CN113340468A - Automatic testing system and method for precision of temperature sensor chip in full temperature range - Google Patents
Automatic testing system and method for precision of temperature sensor chip in full temperature range Download PDFInfo
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- CN113340468A CN113340468A CN202110573695.2A CN202110573695A CN113340468A CN 113340468 A CN113340468 A CN 113340468A CN 202110573695 A CN202110573695 A CN 202110573695A CN 113340468 A CN113340468 A CN 113340468A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
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Abstract
The invention provides an automatic test system and method for the precision of a temperature sensor chip in a full temperature range, which comprises the following steps: the standard temperature generator is used for generating the temperature required by the precision test of the temperature sensor; the PC is connected with the standard temperature generator and the chip of the temperature sensor to be measured; and (3) upper computer software: and controlling the standard temperature generator, reading the temperature of the temperature sensor chip, and automatically completing the precision test of the temperature sensor chip within the full temperature range. The automatic testing method provided by the invention can shorten the full-temperature testing time of the temperature chip, reduce the investment of testing personnel, avoid artificial subjective influence and interference in the test and greatly improve the testing efficiency and the reliability of the test result.
Description
Technical Field
The invention relates to a temperature sensor testing device, in particular to an automatic testing system and method for the precision of a temperature sensor chip in a full temperature range.
Background
The traditional test method of the full-temperature precision of the temperature sensor chip is that the temperature value of the temperature generator is manually set, whether the standard environment temperature reaches a stable state or not is manually judged, the current temperature value of the chip to be tested is manually tested and recorded, and the process is repeated until the required temperature point is covered.
In chinese patent application publication No. CN109799008A, an automatic calibration method for a temperature sensor and a temperature sensor are disclosed, the automatic calibration method for a temperature sensor includes: receiving a standard environment temperature detected by a temperature standard source; detecting the ambient temperature by using a temperature sensor node to obtain a detected ambient temperature; judging whether the difference value of the standard environment temperature and the detection environment temperature is within an error range; if the difference is not within the error range, automatically calibrating the temperature sensor node according to the standard environment temperature; through setting up the temperature standard source, the temperature standard source carries out the precision measurement to ambient temperature, and sends back the standard ambient temperature that detects the acquisition, judges whether take place the skew according to this standard ambient temperature to carry out automatic calibration when taking place the skew, thereby need not to carry out artifical calibration to temperature sensor, greatly saved human cost and time cost. But only the temperature test and calibration of a single temperature point, and the test and calibration in a full temperature range are not realized without automatic change and control of the standard environment temperature.
In chinese patent application No. CN107607228B, a temperature sensor detection device, i.e. a standard temperature generator, is disclosed, and a precision measurement method of a temperature sensor is described. However, the control of the temperature generator and the temperature reading of the temperature sensor to be measured are not linked, and the full-temperature measurement is not automated.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide an automatic testing system and method for the precision of a temperature sensor chip in a full temperature range.
The invention provides an automatic test system for the precision of a temperature sensor chip in a full temperature range, which comprises:
the standard temperature generator is used for generating the temperature required by the precision test of the temperature sensor;
the PC is connected with the standard temperature generator and the chip of the temperature sensor to be measured;
and (3) upper computer software: and controlling the standard temperature generator, reading the temperature of the temperature sensor chip, and automatically completing the precision test of the temperature sensor chip within the full temperature range.
Preferably, the standard temperature generator is connected with the PC through any one of RS232, RS485, USB and Ethernet communication interfaces.
Preferably, the PC is connected with the temperature sensor chip to be measured by any one of USB, RS232 and Bluetooth communication interfaces.
Preferably, the upper computer software detects the cable falling and abnormal reading conditions in real time, and once the cable falling from the standard temperature generator is detected, the popup window informs a user of checking the cable, or when the temperature reading value of the chip to be detected is detected to be abnormal, the popup window informs the user.
Preferably, the upper computer software generates a full-temperature curve graph and a data table after the measurement and test of all the temperature points are finished.
The invention provides an automatic testing method for the precision of a temperature sensor chip in a full temperature range, which comprises the following steps:
step S1: sequentially setting the temperature of the standard temperature generator according to a temperature point to be measured set by a user, and reading the actual temperature of the standard temperature generator in real time after setting;
step S2: when the error between the actual temperature and the set temperature of the standard temperature generator is less than 0.1 ℃ within 1 minute, the upper computer software reads and records the temperature value of the chip to be tested;
step S3: after the measurement task of a certain temperature point is completed, the upper computer software automatically monitors whether the measurement tasks of all the temperature points are completed, if not, the standard temperature generator is set as the next temperature point to be measured, and the steps S1-S2 are repeated; if yes, the data are sorted, and a full-temperature curve graph and a data table are generated.
Preferably, in step S3, during the process of adjusting the standard temperature generator from a certain temperature point to the next temperature point, the method includes a fast temperature adjusting stage and a fine adjusting stage, the fast temperature adjusting stage is entered first, and the fine adjusting stage is entered when the next temperature point is approached.
Preferably, the fine tuning stage is controlled by a PID algorithm.
Preferably, in the rapid temperature adjustment stage, when the temperature reaches the range of +/-1.5 ℃ of the next temperature point, the fine adjustment stage is started.
Preferably, in step S3, after the full-temperature graph and the data table are generated, the standard temperature generator automatically stops operating.
Compared with the prior art, the invention has the following beneficial effects:
1. through practical use verification, the automatic testing method can shorten the full-temperature testing time of the temperature chip, reduce the investment of testing personnel, avoid artificial subjective influence and interference in testing, and greatly improve the testing efficiency and the reliability of the testing result.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a block diagram of an automated testing system for accuracy over the full temperature range of a temperature sensor chip according to the present invention;
FIG. 2 is a block diagram of a process of an automated testing method for accuracy of a temperature sensor chip over a full temperature range.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
The invention provides an automatic test system of the precision of a temperature sensor chip in the full temperature range, which comprises the following components with reference to fig. 1: standard temperature generator, PC and host computer software. The standard temperature generator generates the temperature required by the precision test of the temperature sensor; the PC is connected with the standard temperature generator and the chip of the temperature sensor to be measured; and the upper computer software controls the standard temperature generator, reads the temperature of the temperature sensor chip and automatically completes the precision test of the temperature sensor chip in the full temperature range.
The standard temperature generator is connected with the PC by adopting any one of RS232, RS485, USB and Ethernet communication interfaces. The upper computer software can control the standard temperature generator, and program-controlled heating and cooling operations are carried out, so that the standard temperature generator can quickly reach the set temperature value. The upper computer software can read the actual temperature value in the standard temperature generator in real time, the difference value between the actual temperature value and the set temperature value is maintained in a certain range in a certain time, the standard environment temperature is judged to be established, and the temperature reading and recording of the chip to be detected can be carried out. The PC is connected with the chip of the temperature sensor to be measured by adopting any one of USB, RS232 and Bluetooth communication interfaces, and records and arranges data. And when all the temperature points are measured and tested, generating a full-temperature curve graph and an EXCEL detailed data table.
And the upper computer software detects the cable falling and abnormal reading conditions in real time, and the popup window informs a user to check the cable once the cable falling from the standard temperature generator is detected, or informs the user when the temperature reading value of the chip to be detected is abnormal.
An automatic testing method for the accuracy of a temperature sensor chip in the full temperature range is disclosed, referring to fig. 2, and comprises the following steps:
step S1: sequentially setting the temperature of the standard temperature generator according to a temperature point to be measured set by a user, and reading the actual temperature of the standard temperature generator in real time after setting;
step S2: when the error between the actual temperature and the set temperature of the standard temperature generator is less than 0.1 ℃ within 1 minute, the upper computer software reads and records the temperature value of the chip to be tested;
step S3: after the measurement task of a certain temperature point is completed, the upper computer software automatically monitors whether the measurement tasks of all the temperature points are completed, if not, the standard temperature generator is set as the next temperature point to be measured, and the steps S1-S2 are repeated; if yes, the data are sorted, and a full-temperature curve graph and a data table are generated.
The method comprises the steps that in the process that a standard temperature generator is heated or cooled from a certain temperature point to the next temperature point, the rapid temperature adjusting stage and the fine adjusting stage are included, the rapid temperature adjusting stage is firstly started, and the fine adjusting stage is started when the standard temperature generator is close to the next temperature point. In the rapid temperature adjustment stage, when the temperature reaches the range of +/-1.5 ℃ of the next temperature point, the fine adjustment stage is carried out. And the fine adjustment stage adopts a PID algorithm to control the temperature of the standard temperature generator. And when the full-temperature curve graph and the data table are generated, the standard temperature generator automatically stops working.
The temperature adjustment is carried out by adopting a rapid temperature adjustment stage and a fine adjustment stage, so that the temperature adjustment speed and the accuracy can be improved, and in the fine adjustment stage, the chip to be tested is fully immersed in the temperature near the target temperature, so that the chip to be tested is more rapidly stabilized, and the testing efficiency and the testing accuracy are improved.
Those skilled in the art will appreciate that, in addition to implementing the system and its various devices, modules, units provided by the present invention as pure computer readable program code, the system and its various devices, modules, units provided by the present invention can be fully implemented by logically programming method steps in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers and the like. Therefore, the system and various devices, modules and units thereof provided by the invention can be regarded as a hardware component, and the devices, modules and units included in the system for realizing various functions can also be regarded as structures in the hardware component; means, modules, units for performing the various functions may also be regarded as structures within both software modules and hardware components for performing the method.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.
Claims (10)
1. An automated testing system for the accuracy of a temperature sensor chip over a full temperature range, comprising:
the standard temperature generator is used for generating the temperature required by the precision test of the temperature sensor;
the PC is connected with the standard temperature generator and the chip of the temperature sensor to be measured;
and (3) upper computer software: and controlling the standard temperature generator, reading the temperature of the temperature sensor chip, and automatically completing the precision test of the temperature sensor chip within the full temperature range.
2. The system of claim 1, wherein the system is configured to automatically test the accuracy of the temperature sensor chip over a full temperature range, and further comprising: the standard temperature generator is connected with the PC through any one of RS232, RS485, USB and Ethernet communication interfaces.
3. The system of claim 1, wherein the system comprises: the PC is connected with the chip of the temperature sensor to be measured by adopting any one of USB, RS232 and Bluetooth communication interfaces.
4. The system of claim 1, wherein the system comprises: and the upper computer software detects the cable falling and abnormal reading conditions in real time, and the popup window informs a user to check the cable once the cable falling from the standard temperature generator is detected, or informs the user when the temperature reading value of the chip to be detected is abnormal.
5. The system of claim 1, wherein the system comprises: and the upper computer software generates a full-temperature curve graph and a data table after the measurement and test of all the temperature points are finished.
6. An automatic testing method for the precision of a temperature sensor chip in the full temperature range, which adopts the automatic testing system for the precision of the temperature sensor chip in the full temperature range of claim 1, is characterized by comprising the following steps:
step S1: sequentially setting the temperature of the standard temperature generator according to a temperature point to be measured set by a user, and reading the actual temperature of the standard temperature generator in real time after setting;
step S2: when the error between the actual temperature and the set temperature of the standard temperature generator is less than 0.1 ℃ within 1 minute, the upper computer software reads and records the temperature value of the chip to be tested;
step S3: after the measurement task of a certain temperature point is completed, the upper computer software automatically monitors whether the measurement tasks of all the temperature points are completed, if not, the standard temperature generator is set as the next temperature point to be measured, and the steps S1-S2 are repeated; if yes, the data are sorted, and a full-temperature curve graph and a data table are generated.
7. The method for automatically testing the accuracy of the temperature sensor chip in the full temperature range according to claim 6, wherein the method comprises the following steps: in step S3, in the process of adjusting the standard temperature generator from a certain temperature point to the next temperature point, the method includes a fast temperature adjustment stage and a fine adjustment stage, where the fast temperature adjustment stage is entered first, and the fine adjustment stage is entered when the standard temperature generator approaches the next temperature point.
8. The method of claim 7, wherein the method comprises the following steps: and the fine tuning stage adopts PID algorithm control.
9. The method of claim 7, wherein the method comprises the following steps: and in the rapid temperature adjusting stage, when the temperature reaches the range of +/-1.5 ℃ of the next temperature point, entering a fine adjustment stage.
10. The method for automatically testing the accuracy of the temperature sensor chip in the full temperature range according to claim 6, wherein the method comprises the following steps: in step S3, after the full-temperature graph and the data table are generated, the standard temperature generator automatically stops working.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114136499A (en) * | 2021-12-02 | 2022-03-04 | 广东乐心医疗电子股份有限公司 | Temperature calibration method and system |
| CN115824461A (en) * | 2022-11-24 | 2023-03-21 | 安测半导体技术(义乌)有限公司 | Mass production calibration method and device for temperature sensing chips |
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