CN113362879B - Method and device for predicting service life of solid state disk and readable storage medium - Google Patents
Method and device for predicting service life of solid state disk and readable storage medium Download PDFInfo
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Abstract
The application discloses a method and a device for predicting the service life of a solid state disk and a readable storage medium, wherein the method comprises the following steps: acquiring health information of each flash memory block in the solid state disk and the number of current available flash memory blocks, wherein the available flash memory blocks are flash memory blocks used for storing data to be written; calculating the corresponding flash memory health value by using the health information of each flash memory block, and calculating the quantity health value by using the quantity of the currently available flash memory blocks; and predicting the service life of the solid state disk by using the quantity health value and all flash memory health values to obtain the residual service life of the solid state disk. Through the mode, the residual service life of the solid state disk can be accurately estimated.
Description
Technical Field
The application relates to the technical field of storage, in particular to a method and a device for predicting the service life of a solid state disk and a readable storage medium.
Background
The service life of the solid state disk is mainly determined by flash memory (flash) particles, because the wear frequency of the flash memory particles is limited, the bit number of bit overturn in each page (page) is increased along with the increase of the erasing frequency of a flash memory block, when the bit number of bit overturn exceeds the error correction capability of the solid state disk, an error is reported, and the current block becomes a bad block.
For estimating the service life of a solid state disk, the current practice is generally as follows: the method of counting the number of times of erasing the flash memory blocks or the data writing amount and comparing them with the nominal value to obtain the estimated service life is not accurate enough, because the situation of different flash memory blocks is different, and the bit flipping bit of the flash memory block with more erasing times is lower than that of the flash memory block with less erasing times, so there may be the following situations: the service life counted in the Self-detection Analysis And Reporting Technology (SMART) information of the solid state disk is still remained, but the solid state disk is not available, or the service life counted in the SMART information is used up, but the bit flipping of the flash memory block is less, And the safe operation can still be continued. Moreover, the life of the solid state disk is related to the number of flash memory blocks, and if the number of bad blocks is increased continuously, the number of available flash memory blocks is insufficient to maintain normal operation, and the life of the solid state disk is also ended in advance, so that a method for accurately estimating the remaining life of the solid state disk is needed.
Disclosure of Invention
The application provides a method and a device for predicting the service life of a solid state disk and a readable storage medium, which can accurately estimate the residual service life of the solid state disk.
In order to solve the technical problem, the technical scheme adopted by the application is as follows: the method for predicting the service life of the solid state disk comprises the following steps: acquiring health information of each flash memory block in the solid state disk and the number of current available flash memory blocks, wherein the available flash memory blocks are flash memory blocks used for storing data to be written; calculating the corresponding flash memory health value by using the health information of each flash memory block, and calculating the quantity health value by using the quantity of the currently available flash memory blocks; and predicting the service life of the solid state disk by using the quantity health value and all flash memory health values to obtain the residual service life of the solid state disk.
In order to solve the above technical problem, another technical solution adopted by the present application is: the prediction device comprises a memory and a processor which are connected with each other, wherein the memory is used for storing a computer program, and the computer program is used for realizing the prediction method of the service life of the solid state disk in the technical scheme when being executed by the processor.
In order to solve the above technical problem, another technical solution adopted by the present application is: a computer-readable storage medium is provided, which is used for storing a computer program, and when the computer program is executed by a processor, the computer program is used for implementing the method for predicting the service life of the solid state disk in the above technical solution.
Through the scheme, the beneficial effects of the application are that: the solid state disk comprises a plurality of flash memory blocks, and the health information of all the flash memory blocks in the solid state disk and the number of available flash memory blocks which can be used for storing data to be written currently are acquired; then, calculating a corresponding flash memory health value by using the health information of each flash memory block, and calculating a quantity health value by using the quantity of the current available flash memory blocks; finally, predicting the service life of the solid state disk by using the calculated quantity health value and all flash memory health values to obtain the residual service life of the solid state disk; the number of the available flash memory blocks is used as one of the influence factors for measuring the service life of the solid state disk, so that the service life of the solid state disk can be estimated more conveniently, a user can transfer data in the solid state disk in time when the service life of the solid state disk is about to be used up, and the data safety is ensured; in addition, the service life of the solid state disk is estimated more accurately, so that the solid state disk can be prevented from being used when the actual service life of the solid state disk is not used up, the solid state disk can be fully used for storing data, and the cost is saved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts. Wherein:
fig. 1 is a schematic flowchart of an embodiment of a method for predicting a lifetime of a solid state disk provided in the present application;
fig. 2 is a schematic flowchart of another embodiment of a method for predicting the lifetime of a solid state disk provided in the present application;
FIG. 3 is a schematic flow chart of step 202 in the embodiment shown in FIG. 2;
FIG. 4 is a schematic flow chart of step 205 in the embodiment shown in FIG. 2;
FIG. 5 is a schematic structural diagram illustrating an embodiment of an apparatus for predicting a lifetime of a solid state disk provided in the present application;
FIG. 6 is a schematic structural diagram of an embodiment of a computer-readable storage medium provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The service life of the solid state disk is mainly determined by the flash memory particles, and the flash memory particles can influence the service life of the solid state disk from two aspects, namely the health state of the flash memory particles and the number of flash memory blocks. With the increase of the erasing times of the flash memory block, the service life of the flash memory block is reduced, and the service life of the solid state disk is further influenced. The number of the flash memory blocks can also influence the service life of the solid state disk, when bad blocks appear, the number of the flash memory blocks which can be used for writing data can be reduced, when the number of the available flash memory blocks is reduced to a certain degree, the reserved flash memory blocks are not enough to be used, the garbage recovery speed and the performance of the solid state disk can be influenced, and when the number of the available flash memory blocks is further reduced, the garbage recovery can be completely failed; and when the capacity of the available flash memory block is smaller than the nominal capacity of the hard disk, if data is written to an address beyond the range, an error is directly reported. Therefore, the health state of the flash memory blocks and the number of the available flash memory blocks are integrated to measure the residual service life of the solid state disk, the residual service life of the solid state disk is estimated more accurately, and the safety of data storage is improved.
Referring to fig. 1, fig. 1 is a schematic flowchart illustrating an embodiment of a method for predicting a lifetime of a solid state disk provided in the present application, where the method includes:
step 11: and acquiring the health information of each flash memory block in the solid state disk and the number of currently available flash memory blocks.
In order to estimate the remaining life of the solid state disk more accurately, the health information of the solid state disk can be obtained firstly, the solid state disk comprises a plurality of flash memory blocks, the flash memory blocks comprise damaged flash memory blocks and available flash memory blocks, the damaged flash memory blocks are the damaged flash memory blocks which cannot be used for storing data, and the available flash memory blocks are the flash memory blocks used for storing data to be written; since each flash block may be used in a different condition and thus in a different health condition, to ensure the accuracy of the lifetime estimation, the health information of each flash block and the number of flash blocks that are currently not damaged (i.e. available flash blocks) may be obtained.
Step 12: the health information of each flash block is used to calculate the corresponding flash health value, and the quantity health value is calculated by using the quantity of the currently available flash blocks.
After the health information of each flash memory block is obtained, the health information can be analyzed and processed to obtain the health value (namely the flash memory health value) of each flash memory block; and simultaneously processing the acquired number of the available flash memory blocks to obtain a number health value corresponding to the number of the available flash memory blocks.
Further, a corresponding relation or a functional relation between the health information and the flash memory health value can be established in advance, and in actual use, after the health information is obtained, the matched flash memory health value is calculated according to the pre-established corresponding relation or functional relation; similarly, the corresponding relationship or functional relationship between the number of available flash memory blocks and the number health value may also be pre-established, and in actual use, after the number of available flash memory blocks is obtained, the matched number health value is calculated according to the pre-established corresponding relationship or functional relationship.
Step 13: and predicting the service life of the solid state disk by using the quantity health value and all flash memory health values to obtain the residual service life of the solid state disk.
After the quantity health value and the flash memory health values of all flash memory blocks are calculated, the quantity health value and the flash memory health values can be processed, so that the remaining service life of the current solid state disk is obtained, for example: the number health value and all flash memory health values can be subjected to weighted summation, and the result of the weighted summation is used as the residual life of the solid state disk; or taking the product of the number health value and all flash memory health values as the remaining life; or firstly carrying out weighted summation on all the flash memory health values to obtain a summation result, and then multiplying the summation result by the number health value to obtain the remaining life.
It can be appreciated that, in order to facilitate the user to check the remaining life, the service life of the solid state disk may be set in a fixed interval, such as: 0-1 or 0-100.
The problem to be solved in this embodiment is that the evaluation of the service condition of the solid state disk in the existing scheme is inaccurate, and the used service life of the solid state disk cannot be accurately measured only according to the erasing times or the data writing amount of the flash memory block; the embodiment utilizes two parameters to evaluate the remaining life of the solid state disk, wherein the health condition of the flash memory blocks is one parameter, and the number of the currently available flash memory blocks is another parameter considering the life of the solid state disk, so that the accuracy of predicting the remaining life can be improved, a user is helped to know the service life of the solid state disk, data can be backed up in time before the life of the solid state disk is used up, data loss is prevented, and the safety of data storage is improved.
Referring to fig. 2, fig. 2 is a schematic flowchart illustrating another embodiment of a method for predicting a lifetime of a solid state disk provided in the present application, where the method includes:
step 201: and acquiring the health information of each flash memory block in the solid state disk and the number of currently available flash memory blocks.
The health information of the flash memory block includes the number of erasures and the number of error correction bits, which may be the number of bits for correcting error data by using Low Density Parity Check (LDPC) to correct errors.
Further, three pieces of information may be counted, first: counting the erasing times when erasing the flash memory block, and secondly: when reading the data in the flash memory block, counting the number of error correction bits, and thirdly: the number of currently available flash blocks.
Step 202: and calculating the flash memory health value of the corresponding flash memory block by using the erasing times and the error correction bits of each flash memory block.
After the erasing times and the error correction times of the flash memory blocks in the solid state disk are obtained, the health value of each flash memory block can be calculated by utilizing the erasing times and the error correction times of each flash memory block; for example, the number of erasures and the number of error corrections may be added/multiplied to obtain a health value; or mapping the erasing times and the error correction times into corresponding erasing time health values and error correction bit health values, and adding/multiplying the erasing time health values and the error correction bit health values to obtain health values; it will be appreciated that the health value of the flash block may also be calculated in other reasonable ways, provided that the health of the flash block can be characterized.
In a specific embodiment, the scheme shown in fig. 3 may be used to calculate the flash health value, which specifically includes the following steps:
step 31: and acquiring the erasing times and the error correction bits of each flash memory block.
When erasing the data in the flash memory block, recording and counting the number of times of erasing each flash memory block; the number of bits that the data in the flash block is corrected may also be obtained when reading the data in the flash block.
Step 32: and calculating the erase frequency health value of the flash memory block based on the erase frequency of each flash memory block and a preset erase frequency limit.
Subtracting the preset erasing times limit from the erasing times of the flash memory block to obtain a third difference value; then, dividing the third difference value by a preset erasing frequency limit to obtain a second ratio; and multiplying the second ratio by a fourth preset health value to obtain an erasing time health value.
In a specific embodiment, the fourth predetermined health value is 100, and the erase count health value of each flash memory block can be calculated by using the following formula:
wherein H pe For erase count health value, PE current For the number of times of erasing of a flash block, PE max The erase time limit is preset by the user based on experience.
As can be seen from the above equation (1), if the erase count of the flash memory block is less than the preset erase count limit, the larger the erase count of the current flash memory block is, the smaller the erase count health value corresponding to the flash memory block is.
Step 33: and calculating the error correction digit health value of the flash memory block based on the maximum error correction digit, the preset error correction digit threshold value and the preset error correction digit limit of each flash memory block.
Judging whether the maximum error correction frequency of each flash memory block is smaller than a preset error correction bit number threshold value or not, wherein the maximum error correction bit number is the maximum error correction frequency corresponding to the flash memory block at present; if the maximum error correction times of the flash memory block is smaller than a preset error correction bit number threshold value, the error correction times health value of the flash memory block is a fifth preset health value; if the maximum error correction times of the flash memory block are greater than or equal to the preset error correction bit number threshold, the error correction times health value of the flash memory block is a sixth preset health value (preset error correction bit number limit-maximum error correction times of the flash memory block)/(preset error correction bit number limit-preset error correction bit number threshold).
In a specific embodiment, the fifth predetermined health value is 100, and the health value of the error correction bit of the flash memory block can be calculated by using the following formula:
wherein H ldpc For error correcting the health value of the bit, B current Maximum number of error correction bits of flash memory block, B max To preset limit of error correction bits, B th The error correction bit number threshold value can be set by a developer according to experience.
As can be seen from the above equation (2), if the maximum error correction bit number of the flash memory block is lower than the preset error correction bit number threshold, the flash memory block is completely healthy, and its health value is 100; if the maximum error correction bit number of the flash memory block is larger than or equal to the preset error correction bit number threshold, the larger the maximum error correction bit number of the current flash memory block is, the larger the probability of the error of the flash memory block is, and the smaller the healthy value of the error correction bit number corresponding to the flash memory block is.
Step 34: and carrying out weighted summation on the erasure number health value and the error correction bit health value of each flash memory block to obtain a flash memory health value.
The flash memory health value of a single flash memory block is represented by two parameters, wherein the erasing times of the flash memory block and the error correcting bit number of the ldpc of the flash memory block cannot accurately represent the health state of the flash memory block only by the erasing times, because the flash memory block with more erasing times has less bit turnover and better health state, the calculation formula of the flash memory health value of the single flash memory block is as follows:
H B(i) ＝θ 2 *H ldpc +(1-θ 2 )*H pe (3)
wherein H B(i) Flash health value, θ, for the ith flash block 2 The proportion of the error correction digit health value can be set by a user according to an empirical value.
Step 203: and judging whether the number of the currently available flash memory blocks is less than or equal to a first preset number.
In order to calculate the quantity health value corresponding to the quantity of the available flash memory blocks, the size relationship between the quantity of the current available flash memory blocks and a preset first preset quantity can be compared to determine whether the current available flash memory blocks are sufficient, wherein the first preset quantity is the quantity of the flash memory blocks required for maintaining the normal work of the solid state disk.
Step 204: and if the number of the currently available flash memory blocks is less than or equal to a first preset number, setting the number health value as a first preset health value.
If the number of the current available flash memory blocks is detected to be smaller than or equal to the first preset number, it is indicated that the number of the available flash memory blocks in the current solid state disk is not enough to support the solid state disk to continue to work normally, and at this time, if the solid state disk is operated, an error may occur, so that the number health value can be directly set as the first preset health value, and the first preset health value is a value with a smaller numerical value and is far smaller than the health value when the solid state disk can work normally.
Step 205: and if the number of the current available flash memory blocks is larger than the first preset number, calculating a number health value by using the number of the current available flash memory blocks, the first preset number and the total number of all flash memory blocks in the solid state disk.
If the number of the currently available flash memory blocks is detected to be greater than the first preset number, it indicates that the number of the currently available flash memory blocks in the solid state disk is still sufficient and can be used continuously, and at this time, the scheme shown in fig. 4 may be adopted to calculate the number health value, specifically including the following steps:
step 41: and subtracting the first preset quantity from the quantity of the currently available flash memory blocks to obtain a first difference value.
The first difference is the difference between the number of currently available flash blocks and a first preset number.
Step 42: and subtracting the first preset quantity from the total quantity to obtain a second difference value.
The second difference is a difference between the total number of all the flash memory blocks in the solid state disk and the first preset number, and the total number is the total number of all the flash memory blocks in the solid state disk in the initial state.
Step 43: and calculating the quantity health value by using the first difference value and the second difference value.
The first difference value and the second difference value can be divided to obtain a first ratio; and then multiplying the square of the first ratio by a second preset health value to obtain a quantitative health value.
In a specific embodiment, the first predetermined health value is 0, the second predetermined health value is 100, and the quantitative health value is calculated by using the following formula:
wherein N is least Is a first predetermined number, N avail For the number of currently available flash blocks, N total Is the total number of all flash blocks in the solid state disk.
Step 206: and judging whether the quantity health value is larger than a third preset health value or not.
After the quantitative health value is calculated, the quantitative health value may be compared with a third preset health value, which may be 0, that is preset.
Step 207: and if the number health value is greater than the third preset health value, performing weighted summation on the number health value and all flash memory health values to obtain the remaining life.
When the numerical health value is larger than a third preset health value, summing and averaging all the flash memory health values to obtain an average flash memory health value; and then carrying out weighted summation on the average flash memory health value and the quantity health value to obtain the remaining life.
Step 208: and if the number health value is less than or equal to a third preset health value, setting the residual life to be a preset value.
If the quantity health value is smaller than or equal to the third preset health value, the quantity of the current available flash memory blocks is insufficient, normal use cannot be maintained, the remaining life can be set to be a preset value, and the preset value can be set according to experience.
In a specific embodiment, the preset value is 0, and the remaining life of the solid state disk is calculated by using the following formula:
h represents the residual life of the solid state disk and can be represented by a value of 0-100, 0 represents the end of the life, the data safety cannot be guaranteed when the solid state disk is used continuously, and 100 represents the long life and can be used continuously; theta 1 The proportion of the health value of the flash memory is represented and can be set by a developer according to experience.
Step 209: and detecting whether the residual life is less than or equal to a preset life threshold value.
A threshold for comparison may be set: and presetting a life threshold so as to judge whether the life of the current solid state disk is about to be used up, namely comparing the magnitude relation between the residual life and the preset life threshold.
Step 210: and if the residual life is less than or equal to the preset life threshold, generating a reminding message to remind the solid state disk to migrate and/or copy the data stored in the solid state disk.
When the remaining life is lower than the preset life threshold, it indicates that the remaining life of the current solid state disk is insufficient, and at this time, a reminding message may be generated, so that the user knows that the life of the current solid state disk is insufficient after obtaining the reminding message, and needs to move or copy the data in the solid state disk in time, thereby preventing data loss when the life of the solid state disk is used up, such as: alarm information can be transmitted to the user through SMART information, and the user is prompted to backup data in time.
Compared with the prior art, the technical scheme adopted by the application not only considers the flash memory data writing amount or the erasing times of the flash memory blocks when predicting the service life of the solid state disk, but also adds the error correction bit number of the flash memory blocks and the number of the available flash memory blocks, estimates the residual service life of the solid state disk through the erasing times of the flash memory blocks, the error correction bit number of the flash memory blocks and the number of the current available flash memory blocks, and can calculate the residual service life of the solid state disk more accurately; if the solid state disk has a problem before the nominal service life is reached, the solid state disk can send an alarm in advance through SMART information, so that a user can conveniently transfer data, and the safety of data storage can be ensured; if the nominal service life is reached, but the solid state disk is still healthy, the solid state disk can be continuously used, and the cost is saved.
Referring to fig. 5, fig. 5 is a schematic structural diagram of an embodiment of a device for predicting the lifetime of a solid state disk provided in the present application, in which the device 50 for predicting the lifetime of a solid state disk includes a memory 51 and a processor 52 connected to each other, the memory 51 is used for storing a computer program, and the computer program is used for implementing the method for predicting the lifetime of a solid state disk in the foregoing embodiment when being executed by the processor 52.
Referring to fig. 6, fig. 6 is a schematic structural diagram of an embodiment of a computer-readable storage medium 60 provided in the present application, where the computer-readable storage medium 61 is used for storing a computer program 61, and when the computer program 61 is executed by a processor, the method for predicting the lifetime of a solid state disk in the foregoing embodiment is implemented.
The computer-readable storage medium 60 may be a server, a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and various media capable of storing program codes.
In the several embodiments provided in the present application, it should be understood that the disclosed method and apparatus may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of modules or units is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed.
Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each of the units may exist alone physically, or two or more units may be integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.
Claims (11)
1. A method for predicting the service life of a solid state disk is characterized by comprising the following steps:
acquiring health information of each flash memory block in the solid state disk and the number of current available flash memory blocks, wherein the available flash memory blocks are flash memory blocks used for storing data to be written;
calculating a corresponding flash memory health value by using the health information of each flash memory block, wherein the flash memory health value is the health value of the flash memory block;
judging whether the number of the available flash memory blocks is smaller than or equal to a first preset number or not, wherein the first preset number is the number of the flash memory blocks required for maintaining the normal work of the solid state disk; if yes, setting the number health value as a first preset health value; if not, calculating the quantity health value by using the quantity of the available flash memory blocks, the first preset quantity and the total quantity of all the flash memory blocks in the solid state disk;
judging whether the quantity health value is larger than a third preset health value or not; if yes, carrying out weighted summation on the number health value and all the flash memory health values to obtain the remaining life; and if not, setting the residual life as a preset value.
2. The method for predicting the life of a solid state disk according to claim 1, wherein the step of calculating the health value of the number by using the current number of the available flash memory blocks, the first preset number, and the total number of all flash memory blocks in the solid state disk comprises:
subtracting the first preset quantity from the quantity of the current available flash memory blocks to obtain a first difference value;
subtracting the total number from the first preset number to obtain a second difference value;
and calculating the quantity health value by using the first difference value and the second difference value.
3. The method for predicting the life of a solid state disk according to claim 2, wherein the step of calculating the health value by using the first difference and the second difference comprises:
dividing the first difference value and the second difference value to obtain a first ratio;
and multiplying the square of the first ratio by a second preset health value to obtain the quantitative health value.
4. The method for predicting the life of a solid state disk according to claim 1, wherein the step of performing weighted summation on the number health value and all the flash memory health values to obtain the remaining life comprises:
summing and averaging all the flash memory health values to obtain an average flash memory health value;
and carrying out weighted summation on the average flash memory health value and the quantity health value to obtain the remaining life.
5. The method for predicting the life of a solid state disk according to claim 1, wherein the health information includes erase times and error correction bits, and the step of calculating the corresponding flash health value using the health information of each flash block includes:
and calculating the flash memory health value of the corresponding flash memory block by using the erasing times and the error correction bits of each flash memory block.
6. The method for predicting the life of a solid state disk according to claim 5, wherein the step of calculating the flash health value of each flash block by using the number of times of erasing and the number of error correction bits of each flash block comprises:
acquiring the erasing times and error correction bits of each flash memory block;
calculating the erase frequency health value of each flash memory block based on the erase frequency of each flash memory block and a preset erase frequency limit;
calculating the error correction digit health value of each flash memory block based on the maximum error correction digit, a preset error correction digit threshold value and a preset error correction digit limit of each flash memory block;
and carrying out weighted summation on the erasure number health value of each flash memory block and the error correction digit health value to obtain the flash memory health value.
7. The method for predicting the life of a solid state disk according to claim 6, wherein the step of calculating the healthy value of the number of times of erasure of the flash memory block based on the number of times of erasure of each flash memory block and a preset number of times of erasure limit comprises:
subtracting the erasing times of the flash memory block from the preset erasing times limit to obtain a third difference value;
dividing the third difference value by the preset erasing time limit to obtain a second ratio;
and multiplying the second ratio by a fourth preset health value to obtain the health value of the erasing times.
8. The method for predicting the service life of the solid state disk according to claim 6, wherein the step of calculating the health value of the error correction bits of the flash memory blocks based on the maximum error correction bits of each flash memory block, a preset threshold value of the error correction bits and a preset limit of the error correction bits comprises:
judging whether the maximum error correction times of each flash memory block is smaller than the preset error correction bit number threshold value or not;
if so, the error correction frequency health value of the flash memory block is a fifth preset health value;
if not, the error correction frequency health value of the flash memory block is
；
Wherein c is a sixth preset health value,B max for the preset limit of the number of error correction bits,B current is the maximum number of error corrections of the flash block,B th and the preset error correction bit number threshold value is obtained.
9. The method for predicting the service life of the solid state disk according to claim 1, further comprising:
detecting whether the residual service life is less than or equal to a preset service life threshold value;
and if so, generating a reminding message to remind the solid state disk to migrate and/or copy the data stored in the solid state disk.
10. An apparatus for predicting the lifetime of a solid state disk, comprising a memory and a processor connected to each other, wherein the memory is used for storing a computer program, and the computer program is used for implementing the method for predicting the lifetime of a solid state disk according to any one of claims 1 to 9 when the computer program is executed by the processor.
11. A computer-readable storage medium for storing a computer program, wherein the computer program is configured to, when executed by a processor, implement the method for predicting the lifetime of a solid state disk according to any one of claims 1 to 9.
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| CN202110420734.5A CN113362879B (en) | 2021-04-19 | 2021-04-19 | Method and device for predicting service life of solid state disk and readable storage medium |
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| CN202110420734.5A CN113362879B (en) | 2021-04-19 | 2021-04-19 | Method and device for predicting service life of solid state disk and readable storage medium |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106297898A (en) * | 2015-06-03 | 2017-01-04 | 杭州海康威视数字技术股份有限公司 | The life-span method for early warning of a kind of NAND flash storage and device |
| CN106558346A (en) * | 2016-11-16 | 2017-04-05 | 杭州华澜微电子股份有限公司 | The method and device that a kind of solid-state disk service life based on RAIM frameworks is calculated |
| CN109918283A (en) * | 2019-03-20 | 2019-06-21 | 浪潮商用机器有限公司 | Solid state hard disk service life method for visualizing, device, electronic equipment and medium |
| WO2019160529A2 (en) * | 2018-01-31 | 2019-08-22 | Hewlett-Packard Development Company, L.P. | Hard disk drive lifetime forecasting |
| CN112256193A (en) * | 2020-09-16 | 2021-01-22 | 浙江大华存储科技有限公司 | Method, device and storage medium for improving data security of solid state disk |
-
2021
- 2021-04-19 CN CN202110420734.5A patent/CN113362879B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106297898A (en) * | 2015-06-03 | 2017-01-04 | 杭州海康威视数字技术股份有限公司 | The life-span method for early warning of a kind of NAND flash storage and device |
| CN106558346A (en) * | 2016-11-16 | 2017-04-05 | 杭州华澜微电子股份有限公司 | The method and device that a kind of solid-state disk service life based on RAIM frameworks is calculated |
| WO2019160529A2 (en) * | 2018-01-31 | 2019-08-22 | Hewlett-Packard Development Company, L.P. | Hard disk drive lifetime forecasting |
| CN109918283A (en) * | 2019-03-20 | 2019-06-21 | 浪潮商用机器有限公司 | Solid state hard disk service life method for visualizing, device, electronic equipment and medium |
| CN112256193A (en) * | 2020-09-16 | 2021-01-22 | 浙江大华存储科技有限公司 | Method, device and storage medium for improving data security of solid state disk |
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