CN113358744A

CN113358744A - Array type ultrasonic probe device for detecting transverse defects of large-diameter steel pipe

Info

Publication number: CN113358744A
Application number: CN202110520714.5A
Authority: CN
Inventors: 陈桂; 李进; 李文东; 段贤勇; 朱才顺; 谢冬民
Original assignee: Yangzhou Chengde Steel Pipe Co Ltd
Current assignee: Yangzhou Chengde Steel Pipe Co Ltd
Priority date: 2021-05-13
Filing date: 2021-05-13
Publication date: 2021-09-07
Anticipated expiration: 2041-05-13
Also published as: CN113358744B

Abstract

An array type ultrasonic probe device for detecting transverse defects of a large-diameter steel pipe relates to the technical field of steel pipe detection. The array type ultrasonic probe comprises a probe frame, wherein the bottom of the probe frame is connected with two groups of array type ultrasonic probes, the two groups of array type ultrasonic probes are arranged on the two sides of the bottom of the probe frame in a left-right mode, each group of array type ultrasonic probes are composed of multiple rows of wafers, each row of wafers form a surface, and sound fields with different acoustic characteristics are obtained by changing the combined use quantity and the recycling quantity of each row of probe wafers. The flexible and changeable combined application of the array type ultrasonic probe solves the problem of insufficient coverage rate of conventional ultrasonic transverse defect detection of large-caliber steel pipes, simultaneously greatly increases the application range of the probe, and can obtain sound fields with different characteristics by changing the combined number of wafers to realize the detection of the steel pipes with the wall thickness of 10-130 mm.

Description

Array type ultrasonic probe device for detecting transverse defects of large-diameter steel pipe

Technical Field

The invention relates to the technical field of steel pipe detection, in particular to an array type ultrasonic probe device for detecting transverse defects of a large-diameter steel pipe.

Background

Along with the development of the social manufacturing level, the large-caliber pressure-bearing steel pipes are more and more widely applied, the use scene is more and more important, the product detection requirements are higher and higher, and the steel pipe product detection items are more and more.

The method is limited by the factors of multiple steel pipe product specifications and large detected surface, and the existing detection modes have more or less limitations, such as: the detection efficiency is low, the detection precision is poor, the application range of the detection device or method is small, and the like, and particularly, the detection of the transverse defects is more prominent, and the following detection schemes of the common steel pipes are listed:

1) manual detection

Manual detection generally adopts a direct contact mode handheld probe to scan a workpiece, so that the effective scanning range is small, the detection efficiency is low, the detected area of a large-caliber steel pipe is large, and the requirement of efficient batch product detection cannot be met.

2) Water immersion type multi-probe scheme

The probe does not directly contact the steel pipe to be detected, ultrasonic wave propagation can enter the steel pipe through a water layer, the coupling effect is good, the long-distance propagation is beneficial to the diffusion of a sound field, and the coverage of the sound field is increased. However, a large water tank is needed when the steel pipe, the probe and the driving device are immersed in water, when the steel pipe with the outer diameter larger than 1m is detected, the required water tank mechanism is huge, water replenishing, water changing and steel pipe hoisting are inconvenient, the working efficiency is low, and the rotation of the steel pipe during detection can cause huge fluctuation of water in the water tank, so that the implementation of ultrasonic detection is not facilitated.

3) Contact type multi-probe scheme

The contact type flaw detection is undoubtedly the best choice for detecting steel pipes with larger calibers, particularly steel pipes with the outer diameter of more than one meter, but when the detection is carried out, ultrasonic wave is transmitted from a probe wedge block to the steel pipe, the transmission path is short, the sound field diffusion utilization rate is not high, the coverage rate of a sound field with multiple longitudinally arranged probes is low, the detection effect is poor, and the detection omission is easily caused.

Fig. 10 shows that the wafers 39 are circumferentially arranged and aligned with the defect 40, so that a good sound field coverage can be obtained, the combined sound field is relatively stable, the defect 40 is easily caught, but due to the influence of the appearance shape of the pipe, the probe made of the flexible acoustic material which can meet the requirement of ultrasonic detection is not available at present, and the rigid probe cannot be circumferentially arranged and attached to various outer diameter specifications. Fig. 11 shows that the wafer 39 is axially arranged and aligned with the defect 40, the sound field overlap region is small, the combined sound field is unstable, and the axial moving distance of the probe relative to the defect is shorter when the spiral track scanning is performed to ensure the detection efficiency along with the increase of the detection outer diameter, so that the highest echo position of the defect 40 is difficult to capture, and the detection is missed.

Disclosure of Invention

The invention aims to provide an array type ultrasonic probe device for detecting transverse defects of a large-diameter steel pipe and a wafer combination mode, which can effectively solve the problems in the background technology.

The technical scheme for realizing the purpose is as follows: the utility model provides a large-diameter steel pipe transverse defect detects uses array ultrasonic transducer device which characterized in that: the array type ultrasonic probe comprises a probe frame, wherein the bottom of the probe frame is connected with two groups of array type ultrasonic probes, the two groups of array type ultrasonic probes are arranged on the two sides of the bottom of the probe frame in a left-right mode, each group of array type ultrasonic probes are composed of multiple rows of wafers, each row of wafers form a surface, and sound fields with different acoustic characteristics are obtained by changing the combined use quantity and the recycling quantity of each row of probe wafers.

Furthermore, each group of array ultrasonic probes comprises three rows of wafers, namely an A row of wafers, a B row of wafers and a C row of wafers, wherein the projection surfaces of the three rows of wafers in each group of array ultrasonic probes are distributed in a shape like a Chinese character 'pin', the A row of wafers and the C row of wafers are arranged in the same row, the B row of wafers are arranged at the outer sides of the A row of wafers and the C row of wafers, and the planes of the A row of wafers, the B row of wafers and the C row of wafers and the long axis of the steel pipe are arranged in an inclined angle;

the inclination directions and the arrangement sequence of the three rows of wafers of the two groups of array ultrasonic probes are opposite;

the row A wafers consist of ten wafers which are arranged in sequence, namely A1, A2, A3, A4, A5, A6, A7, A8, A9 and A10, the row B wafers consist of twelve wafers which are arranged in sequence, namely B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11 and B12, and the row C wafers consist of ten wafers which are arranged in sequence, namely C1, C2, C3, C4, C5, C6, C7, C8, C9 and C10;

the A10 wafer in the row A and the projection surface of the B1 wafer in the row B are attached side by side, and the B12 wafer in the row B and the projection surface of the C1 wafer in the row C are attached side by side in each group of array type ultrasonic probes.

Furthermore, the probe frame comprises a rotating frame which is longitudinally arranged, the rotating frame is Jiong-shaped, the center of the upper end of the rotating frame is connected with a rotator, two ends of the bottom of the rotating frame are respectively connected with elastic supports, an outer frame is connected between the elastic supports, probe seats are respectively installed on two sides in the outer frame, the array ultrasonic probes are respectively installed in the probe seats on the corresponding sides, inner frames which are oppositely arranged are arranged in the middle of the outer frame, a centering wheel seat is connected between the inner frames, the bottom end of the centering wheel seat is connected with a centering wheel, and the centering wheel and the array ultrasonic probes on the two sides form a cambered surface which is attached to the detected steel pipe during detection;

the lower end of the probe seat extends out of the outer frame downwards, the lower end of the probe seat is provided with a frame-shaped wear-resistant boot in a matching mode, and the array type ultrasonic probe extends into the wear-resistant boot;

the transverse section of the probe seat is rectangular, a water injection hole penetrating through the probe seat is formed in the side wall of the probe seat, and a connector communicated with the water injection hole is arranged at the top end of the probe seat;

the lower terminal surface of wear-resisting boots sets up to the identical arc with the steel pipe surface, the both ends of wear-resisting boots are provided with the draw-in groove, and the both ends of probe seat have been connected with the spring respectively and have been hung, and the spring has been hung including two supports of fixed connection respectively at probe seat both ends, corresponds respectively on the support to articulate and has the jack catch, is connected with the spring between jack catch and the support, and the lower extreme of jack catch is provided with the trip and blocks under the effect of spring and put in the draw-in groove that the wear-resisting boots correspond the side.

Furthermore, the elastic support comprises two groups of steel plate spring pieces which are symmetrically arranged up and down, each group of steel plate spring pieces comprises two long spring pieces, a middle spring piece and a short spring piece which are sequentially stacked on the two long spring pieces, the short spring pieces of the two groups of steel plate spring pieces are arranged in a back-to-back manner, a square seat fixedly connected with the rotating frame is arranged between the middle parts of the two groups of steel plate spring pieces, the square seat is fixedly connected with the upper and lower two groups of spring steel plate pieces through bolts, the four corners of the outer frame are respectively connected with square blocks, and the square blocks at the four corners of the outer frame are respectively and correspondingly connected between the two ends of the long spring pieces of the two elastic support;

the two ends of the probe seat are rotatably installed in the outer frames of the corresponding sides through the fan-shaped plates, the large arc surfaces of the fan-shaped plates at the two ends of the probe seat are respectively provided with meshing teeth, and the inner frames of the front side and the rear side are respectively connected with racks which are meshed with the meshing teeth on the fan-shaped plates at the two ends of the probe seat in a one-to-one correspondence mode.

Further, the rotator comprises a rotator upper cover, a rotator lower cover and a rotator cone which is rotatably arranged between the rotator upper cover and the rotator lower cover, the rotator cone comprises an upper cone with an upward small-opening end and a lower cone with a downward small-opening end, and the lower end of the rotator cone extends out of the rotator lower cover and is connected with the rotating frame;

the rotating frame is provided with a limiting hole, the rotating frame is connected with the rotator cone through a limiting bolt, the diameter of the limiting hole is larger than the diameter of a screw of the limiting bolt, and the screw end of the limiting bolt vertically penetrates upwards through the limiting hole and then is in threaded connection with the rotator cone.

Further, the wall thickness of the detected steel pipe is 10-20mm, and the combination modes of the two groups of array ultrasonic probes are the same, namely: a1, A2, A3 combination is a first group, A3 combination is a second group, A3 combination is a third group, A3 combination is a fourth group, A3 combination is a fifth group, B3 combination is a sixth group, B3 combination is a seventh group, B3 combination is an eighth group, B3 combination is a ninth group, B3 combination is a tenth group, C3 and C3 are a sixteenth group, each group of wafers of the two groups of array ultrasonic probes respectively corresponds to one simulation channel, and the first to sixteenth groups of wafers of the two groups of array ultrasonic probes are sequentially and synchronously triggered in a circulating manner during the defect detection of the steel pipe.

Further, the wall thickness of the steel pipe is 20-40mm, and the wafer combination modes of the two groups of array ultrasonic probes are the same, and are respectively as follows: a1, A2, A3 and A4 are combined into a first group, A4 and A4 are combined into a second group, A4 and A4 are combined into a third group, A4 and A4 are combined into a fourth group, B4 and B4 are combined into a fifth group, B4 and B4 are combined into a sixth group, B4 and B4 are combined into a seventh group, B4 and B4 are combined into an eighth group, C4 and C4 are combined into a ninth group, C4 and C4 are combined into a tenth group, C4 and C4 are combined into a twelfth group, and a synchronous ultrasonic probe pair is used for detecting the defect of the first, second, the first, second, the second and twelfth, third and twelfth groups are respectively used for detecting the ultrasonic probe pairs of the ultrasonic wave synchronous probe.

Further, the wall thickness of the detected steel pipe is 40-60mm, and the combination modes of the two groups of array ultrasonic probes are the same, namely: a1, A2, A3, A4 and A5 are combined into a first group, A4, A5, A6, A7 and A8 are combined into a second group, A7, A8, A9 and A10 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B6, B7, B8, B9 and B10 are combined into a fifth group, B8, B9, B10, B11 and B12 are combined into a sixth group, C3, C4, C5, C6 and C7 are combined into a seventh group, C6, C7, C8, C9 and C10 are combined into an eighth group, the two groups of array type ultrasonic probe wafer groups respectively correspond to one analog channel, and the two groups of array type ultrasonic probe groups are sequentially triggered when a first wafer group and an eighth wafer group are synchronously tested.

Further, the wall thickness of the detected steel pipe is 60-90mm, and the combination modes of the two groups of array ultrasonic probes are the same, namely: a1, a2, A3, A4, A5 and A6 are combined into a first group, A4, A5, A6, A7, A8 and a9 are combined into a second group, B1, B2, B3, B4, B5 and B6 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B7, B8, B9, B10 and B11 are combined into a fifth group, C1, C2, C3, C4, C5 and C6 are combined into a sixth group, C4, C5, C6, C7, C8 and C9 are combined into a seventh group, C5, C6, C7, C8, C9 and C10 are combined into a first group, a second group, a third group, a fourth group, a fifth, a fourth group, a third, a fourth group, a third and a fourth group, a third group, a fourth group;

further, the wall thickness of the detected steel pipe is 90-130mm, and the combination modes of the two groups of array type ultrasonic probes are the same, namely: a1, A2 and A2 are combined into a first group, A2 and A2 are combined into a second group, B2 and B2 are combined into a third group, B2, C2 and C2 are combined into a fifth group, C2 and a sixth group, and the first group and the second group are respectively used for detecting the defects of the ultrasonic array type ultrasonic probe array type wafer.

The invention has the beneficial effects that:

1) the contact type self-adaptive probe frame has a large detection range and can detect a large-caliber pipe with the outer diameter of 219-1800 mm.

2) The application of the probe frame rotator and the spring piece can ensure that the probe frame does small-range up-and-down fluctuation and horizontal swing along with the contact surface, avoid the influence of local unevenness of the surface of the steel pipe on detection, and greatly enhance the coupling reliability of the detection device.

3) The quick-replaceable wear-resistant boots can ensure the coupling effect of steel pipes with different outer diameters, prolong the service life of the probe and increase the convenience of operation.

4) The width is swept to 60 mm's probe group, and a sweep is looked into and can be swept and examined horizontal defect in two different incident directions in the front, back, promotes detection efficiency greatly.

5) The flexible and changeable combined application of the array type ultrasonic probe solves the problem of insufficient coverage rate of conventional ultrasonic transverse defect detection of large-caliber steel pipes, simultaneously greatly increases the application range of the probe, and can obtain sound fields with different characteristics by changing the combined number of wafers so as to realize the detection of the steel pipes with the wall thickness of 10-130 mm.

Drawings

FIG. 1 is a front view of the present invention;

FIG. 2 is a left side view of FIG. 1;

FIG. 3 is a top view of FIG. 1;

FIG. 4 is a schematic view of the connection structure of the spring-loaded hanger and the wear shoe;

FIG. 5 is a projection view of two sets of array ultrasonic probe chips;

FIG. 6 is a perspective view of two sets of array ultrasonic probes;

FIG. 7 is a schematic view of the working state of the present invention;

FIG. 8 is a schematic view of a steel pipe cut in accordance with an exemplary embodiment;

FIG. 9 is a schematic structural view of a steel pipe cut in application example two;

FIG. 10 is a schematic diagram of a simulated sound field of circumferentially arranged probes;

FIG. 11 is a schematic view of a simulated sound field of axially arranged probes;

FIG. 12 is a schematic diagram of a simulated sound field of the probe of the present invention;

FIG. 13 is a diagram of an example of an interface of working method III;

FIG. 14 is a diagram of a second operation mode interface V according to an embodiment of the present invention;

in FIG. 15, reference character a is a diagram showing the positional relationship between the wafer and the steel pipe on one side in the comparative example, and reference character b is a front view showing the positional relationship between the wafer and the steel pipe on the other side;

FIG. 16 is a diagram of a defect detection interface of the comparative example.

Detailed Description

First, the structure of the invention

As shown in fig. 1-6, the invention discloses an array type ultrasonic probe device for detecting transverse defects of a large-caliber steel pipe, which comprises a probe frame 1, wherein the probe frame 1 comprises a rotating frame 2 which is longitudinally arranged, the rotating frame 2 is Jiong-shaped, two ends of the bottom of the rotating frame 2 are respectively connected with an elastic support 4 which is transversely arranged, the elastic support 4 comprises two groups of steel plate spring pieces 21 which are transversely arranged and are symmetrically arranged up and down, each group of steel plate spring pieces 21 comprises two long spring pieces 22, a middle spring piece 23 and a short spring piece 24 which are sequentially stacked on the two long spring pieces 22 in parallel, the middle spring piece 23 is stacked in the middle of the corresponding long spring piece 22, the short spring piece 24 is stacked in the middle of the corresponding middle spring piece 23, the short spring pieces 24 of the two groups of steel plate spring pieces 21 are arranged oppositely, a square seat 25 is arranged between the middle parts of the two groups of steel plate spring pieces 21, the square seat 25 is connected with the upper and lower groups of steel plate spring pieces 21 through bolts, the two elastic supports 4 are connected with the rotating frame 2 through a square seat 25.

An outer frame 7 is connected between the elastic supports 4, square blocks 35 are respectively connected to four corners of the outer frame 7, and the square blocks 35 at the four corners of the outer frame 7 are respectively connected between the long spring pieces 22 at two ends of the two elastic supports 4 through bolts.

The two sides in the outer frame 7 are respectively provided with a probe seat 9, the probe seats 9 are respectively provided with an array type ultrasonic probe 10, the middle part in the outer frame 7 is provided with two inner frames 5 which are oppositely arranged, a centering wheel seat 13 is connected between the two inner frames 5, the bottom end of the centering wheel seat 13 is connected with a centering wheel 14, and the centering wheel 14 and the array type ultrasonic probes 10 on the two sides form a cambered surface which is attached to a detected steel pipe during detection.

The front end and the rear end of the probe seat 9 are respectively fixedly connected with sector plates 11, the outer end faces of the sector plates 11 at the two ends of the probe seat 9 are respectively connected with a rotating shaft 8, the probe seat 9 is rotatably installed in an outer frame 7 through the rotating shafts 8 on the sector plates 11 at the two ends, meshing teeth are arranged on the large arc faces of the sector plates 11, and racks 6 which are in one-to-one correspondence with the sector plates 11 at the two ends of the probe seat 9 at the two sides and are meshed with the meshing teeth on the sector plates 11 are respectively connected onto the inner frame 5 at the front side and the rear side.

Probe seat 9 stretches out frame 7 downwards respectively, the lower extreme cooperation of probe seat 9 is provided with the wear-resisting boots 15 of frame type, the transverse section of probe seat 9 is the rectangle, inboard inside protruding wear-resisting boots 15 all around of probe seat 9, be provided with the water injection hole 47 that runs through probe seat 9 on the inboard protruding wear-resisting boots 15's of probe seat 9 the lateral wall, the top of probe seat 9 is provided with the connector 48 with water injection hole 47 intercommunication, required coupling water is imported through connector 48 when the steel pipe detects, spout by water injection hole 47 again on the steel pipe that detects, water injection hole 47 can set up a plurality ofly as required.

The bottom end of the probe 10 extends into the wear-resistant shoe 15 and forms a gap of 0.5-1mm with the bottom surface of the wear-resistant shoe 15, so that the probe 10 is prevented from being in direct contact with a steel pipe, and a thin water layer required by coupling can be formed between the probe 10 and the detected steel pipe.

The lower end face of the wear-resistant shoe 15 is in an arc shape matched with the surface of a steel pipe, clamping grooves 16 are formed in two ends of the wear-resistant shoe 15, springs are connected to two ends of the probe seat 9 respectively, the springs comprise two supporting seats 30 fixedly connected to two ends of the probe seat 9 respectively, clamping jaws 31 are correspondingly hinged to the supporting seats 30 respectively, the middle of each clamping jaw 31 is hinged to the outer end of each supporting seat 3, a spring 32 is connected between each clamping jaw 31 and each supporting seat 30, and a clamping hook is arranged at the lower end of each clamping jaw 31 and clamped in the clamping groove 16 at the corresponding end of the wear-resistant shoe 15 under the action of the spring 32.

When the wear-resistant shoe 15 needs to be replaced, the claws 31 on the two sides are only required to be rotated, the claws 31 pull the springs 32, the hooks of the claws 31 are separated from the clamping grooves 16, and the wear-resistant shoe 15 can be taken down.

The upper end center position of the rotating frame 2 is connected with a rotator 17, the rotator 17 comprises a rotator upper cover 18, a rotator lower cover 19 and a rotator cone 20 which is rotatably arranged between the rotator upper cover 18 and the rotator lower cover 19, the rotator upper cover 18 and the rotator lower cover 19 are connected through bolts, the rotator cone 20 comprises an upper cone with a small opening end upward and a lower cone with a small opening end downward, the lower end of the rotator cone 20 extends out of the rotator lower cover 19 and is connected through a limit bolt 33, the rotary frame 2 is provided with a limiting hole, the diameter of the limiting hole is twice of the diameter of a screw of a limiting bolt, the screw end of the limiting bolt 33 vertically penetrates the limiting hole upwards and then is in threaded connection with a rotator cone, the rotary frame 2 can rotate in a small angle, the influence caused by the local straightness accuracy deviation of a steel pipe is effectively avoided, and the coupling effect of the probe 10 is guaranteed.

And the elastic support 4 can form a certain range of up-and-down moving space when local unevenness occurs on the surface of the detected steel pipe, so that the probe frame is kept attached to the surface of the steel pipe.

As shown in fig. 5 and 6, each group of array ultrasonic probes 10 includes three rows of wafers arranged in parallel, each row of wafers constitutes a surface, and the three rows of wafers are respectively an a row of wafers 10.1, a B row of wafers 10.2 and a C row of wafers 10.3, the projection surfaces of the three rows of wafers in each group of array ultrasonic probes 10 are distributed in a delta shape, wherein the a row of wafers 10.1 and the C row of wafers 10.3 are arranged in the same row, the B row of wafers 10.2 are arranged on the sides of the a row of wafers 10.1 and the C row of wafers 10.3, the a row of wafers 10.1, the B row of wafers 10.2 and the C row of wafers 10.3 are arranged in an inclined manner relative to the axial direction of the steel pipe during the defect detection of the steel pipe, and the inclined angle is 37-38 °.

The inclination directions and the arrangement sequences of the three rows of wafers of the two groups of array ultrasonic probes 10 are opposite, so that the scanning directions of the two groups of array ultrasonic probes 10 during defect detection are opposite.

The row A wafers 10.1 are composed of ten wafers of A1, A2, A3, A4, A5, A6, A7, A8, A9 and A10 which are arranged in sequence, the row B wafers are composed of twelve wafers of B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11 and B12 which are arranged in sequence, the row C wafers are composed of ten wafers of C1, C2, C3, C4, C5, C6, C7, C8, C9 and C10 which are arranged in sequence, the A10 wafers in the row A and the B1 wafers in the row B are arranged side by side, and the B12 wafers in the row B and the C1 wafers in the row C are arranged side by side.

Each wafer in row A, B and C has a length of 12mm and a width of 2 mm.

As shown in FIG. 7, when the present invention works, the probe device is driven to be supported downwards on the steel tube 37 by the corresponding mechanical driving device 36, and the probe seats 9 on both sides drive the detection end of the probe 10 to be attached to the steel tube 37 under the action of gravity.

During detection, a spiral scanning track needs to be formed, and two driving modes can be adopted: 1) a driving wheel 38 is adopted to drive the steel pipe to rotate in situ, and meanwhile, a driving mechanism 36 is adopted to drive the probe device 35 to move axially along the steel pipe 37; 2) the probe device 35 is fixed and adopts an oblique wheel as a driving wheel to drive the steel pipe 37 to carry out spiral feeding for scanning.

The probe device of the invention can obtain the sound field characteristics of wafers with different sizes by simulating a plurality of wafers into one wafer for use, and can increase the coverage of the wafers by the repeated use of the wafers to obtain a sound field with stable characteristics, as shown in figure 12, by adopting the simulated sound field of the array type scanning probe 10 disclosed by the invention, the coverage rate of the sound field obtained by changing the overlapped use number of the wafers is far higher than the sound field axially arranged by the traditional probe, and the sound field characteristics are stable, when the probe passes through a defect, any part of a probe group can obtain the accurate highest echo when passing through the defect.

The invention divides the working modes of the wafer into five types of I, II, III, IV and V according to the optimal detection effect of the steel pipes with different wall thicknesses, and can detect the steel pipes with the wall thicknesses of 10-130mm, wherein the working modes are respectively as follows:

i, the wall thickness of the detected steel pipe is 10-20mm, and the combination modes of the wafers of the two groups of array ultrasonic probes are the same, namely: a1, A2, A3 combination is a first group, A3 combination is a second group, A3 combination is a third group, A3 combination is a fourth group, A3 combination is a fifth group, B3 combination is a sixth group, B3 combination is a seventh group, B3 combination is an eighth group, B3 combination is a ninth group, B3 combination is a tenth group, C3 and C3 are a sixteenth group, each group of wafers of the two groups of array ultrasonic probes respectively corresponds to one simulation channel, and the first to sixteenth groups of wafers of the two groups of array ultrasonic probes are sequentially and synchronously triggered in a circulating manner during the defect detection of the steel pipe.

II, the wall thickness of the steel pipe is 20-40mm, and the wafer combination modes of the two groups of array ultrasonic probes are the same and respectively as follows: a1, A2, A3 and A4 are combined into a first group, A4 and A4 are combined into a second group, A4 and A4 are combined into a third group, A4 and A4 are combined into a fourth group, B4 and B4 are combined into a fifth group, B4 and B4 are combined into a sixth group, B4 and B4 are combined into a seventh group, B4 and B4 are combined into an eighth group, C4 and C4 are combined into a ninth group, C4 and C4 are combined into a tenth group, C4 and C4 are combined into a twelfth group, and a synchronous ultrasonic probe pair is used for detecting the defect of the first, second, the first, second, the second and twelfth, third and twelfth groups are respectively used for detecting the ultrasonic probe pairs of the ultrasonic wave synchronous probe.

III, the wall thickness of the detected steel pipe is 40-60mm, and the combination modes of the wafers of the two groups of array ultrasonic probes are the same, namely: a1, A2, A3, A4 and A5 are combined into a first group, A4, A5, A6, A7 and A8 are combined into a second group, A7, A8, A9 and A10 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B6, B7, B8, B9 and B10 are combined into a fifth group, B8, B9, B10, B11 and B12 are combined into a sixth group, C3, C4, C5, C6 and C7 are combined into a seventh group, C6, C7, C8, C9 and C10 are combined into an eighth group, the two groups of array type ultrasonic probe wafer groups respectively correspond to one analog channel, and the two groups of array type ultrasonic probe groups are sequentially triggered when a first wafer group and an eighth wafer group are synchronously tested.

IV, the wall thickness of the detected steel pipe is 60-90mm, and the combination modes of the two groups of array ultrasonic probes are the same and respectively as follows: a1, A2, A3, A4, A5 and A6 are combined into a first group, A4, A5, A6, A7, A8 and A9 are combined into a second group, B1, B2, B3, B4, B5 and B6 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B7, B8, B9, B10 and B11 are combined into a fifth group, C1, C2, C3, C4, C5 and C6 are combined into a sixth group, C4, C5, C6, C7, C8 and C9 are combined into a seventh group, C5, C6, C7, C8, C9 and C10 are combined into a first group, and an eighth group, and an ultrasonic probe array type is used for detecting defects of wafers in sequence when the first group, the second group, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third.

V, the wall thickness of the detected steel pipe is 90-130mm, and the wafer combination modes of the two groups of array ultrasonic probes are the same and respectively as follows: a1, A2 and A2 are combined into a first group, A2 and A2 are combined into a second group, B2 and B2 are combined into a third group, B2, C2 and C2 are combined into a fifth group, C2 and a sixth group, and the first group and the second group are respectively used for detecting the defects of the ultrasonic array type ultrasonic probe array type wafer.

Second, the application of the invention

Application example one:

and (3) carrying out transverse defect detection on a steel pipe which is made of X80 and has an outer diameter of 1422mm and a wall thickness of 40.8mm according to EN10246-6 standard requirements.

The detection steps are as follows:

1) as shown in fig. 8, a first test steel pipe 41 with a length of 800mm is sawed, and an artificial rectangular groove 42 is respectively processed on the inner wall and the outer wall of the steel pipe 41 in the first test, wherein the length of the rectangular groove 42 is 50mm, the width of the rectangular groove is 0.5mm, and the depth of the rectangular groove is 1.5 mm.

2) The wear-resistant boots of the probe with the inner arc of 1422mm are replaced, and the mechanical device is adjusted to enable the probe to tightly wrap the first detection steel pipe 41.

3) The two groups of array ultrasonic probes are connected with a host of an ultrasonic flaw detector, wafers of the two groups of array ultrasonic probes adopt a III combination mode, namely the combination quantity of each group of array ultrasonic probes is 8 groups of wafers, the two groups of probes are 16 groups of wafers, the number of simulation channels of the ultrasonic flaw detector is consistent with that of the two groups of array ultrasonic probes, each group of wafers corresponds to one channel, the wafers of the two groups of array ultrasonic probes are sequentially synchronously and circularly triggered in sequence from the first to the eighth order to obtain a 16-channel A scanning display interface shown in figure 13, a mark a is an initial wave, a mark b is a steel pipe inner wall artificial defect reflected wave, a mark c is an inner wall defect alarm gate, a mark d is a steel pipe outer wall artificial defect reflected wave, and a mark e is an outer wall defect alarm gate.

4) The probe device is arranged above the inner wall artificial defect, the position of the probe is finely adjusted, the highest wave of the inner wall artificial defect is captured by a first channel at the upper left corner shown in figure 13, the sensitivity of the channel is adjusted to enable the highest defect echo to reach 80% of the full screen height to be used as a reference wave amplitude, an inner wall defect alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one according to the adjusting method of the first channel at the upper left corner, then the steel pipe is scanned according to spiral tracks by adopting different screw pitches, the highest wave amplitude of the inner wall defect under different screw pitches is recorded, and if the artificial defect is captured by.

5) Then, the probe device is placed above the outer wall artificial defect, the position of the probe is finely adjusted, the first channel at the upper left corner shown in fig. 13 captures the highest wave of the outer wall artificial defect, the sensitivity of the channel is adjusted to enable the echo of the highest defect to reach 60% of the full screen height to be used as a reference wave amplitude, an outer wall defect alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one, the steel pipe is continuously scanned according to spiral tracks by adopting different screw pitches, the highest wave amplitudes of the outer wall defects under different screw pitches are recorded, and if the artificial defects are captured by a plurality of channels, the highest wave is counted.

6) According to the wave amplitude values recorded in table 1, the maximum difference from the basic wave amplitude is taken according to the formula:

the error of the defect echo between the defect echo and the reference wave is calculated, and the specific result is shown in table 1.

Application example two:

for a steel pipe made of P91, with an outer diameter of 863mm and a wall thickness of 120mm, the steel pipe is treated according to ASME SA335/SA335M

The standard requires that lateral defect detection be implemented.

The detection steps are as follows:

1) as shown in fig. 9, a second test steel pipe 43 with a length of 800mm is sawed, and artificial rectangular grooves 44 are respectively processed on the inner wall and the outer wall of the second test steel pipe 43, wherein the length of the rectangular groove 44 is 25mm, the width is 0.5mm, and the depth is 1.5 mm.

2) The abrasion-resistant boots of the probe with the inner arc of 863mm are replaced, and the mechanical device is adjusted to enable the probe to tightly wrap the second detection steel pipe 44.

3) The two groups of array ultrasonic probe wafers adopt a V-type combination mode, namely the combination quantity of each group of array ultrasonic probe is 6 wafers, the two groups of array ultrasonic probes are 12 wafers, the number of simulation channels of the ultrasonic flaw detector is consistent with that of the wafer groups of the two groups of probes, each group of probes corresponds to one channel, and the wafers of the two groups of probes are sequentially synchronously and circularly triggered according to the sequence from the first to the eighth, so that a 12-channel A scanning display interface shown in the figure is obtained.

4) The probe device 35 is placed above the inner wall artificial defect, the position of the probe is finely adjusted, the highest wave of the inner wall artificial defect is captured by the first channel at the upper left corner shown in fig. 14, the sensitivity of the channel is adjusted, the echo of the highest defect reaches 80% of the full screen height to be used as a reference wave amplitude, the alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one according to the adjusting method of the first channel at the upper left corner, then the steel pipe is scanned according to spiral tracks by adopting different screw pitches, the highest wave amplitude of the inner wall defect under different screw pitches is recorded, and if the artificial defect is captured by a plurality of channels, the highest wave is counted.

5) Then, the probe device is placed above the outer wall artificial defect, the position of the probe is finely adjusted, the first channel at the upper left corner shown in fig. 14 captures the highest wave of the outer wall artificial defect, the sensitivity of the channel is adjusted to enable the echo of the highest defect to reach 60% of the full screen height to serve as a reference wave amplitude, the alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one, the steel pipe is scanned according to spiral tracks by continuously adopting different screw pitches, the highest wave amplitude of the outer wall defect under different screw pitches is recorded, and if the artificial defects captured by a plurality of channels are counted by the highest wave.

6) According to the wave amplitude recorded in table 2, the maximum difference from the basic wave amplitude is taken according to the formula:

the error of the defect echo between the defect echo and the reference wave is calculated, and the specific result is shown in table 2.

Similarly, according to the arrangement of the first and second application examples, the steel pipes with the wall thickness range of 10-20mm, the wall thickness range of 20-40mm and the wall thickness of 60-90mm are respectively selected for defect detection, and the obtained test data is basically consistent with that of the first and second application examples, so that the description is omitted.

Comparative example:

and adopting a traditional contact type multi-probe scheme to carry out transverse defect detection on a third detection steel pipe 45 which is made of X80, has an outer diameter of 1422mm and a wall thickness of 40.8mm according to EN10246-6 standard requirements.

The comparative example takes the following detection process parameters as an example:

as shown in fig. 15, two groups of 8 large wafers 46 are used, and the scanning directions of the two groups of wafers are opposite, which is consistent with the frequency and refraction angle of the ultrasonic probe used in the first application example, and the wafer arrangement mode and the coverage width are close to each other. The ultrasonic flaw detector adopts a conventional 16-channel ultrasonic instrument, 1 wafer is independently triggered in each channel, and the wafers of the two groups of probes are sequentially and circularly triggered according to the sequence from 1 to 8.

The detection steps are as follows:

1) according to the step of the example I, the probe device is placed above the inner wall artificial defect, the position of the probe is finely adjusted, the first channel at the upper left corner shown in the figure 16 captures the highest wave of the inner wall artificial defect, the sensitivity of the channel is adjusted to enable the echo of the highest defect to reach 80% of the full screen height to serve as a reference wave amplitude, the alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one, then the steel pipe is scanned according to spiral tracks by adopting different screw pitches, the highest wave amplitude of the inner wall defect under different screw pitches is recorded, and if the artificial defect is captured by a plurality of channels, the highest wave is counted.

2) Then, the probe device is placed above the artificial defect of the outer wall, the position of the probe is finely adjusted, the highest wave of the artificial defect of the outer wall is captured by the first channel at the upper left corner shown in fig. 16, the sensitivity of the channel is adjusted, the echo of the highest defect reaches 60% of the full screen height to be used as a reference wave amplitude, the alarm gate is set to be 10% in order to read the wave amplitude conveniently, then the parameters of the rest channels are adjusted one by one, the steel pipe is scanned according to spiral tracks by continuously adopting different screw pitches, the highest wave amplitude of the defect of the outer wall under different screw pitches is recorded, and if the artificial defect is captured by a plurality of channels, the highest wave is counted.

3) According to the wave amplitude values recorded in table 3, the maximum difference from the basic wave amplitude is taken according to the formula:

the error of the defect echo between the defect echo and the reference wave is calculated, and the specific result is shown in table 3.

In summary, it can be seen from the application example one and the application example two that: the steel pipe is scanned by adopting various different scanning screw pitches, the dynamic stability verification fluctuation value of the system is less than 1dB, the stability of the detection result is good, and the requirement of 2dB specified by the standard is met.

In contrast to the conventional contact multi-probe scheme, the conventional contact multi-probe scheme is adopted to detect the large-caliber steel pipe, and due to the fact that the coverage rate of a stable sound field is insufficient, detection results are large in difference and low in reliability under different scanning pitch states, and detection omission is easily caused.

Therefore, the invention creatively adopts the array scanning technology to detect the large-caliber steel pipe, greatly improves the coverage rate of a sound field by controlling different array wafer combination triggering modes, and presets 5 working modes to detect the steel pipes with different wall thickness ranges; the probe frame device of cooperation self-adaptation steel pipe external diameter, its parcel ability can adapt to different external diameter steel pipes and the coupling effect is better, the simple operation nature and the application scope under the greatly increased actual detection operating mode.

Claims

1. The utility model provides a large-diameter steel pipe transverse defect detects uses array ultrasonic transducer device which characterized in that: the array type ultrasonic probe comprises a probe frame, wherein the bottom of the probe frame is connected with two groups of array type ultrasonic probes, the two groups of array type ultrasonic probes are arranged on the two sides of the bottom of the probe frame in a left-right mode, each group of array type ultrasonic probes are composed of multiple rows of wafers, each row of wafers form a surface, and sound fields with different acoustic characteristics are obtained by changing the combined use quantity and the recycling quantity of each row of probe wafers.

2. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 1, wherein: each group of array ultrasonic probes comprises three rows of wafers which are arranged in parallel, namely an A row of wafers, a B row of wafers and a C row of wafers, wherein the plane formed by the A row of wafers, the B row of wafers and the C row of wafers is arranged at an inclined angle with the long axis of the steel pipe, the projection surfaces of the three rows of wafers in each group of array ultrasonic probes are distributed in a shape like Chinese character 'pin', the A row of wafers and the C row of wafers are arranged in the same row, and the B row of wafers are arranged at the outer sides of the A row of wafers and the C row of wafers;

3. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 1, wherein: the probe frame comprises a rotating frame which is longitudinally arranged, the rotating frame is Jiong-shaped, the center of the upper end of the rotating frame is connected with a rotator, two ends of the bottom of the rotating frame are respectively connected with an elastic support, an outer frame is connected between the elastic supports, probe seats are respectively arranged on two sides in the outer frame, the array ultrasonic probes are respectively arranged in the probe seats on the corresponding sides, an inner frame which is oppositely arranged is arranged in the middle of the outer frame, a centering wheel seat is connected between the inner frames, the bottom end of the centering wheel seat is connected with a centering wheel, and the centering wheel and the array ultrasonic probes on the two sides form a cambered surface which is attached to a detected steel pipe during detection;

4. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 3, wherein: the elastic support comprises two groups of steel plate spring pieces which are symmetrically arranged up and down, each group of steel plate spring pieces comprises two long spring pieces, a middle spring piece and a short spring piece which are sequentially stacked on the two long spring pieces, the short spring pieces of the two groups of steel plate spring pieces are arranged in a back-to-back manner, a square seat fixedly connected with the rotating frame is arranged between the middle parts of the two groups of steel plate spring pieces, the square seat is fixedly connected with the two groups of upper and lower spring steel plate pieces through bolts, the four corners of the outer frame are respectively connected with square blocks, and the square blocks at the four corners of the outer frame are respectively and correspondingly connected between the two ends of the long spring pieces of the two elastic support;

5. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 3, wherein: the rotator comprises a rotator upper cover, a rotator lower cover and a rotator cone which is rotatably arranged between the rotator upper cover and the rotator lower cover, the rotator cone comprises an upper cone with an upward small-opening end and a lower cone with a downward small-opening end, and the lower end of the rotator cone extends out of the rotator lower cover and is connected with the rotating frame;

6. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 2, wherein: the wall thickness of the detected steel pipe is 10-20mm, the combination modes of the wafers of the two groups of array ultrasonic probes are the same, and the combination modes are respectively as follows: a1, A2, A3 combination is a first group, A3 combination is a second group, A3 combination is a third group, A3 combination is a fourth group, A3 combination is a fifth group, B3 combination is a sixth group, B3 combination is a seventh group, B3 combination is an eighth group, B3 combination is a ninth group, B3 combination is a tenth group, C3 and C3 are a sixteenth group, each group of wafers of the two groups of array ultrasonic probes respectively corresponds to one simulation channel, and the first to sixteenth groups of wafers of the two groups of array ultrasonic probes are sequentially and synchronously triggered in a circulating manner during the defect detection of the steel pipe.

7. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 2, wherein: the wall thickness of the steel pipe is 20-40mm, the wafer combination modes of the two groups of array ultrasonic probes are the same, and the combination modes are respectively as follows: a1, A2, A3 and A4 are combined into a first group, A4 and A4 are combined into a second group, A4 and A4 are combined into a third group, A4 and A4 are combined into a fourth group, B4 and B4 are combined into a fifth group, B4 and B4 are combined into a sixth group, B4 and B4 are combined into a seventh group, B4 and B4 are combined into an eighth group, C4 and C4 are combined into a ninth group, C4 and C4 are combined into a tenth group, C4 and C4 are combined into a twelfth group, and a synchronous ultrasonic probe pair is used for detecting the defect of the first, second, the first, second, the second and twelfth, third and twelfth groups are respectively used for detecting the ultrasonic probe pairs of the ultrasonic wave synchronous probe.

8. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 2, wherein: the wall thickness of the detected steel pipe is 40-60mm, the wafer combination modes of the two groups of array ultrasonic probes are the same, and the method comprises the following steps: a1, A2, A3, A4 and A5 are combined into a first group, A4, A5, A6, A7 and A8 are combined into a second group, A7, A8, A9 and A10 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B6, B7, B8, B9 and B10 are combined into a fifth group, B8, B9, B10, B11 and B12 are combined into a sixth group, C3, C4, C5, C6 and C7 are combined into a seventh group, C6, C7, C8, C9 and C10 are combined into an eighth group, the two groups of array type ultrasonic probe wafer groups respectively correspond to one analog channel, and the two groups of array type ultrasonic probe groups are sequentially triggered when a first wafer group and an eighth wafer group are synchronously tested.

9. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 2, wherein: the wall thickness of the detected steel pipe is 60-90mm, the wafer combination modes of the two groups of array ultrasonic probes are the same, and the method comprises the following steps: a1, A2, A3, A4, A5 and A6 are combined into a first group, A4, A5, A6, A7, A8 and A9 are combined into a second group, B1, B2, B3, B4, B5 and B6 are combined into a third group, B3, B4, B5, B6 and B7 are combined into a fourth group, B7, B8, B9, B10 and B11 are combined into a fifth group, C1, C2, C3, C4, C5 and C6 are combined into a sixth group, C4, C5, C6, C7, C8 and C9 are combined into a seventh group, C5, C6, C7, C8, C9 and C10 are combined into a first group, and an eighth group, and an ultrasonic probe array type is used for detecting defects of wafers in sequence when the first group, the second group, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third, the fourth, the third.

10. The array type ultrasonic probe device for detecting the transverse defects of the large-caliber steel pipe according to claim 2, wherein: the wall thickness of the detected steel pipe is 90-130mm, the wafer combination modes of the two groups of array ultrasonic probes are the same, and the method comprises the following steps: a1, A2 and A2 are combined into a first group, A2 and A2 are combined into a second group, B2 and B2 are combined into a third group, B2, C2 and C2 are combined into a fifth group, C2 and a sixth group, and the first group and the second group are respectively used for detecting the defects of the ultrasonic array type ultrasonic probe array type wafer.