CN113447898A - T/R assembly multi-state S parameter measuring system based on vector network - Google Patents
T/R assembly multi-state S parameter measuring system based on vector network Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
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Abstract
本发明公开了一种基于矢网的T/R组件多态S参数测量系统，包括矢量网络分析仪，用于测试TR组件的S参数指标；波控板，用于提供TR组件必要的控制信号，来控制TR组件切换对应的衰减、移相或延时状态；上位机软件，用于对矢量网络分析仪和波控模块进行总体的控制，并完成相关必要的逻辑设置，由于TR组件状态较多，衰减64态，移相64态再加上延时态，本发明利用矢量网络分析仪的段扫，点触发，外触发的方法，大大降低TR组件的测试时间，使设计研究人员能够更快的发现问题与解决问题，更快的获得反馈，为我国雷达、航天等事业的发展增添了动力。
The invention discloses a vector network-based T/R component polymorphic S-parameter measurement system, comprising a vector network analyzer for testing the S-parameter index of the TR component; a wave control board for providing necessary control signals for the TR component , to control the TR component to switch the corresponding attenuation, phase shift or delay state; the host computer software is used to control the vector network analyzer and the wave control module as a whole, and complete the necessary logic settings. More, attenuation 64 states, phase shifting 64 states plus delay state, the present invention utilizes the method of segment sweep, point triggering and external triggering of vector network analyzer, which greatly reduces the test time of TR components, and enables design researchers to be more Quickly find and solve problems, and get feedback faster, adding impetus to the development of my country's radar, aerospace and other undertakings.
Description
Technical Field
The invention belongs to the technical field of radar, radio frequency and aerospace, and particularly relates to a T/R assembly multi-state S parameter measuring system based on a vector network.
Background
The T/R components are widely applied to active phased array radars, are mainly used for realizing amplification of transmitting signals, amplification of receiving signals and control of signal amplitude and phase, and comprise low-noise amplification, power amplification, amplitude limiters, phase shifters and the like, and one phased array radar comprises hundreds of T/R components. The cost of the T/R component occupies more than 50% of the whole radar, wherein S parameters corresponding to different states such as phase shift, attenuation, time delay and the like are collectively called polymorphic S parameters, and the polymorphic S parameters are indexes which must be concerned by the T/R component.
Each component must be tested for dozens of indexes, if manual testing is adopted, huge time cost is consumed, so that the current T/R components generally adopt corresponding automatic testing systems, and because the T/R components are different in types, requirements and quantity, the requirements on precision and time are high and other factors, the T/R components cannot be processed by a general automatic testing system, a customized special testing system is selected to ensure the precision and the testing time requirements, wherein the polymorphic S parameters often become an important bottleneck of the time factors of the testing systems.
Aiming at the conventional T/R module polymorphic S parameter test, the following problems exist at present:
the conventional testing method generally adopts an upper computer to send a command of a certain state to a wave control board, the wave control board sends a control signal corresponding to the command to a T/R component for control, and finally the upper computer reads and records an S parameter result of the state from a vector network, and then the process is repeatedly circulated until all hundreds of states are tested. The method is the most commonly used method, but due to the fact that repeated cycling operation is conducted for countless times, a large amount of testing time is occupied, and the testing time is an important index for measuring a T/R component automatic testing system.
Disclosure of Invention
The invention aims to provide a T/R assembly multi-state S parameter measuring system based on a vector network, which enables the T/R assembly multi-state S parameter testing time to have a great time qualitative change, if the time of the testing item can be effectively reduced, the testing time of the full life cycle of the T/R assembly is reduced, the production testing efficiency of the T/R assembly is effectively improved, and the problems in the background technology are solved.
In order to achieve the purpose, the invention provides the following technical scheme:
a T/R assembly multi-state S parameter measuring system based on a vector network comprises an upper computer, a vector network analyzer, a wave control board and a T/R assembly, wherein the input end of the upper computer is connected with the vector network analyzer through LAN or GPIB, the output end of the upper computer is connected with the input end of the wave control board, the output end of the wave control board is connected with the input end of the T/R assembly, and the output end of the T/R assembly is connected with the input end of the vector network analyzer;
the upper computer is provided with a processing module for the vector network analyzer, and the processing module is used for controlling and reading data;
the wave control board comprises a wave control module which is used for receiving a control command issued by the upper computer and providing necessary control signals for the T/R assembly to control the T/R assembly to switch corresponding attenuation, phase shift or delay states;
and the T/R component tests the S parameters in different states according to the control signal and transmits the S parameters to the vector network analyzer.
As a still further scheme of the invention: the upper computer sets up the processing module to the vector network analyzer and also includes setting up and scanning the mode of vector network, the scanning mode of said vector network is a sectional scan, its sectional mode is to measure 1.0G-1.1G specifically, the measured piece of 21 frequency points attenuates 64 attitude data, divide into 21 sections, set up 64 data points in each section, the initial termination frequency is set as the same and increased with the number of sections, namely the first section 1.0G, the second section 1.005G, the third section 1.01G … … the Nth section is 1.0G + (N-1) 0.005G, and 0 < N ≦ 21, N gets the integer;
setting a vector network scanning mode as an external trigger mode, namely, carrying out test scanning once a measurement trigger signal is received;
setting a vector network measurement trigger signal mode as point trigger;
and setting the vector net measurement signal trigger edge as a rising edge.
As a still further scheme of the invention: the wave control module tests the phase shift 64 states of the T/R component in the receiving working mode, the wave control board, the T/R component and the vector network analyzer form a loop, namely the wave control module sends 0 state to the T/R component and sends a measuring signal to the vector network analyzer, after the vector network analyzer completes the corresponding state test, the wave control module continues to send 1 state to the T/R component and sends the measuring signal to the vector network analyzer until all tests of 64 states are completed.
As a still further scheme of the invention: the multi-state S parameters are divided into five types of instructions according to receiving and transmitting, the receiving instruction comprises a phase shift error, 64 states, an attenuation precision, 64 states, a delay error precision and 14 states, and the transmitting instruction comprises the phase shift error, 64 states, the delay error and 14 states.
As a still further scheme of the invention: the upper computer transmits and receives a phase shift error and a 64-state instruction, receives an attenuation precision and a 64-state instruction, receives a delay error precision and a 14-state instruction, transmits the phase shift error and the 64-state instruction, and transmits the delay error and the 14-state instruction to the wave control module, and the wave control module transmits a 0-state control instruction to the T/R component and transmits a measurement signal to the vector network analyzer.
Compared with the prior art, the invention has the beneficial effects that: the method utilizes the technologies of section scanning, point triggering and external triggering of a vector network analyzer, namely, an upper computer sends and receives a 64-state attenuation test instruction to a wave control board, the upper computer waits after sending, and the wave control board sends and receives a control signal of an X-state attenuation state to a T/R assembly after receiving the instruction of the upper computer, wherein the X initial state is 0 state, and sends a measurement signal to the vector network analyzer; after receiving the measurement signal, the vector network analyzer performs measurement of a segment Y (the initial Y is 1) according to the initialized setting, namely 1.0Ghz, and fills data into the data 1 position of the segment 1 by default; the wave control board sends a control signal of an attenuation 1 state to the T/R assembly, and then sends a measurement signal to the vector network; and repeating the operation of X +1 state, filling data into the position of data 2 of the segment 1 by default until 64 states are sent completely, namely all 64 states of the segment 1 assembly at 1.0GHz are measured completely, then returning the wave control board to the attenuation 0 for repeated operation, completing the measurement of … data of all 64 states of 1.005Ghz until all data of 21 frequency points to be tested are measured completely, greatly reducing the test time of the whole life cycle of the T/R assembly, effectively improving the production test efficiency of the T/R, enabling design researchers to find and solve problems more quickly, obtaining feedback more quickly, and adding power for the development of radars, aerospace and other industries in China.
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In order to facilitate understanding for those skilled in the art, the present invention will be further described with reference to the accompanying drawings.
FIG. 1 is a schematic structural diagram of a flow chart in the present invention.
FIG. 2 is a block diagram of a polymorphic S-parameter classification instruction according to the present invention.
FIG. 3 is a schematic diagram of the operation of the present invention.
FIG. 4 is a schematic structural diagram of a test flow chart in the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1 to 4, in the embodiment of the present invention, a T/R module multi-state S parameter measurement system based on a vector network measures 21 frequency points in total from 1.0Ghz to 1.1Ghz by taking an upper computer as an example for measuring a receiving attenuation 64 state, and the specific operation steps are as follows:
the method comprises the following steps: the vector network scanning mode is set to be segmented scanning (set by using an SCPI instruction), and the segmentation is detailed as follows:
step two: setting a vector network trigger mode as external trigger, so that the vector network analyzer can perform a test only after receiving an external trigger signal given by a wave control board;
step three: the vector network measurement mode is set to be a point mode, the conventional vector network measurement mode is Channel or Trace, namely, the test of one Channel or one curve is finished by one-time scanning, and the point trigger is set, so that the vector network analyzer only scans one data in each test.
Step four: the test was started, as shown in FIG. 4
S1: the upper computer sends and receives an attenuation 64-state test instruction to the wave control board, and waits after the upper computer finishes sending;
s2: after receiving an instruction of an upper computer, the wave control board sends a control signal for receiving an attenuation X state to the T/R assembly, (the X initial state is 0 state), and sends a measurement signal to the vector network analyzer;
s3: after receiving the measurement signal, the vector network analyzer performs measurement of a segment Y (the initial Y is 1) according to the initialized setting, namely 1.0Ghz, and fills data into the data 1 position of the segment 1 by default;
s4: the wave control board sends a control signal of an attenuation 1 state to the T/R assembly, and then sends a measurement signal to the vector network;
s5: repeating the operation of S3, filling data into the data 2 position of the segment 1 by default until the 64 states are completely transmitted, namely all 64 states of the segment 1 assembly at 1.0GHz are completely measured, then returning the wave control board to the attenuation 0 for repeating the operation, and completing the measurement … of all 64 state data of the segment 2 and 1.005GHz by the vector network until all data of the frequency points required to be tested of 21 segments are completely measured;
s6: after the wave control board finishes all tests, sending a finished instruction to an upper computer;
s7: after the upper computer receives the finished command, the upper computer carries out segmentation, so that 21 × 64 data points are totally used, all data are directly read by using the SCPI command, and after the data are read, the data are processed, so that S parameter test data of each frequency point of the component in different attenuation states can be obtained.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes in the embodiments and/or modifications of the invention can be made, and equivalents and modifications of some features of the invention can be made without departing from the spirit and scope of the invention.
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Citations (3)
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|---|---|---|---|---|
| CN103267902A (en) * | 2013-05-20 | 2013-08-28 | 中国电子科技集团公司第四十一研究所 | A fast antenna testing device and method based on hardware trigger |
| CN105242246A (en) * | 2015-09-08 | 2016-01-13 | 西安电子科技大学 | Automatic radar T/R (Transmitter/Receiver) assembly testing system and method thereof |
| CN109030986A (en) * | 2018-06-14 | 2018-12-18 | 中国电子科技集团公司第四十研究所 | T/R component phase shifting accuracy test method and system based on Trigger Function |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103267902A (en) * | 2013-05-20 | 2013-08-28 | 中国电子科技集团公司第四十一研究所 | A fast antenna testing device and method based on hardware trigger |
| CN105242246A (en) * | 2015-09-08 | 2016-01-13 | 西安电子科技大学 | Automatic radar T/R (Transmitter/Receiver) assembly testing system and method thereof |
| CN109030986A (en) * | 2018-06-14 | 2018-12-18 | 中国电子科技集团公司第四十研究所 | T/R component phase shifting accuracy test method and system based on Trigger Function |
Non-Patent Citations (1)
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| 黄凯冬;尹仲琪;胡勇;: "利用矢量网络分析仪测量时延特性的方法", 电讯技术, no. 01 * |
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Application publication date: 20210928 |