CN113465737A - Broadband photoelectric detector testing device - Google Patents
Broadband photoelectric detector testing device Download PDFInfo
- Publication number
- CN113465737A CN113465737A CN202110327846.6A CN202110327846A CN113465737A CN 113465737 A CN113465737 A CN 113465737A CN 202110327846 A CN202110327846 A CN 202110327846A CN 113465737 A CN113465737 A CN 113465737A
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- China
- Prior art keywords
- temperature
- testing device
- black box
- light source
- photoelectric detector
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- 238000012360 testing method Methods 0.000 title claims abstract description 25
- 230000005540 biological transmission Effects 0.000 claims abstract description 5
- 238000010438 heat treatment Methods 0.000 claims description 2
- 238000005286 illumination Methods 0.000 abstract description 2
- 238000005516 engineering process Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 description 23
- 239000000523 sample Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000004297 night vision Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/083—Testing response of detector
Abstract
A broadband photoelectric detector testing device relates to the photoelectric technology. The device comprises a light source, a chopper, a source meter, a shielding black box, a preamplifier and a lock-in amplifier, and is characterized by also comprising a temperature adjusting module, wherein a heat transmission unit of the temperature adjusting module is arranged in the shielding black box, and a temperature sensor is arranged in the shielding black box. The invention can realize the tests of different temperatures, different illumination intensities and different bias voltages.
Description
Technical Field
The present invention relates to the field of optoelectronics.
Background
The photoelectric detector is based on photoelectric effect, the radiated material in the detector is radiated by light, the optical signal is converted into an electrical signal, the weak electrical signal generated by the photoelectric detector is processed through amplification, sampling and conversion of a rear end circuit, and then the weak electrical signal is applied to actual needs. The photoelectric detector has the characteristics of high detection sensitivity and high dynamic time response speed, and can capture extremely weak optical signals in real time, so the photoelectric detector is widely applied to various directions such as atmosphere monitoring, night vision devices, communication, flame detection and the like. The performance parameters of the photoelectric detector are important basis for evaluating the performance of the photoelectric detector, and include photocurrent, dark current, responsivity, detectivity, time response and detector noise. At present, no mature and systematic broadband detector is found to be used for measuring the performance parameters of the photoelectric detector.
Disclosure of Invention
The invention aims to solve the technical problem of providing a high-precision broadband photoelectric detector testing device.
The technical scheme adopted by the invention for solving the technical problems is that the broadband photoelectric detector testing device comprises a light source, a chopper, a source meter, a shielding black box, a preamplifier and a phase-locked amplifier, and is characterized by also comprising a temperature adjusting module, wherein a heat transmission unit of the temperature adjusting module is arranged in the shielding black box, and a temperature sensor is arranged in the shielding black box.
Further, the temperature control device further comprises a temperature controller, the temperature sensor is connected with the temperature controller, and the temperature controller is connected with the temperature adjusting module. The light source includes an infrared light source and an ultraviolet light source. The shielding black box is connected with a vacuum mechanical pump, and a vacuum gauge is arranged in the shielding black box. The temperature regulation module comprises a cooling module, and the heat transmission unit is a heat exchange pipeline. Or, the temperature regulating module comprises a heating module, and the heat transmission unit is an electric heating wire.
The invention has the following beneficial effects:
1. the broadband photoelectric detector testing system can realize the performance test of the broadband photoelectric detector from ultraviolet to infrared, and the testing parameters comprise photocurrent, dark current, responsivity, detectivity, time response and detector noise.
2. The test has more optional parameters, and can realize the tests of different temperatures, different illumination intensities and different bias voltages.
3. The measuring accuracy is high, and the triaxial line and the low-noise coaxial adapter are used for replacing a common lead, so that the influence of wire noise on the test can be effectively reduced, and the test safety is ensured.
Drawings
Fig. 1 is a flow chart of a structure of a broadband photodetector test system.
Fig. 2 is a graph of the measured light and dark current of the photodetector.
FIG. 3 is a graph of the results of a time response test of a photodetector.
Detailed Description
Referring to fig. 1, as an embodiment, includes:
and the optical platform is used for placing the optical shielding box, the probe station, the light source and various optical devices.
The optical shielding box is internally provided with a temperature changing table and is used for shielding environmental noise.
The temperature changing platform is internally provided with a photoelectric detector and is used for adjusting the environment temperature of the photoelectric detector during working.
And the vacuum gauge is used for observing the internal pressure of the temperature changing table.
And the temperature sensor is used for observing the specific temperature inside the temperature changing table.
And the self-pressurization liquid nitrogen tank is used for cooling the interior of the temperature changing table and adjusting the environment temperature of the photoelectric detector during working.
And the vacuum mechanical pump is used for vacuumizing the interior of the temperature changing table to prevent the problem of frosting due to too low temperature.
The instrument cabinet is used for placing a source meter, a signal generator, a phase-locked amplifier and a preamplifier.
And the infrared light source is used for providing an infrared photoelectric sensor as an optical signal input.
And the ultraviolet light source is used for providing the ultraviolet photoelectric sensor as optical signal input.
And the optical power meter is used for detecting the radiation optical power density.
And the chopper is used for modulating the continuous light source into modulated light with a specified frequency.
The shielding cable is used for connecting the variable temperature platform and the instrument cabinet, and can effectively reduce the wire noise.
And the control computer is used for reading the test data and setting the parameters of the source table.
The specific test steps of the invention are as follows:
1. opening a control computer, opening an optical shielding box, replacing a required light source according to test requirements, placing an optical power meter probe at the central position of a temperature changing table, ensuring that the optical power meter probe is irradiated by the radiation light, adjusting the wavelength and the light spot size parameters of the optical power meter, closing the optical shielding box, closing an indoor light source, waiting for the indication number of the optical power meter to be stabilized, and recording the reading number of the optical power meter. If the optical power is small, the optical power can be increased or decreased by adjusting the power supply of the light source.
2. Opening the optical shielding box, removing the probe of the optical power meter, fixing the photoelectric detector by using a probe in the temperature-changing table, covering the upper cover of the temperature-changing table, screwing a sealing screw, connecting the source meter and the output port on the temperature-changing table by using a low-noise coaxial line, and closing the optical shielding box.
3. And starting the mechanical pump, observing the vacuum gauge, waiting for the internal vacuum degree of the temperature changing table to reach about 1Pa, then adjusting the flow of the self-pressurization liquid nitrogen tank according to the test requirement, observing whether the temperature sensor reaches the temperature required to be tested or not, and waiting for the reading of the temperature sensor to be stabilized at the required temperature.
4. Data acquisition is carried out by controlling a computer, the source meter control software is set to be in a voltage scanning mode, the relation between the photoelectric current and the bias voltage of the photoelectric detector can be obtained, the light source is turned off, and the relation between the dark current and the bias voltage of the photoelectric detector can be obtained by data acquisition again after a few minutes. (FIG. 2)
5. Data acquisition is carried out through a control computer, source meter control software is set to be in a voltage bias mode, sampling rate is set, a light source is turned on and then turned off, and response time of the photoelectric detector can be acquired. (FIG. 3)
6. The connection with a source meter is disconnected, the signal input end of the phase-locked amplifier is connected with the output port on the temperature changing table by the low-noise coaxial line, the light source is closed, the reference frequency of the phase-locked amplifier is adjusted to the required frequency, and the noise current and the noise voltage of the photoelectric detector can be measured after the reading of the phase-locked amplifier is stable.
7. And turning on a light source, adjusting the chopper to a required frequency, connecting the output end of the chopper and the reference input end of the phase-locked amplifier by using a coaxial line, and observing the reading of the phase-locked amplifier to obtain the signal voltage and the signal current of the photoelectric detector.
8. After a series of tests are completed, the power supply of the electric equipment can be turned off. And waiting for the temperature changing table to be heated to the room temperature.
The responsivity can be calculated by the following formula
V is the signal voltage obtained in the step 7, I is the signal current obtained in the step seven, E is the optical power density obtained in the step 1, and A is the area of the photosensitive element of the detector.
The detection rate can be calculated by the following formula
VnFor the photodetector noise voltage, I, obtained in step 6nThe photodetector noise current obtained in step 6.
Claims (6)
1. The broadband photoelectric detector testing device comprises a light source, a chopper, a source meter, a shielding black box, a preamplifier and a phase-locked amplifier, and is characterized by further comprising a temperature adjusting module, wherein a heat transmission unit of the temperature adjusting module is arranged in the shielding black box, and a temperature sensor is arranged in the shielding black box.
2. The broadband photodetector testing device of claim 1, further comprising a temperature controller, wherein the temperature sensor is connected to the temperature controller, and the temperature controller is connected to the temperature adjustment module.
3. The broadband photodetector testing device of claim 1, wherein the light source comprises an infrared light source and an ultraviolet light source.
4. The broadband photodetector testing device according to claim 1, wherein a vacuum mechanical pump is connected to the black box, and a vacuum gauge is disposed in the black box.
5. The broadband photodetector testing device of claim 1, wherein the temperature regulation module comprises a temperature reduction module, and the heat transfer unit is a heat exchange line.
6. The broadband photodetector testing device of claim 1, wherein the temperature adjustment module comprises a temperature raising module, and the heat transfer unit is a heating wire.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110327846.6A CN113465737A (en) | 2021-03-26 | 2021-03-26 | Broadband photoelectric detector testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110327846.6A CN113465737A (en) | 2021-03-26 | 2021-03-26 | Broadband photoelectric detector testing device |
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| Publication Number | Publication Date |
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| CN113465737A true CN113465737A (en) | 2021-10-01 |
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| CN202110327846.6A Pending CN113465737A (en) | 2021-03-26 | 2021-03-26 | Broadband photoelectric detector testing device |
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| CN (1) | CN113465737A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298819A (en) * | 2023-04-19 | 2023-06-23 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103839955A (en) * | 2007-04-18 | 2014-06-04 | 因维萨热技术公司 | Materials, systems and methods for optoelectronic devices |
| CN207095715U (en) * | 2017-06-26 | 2018-03-13 | 浙江师范大学 | A kind of integrated unit pyroelectric detector parameter test system |
| CN111121959A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Accelerated test device and method for quantum dot photoelectric detector at low vacuum temperature |
-
2021
- 2021-03-26 CN CN202110327846.6A patent/CN113465737A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103839955A (en) * | 2007-04-18 | 2014-06-04 | 因维萨热技术公司 | Materials, systems and methods for optoelectronic devices |
| CN207095715U (en) * | 2017-06-26 | 2018-03-13 | 浙江师范大学 | A kind of integrated unit pyroelectric detector parameter test system |
| CN111121959A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Accelerated test device and method for quantum dot photoelectric detector at low vacuum temperature |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298819A (en) * | 2023-04-19 | 2023-06-23 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
| CN116298819B (en) * | 2023-04-19 | 2023-09-15 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
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Application publication date: 20211001 |
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