CN109959829A - A kind of sampling plate high speed tester - Google Patents

Abstract

The invention discloses a kind of sampling plate high speed testers, host includes shell, DC power supply, direct current signal power supply, Voltage measure are equipped in shell, control panel is equipped with voltage display screen, voltage adjusting knob, power switch, several test parameters switching switch；Host upper surface, which is equipped with above limit pillar host, places sampling plate, and sampling plate passes through limit pillar positioning support；Host upper surface is additionally provided with metal probe；Metal probe includes probe column, and probe top end is equipped with the probe springs of one end coaxial arrangement, and probe springs top is equipped with probe contacts；Metal probe is in electrical contact with the terminal of sampling plate bottom respectively.Measured piece sampling plate of the present invention is lain in above tooling by pillar, entire test process does not need external power supply to be not required to, without cable connection by any tool, entire test process only needs a tester, completes the testing time of one piece of sampling plate less than 1 minute.

Description

A kind of sampling plate high speed tester

Technical field

The present invention relates to electronic component field more particularly to a kind of sampling plate high speed testers.

Background technique

The sampling plate used in 2MHz radio-frequency signal generator at present needs to carry out functional test before being attached to complete machine, this survey Examination process is comparatively laborious, time-consuming.Instrument needed for sampling plate is tested has, two DC power supplies (wherein an output voltage be+ The output of 12V, -12V two-way, another electric power output voltage are continuously adjusted from 0V to 5V) and one piece of multimeter；Testing procedure is such as Under: ± 12V DC the voltage of a power supply is added on the power supply terminal of sampling plate first, then by another regulated power supply Output voltage is transferred to 0V, is connected on the detection signal input terminal of sampling plate, next on multimeter measurement output terminal Voltage changes simultaneously applied signal voltage, observes the voltage readings on multimeter whether in test index, finally record test As a result, and judge whether sampling plate qualified, if qualified, be stored in qualified area, wait complete machine assembling, if unqualified, storage To area to be adjusted, waiting is debugged again, and so far, sampling plate test job is completed.This process is cooperated by two people and is completed, people test, Another people's record, needs to test altogether 5 parameters: voltage, electric current, temperature, incidence and reflection, when having surveyed needed for one piece of sampling plate Between about 4 minutes.

Summary of the invention

The purpose of the present invention is design a kind of sampling plate high speed tester.

For achieving the above object, the technical scheme is that a kind of sampling plate high speed tester, including host, Host includes shell, is equipped with DC power supply, direct current signal power supply, Voltage measure in shell, the side of the shell is set There is control panel, the voltage display screen of display input voltage, output voltage is equipped with above control panel, is gone back on the control panel The power switch of voltage adjusting knob, control tester opening and closing equipped with control direct current signal electric power output voltage value, the control Several test parameter switching switches are additionally provided on panel processed；

The host upper surface is equipped with limit pillar, and limit pillar upper end is ladder-like；Sampling plate is placed above the host, is adopted Template is parallel to host upper surface by limit pillar positioning support；The host upper surface is additionally provided with the spy of at least four metals Needle；The metal probe includes probe column, and the probe column installation is electrically connected on the host and with host, probe top end The probe springs of one end coaxial arrangement are installed, probe springs top is equipped with probe contacts；The metal probe respectively with adopt The terminal of template bottom is in electrical contact.

The metal probe include positive pole probe, power cathode probe, detection signal input probe, detection signal it is defeated Probe out, the positive pole probe are in electrical contact by the probe contacts on top and the positive power supply terminal of sampling plate, the electricity Source negative probe is in electrical contact by the probe contacts on top and the cathode power supply terminal of sampling plate, and the detection signal inputs probe It is in electrical contact by the probe contacts on top and the signal input terminal of sampling plate, the detection signal output probe passes through top The electrical contact of the signal output terminal of probe contacts and sampling plate；

The positive pole probe is electrically connected by probe column with DC power supply anode, and the power cathode probe passes through spy Needle column is electrically connected with DC power supply cathode, and the detection signal input probe passes through probe column and direct current signal positive pole Electrical connection, the detection signal output probe are electrically connected by probe column with DC power supply cathode, and the detection signal is defeated Probe also passes through probe column and connect with Voltage measure out, the voltage of Voltage measure detection detection signal output metal probe.

The test parameter switching switch includes voltage tester, testing current, temperature test, incident test, reflection measurement.

The beneficial effects of the present invention are:

Tester measured piece sampling plate of the invention is lain in above tooling by pillar, entire test process do not need by appoint What tool, is not required to external power supply, without cable connection, entire test process only needs a tester, completes one piece of sampling plate Testing time less than 1 minute.

Detailed description of the invention

Fig. 1 is the structural diagram of the present invention；

Fig. 2 is probe structure schematic diagram of the present invention.

Specific embodiment

Below in conjunction with attached drawing, technical scheme in the embodiment of the invention is clearly and completely described.

As shown in Figure 1, 2, a kind of sampling plate high speed tester, including host 1, host 1 includes shell 101, in shell 101 Equipped with DC power supply (not shown), direct current signal power supply (not shown), Voltage measure (not shown), The side of the shell 101 is equipped with control panel 102, and the electricity of display input voltage, output voltage is equipped with above control panel 102 Display screen 103,104 is pressed, the voltage that control direct current signal electric power output voltage value is additionally provided on the control panel 102 adjusts rotation Button 105 controls the power switch 106 that tester is opened and closed, and 5 test parameters switching switches are additionally provided on the control panel 102 107, including voltage tester, testing current, temperature test, incident test, reflection measurement.

The host upper surface is equipped with limit pillar 108, and limit 108 upper end of pillar is ladder-like；It is put above the host 1 Sampling plate 2 is set, limit pillar 2 is inserted into the mounting hole of sampling plate 2, and sampling plate 2 is parallel to by limit 2 positioning support of pillar 1 upper surface of host；1 upper surface of host is additionally provided with several pairs of metal probes 109；The metal probe 109 includes probe column 1091, the probe column 1091 is mounted on the host 1 and is electrically connected with host 1, and 1091 top of probe column is equipped with one end The probe springs 1092 of coaxial arrangement, 1092 top of probe springs are equipped with probe contacts 1093.The metal probe respectively with The terminal 201 of 2 bottom of sampling plate is in electrical contact.

In the present embodiment, totally four kinds of metal probe 109, i.e. positive pole probe, power cathode probe, detection signal are defeated Enter probe, detection signal output probe, respectively corresponds four kinds of terminals of sampling plate 2, i.e., positive power supply terminal, cathode feeder ear Son, signal input terminal, signal output terminal, the probe contacts 1093 and sampling plate 2 that the positive pole probe passes through top The electrical contact of positive power supply terminal, the power cathode probe supplied by the cathode of the probe contacts 1093 on top and sampling plate 2 Electric terminal electrical contact, the detection signal input probe pass through the probe contacts 1093 on top and the signal input part of sampling plate 2 Son electrical contact, the detection signal output probe pass through the probe contacts 1093 on top and the signal output terminal electricity of sampling plate 2 Contact.

The positive pole probe is electrically connected by probe column 1091 with DC power supply anode, and the power cathode is visited Needle be electrically connected by probe column 1091 with DC power supply cathode, the detection signal input probe pass through probe column 1091 and The electrical connection of direct current signal positive pole, the detection signal output probe pass through probe column 1091 and DC power supply negative electricity Connection, the detection signal output probe also pass through probe column 1091 and connect with Voltage measure, Voltage measure detection detection The voltage of signal output metal probe 109.

Tested sampling plate 2 is lain in above host 1 by limiting pillar 2, is not needed screw and is fixed, on sampling plate 2 Measured point, the metal probe 109 on host 1 are aligned with the terminal 201 on sampling plate 2, and are connected by the weight of circuit board itself, To guarantee that metal probe 109 contacts well with terminal 201, design has one section of spring arrangement on metal probe 109, it is ensured that right All terminals 201 well contact.Two voltage display screens 103,104 on control panel 102, left side show " input electricity Pressure ", right side is shown " output voltage ", and input voltage can be adjusted by voltage adjusting knob 105, and numerical value real-time display exists On " input voltage " screen, tooling lower right side " test parameter switching " can switch between different parameters, test knot It is shown in when fruit on " output voltage " display screen.Entire test process does not need to be not required to external power supply by any tool, do not have There is cable connection.Entire test process only needs a tester, completes the testing time of one piece of sampling plate less than 1 minute.

The present invention to 2 electric current of sampling plate, temperature, incidence, reflection test, obtained by the conversion to voltage signal, Specific conversion mode such as the following table 1 test parameter corresponding relationship:

	Input display	Output display
			Voltage	05.0	50.0
Electric current	02.2	22.0
			Temperature	04.5	45.0
It is incident	00.2	20.0
			Reflection	00.1	10.0

1 test parameter corresponding relationship of table

According to table 1, when test parameter is switched to voltage, adjustment input voltage is 0.50V, output voltage 50.0V, then it represents that tested Sampling plate is qualified, otherwise unqualified；Similarly, identical step can test the electric current of tested sampling plate, temperature, incidence, reflection Whether performance is qualified.

Described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Based on the present invention In embodiment, every other implementation obtained by those of ordinary skill in the art without making creative efforts Example, shall fall within the protection scope of the present invention.

Claims (3)

1. a kind of sampling plate high speed tester, which is characterized in that including host, host includes shell, is equipped with direct current in shell and supplies Power supply, direct current signal power supply, Voltage measure, the side of the shell are equipped with control panel, are equipped with above control panel aobvious Show the voltage display screen of input voltage, output voltage, control direct current signal electric power output voltage is additionally provided on the control panel The voltage adjusting knob of value controls the power switch that tester is opened and closed, and is additionally provided with several test parameters on the control panel and cuts Change switch；

The host upper surface is equipped with limit pillar, and limit pillar upper end is ladder-like；Sampling plate is placed above the host, is adopted Template is parallel to host upper surface by limit pillar positioning support；The host upper surface is additionally provided with the spy of at least four metals Needle；The metal probe includes probe column, and the probe column installation is electrically connected on the host and with host, probe top end The probe springs of one end coaxial arrangement are installed, probe springs top is equipped with probe contacts；The metal probe respectively with adopt The terminal of template bottom is in electrical contact.

2. sampling plate high speed tester according to claim 1, which is characterized in that the metal probe includes positive pole Probe, power cathode probe, detection signal input probe, detection signal export probe, and the positive pole probe passes through top Probe contacts and the positive power supply terminal of sampling plate be in electrical contact, the power cathode probe by the probe contacts on top with adopt The cathode power supply terminal of template is in electrical contact, and the detection signal input probe passes through the probe contacts on top and the signal of sampling plate Input terminal electrical contact, the detection signal output probe pass through the probe contacts on top and the signal output terminal electricity of sampling plate Contact；

The positive pole probe is electrically connected by probe column with DC power supply anode, and the power cathode probe passes through spy Needle column is electrically connected with DC power supply cathode, and the detection signal input probe passes through probe column and direct current signal positive pole Electrical connection, the detection signal output probe are electrically connected by probe column with DC power supply cathode, and the detection signal is defeated Probe also passes through probe column and connect with Voltage measure out, the voltage of Voltage measure detection detection signal output metal probe.

3. according to claim 1 or 2 any sampling plate high speed testers, which is characterized in that the test parameter switching Switch includes voltage tester, testing current, temperature test, incident test, reflection measurement.