CN113237635A - Liquid crystal lens phase detection device and method - Google Patents
Liquid crystal lens phase detection device and method Download PDFInfo
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- CN113237635A CN113237635A CN202110460382.6A CN202110460382A CN113237635A CN 113237635 A CN113237635 A CN 113237635A CN 202110460382 A CN202110460382 A CN 202110460382A CN 113237635 A CN113237635 A CN 113237635A
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Abstract
The embodiment of the application provides a liquid crystal lens phase detection device and a method. The interferometer comprises a reference light path, a sample light path and an interference light path formed by combining light, and the liquid crystal lens is arranged in the sample light path. The shading baffle is arranged at a first position outside a light path formed by the interferometer and can be switched to a reference light path or a sample light path from the first position, so that the interferometer has an unshielded state in which the shading baffle is located at the first position, a first shielded state in which the shading baffle moves to the sample light path, and a second shielded state in which the shading baffle moves to the reference light path. The camera is arranged on the interference light path and is used for respectively obtaining interference fringes when the interferometer is in an unshielded state, the light intensity of the reference beam when the interferometer is in a first shielded state and the light intensity of the sample beam when the interferometer is in a second shielded state. The device not only can improve the accuracy of image processing, but also can realize the automation of testing.
Description
Technical Field
The application belongs to the technical field of liquid crystal lenses, and particularly relates to a liquid crystal lens phase detection device and method.
Background
The polarized light microscope system has the advantage of high measurement precision. Currently, a polarization microscope system can be used as a method for measuring the phase difference of the liquid crystal lens.
However, since the polarization microscope system adopts a point scanning measurement method, the phase of the large-area liquid crystal lens cannot be measured in real time, for example: and detecting the phase change of the liquid crystal lens along with the voltage change.
Disclosure of Invention
An object of the present application includes, for example, providing a liquid crystal lens phase detection apparatus and method to ameliorate at least some of the above problems.
The embodiment of the application can be realized as follows:
in a first aspect, a liquid crystal lens phase detection apparatus is provided, which includes an interferometer, a light blocking plate, and a camera. The interferometer comprises a reference light path and a sample light path which are formed by a collimating lens and a first semi-transparent semi-reflective spectroscope, a second semi-transparent semi-reflective spectroscope which is positioned at the rear end of the reference light path and the rear end of the sample light path, an interference light path which is formed by the light combination of the second semi-transparent semi-reflective spectroscope, and a liquid crystal lens which is arranged in the sample light path. The shading baffle is arranged at a first position outside a light path formed by the interferometer and can be switched to a reference light path or a sample light path from the first position, so that the interferometer has an unshielded state in which the shading baffle is located at the first position, a first shielded state in which the shading baffle moves to the sample light path, and a second shielded state in which the shading baffle moves to the reference light path. The camera is arranged on the interference light path and is used for respectively obtaining interference fringes when the interferometer is in an unshielded state, the light intensity of the reference beam when the interferometer is in a first shielded state and the light intensity of the sample beam when the interferometer is in a second shielded state.
Furthermore, a second position is arranged on the sample light path, a third position is arranged on the reference light path, and the light shielding baffle can be switched among the first position, the second position and the third position in a switching mode.
Further, the interferometer further includes a first mirror and a second mirror. The first reflector is positioned between the first transflective spectroscope and the second transflective spectroscope and forms a sample light path, the liquid crystal lens is positioned between the first reflector and the second transflective spectroscope, the second reflector is positioned between the first transflective spectroscope and the second transflective spectroscope and forms a reference light path, the second position is positioned between the first transflective spectroscope and the first reflector, and the third position is positioned between the second reflector and the second transflective spectroscope.
The light shading baffle is movably arranged on the guide rail assembly and can be switched among the first position, the second position and the third position;
when the shading baffle is located at the first position, the interferometer is in a non-shading state, when the shading baffle is located at the second position, the interferometer is in a first shading state, and when the shading baffle is located at the third position, the interferometer is in a second shading state.
Further, the guide rail assembly comprises a guide rail body and a driving piece, a first position, a second position and a third position are arranged on the guide rail body, the shading baffle is slidably arranged on the guide rail body, and the driving piece is connected with the shading baffle and used for driving the shading baffle to be switched among the first position, the second position and the third position.
Further, the interferometer further comprises a non-shielded region surrounded by the reference light path and the sample light path, and the first position is located in the non-shielded region.
Further, the interferometer comprises a mach-zehnder interferometer.
In a second aspect, a method for detecting a phase of a liquid crystal lens is provided, which uses a liquid crystal lens phase detecting apparatus, including: respectively obtaining the interference fringe sum intensity (I) of interferometer and the light intensity I of reference beam1And the intensity I of the sample beam2(ii) a According to the formula
And calculating to obtain a distribution picture of cos delta.
Further, the interference fringe sum intensity (I) of the interferometer and the light intensity I of the reference beam are respectively obtained1And the intensity I of the sample beam2The method comprises the following steps: switching the shading baffle plate to enable the interferometer to be in an unshielded state, a first sheltered state and a second sheltered state respectively; obtaining corresponding interference fringe resultant intensity (I) by camera>Light intensity I of the reference beam1And the intensity I of the sample beam2。
Further, switching the light shielding baffle to enable the interferometer to be in an unshielded state, a first shielded state and a second shielded state respectively comprises: the light shielding baffle is driven to move among the first position, the second position and the third position of the guide rail assembly, when the light shielding baffle is located at the first position, the light path of the interferometer is in an unshielded state, when the light shielding baffle is located at the second position, the light path of the interferometer is in a first shielding state, and when the light shielding baffle is located at the third position, the light path of the interferometer is in a second shielding state.
According to the liquid crystal lens phase detection device provided by the embodiment of the application, the shading baffle is added on the basis of the Mach-Zehnder interferometer, the shading baffle selectively shades the reference light beam or the sample light beam to obtain the independent light intensity distribution of the sample light beam and the reference light beam through measurement, and finally the cos delta distribution picture is obtained through calculation according to a formula. The method is favorable for improving the accuracy of image processing, and the phase detection method performed by the liquid crystal lens phase detection device can measure the phase difference of the liquid crystal lens and improve the contrast so that the image processing can identify a larger range.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.
FIG. 1 is an optical path diagram of a Mach-Zehnder interferometer;
FIG. 2 shows the light intensity I of a reference beam in a Mach-Zehnder interferometer1The distribution picture of (2);
FIG. 3 shows the light intensity I of a sample light beam in a Mach-Zehnder interferometer2The distribution picture of (2);
FIG. 4 is a graph of cos δ distribution in a Mach-Zehnder interferometer;
FIG. 5 is a distribution picture of the combined intensity < I > of two planar rays on the observation plane in the Mach-Zehnder interferometer;
fig. 6 is a schematic structural diagram of a liquid crystal lens phase detection apparatus according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a guide rail assembly in a liquid crystal lens phase detection apparatus according to an embodiment of the present application;
fig. 8 is a schematic flowchart of a method for detecting a phase of a liquid crystal lens according to an embodiment of the present disclosure;
FIG. 9 is a distribution picture of interference fringe resultant intensity < I > obtained by detection using a liquid crystal lens phase detection method;
FIG. 10 is a distribution picture of cos δ obtained by calculation;
fig. 11 is a schematic flowchart of step S110 in fig. 8.
Icon: 100-liquid crystal lens phase detection device; 110-an interferometer; 1102-a laser; 1104-beam splitter; 1106-spatial filter; 115-non-occluded areas; 120-a light-blocking baffle; 122-a first position; 124-a second position; 126-third position; 130-a camera; 140-a rail assembly; 141-guide rail body.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations.
It should be noted that the features of the embodiments of the present application may be combined with each other without conflict.
Currently, for the measurement of the phase difference of the liquid crystal lens, a polarization microscope system can be used. The minimum measurement diameter of the polarization microscope system reaches 3UM, the wavelength precision is 1.0nm, and the polarization microscope system has the advantage of high measurement precision.
However, since the polarization microscope system adopts a point scanning measurement method, the surface phase change of the liquid crystal lens along with the voltage change cannot be measured in real time.
In order to measure the phase change of the liquid crystal lens along with the voltage change, a Mach-Zehnder interferometer can be adopted to measure the transmission phase of the liquid crystal lens.
Specifically, referring to fig. 1, an optical path diagram of a mach-zehnder interferometer is shown. The point light source L forms plane light through the collimating lens L1, and the plane light passes through the semi-transmitting semi-reflecting spectroscope P1 to form two paths of plane light.
One of the planar light rays can be used as reference light, and enters the camera objective lens L2 after passing through the reflector M2 and the beam splitter P2 in sequence. And the other path of plane light passes through the liquid crystal lens S to obtain the transmitted wavefront of the sample, and then sequentially passes through the reflector M1 and the spectroscope P2 and enters the camera objective lens L2. On the image sensor of the camera, two paths of light rays can generate interference, and then interference fringes are generated. In general, the phase change of the plane wave after passing through the liquid crystal lens sample can be calculated from the interference fringes.
According to the interference principle, the combined intensity of two paths of plane light rays on an observation surface<I>(i.e., interference fringe brightness), and reference beam intensity I1And the intensity of the sample beam I2The relationship of (A) is as follows:
where δ is the phase difference to be measured. Referring to fig. 2 to 4, fig. 2 shows the reference beam intensity I1The distribution picture of (2); FIG. 3 shows the intensity I of the sample beam2The distribution picture of (2); FIG. 4 is a graph showing the cos δ distribution; the resultant strength can be obtained according to the formula (1)<I>As shown in fig. 5.
In the ideal case, I1And I2The phase difference can be obtained by detecting the distribution of the interference fringe brightness.
However, diffraction fringes are generated due to the limitation of the aperture in the actual measurement environment and the inevitable dust. In practical cases, the reference beam intensity I1And the intensity of the sample beam I2Is no longer constant. Therefore, the liquid crystal lens phase difference and the interference fringe brightness are not completely correlated any more, but are also affected by the diffraction fringes.
Meanwhile, since the intensity of the edge of the light beam is lower than that of the center, the contrast of the brightness of the interference fringe at the edge of the light beam is low, and image processing is affected.
In view of the above problems, the present embodiment provides a liquid crystal lens phase detection apparatus 100.
Fig. 6 is a schematic structural diagram of a liquid crystal lens phase detection apparatus 100 according to an embodiment of the present disclosure.
The liquid crystal lens phase detection apparatus 100 may include an interferometer 110, a light blocking shutter 120, and a camera 130.
The interferometer 110 may include a collimating lens L1, a first transflective beam splitter P1, and a second transflective beam splitter P2.
The front end of the collimating lens L1 is provided with a point light source L, and the point light source L forms a plane light beam after passing through the collimating lens L1. The plane light beam passes through the first half-transmitting half-reflecting beam splitter P1 to form two different plane light beams, which respectively form a reference light path and a sample light path. The liquid crystal lens S is arranged in the sample light path, the second half-transmitting half-reflecting beam splitter P2 is positioned at the rear ends of the reference light path and the sample light path, and combines the reference light beam and the sample light beam to generate an interference light beam, and the interference light beam forms an interference light path.
The light blocking shutter 120 is movably disposed relative to the interferometer 110 such that the light blocking shutter 120 can be positioned at a first position 122 outside of the optical path formed by the interferometer 110 and moved to switch from the first position 122 to either the sample optical path or the reference optical path.
When the light blocking plate 120 is in the first position 122, both optical paths of the interferometer 110 are in an unblocked state. When the light blocking shutter 120 moves to the sample optical path, the interferometer 110 is in a first blocking state in which the sample optical path is blocked. When the light shielding shutter 120 moves to the reference optical path, the interferometer 110 is in a second shielding state in which the reference optical path is shielded.
The camera 130 may be an industrial camera disposed on an interference light path of the interferometer 110, and configured to obtain interference fringes when the interferometer is in an unshielded state, a light intensity of the reference beam when the interferometer is in a first shielded state, and a light intensity of the sample beam when the interferometer is in a second shielded state.
Alternatively, a second location 124 may be disposed on the sample optical path of the interferometer 110 and a third location 126 may be disposed on the reference optical path of the interferometer 110. The light blocking shutter 120 is movable between a first position 122, a second position 124, and a third position 126. So that the light intensity distribution of the interferometer in different states is acquired by the camera 130.
Further, the interferometer 110 may also include a first mirror M1 and a second mirror M2.
The first reflecting mirror M1 is disposed in the sample optical path and is used for guiding the plane beam in the sample optical path to the second half mirror P2. The second reflecting mirror M2 is disposed in the reference optical path and is used for guiding the plane beam in the reference optical path to the second half mirror P2, so that the plane beam in the reference optical path and the sample optical path are combined to generate an interference beam.
Specifically, the first reflecting mirror M1 is located between the first half mirror P1 and the second half mirror P2, and forms a sample optical path. The liquid crystal lens S is located between the first reflector M1 and the second half mirror P2. The second reflecting mirror M2 is positioned between the first beam splitter P1 and the second beam splitter P2 and forms a reference optical path.
Alternatively, the second position 124 is located between the first beam splitter P1 and the first mirror M1, and the third position 126 is located between the second mirror M2 and the second beam splitter P2. And the first position 122, the second position 124 and the third position 126 can be arranged on the same straight line, which facilitates the movement and switching of the light-shielding baffle 120.
To facilitate switching of the light blocking flap 120 between the first position 122, the second position 124, and the third position 126. Optionally, interferometer 110 may further include a non-occluded region 115 bounded by the reference optical path and the sample optical path, with first location 122 located within non-occluded region 115. Referring to FIG. 6, the light blocking plate 120 is located at a first position 122, and the camera 130 can obtain the interference fringe intensity of the interferometer 110<I>The light shielding shutter 120 is moved from the first position 122 to the second position 124, and the light intensity I of the reference beam can be obtained by the camera 1301The light intensity I of the sample beam is obtained by the camera 130 when the light blocking plate 120 is moved from the first position 122 to the third position 1262。
With continued reference to fig. 6, the interferometer 110 may also include a light source L and a spatial filter 1106. The light source L may be formed by a plurality of lasers 1102 passing through a beam splitter 1104, and a light beam emitted from the light source L passes through a spatial filter 1106 and then is emitted into a collimating lens L1, and passes through a collimating lens L1 to form a planar light.
Alternatively, the interferometer in the embodiment of the present application may employ a mach-zehnder interferometer. By adding a light-shielding baffle 120 to the mach-zehnder interferometer. The reference light beam or the sample light beam is selectively shielded by the light shielding baffle 120, and then the individual light intensity distribution of the sample light beam and the reference light beam is measured by the industrial camera, so that a distribution picture with high contrast can be obtained through calculation, and the accuracy of image processing is improved.
Further, the liquid crystal lens phase detection apparatus 100 provided by the embodiment of the present application may further include a guide rail assembly 140. The guide rail assembly 140 can realize the automatic switching of the light-shielding baffle 120 among the first position 122, the second position 124 and the third position 126, thereby not only improving the testing speed, but also avoiding the inaccurate test caused by the fact that a tester touches other optical devices when manually moving the light-shielding baffle.
Referring to fig. 7, a schematic structural diagram of the guide rail assembly 140 is shown.
Optionally, the rail assembly 140 may be provided with a first position 122, a second position 124 and a third position 126, wherein the second position 124 and the third position 126 are respectively located at two sides of the first position 122. The light blocking plate 120 is movably disposed on the rail assembly 140 and can be switched between a first position 122, a second position 124 and a third position 126.
As shown in FIG. 6, when the shutter plate 120 is moved to the first position 122 of the rail assembly 140, the interferometer is in an unshielded state. When the light blocking flap 120 is moved to the second position 124 of the rail assembly 140, the interferometer is in a first blocking state. When the light blocking flap 120 is moved to the third position 126 of the rail assembly 140, the interferometer is in a second blocking state.
Specifically, the rail assembly 140 may include a rail body 141 and a driving member. The rail body 141 is provided with a first position 122, a second position 124, and a third position 126, and the light blocking shutter 120 is engaged with the rail body 141 and can slide along the rail body 141.
The driving member is connected to the light shielding shutter 120, and the driving member is used for driving the light shielding shutter 120 to move and switch among a first position 122, a second position 124 and a third position 126. The driving part controls the movement of the shading baffle 120 among three positions, so that the whole testing process can be automated, and the testing accuracy is improved.
The liquid crystal lens phase detection device that this application embodiment provided, simple structure switches between three position through guide rail assembly drive shading baffle, obtains sample light beam, the solitary light intensity distribution of reference beam through industry camera, is favorable to calculating the cos delta distribution picture that obtains the contrast height according to the formula, not only can improve image processing's accuracy, can also realize the automation of test.
The embodiment of the application also provides a liquid crystal lens phase detection method, which adopts the liquid crystal lens phase detection device for detection.
Referring to fig. 8, a flow chart of a liquid crystal lens phase detection method is shown.
Step S110, respectively obtaining the interference fringe combination intensity of the interferometer in the non-shielding state<I>Intensity I of the reference beam in the first blocked state1And the intensity I of the sample beam in the second shielded state2。
The light-shielding baffle 120 is adjusted to be located at the first position 122, so that the sample light beam and the reference light beam formed after the point light source passes through the interferometer are both in an unshielded state, and the total intensity of the interference fringes < I > is obtained through measurement of an industrial camera, as shown in fig. 9, which is a distribution picture of the total intensity of the interference fringes < I >.
Similarly, the light shielding baffle 120 is adjusted to be located at the second position 124 and the third position 126, respectively, so that the light shielding baffle 120 shields the sample light beam or the reference light beam formed after the point light source passes through the interferometer, and the individual light intensity distributions of the sample light beam and the reference light beam are measured and obtained by the industrial camera.
And step S120, calculating and obtaining a cos delta distribution picture according to a formula.
According to the interference principle, the combined intensity of two beams on the observation surface<I>With reference beam intensity I1And the intensity of the sample beam I2The relation of (A) is as follows:
from this relation (1), the relation can be obtained by back-stepping:
obtained according to step S110<I>、I1And I2Substituting the above equation (2) to calculate a cos δ distribution picture, as shown in fig. 10, which is a cos δ distribution picture.
It should be noted that the interference fringe sum intensity is obtained in the above step S110<I), light intensity I of reference beam1And a sample lightLight intensity I of the beam2There is no sequential obtaining order between them, as long as it is satisfied that the obtaining is obtained before step S120<I>、I1And I2And then calculating to obtain cos delta according to a formula.
As shown in fig. 11, alternatively, in the step S110, the interference fringe sum intensities of the interferometers are respectively obtained<I>Light intensity I of the reference beam1And the intensity I of the sample beam2The method comprises the following steps:
step S112, the light-shielding shutter is switched to make the interferometer in an unshielded state, a first shielded state and a second shielded state, respectively.
And the guide rail assembly in the liquid crystal lens phase detection device is adopted to drive the shading baffle to move, so that the shading baffle is positioned at the first position and does not shield the reference beam and the sample beam in an unshielded state.
The shading baffle is positioned on the sample light path and is in a first shading state for shading the sample light beam; and the shading baffle is positioned on the reference light path and is in a second shading state for shading the reference light beam.
Step S114, a camera is used for obtaining corresponding interference fringe resultant intensity<I>Light intensity I of the reference beam1And the intensity I of the sample beam2。
Respectively measuring the interference fringe resultant intensity of the interferometer in an unshielded state by adopting an industrial camera positioned on an interference light path of the interferometer<I>The light intensity I of the reference beam when the interferometer is in the first shielding state1And the light intensity I of the sample beam with the interferometer in the second shielding state2。
Further, in the above step S112, switching the light shielding shutter so that the interferometers are in three different states, respectively, may include:
and driving the shading baffle to move among the first position, the second position and the third position of the guide rail assembly, and enabling the light path of the interferometer to be in an unshielded state when the shading baffle is located at the first position. When the shading baffle is located at the second position, the light path of the interferometer is in a first shading state. When the light shielding baffle is located at the third position, the light path of the interferometer is in a second shielding state.
According to the phase detection method of the liquid crystal lens provided by the embodiment of the application, firstly, on the basis of a Mach-Zehnder interferometer, a light shielding baffle is used for shielding a reference light beam or a sample light beam according to an interference principle. Then, the light intensity distributions of the reference beam and the sample beam are obtained by the industrial camera. And finally, improving the contrast of the fringe image through calculation.
According to the characteristic that two independent light beams interfere, the accuracy of measuring the phase of the liquid crystal lens is improved by collecting the light intensity before interference and the interference light intensity.
According to the liquid crystal lens phase detection device provided by the embodiment of the application, on the basis of the Mach-Zehnder interferometer, the shading baffle is added to selectively shade the reference light beam or the sample light beam so as to obtain the independent light intensity distribution of the sample light beam and the reference light beam through measurement, and finally the cos delta distribution picture is obtained through calculation according to a formula, so that the accuracy of image processing is improved. The phase detection method using the liquid crystal lens phase detection device can measure the phase difference of the liquid crystal lens, improve the contrast, and enable the image processing to identify a larger range.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not necessarily depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (10)
1. A liquid crystal lens phase detection device, comprising:
the interferometer comprises a reference light path and a sample light path which are formed by a collimating lens and a first semi-transparent semi-reflective spectroscope, a second semi-transparent semi-reflective spectroscope which is positioned at the rear ends of the reference light path and the sample light path, an interference light path which is formed by combining light of the second semi-transparent semi-reflective spectroscope, and a liquid crystal lens which is arranged in the sample light path;
a light blocking shutter disposed at a first position outside of an optical path formed by the interferometer and capable of switching from the first position to the reference optical path or the sample optical path so that the interferometer has an unblocked state in which the light blocking shutter is at the first position, a first blocked state in which the light blocking shutter moves to the sample optical path, and a second blocked state in which the light blocking shutter moves to the reference optical path; and
and the camera is arranged on the interference light path and is used for respectively acquiring interference fringes when the interferometer is in an unblocked state, the light intensity of the reference beam when the interferometer is in a first blocked state and the light intensity of the sample beam when the interferometer is in a second blocked state.
2. The LC lens phase detecting device of claim 1, wherein a second position is disposed on the sample optical path, a third position is disposed on the reference optical path, and the light blocking plate is switchable between the first position, the second position and the third position.
3. The lc lens phase detection apparatus of claim 2, wherein the interferometer further comprises a first mirror and a second mirror;
the first reflector is located between the first transflective spectroscope and the second transflective spectroscope, and forms the sample light path, the liquid crystal lens is located between the first reflector and the second transflective spectroscope, the second reflector is located between the first transflective spectroscope and the second transflective spectroscope, and forms the reference light path, the second position is located between the first transflective spectroscope and the first reflector, and the third position is located between the second reflector and the second transflective spectroscope.
4. The device for detecting the phase of a liquid crystal lens according to claim 1, further comprising a rail assembly, wherein the rail assembly comprises the first position, a second position and a third position, the second position and the third position are respectively located at two sides of the first position, and the light blocking plate is movably disposed on the rail assembly and can be switched among the first position, the second position and the third position;
when the light shielding baffle is located at the first position, the interferometer is in a non-shielding state, when the light shielding baffle is located at the second position, the interferometer is in a first shielding state, and when the light shielding baffle is located at the third position, the interferometer is in a second shielding state.
5. The device for detecting the phase of a liquid crystal lens according to claim 4, wherein the rail assembly comprises a rail body and a driving member, the rail body is provided with the first position, the second position and the third position, the light-shielding shutter is slidably disposed on the rail body, and the driving member is connected to the light-shielding shutter and is used for driving the light-shielding shutter to switch between the first position, the second position and the third position.
6. The lc lens phase detection apparatus of claim 1, wherein the interferometer further comprises a non-occluded region enclosed by the reference optical path and the sample optical path, the first location being located within the non-occluded region.
7. The liquid crystal lens phase detection device of any of claims 1-6, wherein the interferometer comprises a Mach-Zehnder interferometer.
8. A liquid crystal lens phase detection method using the liquid crystal lens phase detection device according to any one of claims 1 to 7, comprising:
separately obtaining interference of interferometersStripe and stripe combined strength<I>Light intensity I of the reference beam1And the intensity I of the sample beam2；
According to the formula
And calculating to obtain a distribution picture of cos delta.
9. The method for detecting the phase of a liquid crystal lens according to claim 8, wherein the obtaining of the combined intensities of the interference fringes of the interferometer is performed separately<I>Light intensity I of the reference beam1And the intensity I of the sample beam2The method comprises the following steps:
switching the shading baffle plate to enable the interferometer to be in an unshielded state, a first sheltered state and a second sheltered state respectively;
obtaining corresponding interference fringe resultant intensity by camera<I>Light intensity I of the reference beam1And the intensity I of the sample beam2。
10. The method of claim 9, wherein switching the light blocking shutter to place the interferometer in the unblocked state, the first blocked state, and the second blocked state respectively comprises:
the light shielding baffle is driven to move among a first position, a second position and a third position of the guide rail assembly, when the light shielding baffle is located at the first position, the light path of the interferometer is in an unblocked state, when the light shielding baffle is located at the second position, the light path of the interferometer is in a first blocked state, and when the light shielding baffle is located at the third position, the light path of the interferometer is in a second blocked state.
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| CN202110460382.6A CN113237635A (en) | 2021-04-27 | 2021-04-27 | Liquid crystal lens phase detection device and method |
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