CN113447801A

CN113447801A - Switch position detection device and method for slide switch

Info

Publication number: CN113447801A
Application number: CN202010218438.2A
Authority: CN
Inventors: 贺川
Original assignee: Valeo Interior Controls Shenzhen Co Ltd
Current assignee: Valeo Interior Controls Shenzhen Co Ltd
Priority date: 2020-03-25
Filing date: 2020-03-25
Publication date: 2021-09-28
Anticipated expiration: 2040-03-25
Also published as: CN113447801B

Abstract

A switch position detecting apparatus and method of a slide switch is provided, in which the slide switch includes a spring plate and at least two switch position areas, and a space area exists between adjacent switch position areas. The switch position detection device includes: a measurement module configured to output an electrical parameter measurement for determining a switch position of the slide switch; a controller configured to: obtaining an electrical parameter measurement value from a measurement module at a predetermined sampling frequency; generating a track to be detected based on an electrical parameter measured value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in a reference curve track; and determining a switch position based on the particular partial trajectory. The coordinates of each trace point on the reference curve trace indicate: the position points of the trace point on at least two switch position areas and the interval area, and the reference electric parameter measured value at the position points.

Description

Switch position detection device and method for slide switch

Technical Field

The present disclosure relates to the field of detection, and more particularly, to a switch position detecting device and method for a slide switch.

Background

In automobiles, a slide switch technology is commonly used, such as a Transmission Selection Lever (TSL) or a parking-reverse-neutral-forward (PRND) Lever.

These slide switches generally have a plurality of switch positions between which different operations can be controlled by sliding the spring plate. For example, for a slide switch applied to the PRND lever, different gear positions may be selected when the slide switch is in different switch positions, thereby enabling vehicle control operations depending on whether park, reverse, neutral, or drive is selected.

Disclosure of Invention

According to an aspect of the present disclosure, there is provided a switch position detecting device of a slide switch, wherein the slide switch includes a spring piece and at least two switch position areas, and a spacing area exists between adjacent switch position areas. The switch position detection device includes: a measurement module configured to output an electrical parameter measurement for determining a switch position of the slide switch; a controller configured to: obtaining an electrical parameter measurement value from a measurement module at a predetermined sampling frequency; generating a track to be detected based on an electrical parameter measured value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in a reference curve track; and determining a switch position based on the particular partial trajectory. The coordinates of each trace point on the reference curve trace indicate: the position points of the trace point on at least two switch position areas and the interval area, and the reference electric parameter measured value at the position points.

According to another aspect of the present disclosure, there is provided a switch position detecting method of a slide switch, in which the slide switch includes a spring plate and at least two switch position areas with a space area between adjacent switch position areas. The switch position detection method comprises the following steps: obtaining an electrical parameter measurement value from a measurement module at a predetermined sampling frequency; generating a track to be detected based on an electrical parameter measured value sequence in a preset time period before a current sampling point, and determining a specific part track matched with the track to be detected in a reference curve track; and determining a switch position based on the specific partial trajectory, wherein the coordinates of each trajectory point on the reference curvilinear trajectory indicate: the position points of the trace point on at least two switch position areas and the interval area, and the reference electric parameter measured value at the position points.

Drawings

Fig. 1A-1B show the structure of a switch position detection device for a slide switch (slide switch is shown together) according to an embodiment of the present disclosure.

Fig. 2A schematically shows an example in which abrasion or scratch occurs in each switch position region of the slide switch.

Fig. 2B-2C schematically show changes in contact resistance between the dome and the switch position area as the degree of wear or impurity build-up changes.

Fig. 3A-3C schematically show schematic curves of the measured values of the electrical parameter at various points of the spring at the sliding area, when a wear area or an impurity accumulation area is present in the area of the switch position.

Fig. 4A-4D illustrate several examples of switch detection by the switch position detection apparatus according to the embodiments of the present disclosure.

Fig. 5 shows a flowchart of a switch position detection method for a slide switch according to an embodiment of the present disclosure.

Detailed Description

The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure. It is to be understood that the described embodiments are merely exemplary of some, and not all, of the present disclosure. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without any inventive step, are intended to be within the scope of the present disclosure.

Fig. 1A-1B illustrate a structure of a switch position detecting device for a slide switch (the slide switch is shown together for convenience of description) according to an embodiment of the present disclosure.

As shown in fig. 1A, the switch position detection apparatus 100 is composed of a measurement module 101 and a controller 102.

The sliding switch S can be switched between a plurality of switch positions, i.e. can slide between a plurality of switch position areas, and when the sliding switch S is in different switch positions, the measuring module 101 in the switch position detecting apparatus 100 outputs the measured values of the electrical parameter belonging to different threshold ranges of the measured values of the electrical parameter to the controller 102, and the controller 102 determines the different switch positions where the switch is located according to the measured values of the electrical parameter belonging to different threshold ranges of the measured values of the electrical parameter. The controller includes, but is not limited to, a Micro Control Unit (MCU).

More specifically, the controller 102 first presets an electrical parameter measurement value threshold range corresponding to each switch position of the slide switch S for each switch position, respectively, according to the structure of the measurement module and the parameter and empirical data, resulting in a plurality of electrical parameter measurement value threshold ranges, and the electrical parameter measurement value threshold ranges corresponding to different switch positions do not overlap each other, have a predetermined gap range in which the electrical parameter measurement value is regarded as an invalid electrical parameter measurement value, and are not used for determining the switch position. The controller can obtain the measured value of the electrical parameter during the switching operation of the sliding switch from the measuring module in real time at a specific frequency, and since the controller formed by the MCU or other processing module can only process digital signals, in order to facilitate the operation of the controller, the obtained measured value of the electrical parameter is usually converted into a digital measured value of the electrical parameter through an analog-to-digital conversion (ADC) process (hereinafter, for convenience of description, all referred to as measured value of the electrical parameter). And then, comparing the electrical parameter measurement value with a plurality of preset electrical parameter measurement value threshold ranges, so as to determine which switch position the obtained electrical parameter measurement value is in, and further determine the switch position of the sliding switch is. Further, if it is determined that the obtained electrical parameter measurement does not fall within any of the preset electrical parameter measurement threshold ranges, i.e., the controller 102 cannot determine which position the sliding switch has been switched to based on the obtained electrical parameter measurement, then the controller 102 may determine that there is an error in the switch detection system, such as improper switching operation, short circuit of the switch, poor contact, external interference, etc., and optionally prompt and/or stop the switch position detection device.

Fig. 1B also schematically shows a specific structure of the slide switch S and the switch position detecting device 100 for more clearly describing the present disclosure. However, those skilled in the art will appreciate that other configurations of the slide switch S and the switch position detection device 100 are possible, as long as the slide switch S has multiple switch positions and the measurement module 101 in the switch position detection device 100 is capable of outputting electrical parameter measurements that fall within different electrical parameter measurement threshold ranges when the slide switch S is in different switch positions.

As shown in fig. 1B, the sliding switch S may include a spring, a plurality of pads (a first pad 1, a second pad 2, and a third pad 3 in the drawing) that are physically spaced from each other, and a common ground pad G, where one pad corresponds to one switch position region. When the elastic sheet stays at one pad, the pad and the ground pad can be electrically connected, wherein a path formed when the elastic sheet is connected between the first pad 1, the second pad 2 or the third pad 3 and the ground pad has resistance (including contact resistance of the elastic sheet and the pad/ground pad and on-resistance of the elastic sheet itself). In addition, during the period that the elastic sheet slides to pass through the interval area between the two bonding pads, the elastic sheet is not in electrical contact with any one of the first bonding pad 1, the second bonding pad 2 or the third bonding pad 3, and at the moment, the measuring module outputs a constant electric signal, and the value of the electric signal does not belong to any electric parameter measurement value threshold range.

Alternatively, the measurement module 101 in the switch position detecting apparatus 100 includes a series resistor branch and an analog-to-digital conversion module (an analog-to-digital conversion part is omitted in fig. 1B), one end of the series resistor branch is connected to a power supply, the other end of the series resistor branch is grounded, the other nodes between the resistors in the series resistor branch except the first node from top to bottom are used as the output end of the measurement module 101 to output the measured value (voltage value) of the electrical parameter, and are respectively connected to the pads (for example, the first pad 1, the second pad 2, and the third pad 3), and when the spring is on different pads, the measurement module 101 may output, to the controller, a voltage measured value belonging to one of the preset voltage threshold ranges corresponding to the pads (switch positions). The controller can obtain the voltage measurements from the measurement module 101 and determine the different switch positions at which the switches are located based on the respective voltage measurement threshold ranges. When the spring sheet is not in electrical contact with any of the first pad 1, the second pad 2, or the third pad 3, the measurement module outputs a constant voltage measurement value (hereinafter, referred to as an open-circuit voltage), and the constant voltage measurement value does not fall within any voltage threshold range. It is to be understood that the number of pads (switch positions) is not limited to three as shown in fig. 1B, and may be set according to actual circumstances.

However, abrasion or scratch may occur on each switch position region (e.g., first to third pad regions) of the slide switch S after the switching is switched a plurality of times, and a pit (pit) may be further formed, or impurities may be accumulated on each switch position region. The wear or scratches may occur due to wear of the conductive material (e.g., gold or nickel) itself in the area of the switch locations. The impurities accumulated on the switching position region may be silicon dioxide in dust. As the degree of severity of the abrasion or scratch of the pad is gradually increased or the degree of severity of the accumulation of impurities is gradually increased, the contact resistance value between the spring and the partial region where the abrasion or scratch occurs and the accumulation of impurities occurs in each switch position region is also gradually increased.

Fig. 2A schematically shows an example in which abrasion or scratch occurs in the sliding region of the slide switch associated with the switch position detection device shown in fig. 1B. Fig. 2B-2C schematically show changes in contact resistance between the dome and the switch position area as the degree of wear or impurity build-up changes.

In fig. 2A, (1) shows that a plurality of pits (worn regions) formed due to wear or scratches exist on the ground pad G and the remaining three pads (one switch position region for each pad region), and (2) and (3) show that the wear or scratches of the worn region 1 are more severe than the worn region 2 after the worn region 1 and the worn region 2 are respectively enlarged.

Assuming that the spring plate slides from the start point of the first switch position region to the end point of the third switch position region, and that there is a worn region or an impurity accumulation region on each switch position region, fig. 2B shows a schematic change in contact resistance value between the spring plate and the sliding region at each position point on the sliding region (including the first-third switch position regions and the spacing region) in the horizontal direction.

Further, fig. 2C illustrates, by taking one switch position region (for example, the first switch position region corresponding to the first pad 1) as an example, assuming that there are three wear regions or impurity accumulation regions on the switch position region, showing a change in contact resistance value between the spring piece and the switch position region at each position point on the switch position region according to the degree of wear or impurity accumulation existing on the wear regions or impurity accumulation regions. As can be seen from fig. 2C, the higher the degree of wear or impurity accumulation, the greater the contact resistance value between the spring plate and the worn region or impurity accumulation region.

Meanwhile, an increase in the contact resistance value between the spring plate and the wear region or the impurity accumulation region causes a corresponding change in the measured value of the electrical parameter measured when the spring plate is located at each position point on the wear region or the impurity accumulation region. For example, when the switch position detection is performed based on the structure of the switch position detection apparatus shown in fig. 1B, the contact resistance value between the elastic piece and the wear area or the impurity accumulation area on the switch position area increases, and for a certain position point on the wear area or the impurity accumulation area, the measured value (voltage value) of the electrical parameter output by the measurement module at the time when the elastic piece is located at the position point also increases.

Fig. 3A to 3C schematically show schematic change curves of measured values of an electrical parameter (voltage measured values) when the spring piece is located at respective position points on the sliding region when there is a worn region or an impurity accumulation region on the switch position region based on the switch position detecting device shown in fig. 1B.

Fig. 3A to 3B schematically show change curves of voltage measurement values corresponding to respective position points where the spring piece is located in the sliding region when the degree of wear or accumulation of impurities in the wear region or accumulation region of impurities on the switch position region is low and high, respectively. In the case shown in fig. 3A, even if the voltage measurement value corresponding to each position point in the wear region or the impurity accumulation region on each switch position region is shifted to some extent from the voltage measurement value corresponding to each position point in the other region, the shift amount is small, and the voltage measurement value is not shifted out of the threshold range of the voltage measurement value corresponding to the switch position of the switch position region. In the case shown in fig. 3B, the voltage measurement values corresponding to some position points in the worn region or the impurity accumulation region in each switch position region are greatly shifted from the voltage measurement values corresponding to the position points in other regions, and are shifted out of the threshold range of the voltage measurement values corresponding to the switch positions in the switch position region (for example, the voltage values corresponding to some position points in the first switch position region and the second switch position region exceed the corresponding first voltage value range and second voltage value range, respectively).

Fig. 3C shows a specific change curve of voltage measurement values when the spring piece is located at each position point on the sliding region when there is a worn region or an impurity accumulation region on the switch position region based on the switch position detection device shown in fig. 1B.

In fig. 3C, the horizontal coordinate is each position point on the sliding region (the first-third switch position regions and the spacing region between adjacent pads are taken as examples in the figure), and the vertical coordinate is the voltage measurement value output by the measurement module when the spring plate is located at each position point. The voltage measurements taken by the controller when the spring is at the various location points of the first pad include voltage measurements within the ranges shown by

circles

1 and 2 in fig. 3C. For a voltage measurement belonging to circle 1, according to one detection method, the controller will treat the voltage measurement as an invalid value and optionally determine that there is an error in the switch position detection means. For the voltage measurement belonging to circle 2, the controller will determine from the voltage measurement that the slide switch has now switched to the second switch position region. Furthermore, when the spring plate is in the process of switching to the second switch position region, the voltage measurement values obtained by the controller may include voltage measurement values within a range shown by circle 3 in fig. 3C, where the spring plate is located in the interval region between the two switch position regions. For the voltage measurement belonging to circle 3, according to a detection method, since the voltage measurement is an open-circuit voltage and lasts for a while, the controller will take the voltage measurement as an invalid value and optionally determine that there is an error in the switch position detection device, but this may be frequently reported. Alternatively, if the controller does not consider the case where the voltage measurement value is the open-circuit voltage as the presence of an error in the switch position detection means, it may not be determined accurately in the case where an error does exist in the switch position detection means, thereby affecting safety and reliability.

Furthermore, since the spring plate is typically also accompanied by a wobble during the sliding process, when the spring plate slides into a new switch position, i.e. when the controller starts acquiring voltage measurement values that fall within a new voltage measurement value range, it is common to wait for an additional time for filtering or debouncing, after which the controller again makes a determination of the switch position based on the acquired voltage measurement values.

Thus, if the detection method described above is used, the controller may report errors frequently, and there may be additional delays in determining new switch positions, and possibly erroneous switch positions.

In order to solve the above problems, the present disclosure proposes an improved switch position detecting apparatus and method, which can correctly and quickly detect a switch position while increasing accuracy and reliability of switch position detection in the case where there is wear or accumulation of impurities on at least a partial region of each switch position region. The partial region in which wear or impurity accumulation is present is also referred to hereinafter as a wear or impurity accumulation region.

According to an embodiment of the present disclosure, there is provided a switch position detecting device. The switch position detection device may have the same physical structure as the switch position detection device 100 described with reference to fig. 1A-1B, and a detailed description thereof is omitted here.

The application provides a switch position detection device can carry out position determination based on a plurality of electrical parameter measured values that the shell fragment measured at slip in-process measuring module to improve the accuracy that switch position detected and improve the time delay of determining process.

For this reason, the controller 102 in the switch position detection apparatus 100 is configured to perform the following operations.

First, the controller 102 obtains electrical parameter measurements from the measurement module 101 at a predetermined sampling frequency.

Optionally, the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement.

Alternatively, as the contact resistance value between the spring plate and the wear or impurity accumulation region on each switch position region increases, the measured value of the electrical parameter at each position point in the wear or impurity accumulation region also changes as the contact resistance value increases.

Then, the controller 102 generates a to-be-detected trajectory based on the electrical parameter measurement value sequence in a preset time period before the current sampling point.

The electrical parameter measurement value sequence refers to a sequence of electrical parameter measurement values acquired at each sampling point in the preset time period in a sampling time sequence.

Next, the controller 102 determines a specific partial trajectory of the reference curve trajectory that matches the trajectory to be detected, and determines the switch position based on the specific partial trajectory.

The coordinates of each trace point on the reference curve trace indicate: a position point of the trace point on the sliding area (i.e., each of the switch position area and the space area), and a reference electrical parameter measurement value at the position point.

Optionally, the reference curve trajectory is stored as discrete trajectory points, for example, the horizontal coordinates of every two adjacent discrete trajectory points are equidistant, the total length between the minimum horizontal coordinate and the maximum horizontal coordinate is less than or equal to the length of the sliding region, and the vertical coordinate of each discrete trajectory point is the reference electrical parameter measurement value corresponding to the corresponding position point. For example, the reference curve trajectory is stored as discrete trajectory points in a manner that horizontal coordinates are equidistant: (X1, Vr1), (X2, Vr1), (X3, Vr1), (X4, Vr2), (X5, Vr2), (X6, Vr3), (X7, Vr4),.. wherein two adjacent horizontal coordinates are equidistant.

Optionally, the determining of the specific partial trajectory matching the trajectory to be detected in the reference curve trajectory includes: for each electrical parameter measurement value in the track to be detected, determining at least one discrete track point matched with the electrical parameter measurement value in the reference curve track; and obtaining a specific part track matched with the track to be detected based on the discrete track points respectively matched with each electrical parameter measured value in the track to be detected.

Optionally, the matching algorithm employs a hidden markov model algorithm. In this case, the sequence of electrical parameter measurement values within the preset time period is taken as an observation sequence, each electrical parameter measurement value in the sequence of electrical parameter measurement values is taken as an observation state, and a plurality of position points passed by the shrapnel within the preset time period are taken as a hidden sequence, each position point being in a hidden state.

Specifically, for each electrical parameter measurement value in the trajectory to be detected, determining at least one discrete trajectory point in the reference curve trajectory that matches the electrical parameter measurement value comprises: for each electrical parameter measurement, at least one discrete trace point having a deviation (e.g., deviation or percent deviation) from the electrical parameter measurement within a first threshold range (e.g., 30% of the electrical parameter measurement) is determined, and a set of location points corresponding to the at least one discrete trace point is identified as a set of candidate location points for the electrical parameter measurement, wherein the probability of transmission for each candidate location point decreases as the deviation of the corresponding reference electrical parameter measurement from the electrical parameter measurement increases. In addition, obtaining the specific partial track matched with the track to be detected based on the discrete track points respectively matched with each electrical parameter measurement value in the track to be detected comprises: calculating a state transition probability matrix between candidate position point sets of adjacent electrical parameter measurement values, wherein the closer the distance between two candidate position points of the candidate position point sets respectively belonging to the two adjacent electrical parameter measurement values is, the greater the state transition probability of the two candidate position points is; and determining a specific partial trajectory matched with the trajectory to be detected based on the emission probability of each candidate position point in each candidate position point set and a state transition probability matrix between the candidate position point sets of adjacent electrical parameter measurement values.

Further, determining the specific partial trajectory matching the trajectory to be detected based on the emission probability of each candidate location point in each set of candidate location points and the respective state transition probability matrices comprises: taking the emission probability of each candidate position point in the candidate position point set of the first electrical parameter measured value in the track to be detected as the state probability; for the ith electric parameter measurement value in the track to be detected, determining the state probability of each candidate position point in the candidate position set of the ith electric parameter measurement value according to the state probability of each candidate position point in the candidate position set of the ith-1 electric parameter measurement value, a state transition probability matrix from the candidate position set of the ith-1 electric parameter measurement value to the candidate position set of the ith electric parameter measurement value and the emission probability of each candidate position point in the candidate position set of the ith electric parameter measurement value; and determining a specific part of the track matched with the track to be detected based on the candidate position point with the highest state probability in the candidate position point set of the Nth electrical parameter measured value, wherein i is greater than or equal to 2 and less than or equal to N, and N is the total number of the electrical parameter measured values in the track to be detected.

The matching process using the hidden markov model algorithm is described in more detail below by a simple example.

Reference curve trajectories are known and, as previously mentioned, may be stored in a discrete manner, i.e. position points and corresponding reference electrical parameter measurements may be stored in internal storage in the form of discrete points of (Xi, Vri).

The series of measured values of the electrical parameter obtained within the preset time period is (V1, V2, V3... Vn), which is an observation series, and V1, V2, …, Vn are observation states, which are acquired by the controller through sampling.

Each electrical parameter measurement Vi in the series of electrical parameter measurements (V1, V2, V3... Vn) may correspond to a location point Xi on the sliding region, the corresponding location point being unknown. Furthermore, each electrical parameter measurement value Vi (i ═ 1.. n) is ultimately matched to one discrete trace point, and possibly more than two discrete trace points have the same reference electrical parameter measurement value, i.e., one electrical parameter measurement value may be closest to more than two discrete trace points. The sequence of location points corresponding to the plurality of discrete trajectory points that match the sequence of electrical parameter measurements (V1, V2, V3... Vn) is a hidden sequence.

The set of location points for which the reference electrical parameter measurement corresponds to discrete trajectory points for which the deviation of the electrical parameter measurement Vi is within the first threshold range may be considered as the ith set of candidate location points for the electrical parameter measurement Vi, and the emission probability of each candidate location point in the ith set of candidate location points is related to the deviation of its reference electrical parameter measurement from the electrical parameter measurement Vi, the greater the deviation, the smaller the emission probability, and vice versa. In some embodiments, the transmission probability may be determined for each candidate location point in each set of candidate location points according to a normal distribution.

A state transition probability matrix is then calculated between the sets of candidate location points for adjacent electrical parameter measurements. The state transition probability matrix can be derived from a number of algorithms, all designed based on the idea of: the closer the distance of two candidate position points respectively belonging to different candidate position point sets is, the greater the probability of state transition between the two candidate position points is.

Next, an optimal path having the highest probability of being formed by the position points corresponding to the electrical parameter measurement value sequence is obtained based on the viterbi algorithm. The method comprises the following specific steps:

1. the probability of transmission for each candidate location point in the first set of candidate location points for the electrical parameter measurement V1 is taken as the starting state probability.

2. Traversing each candidate position point in the candidate position point set corresponding to each electrical parameter measurement value from front to back, and calculating the state probability of all candidate position points of the current electrical parameter measurement value by the following method for each candidate position point:

a. traversing all candidate position points of the current electrical parameter measurement value;

b. for each candidate location point (current state), go through all previous states, by the formula: the probability of the current state is calculated by the probability of the current state being the previous state probability and the probability of the previous state transferring to the current state being the current state emission probability.

3. After the electrical parameter measurement value sequences are traversed, the current state with the maximum state probability is searched, the previous state corresponding to the probability value is searched, reverse derivation is carried out, and the obtained position point sequence (reverse order) is the hidden sequence with the maximum probability, namely the optimal path, and is also the position point sequence corresponding to the electrical parameter measurement value sequence.

For example, by way of example and not limitation, let the electrical parameter measurement value series be (V1, V2, V3), and the first candidate position point set corresponding to V1 be (a1, a2, A3), and the emission probability of each candidate position point be P_e(A) (0.2, 0.3, 0.7), the second candidate position point set corresponding to V2 is (B1, B2, B3), and the emission probability of each candidate position point is P_e(B) (0.4, 0.2, 0.1), and the state transition probability matrix of a-B is:

meanwhile, the second candidate position point set corresponding to V3 is C ═ (C1, C2, C3), the emission probability of each candidate position point is pe (C) ═ 0.3, 0.2, 0.5, and the state transition probability matrix of B-C is:

for the electrical parameter measurement V1, the probability P of transmission is determined_e(A) (0.2, 0.3, 0.7) as initial state probability P_s(A) And it is known that the state probability of the candidate position point a3 is the largest.

For the electrical parameter measurement V2:

1. for candidate location point B1, there may be three paths: A1-B1, A2-B1 and A3-B1. The state probability of B1 when selecting the path A1-B1 is: p_s(B1)＝P_s(A1)*P_s(A1-B1)*P_e(B1) 0.2 × 0.4 ═ 0.016; the probability of the state of B1 when the path A2-B1 is selected is P_s(B1)＝P_s(A1)*P_s(A2-B1)*P_e(B1) 0.3 × 0.5 × 0.4 ═ 0.06; the probability of the state of B1 when the path A3-B1 is selected is P_s(B1)＝P_s(A1)*P_s(A3-B1)*P_e(B1) 0.7 × 0.1 × 0.4 ═ 0.028. Three kinds of the aboveThe state probability of B1 is the largest when the paths A2-B1 are selected from the paths, which indicates that the remaining two paths cannot form the final sub-path of the optimal path.

2. For candidate location point B2, there may be three paths: A1-B2, A2-B2 and A3-B2. The state probability of B2 when selecting the path A1-B2 is: p_s(B2)＝P_s(A1)*P_s(A1-B2)*P_e(B2) 0.2 × 0.3 × 0.2 ═ 0.012; the probability of the state of B2 when the path A2-B2 is selected is P_s(B2)＝P_s(A2)*P_s(A2-B2)*P_e(B2) 0.3 × 0.6 × 0.2 ═ 0.036; the probability of the state of B2 when the path A3-B2 is selected is P_s(B2)＝P_s(A1)*P_s(A3-B2)*P_e(B2) 0.7 × 0.4 ═ 0.112. The state probability of B2 is the greatest when selecting path a3-B2 among the three paths, suggesting that the remaining two paths may not form part of the final optimal path.

3. For candidate location point B3, there may be three paths: A1-B3, A2-B3 and A3-B3. The state probability of B3 when selecting the path A1-B3 is: p_s(B3)＝P_s(A1)*P_s(A1-B3)*P_e(B3) 0.2 × 0.1 ═ 0.002; the probability of the state of B3 when the path A2-B3 is selected is P_s(B3)＝P_s(A2)*P_s(A2-B3)*P_e(B3) 0.3 × 0.2 × 0.1 ═ 0.006; the probability of the state of B3 when the path A3-B3 is selected is P_s(B3)＝P_s(A3)*P_s(A3-B3)*P_e(B3) 0.7 × 0.2 × 0.1 ═ 0.014. The state probability of B3 is the greatest when selecting path a3-B3 among the three paths, suggesting that the remaining two paths may not form part of the final optimal path.

Through the above state probability analysis for each candidate location point, it may be determined that paths A2-B1, A3-B2, and A3-B3 may be part of the final optimal path. Therefore, the probability that the paths A2-B1, A3-B2 and A3-B3 are selected, i.e. the maximum state probabilities of B1, B2 and B3 are 0.06, 0.112 and 0.014 respectively, and are used for the probability correlation calculation of the next electrical parameter measurement value V3.

The following calculation is then performed for the measured value of the electrical parameter V3 in a similar probabilistic calculation process:

1. for candidate location point C1, it is possibleThere are three paths: B1-C1, B2-C1 and B3-C1. The state probability of C1 when selecting the path B1-C1 is: p_s(C1)＝P_s(B1)*P_s(B1-C1)*P_e(C1) 0.06 × 0.3 ═ 0.0054; the probability of the state of C1 when the path B2-C1 is selected is P_s(C1)＝P_s(B2)*P_s(B2-C1)*P_e(C1) 0.112 × 0.4 × 0.3 ═ 0.01344; the probability of the state of C1 when the path B3-C1 is selected is P_s(C1)＝P_s(B3)*P_s(B3-C1)*P_e(C1) 0.014 × 0.4 × 0.3 ═ 0.00168. The probability of C1 is the greatest when selecting paths B2-C1 of the three paths, suggesting that the remaining two paths may not form part of the final optimal path.

2. For candidate location point C2, there may be three paths: B1-C2, B2-C2 and B3-C2. The state probability of C2 when selecting the path B1-C2 is: p_s(C2)＝P_s(B1)*P_s(B1-C2)*P_e(C2) 0.06 × 0.1 × 0.2 ═ 0.0012; the probability of the state of C2 when the path B2-C2 is selected is P_s(C1)＝P_s(B2)*P_s(B2-C2)*P_e(C2) 0.112 × 0.3 × 0.2 ═ 0.00672; the probability of the state of C2 when the path B3-C2 is selected is P_s(C2)＝P_s(B3)*P_s(B3-C2)*P_e(C2) 0.014 × 0.2 ═ 0.00056. The state probability of C2 is the highest when the paths B2-C2 are selected from the three paths, indicating that the remaining two paths may not form part of the final optimal path.

3. For candidate location point C3, there may be three paths: B1-C3, B2-C3 and B3-C3. The state probability of C3 when selecting the path B1-C3 is: p_s(C3)＝P_s(B1)*P_s(B1-C3)*P_e(C3) 0.06 × 0.2 × 0.5 ═ 0.006; the probability of the state of C3 when the path B2-C3 is selected is P_s(C1)＝P_s(B2)*P_s(B2-C3)*P_e(C3) 0.112 × 0.2 × 0.5 ═ 0.0112; the probability of P (C3) when the paths B3-C3 are selected is P_s(C3)＝P_s(B3)*P_s(B3-C3)*P_e(C3) 0.014 × 0.3 × 0.5 ═ 0.0021. The probability of the state of C3 is the largest when the paths B2-C3 are selected from the three paths, which indicates that the remaining two paths cannot form the final sub-path of the optimal path.

Through the above path analysis for each candidate position point, it can be determined that the highest probability of the state in the candidate position point set of V3 is 0.01344 corresponding to state (candidate position point) C1, C1 is shifted from state (candidate position point) B2, that is, paths B2-C1 are the optimal sub-paths matched from electrical parameter measurement values V2 to V3. While for state B2, based on the foregoing analysis, the probability of transitioning from state A3 to state B2 is the greatest, i.e., A3-B2 is the best sub-path for electrical parameter measurements V1 to V2 to match. Thus, the state series corresponding to the series of electrical parameter measurements (V1, V2, V3) can be determined to be A3-B2-C1. Thus, it may be determined that the location point corresponding to the electrical parameter measurement V1 is A3, the location point corresponding to the electrical parameter measurement V2 is B2, and the location point corresponding to the electrical parameter measurement V3 is C1.

Therefore, it can be determined that the measured value V3 of the electrical parameter corresponding to the current sampling point matches the position point C1, and therefore the switch position corresponding to the switch position region where the position point C1 is located can be determined as the current switch position.

Specifically, the optimal path with the highest probability, that is, the position point sequence corresponding to the matched track point, is obtained for the sequence including the three electrical parameter measurement values based on the hidden markov model algorithm, and when the electrical parameter measurement value sequence includes more electrical parameter measurement values, the optimal path is obtained through similar operations, so that the position point sequence matched with the electrical parameter measurement value sequence and the matched discrete track points are obtained. Further, the specific numbers listed in the above examples are also for better illustrating the matching process and should not be construed as limiting the present disclosure.

Therefore, the change trend of the electrical parameter measurement value in the electrical parameter measurement value sequence can be reflected by the stored position point sequence corresponding to the plurality of discrete track points based on the hidden markov model, and the specific part track generated based on the plurality of discrete track points and the track to be detected generated by the electrical parameter measurement value sequence have different shapes. From a single discrete track point matched with a single electrical parameter measurement value, there may be some difference between the position point corresponding to the discrete track point and the actual position point on the sliding area where the elastic sheet is located when the electrical parameter measurement value is obtained, but only switch position information is output by the controller, and the position point corresponding to the discrete track point and the actual position point of the elastic sheet are all on the same switch position area (for example, on the same pad area), so as not to affect the finally determined correct switch position.

It should be noted that although the above detailed description of a possible matching algorithm based on a hidden markov model is given, this is merely an illustration for a better understanding of the present application and it will be appreciated by those skilled in the art that other matching algorithms, such as a geometry matching algorithm, are also possible.

In some cases, the sequence of electrical parameter measurements acquired over a preset time period may match a plurality of specific partial trajectories in the reference curve trajectory (e.g., a plurality of optimal paths of the same probability are acquired by a hidden markov model, the probability that the percentage of the difference from the probability of the optimal path to the probability of the optimal path is within, for example, 2% is also considered to be the same as the probability of the optimal path in view of errors, other matching algorithms and the following are also similar), then a non-final switch position is obtained based on each specific partial trajectory, and in the event that the non-final switch position determined based on each specific partial trajectory coincides, the non-final switch position is determined as the current switch position; in the case where the determined non-final switch positions of each specific partial trajectory do not coincide, either i) the non-final switch position or the non-final switch position with the highest sum of probabilities of the most determined non-final switch positions of the specific partial trajectories (based on the sum of the probabilities of determining the respective optimal paths of the respective non-final switch positions) is determined as the current switch position, or ii) a sequence of electrical parameter measurement candidates is re-acquired in a time period longer than a preset time period before the current sampling point, or at this time, the switch position determination is not performed, and the acquisition of additional electrical parameter measurement values is continued at more sampling points after the current sampling point, so as to obtain a sequence of electrical parameter measurement candidates based on the previous sequence of electrical parameter measurement values and the additional electrical parameter measurement values, and then the trajectory to be detected generated by the sequence of electrical parameter measurement candidates is matched with the reference curve trajectory, to obtain an alternative specific partial trajectory, and then to derive the current switch position based on the alternative specific partial trajectory.

In some cases, each electrical parameter measurement in the sequence of electrical parameter measurements taken within a preset time period of the current sampling point is nearly constant, this may be the case when the dome is stationary in a certain position or when the dome slides over a relatively smooth (i.e. wear or impurity build-up effects are negligible) switching area, the sequence of electrical parameter measurements should match a trace point in a reference curve trace or a trace formed by multiple trace points having the same reference electrical parameter measurement, however, the position point corresponding to the track point or the position point sequences corresponding to the plurality of track points may be located in different switch position areas (for example, the position points with the same maximum probability in different switch position areas are obtained through a hidden markov model, or the position point sequences with the same maximum probability in different switch position areas are obtained), and thus, a correct unique switch position may not be determined.

In the above case, the switch position determination may be made based on the position point based on when the switch position was last previously determined. For example, a location point or sequence of location points that matches a sequence of electrical parameter measurements that includes nearly invariant electrical parameter measurements may be one of location points X5, X50, and X100 or one of the sequences of location points (X5-X20), (X50-X65), or (X100-X115) located on different switch location regions, while the location point based on when the switch location was last determined was X3, so it can be determined that the location point or sequence of location points that currently matches the sequence of electrical parameter measurements should be X5 or X5-X20 (first switch location) rather than X50 or X50-X65 (second switch location) and X100 or X100-X115 (third switch location) further from X3. Alternatively, if it is determined that there are multiple possible switch positions, the controller may also transmit the determined multiple possible switch positions to an upper control device in the system (e.g., an electronic control unit in an automobile), while also indicating to the upper control device that the current switch position information is less reliable, so that the upper control device can ignore the switch position information and wait until other reliable unique switch position information is transmitted from the controller.

In the embodiment of the present disclosure, the speed of the sliding spring is generally considered to be within a normal speed range that a human user can operate, for example, when the sliding speed is too slow, the time that the spring does not contact with the switch position area may be relatively long, and when the controller detects that the measured value of the electrical parameter is the open-circuit voltage for too long, the controller may judge that the sliding speed is too slow, thereby reporting an error. Furthermore, the duration of the preset time period during which the electrical parameter measurements are to be taken and the sampling frequency may also be selected based on the conventional speed range.

On the other hand, according to the embodiment of the present disclosure, as analyzed above, after the switch is switched for multiple times or when the service time is long, there may be wear or impurity accumulation on the sliding region, and the change in the degree of wear or impurity accumulation may cause the measured value of the electrical parameter obtained when the elastic sheet is at each position point in the wear or impurity accumulation region to also change, so that the controller also updates the reference curve trajectory along with the change in the degree of wear or impurity accumulation, thereby improving the matching accuracy and matching degree.

Updating the reference curve trajectory includes: the reference curve trace is updated based on the sequence of electrical parameter measurements.

Optionally, the theoretical value of the measured value of the electrical parameter when the elastic sheet is located at each position point on the at least two switch position areas and the interval area is used as the reference measured value of the electrical parameter of the position point to generate the reference curve track. For example, the theoretical value of the electrical parameter measurement value at each switch position region may be calculated based on the structure of the measurement circuit, and the theoretical values of the electrical parameter measurement values corresponding to the respective position points at each switch position region are substantially equal, and when based on the structure of the measurement circuit shown in fig. 1B, the reference curve trace is a trace having a step shape with steps of different voltage values, and adjacent steps of different voltage values are spaced apart by an open-circuit voltage value.

More specifically, one updating method may include: for any electrical parameter measurement in the sequence of electrical parameter measurements, updating the reference electrical parameter measurement for the corresponding trace point with the electrical parameter measurement when the electrical parameter measurement deviates from the reference electrical parameter measurement for the corresponding trace point by more than a deviation threshold (e.g., 10%).

In some cases, as mentioned above, if the discrete trace point storage mode is adopted, more than two electrical parameter measurement values in a sequence of electrical parameter measurement values may match to the same discrete trace point, and the reference electrical parameter measurement value of the corresponding discrete trace point may be updated based on the more than two electrical parameter measurement values, for example, the average value, the median value, the largest electrical parameter measurement value or the smallest electrical parameter measurement value among the electrical parameter measurement values, and the like.

Alternatively, another updating method may include: for any one of the series of electrical parameter measurement values, when the deviation of the electrical parameter measurement value from the reference electrical parameter measurement value of the matched corresponding trace point exceeds a deviation threshold, the number of deviations for the corresponding trace point is accumulated (i.e. added by 1), and in the case that the number of deviations for the corresponding trace point reaches a predetermined number of deviations, the reference electrical parameter measurement value of the corresponding trace point is updated with at least a portion of the electrical parameter measurement values corresponding to the deviations of the predetermined number of deviations exceeding the deviation threshold, for example, with an average value, a median value, the largest or smallest electrical parameter measurement value among them, or the like. This may allow the system to be updated less frequently, thereby improving the reliability of the system and reducing power consumption.

Optionally, the deviation is a deviation of the electrical parameter measurement value from a reference electrical parameter measurement value for the corresponding trace point, and the deviation threshold is a deviation threshold, or a deviation percentage of the electrical parameter measurement value from the reference electrical parameter measurement value for the corresponding trace point, the deviation threshold being a percentage threshold. The deviation threshold or percentage threshold may be designed based on actual design and performance requirements.

Fig. 4 shows several examples of switch detection by the switch position detection apparatus according to the embodiments of the present disclosure.

As shown in fig. 4A, a track to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with a specific part track B1 in the reference track diagram through a matching algorithm, and it can be known that a track point P1 in the specific part track B1, which corresponds to the electrical parameter measurement value of the current sampling point Tc, corresponds to a position point Px1 on the first switch position area, so that it is determined that the spring plate is located in the first switch position area at this time, and the switch position is the first switch position. However, if the electrical parameter measurement value of the current sampling point Tc is within the threshold range of the electrical parameter measurement value corresponding to the second switch position region according to the general switch position detection method, it may be determined that the elastic sheet is located in the second switch position region by mistake, and the switch position is the second position.

As shown in fig. 4B, a track to be detected is generated based on the obtained electrical parameter measurement value sequence, and is matched with a specific part track B2 in the reference track diagram through a matching algorithm, and it can be known that a track point P2 corresponding to the current sampling point Tc in the specific part track B2 corresponds to a position point Px2 on the second switch position area, so that it is determined that the shrapnel is located in the second switch position area at this time, and the switch position is the second switch position. However, if the electrical parameter measurement value of the current sampling point Tc is within the threshold range of the electrical parameter measurement value corresponding to the third switch position region according to the general switch position detection method, it may be erroneously determined that the spring plate is located in the third switch position region, and the switch position is the third position.

As shown in fig. 4C, the trajectory to be detected is generated based on the acquired electrical parameter measurement value sequence, and is matched with the specific partial trajectory B3 in the reference trajectory diagram through a matching algorithm, and it is known that the trajectory point P3 corresponding to the current sampling point Tc in the specific partial trajectory B3 corresponds to the position point Px3 between the first switch position region and the second switch position region, so as to determine the interval when the dome sheet is located between the first switch position region and the second switch position region. However, if the measured value of the electrical parameter at the current sampling point Tc is equal to the open circuit voltage according to the general switching position detecting method, it may be erroneously determined that the switching position detecting device has an open circuit error.

As shown in fig. 4D, a track to be detected is generated based on the obtained electrical parameter measurement value sequence, and is matched with the specific part track B4 in the reference track diagram through a matching algorithm, and it can be known that the track point P4 corresponding to the current sampling point Tc in the specific part track B4 corresponds to the position point Px4 on the second switch position area, so that it is determined that the shrapnel is located in the second switch position area at this time, and the switch position is the second switch position. However, if the spring plate slides to a new switch position according to a general switch position detection method, as analyzed above, an additional time is required for debouncing or filtering operations to obtain a stable electrical parameter measurement value, and then the switch position determination can be performed, so that the determination of the switch position is delayed.

According to another aspect of the present disclosure, there is also provided a switch position detection method of a slide switch. The slide switch comprises a spring plate and at least two switch position areas, and a spacing area exists between the adjacent switch position areas.

Fig. 5 shows a flowchart of a switch position detection method of the slide switch.

At step 510, electrical parameter measurements are obtained from a measurement module at a predetermined sampling frequency.

Optionally, the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement. The method comprises the steps that abrasion or impurity accumulation exists on at least one switch position area of the sliding switch, the contact resistance value between the elastic sheet and the area where the abrasion or impurity accumulation exists on the at least one switch position area is increased along with the increase of the abrasion or impurity accumulation degree, and the obtained electric parameter measured value changes along with the increase of the contact resistance value.

In step 520, a trace to be detected is generated based on the electrical parameter measurement value sequence in a preset time period before the current sampling point.

In step 530, a specific portion of the reference curve trajectory matching the trajectory to be detected is determined. The coordinates of each trace point on the reference curve trace indicate: the position points of the trace point on the at least two switch position areas and the spacing area, and the reference electrical parameter measured value at the position points.

At step 540, a switch position is determined based on the particular partial trajectory.

In addition, in order to obtain the reference curve track, the method may further include taking a theoretical value of the measured value of the electrical parameter when the elastic sheet is located at each position point on the at least two switch position areas and the interval area as the reference measured value of the electrical parameter at the position point to generate the reference curve track. Meanwhile, in order to improve the matching accuracy and the matching degree, the method may further include updating the reference curve trajectory, for example, updating the reference curve trajectory based on the electrical parameter measurement value sequence.

Through the switch position detection device and method of the sliding switch, the position is determined based on a plurality of electrical parameter measurement values measured by the measurement module in the sliding process of the elastic sheet, the accuracy of switch position detection can be improved, and the time delay of the determination process can be improved.

While the present disclosure has been described in detail with respect to various specific example embodiments thereof, each example is provided by way of explanation, not limitation, of the present disclosure. Alterations, permutations, and equivalents of such embodiments may be readily made by those skilled in the art having the benefit of this disclosure. Accordingly, the present invention does not preclude inclusion of such modifications, variations and/or additions to the present subject matter as would be readily apparent to one of ordinary skill in the art. For instance, features illustrated or described as part of one embodiment, can be used with another embodiment to yield a still further embodiment. Thus, it is intended that the present disclosure cover such modifications, variations, and equivalents.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

The foregoing is illustrative of the present disclosure and is not to be construed as limiting thereof. While several exemplary embodiments of the present disclosure have been described, those skilled in the art will readily appreciate that many modifications may be made to the exemplary embodiments without departing from the scope of the present disclosure. Accordingly, all such modifications are intended to be included within the scope of this disclosure as defined in the claims. It is to be understood that the foregoing is illustrative of the present disclosure and is not to be construed as limited to the specific embodiments disclosed, and that modifications to the disclosed embodiments, as well as other embodiments, are intended to be included within the scope of the appended claims. The present disclosure is defined by the claims and their equivalents.

Claims

1. A switch position detection device of a slide switch, the slide switch including a resilient piece and at least two switch position areas, and a space area exists between adjacent switch position areas, the switch position detection device comprising:

a measurement module configured to output an electrical parameter measurement for determining a switch position of the slide switch;

a controller configured to:

obtaining an electrical parameter measurement from the measurement module at a predetermined sampling frequency;

generating a track to be detected based on the electrical parameter measured value sequence in a preset time period before the current sampling point,

determining a specific part track matched with the track to be detected in the reference curve track; and

determining a switch position based on the particular partial trajectory,

wherein the coordinates of each trace point on the reference curve trace indicate: the position points of the trace point on the at least two switch position areas and the spacing area, and the reference electrical parameter measured value at the position points.

2. The switch position detection device according to claim 1, wherein determining a specific partial trajectory of the reference curve trajectory that matches the trajectory to be detected includes:

for each electrical parameter measurement value in the track to be detected, determining at least one discrete track point matched with the electrical parameter measurement value in the reference curve track;

and obtaining a specific part track matched with the track to be detected based on the discrete track points respectively matched with each electrical parameter measured value in the track to be detected.

3. The switch position detection device according to claim 2, wherein an algorithm for the matching is a hidden Markov model algorithm,

for each electrical parameter measurement value in the to-be-detected track, determining at least one discrete track point matched with the electrical parameter measurement value in the reference curve track comprises:

for each electrical parameter measurement, at least one discrete trace point is determined at which the deviation of the reference electrical parameter measurement from the electrical parameter measurement is within a first threshold range, and

taking a set of location points corresponding to the at least one discrete trajectory point as a set of candidate location points for the electrical parameter measurement, wherein the probability of transmission for each candidate location point decreases as the deviation of the corresponding baseline electrical parameter measurement from the electrical parameter measurement increases;

obtaining a specific part track matched with the track to be detected based on discrete track points respectively matched with each electrical parameter measurement value in the track to be detected comprises:

calculating a state transition probability matrix between candidate position point sets of adjacent electrical parameter measurement values, wherein the closer the distance between two candidate position points of the candidate position point sets respectively belonging to the two adjacent electrical parameter measurement values is, the greater the state transition probability of the two candidate position points is; and

and determining a specific partial track matched with the track to be detected based on the emission probability of each candidate position point in each candidate position point set and a state transition probability matrix between the candidate position point sets of the adjacent electric parameter measured values.

4. The switch position detection device of claim 3, wherein determining the particular portion of the trajectory that matches the trajectory to be detected based on the emission probability of each candidate position point in each set of candidate position points and the state transition probability matrix between the sets of candidate position points for adjacent electrical parameter measurements comprises:

taking the emission probability of each candidate position point in the candidate position point set of the first electrical parameter measured value in the track to be detected as the state probability;

for the ith electrical parameter measurement value in the track to be detected, determining the state probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value according to the state probability of each candidate position point in the candidate position set of the ith-1 electrical parameter measurement value, a state transition probability matrix from the candidate position set of the ith-1 electrical parameter measurement value to the candidate position set of the ith electrical parameter measurement value and the emission probability of each candidate position point in the candidate position set of the ith electrical parameter measurement value;

determining a specific partial track matched with the track to be detected based on the candidate position point with the highest state probability in the candidate position point set of the Nth electrical parameter measured value,

wherein i is greater than or equal to 2 and less than or equal to N, and N is the total number of the electrical parameter measured values in the track to be detected.

5. The switch position detection device according to claim 1, wherein determining the switch position based on the specific partial locus includes:

extracting corresponding track points of the electrical parameter measurement values obtained at the current sampling point in the specific partial track,

and determining the switch position of the switch position area corresponding to the corresponding track point as the current switch position.

6. The switch position detection device according to claim 1, wherein the controller is further configured to:

and taking the theoretical value of the electrical parameter measured value when the elastic sheet is positioned at each position point on the at least two switch position areas and the interval area as the reference electrical parameter measured value of the position point to generate a reference curve track.

7. The switch position detection apparatus according to claim 1 or 2, wherein the controller is further configured to:

updating the reference curve trace based on the sequence of electrical parameter measurements.

8. The switch position detection device according to claim 7, wherein the updating includes: and for any electrical parameter measurement value in the electrical parameter measurement value sequence, updating the reference electrical parameter measurement value of the corresponding track point by using the electrical parameter measurement value when the deviation of the electrical parameter measurement value from the reference electrical parameter measurement value of the corresponding track point exceeds a deviation threshold value.

9. The switch position detection device according to claim 7, wherein the updating includes:

for any electrical parameter measurement value in the sequence of electrical parameter measurement values, when the electrical parameter measurement value deviates from a reference electrical parameter measurement value for a corresponding trace point by more than a deviation threshold value, adding 1 to the number of deviations for the corresponding trace point, and

and updating the reference electrical parameter measurement value of the corresponding trace point with at least a portion of the electrical parameter measurement value corresponding to the deviation of the predetermined deviation number exceeding the deviation threshold, if the deviation number for the corresponding trace point reaches the predetermined deviation number.

10. The switch position detection device according to claim 8 or 9, wherein the deviation is a deviation of the electrical parameter measurement value from a reference electrical parameter measurement value corresponding to the trace point, the deviation threshold is a deviation threshold, or

The deviation is the deviation percentage of the electrical parameter measured value relative to the reference electrical parameter measured value of the corresponding track point, and the deviation threshold is a percentage threshold.

11. The switch position detection device of claim 1, wherein the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement;

wherein there is wear or accumulation of impurities on at least one switch position region of the sliding switch, and a contact resistance value between the spring piece and a region on at least one switch position region where there is wear or accumulation of impurities increases with an increase in the degree of wear or accumulation of impurities,

wherein the obtained electrical parameter measurement value varies with an increase in the contact resistance value.

12. A switch position detection method of a slide switch, the slide switch comprising a spring plate and at least two switch position areas, and a spacing area exists between adjacent switch position areas, the switch position detection method comprising:

obtaining an electrical parameter measurement value from a measurement module at a predetermined sampling frequency;

determining a switch position based on the particular partial trajectory,

13. The switch position detection method according to claim 12, further comprising:

14. The switch position detection method according to claim 12, further comprising:

15. The switch position detection method of claim 12, wherein the electrical parameter measurement is at least one of a resistance measurement, a voltage measurement, a current measurement;

wherein there is wear or accumulation of impurities on at least one switch position region of the sliding switch, and a contact resistance value between the spring piece and the region on the at least one switch position region where wear or accumulation of impurities is present increases with an increase in the degree of wear or accumulation of impurities,