CN113242102A

CN113242102A - Radio frequency test method and device, equipment and readable storage medium

Info

Publication number: CN113242102A
Application number: CN202110381934.4A
Authority: CN
Inventors: 石宝辉
Original assignee: Etekcity Corp
Current assignee: Etekcity Corp
Priority date: 2021-04-09
Filing date: 2021-04-09
Publication date: 2021-08-10
Anticipated expiration: 2041-04-09
Also published as: CN113242102B

Abstract

The embodiment of the application discloses a radio frequency test method, a device, equipment and a readable storage medium, which belong to the technical field of communication, and can control the mode of data transmission rate test between a prototype to be tested and a standard prototype when a test sample machine to be tested is subjected to radio frequency test, so that the aim of reversely confirming whether the radio frequency parameters of the prototype to be tested are qualified by using a target test rate is fulfilled, the radio frequency test by using an integrated tester is avoided, the radio frequency test can be confirmed to be qualified by the target test rate, the radio frequency parameters are not required to be respectively tested, the test of the multi-dimensional radio frequency parameters can be reduced to the test of the one-dimensional radio frequency parameters, the time required by the radio frequency test is shortened, and the test efficiency is effectively improved.

Description

Radio frequency test method and device, equipment and readable storage medium

Technical Field

The present application relates to the field of communications technologies, and in particular, to a radio frequency testing method, apparatus, device, and readable storage medium.

Background

With the rapid development of communication technology, electronic communication devices are applied more and more widely in daily life. After the electronic communication equipment with the radio frequency function is produced, radio frequency testing is needed, and the electronic communication equipment which is qualified in the radio frequency testing can only leave a factory, so that the stability of the radio frequency performance of the factory-leaving equipment and the qualification rate of products are ensured.

At present, a radio frequency test method usually uses a comprehensive tester, and the radio frequency test efficiency is low due to the complex use mode of the comprehensive tester.

Content of application

The present application mainly aims to provide a radio frequency testing method, a radio frequency testing device, a radio frequency testing apparatus, and a readable storage medium, which can solve the problem of low efficiency of testing radio frequency performance in the prior art.

To achieve the above object, a first aspect of the present application provides a radio frequency testing method, including:

controlling a prototype to be tested and a standard prototype to perform data transmission rate test on the basis of the target configuration parameters to obtain a target test rate, wherein the standard prototype is a prototype which meets the preset conditions and is qualified in radio frequency test;

and determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and a rate qualified interval of the radio frequency parameters, wherein the rate qualified interval is determined according to the test result of the radio frequency parameters of a first history prototype and the test rate obtained by carrying out the data transmission rate test on the first history prototype and the standard prototype, the first history prototype comprises a second history prototype and a third history prototype, and the third history prototype is a prototype with unqualified radio frequency parameters and qualified other radio frequency parameters in the test result of the radio frequency test.

Optionally, the first history prototype comprises the second history prototype and a third history prototype, the second history prototype is a prototype which is qualified in the radio frequency test, and the third history prototype is a prototype which is qualified in the radio frequency test and has one radio frequency parameter which is unqualified and other radio frequency parameters which are qualified.

Optionally, the method further comprises:

counting by using the test result of the radio frequency parameters of the first history prototype and the test rate obtained by carrying out data transmission rate test on the first history prototype and the standard prototype to obtain the test rate range corresponding to each target interval of the target radio frequency parameters when the offsets of other radio frequency parameters except the target radio frequency parameters are in a qualified range, wherein the target intervals respectively comprise the intervals when the target radio frequency parameters are in the qualified range and in a non-qualified range;

and obtaining a lower limit value of the test rate range in the test rate range corresponding to each target interval, and selecting a maximum value from the lower limit values as a lower limit value of a rate qualified interval of the target radio frequency parameter, wherein an upper limit value of the rate qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range.

Optionally, the data transmission type of the data transmission rate test includes: the first history prototype sends data to the standard prototype, the standard prototype sends data to the first history prototype, and the first history prototype and the standard prototype interact data in a peer-to-peer manner;

then, the obtaining of the lower limit value of the test rate range corresponding to each target interval, and selecting the maximum value from the lower limit values as the lower limit value of the rate qualified interval of the target radio frequency parameter, where the upper limit value of the rate qualified interval is the upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range, includes:

obtaining a test rate range corresponding to each target interval under a first target data transmission type, forming a lower limit value of the test rate range, and selecting a maximum value from the lower limit values as a lower limit value of a rate qualified interval of the target radio frequency parameter when the target radio frequency parameter is in the first target data transmission type, wherein the first target data transmission type is any data transmission type, and an upper limit value of the rate qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter when the target radio frequency parameter is in the qualified range.

Optionally, the obtaining a lower limit value of the test rate range in the test rate range corresponding to each target interval, and selecting a maximum value from the lower limit values as a lower limit value of a rate-qualified interval of the target radio frequency parameter, where an upper limit value of the rate-qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range, further includes:

acquiring lower limit values of rate qualified intervals corresponding to all the radio frequency parameters under the first target data transmission type, and selecting a maximum value from the lower limit values as the lower limit value of the rate qualified interval of all the radio frequency parameters under the first target data transmission type;

and acquiring upper limit values of rate qualified intervals corresponding to all the radio frequency parameters under the first target data transmission type, and selecting a minimum value from the upper limit values as the upper limit value of the rate qualified interval of all the radio frequency parameters under the first target data transmission type.

Optionally, there are a plurality of data transmission types of the data transmission rate test;

then, the step of obtaining the lower limit value of the test rate range corresponding to each target interval to form the lower limit value of the test rate range, and selecting the maximum value from the lower limit values as the lower limit value of the rate qualified interval of the target radio frequency parameter, where the upper limit value of the rate qualified interval is the upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range, further includes:

acquiring lower limit values of rate-qualified intervals of the target radio-frequency parameters under all data transmission types, and selecting a maximum value from the lower limit values as the lower limit value of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types;

and acquiring the upper limit values of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types, and selecting the minimum value from the upper limit values as the upper limit value of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types.

Optionally, the controlling the prototype to be tested and the standard prototype to perform the data transmission rate test to obtain the target test rate includes:

acquiring a transmission parameter of a second target data transmission type used when the first history prototype and the standard prototype carry out data transmission rate test, wherein the transmission parameter is the ratio of the sending data volume and the receiving data volume of the standard prototype;

and controlling the prototype to be tested and the standard prototype to test the data transmission rate according to the second target data transmission type and the transmission parameters of the second target data transmission type to obtain a target test rate.

Optionally, the determining whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and the rate qualified interval of the radio frequency parameter includes:

determining a target test rate qualified interval corresponding to a second target data transmission type from the rate qualified intervals of the radio frequency parameters;

and determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and the target test rate qualified interval.

Optionally, the determining whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and the target test rate qualified interval includes:

when the target test rate qualified interval contains the target test rate, determining that the radio frequency test of the prototype to be tested is qualified;

and when the target test rate qualified interval does not contain the target test rate, adding 1 to the test times of the prototype to be tested, if the test times is less than a preset time threshold, returning to the step of controlling the prototype to be tested and the standard prototype to perform data transmission rate test to obtain the target test rate, and if the test times is equal to the preset time threshold, determining to perform radio frequency test on the prototype to be tested by using the comprehensive tester.

Optionally, before the step of controlling the prototype to be tested and the standard prototype to perform the data transmission rate test to obtain the target test rate, the method further includes:

configuring target configuration parameters required by a prototype to be tested for radio frequency testing, wherein the target configuration parameters have relevance with the radio frequency parameters;

the method for configuring the target configuration parameters required by the radio frequency test of the prototype to be tested comprises the following steps:

writing a first configuration parameter into a prototype to be tested, wherein the first configuration parameter is obtained by utilizing a second configuration parameter corresponding to a second history prototype which is qualified in radio frequency test, and the first configuration parameter is the target configuration parameter;

alternatively, the first and second electrodes may be,

and calibrating the configuration parameters of the prototype to be tested, and determining the calibrated configuration parameters as the target configuration parameters.

To achieve the above object, a second aspect of the present application provides a radio frequency testing apparatus, comprising:

the test module is used for controlling the prototype to be tested and a standard prototype to carry out data transmission rate test to obtain a target test rate, wherein the standard prototype is qualified in radio frequency test and meets preset conditions;

and the determining module is used for determining whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and the rate qualified interval of the radio frequency parameters, wherein the rate qualified interval is determined according to the test result of the radio frequency parameters of the first history prototype and the test rate obtained by carrying out the data transmission rate test on the first history prototype and the standard prototype.

To achieve the above object, a third aspect of the present application provides a computer-readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform the steps of the radio frequency testing method according to the first aspect.

To achieve the above object, a fourth aspect of the present application provides a computer device, which includes a memory and a processor, wherein the memory stores a computer program, and the computer program, when executed by the processor, causes the processor to execute the steps in the radio frequency test method according to the first aspect.

By adopting the embodiment of the application, the following beneficial effects are achieved:

the application provides a radio frequency test method, which uses a rate qualified interval of radio frequency parameters, wherein the rate qualified interval is determined according to the test result of the radio frequency parameters of a first history prototype and the test rate obtained by testing the data transmission rate of the first history prototype and a standard prototype, and the inventor finds out through creative labor that if the radio frequency parameters are qualified, the test rate is positioned in the rate qualified interval of the radio frequency parameters, therefore, when the test sample machine to be tested is subjected to radio frequency test, the mode of testing the data transmission rate of the prototype to be tested and the standard prototype can be controlled, the purpose of reversely determining whether the radio frequency parameters of the prototype to be tested are qualified by using the target test rate is realized, the radio frequency test by using a comprehensive tester is avoided, and whether the radio frequency test is qualified can be determined through the target test rate without respectively testing the radio frequency parameters, the test of reducing the test of the multi-dimensional radio frequency parameters to the one-dimensional speed can be realized, the time required by the radio frequency test is shortened, and the test efficiency is effectively improved.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Wherein:

FIG. 1 is a schematic flow chart illustrating an RF testing method according to an embodiment of the present application;

FIG. 2 is a flow chart illustrating a refinement step of step 102 in the embodiment of FIG. 1 of the present application;

FIG. 3 is a schematic flow chart of configuration parameter calibration performed on a prototype in the embodiment of the present application;

FIG. 4 is a schematic flow chart of the calibration of the configuration parameters of the first prototype in the embodiment of the application;

FIG. 5 is a schematic structural diagram of an RF testing apparatus according to an embodiment of the present application;

fig. 6 is an internal structural diagram of a computer device in the embodiment of the present application.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

In the embodiment of the present application, the radio frequency test refers to testing radio frequency parameters of a prototype to determine whether the prototype has a qualified radio frequency performance through the test of the radio frequency parameters, where the prototype refers to a device having a radio frequency function, and the prototype may be an independent radio frequency module having a radio frequency function, or may also be an electronic communication device including a radio frequency function, such as a smart phone, a smart watch, a tablet computer, and the like.

The rf parameters refer to parameters related to rf performance, including but not limited to transmit power, Error Vector Magnitude (EVM), Signal frequency offset, and Received Signal Strength Indication (RSSI), wherein the RSSI is used for measuring the receiving sensitivity.

In the prior art, a comprehensive tester is used for testing radio frequency parameters of a prototype, and the testing mode is to test each radio frequency parameter respectively, determine a test value of the radio frequency parameter obtained by the test, and determine whether the radio frequency parameter is qualified or not by using the test value. The testing mode uses the comprehensive tester, and the comprehensive tester is more complicated to use, and the time required by the mode of sequentially testing a plurality of radio frequency parameters is more, so that the problem of low testing efficiency exists.

In order to solve the above problem, a radio frequency testing method is proposed in the technical solution of the present application, so as to improve the radio frequency testing efficiency, please refer to fig. 1, which is a schematic flow chart of the radio frequency testing method in the embodiment of the present application, and the method includes:

step 101, controlling a prototype to be tested and a standard prototype to perform rate testing to obtain a target testing rate, wherein the standard prototype is a prototype which meets preset conditions and is qualified in radio frequency testing;

and 102, determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and the rate qualified interval of the radio frequency parameters.

In this embodiment, the radio frequency testing method is implemented by a radio frequency testing apparatus, where the radio frequency testing apparatus is a program module and is stored in a computer-readable storage medium of a main control device, and a processor in the main control device can call and run the program module to implement the radio frequency testing method.

In the embodiment of the present application, a standard prototype will be used, which may be a prototype that is qualified in the rf test, and in a possible implementation, the standard prototype is a prototype that is qualified in the rf test using a comprehensive tester or other rf test instruments.

The master control equipment is respectively connected with a prototype to be tested and a standard prototype, and the prototype to be tested and the standard prototype are in a wireless communication connection mode, so that the master control equipment can control the prototype to be tested and the standard prototype to perform data transmission rate testing, and radio frequency testing of the prototype to be tested can be completed through the rate testing.

It should be noted that, the principle used in the technical solution of the present application is: on the premise that the configuration parameters are the configuration parameters of the prototype to be tested or the configuration parameters are the configuration parameters of the standard prototype, the testing speed between the prototype to be tested and the standard prototype belongs to a determinable range, namely the testing speed range can be determined when the radio frequency test is qualified, and based on the point, if the testing speed conforms to the range, the radio frequency test of the prototype will be qualified, so that whether the radio frequency test is qualified can be reversely determined by utilizing the speed between the prototype to be tested and the standard prototype.

For a better understanding of the principles used in the embodiments of the present application, the following will describe the same in detail:

the prototype has configuration parameters, the configuration parameters are parameters needed by the prototype for radio frequency test, the configuration parameters and the radio frequency parameters have relevance, in a feasible implementation mode, the configuration parameters can be register data, the register data belong to a hardware bottom concept, the register data comprise register values and at least one register compensation value, for the prototype obtained by production, the register data are default initial values, calibration is needed before the radio frequency test, the prototype after the calibration is passed can be subjected to the radio frequency test, and the prototype which is not passed through the calibration needs to be subjected to maintenance of radio frequency performance. For a prototype, the size of the register data may affect the value of the radio frequency parameter of the prototype, that is, the size of the register data has a correlation with the radio frequency parameter, and may affect the judgment of whether the radio frequency parameter is qualified when the radio frequency parameter of the prototype is tested.

Specifically, the register data includes a register value and at least one register compensation value, and can be used to form a power control function of the transmission power of the prototype when transmitting data, and in a feasible implementation manner, if the register data includes a register value a, a first register compensation value C, and a second register compensation value D, the power control function of the prototype can be expressed as:

power A + a C + b D

Where a and b are constants, it should be noted that a and b may be different in chips used by different manufacturers or different operators, and the number of register offset values may also be different.

It can be understood that, as can be seen from the above expressions, the register value a, the first register compensation value C, and the second register compensation value D have a linear relationship with the transmission power.

Note that the above-mentioned register data is related not only to the transmission power but also to other radio frequency parameters, for example, EVM, signal frequency offset, and RSSI, which are positively correlated with the transmission power. Therefore, if the calibration of the register data of the prototype is realized based on the transmission power, it indicates that the calibration before the test of the radio frequency parameters such as the EVM, the signal frequency offset, and the RSSI of the prototype is also completed.

It should be noted that, based on the relationship between the configuration parameter and the transmission power, the EVM, the signal frequency offset, and the RSSI, when calibrating the configuration parameter, the configuration parameter may be calibrated by using the transmission power, or the configuration parameter may be calibrated by using the EVM, or the configuration parameter may be calibrated by using the signal frequency offset, or the configuration parameter may be calibrated by using the RSSI, and in an actual application, one or more ways may be selected for calibration, which is not limited herein.

Further, in this embodiment of the application, an integrated tester may be used to perform radio frequency tests on a preset number of prototypes, and select a first history prototype, where the first history prototype includes a second history prototype that is qualified in the radio frequency test, and further includes a third history prototype, and the third history prototype is a prototype that has one unqualified radio frequency parameter in the radio frequency test result and other qualified radio frequency parameters. It will be appreciated that for the third calendar model, the configuration parameters are not calibrated at their failing rf parameters when calibrated prior to testing.

The second configuration parameters and the test results of the radio frequency parameters after the first history prototype is calibrated can be obtained through the radio frequency test of the first history prototype, furthermore, the data transmission rate test of the first history prototype and the standard prototype can be controlled to obtain the test rate, and the data analysis can be carried out by utilizing the second configuration parameters, the test results of the radio frequency parameters and the test rate to determine the relationship among the configuration parameters, the test results of the radio frequency parameters and the test rate.

The data analysis can determine that the second history prototype can be distinguished from the third history prototype based on the test rate, and if a rate range is formed by the test rate of the second history prototype which is qualified based on the radio frequency test, the probability of the third history prototype in the range is smaller.

Based on the above discussion, the inventor creatively finds that, for the second history prototype that the radio frequency test is qualified, there is a relationship between the radio frequency test result and the test rate, that is, the test rate belongs to a determinable rate range under the condition that the radio frequency test result is qualified, and in order to achieve the purpose of improving the test efficiency, whether the radio frequency test is qualified or not can be reversely determined based on the test rate and the determinable rate range, which is the implementation principle of the technical scheme of the present application.

Based on the above principle, in order to determine whether the radio frequency test is qualified based on the test rate in the reverse direction, it is necessary to ensure that the test reference is the same or similar, that is, the configuration parameters are the same or similar, and the second configuration parameters of the second historical prototype can be used for processing to obtain the standard target configuration parameters for the test, wherein the second configuration parameters are the data calibrated by the second historical prototype, and the test rate of the first historical prototype is used to determine the rate qualified interval of the radio frequency parameters, so that when the test rate is within the range of the rate qualified interval, the corresponding radio frequency parameters are necessarily qualified, so that the radio frequency test can be performed on the test sample machine to be tested based on the target configuration parameters and the rate qualified interval, without using a comprehensive tester, thereby avoiding the problem of reducing the test efficiency caused by using the comprehensive tester, and further, whether the radio frequency test is qualified can be determined by using the test rate in the reverse direction, the time required by the test is shortened by the dimension reduction processing mode, and the test efficiency is effectively improved. Wherein, the dimension reduction treatment is as follows: if the radio frequency parameters include the transmission power, the EVM, the signal frequency offset and the RSSI, the comprehensive tester is used for executing one test, the four parameters are required to be respectively tested, the test process is executed for four times, and the test is executed at the test rate, namely, one data transmission rate test is required, namely, one test process is executed.

It should be noted that the test result of the radio frequency parameters of the first history prototype and the test rate obtained by performing the data transmission rate test on the first history prototype and the standard prototype may be used to perform statistics, so as to obtain the test rate range corresponding to each target interval of the target radio frequency parameters when the offsets of the other radio frequency parameters except the target radio frequency parameters are within the qualified range. The target interval comprises an interval when the target radio frequency parameter is in a qualified range and an interval when the target radio frequency parameter is in a non-qualified range, and the target interval is a plurality of continuous intervals. Further, a lower limit value of the test rate range is formed in the test rate range corresponding to each target interval, a maximum value is selected from the lower limit values as a lower limit value of a qualified interval of the target radio frequency parameter, and an upper limit value of the rate qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified interval, for example, if the target radio frequency parameter is transmission power, other three radio frequency parameters such as EVM, signal frequency offset and RSSI are qualified, at this time, the target radio frequency parameter is shifted and divided into five target intervals, which are respectively (— infinity, -a), [ -a, -b), [ -b, b), [ b, c) and [ b, + ∞), and the speed rate ranges corresponding to the five target intervals can be respectively obtained to respectively obtain the lower limit values forming the test rate range, d1, d2, d3, d4 and d5 respectively, then selecting the maximum value from the 5 values as the lower limit value of the rate qualified interval of the transmission power, and if the maximum value is d3 and the upper limit value + ∞ofthe corresponding test rate range when the target radio frequency parameter is in the qualified range, then the rate qualified interval of the transmission power is [ d3, + ∞ ].

It should be noted that, in a feasible implementation manner, when the test rate between the first history prototype and the standard prototype is obtained, different data transmission types may be further distinguished, specifically, the data transmission type between the first history prototype and the standard prototype is obtained, and includes that the first history prototype sends data to the standard prototype, the standard prototype sends data to the first history prototype, and the first history prototype sends peer-to-peer interaction data to the standard prototype, in this implementation manner, the manner of obtaining the rate qualified interval of the target video parameter may be: taking a first target data transmission type as an example, where the first target data transmission type is any data transmission type, a lower limit value of a test rate range can be obtained in a test rate range corresponding to each target interval under the first target data transmission type, a maximum value is selected from the lower limit values as a lower limit value of a rate qualified interval of a target radio frequency parameter when the target radio frequency parameter is in the first target data transmission type, and an upper limit value of the rate qualified interval is an upper limit value of the test rate range corresponding to the target video parameter when the target video parameter is in the qualified range.

Further, rate qualified intervals corresponding to all radio frequency parameters under the first target data transmission type can be obtained, and the method specifically includes: the method comprises the steps of obtaining lower limit values of rate qualified intervals corresponding to all radio frequency parameters under a first target data transmission type, selecting a maximum value from the lower limit values as a lower limit value of the rate qualified intervals of all the radio frequency parameters under the first target data transmission type, obtaining upper limit values of the rate qualified intervals corresponding to all the radio frequency parameters under the first target data transmission type, and selecting a minimum value from the upper limit values as an upper limit value of the rate qualified intervals of all the radio frequency parameters under the first target data type.

Further, considering that there are multiple data transmission types, each rf parameter can also be obtained, in the rate qualified interval under all data transmission types, specifically, after obtaining the rate qualified interval of each radio frequency parameter under each data transmission type, taking the target rf parameter as an example, the rate qualified interval of the target rf parameter in all data transmission types is obtained, determining the lower limit values of the rate qualified intervals forming all the data transmission types, selecting the maximum value from the lower limit values as the lower limit value of the rate qualified interval of the target radio frequency parameter under all the data transmission types, and acquiring the upper limit value of the rate qualified interval of the target radio frequency parameter under all data transmission types, and selecting the minimum value from the upper limit value as the upper limit value of the rate qualified interval of the target video parameter of the target radio frequency parameter under all data transmission types.

For better understanding of the technical solution in the present application, the following describes a method for determining a rate qualified interval of a radio frequency parameter in detail based on experimental data, as follows:

second configuration parameters of a large number of first history prototypes (the number of the first history prototypes is more than 1 ten thousand) and test results of all radio frequency parameters and test rates obtained by testing transmission rates between the first history prototypes and standard prototypes can be obtained, wherein the second configuration parameters are configuration parameters after calibration is qualified, the obtained data of the first history prototypes are counted, and a table 1 can be obtained:

table 1

In table 1, the rf parameters include power offset, EVM, signal frequency offset, and RSSI, where whether the rf parameters are qualified is represented by an offset, which is a difference between a measured value obtained by measurement and a preset target value. The unit of transmission power is dBm, the unit of EVM is dB, the unit of signal frequency offset is ppm, and the unit of RSSI is dB.

In the above table 1, it is known that, in the case where the power offset of the transmission power is within the range of [ -2.0, +2.0], the transmission power test is passed, in the case where the power offset is within the range of [ -2.0, +2.0], in the case where the EVM is within the range of (- ∞, -3], the EVM test is passed, in the case where the signal frequency offset is within the range of [ -20, +20], in the case where the RSSI is within the range of (- ∞, -3], the RSSI test is passed, and in the above table 1, it is known that, in the case where the transmission power is transmitted with a variation range of the power frequency offset from- ∞ to + ∞, and exhibits a normal distribution, and the corresponding EVM frequency offset, signal frequency offset, and RSSI offset are all the pass ranges, and that statistics of the test data of the transmission power can be obtained in the case where all of the other three radio frequency parameters are passed, the variation of the power offset, and the variation of the power offset includes a range where the power offset is qualified and a range where the power offset is not qualified, it can be understood that the data where the transmission power is not qualified in the power offset in the table 1 is obtained by using the test data of the prototype where the transmission power is not qualified in the third history prototype, and the test data of the prototype where the other three parameters are qualified, and the data where the transmission power is qualified in the power offset in the table 1 can be obtained by using the data in the second history prototype, and it can also be understood that the conditions of other three radio frequency parameters, such as EVM, signal frequency offset, and RSSI, are similar to the transmission power, and will not be described herein again.

In addition, in table 1 above, a range of test rates obtained when a data transfer rate test is performed between the first history prototype and the standard prototype is also included, where the data transfer rate test has a plurality of different data transfer types, including: the method comprises the steps that a first historical prototype sends data to a standard prototype, the standard prototype sends data to the first historical prototype, the first historical prototype and the standard prototype interact with each other in an equivalent mode, and further, each different data transmission type further comprises a transmission parameter, the transmission parameter is the ratio of the sending data quantity to the receiving data quantity of the standard prototype, for example, if the first historical prototype sends data to the standard prototype, the ratio of the sending data quantity to the receiving data quantity of the standard prototype is 1:100, if the standard prototype sends data to the first historical prototype, the ratio of the sending data quantity to the receiving data quantity of the standard prototype is 100:1, and if the standard prototype interacts with the first historical prototype in an equivalent mode, the ratio of the sending data quantity to the receiving data quantity of the standard prototype is 50: 50. It is to be understood that, here, the transmission parameter of the data transmission type is set by the ratio of the sending amount and the receiving amount of the standard prototype, in another feasible implementation manner, the ratio of the sending data amount and the receiving data amount of the first history prototype may also be set according to the actual situation, which is not limited here, and further, for the consistency of the standard, the transmission parameter of the same type of data transmission type of the first history prototype is the same. It should be noted that, 1:100 or 100:1 mentioned above may also be a negative infinite value in a feasible implementation manner: 100, or, 100: negative infinity values.

Using table 1 above, rate-qualified intervals of radio frequency parameters can be obtained, and in a possible implementation, each transmit power corresponds to a rate-qualified interval under one data transmission type, for example, based on table 1 above, if the data transmission type is the first history prototype and transmits data to a standard prototype, the range of the test rate that can be obtained is [0,3.28), [3.28,18.7), [18.7, + ∞), [6.24,18.7 ], and the lower limit values constituting each range are selected from each range and are 0,3.28, 18.7, 6.24 respectively, and the maximum value is selected from the lower limit values, the maximum value can be determined to be 18.7, and the upper limit value in the rate-qualified interval such as [18.7, + ∞.) is used as the upper limit value of the test rate range corresponding to the transmit power under the qualified range, thereby determining that the transmit power is qualified, then, in the case where the first history prototype transmitted data to the standard prototype, the rate-qualified interval of the test rate was [18.7, + infinity), and further, another way could be to determine the rate-qualified interval in which the power offset corresponding to [18.7, + infinity) was [ -2.0, +2.0], and the power offset was the range of the transmission power-qualified range, and then the rate-qualified interval corresponding thereto was [18.7, + infinity ] when the transmission power was qualified, or, for RSSI, in the case where the power offset, the EVM offset, and the RSSI offset were all qualified, the range of the offset-qualified was the range formed by (- ∞ -8] and (-8-3), and therefore, the lower limit value of the range formed could be selected using the ranges of the test rate [43.12, + infinity ] and [34.28, + infinity ] corresponding to the two ranges, 43.12 and 34.28, respectively, taking the maximum of the lower limits, the rate-qualified interval can be determined to be [43.12, + ∞). It is understood that other three radio frequency parameters may also determine the corresponding rate-qualified interval in a similar manner, for example, the EVM may be [18.62, + ∞ ] when the data transmission type is the first history prototype transmitting data to the standard prototype, the rate-qualified interval may be [26.88, + ∞ ] when the data transmission type is the first history prototype transmitting data to the standard prototype, and the RSSI may be [43.12, + ∞ ] when the data transmission type is the first history prototype transmitting data to the standard prototype, and it is understood that other two types of data transmission types may also obtain the corresponding rate-qualified interval in a similar manner, and specifically, referring to table 2 below, the rate-qualified interval corresponding to the test rate when the radio frequency parameters are qualified:

table 2

In practical application, the table 2 may be used to determine the target test rate obtained by the test of the sample machine to be tested, so as to determine whether the radio frequency test of the sample machine to be tested is qualified, for example, if the data transmission type is to transmit data to the standard sample machine, and the target test rate obtained by the test is 30, it may be determined that the transmission power, the EVM, and the signal frequency offset of the sample machine to be tested are qualified, and the RSSI is not qualified.

Or, in another case, the intersection of the rate-qualified intervals of the transmission power, the EVM, the signal frequency offset, and the RSSI may be obtained to obtain a rate-qualified interval, so that the rate-qualified interval can be used to perform a first judgment to determine whether the radio frequency test of the prototype to be tested is qualified, and based on the table 2, a table that can determine whether the radio frequency test is qualified by using a rate-qualified interval may be obtained, please refer to the following table 3:

table 3

That is, after the above table 2 is obtained, taking the data transmission type for transmitting data to the standard prototype as an example, the rate-qualified interval of each radio frequency parameter in the data transmission type is [18.7, + ∞), [18.62, + ∞), [26.88, + ∞) and [43.12, + ∞) ] and the maximum value of the lower limit values constituting the rate-qualified interval is selected as 43.12 and the maximum value of the upper limit values constituting the rate-qualified interval is selected as + ∞, and the rate-qualified interval [43.12, + ∞ ] in the above table 3 can be obtained in the same manner as the other examples.

As shown in table 3, the rate-qualified interval for which the radio frequency parameters are all qualified is [43.12, + ∞ ] in the case where the first history prototype transmitted data to the standard prototype, the rate-qualified interval for which the radio frequency parameters are all qualified is [28.63, + ∞ ] in the case where the standard prototype transmitted data to the first history prototype, and the rate-qualified interval for which the radio frequency parameters are all qualified [35.12, + ∞ ] in the case where the first history prototype interacted with the standard prototype peer-to-peer.

In another possible implementation manner, after obtaining table 2, the intersection of the rate-qualified intervals of the radio frequency parameters under different data transmission types may be further obtained, so as to obtain a rate-qualified range corresponding to the radio frequency parameters one to one, as shown in table 4, as follows:

item(s)	Rate qualified interval
		Transmission power	[26.95,+∞)
EVM	[26.38,+∞)
		Signal frequency offset	[29.58,+∞)
RSSI	[43.12,+∞)

TABLE 4

Taking the transmission power as an example, the rate qualified intervals of different data transmission types are respectively: [18.7, + ∞), [26.95, + ∞), [22.7, + ∞) may be used to select the maximum value, i.e., 26.95, from the lower limit values of each rate-qualified interval and the minimum value, i.e., + ∞, from the upper limit values of each rate-qualified interval to form a rate-qualified interval corresponding to the transmission power.

It can be understood that, in practical applications, the rate qualified interval in table 2 or table 3 may be selected according to specific situations, which is not described herein again.

The procedure for performing radio frequency testing on a prototype to be tested is described in detail below:

the main control device configures target configuration parameters required by a prototype to be tested for radio frequency testing, wherein in a feasible implementation manner, the target configuration parameters are configured in the following manner:

the method includes the steps of determining a second historical prototype from a first historical prototype, determining the target configuration parameter by using a second configuration parameter of the second historical prototype, specifically, obtaining the first configuration parameter by taking a median value or an average value, writing the first configuration parameter into a prototype to be tested as the target configuration parameter, for example, if the second configuration parameter includes a register value a, a first register compensation value C and a second register compensation value D, averaging the register values a of a plurality of second historical prototypes, taking the obtained average value as a register value in the first configuration parameter, and respectively performing average value calculation on the first register compensation value C and the first register compensation value D, and taking the obtained values as a first register compensation value and a second register compensation value in the first configuration parameter.

The standard prototype can be a prototype which is qualified in radio frequency test, and in a feasible implementation manner, in order to improve the test accuracy, when the standard prototype is selected, the radio frequency test can be performed on the candidate prototype first, and if the radio frequency test of the candidate prototype is qualified, the data obtained by the radio frequency test of the candidate prototype can be further judged, and particularly, whether the candidate prototype can be used as the standard prototype can be determined by improving the standard mode which is qualified in test. For example, when the integrated tester is used to perform a radio frequency test on a prototype candidate F, the transmission power of the prototype F measured by the integrated tester is P1, and the preset target transmission power is P2, it can be determined whether P3 ═ P1-P2 is within a preset first transmission power qualified range S1, if P3 is within the range S1, it is determined that the transmission power of the prototype candidate F passes the test, and the test is qualified, it can be further determined whether P3 is within a preset second transmission power qualified range S2, the range S1 includes a range S2, if P3 is within a range S2, it is determined that the prototype candidate is usable as a standard prototype, and if P3 is not within the range S2, it is determined that the prototype candidate is a test qualified prototype but cannot be used as a standard prototype. For better understanding, the above range S1 may be [ -4, 4], and the range S2 may be [ -2, 2 ].

In the embodiment of the application, the rate qualified interval of the radio frequency parameters is determined according to the test result of the radio frequency parameters of the first history prototype and the test rate obtained by carrying out the data transmission rate test on the first history prototype and the standard prototype, the first history prototype comprises the second history prototype and the third history prototype, and the third history prototype is a prototype which has unqualified radio frequency parameters and other qualified radio frequency parameters in the test result of the radio frequency test.

In another possible implementation manner, the manner of configuring the target configuration parameters for the radio frequency test of the prototype to be tested may further be: and calibrating the configuration parameters of the prototype to be tested, and determining the calibrated configuration parameters as target configuration parameters.

And it can be understood that the rate qualified interval of the radio frequency parameters is determined based on the principle, and whether the radio frequency test of the prototype to be tested is qualified or not can be determined according to the target test rate of the prototype to be tested and the rate qualified interval of the radio frequency parameters.

In the embodiment of the application, when the radio frequency test is performed on the test sample machine to be tested, the target configuration parameters can be written into the prototype to be tested, and the data transmission rate test mode of the prototype to be tested and the standard prototype is controlled, so that whether the radio frequency parameters of the prototype to be tested are qualified or not is determined reversely by using the target test rate obtained by the test, the radio frequency test by using the comprehensive tester is avoided, the test whether the radio frequency parameters are qualified or not can be realized through the target test rate, the radio frequency parameters do not need to be tested respectively, the purpose of reducing the test of the multi-dimensional radio frequency parameters to the test of the one-dimensional radio frequency parameters can be realized, the time required by the radio frequency test is shortened.

Referring to fig. 2, a flow chart of a step of refining step 101 in the embodiment shown in fig. 1 of the present application is shown, which includes:

step 201, acquiring transmission parameters of a second target data transmission type used when the first history prototype and the standard prototype carry out data transmission rate test;

in the embodiment of the application, in order to perform the radio frequency test on the sample machine to be tested by using the target configuration parameter obtained based on the data of the first history prototype and the rate-qualified interval of the radio frequency parameter, on the basis of ensuring that the configuration parameter used by the prototype to be tested is the target configuration parameter, it is also required to ensure that the data transmission types are the same and the transmission parameters are the same when the data transmission rate test is performed, so that whether the radio frequency parameter is qualified can be determined reversely by using the rate-qualified interval of the radio frequency parameter and the target test rate obtained by the test.

It is understood that there may be a variety of different types of data transfer between the first historical prototype and the standard prototype, including but not limited to: and the first history prototype sends data to the standard prototype, the standard prototype sends data to the first history prototype, the first history prototype and the standard prototype interact with each other in a peer-to-peer manner, and the like. If the first history prototype and the standard prototype adopt one type of data transmission type, the data transmission type is a second target data transmission type, and if the first history prototype and the standard prototype adopt two or more data transmission types, the data transmission type indicates that any one of the two or more data transmission types can be used for radio frequency test when the test sample machine to be tested is subjected to radio frequency test, the selection mode can be random selection or selection according to a preset priority rule, and the selected data transmission type is determined as the second target data transmission type.

Step 202, controlling the prototype to be tested and the standard prototype to perform data transmission rate test according to a second target data transmission type and the transmission parameters of the second target data transmission type to obtain a target test rate.

If the second target data transmission type is that the first history prototype sends data to the standard prototype, and the transmission parameters are A1: b1, controlling the prototype to be tested to send data to the standard prototype, wherein the ratio of the sending data volume to the receiving data volume of the standard prototype is A1: b1, performing data transmission rate test to obtain a target test rate, wherein A1: b1 may be minus infinity: 100. if the second target data transmission type is that the standard prototype sends data to the first history prototype, and the transmission parameters are A2: and B2, controlling the standard prototype to send data to the prototype to be tested, wherein the ratio of the sending data volume to the receiving data volume of the standard prototype is A2: b2, performing data transmission rate test to obtain a target test rate, wherein A2: b2 may be 100: negative infinity values. If the second target data transmission type is equivalent interactive data between the standard prototype and the first historical prototype, and the transmission parameters are A3: b3, controlling the tested model machine and the standard model machine to be in accordance with A3: b3 sending data interactively to test data transmission rate to obtain target test rate.

Since the rate qualified interval of the rf parameter used by the second target data transmission type is different, step 102 in the embodiment shown in fig. 1 may include the following steps:

step a, acquiring a target test rate qualified interval of the radio frequency parameters corresponding to the second target data transmission type;

and b, determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and the target test rate qualified interval.

In the embodiment of the application, a target test rate qualified interval of the radio frequency parameters corresponding to the second target data transmission type can be obtained, and whether the radio frequency parameters of the prototype to be tested are qualified or not is determined according to the target test rate and the target test rate qualified interval. Specifically, when the target test rate qualified interval contains the target test rate, determining that the radio frequency test of the prototype to be tested is qualified; and when the target test rate qualified interval does not contain the target test rate, adding 1 to the test times of the prototype to be tested, and if the test times is smaller than a preset time threshold, returning to execute the step 102 in the embodiment shown in fig. 1. If the test times are equal to the preset time threshold, the comprehensive tester can be used for carrying out radio frequency test on the sample machine to be tested.

In a feasible implementation manner, if each radio frequency parameter corresponds to a target rate qualified interval, as shown in table 2, the target test rate can be used to compare with the target rate qualified interval of each radio frequency parameter, if the target test rates are all located in the target rate qualified intervals of each radio frequency parameter, the radio frequency test of the prototype to be tested is determined to be qualified, if one or more target rate qualified intervals do not contain the target test rate, the radio frequency test of the prototype to be tested can be determined to be unqualified, and the unqualified radio frequency parameter can be determined.

In another feasible implementation manner, if each radio frequency parameter commonly uses a target rate qualified interval, as shown in table 3, a target test rate may be used to compare with the target rate qualified interval, if the target test rate is within the rate qualified interval, the radio frequency test of the prototype to be tested is determined to be qualified, and if the target test rate is not within the rate qualified interval, the radio frequency test of the prototype to be tested is determined to be unqualified.

In the embodiment of the application, a target configuration parameter is obtained by utilizing a second configuration parameter of a second history prototype in a first history prototype, a rate qualified interval of the radio frequency parameter is determined by utilizing a test result of the radio frequency parameter of the first history prototype and a test rate obtained by testing the data transmission rate of the first history prototype and a standard prototype, so that the target configuration parameter can be written into the prototype to be tested, the data transmission rate test is carried out by controlling the prototype to be tested and the standard prototype to obtain a target test rate, the target test rate is compared with the rate qualified interval of the radio frequency parameter to determine whether the radio frequency test of the prototype to be tested is qualified or not, so that whether the radio frequency test is qualified or not can be reversely confirmed by utilizing the target test rate without using a comprehensive tester or respectively testing each radio frequency parameter, the efficiency of radio frequency test can be effectively improved.

It can be understood that, before the radio frequency test is performed on the prototype to be tested by using the technical solution in the above method embodiment, the radio frequency test is performed on the prototype by using the comprehensive tester, and it is determined which prototypes can be used as the first history prototypes based on the test result, and for the first history prototypes, the data transmission rate test is performed on the first history prototypes and the standard prototypes to obtain the test rate, wherein before the radio frequency test is performed on the prototype, the configuration parameters of the prototype also need to be calibrated, so that the prototype to be tested can perform the radio frequency test on the basis of the calibrated configuration parameters meeting the requirements.

Please refer to fig. 3, which is a schematic flow chart of calibrating configuration parameters of a prototype before rf testing in the embodiment of the present application, including:

301, reading initial configuration parameters in a first prototype;

step 302, calibrating the initial configuration parameter based on a preset target sending power to obtain a second configuration parameter of the first prototype, wherein the second configuration parameter is data when the target sending power and the actual sending power meet a preset calibration condition;

303, carrying out radio frequency test on the calibrated radio frequency parameters of the first prototype by using a comprehensive tester;

and 304, if the radio frequency parameters meet preset qualified conditions, determining the first sample machine as the second history sample machine.

In the embodiment of the application, a prototype needs to be tested by using a comprehensive tester to extract a first history prototype, so that a target configuration parameter and a rate qualified interval of a radio frequency parameter, which are needed to be used for confirming whether a radio frequency test is qualified or not based on a rate reversal, can be obtained based on the first history prototype.

Taking the first prototype as an example for explanation, the initial configuration parameters in the first prototype, which are usually default values, may be read first, and the initial configuration parameters are calibrated by using the preset target transmission power, so as to obtain the second configuration parameters of the first prototype.

Wherein the target transmission power is the power that the first sample machine is expected to reach, and it can be understood that the power control function of the transmission power of the first sample machine is formed by configuration parameters, so that the calibration of the transmission power of the first sample machine can be achieved by calibrating the configuration parameters.

Further, the second configuration parameter is data when the target transmission power and the actual transmission power satisfy a preset calibration condition, and the calibration process of step 302 specifically includes the following steps:

step c1, controlling the first prototype to carry out a transmission power test based on the ith configuration parameter and the comprehensive tester, and obtaining the actual transmission power of the first prototype, wherein the initial value of i is 1, and the 1 st configuration parameter is the initial configuration parameter;

step c2, when the power difference value between the actual transmission power and the target transmission power is within a preset first power difference range, determining that the ith configuration parameter is a second configuration parameter after the first sample machine calibration;

and c3, when the power difference between the actual transmission power and the target transmission power is not within the first power difference range, adjusting the ith configuration parameter to obtain an ith +1 configuration parameter, and returning to execute the step c1 after i is equal to i + 1.

In this embodiment of the application, when calibrating a first sample machine, the first sample machine may be controlled to perform a transmission power test based on an ith configuration parameter and an integrated tester, and obtain an actual transmission power of the first sample machine, it can be understood that a description mode using the ith configuration parameter is that the calibration process may be a calibration process that is circulated for multiple times, for convenience of description, the description mode using the ith configuration parameter is used, and an initial value of i is 1, and the 1 st configuration parameter is an initial configuration parameter, so that calibration may be performed from the initial configuration parameter.

After the actual sending power is obtained, comparing the actual sending power with the target sending power, determining a power difference value between the actual sending power and the target sending power, and if the power difference value is within a preset first power difference range, determining that the ith configuration parameter is a second configuration parameter after the first sample machine is calibrated, and completing the calibration. And when the power difference value is not within the preset first power difference range, indicating that the calibration is not completed, adjusting the ith configuration parameter to obtain the ith +1 configuration parameter, making i equal to i +1, returning to execute the step of controlling the first sample machine to perform the transmission power test based on the ith configuration parameter and the comprehensive tester, and acquiring the actual transmission power of the first sample machine until the calibration is completed.

Further, the configuration parameter includes a register value and at least one register compensation value, and the adjustment of the configuration parameter may be an adjustment of the register compensation value, so that a power difference between the actual transmission power and the target transmission power under the adjusted configuration parameter can be within the first power difference range.

In one possible implementation, a register offset value may be adjusted as follows: and increasing a first register compensation value in the ith configuration parameter according to a preset step length to obtain an adjusted configuration parameter, wherein the first register compensation value can be any one register compensation value in the ith configuration parameter, determining whether the increased first register compensation value overflows, if the increased first register compensation value does not overflow, indicating that the adjustment of the first register compensation value is feasible, determining that the ith configuration parameter containing the adjusted first register compensation value is the (i + 1) th configuration parameter, and determining whether the power difference value between the actual transmission power and the target transmission power is within a preset first power difference range by using the (i + 1) th configuration parameter.

In another possible implementation manner, if the number of the register compensation values is at least two, the at least two register compensation values may also be adjusted, taking the adjustment of the first register compensation value and the second register compensation value as an example, the step length of the adjustment of the first register compensation value may be preset to be a first step length and the step length of the adjustment of the second register compensation value is a second step length, and the first step length is greater than the second step length, for example, the first step length of the adjustment of the first register compensation value is 10, the second step length of the adjustment of the second register compensation value is 5, and the adjustment of the first register compensation value is preferentially performed, specifically, referring to fig. 4, which is a schematic flow diagram of calibrating the configuration parameters of the first prototype in the embodiment of the present application, and includes:

step 401, reading initial configuration parameters of a first prototype;

step 402, controlling a first prototype to perform a transmission power test with a comprehensive tester based on an ith configuration parameter, and acquiring the actual transmission power of the first prototype; continuing to execute step 403 or step 404; the initial value of i is 1, and the 1 st configuration parameter is an initial configuration parameter;

step 403, when the power difference between the actual transmission power and the target transmission power is within a preset first power difference range, determining that the ith configuration parameter is the second configuration parameter after the first sample machine calibration;

step 404, when the power difference between the actual transmission power and the target transmission power is not within the first power difference range, increasing a first register compensation value in the ith configuration parameter according to a first step length to obtain an adjusted (i + 1) th configuration parameter;

step 405, if the increased first register compensation value does not overflow, controlling the first sample machine to perform a transmission power test based on the (i + 1) th configuration parameter and the comprehensive tester to obtain the actual transmission power of the first sample machine;

step 406, when the power difference between the actual transmission power and the target transmission power is not within the preset first power difference range, making i equal to i +1, and returning to the step of increasing the first register compensation value in the ith configuration parameter according to the first step in the step 404 to obtain the adjusted ith +1 configuration parameter;

step 407, when the power difference value between the actual transmission power and the target transmission power is within a preset first power difference range, increasing a second register compensation value in the (i + 1) th configuration parameter according to a second step length to obtain an adjusted (i + 2) th configuration parameter;

step 408, if the increased compensation value of the second register does not overflow, controlling the first prototype to perform a transmission power test based on the increased (i + 2) th configuration parameter and the comprehensive tester to obtain the actual transmission power of the first prototype;

step 409, when the power difference value between the actual transmission power and the target transmission power is within a preset second power difference range, determining the (i + 2) th configuration parameter as a second configuration parameter after the first sample machine is calibrated;

step 410, when the power difference between the actual transmission power and the target transmission power is not within the second power difference range, making i +1 equal to i +2, and returning to the step 407 of increasing the second register compensation value in the i + 1-th configuration parameter according to the second step length to obtain the adjusted i + 2-th configuration parameter.

In the embodiment of the application, after the initial configuration parameters of the first prototype are read, the configuration parameters in the calibration process are described by the ith configuration parameter, the initial value of i is 1, and the 1 st configuration parameter is the initial configuration parameter.

And controlling the first sample machine to carry out a transmission power test based on the ith configuration parameter and the comprehensive tester so as to obtain the actual transmission power of the first sample machine under the condition of the ith configuration parameter, comparing the actual transmission power with the target transmission power, determining the power difference value between the actual transmission power and the target transmission power, determining whether the power difference value is within a preset first power difference range, and increasing the first register compensation value in the ith configuration parameter according to the first step length when the power difference value is within the first power difference range to obtain the adjusted (i + 1) th configuration parameter.

After the i +1 configuration parameter is obtained, it is determined whether a first register compensation value in the i +1 configuration parameter overflows, if not, it indicates that further calibration can be performed based on the i +1 configuration parameter, the first sample machine may be controlled to perform a transmission power test based on the i +1 configuration parameter and the comprehensive tester, obtain an actual transmission power of the first sample machine, and determine again whether a power difference between the actual transmission power and a target transmission power is within a preset first power difference range, if not, it indicates that adjustment of the first register compensation value is not finished, and if it is necessary to continue to adjust the first register compensation value, i +1 may be set, and the step of increasing the first register compensation value in the i +1 configuration parameter according to the first step in step 404 may be performed. If the power difference is within the first power difference range, it indicates that the calibration of the first register compensation value has been completed by performing the transmission power test based on the (i + 1) th configuration parameter, and the second register compensation value can be continuously adjusted to achieve more accurate calibration of the configuration parameter, specifically, the second register compensation value in the (i + 1) th configuration parameter can be increased according to the second step length to obtain the adjusted (i + 2) th configuration parameter, and it is determined whether the increased second register compensation value overflows, if the increased second register compensation value does not overflow, it indicates that the first sample machine can be controlled to perform the transmission power test based on the increased (i + 2) th configuration parameter and the comprehensive tester, to obtain the actual transmission power of the first sample machine, and it is determined whether the power difference between the actual transmission power and the target transmission power is within the preset second power difference range, and when the power difference is within the second power difference range, it may be determined that the calibration of the configuration parameters has been completed, and the final i + 2-th configuration parameter is the second configuration parameter after the calibration of the first camera. If the power difference is not within the second power difference range, it indicates that further calibration of the second register compensation value is needed, and i +1 may be made equal to i +2, and the step of increasing the second register compensation value in the i + 1-th configuration parameter according to the second step size in step 407 may be executed again until the calibration is completed.

It will be appreciated that there may be instances where the adjusted first register offset value overflows, in which case it may be determined that the first sample engine requires servicing, and instances where the adjusted second register offset value overflows, in which case it may be determined that the first sample engine requires servicing. It can be understood that the calibrated first sample machine can utilize the comprehensive tester to perform radio frequency test, and if the radio frequency test of the first sample machine is qualified, the first sample machine and the standard sample machine can be continuously controlled to perform data transmission rate test to obtain a test rate, the first sample machine is used as a second history sample machine, if the radio frequency test result of the first sample machine is that one radio frequency parameter is unqualified and other radio frequency parameters are qualified, the first sample machine and the standard sample machine are controlled to perform data transmission rate test to obtain a test rate, and the first sample machine is used as a third history sample machine, so that the target configuration parameters and the rate qualified interval of the radio frequency parameters can be determined by utilizing the data tested by the radio frequency test of the second history sample machine and the first history sample machine and the test rate obtained by the data transmission rate test, so that the rate reverse determination based on the target configuration parameters and the rate qualified interval of the radio frequency parameters can be realized The radio frequency testing efficiency is effectively improved by the purpose of judging whether the radio frequency parameters are qualified.

It should be noted that, in the embodiment shown in fig. 4, calibration of the configuration parameters is implemented by using the transmission power, and if calibration of the configuration parameters is implemented by using the EVM, the signal frequency offset, or the RSSI, a similar manner may also be used, which is not described herein again.

Further, it can be understood that, since the test of one radio frequency parameter is completed in the process of calibrating the configuration parameter, the radio frequency parameter may be tested again or may not be tested any more in the process of performing the radio frequency test by using the integrated tester after the calibration.

Please refer to fig. 5, which is a schematic structural diagram of an rf testing apparatus according to an embodiment of the present application, the rf testing apparatus includes:

the test module 501 is configured to control the prototype to be tested and the standard prototype to perform a data transmission rate test on the basis of the target configuration parameters to obtain a target test rate, where the standard prototype is a prototype that is qualified in the radio frequency test and meets preset conditions;

a determining module 502, configured to determine whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and a rate qualified interval of the radio frequency parameter, where the rate qualified interval is determined according to a test result of the radio frequency parameter of the first history prototype and a test rate obtained by performing a data transmission rate test on the first history prototype and the standard prototype.

In the embodiment of the application, when the radio frequency test is performed on the test sample machine to be tested, the target configuration parameters can be written into the prototype to be tested, and the data transmission rate test mode of the prototype to be tested and the standard prototype is controlled, so that the purpose of reversely confirming whether the radio frequency parameters of the prototype to be tested are qualified by using the target test rate is realized, the radio frequency test by using the comprehensive tester is avoided, whether the radio frequency test is qualified can be determined by using the target test rate, the radio frequency parameters are not required to be respectively tested, the test of the multi-dimensional radio frequency parameters can be reduced to the test of the one-dimensional radio frequency parameters, the time required by the radio frequency test is shortened, and the test efficiency is effectively improved.

Further, the first history prototype comprises a second history prototype and a third history prototype, the second history prototype is a prototype which is qualified in the radio frequency test, and the third history prototype is a prototype which is qualified in the radio frequency test and has one radio frequency parameter which is unqualified and other radio frequency parameters which are qualified.

Optionally, the above radio frequency testing apparatus further includes:

the statistical module is used for carrying out statistics by utilizing the test result of the radio frequency parameters of the first history prototype and the test rate obtained by carrying out data transmission rate test on the first history prototype and the standard prototype to obtain target intervals respectively comprising the intervals when the target radio frequency parameters are in a qualified range and in a non-qualified range when the offsets of other radio frequency parameters except the target radio frequency parameters are in the qualified range;

and the first selection module is used for obtaining a lower limit value of the test rate range in the test rate range corresponding to each target interval, and selecting a maximum value from the lower limit value as a lower limit value of a rate qualified interval of the target radio frequency parameter, wherein the upper limit value of the rate qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range.

the selecting module is specifically configured to:

Optionally, the system further comprises a second selecting module, configured to: acquiring lower limit values of rate qualified intervals corresponding to all the radio frequency parameters under the first target data transmission type, and selecting a maximum value from the lower limit values as the lower limit value of the rate qualified interval of all the radio frequency parameters under the first target data transmission type; and acquiring upper limit values of rate qualified intervals corresponding to all the radio frequency parameters under the first target data transmission type, and selecting a minimum value from the upper limit values as the upper limit value of the rate qualified interval of all the radio frequency parameters under the first target data transmission type.

Optionally, the system further comprises a third selecting module, configured to: acquiring lower limit values of rate-qualified intervals of the target radio-frequency parameters under all data transmission types, and selecting a maximum value from the lower limit values as the lower limit value of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types; and acquiring the upper limit values of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types, and selecting the minimum value from the upper limit values as the upper limit value of the rate-qualified intervals of the target radio-frequency parameters under all the data transmission types.

Optionally, the test module 502 includes:

the parameter acquisition module is used for acquiring transmission parameters of a second target data transmission type used when the first history prototype and the standard prototype carry out data transmission rate test, and the transmission parameters are the ratio of the sending data volume and the receiving data volume of the standard prototype;

and the control test module is used for controlling the prototype to be tested and the standard prototype to perform data transmission rate test according to the second target data transmission type and the transmission parameters of the second target data transmission type to obtain a target test rate.

Optionally, the determining module 503 includes:

an interval obtaining module, configured to determine a target test rate qualified interval corresponding to the second target data transmission type from the rate qualified intervals of the radio frequency parameters;

and the qualification determining module is used for determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and the target test rate qualified interval.

Optionally, the qualification determining module is specifically configured to:

Optionally, the system further comprises a configuration module, configured to configure target configuration parameters required by the prototype to be tested for the radio frequency test, wherein the target configuration parameters have relevance with the radio frequency parameters; and the configuration module is specifically configured to:

writing a first configuration parameter into a prototype to be tested, wherein the first configuration parameter is obtained by utilizing a second configuration parameter corresponding to a second history prototype which is qualified in radio frequency test, and the first configuration parameter is the target configuration parameter; or, calibrating the configuration parameters of the prototype to be tested, and determining the calibrated configuration parameters as the target configuration parameters.

In an embodiment of the present application, a computer-readable storage medium is provided, which stores a computer program, and when the computer program is executed by a processor, the computer program causes the processor to execute the steps in the radio frequency test method as mentioned in the above embodiments.

In an embodiment of the present application, a computer device is provided, which includes a memory and a processor, the memory stores a computer program, and the computer program, when executed by the processor, causes the processor to execute the steps in the radio frequency test method as mentioned in the above embodiments.

FIG. 6 is a diagram illustrating an internal structure of a computer device in one embodiment. The computer device may specifically be a terminal, and may also be a server. As shown in fig. 6, the computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program, which, when executed by the processor, causes the processor to carry out the steps of the above-described method embodiments. The internal memory may also store a computer program, which, when executed by the processor, causes the processor to perform the steps of the above-described method embodiments. Those skilled in the art will appreciate that the architecture shown in fig. 6 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a non-volatile computer-readable storage medium, and can include the processes of the embodiments of the methods described above when the program is executed. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. A radio frequency testing method, the method comprising:

controlling a prototype to be tested and a standard prototype to perform data transmission rate test to obtain a target test rate, wherein the standard prototype is qualified in radio frequency test and meets preset conditions;

and determining whether the radio frequency test of the prototype to be tested is qualified or not according to the target test rate and the rate qualified interval of the radio frequency parameters, wherein the rate qualified interval is determined according to the test result of the radio frequency parameters of the first history prototype and the test rate obtained by carrying out the data transmission rate test on the first history prototype and the standard prototype.

2. The method according to claim 1, wherein the first history prototypes comprise a second history prototype and a third history prototype, the second history prototype is a prototype which is qualified in the radio frequency test, and the third history prototype is a prototype which is qualified in the radio frequency test and has one radio frequency parameter which is unqualified and other radio frequency parameters which are qualified.

3. The method according to claim 1 or 2, characterized in that the method further comprises:

4. The method of claim 3, wherein the data transmission type of the data transmission rate test comprises: the first history prototype sends data to the standard prototype, the standard prototype sends data to the first history prototype, and the first history prototype and the standard prototype interact data;

5. The method according to claim 4, wherein the step of obtaining a lower limit value of the test rate range corresponding to each target interval, and selecting a maximum value from the lower limit values as a lower limit value of a rate-qualified interval of the target radio frequency parameter, where the upper limit value of the rate-qualified interval is an upper limit value of the test rate range corresponding to the target radio frequency parameter in the qualified range, further includes:

6. The method of claim 4, wherein there are a plurality of data transmission types for the data transmission rate test;

7. The method of claim 1, wherein the controlling the prototype to be tested to perform the data transmission rate test with the standard prototype to obtain the target test rate comprises:

8. The method of claim 7, wherein said determining whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and the rate qualified interval of the radio frequency parameters comprises:

9. The method of claim 8, wherein the determining whether the radio frequency test of the prototype to be tested is qualified according to the target test rate and the target test rate qualified interval comprises:

10. The method according to claim 1, wherein before the step of controlling the prototype to be tested and the standard prototype to perform the data transmission rate test to obtain the target test rate, the method further comprises:

alternatively, the first and second electrodes may be,

11. A radio frequency testing apparatus, the apparatus comprising:

12. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, causes the processor to carry out the steps of the radio frequency testing method according to any one of claims 1 to 10.

13. A computer device comprising a memory and a processor, characterized in that the memory stores a computer program which, when executed by the processor, causes the processor to carry out the steps of the radio frequency testing method of any one of claims 1 to 10.