CN113254027A - Method, system, equipment and storage medium for converting control program of semiconductor equipment - Google Patents
Method, system, equipment and storage medium for converting control program of semiconductor equipment Download PDFInfo
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Abstract
The invention belongs to the technical field of program code conversion, and particularly discloses a method for converting a control program of semiconductor equipment, which comprises the steps of grabbing a test program file; splitting the test program file line by line to obtain code information of each line; splitting to obtain single test instruction information, and setting test instruction parameters; performing semantic library matching on the parameter instruction to generate a target result; and outputting the test code corresponding to the target test platform. The invention provides a method for converting a test program into a test platform, which enables the realization of the same test program on different test platforms to be concise and efficient, greatly reduces the complexity of manual operation, improves the development efficiency of the test program, and reduces the method for converting the test program into the test platform.
Description
Technical Field
The invention belongs to the technical field of program code conversion, and particularly relates to a method, a system, equipment and a storage medium for converting a control program of semiconductor equipment.
Background
Program development is developed based on different platforms, and to realize cross-platform implementation of program codes, a conventional method is to issue interpreters specially used for interpreting intermediate languages generated after the program is compiled on different program running platforms. The difference of relevant platforms is shielded by the interpreter, and when the program runs on different platforms, the interpreter generates a program file which can finally run on different platforms.
The existing cross-platform technology aims at an executable environment of a programming language, aims at the fact that the programming language is not changed, but can run on different operating systems or hardware platforms, but aims at the field of semiconductor testing, a bottom layer interface of each testing platform cannot be opened outwards, each testing platform can have a unique special testing instruction which can be identified by a testing machine to carry out testing, and cross-platform programming in the traditional sense cannot be used for realizing cross-platform of a testing program.
Therefore, it is an urgent technical problem to be solved by those skilled in the art to provide a method for semiconductor program conversion.
Disclosure of Invention
The invention aims to overcome the defect that cross-platform of a test program cannot be realized in the field of semiconductor test in the prior art, and provides a method and a system for converting a control program of a semiconductor device, an electronic device and a storage medium.
In a first aspect of the present invention, there is provided a semiconductor device control program conversion method including:
capturing a test program file;
splitting the test program file line by line to obtain code information of each line;
splitting the code information of each line, acquiring single test instruction information, and setting test instruction parameters;
performing semantic library matching on the test instruction parameters to generate a target result;
and outputting the test code corresponding to the target test platform.
Further, the test program file includes: the device comprises a pin resource file, a main test file, a resource relation corresponding file and a time sequence file.
The further scheme is that splitting the code information of each line and obtaining the single test instruction information specifically comprises: splitting each line of code information of the resource corresponding relation file by a first element and a second element to obtain single setting instruction information; splitting each line of code information of the pin resource file by a first element to obtain single test instruction information; splitting each line of code information of the main test file by a first element and a second element to obtain single setting instruction information; the time sequence file is divided by taking a group as a unit to obtain serial numbers of the groups, then unit file information is obtained by dividing each group as a target source, and then the unit file information is split to obtain single setting instruction information.
The further scheme is that the test instruction parameters are matched in a semantic library of the target test platform, after the corresponding test code information is successfully matched, the test instruction parameters are used as input parameters to match the test parameters, after the overall matching is successful, the test code main body and the test code parameters corresponding to the target test platform are returned, and the semantic library comprises a data structure of syntax elements of the semiconductor test platform.
In a second aspect of the present invention, there is provided a semiconductor program rapid transformation building system, including:
the test program grabbing module is used for grabbing test program files;
the program code splitting module is used for splitting the source code file line by line to acquire code information of each line;
the parameter generating module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for performing semantic library matching on the parameter instruction to generate a target result;
and the output module is used for outputting the test code corresponding to the target test platform.
The further scheme is that the test program file comprises a pin resource file, a main test file, a resource relation corresponding file and a time sequence file.
A further scheme is that the parameter generation module specifically further includes: splitting each line of code information of the resource corresponding relation file by a first element and a second element to obtain single setting instruction information; splitting each line of code information of the pin resource file by a first element to obtain single test instruction information; splitting each line of code information of the main test file by a first element and a second element to obtain single setting instruction information; the time sequence file is divided by taking a group as a unit to obtain serial numbers of the groups, then unit file information is obtained by dividing each group as a target source, and then the unit file information is split to obtain single setting instruction information.
Further, the semantic library matching module is configured to: and matching in a semantic library of the target test platform by using the acquired single test instruction information as an incoming parameter, matching test parameters by using the test instruction parameters as the incoming parameter after the corresponding test code information is successfully matched, returning a test code main body and the test code parameters corresponding to the target test platform after the overall matching is successful, wherein the semantic library matching module comprises a data structure of syntax elements of the semiconductor test platform.
In a third aspect of the present invention, there is provided an apparatus comprising a processor and a memory, wherein the memory stores program code which, when executed by the processor, causes the processor to perform any of the above steps of applying the semiconductor program conversion method.
In a fourth aspect of the invention, a computer-readable storage medium is provided, which comprises program code for causing an electronic device to perform the steps of any one of the above-mentioned application semiconductor program conversion methods, when the program product is run on the electronic device.
Compared with the prior art, the invention has the beneficial effects that:
(1) the invention provides a method for converting a test program into a test platform, which enables the realization of the same test program on different test platforms to be concise and efficient, greatly reduces the complexity of manual operation, improves the development efficiency of the test program, and reduces the method for converting the test program into the test platform.
(2) According to the invention, the source code file is split line by line and node by node to obtain the test instruction parameters, and then the test code corresponding to the target test platform is obtained through semantic library matching, so that cross-platform test programs in the field of semiconductor test are realized.
Drawings
The invention is illustrated and described only by way of example and not by way of limitation in the scope of the invention as set forth in the following drawings, in which:
FIG. 1: a flow chart of a program conversion method of the present invention;
FIG. 2: a flow chart of another embodiment of a program conversion method of the present invention;
FIG. 3: the invention provides a structural schematic diagram of an embodiment of an electronic device;
Detailed Description
In order to make the objects, technical solutions, design methods, and advantages of the present invention more apparent, the present invention will be further described in detail by specific embodiments with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1, a first aspect of the present invention provides a semiconductor device control program conversion method, including:
s10: capturing a test program file;
s20: splitting the test program file line by line to obtain code information of each line;
s30: splitting to obtain single test instruction information, and setting test instruction parameters;
s40: performing semantic library matching on the parameter instruction to generate a target result;
s50: and outputting the test code corresponding to the target test platform.
As shown in fig. 2, the method of the present invention, when implemented, further comprises the following steps:
it should be noted that, in this embodiment, the first element is defined as "; ", the second element is defined as" () ".
1) Capturing a resource relation corresponding file in a test program file, splitting the resource relation file line by line to obtain code information of each line, identifying by taking head information of module codes as an identification standard, and setting the initialization setting part of the test program line by line if the module codes are the test initialization part; and splitting to acquire specific information of a single setting instruction, then splitting to acquire a test setting instruction and a parameter setting instruction, if a user-defined setting instruction is met, keeping the test setting instruction and the parameter setting instruction unchanged, otherwise, performing semantic replacement and returning until ending information corresponding to the head information of the module code.
2) Identifying a resource pin corresponding part in the resource relation corresponding file, and then performing line-by-line operation; and splitting and then using, wherein the split obtains a test channel corresponding to the actual pin of each site, then matching and converting the corresponding platform channel into a channel resource of a target platform, and the actual pin of the site is kept unchanged until the information of the corresponding part of the resource pin corresponding to the head information of the module code is finished.
3) If the resource pin group code block part is identified, the same is preceded by "; the method comprises the steps of splitting line by line, then splitting according to the sequence of the data, obtaining the names of resource pin groups and detailed composition parameters, matching a semantic library, and returning to a target result generated after conversion.
4) After identifying the code header information allocated by the map, the same is firstly carried out; the method comprises the steps of splitting line by line, then splitting line by line, placing obtained 1,2 parameter values in a global two-dimensional array, and using the two-dimensional array to set REJECT _ BIN parameters when a main test file is converted and constructed.
5) Grabbing a Timing file in a test program file, firstly dividing by taking a group as a unit to obtain a serial number of the group, then respectively dividing by taking each group as a target source to obtain unit file information, and then dividing by using "[", "]" ","; and splitting to obtain pin information and corresponding time sequence information. And then establishing a global relation corresponding table by using the serial number of the group, the pin information and the time sequence information, and carrying out time sequence setting on the vector file by using the corresponding relation table when carrying out main test file conversion construction.
6) Capturing a main file in the whole test program file, splitting the source test program file line by line, acquiring code information of each line, and then taking the information of each line as a basis; "splitting to obtain information of a single test instruction, and then splitting to obtain a test code body and test instruction parameters" () ".
7) And then, taking the single test instruction information obtained in the step 1) as an incoming parameter, matching in a semantic library of the target test platform, after the corresponding test code information is successfully matched, taking the test instruction parameter obtained in the step 1) as the incoming parameter to match the test parameters, and returning to the test code main body and the test code parameter corresponding to the target test platform after the overall matching is successful.
8) And then, performing matching output line by line according to the logic, keeping the logic of the data processing flow unchanged when a specific data processing flow is met, processing a test instruction in the flow according to the matching mechanism, then putting the test instruction into the logic periphery of the test flow, then performing variable and constant processing of a test platform on variable and constant data in the data processing flow, calling a corresponding relation table generated in 5) to perform matching processing of a target platform if test vector execution is met, then calling parameter setting of REJECT _ BIN in 4) to perform conversion of corresponding relation of software and hardware BIN, and then processing to finish data processing flow codes returned to the target test platform.
In a second aspect of the present invention, there is provided a semiconductor program rapid transformation building system, including:
the test program grabbing module is used for grabbing test program files;
the program code splitting module is used for splitting the source code file line by line to acquire code information of each line;
the parameter generating module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for performing semantic library matching on the parameter instruction to generate a target result;
and the output module is used for outputting the test code corresponding to the target test platform.
Optionally, the test program file includes a pin resource file, a main test file, a resource relationship correspondence file, and a timing sequence file.
Optionally, the parameter generating module further includes: the code information of each line of the resource corresponding relation file is divided into; splitting the ' sum ' () ' to acquire single setting instruction information; the code information of each line of the pin resource file is divided into; "split and obtain the single test instruction information; linking each line of code information of the master test file; splitting the ' sum ' () ' to acquire single setting instruction information; dividing the time sequence file by taking a group as a unit to obtain a serial number of the group, then dividing each group as a target source to obtain unit file information, and then dividing the unit file information by using a [ "," ] "" and "; and splitting to obtain single setting instruction information.
Optionally, the semantic library matching module is configured to: and using the obtained single test instruction information as an incoming parameter, matching in a semantic library of the target test platform, after the corresponding test code information is successfully matched, using the test instruction parameter as the incoming parameter to match the test parameters, returning a test code main body and the test code parameters corresponding to the target test platform after the overall matching is successful, and if the matching is unsuccessful, outputting the test code main body and the test code parameters according to a test original program file, wherein the semantic library matching module comprises a data structure of syntax elements of the semiconductor test platform.
The present invention also provides an apparatus, as shown in fig. 3, comprising: at least one processor, and a memory communicatively coupled to the at least one processor, wherein the memory stores instructions executable by the at least one processor to cause the at least one processor to perform the method.
Specifically, the memory and the processor can be general-purpose memory and processor, which are not limited specifically, and when the processor runs the computer program stored in the memory, the semiconductor program conversion method can be executed, so that cross-platform of the semiconductor test program can be realized, and labor efficiency can be greatly improved.
The invention also provides a computer-readable storage medium, on which a computer program is stored which, when executed by a processor, implements the method. For specific implementation, reference may be made to the method embodiment, which is not described herein again.
It should be noted that the main test file mentioned in the above method is a main body of the test program, and includes history version information, all test item module declarations, a specific flow of each test item, a test platform grammar rule, a test logic, a special function definition, bin information, and the like. The pin resource file is a pin definition file for an IC hardware entity in software, namely pin definition and description of the IC. The resource relation corresponding file comprises the corresponding relation between the hardware entity of the test platform and the IC pin definition in the software, vector file statement, machine resource and parameter setting, software and hardware bin setting, external relay definition, special test flow and the like. The Timing file (Timing file) contains Timing information of the running of the vector file, such as the Timing types (NF, RZ, NRZ, etc.), the rising edge and the falling edge, the sampling point setting, the delay setting, and other Timing settings, the depth is 2, and a plurality of small groups are contained in a plurality of large groups. Header information of module code: refers to the start flag portion of each function in the test program.
Having described embodiments of the present invention, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (10)
1. A semiconductor device control program conversion method characterized by comprising the steps of:
step 1: capturing a test program file;
step 2: splitting the test program file line by line to obtain code information of each line;
and step 3: splitting the code information of each line, acquiring single test instruction information, and setting test instruction parameters;
and 4, step 4: performing semantic library matching on the test instruction parameters to generate a target result;
and 5: and outputting the test code corresponding to the target test platform.
2. The semiconductor device control program conversion method according to claim 1, wherein the test program file in step 1 includes: the device comprises a pin resource file, a main test file, a resource relation corresponding file and a time sequence file.
3. The method for converting the control program of the semiconductor device according to claim 2, wherein the step 3 of splitting the code information of each line to obtain a single test instruction information specifically comprises: splitting each line of code information of the resource corresponding relation file by a first element and a second element to obtain single setting instruction information; splitting each line of code information of the pin resource file by a first element to obtain single test instruction information; splitting each line of code information of the main test file by a first element and a second element to obtain single setting instruction information; the time sequence file is divided by taking a group as a unit to obtain serial numbers of the groups, then unit file information is obtained by dividing each group as a target source, and then the unit file information is split to obtain single setting instruction information.
4. The method as claimed in claim 3, wherein in step 4, the test instruction parameters are matched in a semantic library of the target test platform, after the corresponding test code information is successfully matched, the test instruction parameters are used as input parameters for matching the test parameters, and after the overall matching is successful, the test code body and the test code parameters corresponding to the target test platform are returned, and the semantic library includes a data structure of syntax elements of the semiconductor test platform.
5. A semiconductor device control program conversion system, comprising:
the test program grabbing module is used for grabbing test program files;
the program code splitting module is used for splitting the test program file line by line to acquire code information of each line;
the parameter generating module is used for acquiring single test instruction information and setting test instruction parameters;
the semantic library matching module is used for performing semantic library matching on the parameter instruction to generate a target result;
and the output module is used for outputting the test code corresponding to the target test platform.
6. The semiconductor device control program conversion system according to claim 5, wherein the test program file includes a pin resource file, a main test file, a resource relationship correspondence file, and a timing file.
7. The semiconductor device control program conversion system according to claim 6, wherein the parameter generation module further includes: splitting each line of code information of the resource corresponding relation file by a first element and a second element to obtain single setting instruction information; splitting each line of code information of the pin resource file by a first element to obtain single test instruction information; splitting each line of code information of the main test file by a first element and a second element to obtain single setting instruction information; the time sequence file is divided by taking a group as a unit to obtain serial numbers of the groups, then unit file information is obtained by dividing each group as a target source, and then the unit file information is split to obtain single setting instruction information.
8. The semiconductor device control program conversion system according to claim 7, wherein the semantic library matching module further comprises: and matching in a semantic library of the target test platform by using the acquired single test instruction information as an incoming parameter, matching test parameters by using the test instruction parameters as the incoming parameter after the corresponding test code information is successfully matched, returning a test code main body and the test code parameters corresponding to the target test platform after the overall matching is successful, wherein the semantic library matching module comprises a data structure of syntax elements of the semiconductor test platform.
9. An apparatus comprising a processor and a memory, wherein the memory stores program code which, when executed by the processor, causes the processor to perform the steps of the method of any of claims 1 to 4.
10. Computer-readable storage medium, characterized in that it comprises program code for causing an electronic device to carry out the steps of the method according to any one of claims 1 to 4, when said program product is run on said electronic device.
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| CN115146650A (en) * | 2022-06-27 | 2022-10-04 | 西安羚控电子科技有限公司 | Test process creating method and system based on semantic recognition |
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