CN113504030A - High-speed pulse laser phase randomization testing device and method - Google Patents
High-speed pulse laser phase randomization testing device and method Download PDFInfo
- Publication number
- CN113504030A CN113504030A CN202110819855.7A CN202110819855A CN113504030A CN 113504030 A CN113504030 A CN 113504030A CN 202110819855 A CN202110819855 A CN 202110819855A CN 113504030 A CN113504030 A CN 113504030A
- Authority
- CN
- China
- Prior art keywords
- pulse
- interference
- light
- laser
- beam splitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims description 13
- 230000003287 optical effect Effects 0.000 claims abstract description 30
- 238000001514 detection method Methods 0.000 claims abstract description 21
- 238000007405 data analysis Methods 0.000 claims abstract description 16
- 230000010287 polarization Effects 0.000 claims description 36
- 238000001558 permutation test Methods 0.000 claims description 8
- 239000013307 optical fiber Substances 0.000 claims description 3
- 238000005070 sampling Methods 0.000 abstract description 12
- 238000010586 diagram Methods 0.000 description 7
- 238000004891 communication Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 2
- 238000012113 quantitative test Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000001583 randomness test Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a phase randomization testing device of a high-speed pulse laser, which comprises: the laser source is connected with the input end of the beam splitter, the beam splitter is respectively connected with the long arm of the sagnac interference ring and the short FM reflection arm, and the short FM reflection arm and front and rear pulse reflection light of the long arm of the sagnac interference ring generate interference at the beam splitter; the detection module is used for converting an optical signal generated by interference into an electric signal and testing the power of the interference light; and the data analysis module is used for detecting the randomness of the laser pulse based on the power of the interference light and the electric signal of the interference light. Whether the laser is random in phase or not is qualitatively judged by testing the visibility ratio of the interference fringes of the laser in the continuous light and pulse light modes, the test can be carried out only by using an optical power meter, the optical path is simple, and the cost is low; sampling is carried out on a single pulse interference peak value by adopting a single time, sampling errors caused by time jitter are eliminated, quantitative judgment on the phase randomness of the laser is carried out on the basis of the randomness of the interference peak, and the detection accuracy of the phase randomness of the laser is improved.
Description
Technical Field
The invention belongs to the technical field of quantum communication, and particularly relates to a phase randomization testing device and method for a high-speed pulse laser.
Background
The quantum secret communication technology is theoretically proved to be an absolutely safe encryption technology based on the unknown quantum state unclonable principle and the Heisenberg uncertainty principle. Currently, Quantum Key Distribution (QKD) systems based on BB84 protocol are the most mature, and in recent decades, research teams such as the cambridge institute of toshiba corporation, the university of geneva, NEC and NICT in japan, NIST in usa, and the university of chinese science and technology have realized BB84 practical QKD systems of 1GHz to 1.25GHz, and have wide application prospects in military, government affairs, customs, banks, and other aspects.
For the BB84 quantum key distribution protocol, the phase randomness of a single-photon source is one of the essential factors for ensuring the security thereof. In current QKD systems, a single photon source is mostly generated after attenuation by a gain switched DFB laser, in gain switched mode, each laser pulse is generated by spontaneously radiating seed light, photons disappear in intervals before the next pulse excitation, the spontaneous radiation phase is random, thus proving that the light source phase is random. However, with the increase of the laser pulse frequency, the possibility of overlapping the front pulse and the rear pulse is increased, and the randomization of the pulse phase has a certain question, and a method for qualitatively and quantitatively testing the parameter is still lacked at present. Under the condition of rapid development of quantum communication, a method for testing the randomness of the pulse phase of a laser source is designed as a key step of the safety verification of the QKD system. In the prior art, most of the high-speed QKD system is tested by controlling ADC sampling pulse peak data through FPGA by front and back pulse interference, but for the high-speed QKD system, the pulse repetition frequency is high, the pulse interval is short, the time jitter between pulses and the polarization of long and short arms in an MZ interference ring are inconsistent due to different optical paths, so that the interference is unstable due to polarization and environmental change, and the influence on the test result is large.
Disclosure of Invention
The invention provides a phase randomization testing device of a high-speed pulse laser, aiming at improving the problems.
The invention is realized in this way, a high-speed pulse laser phase randomization testing device, which comprises:
the laser source is connected with the input end of the beam splitter through an optical fiber jumper, the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and the FM reflection short arm interferes with front and rear pulse reflection light of the long arm of the sagnac interference ring at the beam splitter;
the detection module is used for converting an optical signal generated by interference into an electric signal and testing the power of the interference light;
and the data analysis module is used for detecting the randomness of the laser pulse based on the power of the interference light and the electric signal of the interference light.
Further, the sagnac interference loop long arm further comprises:
a port 1 of the polarization beam splitter is connected with a port 2 of the phase modulation module, a port 3 of the polarization beam splitter is connected with a port 4 of the phase modulation module, the distance from the port 1 to the port 2 is equal to the distance from a port intersection 3 to the port 4,
the polarization beam splitter divides the pulse laser beam output by the beam splitter into two pulse lasers with horizontal polarization and vertical polarization, the two pulse lasers are transmitted along opposite directions, the phase modulation module synchronously adjusts the phases of the two pulse lasers, and the two pulse lasers are coupled into one laser beam at the polarization beam splitter and return to the beam splitter;
the FM reflection short arm is composed of a Faraday rotation reflector rotating in 90-degree polarization, and pulse laser output by the beam splitter is reflected by the Faraday rotation reflector rotating in 90-degree polarization and returns to the beam splitter;
the reflected light delay nT of the long arm of the sagnac interference ring is compared with the reflected light delay nT of the FM reflection short arm, and T is the emission period of the laser source pulse;
further, the apparatus further comprises:
and the light intensity adjusting unit is used for adjusting the amplitude of the light pulse of the FM reflection short arm to be consistent with the amplitude of the light pulse of the sagnac interference ring long arm.
The invention also provides a phase randomization test method of the high-speed pulse laser, which comprises the following steps:
s1, collecting the light intensity value of the interference light to calculate the visibility theta of the interference fringe of the pulse light1；
S2, collecting the light intensity value of the interference light by the meter to calculate the visibility theta of the interference fringe of the continuous light2；
S3, calculating visibility theta of interference fringe1Visibility of interference fringes theta2If the ratio is close to 0, preliminarily determining that the laser satisfies the phase randomization, and executing step S4;
s4, based on the electric pulse signal of the interference light, searching the peak value of the pulse intensity and the time interval t between the peak value and the start time of the pulse period in the pulse period1At a time period t from the start of each cycle1And then, collecting the pulse intensity of each pulse period, carrying out random detection on the collected pulse intensity values, and if the random detection is passed, determining that the laser meets the phase randomization.
Further, the light intensity adjusting unit adjusts the amplitude of the light pulse of the FM reflection short arm to be consistent with the amplitude of the light pulse of the long arm of the sagnac interference ring.
The phase randomization testing device for the high-speed pulse laser provided by the invention has the following beneficial technical effects:
(1) an FSM interference ring is used for replacing the conventional MZ interference ring, in the MZ interference ring, due to the fact that the optical paths of the long arm and the short arm are different, the polarization change of pulses in the long arm and the short arm is different, interference is affected by unstable environment change, the output pulses of the long arm and the short arm of the FSM interference ring rotate 90 degrees relative to the polarization of input pulses, polarization disturbance resistance is achieved, and finally interference output is stable compared with MZ;
(2) whether the laser is random in phase can be qualitatively judged by testing the visibility ratio of the interference fringes in the continuous light and pulse light modes of the laser, the test can be carried out only by using an optical power meter, the optical path is simple, and the cost is low;
(3) sampling is carried out on a single pulse interference peak value by adopting a single time, sampling errors caused by time jitter are eliminated, quantitative judgment on the phase randomness of the laser is carried out based on the randomness of the interference peak, the detection precision of the phase randomness of the laser is improved, and the method is suitable for testing the phase randomness of the existing high-speed laser above 1 GHz.
Drawings
FIG. 1 is a schematic diagram of a mechanism of a phase randomization testing device of a high-speed pulse laser according to an embodiment of the present invention;
FIG. 2 is a diagram illustrating the continuous light interference results provided by an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating the interference result of pulsed light provided by an embodiment of the present invention;
fig. 4 is a comparison diagram of the electric pulse signal acquisition principle provided by the embodiment of the present invention, wherein, (a) the data acquisition method provided by the wei prior art, and (b) the data acquisition method provided by the technical solution of the present invention;
FIG. 5 is a probability density distribution curve of interference intensity provided by an embodiment of the present invention;
FIG. 6 is a schematic diagram of phase and intensity modulation of an interferometric module according to an embodiment of the invention;
fig. 7 is a schematic diagram of a data detection and analysis structure according to an embodiment of the present invention.
Detailed Description
The following detailed description of the embodiments of the present invention will be given in order to provide those skilled in the art with a more complete, accurate and thorough understanding of the inventive concept and technical solutions of the present invention.
The phase randomization testing device of the high-speed pulse laser mainly comprises an interference module, a phase modulation module, a detection module and a data analysis module, wherein the interference module comprises a long arm (short for long arm) of an interference ring of sagnac and a short arm (short for short) of FM reflection, the phase modulation module is integrated in the interference module, and the randomness of pulse phases is tested through the interference of adjacent pulses of laser or pulses separated by several periods and the interference light intensity. The phase randomness of adjacent pulses is tested in this example because of the greater likelihood of correlation between adjacent pulses than between separate pulse phases.
The interference module used in this example is a FSM interference ring, which can be fabricated in a fiber structure, a free space structure, or a waveguide chip structure, as will be understood by those skilled in the art. In the prior art, by using the MZ interference ring, the polarization of light pulses is changed inconsistently in the long arm and the short arm, so that the interference result is greatly influenced by environmental changes, and the sagnac ring and the FM in the FSM interference ring have polarization disturbance resistance, so that the interference result is slightly influenced by the environment, and the pulse acquisition modes acquire the intensity of single pulses at the same moment, thereby reducing the sampling error caused by adjacent pulse time jitter and being more suitable for being used in a high-speed system.
The light pulse generated by the light source enters the interference module, and the delay time of the interference module is integral multiple of the period of the light pulse, so that adjacent pulses are interfered when meeting each other when being output. The phase modulation module is arranged in the long arm of the sagnac interferometric ring, the phase difference of the long and short arm light pulses in the interferometric module is changed by adjusting the phase, the interferometric output is connected into the optical power meter, the average power of an optical signal is tested by the optical power meter, and if a fixed phase relation exists between the pulses, the power meter can see obvious light intensity change and clear interferometric fringes appear when the phase difference of the long and short arm light pulses is adjusted. If the phase between the pulses is random, when the phase difference between the long and short arm light pulses is adjusted, under the accumulation of the average time, the power meter tests that the light intensity is not changed, no interference fringe can be seen, and the test result is shown in fig. 3.
Based on the principle, in order to qualitatively test the pulse phase randomness of the laser, firstly, the laser works in the continuous light mode, the coherent length of a light source is larger than the time delay of an interference module, so that the output of the interference module generates interference. Because the continuous light phase is fixed, when the light phase difference of the long arm and the short arm of the interference module is adjusted, the power meter can see obvious light intensity change, and the visibility theta of interference fringes is tested0Close to 1. Then the laser is turned on againWhen the device works at the pulse frequency of a QKD system in operation, light pulses pass through the same interference module, output interference light intensity is connected into the optical power meter, and when the phase difference of long and short arm light is adjusted, the test light intensity of the power meter is not obviously changed, and the visibility theta of interference fringes is tested1Close to 0. The method comprises the following steps of collecting the light intensity of interference light of a laser in the two modes, further calculating the visibility ratio of interference fringes of output continuous light and pulse light, and using the visibility ratio for qualitative detection of phase randomization of the laser, wherein the calculation formula of the visibility theta of the interference fringes is as follows:
wherein, ImaxAnd IminThe intensity values at constructive and destructive interference, respectively, the fringe visibility is closer to 1 as the phase correlation increases. The relationship between the visibility of interference fringes and the phase dependence is described below, and the interference output intensity can be expressed as:
wherein ε is a dielectric constant, αAAnd alphaBFor the field of adjacent interfering pulses, θ is the relative phase of adjacent pulses, C represents a constant, and as can be seen from the above equation, the term that produces interference is:
while phase position
The variation is relatively slow, the relative phase theta is a probability variable, and the visibility of the visible interference fringes is determined by the expected value of the relative phase theta. If the relative phase obeys theta0Centered, gaussian probability density function with standard deviation σ:
the expected values are:
from equations (2) to (5), the visibility of interference fringes and the relative phase standard deviation are as follows:
as can be seen from equation (6), the smaller the relative phase standard deviation, the greater the relative phase correlation between adjacent pulses, and the higher the visibility of interference fringes. Whereas the lower the visibility of the interference fringes. Thus, the results of the test interference in the continuous and pulsed light modes are shown in FIGS. 2 and 3, respectively. By testing the ratio of the visibility of the interference fringes under the pulse mode to the visibility of the interference fringes under the continuous light mode in the same interference ring, the randomness of the pulse phase can be judged.
Fig. 1 is a schematic mechanical diagram of a phase randomization testing device of a high-speed pulse laser according to an embodiment of the present invention, and for convenience of illustration, only the portions related to the embodiment of the present invention are shown, where the system includes:
the laser source is connected with the input end of the beam splitter through an optical fiber jumper, the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the short FM reflection arm, and the reflected light of the short FM reflection arm and the long arm of the sagnac interference ring generates interference at the beam splitter;
in the embodiment of the invention, the FM reflection short arm is composed of a Faraday rotation reflector with 90-degree polarization rotation; the long arm of the sagnac interference ring consists of a polarization beam splitter and a phase modulation module, the polarization beam splitter is provided with two ports, namely a port 1 and a port 2, the phase modulation module is provided with two ports, namely a port 3 and a port 4, the port 1 of the polarization beam splitter is connected with the port 2 of the phase modulation module, the port 3 of the polarization beam splitter is connected with the port 4 of the phase modulation module, and the ports from the port 1 to the port 42 distance L12Distance L from port intersection 3 to port 434Are equal.
The laser periodically emits pulse laser with an emission period of T, the pulse laser is divided into two beams of pulse laser through the beam splitter, the two beams of pulse laser are called pulse laser 1 and pulse laser 2, the pulse laser 1 is input into the Faraday rotating reflector rotating in a 90-degree polarization mode, and then the pulse laser is reflected to the beam splitter through the Faraday rotating reflector rotating in the 90-degree polarization mode; the pulse laser 2 is divided into a pulse laser beam 21 with horizontal polarization and a pulse laser beam 22 with vertical polarization by a polarization beam splitter, the pulse laser beam 21 (the pulse laser beam 22) is transmitted to a phase modulation module along the clockwise direction, the pulse laser beam 22 (the pulse laser beam 21) is transmitted to the phase modulation module along the anticlockwise direction, the pulse laser beam 21 and the pulse laser beam 22 are simultaneously subjected to phase modulation at the phase modulation module, the pulse laser beam 21 and the pulse laser beam 22 modulated by the phase modulation module are continuously transmitted along the original direction, a new pulse laser beam is coupled at the polarization beam splitter and is called as a pulse laser beam 3, a phase difference exists between the pulse laser beam 3 and the pulse laser beam 2, a Faraday rotator FR is integrated in the polarization beam splitter, the pulse laser beam 3 is reflected to the beam splitter, and by controlling the arm lengths of a sagnac interference ring long arm and an FM reflection short arm, making the time delay of the reflected light of the pulse laser beam 2 to nT of the pulse laser beam 1, wherein n is a positive integer, and the reflected light of the pulse laser beam 2 and the reflected light of the adjacent or separated pulse laser beam 1 in a plurality of periods generate interference at the beam splitter;
the detection module consists of a photoelectric detector and a high-precision high-range optical power meter, and the optical power meter acquires the power (also called light intensity) of interference light at the beam splitter and outputs the power to the data analysis module; the photoelectric detection device converts the interfered optical pulse signals into electric pulse signals and outputs the electric pulse signals to the data analysis module;
and the data analysis module is used for calculating the visibility of the interference fringes based on the light intensity of the interference light, performing qualitative detection of laser phase randomization based on the visibility ratio of the interference fringes of the continuous light and the pulse light, and performing quantitative detection of the laser phase randomization based on an electric pulse signal after the qualitative detection meets the requirement.
Interference module in addition to the FSM interference ring described above, for the FM interference ring which is also resistant to polarization disturbance, the phase modulation module is also applicable as an interference module in the present invention, and the phase modulation module is in the middle of the Faraday-Sagnac-Michelson interference ring (FSM interference ring for short), as shown by a dashed box in fig. 6, and includes a phase modulator and a driving control unit, and the phase modulator may be an electro-optical lithium niobate crystal, a piezoelectric ceramic, a thermo-optical modulation, and other future forms of phase modulation products. The drive control unit can be used for voltage drive control, temperature control and the like, the device is mainly used for voltage drive, and the amplitude of the drive voltage is more than or equal to the half-wave voltage of the phase modulator. A drive control unit in the phase modulation module is a signal source which outputs high amplitude with high precision, two channels are adjustable, under the continuous light and pulse light modes of the laser, voltage is controlled to be adjusted to be 0.05V in a stepping mode, scanning is carried out within the voltage range of 0-V pi, the phase on the long arm of the interference ring is modulated within the range of 0-2 pi, the maximum value and the minimum value of the power value of the optical power meter are observed at the moment, the visibility of interference fringes is calculated, the ratio of the interference fringes of the continuous light to the pulse light is calculated, if the ratio is close to 0, the laser meets phase randomization, the quantitative test of a photoelectric detector is triggered, and otherwise the quantitative test of the photoelectric detector is not needed.
In another embodiment of the present invention, the phase randomization test apparatus for a high-speed pulse laser further includes:
the light intensity adjusting unit is used for adjusting the light pulse amplitude of the FM reflection short arm to enable the pulse amplitude of the FM reflection short arm to be basically consistent with that of the sagnac interference ring long arm; the intensity modulation unit is also integrated in the interference module, is connected in the short arm of the FSM interference ring, adjusts the short arm light pulse amplitude through drive control, balances the long arm and the short arm light pulse amplitude, and enables the visibility of interference fringes to be highest so as to improve the test precision. In the laser pulse mode, the bias voltage is further adjusted at the bias port of the intensity modulator by the drive control unit at 0.01V while observing the optical power meter value until the minimum power value of the optical power meter value writes the scanned voltage value into the drive control unit.
The detection module in the invention is composed of a photoelectric detector and an optical power meter, the structure is shown in fig. 7, a part of optical pulse output by the interference module is connected with the photoelectric detector, an optical signal is converted into an electric signal, and then the output electric signal is connected to the data analysis module. And the other part of the output optical signals are accessed into a high-precision optical power meter, and the power values are input into a data analysis module.
The laser respectively continuous light and pulse light output, the optical power meter passes through the drive control unit scanning drive voltage of phase modulation module, and the output optical power is interfered in the test after the modulation phase place to with power value input data analysis module, draw interference light intensity-voltage curve (voltage sweep scope is greater than or equal to half-wave voltage) through data analysis module, test continuous light and pulse light interference fringe visibility, the ratio of the two is close to 0. At the moment, the photoelectric detector is started, the tested optical pulse signal is converted into an electric pulse signal with the same frequency as the laser, and meanwhile, the electric pulse signal is output to the data analysis module.
The data analysis module in the device receives two signals of the detection module, one part is a power value detected by the optical power meter, and the other part is an electric pulse signal detected by the photoelectric detector. The data analysis module firstly carries out interference light intensity-voltage curve drawing on the passing light power value, and qualitatively judges the phase randomness of the laser through the visibility ratio of the interference fringes. After the randomness qualitative judgment is passed, the detection module starts to collect the electric pulse signal of the photoelectric detector, as shown in fig. 4, within a fixed pulse period range P1Searching pulse peak value internally and determining the corresponding time t of the peak value1Then fixed at t1And repeatedly acquiring the pulse value at any moment, wherein the value taking times are more than 10 k. The data analysis module draws an interference intensity probability density curve of the acquired numerical value through the data analysis module, and meanwhile, the numerical value is subjected to randomness test.
In the prior art, pulse sampling with equal intervals is mostly adopted, an interference pulse peak value is collected once every other time period, time jitter exists between every two pulses, the pulse period has a certain change interval, and interference peak value points which are not actual interference peak values are collected during sampling with equal intervals, as shown in (a) of fig. 4, I1May actually be at the position of the front and back dotted lines, and the peak value of the solid line pulse is collected during sampling, resulting in sampling errorEventually leading to test errors. For lasers with higher pulse repetition rates, the time jitter introduces more error into the test.
The invention adopts single pulse sampling, and searches the pulse intensity peak value and the time interval t between the pulse intensity peak value and the period starting time in the pulse period1At a time period t from the start of each cycle1The pulse intensity of each pulse period is collected in time, as shown in fig. 4 (b), the influence of adjacent pulse time jitter on sampling accuracy is eliminated, and the accuracy of the test is improved. After the interference peak point data is collected, an interference light intensity probability density curve is drawn according to the collection result, as shown in fig. 5, and random number detection is carried out simultaneously, so that the pulse randomness of the laser is quantitatively tested.
The invention has been described above with reference to the accompanying drawings, it is obvious that the invention is not limited to the specific implementation in the above-described manner, and it is within the scope of the invention to apply the inventive concept and solution to other applications without substantial modification.
Claims (5)
1. A phase randomization test apparatus for a high-speed pulse laser, the apparatus comprising:
the laser source is connected with the input end of the beam splitter through an optical fiber jumper, the output end of the beam splitter is respectively connected with the long arm of the sagnac interference ring and the FM reflection short arm, and the FM reflection short arm interferes with front and rear pulse reflection light of the long arm of the sagnac interference ring at the beam splitter;
the detection module is used for converting an optical signal generated by interference into an electric signal and testing the power of the interference light;
and the data analysis module is used for detecting the randomness of the laser pulse based on the power of the interference light and the electric signal of the interference light.
2. The high-speed pulsed laser phase randomization test apparatus of claim 1, wherein the sagnac interferometric ring long arm further comprises:
a port 1 of the polarization beam splitter is connected with a port 2 of the phase modulation module, a port 3 of the polarization beam splitter is connected with a port 4 of the phase modulation module, the distance from the port 1 to the port 2 is equal to the distance from a port intersection 3 to the port 4,
the polarization beam splitter divides the pulse laser beam output by the beam splitter into two pulse lasers with horizontal polarization and vertical polarization, the two pulse lasers are transmitted along opposite directions, the phase modulation module synchronously adjusts the phases of the two pulse lasers, and the two pulse lasers are coupled into one laser beam at the polarization beam splitter and return to the beam splitter;
the FM reflection short arm is composed of a Faraday rotation reflector rotating in 90-degree polarization, and pulse laser output by the beam splitter is reflected by the Faraday rotation reflector rotating in 90-degree polarization and returns to the beam splitter;
and the reflected light delay nT of the long arm of the sagnac interference ring is compared with the reflected light delay nT of the FM reflection short arm, and T is the emission period of the laser source pulse.
3. The high-speed pulsed laser phase randomization test apparatus of claim 1, further comprising:
and the light intensity adjusting unit is used for adjusting the amplitude of the light pulse of the FM reflection short arm to be consistent with the amplitude of the light pulse of the sagnac interference ring long arm.
4. A phase randomization test method based on the phase randomization test apparatus of the high-speed pulse laser as claimed in any one of claims 1 to 3, the method comprising the steps of:
s1, collecting the light intensity value of the interference light to calculate the visibility theta of the interference fringe of the pulse light1；
S2, collecting the light intensity value of the interference light by the meter to calculate the visibility theta of the interference fringe of the continuous light2；
S3, calculating visibility theta of interference fringe1Visibility of interference fringes theta2If the ratio is close to 0, preliminarily determining that the laser satisfies the phase randomization, and executing step S4;
s4, based on the electric pulse signal of the interference light, in the pulse periodInternal search pulse intensity peak and its time interval t from the start of the cycle1At a time period t from the start of each cycle1And then, collecting the pulse intensity of each pulse period, carrying out random detection on the collected pulse intensity values, and if the random detection is passed, determining that the laser meets the phase randomization.
5. The phase randomization test method of the fast pulse laser according to claim 4, wherein the amplitude of the optical pulse of the FM reflection short arm is adjusted by the optical intensity adjustment unit to be consistent with the amplitude of the pulse of the long arm of the sagnac interferometric ring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110819855.7A CN113504030B (en) | 2021-07-20 | 2021-07-20 | Phase randomization testing device and method for high-speed pulse laser |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110819855.7A CN113504030B (en) | 2021-07-20 | 2021-07-20 | Phase randomization testing device and method for high-speed pulse laser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113504030A true CN113504030A (en) | 2021-10-15 |
| CN113504030B CN113504030B (en) | 2024-03-12 |
Family
ID=78014110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110819855.7A Active CN113504030B (en) | 2021-07-20 | 2021-07-20 | Phase randomization testing device and method for high-speed pulse laser |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113504030B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115167816A (en) * | 2022-07-13 | 2022-10-11 | 国开启科量子技术(北京)有限公司 | Quantum random number generation control method and quantum random number generation device |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5175743A (en) * | 1991-11-22 | 1992-12-29 | Bell Communications Research, Inc. | Spread-time code division multiple access technique with arbitrary spectral shaping |
| CA2121367A1 (en) * | 1992-09-04 | 1994-03-17 | Eric Udd | Sagnac Interferometer Based Secure Communication System |
| CN201003690Y (en) * | 2006-09-08 | 2008-01-09 | 北京工业大学 | Pipe leakage monitoring device based on Sagnac optical fiber interferometer |
| CN101520335A (en) * | 2009-02-13 | 2009-09-02 | 上海大学 | Method for solving polarization fading and polarization phase noise in optical fibre fiber gyro |
| JP2011082696A (en) * | 2009-10-05 | 2011-04-21 | Nec Corp | Device, method and program for estimating interference power |
| US20110280405A1 (en) * | 2010-05-17 | 2011-11-17 | Raytheon Bbn Technologies Corp. | Systems and methods for stabilization of interferometers for quantum key distribution |
| CN103411660A (en) * | 2013-08-29 | 2013-11-27 | 山东省科学院激光研究所 | Optical fiber distributed type sound wave monitor system |
| CN105897413A (en) * | 2016-05-26 | 2016-08-24 | 安徽问天量子科技股份有限公司 | Phase modulation polarization coded QKD system based on sagnac ring |
| CN110411715A (en) * | 2019-07-29 | 2019-11-05 | 中国科学院半导体研究所 | Device and method for determining AMZI half-wave voltage of phase modulator |
| US20200301669A1 (en) * | 2019-03-18 | 2020-09-24 | Kabushiki Kaisha Toshiba | High bandwidth quantum random number generator |
| CN112364998A (en) * | 2020-10-15 | 2021-02-12 | 国开启科量子技术(北京)有限公司 | Phase randomness test device and method |
| CN112804056A (en) * | 2021-02-02 | 2021-05-14 | 上海循态信息科技有限公司 | Device and method for realizing independent quantum key distribution of continuous variable measurement equipment |
-
2021
- 2021-07-20 CN CN202110819855.7A patent/CN113504030B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5175743A (en) * | 1991-11-22 | 1992-12-29 | Bell Communications Research, Inc. | Spread-time code division multiple access technique with arbitrary spectral shaping |
| CA2121367A1 (en) * | 1992-09-04 | 1994-03-17 | Eric Udd | Sagnac Interferometer Based Secure Communication System |
| CN201003690Y (en) * | 2006-09-08 | 2008-01-09 | 北京工业大学 | Pipe leakage monitoring device based on Sagnac optical fiber interferometer |
| CN101520335A (en) * | 2009-02-13 | 2009-09-02 | 上海大学 | Method for solving polarization fading and polarization phase noise in optical fibre fiber gyro |
| JP2011082696A (en) * | 2009-10-05 | 2011-04-21 | Nec Corp | Device, method and program for estimating interference power |
| US20110280405A1 (en) * | 2010-05-17 | 2011-11-17 | Raytheon Bbn Technologies Corp. | Systems and methods for stabilization of interferometers for quantum key distribution |
| CN103411660A (en) * | 2013-08-29 | 2013-11-27 | 山东省科学院激光研究所 | Optical fiber distributed type sound wave monitor system |
| CN105897413A (en) * | 2016-05-26 | 2016-08-24 | 安徽问天量子科技股份有限公司 | Phase modulation polarization coded QKD system based on sagnac ring |
| US20200301669A1 (en) * | 2019-03-18 | 2020-09-24 | Kabushiki Kaisha Toshiba | High bandwidth quantum random number generator |
| CN110411715A (en) * | 2019-07-29 | 2019-11-05 | 中国科学院半导体研究所 | Device and method for determining AMZI half-wave voltage of phase modulator |
| CN112364998A (en) * | 2020-10-15 | 2021-02-12 | 国开启科量子技术(北京)有限公司 | Phase randomness test device and method |
| CN112804056A (en) * | 2021-02-02 | 2021-05-14 | 上海循态信息科技有限公司 | Device and method for realizing independent quantum key distribution of continuous variable measurement equipment |
Non-Patent Citations (1)
| Title |
|---|
| 吕晓旭;钟丽云;张以谟;: "相移相位测量的全息再现算法及测量误差分析", 光学学报, no. 09, 17 October 2006 (2006-10-17), pages 1367 - 1371 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115167816A (en) * | 2022-07-13 | 2022-10-11 | 国开启科量子技术(北京)有限公司 | Quantum random number generation control method and quantum random number generation device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113504030B (en) | 2024-03-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| RU2371684C2 (en) | Method and device for measuring time-domain spectrum of terahertz radiation pulses | |
| US9612153B2 (en) | Electric field vector detection method and electric field vector detection device | |
| Heersink et al. | Polarization squeezing of intense pulses with a fiber-optic Sagnac interferometer | |
| CN111999739A (en) | Coherent laser radar method and device for measuring distance and speed by phase modulation | |
| JP6875957B2 (en) | Tunnel current controller and tunnel current control method | |
| EP3218741B1 (en) | System and method for measuring doppler effect utilizing elastic and inelastic light scattering | |
| CN102680099A (en) | Method and system for generating and detecting terahenz pulse | |
| CN103529296B (en) | A kind of device and method for measuring comb spectrum generator phase spectrum | |
| CN105866788A (en) | Distance measuring device and distance measuring device method for realizing optical sampling by adjusting resonant cavity of femtosecond laser | |
| CN113395110A (en) | Optical time delay measuring method and device based on single-frequency microwave phase-push | |
| CN113504030A (en) | High-speed pulse laser phase randomization testing device and method | |
| CN108931495A (en) | Terahertz time-domain spectroscopy synchronized measurement system and method | |
| CN102636337A (en) | Method for measuring optical fiber dispersion | |
| US10670520B2 (en) | Optical analysis device and optical analysis method | |
| JP3533651B1 (en) | Time-resolved nonlinear susceptibility measurement system | |
| CN110632585A (en) | Vector Doppler effect measuring method and device | |
| CN106199623B (en) | A kind of femtosecond laser intermode beat frequency method range-measurement system | |
| Mottola et al. | Quantum memory in a microfabricated rubidium vapor cell | |
| JPH08146066A (en) | Electrical signal-measuring method and device | |
| JP6941004B2 (en) | Tunnel current controller and tunnel current control method | |
| RU2697879C1 (en) | Femtosecond optoelectronic system for measuring the field of thz pulses obtained using an electron accelerator | |
| Xue et al. | High precision linear frequency modulation ranging system based on semiconductor laser | |
| CN113552611B (en) | Ultrafast neutron pulse energy spectrum detection system and method | |
| JP2020020641A (en) | Optical analysis module and optical analyzer | |
| US3520616A (en) | Optical pulse measurement system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |