CN113376505B - Detection circuit and method suitable for rapid screening of electrical performance of microwave integrated circuit - Google Patents
Detection circuit and method suitable for rapid screening of electrical performance of microwave integrated circuit Download PDFInfo
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- CN113376505B CN113376505B CN202110514050.1A CN202110514050A CN113376505B CN 113376505 B CN113376505 B CN 113376505B CN 202110514050 A CN202110514050 A CN 202110514050A CN 113376505 B CN113376505 B CN 113376505B
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Abstract
The invention discloses a detection circuit and a detection method suitable for quickly screening electrical properties of a microwave integrated circuit, and belongs to the technical field of microwave testing. By adopting the method provided by the invention, when the rapid screening detection of the electrical performance of the microwave integrated circuit is carried out, the rapid screening detection of the electrical performance of not less than 10 microwave integrated circuits can be automatically completed at one time instead of time division only by presetting the loading and issuing the loading of the related measurement and control states to each related circuit unit at one time, setting the judgment threshold of the detection result in advance according to the detection requirement and loading the microwave integrated circuits to be detected in the same batch, thereby effectively solving the bottleneck problems of the shortage of the electrical performance pre-screening link and the reduction of the final detection invalid working rate of the electrical performance. The method provided by the invention is simple, convenient and economic, has higher testing and resource application efficiency, can be used for carrying out application expansion according to the application requirement scale, and has stronger universality.
Description
Technical Field
The invention belongs to the technical field of microwave testing, and particularly relates to a detection circuit and a detection method suitable for quickly screening the electrical performance of a microwave integrated circuit.
Background
With the rapid development of microwave integrated circuits and their technologies, the number and scale of their production, manufacture and application are increasing. Therefore, the test workload in the production and manufacturing process is also getting larger and larger, which brings great challenges to the efficiency of final detection of electrical properties, occupation of instrument resources and the like. By applying the traditional method, a pre-screening link is not only lacked between the production and the manufacture of the microwave integrated circuit and the final detection of the electrical property, but also the microwave integrated circuit, the resources of a test instrument and a measurement and control mode are mainly adopted to be configured in a proportioning mode of 1:1: 1. If unqualified products exist in the microwave integrated circuit to be tested, each unqualified product has the same testing process as qualified products, occupies the same time, occupies the same instrument resources and the like, but is invalid work without creating value. Therefore, in order to effectively reduce the invalid working rate of the final electrical performance detection link and improve the use efficiency of resources such as time, instruments and the like, and meanwhile, provide an improved reference for the process control quality and state of production and manufacturing through batch-type rapid screening detection evaluation, and cooperatively support the continuous improvement of the production and manufacturing comprehensive capacity of the microwave integrated circuit, a rapid detection method and technology which are adaptive to actual application requirements need to be innovated or formed.
Based on the traditional method, the microwave integrated circuit is not provided with a link of pre-screening unqualified products possibly existing before the final detection of the electrical performance, the qualification judgment is only dependent on the final detection result of the electrical performance, the final detection of the electrical performance is based on the full performance test requirement of specification parameters, and the configuration and the integrated development of corresponding test instrument resources and a measurement and control mode are carried out on a single or a plurality of tested microwave integrated circuits according to the matching mode of 1:1:1 or N:1:1, so that the required performance test target is realized in a simultaneous or time-sharing mode. In view of this, the final electrical property detection link that should only provide the test result of the qualified product performance cannot control the invalid working rate, occupies and consumes much time, instruments and other resources, has relatively low use efficiency, and is difficult to effectively meet the related application requirements and technical requirements of continuously improving the production and manufacturing comprehensive capacity of the microwave integrated circuit.
According to the analysis of practical application requirements of microwave integrated circuit production and manufacture, the traditional method is adopted to pre-screen unqualified products which may exist before the final detection of the electrical property, and obvious defects and shortcomings exist. Based on the traditional method, the qualification judgment of the microwave integrated circuit to be tested only depends on the final detection result of the electrical performance, and the configuration and the integrated development of corresponding test instrument resources and measurement and control modes are carried out according to the test requirements of single or multiple devices to be tested in the same batch in a matching mode of 1:1:1 according to the full performance test requirements of specification parameters, so that the required performance test target is realized in a simultaneous test mode; or the configuration and the integrated development of the corresponding test instrument resources and the measurement and control mode are carried out according to the matching mode of 'N: 1: 1', and the required performance test target is realized in a time-sharing test mode. Based on the method, only one of two choices can be made between shortening the testing time and reducing the instrument resources, and the optimization cannot be realized at the same time. Therefore, based on the conventional method, the invalid working rate of the final detection of the electrical performance cannot be controlled, the occupation and consumption of time, instruments and other resources are large, the use efficiency is relatively low, and the related application requirements and technical requirements of continuously improving the comprehensive production and manufacturing capacity of the microwave integrated circuit are difficult to effectively meet.
With the rapid development of microwave integrated circuits and their technologies, the number and scale of their production, manufacture and application are increasing. Therefore, the test workload in the production and manufacturing process is also increasing, which brings great challenges to the efficiency of final detection of electrical performance, occupation of instrument resources, and the like. In order to effectively reduce the invalid working rate of the final detection link of the electrical performance and improve the use efficiency of resources such as time, instruments and the like, simultaneously provide an improved reference for the process control quality and state of production and manufacturing through batch-type rapid screening detection evaluation, and cooperatively support the continuous improvement of the comprehensive production and manufacturing capacity of the microwave integrated circuit, a detection method and a circuit suitable for rapid electrical performance screening of the microwave integrated circuit are needed, unqualified products can be screened in advance before the final electrical performance detection of the microwave integrated circuit is carried out, and the related application requirements and technical requirements of continuous improvement of the comprehensive production and manufacturing capacity of the microwave integrated circuit are met to the maximum extent.
Disclosure of Invention
Aiming at the technical problems in the prior art, the invention provides the detection circuit and the detection method which are suitable for rapidly screening the electrical property of the microwave integrated circuit, the design is reasonable, the defects in the prior art are overcome, and the detection circuit and the detection method have good effects.
In order to achieve the purpose, the invention adopts the following technical scheme:
the detection circuit suitable for the rapid screening of the electrical property of the microwave integrated circuit comprises a self-adaptive equal-length in-phase multi-channel route carrier unit, a power supply unit, a signal combining unit, a signal power dividing unit, a signal analysis unit, a signal excitation unit and a processor unit;
the adaptive isometric in-phase multichannel route carrier unit comprises a controller and a route, and is configured to load at least 10 transmitting, receiving and transmitting microwave integrated circuits in the same batch, and realize the loading of the working state of the microwave integrated circuits and the automatic construction and switching combination of corresponding isometric in-phase test channels by 'a processor unit, a controller and a route' according to the detection requirement when the rapid screening detection of the electrical property is carried out;
the power supply unit is configured to be used for realizing the supply of direct current power supply of the microwave integrated circuit to be tested and loading the microwave integrated circuit through the carrier unit;
the signal combining unit is configured to be used for completing the combination of at least 10 paths of common-frequency/different-frequency constant-amplitude signals sharing a time base and multi-parameter detection including amplitude and frequency at the same time in a one-time manner instead of a time-sharing manner when the transmission electrical performance parameters of the microwave integrated circuit to be tested are detected;
the signal power dividing unit is configured to be used for completing single carrier/multi-carrier excitation signal shunting of at least 10 paths and cooperatively supporting receiving output response characteristic detection at one time and simultaneously but not in a time-sharing manner when receiving electrical performance parameters of the microwave integrated circuit to be tested are detected;
the signal excitation unit is configured to be used for generating a single carrier/multi-carrier excitation signal for realizing the electrical performance screening of the microwave integrated circuit to be tested;
the signal analysis unit is configured to be used for realizing detection of same-frequency/different-frequency signal amplitude, frequency and receiving type output response characteristic parameters for screening the electrical performance of the microwave integrated circuit to be tested;
and the processor unit is configured to realize integral cooperative control of the adaptive equal-length in-phase multi-channel routing carrier unit, the signal analysis unit and the signal excitation unit according to detection requirements so as to complete quick screening and detection of the electrical performance of at least 10 microwave integrated circuits at one time and at the same time instead of time sharing.
Preferably, the multi-parameter detection includes output response characteristic detection required by the electrical performance parameter detection including transmitting, receiving and transmitting.
Preferably, the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in a working state of common-time base same-frequency and equal-amplitude output, if the microwave integrated circuits to be tested work normally, the power of the synthesized signal of the at least 10 microwave integrated circuits which pass through the equal-length in-phase test channel and pass through the signal combining unit to realize signal combining is equal to
Wherein n is more than or equal to 10; the control signal analysis unit can quickly judge whether the 10 microwave integrated circuits have products with unqualified output signal amplitude parameters under the current frequency of the transmitting class by detecting the amplitude of the synthesized signal.
Preferably, the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in a working state of common-time base different-frequency equal-amplitude output, if the microwave integrated circuits to be tested work normally, the at least 10 signals pass through the equal-length in-phase test channel and the signal combining unit to realize signal combining and then output a group of corresponding frequency signals with combining loss of 10dB, and the signal analysis unit detects the frequency, frequency spectrum and amplitude of the signals to quickly judge whether the 10 microwave integrated circuits output products with unqualified signal frequency, frequency spectrum and amplitude parameters under corresponding emission frequencies.
Preferably, the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in a common-time-base same-frequency or different-frequency receiving working state, the control signal excitation unit provides a single-carrier or multi-carrier excitation signal according to the detection requirement and realizes at least 10-path excitation signal shunting through the signal power dividing unit, if the microwave integrated circuit to be tested works normally, corresponding 10-path output response signals corresponding to the 10-path excitation signal shunting pass through the equal-length in-phase test channel and the switching combination, the control signal analysis unit detects the combined signal amplitude of the corresponding frequency signal which passes through the equal-length in-phase test channel and is combined by the signal combining unit in the common-time-base same-frequency and equal-amplitude output state or the control signal analysis unit detects the frequency spectrum of the corresponding frequency signal which passes through the equal-length in-phase test channel and is combined by the signal combining unit in the common-time-base different-frequency and equal-amplitude output state, The frequency and the amplitude can realize the detection of the amplitude, the frequency and the frequency spectrum parameters of the receiving output response signals, and judge whether the 10 microwave integrated circuits have products with unqualified receiving and transmitting electrical performance parameters.
In addition, the invention also provides a detection method for rapidly screening the electrical property of the microwave integrated circuit, which adopts the detection circuit suitable for rapidly screening the electrical property of the microwave integrated circuit, and specifically comprises the following steps:
step 1: when the amplitude parameters of certain co-frequency output signals of microwave integrated circuit transmission class are rapidly screened, the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in the working state of co-time base co-frequency and equal-amplitude output, if the microwave integrated circuits to be tested work normally, the power of the synthesized signals of the at least 10 microwave integrated circuits which pass through the equal-length in-phase test channel and pass through the signal combining unit to realize signal combining is
Wherein n is more than or equal to 10, control signalThe analysis unit can quickly judge whether the 10 microwave integrated circuits have products with unqualified output signal amplitude parameters under the current frequency of the transmitting class by detecting the amplitude of the synthesized signal, if the products are not unqualified, the 10 microwave integrated circuits enter a final performance test procedure by quick screening, and if the products are unqualified, the 10 microwave integrated circuits are moved to other procedures for problem troubleshooting;
step 2: when the frequency, frequency spectrum and amplitude parameters of certain pilot frequency output signals of microwave integrated circuit emission class are rapidly screened, a processor unit, a self-adaptive equal-length in-phase multichannel routing carrier unit and a power supply unit are used for controlling and loading at least 10 microwave integrated circuits to work in a working state of common-time base pilot frequency equal-amplitude output, if the microwave integrated circuit to be tested works normally, the corresponding frequency signals with combination loss of 10dB can be output after the signals of at least 10 signals pass through an equal-length in-phase testing channel and are combined by a signal combining unit, a control signal analysis unit can rapidly judge whether the 10 microwave integrated circuits have products with unqualified output signal frequency, frequency spectrum and amplitude parameters under the corresponding emission class frequency, if the products are not unqualified, the 10 microwave integrated circuits enter a final performance testing procedure through rapid screening, if unqualified products exist, the 10 microwave integrated circuits are moved to other procedures for problem troubleshooting;
and step 3: when microwave integrated circuit receiving, receiving and transmitting amplitude, frequency and spectrum parameters are rapidly screened, a processor unit, an adaptive equal-length in-phase multi-channel route carrier unit and a power supply unit are used for controlling and loading at least 10 microwave integrated circuits to work in a common-time base same-frequency or different-frequency receiving working state, a control signal excitation unit provides a single-carrier or multi-carrier excitation signal according to detection requirements, at least 10 excitation signal branches are realized through a signal power dividing unit, if the microwave integrated circuit to be tested works normally, corresponding 10 output response signals of the 10 excitation signal branches pass through an equal-length in-phase test channel and a switching combination, a control signal analysis unit detects the synthesized signal amplitude which passes through the equal-length in-phase test channel and is combined by a signal combining unit under the common-time base same-frequency and equal-amplitude output state, or a control signal analysis unit detects the synthesized signal amplitude which passes through the equal-length in-phase test channel and is combined by the equal-frequency and equal-amplitude output state under the common-time base different-frequency and equal-amplitude state The signal combining unit realizes the frequency spectrum, the frequency and the amplitude of the corresponding frequency signal of the signal combining, and can realize the detection of the amplitude, the frequency and the frequency spectrum parameters of the receiving output response signal, thereby quickly judging whether the 10 microwave integrated circuits have products with unqualified receiving and sending electrical performance parameters, if the products are not unqualified, the 10 microwave integrated circuits enter a final performance testing process through quick screening, and if the products are unqualified, the 10 microwave integrated circuits are moved to other processes for problem troubleshooting.
The invention has the following beneficial technical effects:
by adopting the method provided by the invention, when the rapid screening detection of the electrical property of the microwave integrated circuit is carried out, the configuration and the integrated development of corresponding testing instrument resources and a measurement and control mode are not required to be carried out on the tested microwave integrated circuit in a matching mode of 1:1:1, and the method is also not carried out in a mode of N: the resource ratio of 1: 1' realizes the required performance test target in a time-sharing way, only needs to preset one-time loading and issuing the relevant measurement and control states to each relevant circuit unit, the method has the advantages that the judgment threshold of the detection result is set in advance according to the detection requirement, the microwave integrated circuits to be tested in the same batch are loaded, the rapid screening detection (such as key electrical performance parameters of transmitting, receiving and transmitting) of the electrical performance of not less than 10 microwave integrated circuits can be automatically completed at one time instead of time sharing, and the bottleneck problems that the electrical performance is short in the pre-screening link and the final detection invalid working rate of the electrical performance is reduced are effectively solved. The method provided by the invention is simple, convenient and economic, has higher testing and resource application efficiency, can be used for carrying out application expansion according to the application requirement scale, and has stronger universality.
By adopting the method provided by the invention, the pre-screening detection function of the microwave integrated circuit before the final detection of the electrical property can be integrated into the comprehensive capability of the production and the manufacture of the microwave integrated circuit, so that the integrated measurement and control application which meets the low-cost and high-efficiency mass production and manufacture requirements of the microwave integrated circuit is realized, and the practical technical requirements of the practical application requirements on the field of test engineering are met.
Drawings
FIG. 1 is a schematic diagram of the operation principle of the detection circuit for rapidly screening the electrical properties of the microwave integrated circuit according to the present invention.
Detailed Description
The invention is described in further detail below with reference to the following figures and detailed description:
the invention provides a detection circuit and a method suitable for quickly screening the electrical performance of a microwave integrated circuit, which can simultaneously finish quickly screening and detecting the electrical performance of at least 10 microwave integrated circuits in the same batch at one time instead of time-sharing, effectively solve the problems that the traditional method lacks an electrical performance pre-screening link, can not realize the optimization of shortening the test time and reducing the resource occupation, can not reduce the invalid working rate of the final detection of the electrical performance, can not continuously improve the use efficiency of each resource in the production and manufacturing process and the like, and provide a detection solution for quickly screening the electrical performance of the microwave integrated circuit which meets the requirements of low-cost and high-efficiency batch production and manufacturing in a universal mode.
FIG. 1 is a schematic block diagram showing the working principle of the rapid screening and detecting method for microwave integrated circuit electrical performance of the present invention. The self-adaptive equal-length in-phase multi-channel route carrier unit in the rapid screening detection circuit for the electrical property mainly realizes the loading of at least 10 transmitting, receiving and transmitting microwave integrated circuits in the same batch, and realizes the loading of the working state of the microwave integrated circuits and the automatic construction and switching combination of corresponding equal-length in-phase test channels by a processor unit, a controller and a route according to the detection requirement during rapid screening detection of the electrical property;
the power supply unit in the rapid screening and detecting circuit for electrical performance mainly realizes the direct current power supply of the microwave integrated circuit to be tested and loads the microwave integrated circuit through the carrier unit;
the signal combining unit in the rapid screening and detecting circuit for electrical performance mainly realizes that the combination of not less than 10 paths of common-time-base common-frequency/different-frequency constant-amplitude signals and the detection of multiple parameters such as amplitude, frequency and the like (including the detection of output response characteristics required by receiving and receiving electrical performance parameter detection) are completed at the same time and in a non-time-sharing way when the transmitting electrical performance parameters of the microwave integrated circuit to be detected are detected;
the signal power dividing unit in the rapid screening and detecting circuit for electrical performance mainly realizes that the detection of the receiving electrical performance parameters of the microwave integrated circuit to be tested can finish the single carrier/multi-carrier excitation signal shunting of not less than 10 paths and the cooperative support receiving output response characteristic detection at the same time but not in a time-sharing way;
the signal analysis unit and the signal excitation unit in the rapid screening detection circuit for the electrical property mainly realize the detection of parameters such as single carrier/multi-carrier excitation signals screened by the electrical property of the microwave integrated circuit to be tested, the amplitude and the frequency of same-frequency/different-frequency signals, receiving output response characteristics and the like;
the processor unit in the rapid screening detection circuit for electrical properties mainly realizes the integrated cooperative control of the adaptive equal-length in-phase multi-channel route carrier unit, the signal analysis unit and the signal excitation unit according to the detection requirements, so as to complete the rapid screening detection for the electrical properties of not less than 10 microwave integrated circuits at one time and not in a time-sharing manner.
Firstly, a processor unit, a self-adaptive equal-length in-phase multi-channel route carrier unit and a power supply unit control and load at least 10 microwave integrated circuits to work in a working state of common-time base same-frequency and equal-amplitude output, if the microwave integrated circuits to be tested work normally, the power of the synthesized signal of at least 10 paths of microwave integrated circuits passing through the equal-length in-phase test channel and through a signal combining unit to realize signal combining is equal to
(n is not less than 10), the amplitude of the synthesized signal is detected by a signal analysis unit, so that whether the 10 microwave integrated circuits have products with unqualified amplitude parameters of output signals under the current frequency of the transmitting class can be quickly judged;
the processor unit, the self-adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load not less than 10 microwave integrated circuits to work in a working state of common-time base different-frequency equal-amplitude output, if the microwave integrated circuits to be tested work normally, the not less than 10 signals pass through the equal-length in-phase test channel and the signal combining unit to realize signal combining and then output corresponding frequency signals with combining loss of 10dB, and the signal analysis unit detects the frequency, frequency spectrum, amplitude and the like of the signals to quickly judge whether the 10 microwave integrated circuits have products with unqualified parameters such as output signal frequency, frequency spectrum, amplitude and the like under corresponding emission frequencies;
the processor unit, the adaptive equal-length in-phase multichannel route carrier unit and the power supply unit control and load not less than 10 microwave integrated circuits to work in a common-time-base same-frequency or different-frequency receiving working state, a single-carrier or multi-carrier excitation signal is provided through the signal excitation unit according to a detection requirement, at least 10 paths of excitation signal branches are realized through the signal power dividing unit, if the microwave integrated circuit to be tested works normally, corresponding 10 paths of output response signals of the 10 paths of excitation signal branches pass through the equal-length in-phase test channel and the switching combination, and parameters such as amplitude, frequency and frequency spectrum of the received output response signals can be detected through the modes of the first step and the second step, so that whether the 10 microwave integrated circuits have products with unqualified receiving and receiving electrical performance parameters or not is judged quickly.
The invention provides a method and a circuit for rapidly screening and detecting the electrical performance of a microwave integrated circuit based on the comprehensive integration of a processor, multi-channel single/multi-carrier power division excitation, multi-channel same/different frequency combination multi-parameter detection, a self-adaptive equal-length same-phase multi-channel routing carrier and the like, wherein a related measurement and control state is loaded and issued to each related circuit unit at one time in advance through presetting, a judgment threshold value of a detection result is set in advance according to the detection requirement, as long as the microwave integrated circuits to be detected in the same batch are loaded, the rapid screening and detection of the electrical performance (such as key electrical performance parameters of transmitting, receiving and transmitting/receiving) of not less than 10 microwave integrated circuits can be automatically completed at one time and in a non-time-sharing way, meanwhile, related information is recorded and stored and supports analysis processing, unqualified products are returned to carry out fault cause inspection, and qualified products are transferred to an electrical performance final detection link for inspection and warehousing, and then the screening detection of at least 10 microwave integrated circuits in the next batch is continuously repeated, the defect problem of the electrical property pre-screening link is effectively solved, the invalid working rate of the final electrical property detection is reduced, the use efficiency of various resources such as time, instruments and the like in the production and manufacturing process is continuously improved, and the detection solution for quickly screening the electrical property of the microwave integrated circuits, which meets the requirements of low-cost and high-efficiency mass production and manufacturing, is provided in a universal mode.
The invention provides a key electrical performance parameter test model construction and integrated measurement and control method of 'single/multi-carrier power division excitation + same/different frequency combination detection', which can adapt to the rapid screening detection problem of different types of key electrical performance parameters of a microwave integrated circuit in a universal mode, reduce the resource occupation, conveniently integrate the pre-screening detection function of the microwave integrated circuit before the final detection of the electrical performance into the comprehensive capability of the microwave integrated circuit production and manufacture, and realize the integrated measurement and control which is suitable for the low-cost and high-efficiency mass production and manufacture application requirements and technical requirements of the microwave integrated circuit.
It is to be understood that the above description is not intended to limit the present invention, and the present invention is not limited to the above examples, and those skilled in the art may make modifications, alterations, additions or substitutions within the spirit and scope of the present invention.
Claims (5)
1. Detection circuitry suitable for microwave integrated circuit electrical property quick screening, its characterized in that: the system comprises a self-adaptive equal-length in-phase multi-channel route carrier unit, a power supply unit, a signal combining unit, a signal power dividing unit, a signal analysis unit, a signal excitation unit and a processor unit;
the adaptive isometric in-phase multichannel route carrier unit comprises a controller and a route, and is configured to load at least 10 transmitting, receiving and transmitting microwave integrated circuits in the same batch, and realize the loading of the working state of the microwave integrated circuits and the automatic construction and switching combination of corresponding isometric in-phase test channels by 'a processor unit, a controller and a route' according to the detection requirement when the rapid screening detection of the electrical property is carried out;
the power supply unit is configured to be used for realizing the supply of direct current power supply of the microwave integrated circuit to be tested and loading the microwave integrated circuit through the carrier unit;
the signal combining unit is configured to be used for completing the combination of at least 10 paths of common-frequency/different-frequency constant-amplitude signals sharing a time base and multi-parameter detection including amplitude and frequency at the same time in a one-time manner instead of a time-sharing manner when the transmission electrical performance parameters of the microwave integrated circuit to be tested are detected;
the signal power dividing unit is configured to be used for completing single carrier/multi-carrier excitation signal shunting of at least 10 paths and cooperatively supporting receiving output response characteristic detection at one time and simultaneously but not in a time-sharing manner when receiving electrical performance parameters of the microwave integrated circuit to be tested are detected;
the signal excitation unit is configured to be used for generating a single carrier/multi-carrier excitation signal for realizing the electrical performance screening of the microwave integrated circuit to be tested;
the signal analysis unit is configured to be used for realizing detection of same-frequency/different-frequency signal amplitude, frequency and receiving type output response characteristic parameters for screening the electrical performance of the microwave integrated circuit to be tested;
the processor unit is configured to realize integral cooperative control of the adaptive equal-length in-phase multi-channel routing carrier unit, the signal analysis unit and the signal excitation unit according to detection requirements so as to complete quick screening and detection of the electrical performance of at least 10 microwave integrated circuits at one time and at the same time instead of time division;
the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in a working state of common-time-base same-frequency and equal-amplitude output, if the microwave integrated circuits to be tested work normally, at least 10 paths of synthesized signals passing through the equal-length in-phase test channel and through the signal combining unit realize signal combining have the power of
Wherein n is more than or equal to 10; the control signal analysis unit detects the amplitude of the synthesized signal, so that whether products with unqualified output signal amplitude parameters under the current frequency of the transmitting class exist in at least 10 microwave integrated circuits can be judged quickly.
2. The detection circuit for rapidly screening electrical properties of a microwave integrated circuit as claimed in claim 1, wherein: the multi-parameter detection comprises the detection of output response characteristics required by the detection of electrical performance parameters including transmitting, receiving and transmitting.
3. The detection circuit for rapidly screening electrical properties of a microwave integrated circuit as claimed in claim 1, wherein:
the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in a working state of common-time base different-frequency constant-amplitude output, if the microwave integrated circuits to be tested work normally, at least 10 signals pass through the equal-length in-phase test channel and the signal combining unit to realize signal combination, then a group of corresponding frequency signals with combination loss of 10dB can be output, and the control signal analysis unit can quickly judge whether the at least 10 microwave integrated circuits output products with unqualified signal frequency, spectrum and amplitude parameters under corresponding emission frequencies by detecting the frequency, spectrum and amplitude of the signals.
4. The detection circuit for rapidly screening electrical properties of a microwave integrated circuit as claimed in claim 1, wherein:
a processor unit, a self-adaptive equal-length in-phase multi-channel route carrier unit and a power supply unit are used for controlling and loading at least 10 microwave integrated circuits to work in a common-time-base same-frequency or different-frequency receiving working state, a control signal excitation unit provides a single-carrier or multi-carrier excitation signal according to detection requirements and realizes at least 10 excitation signal branches through a signal power dividing unit, if the microwave integrated circuits to be detected work normally, corresponding at least 10 output response signals of the corresponding at least 10 excitation signal branches pass through an equal-length in-phase test channel and a switching combination, a control signal analysis unit detects the combined signal amplitude of a corresponding frequency signal which passes through the equal-length in-phase test channel and is combined by a signal combining unit in the common-time-base same-frequency and equal-amplitude output state, or a control signal analysis unit detects the frequency spectrum of a corresponding frequency signal which passes through the equal-length in-phase test channel and is combined by the signal combining unit in the equal-time-base different-frequency and equal-amplitude output state, The frequency and the amplitude can realize the detection of the amplitude, the frequency and the frequency spectrum parameters of the receiving output response signals, and judge whether products with unqualified receiving and transmitting electrical performance parameters exist in at least 10 microwave integrated circuits.
5. The detection method suitable for the rapid screening of the electrical property of the microwave integrated circuit is characterized by comprising the following steps: the detection circuit suitable for the microwave integrated circuit electrical performance rapid screening of claim 1 is adopted, and comprises the following steps:
step 1: when the amplitude parameters of certain co-frequency output signals of microwave integrated circuit transmission class are rapidly screened, the processor unit, the adaptive equal-length in-phase multi-channel route carrier unit and the power supply unit control and load at least 10 microwave integrated circuits to work in the working state of co-time base co-frequency and equal-amplitude output, if the microwave integrated circuits to be tested work normally, at least 10 combined signals pass through the equal-length in-phase test channel and the signal combining unit to realize the signal combining have the power of the combined signal of
The control signal analysis unit can quickly judge whether at least 10 microwave integrated circuits have products with unqualified amplitude parameters of output signals under the current frequency of the emission class by detecting the amplitude of the synthesized signal, if the products are not unqualified, at least 10 microwave integrated circuits enter a final performance test procedure by quick screening, and if the products are unqualified, at least 10 microwave integrated circuits are moved to other procedures for problem troubleshooting;
step 2: when the frequency, frequency spectrum and amplitude parameters of certain pilot frequency output signals of microwave integrated circuit emission class are rapidly screened, a processor unit, a self-adaptive equal-length in-phase multichannel routing carrier unit and a power supply unit are used for controlling and loading at least 10 microwave integrated circuits to work in a working state of common-time base pilot frequency equal-amplitude output, if the microwave integrated circuits to be tested work normally, at least 10 signals pass through an equal-length in-phase testing channel and a signal combining unit to realize signal combining and then output corresponding frequency signals with combining loss of 10dB, a control signal analysis unit detects the frequency, frequency spectrum and amplitude of the signals to quickly judge whether the at least 10 microwave integrated circuits have products with unqualified output signal frequency, frequency spectrum and amplitude parameters under the corresponding emission class frequency, if the microwave integrated circuits have no unqualified products, at least 10 microwave integrated circuits enter a final performance testing procedure through rapid screening, if unqualified products exist, at least 10 microwave integrated circuits are moved to other procedures for problem troubleshooting;
and step 3: when microwave integrated circuit receiving, receiving and transmitting amplitude, frequency and spectrum parameter fast screening is carried out, at least 10 microwave integrated circuits are controlled and loaded to work in a common-time-base common-frequency or different-frequency receiving working state by a processor unit, an adaptive equal-length in-phase multi-channel route carrier unit and a power supply unit, a control signal excitation unit provides a single-carrier or multi-carrier excitation signal according to a detection requirement, at least 10 excitation signal branches are realized by a signal power dividing unit, if the microwave integrated circuit to be tested works normally, corresponding at least 10 output response signals of the corresponding at least 10 excitation signal branches pass through an equal-length in-phase test channel and a switching combination, a control signal analysis unit detects a synthesized signal amplitude of signal combination through an equal-length in-phase test channel under the common-time-base common-frequency and equal-amplitude output state and a signal combination unit realizes the signal combination through the equal-length in-phase test channel under the common-time-base common-frequency and equal-amplitude output state or a control signal analysis unit detects the synthesized signal amplitude of signal combination through an equal-length test channel under the common-base different-frequency and equal-amplitude output state The frequency spectrum, the frequency and the amplitude of the corresponding frequency signal of the signal combination are realized by the signal combination unit through the test channel, so that the detection on the amplitude, the frequency and the frequency spectrum parameters of the receiving output response signal can be realized, whether products with unqualified receiving and receiving electrical performance parameters exist in at least 10 microwave integrated circuits is further quickly judged, if the products with unqualified receiving and receiving electrical performance parameters do not exist, the final performance testing process is carried out by quickly screening at least 10 microwave integrated circuits, and if the products with unqualified receiving electrical performance parameters exist, the problem is eliminated by moving at least 10 microwave integrated circuits to other processes.
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