CN113254027B - Semiconductor device control program conversion method, system, device and storage medium - Google Patents
Semiconductor device control program conversion method, system, device and storage medium Download PDFInfo
- Publication number
- CN113254027B CN113254027B CN202110549161.6A CN202110549161A CN113254027B CN 113254027 B CN113254027 B CN 113254027B CN 202110549161 A CN202110549161 A CN 202110549161A CN 113254027 B CN113254027 B CN 113254027B
- Authority
- CN
- China
- Prior art keywords
- test
- file
- code
- row
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 32
- 239000004065 semiconductor Substances 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 131
- 230000015654 memory Effects 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 abstract description 7
- 238000011161 development Methods 0.000 abstract description 2
- 238000012545 processing Methods 0.000 description 8
- 238000010276 construction Methods 0.000 description 3
- 238000004590 computer program Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/40—Transformation of program code
- G06F8/51—Source to source
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/70—Software maintenance or management
- G06F8/76—Adapting program code to run in a different environment; Porting
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention belongs to the technical field of program code conversion, and particularly discloses a semiconductor device control program conversion method, which comprises the steps of capturing test program files; splitting the test program file row by row to acquire code information of each row; splitting to obtain single test instruction information and setting test instruction parameters; carrying out semantic library matching on the parameter instruction to generate a target result; outputting a test code corresponding to the target test platform. The invention provides a method for converting a test program into a test platform, which ensures that the realization of the same test program on different test platforms is simple and efficient, greatly reduces the complexity of manual operation, improves the development efficiency of the test program and reduces the method for converting the test program into the test platform.
Description
Technical Field
The present invention relates to the field of program code conversion technology, and in particular, to a method, a system, an apparatus, and a storage medium for converting a control program of a semiconductor device.
Background
Program development is based on different platforms, and to realize cross-platform of program codes, the traditional method is to issue interpreters specially used for interpreting intermediate languages generated after compiling the program on different program running platforms. The interpreter masks the variability of the related platforms, and when the program runs on different platforms, the interpreter generates a program file which can finally run on different platforms.
The existing cross-platform technology aims at the executable environment of a programming language, aims at the fact that the programming language is unchanged, but can run on different operating systems or hardware platforms, but aims at the semiconductor test field, the bottom layer interface of each test platform is not open to the outside, each test platform can have unique special test instructions which can be recognized by a tester for testing, and cross-platform programming in the traditional sense cannot realize cross-platform implementation of test programs.
Therefore, it is a technical problem to be solved by those skilled in the art to provide a method for converting semiconductor processes.
Disclosure of Invention
The invention aims to overcome the defect that the cross-platform test program cannot be realized aiming at the semiconductor test field in the prior art, and provides a semiconductor device control program conversion method, a system, electronic equipment and a storage medium.
In a first aspect of the present invention, there is provided a semiconductor device control program conversion method including:
Grabbing a test program file;
splitting the test program file row by row to acquire code information of each row;
splitting the code information of each row, acquiring single test instruction information, and setting test instruction parameters;
performing semantic library matching on the test instruction parameters to generate a target result;
outputting a test code corresponding to the target test platform.
Further, the test program file includes: pin resource files, main test files, resource relationship correspondence files and time sequence files.
The further scheme is that splitting the code information of each row, and obtaining the single test instruction information specifically comprises: splitting each row of code information of the resource relation corresponding file by using a first element and a second element to obtain single setting instruction information; splitting each row of code information of the pin resource file by a first element to obtain single test instruction information; splitting each row of code information of the main test file by a first element and a second element to obtain single setting instruction information; dividing the time sequence file by taking groups as units to obtain serial numbers of the groups, then dividing units by taking each group as a target source to obtain unit file information, and then splitting the unit file information to obtain single setting instruction information.
The method comprises the further steps of using acquired single test instruction information as an incoming parameter, matching in a semantic library of a target test platform, after the single test instruction information is successfully matched with corresponding test code information, using the test instruction parameter as the incoming parameter to perform test parameter matching, returning a test code main body and a test code parameter corresponding to the target test platform after the whole test instruction information is successfully matched, wherein the semantic library comprises a data structure of a syntax element of a semiconductor test platform.
In a second aspect of the present invention, there is provided a semiconductor program rapid conversion construction system comprising:
the test program grabbing module is used for grabbing test program files;
The program code splitting module is used for splitting the source code file row by row to acquire code information of each row;
The parameter generation module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for carrying out semantic library matching on the parameter instruction to generate a target result;
And the output module is used for outputting the test code corresponding to the target test platform.
The test program file comprises a pin resource file, a main test file, a resource relation corresponding file and a time sequence file.
In a further aspect, the parameter generating module specifically further includes: splitting each row of code information of the resource relation corresponding file by using a first element and a second element to obtain single setting instruction information; splitting each row of code information of the pin resource file by a first element to obtain single test instruction information; splitting each row of code information of the main test file by a first element and a second element to obtain single setting instruction information; dividing the time sequence file by taking groups as units to obtain serial numbers of the groups, then dividing units by taking each group as a target source to obtain unit file information, and then splitting the unit file information to obtain single setting instruction information.
Further, the semantic library matching module is configured to: and after the matching is successful, the test instruction parameters are used as the input parameters for matching the test code main body and the test code parameters corresponding to the target test platform, and the semantic library matching module comprises a data structure of the grammar elements of the semiconductor test platform.
In a third aspect of the present invention, there is provided an apparatus comprising a processor and a memory, wherein the memory stores program code that, when executed by the processor, causes the processor to perform any of the steps of applying a semiconductor program conversion method described above.
In a fourth aspect of the present invention, a computer readable storage medium is provided, comprising program code for causing an electronic device to perform the steps of any one of the above-mentioned application semiconductor program conversion methods, when said program code is run on the electronic device.
Compared with the prior art, the invention has the beneficial effects that:
The invention provides a method for converting a test program into a test platform, which ensures that the realization of the same test program on different test platforms is simple and efficient, greatly reduces the complexity of manual operation, improves the development efficiency of the test program and reduces the method for converting the test program into the test platform.
According to the invention, the source code files are split row by row and node by node to obtain the test instruction parameters, and then the test codes corresponding to the target test platform are obtained through semantic library matching, so that the cross-platform implementation of the test program in the semiconductor test field is realized.
Drawings
The following drawings are illustrative of the invention and are not intended to limit the scope of the invention, in which:
Fig. 1: the program conversion method of the invention is a flow chart;
fig. 2: another embodiment of the program conversion method of the present invention is a flowchart;
Fig. 3: the invention provides a structural schematic diagram of one embodiment of an electronic device.
Detailed Description
The present invention will be further described in detail with reference to the following specific examples, which are given by way of illustration, in order to make the objects, technical solutions, design methods and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
As shown in fig. 1, in a first aspect of the present invention, there is provided a semiconductor device control program conversion method including:
S10: grabbing a test program file;
s20: splitting the test program file row by row to acquire code information of each row;
S30: splitting to obtain single test instruction information and setting test instruction parameters;
s40: carrying out semantic library matching on the parameter instruction to generate a target result;
s50: outputting a test code corresponding to the target test platform.
As shown in fig. 2, the method of the present invention, when implemented, further comprises the steps of:
In this embodiment, the first element is defined as "; the second element is defined as "()".
1) Capturing a resource relation corresponding file in a test program file, splitting the resource relation corresponding file row by row, acquiring code information of each row, identifying by taking header information of a module code as an identification standard, and if the module code is a test initialization part, carrying out row by row on an initialization setting part of the test program; and splitting to obtain specific information of a single setting instruction, then splitting to obtain a test setting instruction and a setting parameter instruction by using '=', if the user-defined setting instruction is met, keeping unchanged, otherwise, returning by semantic replacement until ending information corresponding to the header information of the module code.
2) And splitting, namely acquiring test channels corresponding to the actual pins of each site, carrying out corresponding platform channel matching and converting the test channels into channel resources of a target platform, wherein the actual pins of the site are kept unchanged until the end information of the corresponding part of the resource pins corresponding to the head information of the module code.
3) If the code block part of the resource pin group is identified, the same method comprises the steps of splitting row by row, splitting the code block part of the resource pin group by the sum of the code block part and the sum of the code block part to obtain the name of the resource pin group and detailed composition parameters, and then carrying out semantic library matching to return a target result generated after conversion.
4) After the code header information allocated to the map is identified, the same code header information is divided row by row, then divided, and the obtained parameter values in the step 1) and the step 2) are placed in a global two-dimensional array, and when the main test file is converted and constructed, the two-dimensional array is used for carrying out parameter setting of REJECT_BIN.
5) Grabbing a Timing file in a test program file, dividing the test program file by taking groups as units to obtain serial numbers of the groups, dividing units by taking each group as a target source to obtain unit file information, and splitting to obtain pin information and corresponding time sequence information. And then, a global relation corresponding table is established by the serial numbers of the groups, the pin information and the time sequence information, and the time sequence setting of the vector file can be carried out by using the corresponding relation table when the conversion construction of the main test file is carried out.
6) Capturing a main file in the whole test program file, splitting the source test program file row by row to obtain code information of each row, and taking the information of each row as a basis; the method comprises the steps of splitting to obtain information of a single test instruction, and splitting to obtain a test code main body and test instruction parameters in a () ".
7) And then, taking the specific information of the single setting instruction obtained in the step 1) as an incoming parameter, matching in a semantic library of a target test platform, and after the corresponding test code information is successfully matched, carrying out test parameter matching by taking the test setting instruction and the setting parameter instruction obtained in the step 1) as the incoming parameter, and returning a test code main body and a test code parameter corresponding to the target test platform after the integral matching is successful.
8) And then carrying out matching output row by row according to the logic, keeping the logic of the data processing flow unchanged when encountering a specific data processing flow, processing test instructions in the flow according to the matching mechanism, then putting the test instructions into the periphery of the logic of the test flow, then carrying out variable and constant processing of a test platform on variable and constant data in the data processing flow, calling the corresponding relation table generated in 5) to carry out matching processing of a target platform if encountering execution of a test vector, then calling the parameter setting of REJECT_BIN in 4) to carry out conversion of the corresponding relation of software and hardware BIN, and then finishing processing to return the data processing flow code of the target test platform.
In a second aspect of the present invention, there is provided a semiconductor program rapid conversion construction system comprising:
the test program grabbing module is used for grabbing test program files;
The program code splitting module is used for splitting the source code file row by row to acquire code information of each row;
The parameter generation module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for carrying out semantic library matching on the parameter instruction to generate a target result;
And the output module is used for outputting the test code corresponding to the target test platform.
Optionally, the test program file includes a pin resource file, a main test file, a resource relationship corresponding file and a time sequence file.
Optionally, the parameter generating module specifically further includes: code information of each row of the resource relation corresponding file is used; splitting the sum ()' to obtain single setting instruction information; code information of each row of the pin resource file is used "; splitting to obtain single test instruction information; code information of each row of the main test file is used "; splitting the sum ()' to obtain single setting instruction information; the time sequence file is divided into groups to obtain serial numbers of the groups, then each group is used as a target source to carry out unit division to obtain unit file information, and then the single setting instruction information is obtained by splitting.
Optionally, the semantic library matching module is configured to: and after the matching is successful, the test instruction parameters are used as the input parameters, the test code main body and the test code parameters corresponding to the target test platform are returned after the overall matching is successful, if the matching is unsuccessful, the test code main body and the test code parameters are output according to the original test program file, and the semantic library matching module comprises a data structure of the grammar elements of the semiconductor test platform.
The present invention also provides an apparatus, as shown in fig. 3, comprising: the semiconductor device control device comprises at least one processor and a memory communicatively connected with the at least one processor, wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to cause the at least one processor to perform the semiconductor device control program conversion method.
Specifically, the memory and the processor can be general-purpose memories and processors, and are not particularly limited herein, and when the processor runs a computer program stored in the memory, the semiconductor program conversion method can be executed, so that cross-platform of a semiconductor test program can be realized, and the labor efficiency can be greatly improved.
The present invention also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the semiconductor device control program conversion method. The specific implementation may refer to a method embodiment, which is not described herein.
It should be noted that, the main test file mentioned in the above method is the main body of the test program, and includes history version information, all test item module statements, specific flow of each test item, test platform grammar rule, test logic, special function definition, partition information, and the like. The pin resource file is a pin definition file of an IC hardware entity in software, namely, pin definition and description of the IC. The resource relation corresponding file comprises a corresponding relation between a hardware entity of the test platform and IC pin definition in software, a vector file statement, machine resource and parameter setting, software and hardware partition bin setting, external relay definition, a special test flow and the like. The Timing file (Timing file) contains Timing information of the vector file during operation, such as the type of Timing (NF, RZ, NRZ, etc.), rising edge and falling edge, setting of sampling point, setting of delay, etc., and the depth is 2, and a plurality of small packets are contained in a plurality of large groups. Header information of the module code: refers to the start flag portion of each function in the test program.
The foregoing description of embodiments of the invention has been presented for purposes of illustration and description, and is not intended to be exhaustive or limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the various embodiments described. The terminology used herein was chosen in order to best explain the principles of the embodiments, the practical application, or the technical improvements in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (6)
1. A semiconductor device control program conversion method, characterized by comprising the steps of:
step 1: capturing a test program file, wherein the test program file comprises: pin resource files, main test files, resource relation corresponding files and time sequence files;
step 2: splitting the test program file row by row to acquire code information of each row;
step 3: splitting the code information of each row to obtain single test instruction information and set test instruction parameters;
Step 4: performing semantic library matching on the test instruction parameters to generate a target result;
step 5: outputting a test code corresponding to the target test platform;
in the step 4, the obtained single test instruction information is used as an input parameter, matching is performed in a semantic library of the target test platform, after the corresponding test code information is successfully matched, the test instruction parameter is used as the input parameter, the test parameter matching is performed, and after the integral matching is successful, the corresponding test code main body and the test code parameter of the target test platform are returned, wherein the semantic library comprises a data structure of a syntax element of the semiconductor test platform.
2. The method according to claim 1, wherein the splitting of the code information of each row in step 3, and the obtaining of the single test instruction information specifically includes: splitting each row of code information of the resource relation corresponding file by using a first element and a second element to obtain single setting instruction information; splitting each row of code information of the pin resource file by a first element to obtain single test instruction information; splitting each row of code information of the main test file by a first element and a second element to obtain single setting instruction information; dividing the time sequence file by taking groups as units to obtain serial numbers of the groups, then dividing units by taking each group as a target source to obtain unit file information, and then splitting the unit file information to obtain single setting instruction information.
3. A semiconductor device control program conversion system, characterized by comprising:
The test program grabbing module grabs a test program file, wherein the test program file comprises: pin resource files, main test files, resource relation corresponding files and time sequence files;
The program code splitting module splits the test program file row by row to acquire code information of each row;
The parameter generation module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for carrying out semantic library matching on the test instruction parameters to generate a target result;
the output module outputs a test code corresponding to the target test platform;
The semantic library matching module further comprises: and after the matching is successful, the test instruction parameters are used as the input parameters for matching the test code main body and the test code parameters corresponding to the target test platform, and the semantic library matching module comprises a data structure of the grammar elements of the semiconductor test platform.
4. A semiconductor device control program conversion system according to claim 3, wherein the parameter generation module specifically further comprises: splitting each row of code information of the resource relation corresponding file by using a first element and a second element to obtain single setting instruction information; splitting each row of code information of the pin resource file by a first element to obtain single test instruction information; splitting each row of code information of the main test file by a first element and a second element to obtain single setting instruction information; dividing the time sequence file by taking groups as units to obtain serial numbers of the groups, then dividing units by taking each group as a target source to obtain unit file information, and then splitting the unit file information to obtain single setting instruction information.
5. An apparatus comprising a processor and a memory, wherein the memory stores program code that, when executed by the processor, causes the processor to perform the steps of the method of any of claims 1-2.
6. A computer readable storage medium comprising program code for causing an electronic device to perform the steps of the method of any of claims 1-2 when said program code is run on said electronic device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110549161.6A CN113254027B (en) | 2021-05-20 | 2021-05-20 | Semiconductor device control program conversion method, system, device and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110549161.6A CN113254027B (en) | 2021-05-20 | 2021-05-20 | Semiconductor device control program conversion method, system, device and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113254027A CN113254027A (en) | 2021-08-13 |
| CN113254027B true CN113254027B (en) | 2024-05-14 |
Family
ID=77182953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110549161.6A Active CN113254027B (en) | 2021-05-20 | 2021-05-20 | Semiconductor device control program conversion method, system, device and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113254027B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115146650B (en) * | 2022-06-27 | 2023-06-30 | 西安羚控电子科技有限公司 | Test process creation method and system based on semantic recognition |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5664173A (en) * | 1995-11-27 | 1997-09-02 | Microsoft Corporation | Method and apparatus for generating database queries from a meta-query pattern |
| WO2001050148A1 (en) * | 1999-12-30 | 2001-07-12 | Infineon Technologies North America Corp. | Automated creation of specific test programs from complex test programs |
| US6526570B1 (en) * | 1999-04-23 | 2003-02-25 | Sun Microsystems, Inc. | File portability techniques |
| US6698014B1 (en) * | 1999-10-14 | 2004-02-24 | Convert Systems Inc. | System for automatically converting source code from one programming language to another |
| EP1700210A2 (en) * | 2003-12-15 | 2006-09-13 | Evolveware Information Tech. (India) Pty. Ltd | An apparatus for migration and conversion of software code from any source platform to any target platform |
| WO2014155148A1 (en) * | 2013-03-27 | 2014-10-02 | Netfective Technology Sa | Method for transforming first code instructions in a first programming language into second code instructions in a second programming language |
| CN104793567A (en) * | 2014-01-16 | 2015-07-22 | 中国南方航空工业(集团)有限公司 | Numerical control machining program conversion method and numerical control machining program conversion device |
| CN108595184A (en) * | 2018-04-19 | 2018-09-28 | 北京微播视界科技有限公司 | Code conversion method, device, computer storage media and code conversion terminal |
| CN109214381A (en) * | 2017-07-03 | 2019-01-15 | 发那科株式会社 | Numerical control program conversion equipment |
| CN109783340A (en) * | 2017-11-10 | 2019-05-21 | 深圳市中兴微电子技术有限公司 | Test code programming method, IP test method and the device of SoC |
| JP2019109687A (en) * | 2017-12-18 | 2019-07-04 | 東芝産業機器システム株式会社 | Programming language conversion support device, programming language conversion support method and program |
| JP2019160105A (en) * | 2018-03-16 | 2019-09-19 | 富士通株式会社 | Interface conversion program, interface conversion method, and information processing device |
| CN111708539A (en) * | 2020-06-17 | 2020-09-25 | 腾讯科技（深圳）有限公司 | Application program code conversion method and device, electronic equipment and storage medium |
| CN111722873A (en) * | 2020-07-23 | 2020-09-29 | 腾讯科技（深圳）有限公司 | Code reconstruction method, device, equipment and medium |
| CN111966396A (en) * | 2019-05-20 | 2020-11-20 | 北京京东尚科信息技术有限公司 | Data processing method and device, computer system and computer readable storage medium |
| CN112328226A (en) * | 2020-09-17 | 2021-02-05 | 北京中数科技术有限公司 | Embedded system automatic test code generation method and device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9465608B2 (en) * | 2013-03-15 | 2016-10-11 | ArtinSoft Corporation | Code separation with semantic guarantees |
| JP2019016037A (en) * | 2017-07-04 | 2019-01-31 | ファナック株式会社 | Program creation apparatus |
| US10705943B2 (en) * | 2017-09-08 | 2020-07-07 | Devfactory Innovations Fz-Llc | Automating identification of test cases for library suggestion models |
-
2021
- 2021-05-20 CN CN202110549161.6A patent/CN113254027B/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5664173A (en) * | 1995-11-27 | 1997-09-02 | Microsoft Corporation | Method and apparatus for generating database queries from a meta-query pattern |
| US6526570B1 (en) * | 1999-04-23 | 2003-02-25 | Sun Microsystems, Inc. | File portability techniques |
| US6698014B1 (en) * | 1999-10-14 | 2004-02-24 | Convert Systems Inc. | System for automatically converting source code from one programming language to another |
| WO2001050148A1 (en) * | 1999-12-30 | 2001-07-12 | Infineon Technologies North America Corp. | Automated creation of specific test programs from complex test programs |
| EP1700210A2 (en) * | 2003-12-15 | 2006-09-13 | Evolveware Information Tech. (India) Pty. Ltd | An apparatus for migration and conversion of software code from any source platform to any target platform |
| WO2014155148A1 (en) * | 2013-03-27 | 2014-10-02 | Netfective Technology Sa | Method for transforming first code instructions in a first programming language into second code instructions in a second programming language |
| CN104793567A (en) * | 2014-01-16 | 2015-07-22 | 中国南方航空工业(集团)有限公司 | Numerical control machining program conversion method and numerical control machining program conversion device |
| CN109214381A (en) * | 2017-07-03 | 2019-01-15 | 发那科株式会社 | Numerical control program conversion equipment |
| CN109783340A (en) * | 2017-11-10 | 2019-05-21 | 深圳市中兴微电子技术有限公司 | Test code programming method, IP test method and the device of SoC |
| JP2019109687A (en) * | 2017-12-18 | 2019-07-04 | 東芝産業機器システム株式会社 | Programming language conversion support device, programming language conversion support method and program |
| JP2019160105A (en) * | 2018-03-16 | 2019-09-19 | 富士通株式会社 | Interface conversion program, interface conversion method, and information processing device |
| CN108595184A (en) * | 2018-04-19 | 2018-09-28 | 北京微播视界科技有限公司 | Code conversion method, device, computer storage media and code conversion terminal |
| CN111966396A (en) * | 2019-05-20 | 2020-11-20 | 北京京东尚科信息技术有限公司 | Data processing method and device, computer system and computer readable storage medium |
| CN111708539A (en) * | 2020-06-17 | 2020-09-25 | 腾讯科技（深圳）有限公司 | Application program code conversion method and device, electronic equipment and storage medium |
| CN111722873A (en) * | 2020-07-23 | 2020-09-29 | 腾讯科技（深圳）有限公司 | Code reconstruction method, device, equipment and medium |
| CN112328226A (en) * | 2020-09-17 | 2021-02-05 | 北京中数科技术有限公司 | Embedded system automatic test code generation method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113254027A (en) | 2021-08-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11455150B2 (en) | Accelerating application modernization | |
| CN109597618B (en) | Program development method, program development device, computer device, and storage medium | |
| CN112630622B (en) | Method and system for pattern compiling, downloading and testing of ATE (automatic test equipment) | |
| CN108549535B (en) | Efficient program analysis method and system based on file dependency relationship | |
| CN108804304B (en) | Test case generation method and device, storage medium and electronic equipment | |
| CN111752571A (en) | Program upgrading method, device, equipment and storage medium | |
| CN109614325B (en) | Method and device for determining control attribute, electronic equipment and storage medium | |
| US20180025162A1 (en) | Application program analysis apparatus and method | |
| CN113254027B (en) | Semiconductor device control program conversion method, system, device and storage medium | |
| JP2021002326A (en) | Refinement of repair patterns for static analysis violations in software programs | |
| CN113254054B (en) | Intelligent contract one-stop development system and method | |
| CN108897678B (en) | Static code detection method, static code detection system and storage device | |
| US9880813B2 (en) | RTE code generating method and apparatus performing the same | |
| KR20130022708A (en) | Test case creating mehtod and running method of robot software component using specifications of required interface | |
| CN111913704A (en) | VScode-based method for rapidly developing GSP7 script and plug-in tool | |
| CN111580821B (en) | Script binding method and device, electronic equipment and computer readable storage medium | |
| CN108132799B (en) | Inter-process static program analysis information extraction method, device and equipment | |
| CN116627850A (en) | Function debugging method and device, storage medium and electronic equipment | |
| CN113051173B (en) | Method, device, computer equipment and storage medium for arranging and executing test flow | |
| CN111475304B (en) | Feature extraction acceleration method and system | |
| CN114281709A (en) | Unit testing method, system, electronic equipment and storage medium | |
| CN110489124B (en) | Source code execution method, source code execution device, storage medium and computer equipment | |
| CN111078548A (en) | Test case analysis method and device, storage medium and verification platform | |
| CN118069513A (en) | Method, device, equipment and medium for generating relocation command | |
| US11886328B2 (en) | Test information extraction apparatus, test information extraction method and program |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |