CN113218530A - Diagnostic equipment for obtaining three-dimensional space distribution of ICF hot spot electron temperature - Google Patents
Diagnostic equipment for obtaining three-dimensional space distribution of ICF hot spot electron temperature Download PDFInfo
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- CN113218530A CN113218530A CN202110475422.4A CN202110475422A CN113218530A CN 113218530 A CN113218530 A CN 113218530A CN 202110475422 A CN202110475422 A CN 202110475422A CN 113218530 A CN113218530 A CN 113218530A
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- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
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Abstract
The invention relates to a diagnostic device for acquiring three-dimensional space distribution of ICF hot spot electron temperature, which comprises three identical four-channel KB microscopes for acquiring a front view, a top view and a side view of a hot spot generated by ICF experimental target pill implosion, and three identical imaging plates for respectively receiving X-ray time integral images emitted by the four-channel KB microscopes under different visual angles, wherein the three four-channel KB microscopes are respectively arranged in three pairwise orthogonal directions of an ICF target chamber and respond to the same four energy points. Compared with the prior art, the method makes up the vacancy of the current diagnostic equipment which can not obtain the three-dimensional distribution map of the hot spot electron temperature, can obtain the three-dimensional distribution of the hot spot electron temperature, and is beneficial to researching the implosion state through the element emission characteristic spectral line of the diagnostic target pellet.
Description
Technical Field
The invention relates to the technical field of ICF hot spot electron temperature diagnosis, in particular to a diagnosis device for obtaining three-dimensional space distribution of ICF hot spot electron temperature.
Background
Diagnosis of the electron temperature of the implosion hot spot of Inertial Confinement Fusion (ICF) is an important research content of inertial confinement fusion. The final goal of inertial confinement fusion implosion compression is to achieve very high areal density and temperature of hot spot material. The electron temperature of the hot spot is an important criterion for fusion ignition, and the electron temperature of the hot spot is a necessary condition for fusion reaction. The electron temperature of the implosion compression hot spot has certain spatial distribution, the center temperature of the hot spot is high, and the edge temperature of the hot spot is low. The diagnosis of the electronic temperature of the hot spot is helpful for deeply understanding the physical process of the implosion and is helpful for understanding the key problem of the bottleneck that inertial confinement fusion ignition is not successful.
Currently, the measurement of the electron temperature of the implosion hot spot still remains to be performed by using a single X-ray diagnostic device (such as a KB microscope) or a diagnostic device with low resolution and low light collection efficiency (such as a pinhole and a single-layer film flat mirror, the spatial resolution is only 10 μm in a field range of +/-200 μm, and the light collection solid angle is 10 μm-8sr), a three-dimensional spatial distribution image with high spatial resolution and high light collection efficiency of the electron temperature distribution of the implosion hot spot cannot be obtained. In addition, at present, high-Z elements are generally required to be doped in the ICF target pellet for measuring the electronic temperature of the hot spots at home and abroad, and diagnostic equipment is utilized to measure a special diagnostic line of the doped elements to obtain the electronic temperature of the implosion hot spots, but the high-Z elements doped in the target pellet often bring a radiation refrigeration effect.
Disclosure of Invention
It is an object of the present invention to overcome the above-mentioned drawbacks of the prior art by providing a diagnostic device for obtaining a three-dimensional spatial distribution of the electron temperature of an ICF hot spot.
The purpose of the invention can be realized by the following technical scheme:
the three-channel KB microscopes are completely the same and are used for receiving X-ray time integral images emitted by the four-channel KB microscope at different visual angles respectively, the three four-channel KB microscopes are arranged in three pairwise orthogonal directions of an ICF target chamber respectively, and the three four-channel KB microscopes respond to the same four energy points.
The working energy points of the three four-channel KB microscopes are 4.5keV of the Ka 1 characteristic line of Ti, 6.4keV of the Ka 1 characteristic line of Fe, 8.04keV of the Ka 1 characteristic line of Cu and 17.48keV of the Ka 1 characteristic line of Mo. Four passes of three of the four-channel KB microscopes were each coated with a bi-periodic multilayer film that responded to different energy points.
After receiving X-ray time integral images emitted by three four-channel KB microscopes at different visual angles, each sub-imaging plate extracts intensity information of the images at different energy points in three orthogonal directions and carries out image reconstruction, and then the distribution map of the electron temperature is obtained.
The invention calculates the electron temperature T in the following way:
in the formula: e1And E2Energy of any two energy points in four energy points of Ka 1 characteristic line 4.5keV of Ti, Ka 1 characteristic line 6.4keV of Fe, Ka 1 characteristic line 8.04keV of Cu and Ka 1 characteristic line 17.48keV of Mo, K is Boltzmann constant, g is energy level degeneracy corresponding to different energy points, v is X-ray frequency corresponding to different energy points, I is1And I2Spectral line emission intensity (gv) corresponding to two different energy points respectively1The product of the degeneracy of the energy level of one of the energy points and the X-ray frequency, (gv)2Is the product of the energy level degeneracy of another energy point and the X-ray frequency.
Spectral line emission intensity I corresponding to one energy point1The calculation formula of (A) is as follows:
in the formula: i is1' for images corresponding to a certain extracted energy pointIntensity information, η1For the spectral response of the imaging plate to one of the energy points, R1And obtaining the energy spectrum response at a certain energy point for energy spectrum calibration. Similarly, the emission intensity I of the spectral line corresponding to another energy point can be obtained2。
Further, each four-channel KB microscope preferably employs a four-channel KB microscope with spatial resolution higher than better than 5 μm over a field of view of 200 μm.
Further, each four-channel KB microscope preferably employs a collection cube corner at 10-7Four-channel KB microscope of sr magnitude.
Further, each four-channel KB microscope is provided with a diagnostic manipulator DIM for transporting the four-channel KB microscope into the ICF chamber.
Further, each imaging plate is preferably an imaging plate of Fuji SR2025 type.
Compared with the prior art, the diagnostic equipment for acquiring the three-dimensional space distribution of the ICF hot spot electron temperature at least has the following beneficial effects:
1) the invention adopts three identical four-channel KB microscopes to observe the hot spots from three pairwise orthogonal directions, can obtain a more refined three-dimensional distribution map of the electron temperature of the implosion hot spots, and has the advantages of high spatial resolution and high light collecting efficiency.
2) The invention makes up the vacancy of the current diagnostic equipment which can not obtain the three-dimensional distribution map of the hot spot electron temperature, can obtain the three-dimensional distribution of the hot spot electron temperature and is beneficial to researching the implosion state by diagnosing the element emission characteristic spectral line of the target pill.
3) When the device is used for diagnosis, high-Z elements do not need to be doped in the ICF target pill, and the influence of radiation refrigeration effect on the ICF implosion process can be avoided.
Drawings
FIG. 1 is a schematic structural diagram of a diagnostic device for obtaining three-dimensional spatial distribution of ICF hot spot electron temperature in an embodiment;
FIG. 2 is a schematic diagram of an electronic temperature diagnosis device in one dimension of a three-dimensional cooperative diagnosis device in an embodiment;
FIG. 3 is a schematic view showing imaging of a hot spot of the first imaging plate in the embodiment;
FIG. 4 is a schematic view showing hot spot imaging of the second imaging plate in the embodiment;
FIG. 5 is a schematic view showing hot spot imaging of a third imaging plate in the embodiment;
the reference numbers in the figures indicate:
1. an ICF experimental target, 2, an ICF target chamber, 3, a first four-channel KB microscope, 4, a first diagnostic manipulator DIM, 5, a first imaging plate, 5.1, 5.2, 5.3, 5.4 are hot spot images of the four channels of the first four-channel KB microscope at energy points of 4.5keV, 6.4keV, 8.04keV, 17.48keV, 6, a second four-channel KB microscope, 7, a second diagnostic manipulator DIM, 8, a second imaging plate, 8.1, 8.2, 8.3, 8.4 are hot spot images of the four channels of the second four-channel KB microscope at energy points of 4.5keV, 6.4keV, 8.04, 17.48keV, 9, a third four-channel KB microscope, 10, a third diagnostic manipulator DIM, 11, a third imaging plate, 11.1, 11.2, 11.3, 11.4 keV, 4keV and 4.04, 8.48 keV.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, shall fall within the scope of protection of the present invention.
Examples
The invention relates to a diagnostic device for obtaining three-dimensional space distribution of ICF hot spot electron temperature, which comprises an ICF experiment target pill 1, an ICF target chamber 2 and a three-dimensional cooperative diagnostic device, wherein the three-dimensional cooperative diagnostic device comprises three electronic temperature diagnostic devices which have the same structure and are arranged in different dimensions (X, Y, Z triaxial), and each electronic temperature diagnostic device comprises a four-channel KB microscope, a diagnosis manipulator DIM and an imaging plate.
As shown in fig. 1, the three-dimensional cooperative diagnosis apparatus includes a first four-channel KB microscope 3, a second four-channel KB microscope 6, a third four-channel KB microscope 9, a first diagnostician DIM4, a second diagnostician DIM7, a third diagnostician DIM10, a first imaging plate 5, a second imaging plate 8, and a third imaging plate 11.
ICF experimental target pellet 1 is set inside ICF target chamber 2. The first four-channel KB microscope 3, the second four-channel KB microscope 6 and the third four-channel KB microscope 9 are three identical four-channel KB microscopes, the three four-channel KB microscopes responding to different energy points all respond to the four energy points, and the three four-channel KB microscopes respectively respond to the four energy points and respectively correspond to a Ka 1 characteristic line of Ti 4.5keV, a Ka 1 characteristic line of Fe 6.4keV, a Ka 1 characteristic line of Cu 8.04keV and a Ka 1 characteristic line of Mo 17.48 keV; the three four-channel KB microscopes are respectively positioned in three pairwise orthogonal directions of the ICF target chamber 2.
The first four-channel KB microscope 3 is used for diagnosing an electron temperature distribution front view generated by implosion of the ICF experiment target pill 1, the first diagnosis manipulator DIM4 is connected with the first four-channel KB microscope 3 and used for carrying the first four-channel KB microscope 3 to be conveyed to a designed object distance, and the first imaging plate 5 is used for receiving an X-ray image of an implosion hot spot emitted from the first four-channel KB microscope 3.
The second four-channel KB microscope 6 is used for diagnosing an electron temperature distribution side view generated by implosion of the ICF experiment target pill 1, the second diagnosis manipulator DIM7 is connected with the second four-channel KB microscope 6 and used for carrying the second four-channel KB microscope 6 to be transmitted to a designed object distance, and the second imaging plate 8 is used for receiving an X-ray image of an implosion hot spot emitted from the second four-channel KB microscope 6.
The third four-channel KB microscope 9 is used for diagnosing an electron temperature distribution top view generated by the implosion of the ICF experiment target pill 1, the third diagnosis manipulator DIM10 is connected with the third four-channel KB microscope 9 and used for carrying the third four-channel KB microscope 9 to be conveyed to a designed object distance, and the third imaging plate 11 is used for receiving an X-ray image of an implosion hot spot emitted from the third four-channel KB microscope 9.
The three diagnostic operators DIM4, DIM7 and DIM10 are identical and are arranged in the orthogonal direction in pairs.
The imaging plates of the present invention are also identical. Taking the first imaging plate 5 as an example, as shown in fig. 2, the X-rays to be diagnosed emitted from the hot spot during the implosion process of the ICF experiment target pellet 1 are focused and imaged by the first four-channel KB microscope 3, and finally received by the first imaging plate 5.
As shown in fig. 3, the first imaging plate 5 is used to receive time-integrated images of X-rays from different energy points exiting the first four-channel KB microscope 3, wherein 5.1 is an image of a hot spot at an energy point of 4.5keV, 5.2 is an image of a hot spot at an energy point of 6.4keV, 5.3 is an image of a hot spot at an energy point of 8.04keV, and 5.4 is an image of a hot spot at an energy point of 17.48 keV.
As shown in fig. 4, the second imaging plate 8 is used to receive time-integrated images of X-rays of different energy points emitted from the second four-channel KB microscope 6, where 8.1 is an image of a hot spot at an energy point of 4.5keV, 8.2 is an image of a hot spot at an energy point of 6.4keV, 8.3 is an image of a hot spot at an energy point of 8.04keV, and 8.4 is an image of a hot spot at an energy point of 17.48 keV.
As shown in fig. 5, the third imaging plate 11 is used to receive time-integrated images of X-rays of different energy points emitted from the third four-channel KB microscope 9, wherein 11.1 is an image of a hot spot at an energy point of 4.5keV, 11.2 is an image of a hot spot at an energy point of 6.4keV, 11.3 is an image of a hot spot at an energy point of 8.04keV, and 11.4 is an image of a hot spot at an energy point of 17.48 keV.
In the present embodiment, the three four-channel KB microscope has high spatial resolution, and can realize resolution better than 5 μm within the field of view of +/-200 μm. The three-stage four-channel KB microscope has high light collecting efficiency and the light collecting solid angle is 10-7Of the order of sr. The four channels of the three four-channel KB microscope are all coated with a bi-periodic multilayer film that responds to different energy points. The imaging plate adopts a Fuji SR2025 model imaging plate and is used for obtaining time integral images of the implosion hot spot under three different viewing angles.
In practical use, the ICF experiment target pill 1 emits X-rays to be diagnosed, and three four-channel KB microscopes 3, 6 and 9 are respectively carried and transmitted into the ICF target chamber 2 through three diagnostic operators DIM4, 7 and 10 in pairwise orthogonal directions. In the implosion experiment process, the first imaging plate 5, the second imaging plate 8 and the third imaging plate 11 which are fixed on the image surface are used for receiving X-ray time integral images emitted from three four-channel KB microscopes under different viewing angles. By extracting the intensity information of the images under different energy points in three orthogonal directions, the electron temperature is obtained according to the following formula:
wherein T is the electron temperature, E1And E2Is the energy corresponding to any two energy points in the four energy points used in the invention, k is Boltzmann constant, g is the degeneracy of the energy levels corresponding to different energy points, v is the X-ray frequency corresponding to different energy points, I1And I2Is the emission intensity of the spectral lines corresponding to different energy points. (gv)1Represents the product of the degeneracy of the energy level of one of the energy points and the X-ray frequency, (gv)2Representing the product of the energy level degeneracy of another energy point and the X-ray frequency.
The image obtained by the diagnostic equipment in the explosion experiment process is extracted to obtain the intensity information I of the image corresponding to the two energy points1' and I2' the energy spectrum response under two different energy points obtained by calibrating the energy spectrum of three four-channel KB microscopes 3, 6 and 9 by combining a laboratory is R1And R1And the spectral response η of the imaging plate to different energy points1And η2Using the following formula, I1The values of (A) are:
can be processed by the same method to obtain I2The value of (c).
By utilizing the formula and X-ray images under different energy points obtained by adopting the diagnostic equipment provided by the invention in an implosion experiment, the intensity information in the images is extracted, and the electronic temperature distribution map of the implosion hot spot can be obtained by adopting a data fitting mode.
The invention adopts three identical four-channel KB microscopes to observe the hot spots from three pairwise orthogonal directions, can obtain a more refined three-dimensional distribution map of the electron temperature of the implosion hot spots, and has the advantages of high spatial resolution and high light collecting efficiency. The method makes up the vacancy of the current diagnostic equipment which can not obtain the three-dimensional distribution map of the hot spot electron temperature, can obtain the three-dimensional distribution of the hot spot electron temperature, and is beneficial to researching the implosion state through the element emission characteristic spectral line of the diagnostic target pellet.
While the invention has been described with reference to specific embodiments, the invention is not limited thereto, and those skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope of the invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. The diagnostic equipment is characterized by comprising three identical four-channel KB microscopes for acquiring the front view, the top view and the side view of the hot spot generated by ICF experimental target pill implosion, and three identical imaging plates for respectively receiving X-ray time integral images emitted by the four-channel KB microscopes under different visual angles, wherein the three four-channel KB microscopes are respectively arranged in three pairwise orthogonal directions of an ICF target chamber and all respond to the same four energy points.
2. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hot spot electron temperatures of claim 1 wherein the three four-channel KB microscopes have operating energy points of 4.5keV for Ti, 6.4keV for Fe, 8.04keV for Cu and 17.48keV for Mo.
3. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hotspot electron temperatures of claim 1, wherein four passes of three of said four-channel KB microscopes are each coated with a bicycling multilayer film responsive to different energy points.
4. The diagnostic apparatus for obtaining three-dimensional spatial distribution of electron temperature of ICF hot spot according to claim 2, wherein each sub-imaging plate receives X-ray time-integrated images emitted from three four-channel KB microscopes with different viewing angles, extracts intensity information of images at three orthogonal directions with different energy points, and performs image reconstruction to obtain a distribution map of electron temperature.
5. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of electron temperature of an ICF hotspot according to claim 4, wherein the calculation of the electron temperature T is:
in the formula: e1And E2Energy of any two energy points in four energy points of Ka 1 characteristic line 4.5keV of Ti, Ka 1 characteristic line 6.4keV of Fe, Ka 1 characteristic line 8.04keV of Cu and Ka 1 characteristic line 17.48keV of Mo, K is Boltzmann constant, g is energy level degeneracy corresponding to different energy points, v is X-ray frequency corresponding to different energy points, I is1And I2Spectral line emission intensity (gv) corresponding to two different energy points respectively1The product of the degeneracy of the energy level of one of the energy points and the X-ray frequency, (gv)2Is the product of the energy level degeneracy of another energy point and the X-ray frequency.
6. A diagnostic apparatus for obtaining a three dimensional spatial distribution of ICF hotspot electron temperature as set forth in claim 5, wherein the spectral line emission intensity I corresponding to one of the energy points1The calculation formula of (A) is as follows:
in the formula: i is1' intensity information of an image corresponding to a certain extracted energy point,. eta1For the spectral response of the imaging plate to one of the energy points, R1And obtaining the energy spectrum response at a certain energy point for energy spectrum calibration.
7. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hotspot electron temperatures of claim 1, wherein each four-channel KB microscope employs a four-channel KB microscope with spatial resolution higher than better than 5 μ ι η within a ± 200 μ ι η field of view.
8. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hotspot electron temperature of claim 7, wherein each four-channel KB microscope employs a light collection solid angle of 10-7Four-channel KB microscope of sr magnitude.
9. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hotspot electron temperatures of claim 1, wherein each four-channel KB microscope is provided with a diagnostic manipulator DIM.
10. The diagnostic apparatus for obtaining a three-dimensional spatial distribution of ICF hotspot electron temperatures of claim 1, wherein each imaging plate is a Fuji SR2025 model imaging plate.
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