CN113240997A - Hall effect experiment instrument and method convenient for replacing test material - Google Patents
Hall effect experiment instrument and method convenient for replacing test material Download PDFInfo
- Publication number
- CN113240997A CN113240997A CN202110652222.1A CN202110652222A CN113240997A CN 113240997 A CN113240997 A CN 113240997A CN 202110652222 A CN202110652222 A CN 202110652222A CN 113240997 A CN113240997 A CN 113240997A
- Authority
- CN
- China
- Prior art keywords
- test material
- box
- hinge
- tester
- hall effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
- G09B25/00—Models for purposes not provided for in G09B23/00, e.g. full-sized devices for demonstration purposes
Landscapes
- Engineering & Computer Science (AREA)
- Business, Economics & Management (AREA)
- Physics & Mathematics (AREA)
- Educational Administration (AREA)
- Educational Technology (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention belongs to the technical field of Hall effect experiments, and relates to a Hall effect experiment instrument and an experiment method convenient for replacing a test material. In addition, the whole device has a simplified structure, is convenient for students to study and understand, is beneficial to popularization of related experiments, increases the interest of physics, arouses interest of students in physics in lower grades, and has educational influence.
Description
The technical field is as follows:
the invention belongs to the technical field of Hall effect experiments, and relates to a Hall effect experiment instrument and an experiment method, wherein the Hall effect experiment instrument is convenient for replacing a test material.
Background art:
the hall effect tester is used for measuring important parameters of the semiconductor material, such as carrier concentration, mobility, resistivity, hall coefficient and the like, and the parameters are necessary to know the electrical characteristics of the semiconductor material in advance, so the hall effect tester is a necessary tool for understanding and researching the electrical characteristics of semiconductor devices and semiconductor materials. The Hall effect experiment is a relatively classical experiment in college physics, can realize basic measurement of parameters such as Hall coefficient, carrier concentration, mobility, conductivity and the like of a material, and has important application in semiconductor physics.
As a common physical experiment, the experimental device is unchanged for a long time, the requirement of students on experimental measurement can not be met under the higher requirement of the modern physical experiment, the test material of the original experimental device is inconvenient to replace, only the original fixed material can be measured, the tests of various materials and various sizes are difficult to realize, more operations are not facilitated for an experimenter, the operability of the experiment is greatly reduced, and the problem of copying the experimental data is easily caused; the original instrument is not visual enough, the circuit is complex, the wiring is easy to be connected in error, and the purpose that students can hardly understand the experiment principle completely is achieved as a demonstration experiment.
The invention content is as follows:
the invention aims to overcome the defects in the prior art, and provides the Hall effect experiment instrument and the experiment method which are convenient for replacing a test material, so that the Hall effect experiment instrument is more convenient to operate and more intuitive to demonstrate.
In order to achieve the purpose, the Hall effect experiment instrument comprises a coil, a first hinge, an installation frame, a carrying box, a second hinge and a test material, wherein the coil is installed on a corresponding base, the middle position of the side surface of the base of the coil is rotatably connected with the installation frame through the first hinge, the side surface of the end part of the installation frame is rotatably connected with the carrying box through the second hinge, the test instrument is respectively and electrically connected with the coil and the carrying box through wires, and the test material is placed in the carrying box.
As a preferable scheme of the invention, the carrying box is rectangular, the box cover is arranged at the upper part of the carrying box, the middle positions of the four side surfaces of the carrying box are provided with wiring holes, the inner side surface of the carrying box is fixedly connected with conductive contacts corresponding to the wiring holes, a lead connected with a tester is electrically connected to the conductive contacts through the wiring holes, and the conductive contacts are buckled and pressed on the four side surfaces of the test material, so that the test material is fixed and conductive contact is formed.
As a preferred scheme of the invention, the carrying box is integrally made of PC materials, the mounting frame is an L-shaped right-angle plate made of acrylic materials, and the conductive contacts are tin points.
The specific process of the invention for carrying out the experiment by adopting the Hall effect experiment instrument comprises the following steps:
(1) opening a box cover of the object carrying box, placing the test material between the conductive contacts in a buckling manner, enabling the four conductive contacts to be in contact with four surfaces of the test material respectively, and covering the box cover;
(2) the side face of the carrying box is attached to the mounting frame by turning the carrying box through the second hinge, and the mounting frame is turned through the first hinge, so that the carrying box is integrally positioned in the middle of the coil after the mounting frame is turned;
(3) turning on a power supply of the tester, switching on a circuit, adjusting input current, and reading out the displayed readings of the Hall voltage on the tester; if the test material needs to be replaced, the loading box is moved out by overturning the mounting frame, and the loading box is opened for replacement.
The invention has the beneficial effects that: the invention improves the original experimental device, so that the test material is more convenient to replace, the operability and the copy resistance of the experiment are greatly improved, the structure after modification is simple, and the cost of the selected material is lower, thereby reducing the modification cost of the instrument. In addition, the whole device has a simplified structure, is convenient for students to study and understand, is beneficial to popularization of related experiments, increases the interest of physics, arouses interest of students in physics in lower grades, and has educational influence.
Description of the drawings:
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic structural view of the mounting bracket and the carrier case of the present invention;
fig. 3 is a sectional view showing an inner structure of the carrier case of the present invention.
In the figure: the test device comprises a tester 1, a coil 2, a first hinge 3, a mounting rack 4, a carrying box 5, a box cover 501, a wiring hole 502, a conductive contact 503, tinfoil 504, a second hinge 6 and a test material 7.
The specific implementation mode is as follows:
the invention is further illustrated by the following examples in conjunction with the accompanying drawings.
Example 1:
as shown in fig. 1 to 3, the hall effect tester for facilitating the replacement of the test material according to the embodiment includes a tester 1, a coil 2, a first hinge 3, a mounting frame 4, a carrying box 5, a second hinge 6 and a test material 7, the coil 2 is arranged on the base, the middle position of the side surface of the base of the coil 2 is rotatably connected with an installation frame 4 through a first hinge 3, the side surface of the end part of the mounting rack 4 is rotatably connected with a carrying box 5 through a second hinge 6, the carrying box 5 is rectangular, the upper part of the carrying box 5 is provided with a box cover 501, wiring holes 502 are arranged in the middle of the four side surfaces of the object carrying box 5, conductive contacts 503 are fixedly connected with the inner side surface of the object carrying box 5 at the positions corresponding to the wiring holes 502, the lead wire connected with the tester 1 is electrically connected to the conductive contact 503 through the wiring hole 502, and the tester 1 is electrically connected to the coil 2 and the loading box 5 through the lead wires, respectively.
The object carrying box 5 is used for placing a test material 7, the test material 7 is placed on the tinfoil 504, the conductive contacts 503 are buckled and pressed on four side surfaces of the test material 7, so that the test material 7 is fixed and conductive contact is formed, and the box cover 501 can be opened, so that the test material 7 can be conveniently taken and placed.
The whole PC material that chooses for use of year thing box 5, mounting bracket 4 is the L shape right angle panel of ya keli material, electrically conductive electric shock 503 is the tin point.
The working principle of the embodiment is as follows: open lid 501 and place test material 7 buckle between electrically conductive contact 503, make four electrically conductive contacts 503 respectively with four face contacts of test material 7, lid 501 is good, can overturn through second hinge 6 and carry thing box 5, make and carry the laminating of thing box 5 side on mounting bracket 4, then can overturn mounting bracket 4 through first hinge 3, make after the 4 upsets of mounting bracket carry thing box 5 wholly be located 2 intermediate positions of coil, through control tester 1 alright experimental. If the test material 7 needs to be replaced, the carrying box 5 can be removed by turning the mounting frame 4, and then the carrying box 5 is opened for replacement.
Example 2:
this example adoptsEmbodiment 1 the hall effect tester convenient for replacing the test material is used for testing, and for accurate measurement, the tester is first zeroed, i.e. the I of the testerSRegulation and IMAdjusting knobs to zero positions, and if V is detected after starting up for several minutesHThe display is not zero, zero setting can be realized through a zero setting screw of a small hole at the lower left of the panel of the tester, and V is measuredH—ISRelation, then switching the function of the laboratory apparatus to VHHold of IMThe values were unchanged, and the specific experimental results were as follows:
table 1: i isM＝0.500A
Table 2: i iss＝1.450mA
The experimental results show that the improved Hall effect experimental instrument can still sensitively display the Hall effect phenomenon, and the chip replacement is convenient and quick, so that the improved Hall effect experimental instrument has a good teaching demonstration effect.
Components and circuit connections not described in detail herein are prior art.
Although the present invention has been described in detail with reference to the specific embodiments, the present invention is not limited to the above embodiments, and various changes and modifications without inventive changes may be made within the knowledge of those skilled in the art without departing from the spirit of the present invention.
Claims (3)
1. The utility model provides a hall effect experiment appearance convenient to change test material, includes tester, coil, its characterized in that still includes first hinge, mounting bracket, year thing box, second hinge and test material, and the coil is installed on its base that corresponds, the first hinge of base side intermediate position fixedly connected with of coil, fixedly connected with mounting bracket on the first hinge, mounting bracket tip side fixedly connected with second hinge carry the thing box to pass through the second hinge rotates to be connected on the mounting bracket, and the tester is connected with the coil and carries the thing box electricity through the wire respectively, puts the test material in carrying the thing box.
2. The hall effect tester of claim 1 wherein the test material is easily replaced by: the object carrying box is rectangular, a box cover is arranged at the upper part of the object carrying box, wiring holes are formed in the middle positions of the four side faces of the object carrying box, conductive contacts are fixedly connected to the inner side face of the object carrying box corresponding to the wiring holes, wires connected with a tester are electrically connected onto the conductive contacts through the wiring holes, a test material is buckled between the conductive contacts, and the conductive contacts are pressed on the four side faces of the test material.
3. A method of performing a hall effect experiment using the hall effect tester of claim 2, wherein: the specific process is as follows:
(1) opening a box cover of the object carrying box, placing the test material between the conductive contacts in a buckling manner, enabling the four conductive contacts to be in contact with four surfaces of the test material respectively, and covering the box cover;
(2) the side face of the carrying box is attached to the mounting frame by turning the carrying box through the second hinge, and the mounting frame is turned through the first hinge, so that the carrying box is integrally positioned in the middle of the coil after the mounting frame is turned;
(3) turning on a power supply of the tester, switching on a circuit, adjusting input current, and reading out the displayed readings of the Hall voltage on the tester; if the test material needs to be replaced, the loading box is moved out by overturning the mounting frame, and the loading box is opened for replacement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110652222.1A CN113240997A (en) | 2021-06-11 | 2021-06-11 | Hall effect experiment instrument and method convenient for replacing test material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110652222.1A CN113240997A (en) | 2021-06-11 | 2021-06-11 | Hall effect experiment instrument and method convenient for replacing test material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113240997A true CN113240997A (en) | 2021-08-10 |
Family
ID=77139756
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110652222.1A Pending CN113240997A (en) | 2021-06-11 | 2021-06-11 | Hall effect experiment instrument and method convenient for replacing test material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113240997A (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205139335U (en) * | 2015-11-13 | 2016-04-06 | 东莞市创明电池技术有限公司 | Battery performance simulation testing arrangement |
| CN205157730U (en) * | 2015-12-02 | 2016-04-13 | 日月光半导体（昆山）有限公司 | Integrated circuit hall effect testing arrangement and test platform thereof |
| CN206208908U (en) * | 2016-08-17 | 2017-05-31 | 广州万孚生物技术股份有限公司 | Reagent card fixer and the detector containing the reagent card fixer |
| CN206618831U (en) * | 2017-03-17 | 2017-11-07 | 武汉市蜀汉量子科技有限责任公司 | A kind of new alternating temperature Hall effect tester |
| CN112164290A (en) * | 2020-11-03 | 2021-01-01 | 杨天宇 | Novel Hall effect experiment instrument |
| CN112394263A (en) * | 2020-10-16 | 2021-02-23 | 西安锐驰电器有限公司 | Multifunctional insulation strength testing device |
| CN213043006U (en) * | 2020-10-27 | 2021-04-23 | 安徽利维能动力电池有限公司 | Cylinder electricity core fixed knot that adapts to not unidimensional constructs |
| CN213211452U (en) * | 2020-11-03 | 2021-05-14 | 杨天宇 | Novel Hall effect experiment instrument |
| CN215220047U (en) * | 2021-06-11 | 2021-12-17 | 张怡菲 | Hall effect experiment instrument convenient for replacing test material |
-
2021
- 2021-06-11 CN CN202110652222.1A patent/CN113240997A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205139335U (en) * | 2015-11-13 | 2016-04-06 | 东莞市创明电池技术有限公司 | Battery performance simulation testing arrangement |
| CN205157730U (en) * | 2015-12-02 | 2016-04-13 | 日月光半导体（昆山）有限公司 | Integrated circuit hall effect testing arrangement and test platform thereof |
| CN206208908U (en) * | 2016-08-17 | 2017-05-31 | 广州万孚生物技术股份有限公司 | Reagent card fixer and the detector containing the reagent card fixer |
| CN206618831U (en) * | 2017-03-17 | 2017-11-07 | 武汉市蜀汉量子科技有限责任公司 | A kind of new alternating temperature Hall effect tester |
| CN112394263A (en) * | 2020-10-16 | 2021-02-23 | 西安锐驰电器有限公司 | Multifunctional insulation strength testing device |
| CN213043006U (en) * | 2020-10-27 | 2021-04-23 | 安徽利维能动力电池有限公司 | Cylinder electricity core fixed knot that adapts to not unidimensional constructs |
| CN112164290A (en) * | 2020-11-03 | 2021-01-01 | 杨天宇 | Novel Hall effect experiment instrument |
| CN213211452U (en) * | 2020-11-03 | 2021-05-14 | 杨天宇 | Novel Hall effect experiment instrument |
| CN215220047U (en) * | 2021-06-11 | 2021-12-17 | 张怡菲 | Hall effect experiment instrument convenient for replacing test material |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102004337B (en) | Liquid crystal display (LCD) test fixture and test method thereof | |
| CN206618918U (en) | A kind of test device | |
| CN206370217U (en) | A kind of electrophysics experimental provision | |
| CN206292307U (en) | A kind of device of utilization Wheatstone bridge measuring resistance | |
| CN107290399B (en) | Transformer water content measuring device based on PDC/FDS medium response method | |
| CN215220047U (en) | Hall effect experiment instrument convenient for replacing test material | |
| CN113240997A (en) | Hall effect experiment instrument and method convenient for replacing test material | |
| CN206618831U (en) | A kind of new alternating temperature Hall effect tester | |
| CN217505983U (en) | High-precision solution conductivity measuring instrument | |
| CN205941695U (en) | Resistance measuring device | |
| CN203069710U (en) | System for electrical transport property measurement on material | |
| CN101937624A (en) | Electrostatic field plotter | |
| CN209784246U (en) | Electrical testing device for functional thin film | |
| CN2932530Y (en) | A simulative electrostatic field drawing instrument | |
| CN221039232U (en) | Nonlinear resistance tester with temperature control function | |
| CN206832950U (en) | Resistance substrate test device | |
| CN202929112U (en) | Apparatus for testing resistivity of solar cell material under low temperature | |
| CN206584643U (en) | A kind of Experiments of Electricity instruments used for education | |
| CN221326401U (en) | Convenient testing device of silicon nanowire field effect sensor | |
| CN209168498U (en) | A kind of analog electrostatic field drawing apparatus | |
| CN207650305U (en) | A kind of sampling plate high speed tester | |
| CN201549107U (en) | Experimental instrument for measuring resistivity | |
| CN109959829A (en) | A kind of sampling plate high speed tester | |
| CN221350002U (en) | Detection device for thickness of coating layer for automobile | |
| CN106707051A (en) | Electrical property testing device for flexible material |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20210810 |