CN113495196A - Power module dynamic performance testing device - Google Patents
Power module dynamic performance testing device Download PDFInfo
- Publication number
- CN113495196A CN113495196A CN202010253656.XA CN202010253656A CN113495196A CN 113495196 A CN113495196 A CN 113495196A CN 202010253656 A CN202010253656 A CN 202010253656A CN 113495196 A CN113495196 A CN 113495196A
- Authority
- CN
- China
- Prior art keywords
- power module
- busbar
- test
- dynamic performance
- pole terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to a power module dynamic performance testing device, which comprises: a control unit for controlling the pulse parameters and the test conditions; a pulse generating unit that outputs a pulse signal based on the pulse parameter; a test section having a power module drive section mounting section and a power module mounting section on which a power module is mounted; a plurality of power module driving parts of different specifications detachably mounted on the power module driving part mounting part and driving the power module according to the test condition and the pulse signal; a data acquisition unit that acquires dynamic performance data of the power module as test data; the power supply supplies current to the power module, and the busbars with different specifications are detachably arranged in the testing part, connected with the power supply and the power module, and one of the busbars and one of the power module driving parts are arranged in the testing part so as to test the power module under the condition the same as or similar to the actual use condition of the power module.
Description
Technical Field
The invention relates to a power module dynamic performance testing device.
Background
The power module is a hybrid integrated power component with an Insulated Gate Bipolar Transistor (IGBT) as a core and comprises a high-speed low-power-consumption tube core (IGBT), an optimized gate driving circuit and a quick protection circuit. In recent years, the automotive industry has been developing power components and systems, and the number of IGBT devices used in electric vehicles has also increased dramatically. Manufacturers of semiconductor and electric vehicle products desire better efficiency and lower cost of industrial processes in the production of these products with IGBT devices, and must therefore be well controlled from the development of the products to the final control of the product quality. To achieve the above objectives, testing of products becomes relatively important and must be accurate and reliable.
Patent document CN202815167U provides a double-pulse IGBT testing apparatus including modules for transmitting pulse signals, storing waveforms, and processing signals. The patent has the advantages of automation of the testing process, flexible control, safe and reliable testing process, convenient data analysis, good data traceability and the like.
However, the existing testing device has a high parasitic inductance which is much higher than that of the power module in actual use, so that the obtained testing result is unreliable and cannot be used as a reference when the power module is actually selected. In addition, when testing power modules of various voltage classes, different power modules are required to be driven, so that different testing devices are required, and the testing of the power modules of various voltage classes cannot be handled by one testing device.
In patent document CN202815167U, only one test platform is set up, and no mention is made about parasitic inductance which is relatively concerned in actual test and how to test power modules with various voltage levels.
Disclosure of Invention
The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a power module dynamic performance testing apparatus capable of reducing parasitic inductance in a test loop, directly using a test result as a basis for actually selecting a power module, and capable of coping with tests of various voltage classes.
In order to achieve the above object, a power module dynamic performance testing apparatus according to the present invention includes: a control unit for controlling the pulse parameters and the test conditions; a pulse generating unit that outputs a pulse signal based on the pulse parameter from the control unit; the testing part is provided with a power module driving part mounting part and a power module mounting part for mounting a power module, and the power module driving part mounting part is electrically connected with the power module mounting part; a plurality of power module driving units of different specifications detachably attached to the power module driving unit attaching unit, and configured to drive the power modules based on test conditions from the control unit and pulse signals from the pulse generating unit; a data acquisition unit electrically connected to the power module mounting unit, the data acquisition unit acquiring dynamic performance data of the power module as test data when the power module driving unit drives the power module; the power supply supplies current to the power module when the power module driving part drives the power module, and the busbar with different specifications is detachably installed in the testing part, connects the power supply and the power module, and is provided with one of the busbar and one of the power module driving parts in the testing part so as to test the power module under the condition the same as or similar to the actual use condition of the power module.
According to the invention, the dynamic performance testing device of the power module, which has low parasitic inductance, can directly use the testing result as the basis of actually selecting the power module and can cope with the tests of various voltage levels, can be obtained.
Drawings
Fig. 1 is a block diagram of a power module dynamic performance testing apparatus according to the present invention.
Fig. 2 is a schematic view showing a connection relationship of members mounted on a test section.
Fig. 3 is a schematic diagram showing the structure of the laminated bus bar.
Fig. 4 is a schematic diagram showing the use of laminated bus bars to connect a power source to a power module.
Fig. 5 is a schematic diagram showing a connection mode between a power supply and a power module according to the present invention.
Fig. 6 is a diagram illustrating a current flow manner in different connection manners of a power supply and a power module, where a is a conventional connection manner and b is a connection manner of the present invention.
Fig. 7 is a schematic structural diagram of a power module.
Detailed Description
The following description of the embodiments of the present invention is provided for illustrative purposes, and other advantages and effects of the present invention will become apparent to those skilled in the art from the present disclosure. While the invention will be described in conjunction with the preferred embodiments, it is not intended that features of the invention be limited to these embodiments. On the contrary, the invention is described in connection with the embodiments for the purpose of covering alternatives or modifications that may be extended based on the claims of the present invention. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The invention may be practiced without these particulars. Moreover, some of the specific details have been left out of the description in order to avoid obscuring or obscuring the focus of the present invention. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
Fig. 1 is a block diagram of a power module dynamic performance testing apparatus according to the present invention. Fig. 2 is a schematic view showing a connection relationship of members mounted on a test section.
As shown in fig. 1 and 2, a power module dynamic performance testing apparatus 1 according to the present invention is a power module dynamic performance testing apparatus for testing dynamic performance of a power module 10, and includes a control unit 2, a pulse generation unit 3, a test unit 4, a data processing unit 5, a storage unit 6, a power module driving unit 7, a power supply 8, a bus 9, and a data acquisition unit 11.
The control unit 2 controls the pulse parameters and the test conditions.
The pulse generator 3 outputs a pulse signal based on the pulse parameter from the controller 2. The pulse signal may be a double pulse signal or a single pulse signal. In case the pulse signal is a double pulse signal, the reverse recovery process of the power module 10 can be observed.
The test section 4 has a power module driving section mounting section and a power module mounting section for mounting the power module 11, the power module driving section mounting section being electrically connected to the power module mounting section.
The power module driving unit 7 is detachably mounted on the power module driving unit mounting unit, for example, by a general-purpose or dedicated interface. The power module driving unit 7 drives the power module 10 based on the test condition from the control unit 2 and the pulse signal from the pulse generating unit 3.
The power supply 8 supplies current to the power module 10 when the power module driving unit 7 drives the power module 10. The power supply 8 may be a conventional power supply device such as a battery or a capacitor.
The busbar 9 is detachably mounted on the test section 4 and connects the power supply 8 and the power module 10.
The data acquisition unit 11 is electrically connected to the power module mounting unit, and acquires dynamic performance data (for example, a voltage waveform, a current waveform, and the like of the power module) of the power module 10 as test data when the power module 10 is driven by the power module driving unit 7.
The data processing unit 5 processes the test data, and for example, uses an oscilloscope as the data processing unit 5 to process the voltage waveform of the power module. The storage unit 6 stores the test data and the data processed by the data processing unit 5.
As shown in fig. 2, the power module driving unit 7, the power supply 8, the bus bar 9, and the data acquisition unit 11 may be mounted on the test unit 4, and the power module 10 may be mounted on the test unit 10. However, in the present invention, the power supply 8 and the data acquisition unit 11 may not be provided in the test unit 4.
In the present invention, a plurality of power module drivers 7 of different specifications and a plurality of busbars 9 of different specifications are provided, and one of the plurality of busbars 9 and one of the plurality of power module drivers 7 are mounted in the test section 4 so as to test the power module 10 under the same or similar actual use conditions of the power module 10.
Thus, the bus bar 9 and the power module driving unit 7 mounted on the test unit 4 can be designed as replaceable parts, and parasitic inductance in the test apparatus can be reduced.
In addition, in the present invention, the power module 10 can be tested under the same or similar conditions as the actual use conditions of the power module 10, and thus, the test result obtained by the present invention can be directly used as the basis for actually selecting the power module.
And, while different test conditions, such as parasitic inductance requirements, gate internal resistance requirements, etc., are required when testing the power modules 10 of different voltage classes, according to the present invention, the bus bar 9 and the power module driving part 7 mounted on the test part 4 can be designed as replaceable parts, and the power module 10 can be tested under the same or similar conditions as the actual use conditions of the power module 10, so that various different test conditions can be satisfied to cope with the test of various voltage classes.
In addition, in the present invention, the bus bar 9 may be a laminated bus bar. Fig. 3 is a schematic diagram showing the structure of the laminated bus bar. Fig. 4 is a schematic diagram showing the use of laminated bus bars to connect a power source to a power module.
As shown in fig. 3, the laminated busbar includes an upper insulating layer 91, an upper busbar 92, an intermediate insulating layer 93, a lower busbar 94, and a lower insulating layer 95. The laminated busbar may not have the upper insulating layer 91 and the lower insulating layer 95, but may have only the upper busbar 92, the intermediate insulating layer 93, and the lower busbar 94.
As shown in fig. 4, in the laminated busbar, the upper busbar and the lower busbar are parallel to each other, and the current in the upper busbar and the current in the lower busbar flow in opposite directions, so that the magnetic field generated by the current in the upper busbar and the magnetic field generated by the current in the lower busbar cancel each other, and the parasitic inductance in the busbar 9 can be reduced.
Since the parasitic inductance in the bus bar is proportional to the thickness of the intermediate insulating layer 93 and the intermediate insulating layer 93 also needs to have an insulating function, the intermediate insulating layer 93 is preferably made of an insulating material having high dielectric strength, for example, the intermediate insulating layer 93 is made of polyester film PET.
In addition, in order to further reduce the parasitic inductance in the testing device, the invention also improves the connection mode of connecting the power supply 8 and the power module 10 by using the busbar 9. This is described in more detail below with reference to fig. 4-7.
As shown in fig. 4 and 5, the power module 10 has an N-pole terminal and a P-pole terminal, the power supply 8 has a positive terminal and a negative terminal, and the busbar 9 has an upper busbar 92 (a solid line portion in fig. 5, also referred to as a positive busbar) connecting the P-pole terminal and the positive terminal, and a lower busbar 94 (a dotted line portion in fig. 5, also referred to as a negative busbar) connecting the N-pole terminal and the negative terminal.
If a connection line between a connection point of a P-pole terminal on the upper bus bar 92 and a connection point of a positive-pole terminal on the upper bus bar 92 is used as a first connection line, and a connection line between a connection point of an N-pole terminal on the lower bus bar 94 and a connection point of a negative-pole terminal on the lower bus bar 94 is used as a second connection line, the first connection line and the second connection line are parallel to each other in the present invention.
As described above, as shown in a of fig. 6, when the first connection line and the second connection line are not parallel to each other, a current flowing from the positive terminal to the P terminal (a solid line in a of fig. 6) and a current flowing from the N terminal to the negative terminal (a dashed line in a of fig. 6) cross each other and affect each other, thereby generating parasitic inductance. In the present invention, when the first connection line and the second connection line are parallel to each other, as shown in b of fig. 6, the current flow on the busbar 9 can be kept parallel without crossing, thereby reducing the parasitic inductance.
In the present invention, as shown in fig. 5, it is preferable that the first connection line, the second connection line, and the center line of the busbar are located on the same straight line when the busbar is viewed in plan. This can further reduce parasitic inductance.
As shown in fig. 7, the power module 10 is a three-phase bridge power module including three half-bridge circuits. In the conventional test apparatus, for convenience of testing, a busbar is used to connect the three half-bridge circuits to a power supply. However, at the time of testing, only one of the three half-bridge circuits can be tested at a time. The existing connection mode has a longer useless busbar, so that the existing connection mode has larger parasitic inductance.
In contrast, in the present invention, as shown in fig. 4, the bus bar 9 connects only the half-bridge circuit to be tested of the three half-bridge circuits to the power supply 8. Thus, although the test operation is increased, the length of the bus bar 9 is shortened, and the parasitic inductance in the test device can be reduced.
The embodiments of the present invention have been described above, but the embodiments are merely examples and are not intended to limit the scope of the present invention. These embodiments can be implemented in other various forms, and various omissions, substitutions, changes, and combinations are made without departing from the spirit of the invention. These embodiments and modifications thereof are included in the scope and spirit of the present invention, and are also included in the invention described in the claims and the scope equivalent thereto.
Description of the symbols
The power module dynamic performance testing device comprises a power module dynamic performance testing device 1, a control part 2, a pulse generating part 3, a testing part 4, a data processing part 5, a storage part 6, a power module driving part 7, a power supply 8, a busbar 9, a power module 10, a data acquisition part 11, an upper insulating layer 91, an upper busbar 92, a middle insulating layer 93, a lower busbar 94 and a lower insulating layer 95.
Claims (7)
1. A power module dynamic performance testing device is characterized by comprising:
a control unit for controlling the pulse parameters and the test conditions;
a pulse generating unit that outputs a pulse signal based on the pulse parameter from the control unit;
the testing part is provided with a power module driving part mounting part and a power module mounting part for mounting a power module, and the power module driving part mounting part is electrically connected with the power module mounting part;
a plurality of power module driving units of different specifications detachably attached to the power module driving unit attaching unit, and configured to drive the power modules based on test conditions from the control unit and pulse signals from the pulse generating unit;
a data acquisition unit electrically connected to the power module mounting unit, the data acquisition unit acquiring dynamic performance data of the power module as test data when the power module driving unit drives the power module;
a power supply that supplies a current to the power module when the power module driving part drives the power module, an
A plurality of busbars of different specifications, which are detachably arranged on the test part and connect the power supply and the power module,
one of the plurality of mother rows and one of the plurality of power module driving portions are mounted in the test portion so as to test the power module under the same or similar condition as an actual use condition of the power module.
2. The power module dynamic performance testing apparatus of claim 1,
the plurality of busbars are laminated busbars.
3. The power module dynamic performance testing apparatus of claim 2,
the laminated busbar comprises an upper layer busbar, a lower layer busbar and an intermediate insulating layer arranged between the upper layer busbar and the lower layer busbar,
the intermediate insulating layer is composed of an insulating material having a high dielectric strength.
4. The power module dynamic performance testing apparatus of claim 1,
the power module has an N-pole terminal and a P-pole terminal,
the power supply has a positive terminal and a negative terminal,
the busbar is provided with a positive busbar connecting the P-pole terminal and the positive pole terminal and a negative busbar connecting the N-pole terminal and the negative pole terminal,
a connecting line between a connecting point of the P-pole terminal on the positive bus bar and a connecting point of the positive pole terminal on the positive bus bar is used as a first connecting line, a connecting line between a connecting point of the N-pole terminal on the negative bus bar and a connecting point of the negative pole terminal on the negative bus bar is used as a second connecting line,
the first connecting line and the second connecting line are parallel to each other.
5. The power module dynamic performance testing apparatus of claim 4,
the first connecting line, the second connecting line and the central line of the busbar are positioned on the same straight line when the busbar is observed in a overlooking mode.
6. The power module dynamic performance testing apparatus of claim 1,
the pulse signal is a double pulse signal.
7. The power module dynamic performance testing apparatus of any one of claims 1-6,
the power module is a three-phase bridge power module formed by three half-bridge circuits,
the busbar is used for connecting only the half-bridge circuit to be tested in the three half-bridge circuits with the power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010253656.XA CN113495196A (en) | 2020-04-02 | 2020-04-02 | Power module dynamic performance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010253656.XA CN113495196A (en) | 2020-04-02 | 2020-04-02 | Power module dynamic performance testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113495196A true CN113495196A (en) | 2021-10-12 |
Family
ID=77994356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010253656.XA Pending CN113495196A (en) | 2020-04-02 | 2020-04-02 | Power module dynamic performance testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113495196A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980493A (en) * | 2023-01-03 | 2023-04-18 | 广州市德珑电子器件有限公司 | Multi-inductor photovoltaic inverter testing method, device, equipment and storage medium |
-
2020
- 2020-04-02 CN CN202010253656.XA patent/CN113495196A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980493A (en) * | 2023-01-03 | 2023-04-18 | 广州市德珑电子器件有限公司 | Multi-inductor photovoltaic inverter testing method, device, equipment and storage medium |
| CN115980493B (en) * | 2023-01-03 | 2023-11-07 | 广州市德珑电子器件有限公司 | Multi-inductance photovoltaic inverter testing method, device, equipment and storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8310272B2 (en) | Method and system for testing electric automotive drive systems | |
| US7583109B2 (en) | Apparatus and methods for monitoring parallel-connected power switching devices responsive to drive circuit parameters | |
| US20140313671A1 (en) | Power conversion apparatus | |
| EP2590309B1 (en) | Semiconductor power module | |
| JP5472043B2 (en) | Driving device for power conversion circuit | |
| US20140210260A1 (en) | Electric power conversion system for electric vehicle | |
| CN102668355A (en) | Power conversion apparatus | |
| CN101893666B (en) | Method of inspecting power converter and inspecting device | |
| CN113495196A (en) | Power module dynamic performance testing device | |
| CN111213312A (en) | Inverter control board | |
| US20240019503A1 (en) | Deterioration determination device, and power conversion device | |
| CN114088986A (en) | Dynamic test board for needle-shaped terminal half-bridge type power module | |
| KR100986928B1 (en) | A method and a device for testing a power module | |
| JP4765638B2 (en) | INVERTER MODULE INSPECTION METHOD AND INSPECTION DEVICE | |
| US11736036B2 (en) | Electric power converter | |
| US9041460B2 (en) | Packaged power transistors and power packages | |
| JP2005278296A (en) | Capacitor device and power supply system having the same | |
| JP2013140889A (en) | Power module | |
| CN208665111U (en) | A kind of micro- novel vehicle controller drive module of pure electric vehicle | |
| Jaksic et al. | Novel SiC power module for traction power inverters with low parasitic inductances | |
| CN116184151B (en) | IGBT switching characteristic test system and test method thereof | |
| US10720912B2 (en) | Suppressing circuit for semiconductor switch | |
| CN114002575B (en) | Bonding wire fracture state monitoring method and device for IGBT module | |
| US20210378085A1 (en) | Circuit board, semiconductor device, power converter, and moving object | |
| JP2019198173A (en) | Power converter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20211012 |
|
| WD01 | Invention patent application deemed withdrawn after publication |