 2.6GHz band test, and the test shows that the 5 materials can be subjected to PIM characterization by the method. Empirically, the test method is effective and safe when the maximum porosity of the material is less than one twentieth of the wavelength. Fig. 12 shows the PIM test results of the materials to be tested in 5 at 2.6G, and the test results show that the maximum resolution between the 5 materials can reach 40 dB.
TABLE 1 description of samples to be tested for different connecting materials
Table 2 antenna parameters and dimensions designed in the present invention
Although the invention has been described in detail hereinabove with respect to a general description and specific embodiments thereof, it will be apparent to those skilled in the art that modifications or improvements may be made thereto based on the invention. Accordingly, such modifications and improvements are intended to be within the scope of the invention as claimed.
Claims (6)
1. The broadband passive intermodulation characterization method of the conductive material based on the elliptical monopole patch antenna is characterized by comprising the following steps of:
1) calibration: connecting the calibration copper foil patch to an antenna feeder line through soldering tin, testing antenna electrical parameters and reflection PIM, and ensuring a loop connection state and low intermodulation characteristics; when the return loss of the antenna is less than-10 dB in the test frequency band and the reflection intermodulation is less than-115 dBm under the condition that the two-path carrier waves are input at 30dBm, the calibration is finished;
2) replacement of the material to be tested: cleaning a connecting material between an antenna feeder and a copper foil patch, taking down a calibration copper foil, cleaning and assembling a material to be tested;
3) characterization of MUT intermodulation characteristics: firstly, testing the electrical parameters of the assembled antenna, accessing the antenna into a PIM test system to continuously test the PIM of the antenna when the return loss of the antenna is less than-10 dB in a test frequency band, setting carrier excitation as 30dBm to read a test result, and if the return loss of the antenna is more than or equal to-10 dBm in the test frequency band, indicating that the shape deviation of the patch is large and needing to be manufactured and pasted again;
4) repeating the steps 2) and 3), and testing all the materials to be tested;
5) and (4) checking: observing whether more than two MUTs' reflected PIMs fall below the sensitivity of the receiving system, if so, increasing the input power in 1dB steps until the PIM amplitude of the MUT falls within a PIM test system test threshold, retesting MUTs without test results, and repeating 2) and 3) until intermodulation levels of all DUTs are distinguished;
6) normalization: and according to the test result of 3), normalizing the test results of all MUTs according to a formula of PIM test result + (43-test input power) × 2.5 to approximately obtain the PIM test result of all DUTs under the excitation of 43dBm double carriers.
2. The broadband passive intermodulation characterization method for conductive materials based on the elliptical monopole patch antenna according to claim 1, wherein in step 1), the shape of the copper foil patch is elliptical.
3. The broadband passive intermodulation characterization method of the conductive material based on the elliptical monopole patch antenna, according to claim 1, wherein in the step 1), the copper foil patch is a copper foil with a single surface adhesive or a high-temperature insulating adhesive tape.
4. The broadband passive intermodulation characterization method for the conductive material based on the elliptical monopole patch antenna, according to claim 1, wherein in the step 2), when the connection material between the antenna feeder and the copper foil patch is cleaned, the conductive paint is wiped by dipping the clean non-woven fabric into absolute ethyl alcohol, the soldering tin and the soldering paste are cleaned by using a soldering iron, and the gallium-indium alloy is stripped and cleaned by using an adhesive tape.
5. The broadband passive intermodulation characterization method for the conductive material based on the elliptical monopole patch antenna, according to claim 1, characterized in that in step 2), the copper foil is calibrated, the non-woven fabric with clean words is dipped in absolute ethyl alcohol to wipe off the residual colloid on the antenna substrate, and the absolute ethyl alcohol on the surface of the substrate is cleaned up by using an ear washing ball.
6. The broadband passive intermodulation characterization method of conductive material based on elliptical monopole patch antenna of claim 1, wherein in step 3), the assembled antenna is excited with a two-way 30dBm carrier in an open field or a low intermodulation dark room.
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