CN113219363A - Power supply noise test method and device and storage medium - Google Patents
Power supply noise test method and device and storage medium Download PDFInfo
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Abstract
The application discloses a power supply noise test method, a power supply noise test device and a storage medium. The method comprises the following steps: firstly, adjusting vertical scales and offset values according to waveform data of a power supply signal, so that the waveform data are displayed in an easily observed range in an oscilloscope window; then, continuously acquiring waveform data of the power supply signal, and dynamically and finely adjusting the vertical scale according to the waveform data of the power supply signal acquired in real time in the test process, so that the acquired waveform data of the power supply signal, including sudden noise data, is always displayed in an oscilloscope window; then, test data is exported to complete the test. Therefore, the vertical scale and the offset of signal display are dynamically and automatically adjusted according to the waveform data of the power supply signal acquired in real time in the testing process, so that the recorded waveform data of the power supply signal is more complete, various noise anomalies can be captured in time, and the testing result is more accurate.
Description
Technical Field
The present application relates to computer information processing technologies, and in particular, to a method and an apparatus for testing power supply noise, and a storage medium.
Background
The power supply signal noise test of the computer mainboard requires a tester to adjust the offset (offset) of signal display by observing the amplitude of the power supply signal captured by the oscilloscope, then adjusts the vertical scale (vertical scale) and the offset of the signal display by observing the noise of the signal for multiple times, so that the signal is displayed in the middle of the whole oscilloscope window and occupies about 1/2 of the whole oscilloscope window, and then the test is started after the signal waveform adjustment is finished, and test data and pictures are manually filled and inserted into a report. If abnormal noise exists in the test process, for example, a large burr appears, the size of the noise needs to be observed to judge whether the vertical scale needs to be adjusted in time and the offset needs to be tested again, so that the abnormal noise can be displayed correctly.
However, this process is very labor and time consuming, resulting in a long overall test period. Therefore, how to automatically adjust the vertical scale and the offset of the signal display is a technical problem to be solved urgently in the power noise test.
Disclosure of Invention
The inventor of the present application creatively provides a power supply noise test method, device and storage medium.
According to a first aspect of embodiments of the present application, there is provided a power supply noise testing method, including: acquiring waveform data of a power supply signal to obtain first waveform data; adjusting the vertical scale and the offset value according to the first waveform data so that the first waveform data is displayed in a first display range of the oscilloscope window; continuously acquiring waveform data of the power supply signal, calculating a waveform accumulation value and recording test data until the waveform data of the power supply signal meets a test exit condition, wherein in the process of continuously acquiring the power supply sound wave, the vertical scale and the offset value are adjusted so that the acquired waveform data of the power supply signal is displayed in an oscilloscope window; and exporting the test data.
According to an embodiment of the application, before obtaining the first waveform data by obtaining the waveform data of the power signal, the method further includes: resetting a display window of the oscilloscope; and setting environment variables, test parameters, test exit conditions, initial vertical scales and initial bias values of the oscilloscope.
According to an embodiment of the application, adjusting the vertical scale and the offset value according to the first waveform data to display the first waveform data in a first display range of an oscilloscope window comprises: acquiring a maximum peak value from the first waveform data to obtain a first maximum peak value; adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale so that the power supply sound wave is displayed in a window of the oscilloscope; and reducing the first vertical scale to a second vertical scale according to the first offset value to obtain a finer second offset value, so that the power supply sound wave is displayed in a first display range of the oscilloscope window.
According to an embodiment of the present application, adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale, so that the power supply sound wave is displayed in the window of the oscilloscope, includes: determining whether the first maximum peak value exceeds a display window of the oscilloscope, if so, adjusting the vertical scale to the first vertical scale according to the first maximum peak value so as to display the first maximum peak value in the display window of the oscilloscope; acquiring a minimum peak value from the first waveform data to obtain a first minimum peak value; a first offset value is determined based on the first maximum peak value and the first minimum peak value.
According to an embodiment of the present application, reducing the first vertical scale to the second vertical scale according to the first offset value to obtain a finer second offset value, so that the power supply sound wave is displayed in a first display range of the oscilloscope window, includes: reducing the first vertical scale to a second vertical scale according to the first offset value; obtaining the waveform data of the power supply signal again to obtain second waveform data; obtaining a maximum peak value from the second waveform data to obtain a second finer maximum peak value; and determining a second offset value and a third vertical scale according to the second maximum peak value so that the second maximum peak value is displayed in the first display range of the oscilloscope window.
According to an embodiment of the application, the first display range is a range within a middle half of the oscilloscope window.
According to an embodiment of the present application, the test exit condition includes: the waveform accumulation value is greater than a number threshold, or a maximum peak value in the acquired waveform data of the power supply signal exceeds the second offset value plus three times of a third vertical scale, or a minimum peak value in the acquired waveform data of the power supply signal exceeds the second offset value minus three times of the third vertical scale.
According to an embodiment of the present application, adjusting the vertical scale and the offset value to display the acquired waveform data of the power signal in an oscilloscope window includes: and carrying out incremental adjustment on the vertical scale by using the fourth vertical scale unit value, resetting the waveform accumulation value, and recording test data until the acquired waveform data of the power supply signal is displayed in an oscilloscope window.
According to a second aspect of embodiments of the present application, there is provided a power supply noise test apparatus, the apparatus including: the first waveform data acquisition module is used for acquiring waveform data of the power supply signal to obtain first waveform data; the first display adjustment module is used for adjusting the vertical scale and the offset value according to the first waveform data so as to display the first waveform data in a first display range of the oscilloscope window; the test module is used for continuously acquiring the waveform data of the power signal and recording the test data until the waveform data of the power signal meets the test exit condition; the second display adjustment module is used for adjusting the vertical scale and the offset value in the process of continuously acquiring the power supply sound wave so as to display the acquired waveform data of the power supply signal in an oscilloscope window; and the test data export module is used for exporting the test data.
According to a third aspect of embodiments herein, there is provided a computer-readable storage medium comprising a set of computer-executable instructions which, when executed, are operable to perform any of the above-described power supply noise testing methods.
The embodiment of the application provides a power supply noise test method and device, namely a storage medium. The method comprises the following steps: firstly, adjusting vertical scales and offset values according to waveform data of a power supply signal, so that the waveform data are displayed in an easily observed range in an oscilloscope window; then, continuously acquiring waveform data of the power supply signal, and dynamically and finely adjusting the vertical scale according to the waveform data of the power supply signal acquired in real time in the test process, so that the acquired waveform data of the power supply signal, including sudden noise data, is always displayed in an oscilloscope window; then, test data is exported to complete the test. Therefore, the vertical scale and the offset of signal display are dynamically and automatically adjusted according to the waveform data of the power supply signal acquired in real time in the testing process, so that the recorded waveform data of the power supply signal is more complete, various noise anomalies can be captured in time, and the testing result is more accurate.
In addition, because manual monitoring and manual adjustment are not needed in the testing process, the labor cost is greatly saved.
It is to be understood that the implementation of the present application does not require all of the above-described advantages to be achieved, but rather that certain technical solutions may achieve certain technical effects, and that other embodiments of the present application may also achieve other advantages not mentioned above.
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The above and other objects, features and advantages of exemplary embodiments of the present application will become readily apparent from the following detailed description read in conjunction with the accompanying drawings. Several embodiments of the present application are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which:
in the drawings, the same or corresponding reference numerals indicate the same or corresponding parts.
FIG. 1 is a schematic diagram illustrating an implementation flow of a power noise testing method according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a specific implementation flow of an application of a power noise testing method according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a power supply noise test apparatus according to an embodiment of the present application.
Detailed Description
In order to make the objects, features and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the power supply noise test method, the sound wave oscilloscope is used to obtain the waveform data of the power supply signal, for example, the probe of the oscilloscope is connected to two ends of the output pin of the power supply module, and the power supply signal is converted into the waveform data by the oscilloscope and displayed in the window of the oscilloscope.
Oscilloscopes can display signals with peak voltages of several millivolts to tens of volts, so that the signals with different amplitudes need to be converted to adapt to the display range of a screen, the waveform can be measured according to the scale marks, and the large signals need to be attenuated and the small signals need to be amplified. The vertical scale, also known as vertical sensitivity, is used to indicate the degree of amplification of a weak signal by a vertical amplifier, usually expressed in millivolts per scale.
Furthermore, if the actual voltage of the signal is located above or below the oscilloscope, or even outside the displayable range of the oscilloscope, adjustments need to be made by the oscilloscope's biasing function to cause the waveform to be displayed at the proper location within the oscilloscope window. The bias function operates on the principle of superimposing a voltage or current value on the input signal to cause the waveform of the signal to translate up and down within the oscilloscope window, so that the waveform can be displayed at a suitable position within the oscilloscope window. The offset value is a specific value of the superimposed voltage or current, so that up/down translation with different amplitudes can be realized.
Fig. 1 shows an implementation flow of a power supply noise testing method according to an embodiment of the present application. Referring to fig. 1, the method includes: an operation 110 of obtaining waveform data of a power signal to obtain first waveform data; an operation 120 of adjusting the vertical scale and the offset value according to the first waveform data so that the first waveform data is displayed within a first display range of the oscilloscope window; operation 130, continuously acquiring waveform data of the power supply signal, calculating a waveform accumulation value, and recording test data until the waveform data of the power supply signal meets a test exit condition, wherein in the process of continuously acquiring the power supply sound wave, the vertical scale and the offset value are adjusted so that the acquired waveform data of the power supply signal is displayed in an oscilloscope window; at operation 140, test data is derived.
In operation 110, the first waveform data mainly refers to waveform data of the power signal acquired during an initial period of time at the start of the test. The waveform data of the power supply signal is mainly acquired according to the power supply signal acquired by the oscilloscope.
In operation 120, adjusting the vertical scale mainly means that the vertical scale is appropriately enlarged or reduced according to the acquired waveform data, so that the waveform is enlarged or reduced and displayed in the oscilloscope window in an appropriate scale.
Adjusting the offset value mainly refers to properly translating the waveform data up/down according to the scaled waveform data, so that the waveform data is displayed in the central position of the oscilloscope window.
For example, it is assumed that the current scale is 5 mv/scale, a total of 20 scales are provided, and the maximum peak value of the first waveform data is 200mv and the minimum peak value is 0 mv. Since the maximum peak value-minimum peak value is 140mv, the current window can display the waveform data with the peak value difference of 100mv (5mv 20).
At this time, the vertical scale may be adjusted to 20mv, so that waveform data having a peak difference of 400mv (20mv 20) may be displayed, thereby displaying the first waveform data within a displayable range of the oscilloscope window.
After the vertical scale is adjusted, the first waveform data is displayed between 0mv and 200mv, i.e., the position below the oscilloscope window. At this time, the offset may be set to 100mv, so that the waveform data is displayed between 100mv and 300mv, centered in the oscilloscope window for observation.
Therefore, abnormal noise can be captured in time, more complete waveform data can be recorded as far as possible, and manual monitoring and manual adjustment of the oscilloscope for multiple times are not needed to adjust the display of signals.
Therefore, the power supply noise test method can automatically analyze the waveform data of the received power supply signal to preliminarily set the vertical scale and the offset value; and then, the waveform data of the received power supply signal can be continuously and dynamically detected, and the offset value and/or the vertical scale can be timely adjusted according to abnormal noise to capture complete sound wave data, so that the test data is more complete, and further analysis and timely processing can be conveniently carried out.
It should be noted that the embodiment shown in fig. 1 is only one of the most basic embodiments of the automatic exposure method of the present application, and further refinements and extensions can be made by the implementer on the basis of the embodiment.
According to an embodiment of the application, before obtaining the first waveform data by obtaining the waveform data of the power signal, the method further includes: resetting a display window of the oscilloscope; and setting environment variables, test parameters, test exit conditions, initial vertical scales and initial bias values of the oscilloscope.
Before each test is started, the display window of the oscilloscope is reset, for example, the oscilloscope is restarted or recalibrated, so that the test environment is clean and effective and is prevented from being influenced by the last test operation.
In addition, before each test is run, the environmental variables of the oscilloscope, such as time base, bandwidth and the like, as well as test parameters, test exit conditions, initial vertical scales, initial offset values and the like can be set according to different requirements of the test. As such, the test cases may be made to satisfy a variety of different test requirements by way of these environmental variables, test parameters, and other configurable items. Therefore, the reusability and the expandability of the test cases can be greatly improved.
According to an embodiment of the application, adjusting the vertical scale and the offset value according to the first waveform data to display the first waveform data in a first display range of an oscilloscope window comprises: acquiring a maximum peak value from the first waveform data to obtain a first maximum peak value; adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale so that the power supply sound wave is displayed in a window of the oscilloscope; and reducing the first vertical scale to a second vertical scale according to the first offset value to obtain a finer second offset value, so that the power supply sound wave is displayed in a first display range of the oscilloscope window.
The accuracy of the test data is often directly related to the vertical scale and offset values. Theoretically, when waveform data is ensured to be within a certain region, the smaller the vertical scale is set, the more accurately the offset value is set, and the more accurately the test data is obtained.
In this embodiment, after the vertical scale and the offset value are initially adjusted according to the first waveform data, the vertical scale is further reduced to obtain a second vertical scale, and a finer second offset value is determined again according to the reduced vertical scale, so that the acquired test data can be more accurate.
During manual operation, the fine adjustment is difficult, and the fine adjustment degree is different due to different judgment of each person, so that different testers execute the same program and can obtain different results, and even the original testers can not reproduce the previous results.
However, after the step of automating the present embodiment, the magnitude of the fine adjustment can be accurately determined according to the result calculated by a certain function or model. Therefore, the accuracy of the test result can be further improved, the stability of the test result can be improved, and the reproducibility of the test case can be improved.
According to an embodiment of the present application, adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale, so that the power supply sound wave is displayed in the window of the oscilloscope, includes: determining whether the first maximum peak value exceeds a display window of the oscilloscope, if so, adjusting the vertical scale to the first vertical scale according to the first maximum peak value so as to display the first maximum peak value in the display window of the oscilloscope; acquiring a minimum peak value from the first waveform data to obtain a first minimum peak value; a first offset value is determined based on the first maximum peak value and the first minimum peak value.
Generally, the initial vertical scale and the initial offset are set according to a conventional value or an average value, and the power signal collected in the initial stage of the test is actually unknown and can be large or small. Therefore, it is highly likely that the first maximum peak of the first waveform data will exceed the display window of the oscilloscope. At this point, the vertical scale needs to be adjusted, for example, the vertical scale is increased, so that the first maximum peak is displayed in the display window of the oscilloscope.
According to an embodiment of the present application, reducing the first vertical scale to the second vertical scale according to the first offset value to obtain a finer second offset value, so that the power supply sound wave is displayed in a first display range of the oscilloscope window, includes: reducing the first vertical scale to a second vertical scale according to the first offset value; obtaining the waveform data of the power supply signal again to obtain second waveform data; obtaining a maximum peak value from the second waveform data to obtain a second finer maximum peak value; and determining a second offset value and a third vertical scale according to the second maximum peak value so that the second maximum peak value is displayed in the first display range of the oscilloscope window.
After the vertical scale and the offset value are reset, the precision of the waveform data can be correspondingly changed, at the moment, the second waveform data can be obtained by obtaining the waveform data of the power supply signal again to obtain the data after precision adjustment, on one hand, the test data with higher precision can be obtained through the data after precision adjustment, on the other hand, the adjustment effect can be verified, and whether further adjustment is needed to achieve higher precision is determined according to the adjustment effect.
According to an embodiment of the application, the first display range is a range within a middle half of the oscilloscope window.
The size of the first display range directly influences the precision and the observation effect of the test result, and influences the capture rate of abnormal noise, the interruption rate of the test and the smoothness of the test.
For example, a too small first display range may result in insufficient test accuracy and no capture of some suspicious noise; if the first display range is too large, the waveform data may frequently exceed the scope of the oscilloscope, the vertical scale and the offset value need to be frequently adjusted, and the test data needs to be collected again, so that the number of times of repeated tests is increased, and the whole test period is further prolonged.
Therefore, the setting of the first display range is critical. According to the embodiment of the application, the implementation effect is evaluated under the condition that the first display range is set to be different, and the applicant finds that when the first display range is half of the middle of the oscilloscope window, the test precision is proper, the accumulation of the captured noise is large, the test period is moderate, and the implementation effect is good.
According to an embodiment of the present application, the test exit condition includes: the waveform accumulation value is greater than a number threshold, or a maximum peak value in the acquired waveform data of the power supply signal exceeds the second offset value plus three times of a third vertical scale, or a minimum peak value in the acquired waveform data of the power supply signal exceeds the second offset value minus three times of the third vertical scale.
The waveform accumulation value is larger than the frequency threshold value to indicate that the test is finished; and the maximum peak value in the acquired waveform data of the power supply signal exceeds the second offset value plus three times of the third vertical scale, or the minimum peak value in the acquired waveform data of the power supply signal exceeds the second offset value minus three times of the third vertical scale, so that abnormal noise is captured, and problems are found. At this point, the test may be terminated and the problem found may be investigated in time, without the need for further testing.
According to an embodiment of the present application, adjusting the vertical scale and the offset value to display the acquired waveform data of the power signal in an oscilloscope window includes: and carrying out incremental adjustment on the vertical scale by using the fourth vertical scale unit value, resetting the waveform accumulation value, and recording test data until the acquired waveform data of the power supply signal is displayed in an oscilloscope window.
If the vertical scale and the offset value are finely adjusted according to the power signal at the initial stage of the test before the formal collection of the test data or the recording of the test result is performed, the probability that the vertical scale and the offset value need to be adjusted greatly is relatively small.
Thus, when dynamic adjustment is required after formal collection of test data or recording of test results, the vertical scale can be incrementally adjusted by an empirical scale unit value, e.g., 5mv, without requiring further fine calculations based on maximum or minimum peaks. Therefore, the calculation resources can be saved, the calculation time is shortened, the whole test period is shortened, and the test efficiency is further improved.
Fig. 2 shows a specific application of the power noise testing method according to the embodiment of the present application, which combines the above various embodiments to finally form another embodiment with better implementation effect.
As shown in fig. 2, the process of performing the power supply noise test by the application mainly includes:
The environment variables and test parameters include time base, bandwidth, waveform statistics (e.g., 2K), and waveform accumulation threshold, among others. The initial vertical scale is set to be 1V, and the initial offset value is set to be 3V;
wherein the offset value can be calculated using the following formula
offset1＝(max+min)/2；
Wherein offset1 is an offset value; max is the maximum peak value of the waveform data of the power supply signal; min is the minimum peak value of the waveform data of the power supply signal.
here, it is assumed that the adjustment is in units of 5 v.
2080, performing a first-level judgment to determine whether the peak value is less than or equal to 40mv, if yes, continuing 2090 to set the vertical scale to 10mv and recalculate the offset value, and if not, continuing 2100;
2140, dynamically analyzing whether the waveform data of the power signal collected in real time has abnormal noise;
The cumulative value of the waveform reaches a threshold value, or
Maximum peak > offset +3 x vertical scale), or
Minimum peak < offset-3 x vertical scale), if yes, continue step 2160, if no, continue step 2170;
step 2160, finish the test, derive the test data/picture to the report;
2170, fine-tuning the vertical scale by step length of 10mv increment each time to enable the waveform to be completely displayed in the scope of the oscilloscope, and recording the test result;
wherein, recording the test result comprises setting waveform statistics times, resetting waveform accumulation values and the like.
Compared with the traditional method for manually adjusting the vertical scale and the offset value, the embodiment adopts the steps to realize the power supply noise test method of the application, and then:
1) the power supply signal testing efficiency is improved;
for a computer motherboard test, the noise test generally requires 10 hours, and the test time can be saved by about 2 hours by using an automatic program test, and the data accuracy is close to 100%;
2) test data and pictures are automatically generated and imported by a program, and the test result keeps high consistency;
3) the testing steps are simplified, and the testing process is smoother.
It should be noted that the application shown in fig. 2 is only an exemplary illustration of the automatic exposure method of the present application and is not a limitation on the embodiment and application scenario of the automatic exposure method of the present application. The implementer can adopt any applicable implementation mode and be applied to any applicable application scene according to specific implementation conditions.
Further, the embodiment of the application also provides a power supply noise testing device. As shown in fig. 3, the apparatus 30 includes: a first waveform data obtaining module 301, configured to obtain waveform data of a power signal to obtain first waveform data; the first display adjustment module 302 is configured to adjust the vertical scale and the offset value according to the first waveform data, so that the first waveform data is displayed in a first display range of the oscilloscope window; the test module 303 is configured to continuously obtain waveform data of the power signal and record test data until the waveform data of the power signal meets a test exit condition; the second display adjustment module 304 is configured to adjust the vertical scale and the offset value in the process of continuously acquiring the power supply sound wave, so that the acquired waveform data of the power supply signal is displayed in the oscilloscope window; a test data derivation module 305 for deriving test data.
According to an embodiment of the present application, the apparatus 30 further includes: the oscilloscope display window termination module is used for resetting the display window of the oscilloscope; and the test initialization module is used for setting the environment variable, the test parameter, the test exit condition, the initial vertical scale and the initial offset value of the oscilloscope.
According to an embodiment of the present application, the first display adjustment module 302 includes: the first maximum peak value obtaining submodule is used for obtaining a maximum peak value from the first waveform data to obtain a first maximum peak value; the vertical scale and offset value adjusting submodule is used for adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale so as to display the power supply sound wave in an oscilloscope window; and the second offset value determining submodule is used for reducing the first vertical scale to the second vertical scale according to the first offset value so as to obtain a finer second offset value, and the power supply sound wave is displayed in the first display range of the oscilloscope window.
According to an embodiment of the present application, the vertical scale and offset adjustment submodule includes: the peak value judging unit is used for determining whether the first maximum peak value exceeds a display window of the oscilloscope, if so, adjusting the vertical scale to the first vertical scale according to the first maximum peak value so as to display the first maximum peak value in the display window of the oscilloscope; a first minimum peak value obtaining unit, configured to obtain a first minimum peak value by obtaining a minimum peak value from the first waveform data; a first offset value determination unit for determining a first offset value based on the first maximum peak value and the first minimum peak value.
According to an embodiment of the application, the second offset value determining submodule includes: the second vertical scale adjusting unit is used for reducing the first vertical scale to a second vertical scale according to the first offset value; the second waveform data acquisition unit is used for acquiring the waveform data of the power supply signal again to obtain second waveform data; a second maximum peak value obtaining unit configured to obtain a finer second maximum peak value from the maximum peak value obtained from the second waveform data; and the second offset value and third vertical scale determining unit is used for determining the second offset value and the third vertical scale according to the second maximum peak value so as to display the second maximum peak value in the first display range of the oscilloscope window.
According to an embodiment of the present application, the second display adjustment module 304 is specifically configured to perform incremental adjustment on the vertical scale by using a fourth vertical scale unit value, reset a waveform accumulation value, and record test data until the acquired waveform data of the power signal is displayed in the oscilloscope window.
According to a third aspect of embodiments of the present application, there is provided a computer-readable storage medium, the storage medium comprising a set of computer-executable instructions, which when executed, are configured to perform any one of the above-mentioned information processing methods applied to a recommendation system.
Here, it should be noted that: the above description of the embodiment of the power noise testing apparatus and the above description of the embodiment of the computer readable storage medium are similar to the description of the foregoing method embodiments, and have similar beneficial effects to the foregoing method embodiments, and therefore are not repeated herein. For the technical details that have not been disclosed in the present application for describing the embodiments of the power supply noise test apparatus and the embodiments of the computer-readable storage medium, please refer to the description of the foregoing method embodiments of the present application for understanding, and therefore, for brevity, will not be described again.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described device embodiments are merely illustrative, for example, the division of a unit is only one logical function division, and there may be other division ways in actual implementation, such as: multiple units or components may be combined, or may be integrated into another device, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or communication connection between the components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between the devices or units may be electrical, mechanical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units; can be located in one place or distributed on a plurality of network units; some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be separately regarded as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
Those of ordinary skill in the art will understand that: all or part of the steps for realizing the method embodiments can be completed by hardware related to program instructions, the program can be stored in a computer readable storage medium, and the program executes the steps comprising the method embodiments when executed; and the aforementioned storage medium includes: various media capable of storing program codes, such as a removable storage medium, a Read Only Memory (ROM), a magnetic disk, and an optical disk.
Alternatively, the integrated units described above in the present application may be stored in a computer-readable storage medium if they are implemented in the form of software functional modules and sold or used as independent products. Based on such understanding, the technical solutions of the embodiments of the present application may be essentially implemented or portions thereof that contribute to the prior art may be embodied in the form of a software product stored in a storage medium, and including several instructions for enabling a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the methods of the embodiments of the present application. And the aforementioned storage medium includes: a removable storage medium, a ROM, a magnetic disk, an optical disk, or the like, which can store the program code.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A power supply noise testing method, the method comprising:
acquiring waveform data of a power supply signal to obtain first waveform data;
adjusting the vertical scale and the offset value according to the first waveform data so that the first waveform data are displayed in a first display range of an oscilloscope window;
continuously acquiring waveform data of a power supply signal, calculating a waveform accumulation value and recording test data until the waveform data of the power supply signal meets a test exit condition, wherein in the process of continuously acquiring the power supply sound wave, vertical scales and offset values are adjusted so that the acquired waveform data of the power supply signal is displayed in a window of the oscilloscope;
and deriving the test data.
2. The method of claim 1, wherein before the obtaining the waveform data of the power supply signal yields first waveform data, the method further comprises:
resetting a display window of the oscilloscope;
and setting environment variables, test parameters, test exit conditions, initial vertical scales and initial bias values of the oscilloscope.
3. The method of claim 1, wherein adjusting the vertical scale and the offset value according to the first waveform data to cause the first waveform data to be displayed within a first display range of an oscilloscope window comprises:
acquiring a maximum peak value from the first waveform data to obtain a first maximum peak value;
adjusting the vertical scale and the offset value according to the first maximum peak value to obtain a first offset value and a first vertical scale so that the power supply sound wave is displayed in an oscilloscope window;
and reducing the first vertical scale to a second vertical scale according to the first offset value to obtain a finer second offset value, so that the power supply sound wave is displayed in a first display range of an oscilloscope window.
4. The method of claim 3, wherein adjusting the vertical scale and the offset value according to the first maximum peak value results in a first offset value and a first vertical scale to cause the power supply sound wave to be displayed within an oscilloscope window, comprising:
determining whether the first maximum peak value exceeds a display window of the oscilloscope, if so, adjusting a vertical scale to a first vertical scale according to the first maximum peak value so as to display the first maximum peak value in the display window of the oscilloscope;
acquiring a minimum peak value from the first waveform data to obtain a first minimum peak value;
determining a first offset value based on the first maximum peak value and the first minimum peak value.
5. The method of claim 3, wherein said scaling down the first vertical scale to the second vertical scale based on the first offset value to obtain a finer second offset value to cause the power supply sound wave to be displayed within a first display range of an oscilloscope window comprises:
reducing the first vertical scale to a second vertical scale according to the first offset value;
obtaining the waveform data of the power supply signal again to obtain second waveform data;
acquiring a maximum peak value from the second waveform data to obtain a finer second maximum peak value;
and determining a second offset value and a third vertical scale according to the second maximum peak value so as to display the second maximum peak value in the first display range of the oscilloscope window.
6. The method of claim 5, wherein the first display range is a range within a middle half of the oscilloscope window.
7. The method of claim 6, wherein testing for an exit condition comprises:
the cumulative value of the waveform is greater than a number threshold, or
The maximum peak value in the acquired waveform data of the power supply signal exceeds the second offset value plus three times the third vertical scale, or
The minimum peak value in the acquired waveform data of the power supply signal exceeds the third vertical scale obtained by subtracting three times from the second offset value.
8. The method of claim 1, wherein the adjusting the vertical scale and the offset value to cause the waveform data of the acquired power supply signal to be displayed in the oscilloscope window comprises:
and carrying out incremental adjustment on the vertical scale by using a fourth vertical scale unit value, resetting a waveform accumulation value, and recording test data until the acquired waveform data of the power supply signal is displayed in the oscilloscope window.
9. A power supply noise test apparatus, the apparatus comprising:
the first waveform data acquisition module is used for acquiring waveform data of the power supply signal to obtain first waveform data;
the first display adjustment module is used for adjusting the vertical scale and the offset value according to the first waveform data so as to display the first waveform data in a first display range of an oscilloscope window;
the test module is used for continuously acquiring the waveform data of the power supply signal and recording the test data until the waveform data of the power supply signal meets the test exit condition;
the second display adjustment module is used for adjusting the vertical scale and the offset value in the process of continuously acquiring the power supply sound wave so as to display the acquired waveform data of the power supply signal in the oscilloscope window;
and the test data export module is used for exporting the test data.
10. A computer-readable storage medium comprising a set of computer-executable instructions for performing the method of any one of claims 1 to 8 when executed.
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