CN113465652A - Method for calibrating photoelectric characteristic difference of photoelectric sensor - Google Patents
Method for calibrating photoelectric characteristic difference of photoelectric sensor Download PDFInfo
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- CN113465652A CN113465652A CN202110772189.6A CN202110772189A CN113465652A CN 113465652 A CN113465652 A CN 113465652A CN 202110772189 A CN202110772189 A CN 202110772189A CN 113465652 A CN113465652 A CN 113465652A
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- G—PHYSICS
- G01—MEASURING; TESTING
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Abstract
The invention discloses a method for calibrating photoelectric characteristic difference of a photoelectric sensor, which is characterized by comprising the following steps: s1, under the condition that the specific calibration environment and the irradiation environment are consistent, respectively adjusting the duty ratio of the PWM driving signal input to the input end of each photoelectric sensor in the batch sensors to enable the electric signal values output by each photoelectric sensor to be consistent; s2, storing PWM driving values when the signal values output by each photoelectric sensor are consistent; and S3, when each photoelectric sensor is driven and used, calling the stored PWM driving value of each photoelectric sensor, and driving the photoelectric sensor under the driving of the PWM driving value. The method can eliminate or reduce the difference of photoelectric characteristics of the photoelectric sensor, and improve the detection precision and detection consistency of the sensor.
Description
Technical Field
The invention relates to the technical field of sensor calibration, in particular to a method for calibrating photoelectric characteristic difference of a photoelectric sensor.
Background
At present, photoelectric sensors, whether in a correlation type or a reflection type, cannot ensure the consistency of photoelectric characteristics of each sensor in batch production, so that misjudgment or incapability of use exists in some high-precision application environments, and the photoelectric sensors in later use are influenced by factors such as structural differences, high temperature, humidity, oxidation and dust pollution to cause the differences of the photoelectric characteristics, so that the detection precision of the photoelectric sensors is reduced.
Disclosure of Invention
In order to solve the above problems, the present invention provides a method for calibrating differences in photoelectric characteristics of photosensors, which can quickly and effectively calibrate the problem of decreased detection accuracy of photosensors due to small differences in individual photoelectric characteristics in mass production, or due to differences in photoelectric characteristics of photosensors caused by high temperature, humidity, oxidation, dust contamination, etc.
The technical scheme of the invention is as follows:
a method for calibrating photoelectric characteristic difference of a photoelectric sensor is characterized by comprising the following steps:
s1, under the condition that the specific calibration environment and the irradiation environment are consistent, respectively adjusting the duty ratio of the PWM driving signal input to the input end of each photoelectric sensor in the batch sensors to enable the electric signal values output by each photoelectric sensor to be consistent;
s2, storing PWM driving values when the signal values output by each photoelectric sensor are consistent;
and S3, when each photoelectric sensor is driven and used, calling the stored PWM driving value of each photoelectric sensor, and driving the photoelectric sensor under the driving of the PWM driving value.
Further, in certain calibration environments, including environments in which certain temperature, dust-free, and lighting environments are relatively fixed.
Further, the substance irradiated to the photodiode in the photosensor is included under the uniform irradiation environment, and the absolute distance of the irradiated substance with respect to the irradiated photodiode is uniform.
Further, in S1, the duty ratio of the PWM driving signal input to the input terminal of each of the photosensors in the batch sensor is respectively adjusted, so that the signal values output by each of the photosensors are all the same, and the microprocessor MCU outputs the PWM signal to both ends of the light emitting diode of each of the photosensors, so as to input the PWM signal to each of the photosensors.
Furthermore, in S1, the signal values output by each of the photosensors are made to be consistent by receiving the analog signal values at the output of the photosensor, outputting the analog signals to convert the analog signals into digital signals, and automatically determining the digital signals by the microprocessor MCU and automatically adjusting and outputting the PWM signals by the microprocessor MCU.
Furthermore, the microprocessor MCU is integrated with an analog-to-digital conversion module, analog signals output by the photoelectric sensor are directly and automatically acquired and judged through the analog-to-digital conversion module of the microprocessor MCU, and the duty ratio of the output PWM signals is automatically adjusted through the microprocessor MCU.
The invention has the beneficial effects that: the method adjusts the luminous intensity of the light emitting diode of the photoelectric sensor by adjusting the PWM duty ratio, and then collects the numerical value of the receiving end of the photoelectric sensor to make the numerical value of the receiving end of the photoelectric sensor consistent, and stores and uses the numerical value, so that the photoelectric characteristic difference of the photoelectric sensor can be eliminated or reduced, and the detection precision and the detection consistency of the sensor are improved.
Drawings
FIG. 1 is a flow chart of a method according to an embodiment of the present invention.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings in conjunction with embodiments. It should be noted that the features of the following embodiments and examples may be combined with each other without conflict.
As shown in fig. 1, a method for calibrating a difference in photoelectric characteristics of a photosensor includes the steps of:
s1, under the condition that the specific calibration environment and the irradiation environment are consistent, respectively adjusting the duty ratio of the PWM driving signal input to the input end of each photoelectric sensor in the batch sensors to enable the electric signal values output by each photoelectric sensor to be consistent, wherein the consistency of the electric signal values represents the consistency of the voltage values of the electric signals;
the calibration environment includes a specific temperature and humidity environment, a dust-free environment and an environment with a relatively fixed illumination environment, particularly the environment which is protected from external sunlight and lamp light, the illumination environment includes a substance for illuminating the photodiode in the photoelectric sensor, and the absolute distance of the illuminated substance relative to the illuminated photodiode is consistent. The calibration value error caused by photoelectric characteristic difference caused by factors such as external structure difference, illumination intensity, temperature, humidity, oxidation condition, dust pollution and the like is avoided.
In addition, the duty ratio of the PWM driving signal input to the input terminal of each of the photosensors in the batch sensor is adjusted to make the electrical signal values output by each of the photosensors uniform, and the PWM signal is output to both ends of the light emitting diode of each of the photosensors by the microprocessor MCU and input to each of the photosensors.
S2, storing the PWM driving values when the electric signal values output by each photoelectric sensor are consistent correspondingly, and storing the specific PWM values in FLASH to realize power failure storage calibration values and avoid repeated operation of secondary calibration or each calibration;
and S3, when each photoelectric sensor is driven and used, calling the stored PWM driving value of each photoelectric sensor, and driving the photoelectric sensor under the driving of the PWM driving value. Can guarantee that every photoelectric sensor's photoelectric characteristic is unanimous, realize the detection of photoelectric sensor high accuracy, later stage also can be opened for the user in the product with this calibration function is integrated, can improve the precision that the product detected in real time like this, solves to a certain extent because the equipment trouble that environmental mutation or dust influence caused.
It should be further noted that, in an embodiment, in S1, the making of the signal values output by each of the photosensors is implemented by receiving analog signal values output by the photosensor outputs, converting the analog signal outputs into digital signals, and performing automatic determination by the microprocessor MCU and automatically adjusting and outputting PWM signals by the microprocessor MCU.
It should be further noted that, in an embodiment, the microprocessor MCU is integrated with an analog-to-digital conversion module, the analog signal output by the photoelectric sensor is directly and automatically collected and judged by the analog-to-digital conversion module of the microprocessor MCU, and the duty ratio of the output PWM signal is automatically adjusted by the microprocessor MCU.
The above embodiments are merely representative of the centralized embodiments of the present invention, and the description thereof is specific and detailed, but it should not be understood as the limitation of the scope of the present invention, and it should be noted that those skilled in the art can make various changes and modifications without departing from the spirit of the present invention, and these changes and modifications all fall into the protection scope of the present invention. Therefore, the protection scope of the present patent should be subject to the appended claims.
Claims (6)
1. A method for calibrating photoelectric characteristic difference of a photoelectric sensor is characterized by comprising the following steps:
s1, under the condition that the specific calibration environment and the irradiation environment are consistent, respectively adjusting the duty ratio of the PWM driving signal input to the input end of each photoelectric sensor in the batch sensors to enable the electric signal values output by each photoelectric sensor to be consistent;
s2, storing PWM driving values when the signal values output by each photoelectric sensor are consistent;
and S3, when each photoelectric sensor is driven and used, calling the stored PWM driving value of each photoelectric sensor, and driving the photoelectric sensor under the driving of the PWM driving value.
2. The method for calibrating the difference in the photoelectric characteristics of the photoelectric sensor according to claim 1, wherein: in a particular calibration environment, including environments in which a particular temperature, dust-free, and light environment is relatively fixed.
3. The method for calibrating the difference in the photoelectric characteristics of the photoelectric sensor according to claim 1, wherein: the illumination environment is consistent, the material irradiated to the photodiode in the photoelectric sensor is included, and the absolute distance of the irradiated material relative to the irradiated photodiode is consistent.
4. The method for calibrating the difference in the photoelectric characteristics of the photoelectric sensor according to claim 1, wherein: in S1, the duty ratio of the PWM driving signal input to the input terminal of each of the photosensors in the batch sensor is adjusted, so that the signal values output by each of the photosensors are all the same, and the PWM signal is output to both ends of the light emitting diode of each of the photosensors by the microprocessor MCU, and the PWM signal is input to each of the photosensors.
5. The method for calibrating the difference in the photoelectric characteristics of the photoelectric sensor according to claim 4, wherein: in the step S1, the signal values output by each of the photoelectric sensors are consistent by receiving the analog signal values at the output end of the photoelectric sensor, converting the analog signal output into a digital signal, and automatically determining by the microprocessor MCU and automatically adjusting the output PWM signal by the microprocessor MCU.
6. The method for calibrating the difference in the photoelectric characteristics of the photoelectric sensor according to claim 5, wherein: the microprocessor MCU is integrated with an analog-to-digital conversion module, analog signals output by the photoelectric sensor are directly and automatically acquired and judged through the analog-to-digital conversion module of the microprocessor MCU, and the duty ratio of the output PWM signals is automatically adjusted through the microprocessor MCU.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114279482A (en) * | 2021-11-26 | 2022-04-05 | 山东云海国创云计算装备产业创新中心有限公司 | Transmission sensor calibration method and system |
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| EP3252445A1 (en) * | 2016-06-01 | 2017-12-06 | ams International AG | Photodetector arrangement having an adjustable output and method for adjusting an output of a photodetector arrangement |
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| CN211606862U (en) * | 2019-12-31 | 2020-09-29 | 美芯晟科技（北京）有限公司 | LED dimming circuit and LED dimming system |
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Patent Citations (6)
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| CN101055374A (en) * | 2006-04-14 | 2007-10-17 | Nec液晶技术株式会社 | Backlight system, liquid crystal display including the same, and method of adjusting backlight |
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| KR20080107825A (en) * | 2007-06-08 | 2008-12-11 | 엘지디스플레이 주식회사 | Liquid crystal display and driving method thereof |
| EP3252445A1 (en) * | 2016-06-01 | 2017-12-06 | ams International AG | Photodetector arrangement having an adjustable output and method for adjusting an output of a photodetector arrangement |
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