CN113447801B

CN113447801B - Switch position detection device and method for sliding switch

Info

Publication number: CN113447801B
Application number: CN202010218438.2A
Authority: CN
Inventors: 贺川
Original assignee: Valeo Interior Controls Shenzhen Co Ltd
Current assignee: Valeo Interior Controls Shenzhen Co Ltd
Priority date: 2020-03-25
Filing date: 2020-03-25
Publication date: 2024-03-15
Anticipated expiration: 2040-03-25
Also published as: CN113447801A

Abstract

A switch position detection device and method of a sliding switch are provided, wherein the sliding switch comprises a spring plate and at least two switch position areas, and a spacing area exists between adjacent switch position areas. The switch position detection device includes: a measurement module configured to output an electrical parameter measurement for determining a switch position of the sliding switch; a controller configured to: acquiring electrical parameter measurements from the measurement module at a predetermined sampling frequency; generating a track to be detected based on an electric parameter measurement value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in the reference curve track; and determining a switch position based on the particular portion trajectory. The coordinates of each trace point on the reference curve trace indicate: a position point of the trace point on at least two switch position areas and spacing areas, and a reference electrical parameter measurement at the position point.

Description

Switch position detection device and method for sliding switch

Technical Field

The present disclosure relates to the field of detection, and more particularly, to a switch position detection apparatus and method for a slide switch.

Background

In automobiles, slide switch technology is commonly used, such as a transmission select lever (Transmission Selection Lever, TSL) or a park-reverse-neutral-drive (PRND) lever.

These sliding switches typically have a plurality of switch positions between which different operations can be controlled by sliding the spring. For example, with a slide switch applied to the PRND lever, when the slide switch is in different switch positions, different shift positions may be selected, so that a vehicle control operation is performed according to whether parking, reverse, neutral, or forward is selected.

Disclosure of Invention

According to an aspect of the present disclosure, there is provided a switch position detecting device of a slide switch, wherein the slide switch includes a spring and at least two switch position regions, and a spacing region exists between adjacent switch position regions. The switch position detection device includes: a measurement module configured to output an electrical parameter measurement for determining a switch position of the sliding switch; a controller configured to: acquiring electrical parameter measurements from the measurement module at a predetermined sampling frequency; generating a track to be detected based on an electric parameter measurement value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in the reference curve track; and determining a switch position based on the particular portion trajectory. The coordinates of each trace point on the reference curve trace indicate: a position point of the trace point on at least two switch position areas and spacing areas, and a reference electrical parameter measurement at the position point.

According to another aspect of the present disclosure, there is provided a switch position detection method of a slide switch, wherein the slide switch includes a spring and at least two switch position regions, and a spacing region exists between adjacent switch position regions. The switch position detection method comprises the following steps: acquiring electrical parameter measurements from the measurement module at a predetermined sampling frequency; generating a track to be detected based on an electric parameter measurement value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in the reference curve track; and determining a switch position based on the particular partial trajectory, wherein coordinates of each trajectory point on the reference curve trajectory indicate: a position point of the trace point on at least two switch position areas and spacing areas, and a reference electrical parameter measurement at the position point.

Drawings

Fig. 1A-1B illustrate a structure of a switch position detecting device for a slide switch (the slide switch is also illustrated) according to an embodiment of the present disclosure.

Fig. 2A schematically illustrates an example in which abrasion or scratch occurs in each switch position area of the slide switch.

Fig. 2B-2C schematically show the change in contact resistance between the dome and the switch position area as the degree of wear or impurity accumulation changes.

Fig. 3A-3C schematically show a schematic variation of the measured value of the electrical parameter when the spring is located at various points on the sliding region in the presence of a worn region or an impurity accumulation region on the switch position region.

Fig. 4A-4D illustrate several examples of switch detection by a switch position detection device according to an embodiment of the present disclosure.

Fig. 5 shows a flowchart of a switch position detection method for a slide switch according to an embodiment of the present disclosure.

Detailed Description

The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure. It will be apparent that the described embodiments are merely embodiments of a portion, but not all, of the present disclosure. All other embodiments, which can be made by one of ordinary skill in the art without the need for inventive faculty, are intended to be within the scope of the present disclosure, based on the embodiments in this disclosure.

Fig. 1A to 1B show a structure of a switch position detecting device for a slide switch (the slide switch is also shown for convenience of description) according to an embodiment of the present disclosure.

As shown in fig. 1A, the switch position detection device 100 is constituted by a measurement module 101 and a controller 102.

The sliding switch S can be switched between a plurality of switch positions, i.e. between a plurality of switch position areas, and when the sliding switch S is in a different switch position, the measurement module 101 in the switch position detecting device 100 outputs to the controller 102 electrical parameter measurement values belonging to different electrical parameter measurement value threshold ranges, and the controller 102 determines the different switch positions in which the switch is located according to the electrical parameter measurement values belonging to different electrical parameter measurement value threshold ranges. The controller includes, but is not limited to, a microcontroller unit (Micro Control Unit, MCU).

More specifically, the controller 102 first presets an electrical parameter measurement value threshold range corresponding to each switch position of the slide switch S according to the structure of the measurement module and the parameter and experience data, to obtain a plurality of electrical parameter measurement value threshold ranges, and the electrical parameter measurement value threshold ranges corresponding to different switch positions do not overlap each other, have a predetermined gap range in which the electrical parameter measurement value is considered as an invalid electrical parameter measurement value, and are not used for judging the switch position. The controller may acquire the electrical parameter measurement values during the switching operation of the sliding switch from the measurement module in real time at a specific frequency, and since the controller composed of the MCU or other processing module generally processes only digital signals, it is also generally required to additionally convert the acquired electrical parameter measurement values into digital electrical parameter measurement values (hereinafter, referred to as electrical parameter measurement values for convenience of description) through an analog-to-digital conversion (ADC) process in order to facilitate the operation of the controller. And comparing the electrical parameter measured value with a plurality of preset electrical parameter measured value threshold ranges, thereby determining which electrical parameter measured value threshold range corresponds to the acquired electrical parameter measured value at which switch position, and further determining the switch position of the sliding switch. Further, if it is determined that the acquired electrical parameter measurement value does not belong to any one of a plurality of electrical parameter measurement value threshold ranges set in advance, that is, the controller 102 cannot determine which position the slide switch is switched to based on the acquired electrical parameter measurement value, then the controller 102 may determine that there is an error in the switch detection system, such as a switching operation failure, a switch short circuit, a contact failure, external disturbance, or the like, and optionally perform a warning and/or cause the switch position detection device to stop operating.

For a clearer description of the present disclosure, fig. 1B also schematically shows specific structures of the slide switch S and the switch position detecting device 100. However, those skilled in the art will appreciate that other configurations of the slide switch S and the switch position detection device 100 are possible, as long as it is satisfied that the slide switch S has a plurality of switch positions and that the measurement module 101 in the switch position detection device 100 is capable of outputting electrical parameter measurements belonging to different threshold ranges of electrical parameter measurements when the slide switch S is in different switch positions.

As shown in fig. 1B, the sliding switch S may include a spring, a plurality of pads (a first pad 1, a second pad 2, and a third pad 3 in the drawing) having physical intervals therebetween, and a common ground pad G, one pad corresponding to each switch position area. The spring plate can be electrically connected with the grounding pad when staying at one pad, wherein the resistance exists in a path formed when the spring plate is connected between the first pad 1, the second pad 2 or the third pad 3 and the grounding pad (comprising the contact resistance of the spring plate and the pad/grounding pad and the on-resistance of the spring plate). In addition, during the sliding of the spring plate through the interval region between the two pads, the spring plate is not in electrical contact with any one of the first pad 1, the second pad 2 or the third pad 3, and the measurement module outputs a constant electrical signal whose value does not fall within any threshold range of the measured value of the electrical parameter.

Optionally, the measuring module 101 in the switch position detecting device 100 includes a series resistor branch and an analog-to-digital conversion module (the analog-to-digital conversion part is omitted in fig. 1B), one end of the series resistor branch is connected to a power source, the other end is grounded, the resistors in the series resistor branch are connected to respective pads (for example, the first pad 1, the second pad 2 and the third pad 3) except that the first node from top to bottom is used as an output end of the measuring module 101 to output an electrical parameter measured value (voltage value), and when the spring sheet is on a different pad, the measuring module 101 may output a voltage measured value belonging to one of the preset voltage threshold ranges corresponding to the respective pads (switch positions) to the controller. The controller can obtain the voltage measurements from the measurement module 101 and determine the different switch positions in which the switches are located based on the respective voltage measurement threshold ranges. When the spring sheet is not in electrical contact with any of the first pad 1, the second pad 2, or the third pad 3, the measurement module outputs a constant voltage measurement value (hereinafter also referred to as an open circuit voltage), and the constant voltage measurement value does not belong to any voltage threshold range. It should be understood that the number of pads (switch positions) is not limited to three as shown in fig. 1B, and may be set according to actual circumstances.

However, abrasion or scratch may occur on each of the switch position areas (e.g., the first to third pad areas) of the slide switch S after the switch is switched a plurality of times, and pits (pids) may be further formed, or impurities may be accumulated on each of the switch position areas. The abrasion or scoring may occur due to abrasion of the conductive material (e.g., gold or nickel) itself in the region of the switch location. The impurities deposited on the switch position area may be silica in the dust. As the degree of abrasion or scratch of the pad gradually increases or the degree of impurity accumulation gradually increases, the contact resistance value between the elastic piece and the partial region where abrasion or scratch occurs and impurity accumulation occurs in each switch position region also gradually increases.

Fig. 2A schematically illustrates an example in which abrasion or scratch occurs in a sliding region of the slide switch associated with the switch position detecting device illustrated in fig. 1B. Fig. 2B-2C schematically show the change in contact resistance between the dome and the switch position area as the degree of wear or impurity accumulation changes.

In fig. 2A, (1) shows that there are a plurality of pits (worn areas) formed due to abrasion or scratches on the ground pad G and the remaining three pads (each pad area corresponds to one switch position area), and (2) and (3) show that the abrasion or scratch of the worn area 1 is more serious than that of the worn area 2 after enlarging the worn area 1 and the worn area 2, respectively.

Assuming that the elastic piece slides from the start point of the first switch position region to the end point of the third switch position region, and that there is a worn region or an impurity accumulation region on each switch position region, fig. 2B shows a schematic variation of the contact resistance value between the elastic piece and the sliding region at each position point on the sliding region (including the first to third switch position regions and the spacing region) in the horizontal direction.

Further, fig. 2C is an example of one switch position region (for example, a first switch position region corresponding to the first pad 1), and shows a change in contact resistance value between the spring plate and the switch position region at each position point on the switch position region, with the degree of abrasion or impurity accumulation existing on the abrasion region or the impurity accumulation region, assuming that three abrasion regions or impurity accumulation regions exist on the switch position region. As can be seen from fig. 2C, the higher the degree of abrasion or accumulation of impurities, the greater the contact resistance value between the elastic piece and the abrasion region or the impurity accumulation region.

Meanwhile, an increase in the contact resistance value between the elastic piece and the worn area or the impurity accumulation area causes a corresponding change in the measured value of the electrical parameter measured when the elastic piece is located at each position point on the worn area or the impurity accumulation area. For example, when the switch position detection is performed based on the structure of the switch position detection device shown in fig. 1B, the contact resistance value between the elastic piece and the worn region or the impurity accumulation region on the switch position region increases, and for a specific position point on the worn region or the impurity accumulation region, the measured value (voltage value) of the electrical parameter output by the measurement module increases when the elastic piece is located at the position point.

Fig. 3A to 3C schematically show schematic change curves of electrical parameter measurement values (voltage measurement values) when the elastic pieces are located at respective position points on the sliding region when there is a worn region or an impurity accumulation region on the switch position region based on the switch position detection device shown in fig. 1B.

Fig. 3A to 3B schematically show the change curves of the voltage measurement values corresponding to the respective position points of the spring piece located in the sliding region when the degree of abrasion or accumulation of impurities in the abrasion region or the accumulation region of impurities on the switch position region is low and high, respectively. In the case shown in fig. 3A, even if the voltage measurement value corresponding to each position point in the worn out region or the impurity accumulation region on each switch position region is offset to some extent with respect to the voltage measurement value corresponding to each position point in the other region, the smaller offset amount does not cause the voltage measurement value to deviate from the voltage measurement value threshold value range corresponding to the switch position of the switch position region. In the case shown in fig. 3B, however, the voltage measurement values corresponding to some of the position points in the worn-out region or the impurity accumulation region on each of the switch position regions are greatly shifted with respect to the voltage measurement values corresponding to the position points of the other regions, and shifted out of the voltage measurement value threshold range corresponding to the switch position of the switch position region (for example, the voltage values corresponding to some of the position points on the first switch position region and the second switch position region are respectively out of the corresponding first voltage value range and the second voltage value range).

Fig. 3C shows a specific change curve of the voltage measurement value when the elastic piece is located at each position point on the sliding region when there is a worn region or an impurity accumulation region on the switch position region based on the switch position detection device shown in fig. 1B.

In fig. 3C, the horizontal coordinates are the respective position points on the sliding region (the first to third switch position regions and the interval region between the adjacent pads are exemplified in the drawing), and the vertical coordinates are the voltage measurement values output by the measurement module when the spring piece is located at the respective position points. When the spring is at each position point of the first pad, the voltage measurement values obtained by the controller include voltage measurement values within a range as shown by circle 1 and circle 2 in fig. 3C. For the voltage measurement belonging to circle 1, the controller will take this voltage measurement as an invalid value and optionally determine that there is an error in the switch position detection means according to a detection method. For the voltage measurement belonging to circle 2, the controller determines from this voltage measurement that the sliding switch has now switched to the second switch position region. In addition, when the spring is in the process of switching to the second switch position area, the voltage measurement value obtained by the controller may include a voltage measurement value in a range shown by a circle 3 in fig. 3C, where the spring is located in a spacing area between the two switch position areas. For the voltage measurement belonging to circle 3, according to one detection method, since the voltage measurement is an open circuit voltage for a period of time, the controller will take the voltage measurement as an invalid value and optionally determine that there is an error in the switch position detection means, but this may be frequently reported as an error. Alternatively, if the controller does not consider the case where the voltage measurement value is the open-circuit voltage as an error in the switch position detecting device, it may not be accurately determined in the case where an error does exist in the switch position detecting device, thereby affecting safety and reliability.

Furthermore, since the spring is typically accompanied by a shake during the sliding, when the spring slides to a new switching position, i.e. when the controller starts to acquire voltage measurements falling within the new voltage measurement range, it usually waits for an additional time for filtering or debouncing, after which the controller then determines the switching position based on the acquired voltage measurements.

Therefore, if the above detection method is adopted, the controller may frequently report errors, and there may be additional delay in determining a new switch position, and also may determine an erroneous switch position.

In order to solve the above-mentioned problems, the present disclosure proposes an improved switch position detection device and method capable of accurately and rapidly detecting a switch position while increasing the accuracy and reliability of switch position detection in the presence of wear or accumulation of impurities on at least a part of each switch position region. The partial region in which abrasion or impurity accumulation exists is hereinafter also referred to as an abrasion or impurity accumulation region.

According to an embodiment of the present disclosure, there is provided a switch position detecting device. The switch position detecting device may have the same physical structure as the switch position detecting device 100 described with reference to fig. 1A to 1B, and a detailed description thereof will be omitted herein.

The switch position detection device provided by the application can carry out position determination based on a plurality of electrical parameter measurement values measured by the measuring module in the sliding process of the elastic sheet, so that the accuracy of switch position detection is improved, and the time delay of the determination process is improved.

For this reason, the controller 102 in the switch position detecting device 100 is configured to perform the following operations.

First, the controller 102 acquires electrical parameter measurement values from the measurement module 101 at a predetermined sampling frequency.

Optionally, the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement.

Alternatively, as the contact resistance value between the spring and the wear or impurity accumulation region on each switch position region increases, the measured value of the electrical parameter at each position point in the wear or impurity accumulation region also changes with the increase in the contact resistance value.

The controller 102 then generates a trajectory to be detected based on the sequence of electrical parameter measurements over a preset period of time prior to the current sampling point.

The sequence of electrical parameter measurement values refers to a sequence in which electrical parameter measurement values acquired at each sampling point within the preset period are arranged in a sampling time sequence.

Next, the controller 102 determines a specific partial trajectory that matches the trajectory to be detected among the reference curve trajectories, and determines the switch position based on the specific partial trajectory.

The coordinates of each trace point on the reference curve trace indicate: a location point of the trace point on the sliding region (i.e., the respective switch position region and the spacing region), and a reference electrical parameter measurement at the location point.

Optionally, the reference curve track is stored according to discrete track points, for example, horizontal coordinates of every two adjacent discrete track points are equidistant, and the total length between the minimum horizontal coordinates and the maximum horizontal coordinates is smaller than or equal to the length of the sliding region, and vertical coordinates of each discrete track point are reference electrical parameter measurement values corresponding to corresponding position points. For example, the reference curve trajectory is stored as discrete trajectory points in a horizontal coordinate equidistant manner: (X1, vr 1), (X2, vr 1), (X3, vr 1), (X4, vr 2), (X5, vr 2), (X6, vr 3), (X7, vr 4), …, wherein adjacent two horizontal coordinates are equidistant.

Optionally, determining a specific part of the reference curve track that matches the track to be detected includes: for each electrical parameter measurement value in the track to be detected, determining at least one discrete track point matched with the electrical parameter measurement value in the reference curve track; based on the discrete track points respectively matched with each electric parameter measured value in the track to be detected, a specific part track matched with the track to be detected is obtained.

Alternatively, the matching algorithm employs a hidden Markov model algorithm. In this case, the sequence of electrical parameter measurement values within the preset period is taken as an observation sequence, each electrical parameter measurement value in the sequence of electrical parameter measurement values is taken as an observation state, and a plurality of position points through which the elastic sheet passes within the preset period are taken as a hidden sequence, and each position point is in a hidden state.

Specifically, for each electrical parameter measurement in the track to be detected, determining at least one discrete track point in the reference curve track that matches the electrical parameter measurement comprises: for each electrical parameter measurement, at least one discrete trajectory point for which a deviation (e.g., a deviation or a percentage of a deviation) of the reference electrical parameter measurement from the electrical parameter measurement is within a first threshold range (e.g., 30% of the electrical parameter measurement) is determined, and a set of location points corresponding to the at least one discrete trajectory point is taken as a set of candidate location points for the electrical parameter measurement, wherein a probability of emission for each candidate location point decreases as the deviation of the corresponding reference electrical parameter measurement from the electrical parameter measurement increases. Furthermore, based on discrete track points respectively matched with each electrical parameter measurement value in the track to be detected, obtaining a specific partial track matched with the track to be detected comprises: calculating a state transition probability matrix between candidate position point sets of adjacent electric parameter measurement values, wherein the closer the distance between two candidate position points respectively belonging to the candidate position point sets of two adjacent electric parameter measurement values is, the greater the state transition probability of the two candidate position points is; and determining a specific partial trajectory matching the trajectory to be detected based on the emission probability of each candidate position point in each candidate position point set and the state transition probability matrix between the candidate position point sets of adjacent electrical parameter measurement values.

Still further, determining a particular partial trajectory matching the trajectory to be detected based on the emission probability of each candidate location point in each candidate location point set and the respective state transition probability matrices comprises: taking the emission probability of each candidate position point in the candidate position point set of the first electric parameter measured value in the track to be detected as the state probability; for an ith electrical parameter measurement value in the track to be detected, determining the state probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value according to the state probability of each candidate position point in the candidate position set of the ith-1 electrical parameter measurement value, the state transition probability matrix from the candidate position set of the ith-1 electrical parameter measurement value to the candidate position set of the ith electrical parameter measurement value, and the emission probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value; and determining a specific part of the tracks matched with the track to be detected based on the candidate position points with the highest state probability in the candidate position point set of the Nth electric parameter measured value, wherein i is more than or equal to 2 and less than or equal to N, and N is the total number of the electric parameter measured values in the track to be detected.

The matching process employing the hidden markov model algorithm is described in more detail below by way of a simple example.

Reference curve trajectories are known and, as previously described, may be stored in a discrete manner, i.e. the location points and corresponding reference electrical parameter measurements may be stored in an internal memory in the form of discrete points of (Xi, vri).

The sequence of electrical parameter measurements obtained during the preset time period is (V1, V2, V3 … Vn), which is the observed sequence, V1, V2, …, vn is the observed state, which are obtained by the controller through sampling.

Each electrical parameter measurement Vi in the sequence of electrical parameter measurements (V1, V2, V3 … Vn) may correspond to a location point Xi on the sliding region, the corresponding location point being unknown. Furthermore, each electrical parameter measurement Vi (i= … n) is eventually matched to one discrete trace point, and it is possible that more than two discrete trace points have the same reference electrical parameter measurement, i.e. one electrical parameter measurement may be closest to more than two discrete trace points. The sequence of location points corresponding to the plurality of discrete trace points matched to the sequence of electrical parameter measurements (V1, V2, V3 … Vn) is a hidden sequence.

The set of location points for which the deviation of the reference electrical parameter measurement value from the electrical parameter measurement value Vi corresponds to discrete trajectory points within the first threshold range may be regarded as the i-th candidate set of location points for the electrical parameter measurement value Vi, and the emission probability of each candidate location point in the i-th candidate set of location points is related to the deviation of the reference electrical parameter measurement value thereof from the electrical parameter measurement value Vi, the greater the deviation, the smaller the emission probability, and conversely the greater the emission probability of that location point. In some embodiments, the probability of transmission may be determined for each candidate location point in each candidate location point set according to a normal distribution.

Then, a state transition probability matrix between the candidate set of location points of adjacent electrical parameter measurements is calculated. The state transition probability matrix can be derived from a number of algorithms, all designed based on the idea: the closer the distance between two candidate position points respectively belonging to different candidate position point sets, the greater the state transition probability between the two candidate position points.

Then, an optimal path corresponding to the electrical parameter measurement value sequence and having the highest probability of forming the position point is obtained based on the Viterbi algorithm. The method comprises the following specific steps:

1. The emission probability of each candidate location point in the first candidate location point set of the electrical parameter measurement V1 is taken as the initial state probability.

2. Traversing each candidate position point in the candidate position point set corresponding to each electric parameter measured value from front to back, and calculating the state probability of all candidate position points of the current electric parameter measured value for each candidate position point by the following method:

a. traversing all candidate position points of the current electrical parameter measurement value;

b. for each candidate location point (current state), all previous states are traversed through the formula: current state probability = previous state probability × probability of previous state transition to current state × current state emission probability to calculate the probability of current state.

3. After the electrical parameter measurement value sequence is traversed, the current state with the highest state probability is searched, then the last state corresponding to the probability value is searched, and the reverse deducing is carried out, wherein the obtained position point sequence (in the reverse order) is the hidden sequence with the highest probability, namely the optimal path, and is also the position point sequence corresponding to the electrical parameter measurement value sequence.

For example, and by way of illustration and not limitation, let the sequence of electrical parameter measurements be (V1, V2, V3), and the first set of candidate location points corresponding to V1 be a= (A1, A2, A3), the probability of transmission for each candidate location point be P _e (A) = (0.2,0.3,0.7), the second candidate position point set corresponding to V2 is b= (B1, B2, B3), and the emission probability of each candidate position point is P _e (B) = (0.4,0.2,0.1), and the state transition probability matrix of a-B is:

meanwhile, the second candidate position point set corresponding to V3 is c= (C1, C2, C3), the emission probability of each candidate position point is Pe (C) = (0.3,0.2,0.5), and the state transition probability matrix of B-C is:

for the electrical parameter measurement V1, the emission probability P will be _e (A) = (0.2,0.3,0.7) as initial state probability P _s (A) And the state probability of the candidate position point A3 can be known to be the largest.

For the electrical parameter measurement V2:

1. for candidate location point B1, there may be three paths: A1-B1, A2-B1, A3-B1. The state probability of B1 when selecting paths A1-B1 is: p (P) _s (B1)＝P _s (A1)*P _s (A1-B1)*P _e (B1) =0.2×0.2×0.4=0.016; the state probability of B1 when selecting paths A2-B1 is P _s (B1)＝P _s (A2)*P _s (A2-B1)*P _e (B1) =0.3×0.5×0.4=0.06; the state probability of B1 when selecting paths A3-B1 is P _s (B1)＝P _s (A3)*P _s (A3-B1)*P _e (B1) =0.7×0.1×0.4=0.028. The highest state probability of B1 when selecting the path A2-B1 in the three paths indicates that the remaining two paths cannot form the sub-paths of the final optimal path.

2. For candidate location point B2, there may be three paths: A1-B2, A2-B2, A3-B2. The state probability of B2 when selecting paths A1-B2 is: p (P) _s (B2)＝P _s (A1)*P _s (A1-B2)*P _e (B2) =0.2×0.3×0.2=0.012; the state probability of B2 when selecting paths A2-B2 is P _s (B2)＝P _s (A2)*P _s (A2-B2)*P _e (B2) =0.3×0.6×0.2=0.036; the state probability of B2 when selecting paths A3-B2 is P _s (B2)＝P _s (A3)*P _s (A3-B2)*P _e (B2) =0.7×0.4×0.2=0.056. The highest probability of B2 state when selecting paths A3-B2 in the three paths indicates that the two remaining paths cannot form the final resultIs a part of the optimal path of (a) the network.

3. For candidate location point B3, there may be three paths: A1-B3, A2-B3, A3-B3. The state probability of B3 when selecting paths A1-B3 is: p (P) _s (B3)＝P _s (A1)*P _s (A1-B3)*P _e (B3) =0.2×0.1×0.1=0.002; the state probability of B3 when selecting paths A2-B3 is P _s (B3)＝P _s (A2)*P _s (A2-B3)*P _e (B3) =0.3×0.4×0.1=0.012; the state probability of B3 when selecting paths A3-B3 is P _s (B3)＝P _s (A3)*P _s (A3-B3)*P _e (B3) =0.7×0.2×0.1=0.014. The highest probability of B3 being in the state when selecting paths A3-B3 of the three paths indicates that the remaining two paths cannot form part of the final optimal path.

By the above-described state probability analysis for each candidate location point, it can be determined that paths A2-B1, A3-B2, and A3-B3 may be part of the final optimal path. Thus, the probabilities of paths A2-B1, A3-B2 and A3-B3 being selected, i.e., the maximum state probabilities of B1, B2, B3, are 0.06, 0.056, 0.014, respectively, for probability-related calculation of the next electrical parameter measurement V3.

The following calculations are then performed with a similar probability calculation process for the electrical parameter measurement V3:

1. for candidate location point C1, there may be three paths: B1-C1, B2-C1, B3-C1. The state probability of C1 when selecting paths B1-C1 is: p (P) _s (C1)＝P _s (B1)*P _s (B1-C1)*P _e (C1) =0.06×0.3×0.3=0.0054; the state probability of C1 when selecting paths B2-C1 is P _s (C1)＝P _s (B2)*P _s (B2-C1)*P _e (C1) =0.056×0.4×0.3= 0.00672; the state probability of C1 when selecting paths B3-C1 is P _s (C1)＝P _s (B3)*P _s (B3-C1)*P _e (C1) =0.014×0.4×0.3=0.00168. The probability of C1 is the greatest when selecting paths B2-C1 among the three paths, indicating that the remaining two paths cannot form part of the final optimal path.

2. For candidate location point C2, there may be three paths: B1-C2, B2-C2, B3-C2. The state probability of C2 when selecting paths B1-C2 is: p (P) _s (C2)＝P _s (B1)*P _s (B1-C2)*P _e (C2) =0.06×0.1×0.2=0.0012; the state probability of C2 when selecting paths B2-C2 is P _s (C1)＝P _s (B2)*P _s (B2-C2)*P _e (C2) =0.056×0.3×0.2= 0.00336; the state probability of C2 when selecting paths B3-C2 is P _s (C2)＝P _s (B3)*P _s (B3-C2)*P _e (C2) =0.0140.2x0.2=0.00056. The highest probability of state of C2 when selecting paths B2-C2 among the three paths indicates that the remaining two paths cannot form part of the final optimal path.

3. For candidate location point C3, there may be three paths: B1-C3, B2-C3, B3-C3. The state probability of C3 when selecting paths B1-C3 is: p (P) _s (C3)＝P _s (B1)*P _s (B1-C3)*P _e (C3) =0.06×0.2×0.5=0.006; the state probability of C3 when selecting paths B2-C3 is P _s (C1)＝P _s (B2)*P _s (B2-C3)*P _e (C3) =0.056×0.2×0.5=0.0056; the probability of P (C3) when selecting paths B3-C3 is P _s (C3)＝P _s (B3)*P _s (B3-C3)*P _e (C3) =0.0140.3×0.5=0.0021. The highest state probability of C3 when selecting paths B1-C3 in the three paths indicates that the remaining two paths cannot form sub-paths of the final optimal path.

By the above-described path analysis for each candidate position point, it can be determined that 0.00672 corresponding to the state (candidate position point) C1, in which the state probability is highest in the candidate position point set of V3, C1 is shifted from the state (candidate position point) B2, that is, the path B2-C1 is the optimal sub-path for matching the electrical parameter measurement values V2 to V3. Whereas for state B2, based on the foregoing analysis, the probability of transitioning from state A3 to state B2 is greatest, i.e., A3-B2 is the optimal sub-path for matching electrical parameter measurements V1 through V2. Thus, a state sequence corresponding to the sequence of electrical parameter measurements (V1, V2, V3) can be determined to be A3-B2-C1. Thus, it is possible to determine that the position point corresponding to the electrical parameter measurement value V1 is A3, the position point corresponding to the electrical parameter measurement value V2 is B2, and the position point corresponding to the electrical parameter measurement value V3 is C1.

Accordingly, it can be determined that the electrical parameter measurement value V3 corresponding to the current sampling point matches the position point C1, and therefore the switch position corresponding to the switch position region in which the position point C1 is located can be determined as the current switch position.

The above specifically shows that, based on the hidden markov model algorithm, an optimal path with highest probability is obtained for a sequence including three electrical parameter measurement values, that is, a position point sequence corresponding to a matched track point, when the electrical parameter measurement value sequence includes more electrical parameter measurement values, the optimal path is obtained through similar operation, so that a position point sequence matched with the electrical parameter measurement value sequence and a plurality of matched discrete track points are obtained. Furthermore, the specific numbers listed in the examples above are also for better illustration of the matching process and should not be construed as limiting the present disclosure.

It can be seen that, based on the hidden markov model, the trend of the change of the electrical parameter measurement value in the electrical parameter measurement value sequence can be reflected by the stored position point sequence corresponding to the plurality of discrete track points, and the specific part track generated based on the plurality of discrete track points may be different from the track shape to be detected generated by the electrical parameter measurement value sequence. The location point corresponding to a single discrete trace point for which a single electrical parameter measurement is matched may be somewhat different from the actual location point on the sliding region where the spring is located when the electrical parameter measurement is obtained, but the controller outputs only switch location information, where the location point corresponding to the discrete trace point is on the same switch location region (e.g., on the same pad region) as the actual location point of the spring, so as not to affect the final determined correct switch location.

It should be noted that while the above describes in detail a possible matching algorithm based on a hidden markov model, this is merely illustrative for a better understanding of the present application, and those skilled in the art will recognize that other matching algorithms, such as geometric matching algorithms, are also possible.

In some cases, the sequence of electrical parameter measurement values acquired within a preset time period may match a plurality of specific partial trajectories in the reference curve trajectory (for example, a plurality of optimal paths of the same probability are acquired by a hidden markov model, the probability that the difference from the probability of the optimal path is within, for example, 2% is considered to be the same as the probability of the optimal path, other matching algorithms and the following are similar), then the non-final switch position is obtained based on each specific partial trajectory, and the non-final switch position is determined as the current switch position in the case that the determined non-final switch position based on each specific partial trajectory is identical; in case the determined non-final switch positions of each specific part trajectory are inconsistent, i) the non-final switch position determined by the most number of specific part trajectories or the non-final switch position with the highest sum of probabilities (based on the sum of probabilities of the respective optimal paths determining the respective non-final switch positions) may be determined as the current switch position, or ii) the sequence of alternative electrical parameter measurement values within a longer period of time than the preset period of time before the current sampling point may be retrieved, or no switch position determination may be performed at this time, and further sampling points after the current sampling point may be continued to obtain additional electrical parameter measurement values to obtain an alternative electrical parameter measurement value sequence based on the previous electrical parameter measurement value sequence and the additional electrical parameter measurement values, and then the alternative to-be-detected trajectory generated by the alternative electrical parameter measurement value sequence may be matched with the reference curve trajectory to obtain the alternative specific part trajectory, and the current switch position may be obtained based on the alternative specific part trajectory.

In some cases, each electrical parameter measurement value in the electrical parameter measurement value sequence acquired within the preset time period of the current sampling point is almost unchanged, which may be the case when the elastic sheet is stationary at a certain position or when the elastic sheet slides on a switch area that is relatively smooth (i.e., abrasion or impurity accumulation has little influence and is negligible), the electrical parameter measurement value sequence should be matched with a track formed by one track point in the reference curve track or a plurality of track points with the same reference electrical parameter measurement value, but a position point corresponding to the track point or a position point sequence corresponding to the plurality of track points may be located in different switch position areas (for example, the position points with the same maximum probability on different switch position areas or the position point sequence with the same maximum probability on different switch position areas are obtained through a hidden markov model), so that a correct unique switch position may not be determined.

In the above case, the switch position determination may be made based on the position point on which the switch position was previously last determined. For example, one location point or sequence of location points matching a sequence of electrical parameter measurements comprising an almost constant electrical parameter measurement may be one of location points X5, X50 and X100 or one of the sequences of location points (X5-X20), (X50-X65) or (X100-X115) located on different switch location areas, whereas the location point on which the switch position was last determined previously was based is X3, so that it may be determined that the location point or sequence of location points currently matching the sequence of electrical parameter measurements should be X5 or X5-X20 (first switch position), instead of X50 or X50-X65 (second switch position) and X100 or X100-X115 (third switch position) located farther from X3. Alternatively, if it is determined that there are a plurality of possible switch positions, the controller may also send the determined plurality of possible switch positions to an upper layer control device in the system (e.g., an electronic control unit in an automobile) while also indicating to the upper layer control device that the reliability of the current switch position information is low, so that the upper layer control device may ignore the switch position information and wait until other reliable unique switch position information is sent from the controller.

In embodiments of the present disclosure, the speed of the sliding spring is generally considered to be within a conventional speed range operable by a human user, for example, the time that the spring is not in contact with the switch position area may be relatively long when the sliding speed is too slow, and the controller may determine that the sliding speed is too slow when detecting that the electrical parameter measurement is an open circuit voltage for too long, thereby reporting a fault. Furthermore, the duration of the preset time period during which the electrical parameter measurement is to be acquired, as well as the sampling frequency, may also be selected based on the conventional speed range.

On the other hand, according to the embodiment of the disclosure, as in the previous analysis, after the switch is switched for many times or when the service time is long, there is abrasion or impurity accumulation on the sliding region, and the change of the abrasion or impurity accumulation degree can cause the change of the electrical parameter measurement value obtained when the elastic sheet is at each position point in the abrasion or impurity accumulation region, so the controller also updates the reference curve track along with the change of the abrasion or impurity accumulation degree, thereby improving the matching accuracy and the matching degree.

Updating the reference curve trajectory includes: the reference curve trajectory is updated based on the sequence of electrical parameter measurements.

Optionally, the theoretical value of the measured value of the electrical parameter when the elastic sheet is positioned at each position point on at least two switch position areas and interval areas is used as the measured value of the reference electrical parameter of the position point, so as to generate the reference curve track. For example, the theoretical value of the electrical parameter measurement value at the time of each switch position region may be calculated based on the structure of the measurement circuit, and the theoretical values of the electrical parameter measurement values corresponding to the respective position points on each switch position region are substantially equal, and when based on the structure of the measurement circuit shown in fig. 1B, the reference curve locus is a locus of a step shape having steps of different voltage values, and adjacent steps of different voltage values are separated by an open circuit voltage value.

More specifically, an update method may include: for any one of the series of electrical parameter measurements, updating the reference electrical parameter measurement for the corresponding trace point with the electrical parameter measurement when the electrical parameter measurement deviates from the reference electrical parameter measurement for the corresponding trace point that is matched by more than a deviation threshold (e.g., 10%).

In some cases, as previously described, if a storage of discrete trace points is used, there may be more than two electrical parameter measurements in a sequence of electrical parameter measurements that match the same discrete trace point, at which time the reference electrical parameter measurement for the corresponding discrete trace point may be updated based on the more than two electrical parameter measurements, e.g., with their average, median, the largest or smallest of them, etc.

Alternatively, another update may include: for any one of the sequence of electrical parameter measurements, when the electrical parameter measurement deviates from the reference electrical parameter measurement for the corresponding locus point that is matched by more than a deviation threshold, the number of deviations for the corresponding locus point is accumulated (i.e. increased by 1), and in case the number of deviations for the corresponding locus point reaches a predetermined number of deviations, the reference electrical parameter measurement for the corresponding locus point is updated with at least a portion of the electrical parameter measurements corresponding to the deviations of the predetermined number of deviations exceeding the deviation threshold, for example with the average, median, largest or smallest electrical parameter measurement among them, etc. This may allow the system to be updated infrequently, thereby improving the reliability of the system and reducing power consumption.

Optionally, the deviation is a deviation of the electrical parameter measurement from a reference electrical parameter measurement for the corresponding trace point, and the deviation threshold is a deviation threshold, or the deviation is a percentage of the deviation of the electrical parameter measurement from the reference electrical parameter measurement for the corresponding trace point, the deviation threshold being a percentage threshold. The deviation threshold or percentage threshold may be designed based on actual design and performance requirements.

Fig. 4 illustrates several examples of switch detection by a switch position detection device according to an embodiment of the present disclosure.

As shown in fig. 4A, a track to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with a specific part track B1 in the reference track graph through a matching algorithm, so that it is known that a track point P1 corresponding to the electrical parameter measurement value of the current sampling point Tc in the specific part track B1 corresponds to a position point Px1 on the first switch position area, so that it is determined that the spring is located in the first switch position area at this time, and the switch position is the first switch position. However, if the electrical parameter measured value of the current sampling point Tc is within the electrical parameter measured value threshold range corresponding to the second switch position area according to the general switch position detection method, it is determined that the elastic piece is located in the second switch position area, and the switch position is the second position.

As shown in fig. 4B, a track to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with a specific part track B2 in the reference track graph through a matching algorithm, so that it is known that a track point P2 corresponding to the current sampling point Tc in the specific part track B2 corresponds to a position point Px2 on the second switch position area, and therefore it is determined that the spring is located in the second switch position area at this time, and the switch position is the second switch position. However, if the electrical parameter measured value of the current sampling point Tc is within the electrical parameter measured value threshold range corresponding to the third switch position area according to the general switch position detection method, it is erroneously determined that the elastic piece is located in the third switch position area, and the switch position is the third position.

As shown in fig. 4C, a track to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with a specific part track B3 in the reference track map through a matching algorithm, so that it is known that a track point P3 corresponding to the current sampling point Tc in the specific part track B3 corresponds to a position point Px3 between the first switch position area and the second switch position area, and therefore the interval between the first switch position area and the second switch position area at this time is determined. However, if the measured value of the electrical parameter at the current sampling point Tc is equal to the open circuit voltage according to the general switch position detecting method, it is erroneously determined that the switch position detecting device has an open circuit error.

As shown in fig. 4D, a track to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with a specific part track B4 in the reference track graph through a matching algorithm, so that it is known that a track point P4 corresponding to the current sampling point Tc in the specific part track B4 corresponds to a position point Px4 on the second switch position area, and therefore it is determined that the spring is located in the second switch position area at this time, and the switch position is the second switch position. However, if the conventional switch position detection method is adopted, as in the previous analysis, when the spring plate slides to a new switch position, an additional time is required to perform the debounce or filtering operation to obtain a stable electrical parameter measurement value, and then the switch position determination can be performed, so that the determination of the switch position is delayed.

According to another aspect of the present disclosure, a switch position detection method of a slide switch is also provided. The sliding switch comprises a spring plate and at least two switch position areas, wherein a spacing area exists between every two adjacent switch position areas.

Fig. 5 shows a flowchart of a switch position detection method of the slide switch.

At step 510, electrical parameter measurements are obtained from the measurement module at a predetermined sampling frequency.

Optionally, the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement. There is wear or accumulation of impurities on at least one switch position area of the slide switch, and as the degree of wear or accumulation of impurities increases the contact resistance value between the dome and the area of the at least one switch position area where wear or accumulation of impurities is present increases, the acquired electrical parameter measurement value changes as the contact resistance value increases.

In step 520, a trajectory to be detected is generated based on the sequence of electrical parameter measurements within a preset time period prior to the current sampling point.

In step 530, a specific portion of the reference curve track that matches the track to be detected is determined. The coordinates of each trace point on the reference curve trace indicate: a location point of the trace point on the at least two switch location areas and the spacing area, and a reference electrical parameter measurement at the location point.

In step 540, a switch position is determined based on the particular part trajectory.

In addition, in order to obtain the reference curve track, the method may further include using a theoretical value of the measured value of the electrical parameter when the elastic piece is located at each position point on the at least two switch position areas and the interval area as the reference measured value of the electrical parameter of the position point, so as to generate the reference curve track. Meanwhile, in order to improve the matching accuracy and the matching degree, the method may further include updating the reference curve track, for example, updating the reference curve track based on the sequence of electrical parameter measurement values.

According to the switch position detection device and method for the sliding switch, the position determination is carried out based on the plurality of electrical parameter measurement values measured by the measuring module in the sliding process of the elastic sheet, so that the accuracy of switch position detection can be improved, and the time delay of the determination process can be improved.

While the present disclosure has been described in detail with respect to various specific example embodiments thereof, each example is provided by way of explanation and not limitation of the present disclosure. Modifications, variations and equivalents of such embodiments may be readily made by those skilled in the art after having obtained an understanding of the foregoing description. Accordingly, the present invention is not intended to exclude such modifications, variations and/or additions to the present subject matter as would be obvious to one of ordinary skill in the art. For instance, features illustrated or described as part of one embodiment, can be used with another embodiment to yield a still further embodiment. It is therefore intended that the present disclosure cover such alternatives, modifications, and equivalents.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

The foregoing is illustrative of the present disclosure and is not to be construed as limiting thereof. Although a few exemplary embodiments of this disclosure have been described, those skilled in the art will readily appreciate that many modifications are possible in the exemplary embodiments without departing from the scope of this disclosure. Accordingly, all such modifications are intended to be included within the scope of this disclosure as defined in the claims. It is to be understood that the foregoing is illustrative of the present disclosure and is not to be construed as limited to the specific embodiments disclosed, and that modifications to the disclosed embodiments, as well as other embodiments, are intended to be included within the scope of the appended claims. The disclosure is defined by the claims and their equivalents.

Claims

1. A switch position detection device of a slide switch, the slide switch including a spring and at least two switch position areas, and there being a spacing area between adjacent switch position areas, the switch position detection device comprising:

A measurement module configured to output an electrical parameter measurement for determining a switch position of the slide switch;

a controller configured to:

acquiring electrical parameter measurements from the measurement module at a predetermined sampling frequency;

generating a track to be detected based on a sequence of electrical parameter measurement values within a preset time period before the current sampling point,

determining a specific part track matched with the track to be detected in the reference curve track; and

the switch position is determined based on the specific part trajectory,

wherein the coordinates of each track point on the reference curve track indicate: a location point of the trace point on the at least two switch location areas and spacing areas and a reference electrical parameter measurement at the location point,

wherein the algorithm for the matching is a hidden Markov model algorithm,

wherein determining a specific part track matched with the track to be detected in the reference curve track comprises:

for each electrical parameter measurement value in the track to be detected, determining at least one discrete track point, the deviation of the reference electrical parameter measurement value from the electrical parameter measurement value being within a first threshold range, and taking a set of position points corresponding to the at least one discrete track point as a candidate position point set of the electrical parameter measurement value, wherein the emission probability of each candidate position point decreases as the deviation of the corresponding reference electrical parameter measurement value from the electrical parameter measurement value increases;

Calculating a state transition probability matrix between candidate position point sets of adjacent electric parameter measurement values, wherein the closer the distance between two candidate position points respectively belonging to the candidate position point sets of two adjacent electric parameter measurement values is, the greater the state transition probability of the two candidate position points is; and

a particular partial trajectory matching the trajectory to be detected is determined based on the emission probability of each candidate position point in each candidate position point set and a state transition probability matrix between candidate position point sets of adjacent electrical parameter measurements.

2. The switch position detection apparatus according to claim 1, wherein determining a specific partial trajectory matching the trajectory to be detected based on a transmission probability of each candidate position point in each candidate position point set and a state transition probability matrix between candidate position point sets of adjacent electrical parameter measurement values includes:

taking the emission probability of each candidate position point in the candidate position point set of the first electric parameter measured value in the track to be detected as a state probability;

for the ith electrical parameter measurement value in the track to be detected, determining the state probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value according to the state probability of each candidate position point in the candidate position set of the ith-1 electrical parameter measurement value, the state transition probability matrix from the candidate position set of the ith-1 electrical parameter measurement value to the candidate position set of the ith electrical parameter measurement value, and the emission probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value;

Determining a specific partial track matched with the track to be detected based on the candidate position point with the highest state probability in the candidate position point set of the Nth electric parameter measurement value,

and i is more than or equal to 2 and less than or equal to N, wherein N is the total number of the electrical parameter measured values in the track to be detected.

3. The switch position detection apparatus according to claim 1, wherein determining a switch position based on the specific part trajectory comprises:

extracting corresponding track points of the electrical parameter measured values acquired at the current sampling point in the specific part track,

and determining the switch position of the switch position area corresponding to the corresponding track point as the current switch position.

4. The switch position detection apparatus according to claim 1, wherein the controller is further configured to:

and taking the theoretical value of the electric parameter measured value when the elastic sheet is positioned at each position point on the at least two switch position areas and the interval area as the reference electric parameter measured value of the position point so as to generate a reference curve track.

5. The switch position detection apparatus according to claim 1, wherein the controller is further configured to:

and updating the reference curve track based on the electric parameter measured value sequence.

6. The switch position detection apparatus according to claim 5, wherein the updating includes: for any one of the electrical parameter measurement values in the sequence of electrical parameter measurement values, updating the reference electrical parameter measurement value for the corresponding track point with the electrical parameter measurement value when the electrical parameter measurement value deviates from the reference electrical parameter measurement value for the corresponding track point by more than a deviation threshold.

7. The switch position detection apparatus according to claim 5, wherein the updating includes:

for any one of the series of electrical parameter measurements, when the electrical parameter measurement deviates from the reference electrical parameter measurement for the corresponding trace point by more than a deviation threshold, adding 1 to the number of deviations for the corresponding trace point, and

when the number of deviations for the corresponding track point reaches a predetermined number of deviations, the reference electrical parameter measurement value for the corresponding track point is updated with at least a portion of the electrical parameter measurement values corresponding to the deviations of the predetermined number of deviations beyond the deviation threshold.

8. The switch position detection apparatus according to claim 6 or 7, wherein the deviation is a deviation of the electrical parameter measurement value from a reference electrical parameter measurement value of the corresponding locus point, the deviation threshold value is a deviation threshold value, or

The deviation is a percentage of deviation of the electrical parameter measurement from a reference electrical parameter measurement for the corresponding trace point, and the deviation threshold is a percentage threshold.

9. The switch position detection apparatus according to claim 1, wherein the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement;

wherein abrasion or impurity accumulation is present on at least one switch position region of the slide switch, and a contact resistance value between the elastic piece and a region where abrasion or impurity accumulation is present on at least one switch position region increases as an abrasion or impurity accumulation degree increases,

wherein the acquired electrical parameter measurement value changes with an increase in the contact resistance value.

10. A switch position detection method of a slide switch, the slide switch including a spring and at least two switch position regions with a spacing region between adjacent switch position regions, the switch position detection method comprising:

the switch position is determined based on the specific part trajectory,

wherein the algorithm for the matching is a hidden Markov model algorithm,

11. The switch position detection method according to claim 10, further comprising:

12. The switch position detection method according to claim 10, further comprising:

13. The switch position detection method of claim 10, wherein the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement;

wherein abrasion or impurity accumulation is present on at least one switch position region of the slide switch, and a contact resistance value between the elastic piece and a region where abrasion or impurity accumulation is present on the at least one switch position region increases as an abrasion or impurity accumulation degree increases,