CN113315469B - Testing device for solar cell - Google Patents

Abstract

The embodiment of the invention provides a testing device of a solar cell, which comprises: the upper needle pressing row comprises a plurality of upper pressing needles which are arranged at intervals, the lower needle pressing row comprises a plurality of lower pressing needles which are arranged at intervals, and the upper pressing needles in the upper needle pressing row and the lower pressing needles arranged at corresponding positions in the lower needle pressing row form a needle pressing group; the transmitting unit is arranged on one of the upper pressing pin and the lower pressing pin, the receiving unit is arranged on the other of the upper pressing pin and the lower pressing pin, the transmitting unit is used for transmitting a detection signal to the receiving unit, and the receiving unit is used for receiving the detection signal; and the control module is used for judging the abnormal state of the upper pressing pin and/or the lower pressing pin in the pressing pin group based on the detection signal. According to the embodiment of the invention, the accuracy of the test result of the electrical property of the solar cell can be improved.

Description

Testing device for solar cell

Technical Field

The embodiment of the invention relates to the field of solar energy, in particular to a testing device for a solar cell.

Background

After the solar cell is produced, the solar cell is usually tested under a tester simulating solar illumination, so as to calibrate electrical performance parameters such as conversion efficiency of the solar cell. The electrical performance parameters such as conversion efficiency reflect the photoelectric conversion performance and the product quality of the solar cell, and are also important embodiment of the product value of the solar cell.

The photovoltaic effect of the solar cell is generated under the simulated sunlight, the secondary grid on the surface of the solar cell collects the generated current on the main grid, then the current is transmitted to a load through the press pins on the press pin row pressed on the main grid, and the tester carries out related calculation according to the generated current, the illumination intensity, the temperature, the area of the cell and other data, so that a series of electrical performance parameters of the solar cell, such as conversion efficiency, open-circuit voltage, short-circuit current, rated power, rated voltage, rated current, series resistance and the like, are obtained. In the process, the contact condition of the pressing pin and the main grid directly influences the test result of the solar cell, so that the actual presentation of the actual electrical performance of the solar cell is influenced. Therefore, the good contact between the pressing pin and the main grid is ensured, and the accuracy of the test result of the electrical performance of the solar cell is greatly influenced. However, at present, enterprises mostly adopt a manual detection mode to detect whether the pressing needle is damaged, and the accuracy of a test result is difficult to control.

Disclosure of Invention

The embodiment of the invention provides a testing device of a solar cell, which aims to improve the accuracy of a testing result of the electrical performance of the solar cell.

The embodiment of the invention provides a testing device of a solar cell, which comprises: the device comprises an upper needle pressing row and a lower needle pressing row, wherein the upper needle pressing row comprises a plurality of upper needle pressing needles which are arranged at intervals, the lower needle pressing row comprises a plurality of lower needle pressing needles which are arranged at intervals, and the upper needle pressing needles in the upper needle pressing row and the lower needle pressing needles arranged at corresponding positions in the lower needle pressing row form a needle pressing group; the transmitting unit is arranged on one of the upper pressing pin and the lower pressing pin, the receiving unit is arranged on the other one of the upper pressing pin and the lower pressing pin, the transmitting unit is used for transmitting a detection signal to the receiving unit, and the receiving unit is used for receiving the detection signal; and the control module is used for judging the abnormal state of the upper pressing pin and/or the lower pressing pin in the pressing pin group based on the detection signal.

In addition, both opposite end portions of the upper acupressure probe and the lower acupressure probe have grooves, the emitting unit is disposed in the groove of one of the upper acupressure probe and the lower acupressure probe, and the receiving unit is disposed in the groove of the other one of the upper acupressure probe and the lower acupressure probe.

In addition, the transmitting unit is arranged on the outer wall of one of the upper pressing pin and the lower pressing pin, the receiving unit is arranged on the outer wall of the other one of the upper pressing pin and the lower pressing pin, and the transmitting unit and the receiving unit are positioned on the same side of the outer walls of the upper pressing pin and the lower pressing pin.

In addition, the control module includes a first judgment unit configured to: judging whether the receiving unit receives the detection signal; if so, generating a first normal signal, wherein the first normal signal represents that the upper pressing pin and/or the lower pressing pin are/is not separated or deviated; and if not, generating a first abnormal signal which represents the abnormality that the upper pressing pin and/or the lower pressing pin fall off or shift.

In addition, the control module further comprises an acquisition unit and a second judgment unit; if the first judging unit generates the first normal signal, the first judging unit is further configured to: sending the detection signal to the acquisition unit; the acquisition unit is configured to: acquiring the detection signal sent by the first judgment unit, and acquiring the distance between the upper pressing pin and the lower pressing pin based on the detection signal; the second determination unit is configured to: judging whether the distance between the upper pressing pin and the lower pressing pin acquired by the acquisition unit exceeds a threshold range or not; if so, generating a second abnormal signal which represents the abnormality of the length change of the upper pressing pin and/or the lower pressing pin; and if not, generating a second normal signal which represents that the upper pressing pin and/or the lower pressing pin is not subjected to the abnormity of length change.

In addition, the testing device comprises a plurality of upper needle pressing bars which are arranged at intervals and a plurality of lower needle pressing bars which are arranged corresponding to the upper needle pressing bars; further comprising: the needle bar distance measuring module is arranged on the upper needle bar and/or the lower needle bar and is used for measuring the actual distance between the adjacent upper needle bar or the adjacent lower needle bar; the control module is configured to: judging whether the actual distance meets the requirement of a target distance; if so, the upper needle bar and/or the lower needle bar are kept static; if not, the control module generates a distance difference value based on the target distance and the actual distance, and controls the upper needle bar and/or the lower needle bar to move according to the distance difference value until the actual distance is equal to the target distance.

In addition, the needle pressing row ranging module comprises a ranging transmitting structure and a ranging receiving structure; the distance measuring transmitting structure is positioned on one of two opposite side walls adjacent to the upper needle pressing row or the lower needle pressing row, and the distance measuring receiving structure is positioned on the other of two opposite side walls adjacent to the upper needle pressing row or the lower needle pressing row.

In addition, the test apparatus further includes: each telescopic connecting piece is connected with one upper needle pressing row and one lower needle pressing row; the needle bar distance measuring module is positioned on one of the upper needle bar or the lower needle bar; the control module is used for controlling and is provided with the last acusector or the acusector carries out the interval adjustment down of acusector distance measuring module, just telescopic connection spare is used for driving and is not provided with acusector distance measuring module go up the acusector or the acusector moves down.

In addition, each side wall of the upper needle pressing row and/or each side wall of the lower needle pressing row are/is provided with a plurality of needle pressing row distance measuring modules.

In addition, still include: the main grid distance measuring module is used for measuring the distance between the adjacent main grids on the front and/or back of the solar cell and sending the distance between the adjacent main grids to the control module.

The technical scheme provided by the embodiment of the invention at least has the following advantages:

(1) the transmitting unit and the receiving unit detect the upper pressing pins and/or the lower pressing pins, the probability of the abnormal pressing pins for carrying out the electrical performance test of the solar cell can be effectively reduced, and errors of the electrical performance test results of the solar cell caused by abnormal pressing pins are avoided. In addition, the automatic detection function can replace manual point inspection, so that the production cost is reduced while the working efficiency and the accuracy are improved.

(2) The needle bar ranging module can measure the actual distance between the adjacent upper needle bar or the adjacent lower needle bar, and the control module can adjust the actual distance between the adjacent upper needle bar and/or the adjacent lower needle bar to the target distance based on the measurement result of the needle bar ranging module. Therefore, the full-automatic distance adjustment of the upper pressing pin row and/or the lower pressing pin row can be realized, and the solar cell pieces of the main grids with different distances can be conveniently tested.

Drawings

One or more embodiments are illustrated by corresponding figures in the drawings, which are not to be construed as limiting the embodiments, unless expressly stated otherwise, and the drawings are not to scale.

Fig. 1 is a schematic view of a solar cell testing apparatus according to an embodiment of the present invention;

FIG. 2 is a schematic view of a portion of the structure of FIG. 1;

FIG. 3 is a schematic view of another partial structure of FIG. 1;

fig. 4 is a schematic diagram of a pin header ranging module and a main grid ranging module in the testing apparatus for a solar cell provided in an embodiment of the present invention;

fig. 5 is a schematic view of another testing apparatus for solar cells according to an embodiment of the present invention.

Detailed Description

As known from the background art, the accuracy of the test result of the electrical performance of the solar cell needs to be further improved. The analysis shows that the main reasons are as follows: in daily production, the state of the pressing pin is usually confirmed by manual spot inspection at different time periods, and a corresponding testing device does not automatically detect the state. In the non-point inspection time period, if the local pressing needle is twisted, inclined or fallen off, the manual point inspection cannot be found in time; and because manual detection and the size of tucking are less, consequently detection personnel easily miss the tucking that has damaged in the testing process. Under the condition, poor contact between the main grid and the press pin can cause that the test series resistance of the solar cell is higher, so that the test efficiency is lower, and the rated power of the test is lower. If the abnormal pressing pins are more, the accuracy of the test result of the electrical performance of the solar cell is greatly influenced. In addition, reworking the solar cell with abnormal test also causes the increase of production cost.

The embodiment of the invention provides a testing device of a solar cell, which comprises: a plurality of upper and lower push pins; any upper pressing pin and a lower pressing pin correspondingly arranged form a pressing pin group; the transmitting unit is arranged on one of the upper pressing pin and the lower pressing pin, the receiving unit is arranged on the other of the upper pressing pin and the lower pressing pin, the transmitting unit is used for transmitting a detection signal to the receiving unit, and the receiving unit is used for receiving the detection signal; the control module judges whether the upper pressing pin and/or the lower pressing pin in the pressing pin group are abnormal or not based on the detection signal. The transmitting unit and the receiving unit can detect the upper pressing pin and/or the lower pressing pin, and the control module can judge whether the abnormity occurs or not based on the detection signal, so that the abnormal upper pressing pin and/or the abnormal lower pressing pin can be detected in time, the abnormal upper pressing pin and/or the abnormal lower pressing pin can be replaced or repaired conveniently, and the accuracy of the test result of the electrical property of the solar cell is improved.

In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that in various embodiments of the invention, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.

An embodiment of the present invention provides a testing apparatus for a solar cell, and referring to fig. 1 to 5, the testing apparatus includes: the device comprises an upper needle pressing row 11 and a lower needle pressing row 12, wherein the upper needle pressing row 11 comprises a plurality of upper needle pressing needles 21 which are arranged at intervals, and the lower needle pressing row 12 comprises a plurality of lower needle pressing needles 22 which are arranged at intervals; wherein, the upper presser pins 21 in the upper presser pin row 11 and the lower presser pins 22 arranged at corresponding positions in the lower presser pin row 12 form a presser pin group; the transmission unit 31 is arranged on one of the upper pressing pin 21 and the lower pressing pin 22, the receiving unit 32 is arranged on the other one of the upper pressing pin 21 and the lower pressing pin 22, the transmission unit 31 is used for transmitting a detection signal to the receiving unit 32, and the receiving unit 32 is used for receiving the detection signal; and the control module 6 is used for judging the abnormal state of the upper pressing pin 21 and/or the lower pressing pin 22 in the pressing pin group based on the detection signal. As will be specifically described below.

In some embodiments, the front surface and the back surface of the solar cell piece are provided with a plurality of mutually parallel main grids. The main grids are parallel to each other. In addition, the number of the main grids on the front surface and the back surface can be the same, and the main grids on the front surface and the main grids on the back surface can be in mirror symmetry compared with the solar cell body.

Referring to fig. 1, each upper bank of pins 11 corresponds to one main grid of one of the front and back sides, and each lower bank of pins 12 corresponds to one main grid of the other of the front and back sides. That is, the upper pin header 11 and the lower pin header 12 may also be mirror-symmetrical, so as to ensure that the upper pins 21 and the lower pins 22 can completely press on the main grid of the solar cell during the test of the solar cell, and simultaneously ensure the uniform stress of the bonding point.

In other embodiments, the front side of the solar cell sheet may have a main grid, and the back side of the solar cell sheet may be designed as an all-back electrode; or the front surface and the back surface of the solar cell piece are both provided with the main grids, but the number of the main grids on the front surface and the number of the main grids on the back surface can be different, and the positions of the main grids on the front surface and the main grids on the back surface can be not in a mirror symmetry relationship. Correspondingly, during the test of the solar cell, the upper pin header 11 and the lower pin header 12 may not be in a mirror symmetry relationship, and the upper pin header 11 and the lower pin header 12 may be adjusted to be in a mirror symmetry relationship before the test, so as to complete the detection of the upper pins 21 and/or the lower pins 22.

When the solar cell is subjected to an electrical performance test, under the action of the driving member, the upper pressing pin row 11 and the lower pressing pin row 12 move towards the solar cell, so that the upper pressing pins 21 and the lower pressing pins 22 press on the main grid of the solar cell. The upper and lower push pins 21 and 22 are used to make electrical connection with the main grid so as to collect the current generated by the photovoltaic effect, thereby completing the electrical performance test of the solar cell. In some embodiments, the drive member may be a cylinder.

In some embodiments, the arrangement direction of the upper pins 21 of one upper pin row 11 is parallel to the extension direction of the main grid of the solar cell, and the arrangement direction of the lower pins 22 of one lower pin row 12 is also parallel to the extension direction of the main grid of the solar cell. Usually, each upper presser bar 11 has at least 15 upper presser bars 21 and each lower presser bar 12 has at least 15 lower presser bars 22. In addition, the number of the upper press pins 21 and the lower press pins 22 can be changed according to the size of the solar cell. In some embodiments, the widths of the upper and lower pressing pins 21 and 22 may be slightly larger than the width of the main grid, so that even if the upper and lower pressing pins 21 and 22 are slightly misaligned with the main grid, the upper and lower pressing pins 21 and 22 still maintain a larger contact area with the main grid, thereby improving the accuracy of the test result. In other embodiments, the widths of the upper and lower pressing pins 21 and 22 may be less than or equal to the width of the main grid.

With continued reference to fig. 1, the transmitting unit 31 and the receiving unit 32 are used to detect whether an abnormality occurs in the upper push pin 21 and/or the lower push pin 22. The emitting unit 31 is provided on one of the upper acupressure needle 21 and the lower acupressure needle 22, and the receiving unit 32 is provided on the other of the upper acupressure needle 21 and the lower acupressure needle 22. In some embodiments, the transmitting unit 31 is disposed on the upper presser pin 21, and the receiving unit 32 is disposed on the lower presser pin 22. In other embodiments, the transmitting unit 31 is disposed on the lower presser pin 22, and the receiving unit 32 is disposed on the upper presser pin 21. It can be understood that if the upper pressing pin 21 and/or the lower pressing pin 22 are abnormal, it is difficult for the upper pressing pin 21 and/or the lower pressing pin 22 to form a good electrical connection with the main grid, and thus the accuracy of the test result is affected. Because the transmitting unit 31 and the receiving unit 32 can detect the abnormal upper pressure pin 21 and/or the abnormal lower pressure pin 22 in time, the subsequent replacement or maintenance of the upper pressure pin 21 and/or the lower pressure pin 22 can be facilitated, and the accuracy of the test result can be further improved.

In addition, the transmitting unit 31 may be an optical-electrical signal transmitting unit, and the receiving unit 32 may be an optical-electrical signal receiving unit, that is, the detection signal is an optical-electrical signal, such as a laser.

The principle of the test of the transmitting unit 31 and the receiving unit 32 will be specifically explained below.

Referring to fig. 2 to 3, the upper presser pins 21 in the upper presser pin bank 11 (refer to fig. 1) and the lower presser pins 22 arranged at corresponding positions in the lower presser pin bank 12 (refer to fig. 1) form a presser pin group; namely, the upper presser pins 21 and the lower presser pins 22 in the same presser pin group are opposite to each other, and further, the upper presser pins 21 and the lower presser pins 22 in the same presser pin group can be located at the same vertical position.

In some embodiments, referring to fig. 2, both opposite ends of the upper and lower pins 21 and 22 have grooves, the emitting unit 31 is disposed in the groove of one of the upper and lower pins 21 and 22, and the receiving unit 32 is disposed in the groove of the other of the upper and lower pins 21 and 22. In addition, the opening of the groove and the receiving unit 32 or the transmitting unit 31 positioned in the groove have a height difference of at least 0.3mm, so that when the upper pressing pin 21 and the lower pressing pin 22 are in contact with the main grid, the receiving unit 32 or the transmitting unit 31 is prevented from being in contact with the main grid, and the receiving unit 32 or the transmitting unit 31 can be prevented from being abraded. In addition, the height difference between the opening of the groove and the receiving unit 32 or the transmitting unit 31 located in the groove should not be too large, which is beneficial to shortening the transmission path of the detection signal, and further improving the accuracy of the receiving unit 32 receiving the detection signal.

In other embodiments, referring to fig. 3, the emitting unit 31 is disposed on an outer wall of one of the upper and lower pins 21 and 22, the receiving unit 32 is disposed on an outer wall of the other of the upper and lower pins 21 and 22, and the emitting unit 31 and the receiving unit 32 are located on the same side of the outer walls of the upper and lower pins 21 and 22.

It can be understood that, if the upper push pin 21 and the lower push pin 22 are not separated or deviated abnormally, the transmitting unit 31 is opposite to the receiving unit 32, the transmitting unit 31 sends a detection signal to the receiving unit 32, and the receiving unit 32 can receive the detection signal. If the upper presser foot 21 and the lower presser foot 22 are out of order or deviated, the transmitter 31 cannot face the receiver 32, and therefore the receiver 32 cannot receive the detection signal.

With continued reference to fig. 1, the control module 6 is used to control the operation of the transmitting unit 31 and the receiving unit 32. Furthermore, the control module 6 comprises a first judging unit configured to: determining whether the receiving unit 32 receives the detection signal; if so, generating a first normal signal, wherein the first normal signal represents that the upper pressing pin 21 and/or the lower pressing pin 22 are/is not separated or deviated; if not, a first abnormal signal is generated, wherein the first abnormal signal represents the abnormality that the upper pressing pin 21 and/or the lower pressing pin 22 fall off or shift. That is, the first determination unit can determine whether or not the upper push pin 21 or the lower push pin 22 has an abnormality such as falling or displacement. Therefore, the pressing pin which is fallen off or deviated from the abnormal state can be maintained or replaced subsequently according to the judgment result of the first judgment unit, and the accuracy of the electrical property test result of the solar cell is improved.

The control module 6 may comprise a plc (programmable Logic controller) controller. Under the control of the PLC controller, when the solar cell is tested for efficiency, that is, when the solar cell is placed on the test platform 8, the transmitting unit 31 and the receiving unit 32 are in a closed state; when no solar cell is on the test platform 8, the PLC opens the transmitting unit 31 and the receiving unit 32, so that automatic detection of the pressing pin can be realized.

It should be noted that if the receiving unit 32 does not receive the detection signal, at least one of the upper press pin 21 and the lower press pin 22 has an abnormality. In order to determine whether the abnormal presser finger is the upper presser finger 21 or the lower presser finger 22, the correspondence relationship between the upper presser finger bank 11 and the lower presser finger bank 12 may be readjusted to combine a new presser finger group. In one example, first, a first upper presser bar 11 corresponds to a first lower presser bar 12, and a second upper presser bar 11 corresponds to a second lower presser bar 12; starting the transmitting unit 31 and the receiving unit 32 to test abnormal needle pressing; the test result shows that some of the upper press pins 21 and/or the lower press pins 22 in the first upper press pin row 11 and the first lower press pin row 12 have abnormality, and the upper press pins 21 and the lower press pins 22 in the second upper press pin row 11 and the second lower press pin row 12 do not have abnormality; changing the corresponding relationship, for example, corresponding the first upper presser row 11 to the second lower presser row 12, if the detection signal cannot be received at this time, the upper presser 21 of the first upper presser row 11 has an abnormality; if the detection signal can be received at this time, the upper presser pins 21 of the first upper presser pin row 11 have no abnormality. Furthermore, the first lower pin header 12 may be associated with the second upper pin header 11. Therefore, whether the abnormal pressing needle is the upper pressing needle 21 or the lower pressing needle 22 can be accurately detected, and the subsequent replacement or repair is convenient.

In other embodiments, to detect the abnormal upper pressure pin 21 and/or lower pressure pin 22 with length change, the control module 6 may further include an obtaining unit and a second determining unit. The acquisition unit and the second determination unit will be described in detail below.

If the first judging unit generates the first normal signal, the first judging unit is further configured to: sending the detection signal to an acquisition unit; that is, if the upper plunger 21 and/or the lower plunger 22 are not separated or deviated, the first determining unit sends the detection signal to the acquiring unit. That is, if the receiving unit does not receive the detection signal, it indicates that the upper pressing pin and/or the lower pressing pin fall off or shift, and at this time, it is not necessary to further determine whether the length of the upper pressing pin and/or the lower pressing pin changes; if the receiving unit receives the detection signal, the subsequent acquiring unit analyzes the detection signal.

The acquisition unit is configured to: the detection signal sent by the first judgment unit is acquired, and the distance between the upper press pin 21 and the lower press pin 22 is acquired based on the detection signal. For example, the detection signal may further include a propagation time of the photoelectric signal from the transmitting unit 31 to the receiving unit 32, and thus the obtaining unit may calculate the distance between the upper stylus 21 and the lower stylus 22 based on the propagation time.

The second determination unit is configured to: judging whether the distance between the upper pressing pin 21 and the lower pressing pin 22 acquired by the acquisition unit exceeds a threshold range or not; if so, generating a second abnormal signal which represents the abnormality of the length change of the upper pressing pin 21 and/or the lower pressing pin 22; if not, a second normal signal is generated, wherein the second normal signal represents that the upper pressing pin 21 and/or the lower pressing pin 22 are/is not subjected to length change. That is, the second determination unit can determine whether or not an abnormality of a length change occurs in the upper push pin 21 and/or the lower push pin 22.

It is understood that the temperature and the actuation process during the test may deform the upper press pin 21 or the lower press pin 22, and if the length of the upper press pin 21 or the lower press pin 22 is small, the upper press pin 21 or the lower press pin 22 may have poor contact with the main grid. Therefore, the lengths of the upper pressing pin 21 and the lower pressing pin 22 can be detected in time through the acquisition unit and the second judgment unit, and the accuracy of the test result can be improved. In other embodiments, the control module 6 may not include the obtaining unit and the second determining unit.

In some embodiments, the control module 6 may also include an alarm unit. If the receiving unit 32 does not receive the detection signal, or the detection signal represents the length change of the upper pressing pin 21 and/or the lower pressing pin 22, at the moment, the alarm unit sends an alarm to the upper computer 7 to remind a tester that the upper pressing pin 21 or the lower pressing pin 22 is abnormal, and a worker can replace or maintain the pressing pins according to the alarm information, so that the problem that the solar cell is tested under the condition that the pressing pins are abnormal is solved.

In other embodiments, the test device may further include a repair module. If the upper pressing pin 21 and/or the lower pressing pin 22 are abnormal, the repairing module can repair or replace the abnormal pressing pin according to the control signal sent by the control module 6, so that manual operation is replaced, and the automation degree of the repairing or replacing process is further improved.

If the control module 6 determines that the upper press pins 21 and the lower press pins 22 of the press pin group are not abnormal, the control module 6 may control the upper press pin row 11 and the lower press pin row 12 to move towards the solar cell, so that the upper press pins 21 and the lower press pins 22 are in contact with the main grid to be electrically connected, and thus, the electrical performance test is performed on the solar cell.

Referring to fig. 1 and 4 in combination, the testing device includes a plurality of upper pin rows 11 arranged at intervals and a plurality of lower pin rows 12 arranged corresponding to the upper pin rows 11. The plurality of upper presser foot rows 11 are parallel to each other, the plurality of lower presser foot rows 12 are also parallel to each other, and both the arrangement direction of the upper presser foot rows 11 and the arrangement direction of the lower presser foot rows 12 are perpendicular to the extending direction of the main grid. Two ends of all the upper presser finger rows 11 are respectively arranged on the two upper slide rails 51, and two ends of all the lower presser finger rows 12 are respectively arranged on the two lower slide rails 52. The upper pin header 11 can move along the upper slide rail 51, and the lower pin header 12 can move along the lower slide rail 52, so that the control module 6 can adjust the distance between the adjacent upper pin headers 11 and/or the adjacent lower pin headers 12 according to the distance between the adjacent main grids, thereby facilitating the testing of solar cells with different sizes.

Correspondingly, the control module 6 may further include a driver, and the PLC sends a control signal to the driver, and the driver drives the upper pin header 11 and/or the lower pin header 12 to move based on the control signal, so as to automatically complete the distance adjustment.

In some embodiments, the testing apparatus may further include a main grid ranging module 43, and the main grid ranging module 43 is configured to measure the distance between the adjacent main grids on the front and/or back of the solar cell and further configured to send the distance between the adjacent main grids to the control module 6. The distance between adjacent main grids measured by the main grid distance measuring module 43 can be used as a target distance between the adjacent upper presser finger row 11 and the adjacent lower presser finger row 12, so that the actual distance between the adjacent upper presser finger row 11 and the adjacent lower presser finger row 12 can be adjusted according to the target distance to avoid the dislocation of the subsequent upper presser finger 21 and lower presser finger 22 with the main grids.

The main grid distance measuring module 43 may be disposed on the bodies of the upper and lower acupressure probe rows 11 and 12, on the upper acupressure probe 21 or the lower acupressure probe 22, or on a position other than the upper acupressure probe row 11 and the lower acupressure probe row 12. The main fence ranging module 43 may be a camera that takes a picture of the lower main fence to obtain the spacing of adjacent main fences.

In other embodiments, the testing apparatus may also obtain the spacing between adjacent main grids directly from the production parameters of the solar cell without providing the main grid distance measuring module 43, and use the obtained spacing as the target spacing between the adjacent upper punch pin row 11 and the adjacent lower punch pin row 12.

With continued reference to fig. 4, the testing apparatus further comprises: and the pin header distance measuring module 40 is arranged on the upper pin header 11 and/or the lower pin header 12, and the pin header distance measuring module 40 is used for measuring the actual distance between the adjacent upper pin header 11 or the adjacent lower pin header 12, so that the subsequent adjustment of the actual distance can be facilitated to meet the requirement of the target distance between the adjacent upper pin header 11 or the adjacent lower pin header 12.

Accordingly, the control module 6 (refer to fig. 1) is configured to: judging whether the actual distance meets the requirement of the target distance; if so, keeping the upper pressing pin row 11 and/or the lower pressing pin row 12 still so that the subsequent control module 6 controls the upper pressing pins 21 and the lower pressing pins 22 to be electrically connected with the main grid contacts of the solar cell; if not, the control module 6 generates a distance difference value based on the target distance and the actual distance, and controls the upper pincer row 11 and/or the lower pincer row 12 to move according to the distance difference value until the actual distance is equal to the target distance.

In addition, in the process of testing the electrical performance of the solar cell, the pin header ranging module 40 may also start automatic detection every 2 hours according to a detection period set in advance, for example, to determine whether the position of the pin header is abnormally deviated, if so, an abnormal signal may be fed back to the upper computer 7 (refer to fig. 1) through the control module, to prompt that the position of the pin header is abnormal, and prompt whether automatic adjustment is performed, and if an automatic adjustment function is started, the control module 6 may perform automatic position calibration on the pin header according to a recently entered target distance. In addition, the main grid width value of the solar cell to be tested can be recorded into the control module 6, so that whether the dislocation of the pressing pins and the main grid exceeds 50% of the main grid width or not is judged according to the actual distance tested by the pressing pin row distance measuring module 40; if the misalignment between the presser pins and the main grid exceeds 50% of the width of the main grid, the actual distance between the adjacent upper presser pin row 11 and the adjacent lower presser pin row 12 also needs to be adjusted.

The pin header ranging module 40 will be described in detail below. Referring to fig. 4, the piezo pin header ranging module 40 includes a ranging transmission structure 41 and a ranging reception structure 42; the ranging transmitting structure 41 is used for transmitting ranging signals to the ranging receiving structure 42; the ranging receiving structure 42 is used for receiving ranging signals; the distance measuring and transmitting structure 41 is located on one of two opposite side walls of the adjacent upper presser finger row 11 or the adjacent lower presser finger row 12, and the distance measuring and receiving structure 42 is located on the other of two opposite side walls of the adjacent upper presser finger row 11 or the adjacent lower presser finger row 12. In other words, every two adjacent needle bars are used as a group, namely N needle bars share (N-1) groups, and the opposite side walls of the two needle bars of each group are respectively provided with the distance measuring transmitting structure 41 and the distance measuring receiving structure 42.

In some embodiments, the ranging transmission structure 41 may transmit an optical-electrical signal to the ranging reception structure 42. Control module 6 is further configured to determine the actual spacing between adjacent upper pin header 11 and adjacent lower pin header 12 based on the time at which ranging receiving structure 42 receives the optical signal. In addition, the control module 6 is also used for adjusting the spacing between adjacent upper presser finger rows 11 and/or lower presser finger rows 12 to a target spacing according to the actual spacing. Therefore, the upper pin header 11 and the lower pin header 12 which move automatically can be automatically matched with the screen solar cells with different main grid pitches, manual adjustment is avoided, and generation efficiency is improved.

Each side wall of the upper pin header 11 and/or each side wall of the lower pin header 12 is provided with a plurality of pin header ranging modules 40. In some embodiments, each sidewall may be provided with two pin header ranging modules 40, specifically, for two opposing sidewalls of adjacent upper pin header 11 or adjacent lower pin header 12, one sidewall has two ranging transmitting structures 41 thereon and the other sidewall has two ranging receiving structures 42 thereon. Two pin header ranging modules 40 may be respectively close to two ends of the upper pin header 11 or the lower pin header 12, so that the distance between two ends of the adjacent upper pin header 11 or the adjacent lower pin header 12 may be measured. In other embodiments, each sidewall of the upper pin header 11 and/or each sidewall of the lower pin header 12 may be provided with one pin header ranging module 40 or three or more pin header ranging modules 40.

In some embodiments, referring to fig. 5, the test device may further include: a plurality of telescopic links 53, each telescopic link 53 connecting an upper presser bar 11 and a lower presser bar 12. A bank of pins ranging module 40 (see fig. 4) is located on one of the upper bank of pins 11 or the lower bank of pins 12; the control module 6 is used for controlling the upper pin header 11 or the lower pin header 12 provided with the pin header ranging module 40 to perform spacing adjustment, and the retractable connecting piece 53 is used for driving the upper pin header 11 or the lower pin header 12 not provided with the pin header ranging module 40 to move. For example, the pin header ranging module 40 is only located on the upper pin header 11, and when the control module 6 adjusts the distance between adjacent upper pin headers 11, the retractable connecting member 53 can drive the lower pin header 12 to move together with the upper pin header 11, so as to reduce the number of the pin header ranging modules 40 and simplify the control process.

The telescopic connecting member 53 may be a cylinder, and when the cylinder is telescopic, the distance between the upper needle bar 11 and the lower needle bar 12 is changed. For example, when testing the solar cell, the air cylinder contracts to reduce the distance between the upper press pin row 11 and the lower press pin row 12, so that the upper press pins 21 and the lower press pins 22 can be pressed with the main grid; after the test is finished, the air cylinder extends to increase the distance between the upper pressing pin row 11 and the lower pressing pin row 12, so that the solar cell piece can be taken out conveniently.

It should be noted that when an upper acupressure needle bank 11 and a lower acupressure needle bank 12 are connected by the retractable connecting member 53, the correspondence relationship therebetween is fixed, and therefore, the upper acupressure needle bank 11 and the lower acupressure needle bank 12 cannot be recombined.

In summary, the transmitting unit 31 or the receiving unit 32 arranged on the upper pressing pin 21 and the lower pressing pin 22 can detect the abnormal upper pressing pin 21 and/or lower pressing pin 22, so as to find abnormal situations such as deflection, bending, dropping, length change and the like of the upper pressing pin 21 and/or lower pressing pin 22 in time, ensure that the solar cell can normally perform electrical performance test, avoid the lower test efficiency and rated power of the solar cell caused by the higher test string resistance due to abnormal pressing pins, and avoid the increase of production cost caused thereby. In addition, the application of the automatic detection function replaces manual point detection of the interrupted time, so that the production cost is reduced while the working efficiency and the accuracy are improved. In addition, the pin header ranging module 40 is also helpful to automatically adjust the pin header position, so as to automatically match solar cells with different main grid pitches.

It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice. Various changes and modifications may be effected therein by one skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (10)

1. A testing device for solar cells is characterized by comprising:

the device comprises an upper needle pressing row and a lower needle pressing row, wherein the upper needle pressing row comprises a plurality of upper needle pressing needles which are arranged at intervals, the lower needle pressing row comprises a plurality of lower needle pressing needles which are arranged at intervals, and the upper needle pressing needles in the upper needle pressing row and the lower needle pressing needles arranged at corresponding positions in the lower needle pressing row form a needle pressing group;

the transmitting unit is arranged on one of the upper pressing pin and the lower pressing pin of the same pressing pin group, the receiving unit is arranged on the other of the upper pressing pin and the lower pressing pin of the same pressing pin group, the transmitting unit is used for transmitting a detection signal to the receiving unit, and the receiving unit is used for receiving the detection signal;

and the control module is used for judging the abnormal state of the upper pressing pin and/or the lower pressing pin in the pressing pin group based on the detection signal.

2. The device for testing the solar cell slice as claimed in claim 1, wherein the two opposite ends of the upper and lower pins are provided with grooves, the emitting unit is disposed in the groove of one of the upper and lower pins of the same pin set, and the receiving unit is disposed in the groove of the other of the upper and lower pins of the same pin set.

3. The device for testing the solar cell according to claim 1, wherein the emitting unit is disposed on an outer wall of one of the upper pressing pin and the lower pressing pin of the same pressing pin group, the receiving unit is disposed on an outer wall of the other of the upper pressing pin and the lower pressing pin of the same pressing pin group, and the emitting unit and the receiving unit are located on the same side of the outer walls of the upper pressing pin and the lower pressing pin.

4. The device for testing the solar cell of claim 1, wherein the control module comprises a first judging unit configured to: judging whether the receiving unit receives the detection signal; if so, generating a first normal signal, wherein the first normal signal represents that the upper pressing pin and/or the lower pressing pin are/is not separated or deviated; and if not, generating a first abnormal signal which represents the abnormality that the upper pressing pin and/or the lower pressing pin fall off or shift.

5. The device for testing the solar cell of claim 4, wherein the control module further comprises an acquisition unit and a second judgment unit;

if the first judging unit generates the first normal signal, the first judging unit is further configured to: sending the detection signal to the acquisition unit;

the acquisition unit is configured to: acquiring the detection signal sent by the first judgment unit, and acquiring the distance between the upper pressing pin and the lower pressing pin based on the detection signal;

the second determination unit is configured to: judging whether the distance between the upper pressing pin and the lower pressing pin acquired by the acquisition unit exceeds a threshold range or not; if so, generating a second abnormal signal which represents the abnormality of the length change of the upper pressing pin and/or the lower pressing pin; and if not, generating a second normal signal which represents that the upper pressing pin and/or the lower pressing pin is not subjected to the abnormity of length change.

6. The testing device of the solar cell piece according to claim 1, wherein the testing device comprises a plurality of upper pin banks arranged at intervals and a plurality of lower pin banks arranged corresponding to the upper pin banks;

further comprising: the needle bar distance measuring module is arranged on the upper needle bar and/or the lower needle bar and is used for measuring the actual distance between the adjacent upper needle bar or the adjacent lower needle bar;

the control module is configured to: judging whether the actual distance meets the requirement of a target distance;

if so, the upper needle bar and/or the lower needle bar are kept static;

if not, the control module generates a distance difference value based on the target distance and the actual distance, and controls the upper needle bar and/or the lower needle bar to move according to the distance difference value until the actual distance is equal to the target distance.

7. The device for testing the solar cell slice as claimed in claim 6, wherein the pin bank ranging module comprises a ranging transmitting structure and a ranging receiving structure; the distance measuring transmitting structure is positioned on one of two opposite side walls adjacent to the upper needle pressing row or the lower needle pressing row, and the distance measuring receiving structure is positioned on the other of two opposite side walls adjacent to the upper needle pressing row or the lower needle pressing row.

8. The solar cell testing device according to claim 6, further comprising: each telescopic connecting piece is connected with one upper needle pressing row and one lower needle pressing row;

the needle bar distance measuring module is positioned on one of the upper needle bar or the lower needle bar;

the control module is used for controlling and is provided with the last acusector or the acusector carries out the interval adjustment down of acusector distance measuring module, just telescopic connection spare is used for driving and is not provided with acusector distance measuring module go up the acusector or the acusector moves down.

9. The device for testing the solar cell slice of claim 6, wherein each side wall of the upper pin header and/or each side wall of the lower pin header is provided with a plurality of the pin header ranging modules.

10. The solar cell testing device according to claim 1, further comprising: the main grid distance measuring module is used for measuring the distance between the adjacent main grids on the front and/or back of the solar cell and sending the distance between the adjacent main grids to the control module.

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