CN113253090A - System and method for over the air testing of electronic devices - Google Patents
System and method for over the air testing of electronic devices Download PDFInfo
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- CN113253090A CN113253090A CN202010088613.0A CN202010088613A CN113253090A CN 113253090 A CN113253090 A CN 113253090A CN 202010088613 A CN202010088613 A CN 202010088613A CN 113253090 A CN113253090 A CN 113253090A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- Microelectronics & Electronic Packaging (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
本发明涉及用于空中测试电子设备的系统和方法。一种用于空中测试电子设备(101)、尤其是DUT的系统(100)，包括：支撑表面(103)，其中，所述电子设备(101)被布置在所述支撑表面(103)上；测试设备(105)，所述测试设备(105)包括收发器单元(107)和RF波束形成器(109)，其中，所述收发器单元(107)被配置成发射RF测试信号，其中，所述RF波束形成器(109)被配置成将所述RF测试信号对准在所述电子设备(101)的方向上，其中，所述收发器单元(107)被配置成接收来自所述电子设备(101)的RF响应信号，以及其中，所述测试设备(105)被配置成基于所述RF响应信号评估所述电子设备(101)。
The present invention relates to systems and methods for over-the-air testing of electronic equipment. A system (100) for over-the-air testing of electronic equipment (101), in particular DUTs, comprising: a support surface (103), wherein the electronic equipment (101) is arranged on the support surface (103); Test equipment (105) comprising a transceiver unit (107) and an RF beamformer (109), wherein the transceiver unit (107) is configured to transmit RF test signals, wherein the The RF beamformer (109) is configured to align the RF test signal in the direction of the electronic device (101), wherein the transceiver unit (107) is configured to receive data from the electronic device The RF response signal of (101), and wherein the test device (105) is configured to evaluate the electronic device (101) based on the RF response signal.
Description
Technical Field
The present invention relates to a system and method for over the air testing of electronic devices, particularly Devices Under Test (DUTs).
Background
Many electronic devices are tested at or after first manufacture during their life cycle. The test may include a functional test, a performance test, or a calibration check. Devices tested in this manner are referred to as Devices Under Test (DUTs).
Many devices for wireless communication, radar applications or satellite communication have integrated antennas, in particular Radio Frequency (RF) antennas. Testing of these devices typically includes RF performance testing, which is performed Over The Air (OTA). To ensure that other signals are not disturbed during OTA, the OTA test system can be surrounded by an RF reflector. In particular, the device may be placed in a special OTA chamber that shields external RF sources.
However, such reflector or OTA chambers may require a large space in the test facility and result in increased costs.
Disclosure of Invention
It is therefore an object to provide an improved system and an improved method for over the air testing of electronic devices, which avoid the above-mentioned disadvantages. In particular, it is an object to provide a system and method for over-the-air testing that does not require an additional shielded room or OTA room.
The object of the invention is achieved by the solution presented in the appended independent claims. Advantageous implementations of the invention are further defined in the dependent claims.
According to a first aspect, the invention relates to a system for over the air testing of electronic devices, in particular DUTs, comprising: a support surface, wherein the electronic device is disposed on the support surface; a test device comprising a transceiver unit and an RF beamformer, wherein the transceiver unit is configured to transmit RF test signals, wherein the RF beamformer is configured to align the RF test signals in a direction of the electronic device, wherein the transceiver unit is configured to receive RF response signals from the electronic device, and wherein the test device is configured to evaluate the electronic device based on the RF response signals. This achieves the advantage that the test signal is concentrated on the electronic device.
In this way, the signal strength of the RF test signal at the electronic device may be enhanced without using a shielded room or OTA room.
The electronic device may be a communication device, such as a cell phone, a sensor or a measurement device. The communication device may be a radar device or a SATCOM (satellite communication) device.
The electronic device may further be a chip (especially for wireless communication), a die or a package component.
The electronic device may comprise an RF antenna for receiving the RF test signal and/or for transmitting the RF response signal. The electronic device itself may include a beamforming integrated circuit. In particular, the electronic device comprises a processing unit which, upon receiving the RF test signal, controls the RF antenna to transmit the RF response signal.
The RF test signal and/or the RF response signal may include a 3G, 4G, or 5G signal, a WiFi signal, a bluetooth signal, an RFID signal, and/or an NFC signal.
In an embodiment, the RF beamformer is configured to selectively receive the RF response signals from the electronic device and to forward the received RF response signals to the transceiver unit. This achieves the following advantages: the RF response signal may be concentrated on the test equipment and may avoid interfering with other signals.
In an embodiment, the RF beamformer is configured to selectively receive the RF response signals by limiting a receive direction of the RF beamformer towards the electronic device. This achieves the following advantages: the RF response signal may be concentrated on the test equipment and may avoid interfering with other signals.
In an embodiment, the RF beamformer comprises a phased array antenna. This achieves the following advantages: the receiving direction of the RF beamformer can be set efficiently.
In an embodiment, the RF beamformer comprises a chipset with at least one integrated Antenna, In particular an Antenna In Package (AIP). This achieves the following advantages: the receiving direction of the RF beamformer can be set efficiently.
In an embodiment, the support surface comprises a conveyor belt configured to move the electronic device relative to the RF beamformer. This achieves the following advantages: the test can be performed without delay during device manufacturing.
Preferably, the test equipment, in particular the RF beamformer of the test equipment, is arranged above the conveyor belt.
In an embodiment, the RF beamformer is configured to actively adapt the alignment of the RF test signals to compensate for movement of the electronic device. This achieves the following advantages: the test may be performed on the mobile device, for example, during production of the device.
Preferably, the RF beamformer is further configured to actively adapt its receive direction to compensate for movement of the electronic device. This achieves the following advantages: the test may be performed on a mobile device.
In other words, the RF beamformer may be configured to follow the movement of the electronic device with the alignment of the RF test signal and/or with its reception direction for the RF response signal.
Preferably, the RF beamformer is configured to electronically control the alignment of the RF test signal and/or its reception direction while remaining stationary.
In an embodiment, the support surface comprises a holding device having at least one fixture designed to accommodate the electronic device, in particular a recess in the holding device. This achieves the following advantages: the electronic device may be held in a fixed position to which the RF test signal may be effectively directed.
In an embodiment, the system further comprises an absorption unit configured to absorb RF signals, wherein the absorption unit at least partially surrounds the support surface and/or the test device. This achieves the following advantages: interference caused by reflections of the RF test signal or the RF response signal can be avoided.
In an embodiment, the RF beamformer is configured to direct the RF test signal in the direction of at least one further electronic device on the support surface, wherein the transceiver unit is configured to receive a further RF response signal from the at least one further electronic device, and wherein the test device is configured to evaluate the at least one further electronic device based on the further RF response signal. This achieves the following advantages: multiple electronic devices may be tested simultaneously or in close succession.
The at least one further electronic device may be arranged on the support surface at a distance from the first electronic device.
According to a second aspect, the invention relates to a method for over-the-air testing of electronic equipment, the method comprising: disposing the electronic device on a support surface; transmitting an RF test signal from a transceiver unit of a test device; aligning the RF test signal in a direction of the electronic device by an RF beamformer; receiving, at the transceiver unit, an RF response signal from the electronic device; and evaluating the electronic device based on the RF response signal. This achieves the advantage that the test signal is concentrated on the electronic device.
In this way, the signal strength of the RF test signal at the electronic device may be enhanced without using a shielded room or OTA room.
In an embodiment, the RF beamformer is configured to selectively receive the RF response signals from the electronic device, in particular by restricting a reception direction of the RF beamformer towards the electronic device, and to forward the received RF response signals to the transceiver unit. This achieves the following advantages: the RF response signal may be concentrated on the test equipment and may avoid interfering with other signals.
In an embodiment, the support surface is configured to move the electronic device relative to the RF beamformer. This achieves the following advantages: the test can be performed without delay during device manufacturing.
In an embodiment, the RF beamformer is configured to actively adapt the alignment of the RF test signals to compensate for movement of the electronic device. This achieves the following advantages: the test may be performed on the mobile device, for example, during production of the device.
Preferably, the RF beamformer is further configured to actively adapt its receive direction to compensate for movement of the electronic device. This achieves the following advantages: the test may be performed on a mobile device.
In particular, the support surface comprises a conveyor belt and/or a holding device having at least one fixing, in particular a recess in the holding device, designed to accommodate the electronic device.
In one embodiment, the method further comprises the steps of: aligning, by the RF beamformer, the RF test signal in a direction of at least one other electronic device on the support surface; receiving at least one further RF response signal from the at least one further electronic device at the transceiver unit; and evaluating the at least one further electronic device based on the at least one further RF response signal. This achieves the following advantages: multiple electronic devices may be tested simultaneously or in close succession.
The above description of the system according to the invention is correspondingly valid for the method according to the invention.
Drawings
The invention will be explained below with reference to the drawings.
FIG. 1 shows a schematic diagram of a system for over the air testing of electronic devices, according to an embodiment;
FIG. 2 shows a schematic view of a support surface according to an embodiment; and
FIG. 3 shows a schematic diagram of a method for over the air testing of electronic devices, according to an embodiment.
Detailed Description
FIG. 1 shows a schematic diagram of a system 100 for over the air testing of electronic devices 101 according to an embodiment.
The system 100 includes: a support surface 103, wherein the electronic device 101 is arranged on the support surface 103; a test device 105, the test device 105 comprising a transceiver unit 107 and an RF beamformer 109, wherein the transceiver unit 107 is configured to transmit RF test signals, wherein the RF beamformer 109 is configured to align the RF test signals in the direction of the electronic device 101, wherein the transceiver unit 107 is configured to receive RF response signals from the electronic device 101, and wherein the test device 105 is configured to evaluate the electronic device 101 based on the RF response signals.
The test device 105 may be configured to evaluate the functionality, performance, or calibration of the electronic device 101 based on the RF response signal.
The test equipment 105 may be bidirectional test equipment for transmitting modulated signals and/or continuous wave signals to the electronic device 101 and receiving modulated signals and/or continuous wave signals from the electronic device 101, respectively.
The test equipment 105 may include RF test equipment to perform RF tests. In particular, the RF testing includes modulation performance testing of the electronic device 101. In particular, the RF beamformer 109 is arranged in the far field of the electronic device 101.
Preferably, the test device 105 comprises a processing unit 113, the processing unit 113 being configured to evaluate the electronic device based on the RF response signal (i.e. by detecting and analyzing radio frequency characteristics of the RF response signal).
The transceiver unit 107 and the RF beamformer 109 may form a single unit of the test device 105.
The electronic device 101 may include an RF antenna, in particular a beamforming integrated circuit configured to receive an RF test signal and transmit an RF response signal.
The RF beamformer 109 may be configured to selectively receive RF response signals from the electronic device 101, in particular by limiting the reception direction towards the signal path Rx from the electronic device 101 to the RF beamformer 109. Concentrating the RF test signal on the electronic device 101 and selectively receiving the RF response signal from the electronic device 101 may help avoid detection and use of interference and false signals (e.g., signals from other devices in the vicinity). Therefore, no shielding or dedicated test chamber is required to perform the OAT test.
Preferably, the RF beamformer 109 comprises a phased array antenna. The phased array antenna may comprise an antenna array which is electronically controllable to point in the direction of the electronic device for forwarding and/or receiving RF signals, in particular RF test signals and RF response signals, respectively.
In particular, the RF beamformer 109 comprises a chipset with at least one integrated Antenna, In particular a Package Antenna (AIP).
The system in fig. 1 further comprises a conveyor belt 111, wherein the support surface 103 is a surface of the conveyor belt 111.
The test device 105 may be disposed above the conveyor belt 111 such that the conveyor belt may be configured to move the electronic device 101 past the test device 105. In particular, the testing device 105 is configured to: if the electronic device 101 has reached a certain position relative to the testing apparatus 105, an RF test signal is emitted in the direction of the mobile electronic device 101 on the conveyor belt.
The RF beamformer 109 may be an active RF beamformer. The RF beamformer may be configured to change its orientation in accordance with the movement of the electronic device 101, in particular for steering and receiving RF test or response signals.
Fig. 1 shows another electronic device 101a on a support surface 103. The other electronic device 101a may be tested simultaneously or immediately after the electronic device 101.
The other electronic device 101a may be of the same type as the electronic device 101.
The testing of the further electronic device 101a may be performed in the same way as described above for the electronic device 101, i.e. the RF beamformer 109 directs the RF test signal in the direction of the further electronic device 101a on the supporting surface, the transceiver unit 107 receives a further RF response signal from the further electronic device 101a, and the testing device 105 evaluates the further electronic device 101a based on the further RF response signal.
The RF beamformer 109 may be configured to selectively receive another RF response signal from another electronic device 101a in the same manner as described above for the electronic device 101.
The system 100 may further comprise an absorption unit (not shown) configured to absorb the RF signal. The absorption unit may be arranged to at least partially surround the support surface 103 and/or the electronic device 101, the electronic device 101 a. In particular, the absorption unit is arranged behind the electronics and/or the RF beamformer 109.
The size of the absorption unit may be adapted to the beam width of the RF beam emitted by the RF beamformer 109 and/or the electronic device 101.
Fig. 2 shows a schematic view of a support surface 103 according to an embodiment.
The support surface 103 in fig. 2 comprises a holding device 201, which holding device 201 is configured to accommodate a plurality of electronic devices 101, 101a-101 e. In particular, the holding device 201 comprises a tray or plate.
The holding device 201 may comprise a holder 203, holders 203a-203e to accommodate the electronic device 101, 101a-101 e. In particular, the fixing 203a-203e are recesses in the holding device 201.
The conveyor belt 111 as shown in fig. 1 may comprise a holding device 201. In particular, the holding device 201 is a component of the carrier medium of the conveyor belt 111.
FIG. 3 shows a schematic diagram of a method 300 for over the air testing of an electronic device 101, according to an embodiment.
The method 300 includes the steps of: arranging (301) an electronic device 101 on a support surface 103; transmitting (303) an RF test signal from the transceiver unit 107 of the test device 105; aligning (305) the RF test signal in the direction of the electronic device 101 by the RF beamformer 109; receiving (307) an RF response signal from the electronic device 101 at the transceiver unit 107; and evaluating (309) the electronic device 101 based on the RF response signal.
The RF beamformer 109 may be configured to selectively receive RF response signals from the electronic device 101, particularly by restricting reception directions towards the electronic device 101. Concentrating the RF test signal on the electronic device 101 and selectively receiving the RF response signal from the electronic device 101 helps to avoid interference and detection and use of false signals (e.g., signals from other devices in the vicinity). Therefore, no shielding or dedicated test chamber is required to perform the OAT test.
The support surface 103 may be configured to move the electronic device 101 relative to the RF beamformer 109. In particular, the support surface 103 comprises the conveyor belt 111 or a surface forming the conveyor belt 111.
Preferably, the method 300 further comprises the steps of: aligning the RF test signal in the direction of the at least one further electronic device 101a on the support surface 103 by the RF beamformer 109; receiving at least one further RF response signal from at least one further electronic device 101a at the transceiver unit 107; and evaluating the at least one further electronic device 101a based on the at least one further RF response signal.
The RF test signal may be directed in the direction of the two electronic devices 101, 101a on the support surface 103 simultaneously or in close succession.
The RF test signals for the electronic device 101 and for the at least one other electronic device 101a may be the same signal. Alternatively, the RF test signal may be different for each device 101, 101 a. Transceiver unit 107 may be configured to transmit two RF test signals.
All features of all embodiments described, illustrated and/or claimed herein may be combined with each other.
Claims (15)
1. A system (100) for over the air testing of electronic devices (101), in particular devices under test, comprising:
a support surface (103), wherein the electronic device (101) is arranged on the support surface (103),
a test device (105), the test device (105) comprising a transceiver unit (107) and an RF beamformer (109),
wherein the transceiver unit (107) is configured to transmit an RF test signal,
wherein the RF beamformer (109) is configured to align the RF test signal in a direction of the electronic device (101),
wherein the transceiver unit (107) is configured to receive an RF response signal from the electronic device (101), an
Wherein the test device (105) is configured to evaluate the electronic device (101) based on the RF response signal.
2. The system (100) according to claim 1, wherein the RF beamformer (109) is configured to selectively receive the RF response signals from the electronic device (101) and to forward the received RF response signals to the transceiver unit (107).
3. The system (100) according to claim 2, wherein the RF beamformer (109) is configured to selectively receive the RF response signals by limiting a receive direction of the RF beamformer (109) towards the electronic device (101).
4. The system (100) according to any one of claims 1 to 3, wherein the RF beamformer (109) comprises a phased array antenna.
5. The system (100) according to any of claims 1 to 4, wherein the RF beamformer (109) comprises a chipset having at least one integrated antenna, in particular a packaged antenna.
6. The system (100) according to any one of claims 1 to 5, wherein the support surface (103) comprises a conveyor belt (111), the conveyor belt (111) being configured to move the electronic device (101) relative to the RF beamformer (109).
7. The system (100) according to claim 6, wherein the RF beamformer (109) is configured to actively adapt an alignment of the RF test signals to compensate for movement of the electronic device (101).
8. System (100) according to any one of claims 1 to 7, wherein the support surface (103) comprises a holding device (201), the holding device (201) having at least one fixing (203, 203a-203e) designed to accommodate the electronic device (101).
9. The system (100) according to any one of claims 1 to 8, wherein the system (100) further comprises an absorption unit configured to absorb RF signals, wherein the absorption unit at least partially surrounds the support surface (103) and/or the test device (105).
10. The system (100) according to any one of claims 1 to 9, wherein the RF beamformer (109) is configured to align the RF test signal in the direction of at least one further electronic device (101a-101e) on the support surface (103), wherein the transceiver unit (107) is configured to receive a further RF response signal from the at least one further electronic device (101a-101e), and wherein the test device (105) is configured to evaluate the at least one further electronic device (101a-101e) based on the further RF response signal.
11. A method (300) for over the air testing of an electronic device (101), comprising:
-arranging (301) the electronic device (101) on a support surface (103);
-transmitting (303) an RF test signal from a transceiver unit (107) of the test device (105);
-aligning (305) the RF test signal in the direction of the electronic device (101) by an RF beamformer (109);
-receiving (307) an RF response signal from the electronic device (101) at the transceiver unit (107); and
-evaluating (309) the electronic device (101) based on the RF response signal.
12. The method (300) of claim 11, wherein the RF beamformer (109) is configured to: selectively receive the RF response signal from the electronic device (101), in particular by restricting the RF beamformer (109) towards a reception direction of the electronic device (101), and forward the received RF response signal to the transceiver unit (107).
13. The method (300) of claim 11 or 12, wherein the support surface (103) is configured to move the electronic device (101) relative to the RF beamformer (109).
14. The method (300) of claim 13, wherein the RF beamformer (109) is configured to actively adapt the alignment of the RF test signals to compensate for movement of the electronic device (101).
15. The method (300) according to any one of claims 11-14, further comprising the steps of:
-aligning the RF test signal in the direction of at least one further electronic device (101a-101e) on the support surface (103) by the RF beamformer (109),
-receiving at the transceiver unit (107) at least one further RF response signal from the at least one further electronic device (101a-101e), and
-evaluate the at least one further electronic device (101a-101e) based on the at least one further RF response signal.
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| CN202010088613.0A CN113253090A (en) | 2020-02-12 | 2020-02-12 | System and method for over the air testing of electronic devices |
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| CN202010088613.0A CN113253090A (en) | 2020-02-12 | 2020-02-12 | System and method for over the air testing of electronic devices |
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