CN113310351B - Method and system for calibrating precision of electronic division and assembly meter - Google Patents
Method and system for calibrating precision of electronic division and assembly meter Download PDFInfo
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- CN113310351B CN113310351B CN202110595483.4A CN202110595483A CN113310351B CN 113310351 B CN113310351 B CN 113310351B CN 202110595483 A CN202110595483 A CN 202110595483A CN 113310351 B CN113310351 B CN 113310351B
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G1/00—Sighting devices
- F41G1/06—Rearsights
- F41G1/16—Adjusting mechanisms therefor; Mountings therefor
Abstract
The invention relates to a method and a system for calibrating the precision of an electronic division assembling meter, wherein the method comprises the steps of averagely dividing the whole view field into four symmetrical sub view fields, and carrying out S-shaped line test in any sub view field to obtain theodolite data; carrying out data fitting on theodolite data to obtain a dense bit value of a pixel point; dividing the whole view field image into a plurality of blocks, and respectively setting corresponding secret bit conversion parameters for each block; calculating the impact point secret offset value of the pixel point according to the secret value of the pixel point; and converting the impact point dense-bit deviation value of the pixel point into the impact point dense-bit deviation value coordinate based on the dense-bit conversion parameter of the block where the pixel point is located. According to the invention, only part of the sight field is tested, so that the test efficiency can be effectively improved under the condition of ensuring the test effect; corresponding dense bit conversion parameters are set in different blocks, and corresponding angles corresponding to each pixel are converted, so that errors caused by lens distortion are greatly made up, and the tabulation precision of electronic division is improved.
Description
Technical Field
The invention relates to the field of calibration of sighting devices, in particular to a method and a system for calibrating the precision of an electronic division mounted meter.
Background
The sighting telescope is used for helping a user to accurately, conveniently and quickly hit a target. To achieve this, a divider is typically used to help the user locate the target and provide other aids such as distance measurements. The aiming capability of the sighting device is a key index for measuring the performance of the sighting device, the distance of the target aimed by the sighting device corresponding to the instrument loading amount takes the secret bit as a unit, and if the instrument loading amount of the sighting device is unstable and inaccurate, the hitting error of a weapon system is directly influenced. Therefore, it is important to calibrate the accuracy of the electronic division table.
The meter mounting precision is a key judgment index in the design test stage of the sight, and measures the precision error between the angular displacement calibrated by a sight display system and the actual angular displacement of a target deviating from a sight line. At present, a calibration method for meter installation precision generally adopts a mode of reading high-precision rotation quantity of a two-dimensional turntable, but the method is inevitably limited by large errors caused by the field of stepping motor step length, gear backlash, electric pulse loss and the like of the two-dimensional turntable, and the electric two-dimensional turntable needs to be continuously aligned in a certain subdivided step length under the control of a computer or a controller, so that the operation process has certain operation difficulty and the calibration efficiency is low.
Disclosure of Invention
The invention aims to solve the technical problem of providing a method and a system for calibrating the precision of an electronic division dial-up gauge, which can improve the calibration efficiency and the calibration precision at the same time.
The technical scheme for solving the technical problems is as follows: a method for calibrating the precision of an electronic division mounting meter comprises the following steps;
s1, evenly dividing the whole view field of the sighting telescope into four symmetrical sub view fields, and carrying out S-shaped line test through a theodolite in any sub view field to obtain theodolite data of each test point uniformly distributed on the S-shaped line;
s2, performing data fitting on theodolite data of each test point to obtain a dense bit value of a pixel point of the whole field image;
s3, dividing the whole view field image into a plurality of blocks, and respectively setting corresponding secret bit conversion parameters for each block;
s4, calculating the impact point secret offset value of any pixel point in the whole view field image according to the secret value of the pixel point;
s5, converting the impact point dense offset value of the pixel point into the impact point dense offset value coordinate based on the dense conversion parameter of the block where the pixel point is located;
and S6, calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
On the basis of the technical scheme, the invention can be further improved as follows.
Further, in S1, the specific implementation of averagely dividing the entire field of view of the sight into four symmetrical subfields is that the first dividing axis and the second dividing axis that cross each other are used to averagely divide the entire field of view of the sight into four symmetrical subfields, and an intersection point of the first dividing axis and the second dividing axis is an electronic dividing center of the sight.
Further, in the step S1, the specific steps of performing the S-shaped line test by the theodolite are,
s11, adjusting the theodolite to enable the theodolite to be in a leveling state in the horizontal and vertical directions;
s12, aiming the theodolite in a leveling state at the sighting device, enabling the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s13, taking the electronic division center of the sighting telescope as a starting point, keeping the coordinate value of the second division axis unchanged, moving the electronic division of the theodolite to the current test point in a first preset direction of the first division axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting telescope, and recording the reading of the theodolite at the moment;
s14, repeatedly executing the S13 by taking the current test point in the S13 as a starting point until the current test point is a critical point of the whole field of view on a first dividing axis;
s15, taking the critical point in the S14 as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s16, taking the current test point in the S15 as a starting point, keeping the coordinate value of the second dividing axis unchanged, moving the electronic division of the theodolite to the current test point in a second preset direction of the first dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s17, repeatedly executing the S16 by taking the current test point in the S16 as a starting point until the current test point is positioned on a second dividing axis;
s18, taking the current test point on the second dividing axis as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s19, repeatedly executing the S13 to the S18 by taking the current test point in the S18 as a starting point until the current test point in the S18 is a critical point of the whole field of view on a second division axis, and completing the S-type line test in any sub-field of view;
the first preset direction is opposite to the second preset direction, and the recorded reading of the theodolite at each time is theodolite data of the corresponding test point on the S-shaped wire.
Further, S11 specifically includes adjusting a base adjustment knob of the theodolite to allow electronic bubbles of the theodolite to be respectively located at the center of the circular level and the center of the long level, and at this time, the theodolite is in a leveling state in the horizontal and vertical directions.
Further, in S13 to S19, the theodolite is adjusted such that the electronic division center of the theodolite coincides with the electronic division center of the sight, specifically, the fine movement hand wheel of the theodolite is adjusted such that the electronic division center of the theodolite coincides with the electronic division center of the sight.
Further, the theodolite data are specifically azimuth angles and pitch angles obtained through theodolite measurement.
Further, in S4, specifically,
s41, selecting two pixel points in the whole view field image optionally, wherein the distance between the two selected pixel points meets the preset distance, one of the pixel points is used as an origin, and the other pixel point is used as a reference point;
s42, performing linear interpolation on the secret bit value of the origin and the secret bit value of the reference point, and fitting the corresponding relation between the pixel of the origin and the angle;
s43, calculating the corresponding relation between the pixel of the origin and the angle based on a trajectory calculation method to obtain the impact point secret offset value of the origin;
wherein, the origin is any pixel point in the whole view field image.
Further, in S5, specifically,
s51, forming a coefficient matrix of the corresponding relation between the coordinate points and the secret bits according to the secret bit conversion parameters of all the blocks;
s52, searching in the coefficient matrix according to the coordinate of the origin, and finding out the secret bit conversion parameter of the block to which the origin belongs;
and S53, converting the impact point close-position deviation value of the original point according to the close-position conversion parameter of the block to which the original point belongs to obtain the impact point close-position deviation value coordinate of the original point.
Further, in step S6, the coordinates of the impact point close-position offset value of the origin point are added to the coordinates of the origin point to obtain the coordinates of the impact point of the origin point, and the coordinates of the impact point of the origin point are calibrated in the screen.
Based on the method for calibrating the precision of the electronic division mounted meter, the invention also provides a system for calibrating the precision of the electronic division mounted meter.
An electronic division mounting meter precision calibration system comprises the following modules,
the S-shaped line testing module is used for averagely dividing the whole field of view of the sighting telescope into four symmetrical sub-fields of view, and in any sub-field of view, carrying out S-shaped line testing through the theodolite to obtain theodolite data of all testing points uniformly distributed on the S-shaped line;
the data fitting module is used for performing data fitting on the theodolite data of each test point to obtain a dense bit value of a pixel point of the whole view field image;
the block division and parameter setting module is used for dividing the whole view field image into a plurality of blocks and respectively setting corresponding secret bit conversion parameters for each block;
the impact point dense-bit deviation value calculation module is used for calculating the impact point dense-bit deviation value of any pixel point in the whole view field image according to the dense-bit value of the pixel point;
the impact point dense-bit deviation value conversion module is used for converting the impact point dense-bit deviation value of the pixel point into the impact point dense-bit deviation value coordinate based on the dense-bit conversion parameter of the block where the pixel point is located;
and the impact point coordinate calibration module is used for calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
The invention has the beneficial effects that: according to the method and the system for calibrating the precision of the electronic division dress table, the symmetrical characteristic of the sight field is utilized, only the 1/4 sight field is tested, the number of test points can be effectively reduced as much as possible under the condition that the test effect is guaranteed, the test process is simplified, and the test efficiency is improved; the test points are uniformly and regularly distributed, the test data is convenient to arrange, and the reliability is high; in the process of converting the impact point dense bit deviation value, the corresponding dense bit conversion parameters are set in different blocks instead of using uniform dense bit conversion parameters, and the corresponding angle of each pixel is converted, so that the error caused by lens distortion is greatly compensated, and the tabulation precision of electronic division is improved.
Drawings
FIG. 1 is a block diagram of the overall process of a method for calibrating the accuracy of an electronic division and packaging meter according to the present invention;
FIG. 2 is a flow chart of S-shaped line testing in the method for calibrating the accuracy of the electronic division mounting table according to the present invention;
fig. 3 is a schematic diagram of an S-type line formed by performing an S-type line test in the present embodiment;
FIG. 4 is a block diagram of the electronic partition table precision calibration system of the present invention.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
As shown in FIG. 1, a method for calibrating the accuracy of an electronic division chart comprises the following steps S1-S6;
and S1, evenly dividing the whole view field of the sighting telescope into four symmetrical sub view fields, and carrying out S-shaped line test through the theodolite in any sub view field to obtain theodolite data of all test points uniformly distributed on the S-shaped line.
In S1, the specific implementation of averagely dividing the entire field of view of the collimator into four symmetrical sub-fields of view is that the first dividing axis and the second dividing axis which cross each other are used to averagely divide the entire field of view of the collimator into four symmetrical sub-fields of view, and an intersection point of the first dividing axis and the second dividing axis is an electronic dividing center of the collimator.
As shown in fig. 2, in the S1, the specific steps of performing the S-shaped line test by the theodolite are,
s11, adjusting the theodolite to enable the theodolite to be in a leveling state in the horizontal and vertical directions; the specific scheme of the S11 is that the base adjusting knob of the theodolite is adjusted to enable the electronic bubble of the theodolite to be respectively positioned at the centers of the circular level and the long level, and at the moment, the theodolite is in a leveling state in the horizontal and vertical directions;
s12, aiming the theodolite in a leveling state at the sighting device, enabling the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment (the reading of the theodolite is specifically the azimuth angle and the pitch angle displayed on the theodolite);
s13, taking the electronic division center of the sighting device as a starting point, keeping the coordinate value of the second division axis unchanged, moving the electronic division of the theodolite to the current test point in a first preset direction of the first division axis by a preset step length (at the moment, the separation of the two division centers can be seen in the field of view of the theodolite), adjusting the theodolite (specifically, adjusting a micro-motion hand wheel of the theodolite), enabling the electronic division center of the theodolite to be coincident with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s14, repeatedly executing the S13 by taking the current test point in the S13 as a starting point until the current test point is a critical point of the whole field of view on a first dividing axis;
s15, taking the critical point in the S14 as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s16, taking the current test point in the S15 as a starting point, keeping the coordinate value of the second dividing axis unchanged, moving the electronic division of the theodolite to the current test point in a second preset direction of the first dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s17, repeatedly executing the S16 by taking the current test point in the S16 as a starting point until the current test point is positioned on a second dividing axis;
s18, taking the current test point on the second dividing axis as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s19, repeatedly executing the S13 to the S18 by taking the current test point in the S18 as a starting point until the current test point in the S18 is a critical point of the whole field of view on a second division axis, and completing the S-type line test in any sub-field of view;
the first preset direction is opposite to the second preset direction, and the recorded reading of the theodolite at each time is theodolite data of the corresponding test point on the S-shaped wire.
The specific procedure of the S-shaped line test is described below with an example of a resolution of 1024 × 768 over the entire field of view of the collimator.
Since the resolution of the whole field of view of the collimator is 1024 × 768 and is symmetrical, the whole field of view of the collimator is averagely divided into four symmetrical sub-fields by adopting a first dividing axis and a second dividing axis which are crossed in a cross manner, the first dividing axis is an X axis, the second dividing axis is a Y axis, and the intersection point of the X axis and the Y axis is (512, 0).
The first step is to adjust the base adjusting knob of the theodolite to make the electronic bubble respectively in the center of the round level and the long level, at this time, the theodolite is regarded as being in the leveling state in the horizontal and vertical directions.
And secondly, enabling the electronic division center (512,0) of the sighting telescope to coincide with the electronic division center of the theodolite, recording the numerical value of the theodolite at the moment, and taking the numerical value as the data record of the first test point.
Third, using (512,0) as a starting point, the electronic division of the theodolite is horizontally moved in a step size of 50pix (which is a preset step size in this embodiment) to the negative direction of the X axis (which is a first division axis in this embodiment) (which is a first preset direction in this embodiment), and this is used as a next test point. At the moment, the fact that the two division centers are separated can be seen in the field of view of the theodolite, the electronic division center of the theodolite is completely overlapped with the electronic division center of the sighting telescope by adjusting the micro-motion hand wheel, the azimuth angle and the pitch angle on the display screen of the theodolite are read out, and data records of a second test point are obtained.
Fourthly, repeating the third step; and moving the electronic division of the theodolite 50pix in the negative direction of the X axis to reach the next test point, and sequentially recording the reading of the theodolite each time.
And fifthly, moving the electronic partition of the theodolite to the negative direction of the X axis to the left side of the X axis, wherein the last test point on the left side of the X axis is a critical point of the whole field of view, keeping the coordinate value of the X axis unchanged after reaching the critical point of the field of view on the left side of the sighting telescope, moving the electronic partition of the theodolite to the positive direction (which is the preset direction in the specific embodiment) of the Y axis (which is the second partition axis in the specific embodiment) by 50pix, and recording data by taking the position at the moment as the test point.
Sixthly, keeping the coordinate value of the Y axis of the electronic division of the theodolite unchanged, then horizontally moving to the positive direction of the x axis (which is the second preset direction in the embodiment) by a step length of 50pix, and recording data by taking the position at the moment as a test point.
And seventhly, repeating the sixth step until the electronic division of the theodolite reaches a position 50pix above the starting point, keeping the coordinate value of the X axis unchanged, and moving the theodolite 50pix to the Y axis in the positive direction to serve as the next test point and record data.
And eighthly, repeatedly executing the third step to the seventh step by taking the test points in the seventh step as starting points, and finishing the data record of the azimuth angle and the pitch angle of each test point in the quarter-field of view in an S-shaped line test mode.
The S-shaped line formed with this embodiment is shown in fig. 3; wherein the S-shaped line is positioned in the second quadrant.
In other embodiments, the first dividing axis may also be a Y-axis, and the second dividing axis may also be an X-axis.
In other embodiments, the first predetermined direction may be a negative direction, and the second predetermined direction may be a positive direction.
In other embodiments, the predetermined direction may be negative.
In other embodiments, the preset step length can be reasonably set according to actual needs.
And S2, performing data fitting on the theodolite data of each test point to obtain the density value of the pixel point of the whole field image.
Because the whole field of view of the sighting telescope is symmetrical and the test points during the S-shaped test are uniformly distributed, the densometer value of the whole field of view can be fitted by one fourth of the whole field of view.
And S3, dividing the whole view field image into a plurality of blocks, and respectively setting corresponding secret bit conversion parameters for each block.
In consideration of lens distortion factors, in a frame of image, the conversion relation between pixel point coordinates and density bits at different positions in the image is different, and a single algorithm cannot be adopted for conversion; therefore, the invention divides the whole view field into a plurality of blocks, and each block is provided with the corresponding secret bit conversion parameter, thereby greatly reducing the influence of lens distortion on the secret bit conversion parameter.
And S4, calculating the impact point secret offset value of any pixel point in the whole view field image according to the secret value of the pixel point.
Specifically, the step S4 is,
s41, selecting two pixel points in the whole view field image, and the distance between the two selected pixel points satisfies a preset distance, and using one of the pixel points as an origin and the other one as a reference point (in this specific embodiment, the reference point is far from the origin, and the distance between the reference point and the origin is considered to be above a preset distance value or within a preset distance range value when the preset distance is satisfied);
s42, performing linear interpolation on the secret bit value of the origin and the secret bit value of the reference point, and fitting the corresponding relation between the pixel of the origin and the angle;
s43, calculating the corresponding relation between the pixel of the origin and the angle based on a trajectory calculation method to obtain the impact point secret offset value of the origin;
wherein, the origin is any pixel point in the whole view field image.
S5, based on the secret conversion parameter of the block where the pixel point is located, converting the impact point secret deviant of the pixel point into the impact point secret deviant coordinate.
Specifically, the step S5 is,
s51, forming a coefficient matrix of the corresponding relation between the coordinate points and the secret bits according to the secret bit conversion parameters of all the blocks;
s52, searching in the coefficient matrix according to the coordinate of the origin, and finding out the secret bit conversion parameter of the block to which the origin belongs;
and S53, converting the impact point close-position deviation value of the original point according to the close-position conversion parameter of the block to which the original point belongs to obtain the impact point close-position deviation value coordinate of the original point.
It should be noted that: the more detailed the blocks divided by the whole view field image are, the more accurate the obtained coordinate points and dense bit values are.
And S6, calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
The step S6 is specifically to add the coordinates of the origin to the coordinates of the impact point dense offset value of the origin to obtain the coordinates of the impact point of the origin, and to mark the coordinates of the impact point of the origin in the screen. For example, the coordinate of the marked impact point is displayed at the lower right corner of the image, the position of the impact point can be manually adjusted by moving the key up, down, left and right, and the moving step length is one pixel.
According to the electronic division mounting meter precision calibration method, the symmetrical characteristic of the sight field is utilized, only the 1/4 sight field is tested, the number of test points can be effectively reduced as much as possible under the condition that the test effect is guaranteed, the test process is simplified, and the test efficiency is improved; the test points are uniformly and regularly distributed, the test data is convenient to arrange, and the reliability is high; in the process of converting the impact point dense bit deviation value, the corresponding dense bit conversion parameters are set in different blocks instead of using uniform dense bit conversion parameters, and the corresponding angle of each pixel is converted, so that the error caused by lens distortion is greatly compensated, and the tabulation precision of electronic division is improved.
Based on the method for calibrating the precision of the electronic division mounted meter, the invention also provides a system for calibrating the precision of the electronic division mounted meter.
As shown in fig. 4, an electronic division table precision calibration system is used for implementing the above electronic division table precision calibration method, and the system of the present invention includes the following modules,
the S-shaped line testing module is used for averagely dividing the whole field of view of the sighting telescope into four symmetrical sub-fields of view, and in any sub-field of view, carrying out S-shaped line testing through the theodolite to obtain theodolite data of all testing points uniformly distributed on the S-shaped line;
the data fitting module is used for performing data fitting on the theodolite data of each test point to obtain a dense bit value of a pixel point of the whole view field image;
the block division and parameter setting module is used for dividing the whole view field image into a plurality of blocks and respectively setting corresponding secret bit conversion parameters for each block;
the impact point dense-bit deviation value calculation module is used for calculating the impact point dense-bit deviation value of any pixel point in the whole view field image according to the dense-bit value of the pixel point;
the impact point dense-bit deviation value conversion module is used for converting the impact point dense-bit deviation value of the pixel point into the impact point dense-bit deviation value coordinate based on the dense-bit conversion parameter of the block where the pixel point is located;
and the impact point coordinate calibration module is used for calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
According to the electronic division dress table precision calibration system, the symmetrical characteristic of the sight field is utilized, only the 1/4 sight field is tested, the number of test points can be effectively reduced as much as possible under the condition that the test effect is guaranteed, the test process is simplified, and the test efficiency is improved; the test points are uniformly and regularly distributed, the test data is convenient to arrange, and the reliability is high; in the process of converting the impact point dense bit deviation value, the corresponding dense bit conversion parameters are set in different blocks instead of using uniform dense bit conversion parameters, and the corresponding angle of each pixel is converted, so that the error caused by lens distortion is greatly compensated, and the tabulation precision of electronic division is improved.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (10)
1. A method for calibrating the precision of an electronic division and assembly meter is characterized by comprising the following steps: comprises the following steps;
s1, evenly dividing the whole view field of the sighting telescope into four symmetrical sub view fields, and carrying out S-shaped line test through a theodolite in any sub view field to obtain theodolite data of each test point uniformly distributed on the S-shaped line;
s2, performing data fitting on theodolite data of each test point to obtain a dense bit value of a pixel point of the whole field image;
s3, dividing the whole view field image into a plurality of blocks, and respectively setting corresponding secret bit conversion parameters for each block;
s4, calculating the impact point secret offset value of any pixel point in the whole view field image according to the secret value of the pixel point;
s5, converting the impact point dense offset value of the pixel point into the impact point dense offset value coordinate based on the dense conversion parameter of the block where the pixel point is located;
and S6, calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
2. The method for calibrating the accuracy of the electronic division chart according to claim 1, characterized in that: in S1, the specific implementation of averagely dividing the entire field of view of the collimator into four symmetrical sub-fields of view is that the first dividing axis and the second dividing axis which cross each other are used to averagely divide the entire field of view of the collimator into four symmetrical sub-fields of view, and an intersection point of the first dividing axis and the second dividing axis is an electronic dividing center of the collimator.
3. The method for calibrating the accuracy of the electronic division chart according to claim 2, characterized in that: in S1, the specific steps of performing the S-shaped line test by the theodolite are,
s11, adjusting the theodolite to enable the theodolite to be in a leveling state in the horizontal and vertical directions;
s12, aiming the theodolite in a leveling state at the sighting device, enabling the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s13, taking the electronic division center of the sighting telescope as a starting point, keeping the coordinate value of the second division axis unchanged, moving the electronic division of the theodolite to the current test point in a first preset direction of the first division axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting telescope, and recording the reading of the theodolite at the moment;
s14, repeatedly executing the S13 by taking the current test point in the S13 as a starting point until the current test point is a critical point of the whole field of view on a first dividing axis;
s15, taking the critical point in the S14 as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s16, taking the current test point in the S15 as a starting point, keeping the coordinate value of the second dividing axis unchanged, moving the electronic division of the theodolite to the current test point in a second preset direction of the first dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s17, repeatedly executing the S16 by taking the current test point in the S16 as a starting point until the current test point is positioned on a second dividing axis;
s18, taking the current test point on the second dividing axis as a starting point, keeping the coordinate value of the first dividing axis unchanged, moving the electronic division of the theodolite to the current test point in the preset direction of the second dividing axis by a preset step length, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, and recording the reading of the theodolite at the moment;
s19, repeatedly executing the S13 to the S18 by taking the current test point in the S18 as a starting point until the current test point in the S18 is a critical point of the whole field of view on a second division axis, and completing the S-type line test in any sub-field of view;
the first preset direction is opposite to the second preset direction, and the recorded reading of the theodolite at each time is theodolite data of the corresponding test point on the S-shaped wire.
4. The method for calibrating the accuracy of the electronic division chart according to claim 3, characterized in that: s11 specifically is adjusting the base adjustment knob of the theodolite so that the electronic bubble of the theodolite is respectively at the center of the circular level and the long level, and the theodolite is now in a leveling state in the horizontal and vertical directions.
5. The method for calibrating the accuracy of the electronic division chart according to claim 3, characterized in that: and S13 to S19, adjusting the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device, specifically, adjusting a micro-motion hand wheel of the theodolite to enable the electronic division center of the theodolite to coincide with the electronic division center of the sighting device.
6. The electronic division chart precision calibration method according to any one of claims 1 to 5, characterized in that: the theodolite data are specifically azimuth angles and pitch angles obtained through theodolite measurement.
7. The method for calibrating the accuracy of the electronic division chart according to claim 6, wherein: specifically, the step S4 is,
s41, selecting two pixel points in the whole view field image optionally, wherein the distance between the two selected pixel points meets the preset distance, one of the pixel points is used as an origin, and the other pixel point is used as a reference point;
s42, performing linear interpolation on the secret bit value of the origin and the secret bit value of the reference point, and fitting the corresponding relation between the pixel of the origin and the angle;
s43, calculating the corresponding relation between the pixel of the origin and the angle based on a trajectory calculation method to obtain the impact point secret offset value of the origin;
wherein, the origin is any pixel point in the whole view field image.
8. The method for calibrating the accuracy of the electronic division chart according to claim 7, wherein: specifically, the step S5 is,
s51, forming a coefficient matrix of the corresponding relation between the coordinate points and the secret bits according to the secret bit conversion parameters of all the blocks;
s52, searching in the coefficient matrix according to the coordinate of the origin, and finding out the secret bit conversion parameter of the block to which the origin belongs;
and S53, converting the impact point close-position deviation value of the original point according to the close-position conversion parameter of the block to which the original point belongs to obtain the impact point close-position deviation value coordinate of the original point.
9. The method for calibrating the accuracy of the electronic division chart according to claim 8, wherein: the step S6 is specifically to add the coordinates of the origin to the coordinates of the impact point dense offset value of the origin to obtain the coordinates of the impact point of the origin, and to mark the coordinates of the impact point of the origin in the screen.
10. The utility model provides an electronic graduation dress table precision calibration system which characterized in that: comprises the following modules which are used for realizing the functions of the system,
the S-shaped line testing module is used for averagely dividing the whole field of view of the sighting telescope into four symmetrical sub-fields of view, and in any sub-field of view, carrying out S-shaped line testing through the theodolite to obtain theodolite data of all testing points uniformly distributed on the S-shaped line;
the data fitting module is used for performing data fitting on the theodolite data of each test point to obtain a dense bit value of a pixel point of the whole view field image;
the block division and parameter setting module is used for dividing the whole view field image into a plurality of blocks and respectively setting corresponding secret bit conversion parameters for each block;
the impact point dense-bit deviation value calculation module is used for calculating the impact point dense-bit deviation value of any pixel point in the whole view field image according to the dense-bit value of the pixel point;
the impact point dense-bit deviation value conversion module is used for converting the impact point dense-bit deviation value of the pixel point into the impact point dense-bit deviation value coordinate based on the dense-bit conversion parameter of the block where the pixel point is located;
and the impact point coordinate calibration module is used for calibrating the impact point coordinate of the pixel point based on the impact point dense offset value coordinate of the pixel point.
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