CN113447860A - Residual magnetic field triaxial component in-situ measurement method under shielding environment - Google Patents
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Abstract
The method focuses on the resonance characteristic of spin-polarized electrons under an external magnetic field, is a quick, in-situ and high-precision residual magnetic field measuring method suitable for an atomic spin magnetometer or an atomic magnetometer residual magnetic field measuring method based on electron paramagnetic resonance, overcomes the defects of low measuring precision and the like of the existing method, provides theoretical support for compensating the residual magnetic field, is beneficial to realizing automatic measurement and real-time compensation of the residual magnetic field, and provides basic guarantee for improving the performance of the SERF atomic magnetometer.
Description
Technical Field
The invention relates to the technical field of optical detection, magnetic field detection and analysis, in particular to a residual magnetic field triaxial component in-situ measurement method in a shielding environment, which focuses on the resonance characteristic of spin-polarized electrons in an external magnetic field and is a rapid, in-situ and high-precision residual magnetic field measurement method suitable for an atomic spin magnetometer or an atomic magnetometer residual magnetic field measurement method based on electron paramagnetic resonance.
Background
With the rapid development of quantum manipulation technology and extremely weak signal detection and extraction technology, the all-optical atomic magnetometer is rapidly developed. Unlike conventional superconducting quantum interferometers (SQUIDs), atomic magnetometers do not require liquids4He is subjected to low-temperature cooling, and the operation and control are more convenient. Among the many types of atomic magnetometers, the atomic magnetometers based on the spin-exchange relaxation (SERF) effect are most attractive. A team of Romalis from Princeton university achieved 0.16fT/Hz in 20101/2The sensitivity of the magnetic field measurement of (1) and has been successfully applied to the study of Magnetoencephalogram (MEG) and Magnetocardiogram (MCG) measurements.
One of the important features of atomic magnetometer manipulation in the SERF state is that the spin exchange rate is much greater than the larmor precession frequency. In general, there are two ways to achieve atomic spin SERF states: under a certain magnetic field intensity, the spin exchange rate is improved by increasing the density (namely the working temperature) of alkali metal atoms; secondly, in a certain working temperature range, the larmor precession frequency is reduced by restraining the amplitude of the residual magnetic field. However, these two approaches complement each other. The lower the remanent magnetic field, the lower the operating temperature required to achieve the atomic spin SERF state. It follows that achieving in-situ measurement of the remnant magnetic field is the root for achieving the atomic spin SERF state.
The traditional residual magnetic field measurement method is to use a magnetic sensing probe placed at the central position of the residual magnetic field to be measured to complete measurement, but the method is more suitable for the condition with low requirement on measurement precision, such as geomagnetic field intensity measurement. Furthermore, the conventional measurement method has some limitations if it is used to measure the residual magnetic field in the atomic magnetometer based on the SERF effect: on one hand, within a smaller magnetic field uniform area, the position deviation between the magnetic sensor probe and the sensitive gauge outfit of the atomic magnetometer causes measurement errors; on the other hand, the measurement accuracy is limited to the magnetic sensor accuracy. Therefore, the method for realizing the in-situ measurement of the residual magnetic field by using the sensitive gauge head of the atomic magnetometer based on the SERF effect is the best scheme. Seltzer et al have studied the synchronous independent measurement method of the triaxial component of the residual magnetic field of the atomic magnetometer, monitor and demodulate the output signal through the modulating magnetic field of two different amplitudes and frequencies applied to x and z axes separately and utilizing the lock-in amplifier, obtain the signal in direct proportion to triaxial component amplitude of the magnetic field. Walker et al propose a z-field parameter modulation method for atomic magnetometers under shielded environments that detects x-and y-direction residual magnetic field components while suppressing non-magnetic technical noise using z-direction magnetic field parameter modulation. Ito et al, by means of their own developed hybrid pump optical pump atomic magnetometer, utilized a linear array of photodiodes and charge coupled sensors to measure in real time the one and two dimensional magnetic field distribution states generated by the test coil. Gusarov et al achieve the measurement of the 3-D remnant magnetic field in a SERF atomic magnetometer by pumping air chambers layer by layer continuously in a direction perpendicular to the detection light and collecting signals by an array photodiode, but the magnetic field measurement accuracy is affected by the non-uniform light intensity caused by the beam expansion of the pumping light. Based on earlier research work, Gusarov et al recently proposed a method for measuring the residual magnetic field in the internal space of a SERF atomic magnetometer based on a multi-channel pumping-detection configuration, and the method completes the measurement process by spatially selectively pumping a gas chamber and analyzing the atomic polarizability. A three-component independent measuring method of a magnetic field based on a single beam scheme and a measuring method of the magnetic field distribution in the z direction of an SERF atomic spin magnetometer based on detection light modulation are provided for room construction and the like. However, some of the above magnetic field measurement methods are difficult to be directly used in a SERF magnetic field measurement device due to limitations of device configuration and the like, some of the magnetic field measurement methods have limited measurement accuracy, and some of the magnetic field measurement methods cannot realize three-axis component measurement of a magnetic field. Therefore, it is particularly important to explore an in-situ high-precision residual magnetic field triaxial component measurement method.
In order to solve the problems and make up for the defects of the existing method, the invention provides an atomic magnetometer residual magnetic field three-axis component in-situ measurement method based on an electron paramagnetic resonance theory. The invention provides a method for realizing in-situ measurement of triaxial components of a residual magnetic field by utilizing the resonance characteristic of spin-polarized electrons under an external magnetic field, aiming at the problem that the residual magnetic field influences the sensitivity of an atomic magnetometer and further restricts the performance of the atomic magnetometer. The method overcomes the defect of lacking a rapid, high-precision and in-situ SERF atomic magnetometer residual magnetic field triaxial component measuring method, can provide theoretical reference and method support for automatic measurement and real-time compensation of the residual magnetic field triaxial component, and provides basic guarantee for improving the measurement sensitivity of the SERF atomic magnetometer.
Disclosure of Invention
The method focuses on the resonance characteristic of spin-polarized electrons under an external magnetic field, is a quick, in-situ and high-precision residual magnetic field measuring method suitable for an atomic spin magnetometer or an atomic magnetometer residual magnetic field measuring method based on electron paramagnetic resonance, overcomes the defects of low measuring precision and the like of the existing method, provides theoretical support for compensating the residual magnetic field, is beneficial to realizing automatic measurement and real-time compensation of the residual magnetic field, and provides basic guarantee for improving the performance of the SERF atomic magnetometer.
The technical solution of the invention is as follows:
the method for in-situ measurement of the three-axis component of the residual magnetic field in the shielding environment is characterized by comprising the steps of utilizing the direct proportion relation between the resonance frequency of spin-polarized electrons in the paramagnetic resonance phenomenon of the spin-polarized electrons under the action of an external magnetic field and the amplitude of the external magnetic field, fitting and obtaining resonance frequency information, and sequentially carrying out z-axis residual magnetic field component measurement, x-axis residual magnetic field component measurement and y-axis residual magnetic field component measurement through the resonance frequency information.
The method comprises the following steps:
step 1, spin-polarized electrons generate paramagnetic resonance under the action of an external magnetic field, and the resonance frequency omega0Amplitude B of external magnetic field0In a direct proportion to the total weight of the composition,
ω0＝γB0 (1)
wherein gamma is the electron gyromagnetic ratio;
wherein f (upsilon) is a paramagnetic resonance output signal, a and b are constants, upsilon is a sweeping field frequency, and lw is a resonance line width;
and step 10, fitting the extracted resonance frequency information according to the formula (2), and acquiring the x-axis residual magnetic field component by using a formula (12).
y-axis residual magnetic field component Brem-yAnd (3) measuring, namely according to the z-axis and x-axis residual magnetic field component values obtained in the step 6 and the step 10, firstly roughly zeroing the residual magnetic field along the z-axis and x-axis, and applying a scanning magnetic field along the x-axis only in the same other measuring process as the measuring process of the x-direction residual magnetic field component.
The y-axis residual magnetic field component is,
in the formula
Is the resonant frequency of the spin-polarized electrons under the y-axis forward magnetic field,
is the resonance frequency of the spin-polarized electrons under the y-axis negative resultant magnetic field.
The direction of the three-axis component of the residual magnetic field is the same as the direction of the residual magnetic field and the larger amplitude of the magnetic field.
The invention has the following technical effects: aiming at the problem that the residual magnetic field influences the sensitivity of the atomic magnetometer and further restricts the performance of the atomic magnetometer, the invention provides the in-situ measurement method of the three-axis component of the residual magnetic field in the shielding environment based on the resonance characteristic of spin-polarized electrons under the external magnetic field.
The in-situ measurement of the three-axis component of the residual magnetic field in the shielding environment has the following characteristics: (1) the defects of the existing optical frequency shift measuring method are overcome; (2) the method is beneficial to realizing automatic measurement and real-time compensation of the residual magnetic field; (3) and a basic guarantee is provided for improving the sensitivity of the atomic magnetometer based on the SERF effect.
Drawings
FIG. 1 is a schematic diagram illustrating the principle of the method for in-situ measurement of three-axis components of a residual magnetic field in a shielding environment according to the present invention. In FIG. 1
For applying magnetic fields in the positive direction of the x-axis (for short)
Or x-axis forward applied magnetic field
)；
For applying magnetic fields in the negative direction of the x-axis (for short)
Or x-axis negative applied magnetic field
)；
For applying magnetic fields in the positive direction of the y-axis (for short)
Or the y-axis applying a magnetic field in the forward direction
)；
For applying magnetic fields in the negative direction of the y-axis (for short)
Or the y-axis applies a magnetic field in the negative direction
)；
For applying magnetic fields in the positive direction of the z-axis (for short)
Or the z-axis applying a magnetic field in the forward direction
)；
For applying magnetic fields in negative direction along the z-axis (for short)
Or the z-axis applies a magnetic field in the negative direction
)；
For combining magnetic fields in the positive direction of the measuring axis (abbreviated correspondingly)
In the subscript, tot indicates the close, x indicates the x-axis, y indicates the y-axis, and z indicates the z-axis);
for combining magnetic fields in the negative direction of the measuring axis (abbreviated correspondingly)
)；BremIs a residual magnetic field; omega+Electrons polarized by spin in
A lower resonance frequency; omega-Electrons polarized by spin in
A lower resonance frequency; b isz-fixedApplying a magnetic field for fixation in the positive z-axis direction;
is the magnetic moment.
FIG. 2 is a schematic diagram of an experimental apparatus for implementing the in-situ measurement method of three-axis components of the residual magnetic field in the shielding environment. The reference numbers in fig. 2 are listed below: 1 is a magnetic shielding barrel; 2 is a quarter wave plate; 3 is a first polarization beam splitter prism; 4 is a first quarter wave plate; 5 is a first convex lens; 6 is a second convex lens; 7 is a first reflector; 8 is a first photodetector; 9 is a second reflector; 10 is a second polarization beam splitter prism; 11 is a second half wave plate; 12 is a first optical isolator; 13 is a pump laser; 14 is a third convex lens; 15 is a laser frequency stabilization module; 16 is a three-dimensional coil; 17 is an alkali metal gas chamber; 18 is a fourth convex lens; 19 is a third polarization splitting prism; 20 is a third reflector; 21 is a first balanced detector; 22 is a Zurich Instruments digital phase-locked amplifier; 23 is a signal generator; 24 is a data processing system; 25 is a heating oven; 26 is a polarizer; 27 is a second optical isolator; and 28 is a detection laser.
FIG. 3 is a three-axis component measurement result of the residual magnetic field by using the in-situ measurement method for the three-axis component of the residual magnetic field in the shielding environment. The measured residual magnetic field component amplitudes are shown in FIG. 3, with (9.60. + -. 0.32) nT on the x-axis, (2.25. + -. 0.11) nT on the y-axis and (2.83. + -. 0.17) nT on the z-axis. The directions of the three-axis components of the residual magnetic field in fig. 3 are all negative along the corresponding axes. Included in fig. 3 are left, middle, and right views. The abscissa of the left plot is the x-axis applied current (mA) and is scaled by 0.44, 0.46, 0.48, 0.50, 0.52, 0.54, 0.56, and the ordinate of the left plot includes the lower residual magnetic field (nT), the scales are 9.0, 9.2, 9.4, 9.6, 9.8, 10.0, the upper total magnetic field (nT), and the scales are 35, 42, 49, 56, 63, 70, 77. The abscissa of the middle plot is the y-axis applied current (mA) and is scaled by 0.44, 0.46, 0.48, 0.50, 0.52, 0.54, 0.56, and the ordinate of the middle plot includes the underlying residual magnetic field (nT), which is scaled by 2.10, 2.15, 2.20, 2.25, 2.30, 2.35, 2.40, and the overlying total magnetic field (nT), which is scaled by 40, 42, 44, 48, 52, 56, 60. The abscissa of the right plot is the z-axis applied current (mA) and is scaled by 0.44, 0.46, 0.48, 0.50, 0.52, 0.54, 0.56, and the ordinate of the right plot includes the lower residual magnetic field (nT), the scales are 2.10, 2.4, 2.7, 3.0, 3.3, 3.6, the upper total magnetic field (nT), and the scales are 330, 360, 390, 420, 450.
Detailed Description
The invention is explained below with reference to the figures (fig. 1-3) and the examples.
FIG. 1 is a schematic diagram illustrating the principle of the method for in-situ measurement of three-axis components of a residual magnetic field in a shielding environment according to the present invention. FIG. 2 is a schematic diagram of an experimental apparatus for implementing the in-situ measurement method of three-axis components of the residual magnetic field in the shielding environment. FIG. 3 is a three-axis component measurement result of the residual magnetic field by using the in-situ measurement method for the three-axis component of the residual magnetic field in the shielding environment. In FIG. 1
For an applied magnetic field applied in the positive x-direction;
for an applied magnetic field applied in the negative x-axis direction;
for an applied magnetic field applied in the positive y-axis direction;
for an applied magnetic field applied in the negative y-axis direction;
for an applied magnetic field applied in the positive z-axis direction;
for an applied magnetic field applied in a negative z-axis direction;
the magnetic field is combined along the positive direction of the measuring axis;
the magnetic field is combined along the negative direction of the measuring axis; b isremIs a residual magnetic field; omega+Electrons polarized by spin in
A lower resonance frequency; omega-Electrons polarized by spin in
A lower resonance frequency; b isz-fixedApplying a magnetic field for fixation in the positive z-axis direction;
is the magnetic moment. Referring to fig. 1 to 3, the in-situ measurement method of three-axis residual magnetic field components in a shielding environment includes obtaining resonance frequency information by fitting according to a direct ratio relationship between a resonance frequency of spin-polarized electrons in a paramagnetic resonance phenomenon of spin-polarized electrons under an external magnetic field and an amplitude of the external magnetic field, and sequentially performing z-axis residual magnetic field component measurement, x-axis residual magnetic field component measurement, and y-axis residual magnetic field component measurement according to the resonance frequency information. Following with K-4He atomic magnetometer is taken as an example, and the process of measuring the three-axis component of the residual magnetic field is described by using the method.
The in-situ measurement method of the three-axis component of the residual magnetic field in the shielding environment comprises the following steps:
(1) and adjusting and connecting the light path. The optical path was fine-tuned according to the experimental setup diagram shown in fig. 2. The experimental device in fig. 2 includes a magnetic shielding barrel 1, a quarter-wave plate 2, a first polarization beam splitter 3, a first quarter-wave plate 4, a first convex lens 5, a second convex lens 6, a first reflector 7, a first photodetector 8, a second reflector 9, a second polarization beam splitter 10, a second half-wave plate 11, a first optical isolator 12, a pump laser 13, a third convex lens 14, a laser frequency stabilization module 15, a three-dimensional coil 16, an alkali metal gas chamber 17, a fourth convex lens 18, a third polarization beam splitter 19, a third reflector 20, a first balance detector 21, a Zurich Instruments digital phase-locked amplifier 22 (the output signal is paramagnetic resonance output signal f (upsilon), the function of the scanning field frequency, the split axis and the positive and negative directions can be respectively expressed as paramagnetic resonance output signal f (upsilon), and the scanning field frequency can be expressed as positive and negative directions
A signal generator 23, a data processing system 24, a heating oven 25, a polarizer 26, a second optical isolator 27, and a detection laser 28.
(2) And (5) preparing the system. The heating system was turned on and the alkali metal cell was heated to 170 ℃. The pump laser power was adjusted to 5mW and the detection laser power was adjusted to 3.2 mW.
(3) The test is started. The test sequence is z-axis first, then x, y-axis.
(4) A DC steady-state applied magnetic field with an amplitude of 300nT is applied along the positive and negative directions of the z-axis respectively, and a sinusoidal scanning magnetic field with an amplitude of 100mV is applied along the y-axis simultaneously. Then the z-axis applies the resultant magnetic field formed by the magnetic field and the residual magnetic field
And
and the resonance frequency
Respectively, are as follows,
(5) the resonance frequency in step (4) can be obtained by fitting according to the following formula,
wherein,
and
outputting signals for positive and negative paramagnetic resonance, wherein a and b are constants, v is the scanning field frequency, and lw is the resonance line width;
(6) from the equations (14) and (15), it can be seen that the z-axis residual magnetic field component is,
(7) the z-axis residual magnetic field component can be obtained by substituting resonance frequency information extracted by fitting from the formula (16) and the formula (17) into the formula (18).
(8) According to the component value of the z-axis residual magnetic field obtained in the step (7), firstly, the residual magnetic field along the z-axis is roughly zeroed, and then a fixed application magnetic field B with the amplitude of 300nT is applied to the z-axisz-fixedSimultaneously, an applied magnetic field with the amplitude of 40.5nT is respectively applied to the positive direction and the negative direction of x
And
while a sinusoidal scanning magnetic field with an amplitude of 100mV is applied along the y-axis. Then the x-axis applies the resultant magnetic field formed by the magnetic field and the residual magnetic field
And
and the resonance frequency
Respectively, are as follows,
(9) the resonance frequency in step (8) can be obtained by fitting,
(10) from the equations (21) and (22), it can be seen that the x-axis residual magnetic field component is,
(11) the x-axis residual magnetic field component can be obtained by substituting resonance frequency information extracted by fitting from the formula (23) and the formula (24) into the formula (25).
(12) According to the component values of the residual magnetic fields of the z axis and the x axis obtained in the step (7) and the step (11), firstly, the residual magnetic fields along the z axis and the x axis are roughly zeroed, and then a fixed application magnetic field B with the amplitude of 300nT is applied to the z axisz-fixedSimultaneously, an applied magnetic field with amplitude of 38.25nT is respectively applied in the positive and negative directions of y
And
while a sinusoidal scanning magnetic field with an amplitude of 100mV is applied along the x-axis. Then the y-axis applies the resultant magnetic field formed by the magnetic field and the residual magnetic field
And
and the resonance frequency
Respectively, are as follows,
(13) the resonance frequency of step (12) can be obtained by fitting,
(14) according to the formula (30) and the formula (31), it can be known that the y-axis residual magnetic field component is,
(15) the y-axis residual magnetic field component can be obtained by substituting resonance frequency information extracted by fitting from the formula (30) and the formula (31) into the formula (32).
(16) And (5) repeating the steps (1) to (15).
(17) The final measurement results are expressed as a weighted average ± measurement uncertainty.
(18) The direction of the three-axis component of the residual magnetic field is the same as the direction of the residual magnetic field and the larger amplitude of the magnetic field.
(19) The three-axis component measurement result of the residual magnetic field measured by the invention patent is as follows,
three-axis component measurement result of residual magnetic field of atomic magnetometer
As shown in fig. 3, the magnitudes of the components of the residual magnetic field measured by the method of the present invention along the three axes x, y, and z are respectively: (9.60 +/-0.32) nT, (2.25 +/-0.11) nT and (2.83 +/-0.17) nT; the directions of the three-axis components of the residual magnetic field are all along the negative direction of the corresponding axis.
Those skilled in the art will appreciate that the invention may be practiced without these specific details. It is pointed out here that the above description is helpful for the person skilled in the art to understand the invention, but does not limit the scope of protection of the invention. Any such equivalents, modifications and/or omissions as may be made without departing from the spirit and scope of the invention may be resorted to.
Claims (4)
1. The method for in-situ measurement of the three-axis component of the residual magnetic field in the shielding environment is characterized by comprising the steps of utilizing the direct proportion relation between the resonance frequency of spin-polarized electrons in the paramagnetic resonance phenomenon of the spin-polarized electrons under the action of an external magnetic field and the amplitude of the external magnetic field, fitting and obtaining resonance frequency information, and sequentially carrying out z-axis residual magnetic field component measurement, x-axis residual magnetic field component measurement and y-axis residual magnetic field component measurement through the resonance frequency information.
2. The in-situ measurement method for the three-axis component of the residual magnetic field in the shielding environment according to claim 1 is characterized by comprising the following steps:
step 1, spin-polarized electrons generate paramagnetic resonance under the action of an external magnetic field, and the resonance frequency omega0Amplitude B of external magnetic field0In a direct proportion to the total weight of the composition,
ω0＝γB0 (1)
wherein gamma is the electron gyromagnetic ratio;
step 2, the resonance frequency omega stated in step 10Obtained by the following fitting method,
wherein f (upsilon) is a paramagnetic resonance output signal, a and b are constants, upsilon is a sweeping field frequency, and lw is a resonance line width;
step 3, z-axis residual magnetic field component Brem-zMeasuring by applying two applied magnetic fields with the same amplitude respectively along positive and negative directions of z-axis
And
with + in the superscript denoting the positive direction and z in the subscript denoting the z-axis, and a sinusoidal scanning magnetic field applied along the y-axis, the two applied magnetic fields applied along the z-axis and the axis-remanent magnetic field component Brem-zResultant magnetic field
And
respectively, are as follows,
step 4, under the two magnetic fields in the step 3, the spin-polarized electrons resonate and the resonance frequency is expressed according to the formula (1)
Respectively, are as follows,
step 5, according to the formula (5) and the formula (6), the residual magnetic field component of the z-axis is,
step 6, fitting the extracted resonance frequency information according to the formula (2), and acquiring a residual magnetic field component of the z axis by using a formula (7);
step 7, x-axis residual magnetic field component Brem-xMeasuring, namely, according to the z-axis residual magnetic field component information obtained in the step (7), roughly zeroing the z-axis residual magnetic field, and then applying a fixed application magnetic field B with known amplitude along the z-axisz-fixedSimultaneously applying two applied magnetic fields with the same amplitude along the positive and negative directions of the x-axis
And
subscript x represents the x-axis; the two applied magnetic fields on the x-axis and the residual magnetic field Brem-xFixed magnetic field B with z-axisz-fixedRespectively form two combined magnetic fields
And
step 8, under the two magnetic fields in which the step 7 is positioned, the spin-polarized electrons resonate, and the resonance frequency is according to the formula (1)
Respectively, are as follows,
step 9, according to the formula (10) and the formula (11), the x-axis residual magnetic field component is,
and step 10, fitting the extracted resonance frequency information according to the formula (2), and acquiring the x-axis residual magnetic field component by using a formula (12).
y-axis residual magnetic field component Brem-yMeasurement of z obtained according to step 6 and step 10And the x-axis residual magnetic field component value is firstly roughly zeroed along the z-axis and the x-axis residual magnetic field, other measurement processes are the same as the x-direction residual magnetic field component measurement process, and only the scanning magnetic field is applied along the x-axis.
3. The in-situ measurement method for three-axis components of residual magnetic field in shielded environment according to claim 2, wherein the y-axis residual magnetic field component is,
in the formula
Is the resonant frequency of the spin-polarized electrons under the y-axis forward magnetic field,
is the resonance frequency of the spin-polarized electrons under the y-axis negative resultant magnetic field.
4. The in-situ measurement method for the three-axis component of the residual magnetic field in the shielding environment of claim 1, wherein the direction of the three-axis component of the residual magnetic field is the same as the direction of the three-axis component of the residual magnetic field, and the magnitude of the resultant magnetic field is larger than that of the three-axis component of the residual magnetic field.
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| CN114271826A (en) * | 2021-12-21 | 2022-04-05 | 苏州众烁云辉科技有限公司 | Single-beam polarization regulation-based magnetocardiogram imaging detection device and method |
| CN116381574A (en) * | 2023-02-23 | 2023-07-04 | 中国人民解放军海军工程大学 | Measurement device for remanence in magnetic shielding space |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103438877A (en) * | 2013-09-02 | 2013-12-11 | 北京航空航天大学 | Inertia and magnetic field integration measuring method based on SERF (spin-exchange-relaxation-free) atomic spin effect |
| CN107490775A (en) * | 2017-09-30 | 2017-12-19 | 北京航空航天大学 | A kind of three axial coil constants and non-orthogonal angles integral measurement method |
| CN107727089A (en) * | 2017-09-30 | 2018-02-23 | 北京航空航天大学 | A kind of measurement of three axle remnant fields and compensation method suitable for SERF atomic spin gyroscopes |
| CN109738837A (en) * | 2019-02-22 | 2019-05-10 | 北京航空航天大学 | A kind of remnant field original position compensation method for single beam SERF atom magnetometer |
-
2021
- 2021-06-24 CN CN202110707268.9A patent/CN113447860A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103438877A (en) * | 2013-09-02 | 2013-12-11 | 北京航空航天大学 | Inertia and magnetic field integration measuring method based on SERF (spin-exchange-relaxation-free) atomic spin effect |
| CN107490775A (en) * | 2017-09-30 | 2017-12-19 | 北京航空航天大学 | A kind of three axial coil constants and non-orthogonal angles integral measurement method |
| CN107727089A (en) * | 2017-09-30 | 2018-02-23 | 北京航空航天大学 | A kind of measurement of three axle remnant fields and compensation method suitable for SERF atomic spin gyroscopes |
| CN109738837A (en) * | 2019-02-22 | 2019-05-10 | 北京航空航天大学 | A kind of remnant field original position compensation method for single beam SERF atom magnetometer |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114271826A (en) * | 2021-12-21 | 2022-04-05 | 苏州众烁云辉科技有限公司 | Single-beam polarization regulation-based magnetocardiogram imaging detection device and method |
| CN114271826B (en) * | 2021-12-21 | 2024-09-10 | 苏州众烁云辉科技有限公司 | Device and method for detecting magnetocardiogram based on single-beam polarization regulation |
| CN116381574A (en) * | 2023-02-23 | 2023-07-04 | 中国人民解放军海军工程大学 | Measurement device for remanence in magnetic shielding space |
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