CN113447754B

CN113447754B - Testing device

Info

Publication number: CN113447754B
Application number: CN202110635211.2A
Authority: CN
Inventors: 赵平; 胡淳; 廖良生; 武启飞; 赵鹏鹏
Original assignee: Suzhou Fangsheng Photoelectricity Share Co ltd
Current assignee: Suzhou Fangsheng Photoelectricity Share Co ltd
Priority date: 2021-06-08
Filing date: 2021-06-08
Publication date: 2023-02-24
Anticipated expiration: 2041-06-08
Also published as: CN113447754A

Abstract

The invention provides a testing device, which comprises a constant current power supply and a loop formed by a plurality of testing switching units connected in series with the constant current power supply, wherein each testing switching unit comprises a testing clamp, a time delay disconnection circuit and a time delay connection circuit; the delay disconnection circuit is connected with the test fixture in series to form a test circuit; the delay switch-on circuit is connected in parallel with the test circuit; the delay disconnection circuit and the delay connection circuit are provided with detection elements, and the detection elements control the delay disconnection circuit to delay disconnection of the test fixture according to the working state of a device to be tested and control the delay connection circuit to delay connection so as to short-circuit the test circuit; or the detection element controls the time delay switching-off circuit to be kept switched on according to the working state of the device to be tested and controls the time delay switching-on circuit to be kept switched off. The invention has the beneficial effects that: the device can realize that the multipath to be detected works in a constant current mode, the requirement of simultaneously detecting multipath products is realized by adopting one set of constant current power supply, the reliability is high, and the cost is greatly reduced.

Description

Testing device

Technical Field

The invention belongs to the technical field of device testing, and particularly relates to a testing device.

Background

After the semiconductor device is manufactured, performance tests are generally required to be performed on the semiconductor device, including tests on whether the semiconductor device can normally operate, such as lighting, on/off, and the like. It is commonly used in the industry to perform a lighting test by a constant current power supply, so that the product operates in a constant current mode to check the lighting conditions and parameters.

However, when the number of products on the production line is large, if the products and the constant current power supplies are matched one to one, not only enough installation controls are needed, but also the final hardware wiring circuit is complicated. Meanwhile, the reliable constant current power supply is often high in price, and the one-to-one correspondence brings high cost. Of course, the constant current power supply is manually used at intervals, and the product is tested in different time periods, but the reliability is not high. Therefore, it is important to develop a reliable testing device to conveniently and rapidly test a plurality of products.

Disclosure of Invention

In order to solve the defects of the prior art, the invention provides a testing device and a testing method thereof.

The purpose of the invention is realized by the following technical scheme:

a testing device comprises a constant current power supply and a loop formed by a plurality of testing switching units connected in series with the constant current power supply, wherein each testing switching unit comprises a testing clamp used for connecting a device to be tested, a time delay disconnection circuit and a time delay connection circuit; the time delay disconnection circuit is connected with the test fixture in series to form a test circuit; the delay connecting circuit is connected with the test circuit in parallel; the time delay on-off circuit and the time delay on-off circuit are provided with detection elements for monitoring the device to be tested, and the detection elements control the time delay on-off circuit to delay off the test fixture according to the working state of the device to be tested and control the time delay on-off circuit to delay on so as to short-circuit the test circuit; or the detection element controls the time delay on-off circuit to be kept on according to the working state of the device to be tested and controls the time delay on-off circuit to be kept off.

Preferably, the device to be tested is a display or a lamp strip, and the detection element is a photoelectric sensor.

Preferably, the delay disconnection circuit includes a first delay switch, and a first photoelectric switch connected in parallel with the first delay switch.

Preferably, the time delay connection circuit comprises a second time delay switch and a second photoelectric switch connected in series with the second time delay switch.

Preferably, the first time delay switch contact is normally closed, and the first photoelectric switch contact is normally open.

Preferably, the second time delay switch contact is normally open, and the second photoelectric switch contact is normally closed.

Preferably, the first delay switch and the second delay switch each include a delay relay and an action switch, and the first photoelectric switch and the second photoelectric switch each include a photoelectric relay and an action switch.

Preferably, the delay time of the delay on circuit is not greater than the delay time of the delay off circuit.

Preferably, an anti-short circuit load is also connected in series to the loop.

The invention has the beneficial effects that: the device can realize that the multipath to-be-detected devices work in a constant current mode, the requirement of simultaneously detecting multipath products is met by adopting one set of constant current power supply, the reliability is high, and the cost is greatly reduced.

Drawings

FIG. 1: the circuit of the invention is schematically shown.

Detailed Description

The technical scheme of the invention is specifically described below with reference to an embodiment, and the invention discloses a testing device, which is shown in fig. 1 and comprises a constant current power supply and a loop formed by a plurality of testing switching units connected in series with the constant current power supply according to different powers of the constant current power supply and requirements. The constant current power supply can work in a constant current mode, the voltage of the constant current power supply changes along with the change of the load, and the current is kept at a set value.

Each test switching unit comprises a test fixture for connecting a device to be tested, a time delay disconnection circuit which is connected with the test fixture in series to form a test circuit, and a time delay connection circuit which is connected with the test circuit in parallel. The delay time of the delay switch-on circuit is not more than that of the delay switch-off circuit, so that when one to-be-tested device is damaged and the delay switch-off circuit needs to be switched to the delay switch-on circuit, the rest to-be-tested devices are not influenced

And the loop is also connected with a short-circuit-proof load in series to prevent the short circuit of the whole loop caused by the faults of all devices to be tested.

The time delay on-off circuit and the time delay on-off circuit are provided with detection elements for monitoring the device to be tested, and the detection elements control the time delay on-off circuit to delay off the test fixture according to the working state of the device to be tested and control the time delay on-off circuit to delay on so as to short-circuit the test circuit; or the detection element controls the time delay on-off circuit to be kept on according to the working state of the device to be tested and controls the time delay on-off circuit to be kept off. The device to be tested is a display or a lamp piece, and the detection element is a photoelectric sensor.

The time delay disconnection circuit comprises a time delay switch and a photoelectric switch connected with the time delay switch in parallel. And a delay switch contact in the delay disconnection circuit is normally closed, and a photoelectric switch contact is normally open. The delay connecting circuit comprises another delay switch and another photoelectric switch connected with the delay switch in series. And a contact of a time delay switch in the time delay connection circuit is normally open, and a contact of a photoelectric switch is normally closed.

The delay switches in the delay off-circuit and the delay on-circuit comprise action switches and delay relays for controlling the action switches. The contact of the delay switch controls the action of the action switch at the set time after the power is supplied. The photoelectric switch comprises an action switch and a photoelectric relay for controlling the action switch. The contact of the photoelectric switch controls the action switch to trigger and act under the condition that the light source meets the condition.

In this embodiment, two test switching units are provided, which are respectively a first test switching unit and a second test switching unit. The device to be tested is a lamp strip.

The first test switching unit specifically comprises a first test fixture provided with a lamp piece L1, and a first delay disconnection circuit composed of a delay switch KT1-1 and a photoelectric switch G1-1 connected with the delay switch KT1-1 in parallel; the first delay switch-on circuit is composed of a delay switch KT3-1 and a photoelectric switch G1-2 which is connected with the delay switch KT3-1 in series.

Correspondingly, the second test switching unit specifically comprises a second test fixture provided with a lamp piece L2, and a second delay disconnection circuit composed of a delay switch KT2-1 and a photoelectric switch G2-1 connected with the delay switch KT2-1 in parallel; and the second delay switch-on circuit is formed by a delay switch KT3-2 and a photoelectric switch G2-2 connected with the delay switch KT3-2 in series.

The contacts of the time delay switch KT1-1 and the time delay switch KT2-1 are normally closed. The contacts of the photoelectric switch G1-1 and the photoelectric switch G2-1 are normally open. One end of a delay switch KT1-1 is connected with the positive electrode of a constant current power supply P, the other end of the delay switch KT1-1 is connected with one end of a first test fixture, the other end of the first test fixture is connected with one end of a delay switch KT2-1, the other end of the delay switch KT2-1 is connected with one end of a second test fixture, and the other end of the second test fixture is connected with the negative electrode of the constant current power supply P.

For a better understanding of the invention, the working of the test device when there are two test switching units is explained below:

s1, setting the delay time of the delay switch KT1-1 and the delay switch KT2-1 to be 2 seconds.

S2, when the constant current power supply P just outputs, the current passes through the normally closed contacts of the time delay switch KT1-1 and the time delay switch KT2-1 to form a loop with the lamp piece L1 and the lamp piece L2 on the test fixture, and the lamp piece L1 and the lamp piece L2 work normally.

And S3, when the lamp piece L1 and the lamp piece L2 work normally, the photoelectric switch G1-1 and the photoelectric switch G2-1 receive signals and are triggered to enable the normally open contact to be attracted, and current forms a new loop with the photoelectric switch G1-1 and the photoelectric switch G2-1 through the lamp piece L1 and the lamp piece L2.

S4, when the time reaches the set time, the normally closed contacts of the time delay switch KT1-1 and the time delay switch KT2-1 are disconnected, and if the lamp piece L1 and the lamp piece L2 work, the current forms a loop through the lamp piece L1, the lamp piece L2, the photoelectric switch G1-1 and the photoelectric switch G2-1; two lamp sheets in the test switching unit are connected in series and work in a constant current mode;

and S4, when the lamp sheet in one of the test switching units fails, the lamp sheet is broken or the light-emitting parameters are abnormal, the corresponding photoelectric switch in the test switching unit is not triggered, the current passes through the photoelectric switch and the delay switch of the normally closed contact in the test switching unit to form a loop with the lamp sheet in the other test switching unit, the failed lamp sheet is short-circuited and stops working, the lamp sheet in the other test switching unit continuously works in a constant current mode through the delay switch-on circuit, and at the moment, the failed lamp sheet and the good lamp sheet can be judged through visual observation, so that the safety, the rapidness and the convenience are realized.

Specifically, when the lamp sheet L1 has a fault, at this time, the corresponding photoelectric switch G1-1 is not triggered, and a current passes through the photoelectric switch G1-2 and the delay switch KT3-1 to form a loop with the lamp sheet L2, thereby ensuring that the lamp sheet L2 continuously works. Similarly, the above operation is performed even when the lamp L2 fails.

It can be understood that when the number of the test units is 3 or more, the working process is the same, and thus, a plurality of lamp pieces can be tested simultaneously by adopting one constant-current power supply, so that the cost is saved, and the working efficiency is improved.

There are, of course, many other specific embodiments of the invention and these are not to be considered as limiting. All technical solutions formed by using equivalent substitutions or equivalent transformations fall within the scope of the claimed invention.

Claims

1. A testing device is characterized by comprising a constant current power supply and a loop formed by a plurality of testing switching units connected with the constant current power supply in series, wherein each testing switching unit comprises a testing clamp used for connecting a device to be tested, a time delay disconnection circuit and a time delay connection circuit; the time delay disconnection circuit is connected with the test fixture in series to form a test circuit; the delay connecting circuit is connected with the test circuit in parallel; the time delay on-off circuit and the time delay on-off circuit are provided with detection elements for monitoring the device to be tested, and the detection elements control the time delay on-off circuit to delay off the test fixture according to the working state of the device to be tested and control the time delay on-off circuit to delay on so as to short-circuit the test circuit; or the detection element controls the time delay switching-off circuit to keep switched on according to the working state of the device to be tested and controls the time delay switching-on circuit to keep switched off; the delay disconnection circuit comprises a first delay switch and a first photoelectric switch connected with the first delay switch in parallel;

the delay switch-on circuit comprises a second delay switch and a second photoelectric switch connected with the second delay switch in series;

the first time delay switch contact is normally closed, and the first photoelectric switch contact is normally open;

the contact of the second time delay switch is normally open, and the contact of the second photoelectric switch is normally closed; the delay time of the delay on circuit is not more than the delay time of the delay off circuit.

2. The test apparatus of claim 1, wherein the device under test is a display or a lamp strip and the detecting element is a photosensor.

3. A test apparatus as claimed in claim 2, wherein the first delay switch and the second delay switch each comprise a delay relay and an action switch, and the first photoelectric switch and the second photoelectric switch each comprise a photoelectric relay and an action switch.

4. A test apparatus as claimed in claim 1, wherein an anti-short circuit load is further connected in series with the circuit.