CN113203941A - ICT test equipment - Google Patents
ICT test equipment Download PDFInfo
- Publication number
- CN113203941A CN113203941A CN202110488237.9A CN202110488237A CN113203941A CN 113203941 A CN113203941 A CN 113203941A CN 202110488237 A CN202110488237 A CN 202110488237A CN 113203941 A CN113203941 A CN 113203941A
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- testing
- test
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- upper die
- test fixture
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses ICT (information and communication technology) test equipment, which relates to the field of mainboard testing and comprises a rack, wherein a first test mechanism and a second test mechanism are arranged on the rack, quick-change mechanisms are respectively arranged on one sides of the first test mechanism and the second test mechanism, the first test mechanism comprises a first test fixture upper die and a first test fixture lower die, a first transmission mechanism, a second transmission mechanism and a third transmission mechanism are arranged on the rack, a first lifting mechanism is arranged below the first transmission mechanism, a second lifting mechanism is arranged below the second transmission mechanism, the ICT test equipment further comprises a control mechanism and a code scanning mechanism arranged at the head end of the first transmission mechanism, the quick-change mechanisms in the invention enable the test equipment to quickly change test fixtures, save time and improve the efficiency of replacing the fixtures, the rack is arranged into two layers, instruments and meters are arranged on the upper layer, saving space and reducing cost.
Description
Technical Field
The invention relates to the field of mainboard testing, in particular to ICT testing equipment.
Background
The conventional ICT testing equipment is troublesome in wire replacement, a plurality of flat cables need to be pulled out from a testing jig one by one, and then the flat cables are inserted into the replaced testing jig one by one, so that long time is needed, and the replacement efficiency is low.
Disclosure of Invention
The ICT testing equipment provided by the invention can be used for rapidly replacing the testing jig, and is high in efficiency and small in occupied area.
The technical scheme adopted by the invention for solving the technical problems is as follows: ICT test equipment comprises a rack, wherein a first test mechanism and a second test mechanism are arranged on the rack, quick-change mechanisms are arranged on one sides of the first test mechanism and the second test mechanism respectively, the first test mechanism comprises a first test fixture upper die and a first test fixture lower die, the second test mechanism comprises a second test fixture upper die and a second test fixture lower die, a first transmission mechanism, a second transmission mechanism and a third transmission mechanism are arranged on the rack, the first transmission mechanism is arranged between the first test fixture upper die and the first test fixture lower die, the second transmission mechanism is arranged between the first test mechanism and the second test mechanism, the third transmission mechanism is arranged between the second test fixture upper die and the second test fixture lower die, and the first test mechanism and the second test mechanism are used for testing two faces of a mainboard, the quick change mechanism enables the test equipment to quickly change the test jig, saves time and improves the efficiency of replacing the jig, the upper die of the first test jig is matched with the lower die of the first test jig to test the performance of the mainboard, the first transmission mechanism, the second transmission mechanism and the third transmission mechanism are used for driving the mainboard to transmit, and the mainboard is a product to be tested;
the system comprises a first transmission mechanism, a second transmission mechanism, a control mechanism and a code sweeping mechanism, wherein the first transmission mechanism is used for driving the first transmission mechanism to ascend and descend, the second transmission mechanism is used for driving the second transmission mechanism to ascend and descend, the control mechanism is used for controlling ICT testing equipment, the code sweeping mechanism is arranged at the head end of the first transmission mechanism, the first testing mechanism, the second testing mechanism, the quick changing mechanism, the first transmission mechanism, the second transmission mechanism, the third transmission mechanism, the first lifting mechanism, the second lifting mechanism and the code sweeping mechanism are electrically connected with the control mechanism respectively, the first lifting mechanism is used for driving the first transmission mechanism to ascend and descend, so that a mainboard is placed on a lower die of a first testing jig to be tested, and the control mechanism is used for controlling the ICT testing equipment.
Further, the method comprises the following steps: the first testing mechanism and the second testing mechanism are identical in structure.
Further, the method comprises the following steps: and one sides of the first test fixture upper die and the first test fixture lower die are provided with quick-change mechanisms.
Further, the method comprises the following steps: a connecting pin is arranged on one side, close to the quick-change mechanism, of the upper die of the first test fixture, a first connecting hole is formed in one side, close to the upper die of the first test fixture, of the quick-change mechanism, and the first connecting hole is connected with the connecting pin in a plugging and unplugging mode, so that the test fixture can be conveniently replaced;
and a second connecting hole used for being connected with equipment is formed in one side, away from the first test fixture, of the quick-change mechanism.
Further, the method comprises the following steps: and a vacuum adsorption assembly is arranged between the first test fixture upper die and the quick-change mechanism and used for rapidly adsorbing the first test fixture upper die and the quick-change mechanism together.
First air cylinders for pushing the quick-change mechanism are symmetrically arranged on two sides of the quick-change mechanism and are electrically connected with the control mechanism, and the first air cylinders are used for pushing the quick-change mechanism, so that the first test fixture lower die and the quick-change mechanism are adsorbed together;
the corner of the first test fixture upper die is provided with a positioning hole, a positioning column is arranged at a position, corresponding to the positioning hole, on the quick-change mechanism, the positioning column is connected with the positioning hole in a plugging mode, the positioning hole and the positioning column are matched to align the quick-change mechanism, and the quick-change mechanism is prevented from deviating in the moving process.
Further, the method comprises the following steps: first elevating system is including setting up the first connecting plate in the frame, first drive mechanism sets up on first connecting plate, the lower extreme symmetry of first connecting plate is provided with a plurality of first lead screws, each first lead screw is connected with first motor, be provided with a plurality of through-holes on the first connecting plate, it is provided with revolving cylinder to lie in through-hole department on the lower terminal surface of first connecting plate, be provided with the buckle in revolving cylinder's the drive shaft for can detain the mainboard, one of them through-hole department is provided with the third cylinder, be provided with the arm-tie in the drive shaft of third cylinder, first motor and revolving cylinder respectively with control mechanism electric connection, thereby first motor rotates and drives first lead screw transmission and drives first connecting plate and reciprocate and then drive the mainboard and move down to first test fixture lower mould.
Further, the method comprises the following steps: the second cylinder is used for driving the first test fixture to move up and down and is arranged above the first test fixture and positioned on the rack, the second cylinder is electrically connected with the control mechanism, and the second cylinder is used for driving the first test fixture to move up and down, so that the first test fixture and the first test fixture are contacted or separated from each other.
Further, the method comprises the following steps: the rack is arranged into two layers, and the instruments and meters are arranged on the upper layer, so that the space is saved, and the cost is reduced.
The invention has the beneficial effects that: the quick-change mechanism enables the test equipment to quickly change the test fixture, saves time, improves the efficiency of replacing the fixture, and saves space and reduces cost because the rack is arranged into two layers and the instruments and meters are arranged on the upper layer.
Drawings
FIG. 1 is a front view of ICT test equipment;
FIG. 2 is a rear view of ICT test equipment;
FIG. 3 is a schematic structural diagram of a first testing mechanism;
FIG. 4 is a front view of the first lift mechanism;
FIG. 5 is a top view of the first lift mechanism;
FIG. 6 is a schematic structural view of a quick-change mechanism;
labeled as: 1. a frame; 2. a first testing mechanism; 3. a second testing mechanism; 4. a quick-change mechanism; 5. a first test fixture upper die; 6. a first test fixture lower die; 7. a first transmission mechanism; 8. a second transmission mechanism; 9. a third transmission mechanism; 10. a first lifting mechanism; 11. a second lifting mechanism; 12. a second cylinder; 41. a second connection hole; 42. a first cylinder; 43. positioning holes; 44. a positioning column; 101. a first connecting plate; 102. a first lead screw; 103. a first motor; 104. a rotating cylinder; 105. buckling the plate; 106. a third cylinder; 107. and (5) pulling the plate.
Detailed Description
The invention is further described with reference to the following figures and detailed description.
The ICT testing device shown in fig. 1 comprises a frame 1, wherein a first testing mechanism 2 and a second testing mechanism 3 are arranged on the frame 1, a quick-change mechanism 4 is arranged on each of one sides of the first testing mechanism 2 and the second testing mechanism 3, the first testing mechanism 2 comprises a first testing jig upper die 5 and a first testing jig lower die 6, the second testing mechanism 3 comprises a second testing jig upper die and a second testing jig lower die, a first transmission mechanism 7, a second transmission mechanism 8 and a third transmission mechanism 9 are arranged on the frame 1, the first transmission mechanism 7 is arranged between the first testing jig upper die 5 and the first testing jig lower die 6, the second transmission mechanism 8 is arranged between the first testing mechanism 2 and the second testing mechanism 3, the third transmission mechanism 9 is arranged between the second testing jig upper die and the second testing jig lower die, the first testing mechanism 2 and the second testing mechanism 3 are used for testing two surfaces of the mainboard, the quick-change mechanism 4 enables the testing equipment to quickly change a testing jig, time is saved, and the jig changing efficiency is improved, the upper die 5 of the first testing jig and the lower die 6 of the first testing jig are matched to carry out performance testing on the mainboard, the first transmission mechanism 7, the second transmission mechanism 8 and the third transmission mechanism 9 are used for driving the mainboard to carry out transmission, and the mainboard is a product to be tested;
a first lifting mechanism 10 for driving the first transmission mechanism 7 to lift is arranged below the first transmission mechanism 7, a second lifting mechanism 11 for driving the second transmission mechanism 8 to lift is arranged below the second transmission mechanism 8, the ICT testing device further comprises a control mechanism for controlling the ICT testing device and a code scanning mechanism arranged at the head end of the first transmission mechanism 7, the first testing mechanism 2, the second testing mechanism 3, the quick-change mechanism 4, the first transmission mechanism 7, the second transmission mechanism 8, the third transmission mechanism 9, the first lifting mechanism 10, the second lifting mechanism 11 and the code scanning mechanism are respectively electrically connected with the control mechanism, the first lifting mechanism 10 is used for driving the first transmission mechanism 7 to lift, therefore, the mainboard is placed on the lower die 6 of the first testing jig to be tested, the control mechanism is used for controlling ICT testing equipment, and the control mechanism comprises a controller.
On the basis of the above, the first testing mechanism 2 and the second testing mechanism 3 have the same structure.
On the basis, the quick change mechanisms 4 are arranged on one sides of the first test fixture upper die 5 and the first test fixture lower die 6.
On the basis, a connecting pin is arranged on one side, close to the quick-change mechanism 4, of the first test fixture upper die 5, a first connecting hole is arranged on one side, close to the first test fixture upper die 5, of the quick-change mechanism 4, and the first connecting hole is connected with the connecting pin in a plugging and unplugging mode, so that the test fixture can be conveniently replaced;
and a second connecting hole 41 used for being connected with equipment is formed in one side, away from the first testing jig upper die 5, of the quick-change mechanism 4.
On the basis, a vacuum adsorption component is arranged between the first test fixture upper die 5 and the quick-change mechanism 4, and the vacuum adsorption component is used for rapidly adsorbing the first test fixture upper die 5 and the quick-change mechanism 4 together.
the corner of the first test fixture upper die 5 is provided with a positioning hole 43, a positioning column 44 is arranged at a position on the quick-change mechanism 4 corresponding to the positioning hole 43, the positioning column 44 is connected with the positioning hole 43 in a plugging manner, and the positioning hole 43 and the positioning column 44 are matched to align the quick-change mechanism, so that the quick-change mechanism is prevented from deviating in the moving process.
On the basis, the first lifting mechanism 10 includes a first connecting plate 101 disposed on the frame 1, the first transmission mechanism 7 is disposed on the first connecting plate 101, a plurality of first screws 102 are symmetrically disposed at a lower end of the first connecting plate 101, each first screw 102 is connected to a first motor 103, the first connecting plate is provided with a plurality of through holes, a rotary cylinder 104 is disposed at a position of the through hole on a lower end surface of the first connecting plate, a fastening plate 105 is disposed on a driving shaft of the rotary cylinder 104 so as to fasten the main board, one of the through holes is provided with a third cylinder 106, a pulling plate 107 is disposed on a driving shaft of the third cylinder 106, the third cylinder 106 is used for driving the third cylinder 106 to move so as to pull the main board and position the main board, the first motor, the rotary cylinder 104, and the third cylinder 106 are electrically connected to the control mechanism respectively, the first motor 103 rotates to drive the first screw rod 102 to transmit, so as to drive the first connecting plate 101 to move up and down, and further drive the main board to move down to the first lower testing fixture die 6.
On the basis, a second cylinder 12 used for driving the first test fixture to move up and down is arranged above the first test fixture upper die 5 on the frame 1, the second cylinder 12 is electrically connected with the control mechanism, and the second cylinder 12 is used for driving the first test fixture upper die 5 to move up and down, so that the first test fixture upper die 5 is contacted with or separated from the first test fixture lower die 6.
On the basis, the rack 1 is arranged into two layers, and instruments and meters are arranged on the upper layer, so that the space is saved, and the cost is reduced.
On the basis, firstly, the mainboard is placed at the position of the first transmission mechanism 7, the code scanning mechanism scans codes, the first transmission mechanism 7 drives the mainboard to transmit, then the first testing mechanism 2 performs performance testing on one surface of the mainboard, after the testing is completed, the second transmission mechanism drives the mainboard to transmit, the mainboard transmits to the third transmission mechanism 9, the second testing mechanism 3 tests the other surface of the mainboard, and the operation is repeated.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
- ICT test equipment, including frame (1), its characterized in that: a first testing mechanism (2) and a second testing mechanism (3) are arranged on the frame (1), one side of the first testing mechanism (2) and one side of the second testing mechanism (3) are both provided with a quick-change mechanism (4), the first testing mechanism (2) comprises a first testing jig upper die (5) and a first testing jig lower die (6), the second testing mechanism (3) comprises a second testing jig upper die and a second testing jig lower die, a first transmission mechanism (7), a second transmission mechanism (8) and a third transmission mechanism (9) are arranged on the frame (1), the first transmission mechanism (7) is arranged between the first test fixture upper die (5) and the first test fixture lower die (6), the second transmission mechanism (8) is arranged between the first testing mechanism (2) and the second testing mechanism (3), the third transmission mechanism (9) is arranged between the second test fixture upper die and the second test fixture lower die;the utility model discloses a ICT test device, including first drive mechanism (7), first drive mechanism (7) and second drive mechanism (8), the below of first drive mechanism (7) is provided with and is used for driving first elevating system (10) that first drive mechanism (7) go up and down, the below of second drive mechanism (8) is provided with and is used for driving second drive mechanism (8) second elevating system (11) that goes up and down, still including the control mechanism who is used for controlling ICT test equipment and the yard mechanism of sweeping of setting at first drive mechanism (7) head end, first test mechanism (2), second test mechanism (3), quick change mechanism (4), first drive mechanism (7), second drive mechanism (8), third drive mechanism (9), first elevating system (10), second elevating system (11) and sweep yard mechanism respectively with control mechanism electrical connection.
- 2. An ICT test set according to claim 1, characterized in that: the first testing mechanism (2) and the second testing mechanism (3) are identical in structure.
- 3. An ICT test set according to claim 1, characterized in that: and one sides of the first test fixture upper die (5) and the first test fixture lower die (6) are provided with quick-change mechanisms (4).
- 4. An ICT test set according to claim 1, characterized in that: a connecting pin is arranged on one side, close to the quick-change mechanism (4), of the first test fixture upper die (5), a first connecting hole is formed in one side, close to the first test fixture upper die (5), of the quick-change mechanism (4), and the connecting pin is connected with the first connecting hole in a plugging and pulling mode;and a second connecting hole (41) used for being connected with equipment is formed in one side, away from the first testing jig upper die (5), of the quick-change mechanism (4).
- 5. An ICT testing device according to claim 4, characterized in that: a vacuum adsorption component is arranged between the first test fixture upper die (5) and the quick-change mechanism (4);first air cylinders (42) used for pushing the quick-change mechanism (4) are symmetrically arranged on two sides of the quick-change mechanism (4), and the first air cylinders (42) are electrically connected with the control mechanism;the corner of the first testing jig upper die (5) is provided with a positioning hole (43), a positioning column (44) is arranged on the quick-change mechanism (4) and corresponds to the positioning hole (43), and the positioning column (44) is connected with the positioning hole (43) in a plugging mode.
- 6. An ICT testing device according to claim 4, characterized in that: the first lifting mechanism (10) comprises a first connecting plate (101) arranged on the frame (1), the first transmission mechanism (7) is arranged on a first connecting plate (101), a plurality of first screw rods (102) are symmetrically arranged at the lower end of the first connecting plate (101), each first screw rod (102) is connected with a first motor (103), a plurality of through holes are arranged on the first connecting plate, a rotary cylinder (104) is arranged on the lower end surface of the first connecting plate at the through holes, a buckle plate (105) is arranged on the driving shaft of the rotating cylinder (104) so as to buckle the main plate, a third air cylinder (106) is arranged at one through hole, a pulling plate (107) is arranged on a driving shaft of the third air cylinder (106), the first motor, the rotary cylinder (104) and the third cylinder (106) are respectively electrically connected with the control mechanism.
- 7. An ICT testing device according to claim 4, characterized in that: and a second cylinder (12) used for driving the first test fixture upper die (5) to move up and down is arranged above the first test fixture upper die (5) on the frame (1), and the second cylinder (12) is electrically connected with the control mechanism.
- 8. An ICT test set according to claim 1, characterized in that: the rack (1) is arranged into two layers, and the instruments and meters are arranged on the upper layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110488237.9A CN113203941A (en) | 2021-05-06 | 2021-05-06 | ICT test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110488237.9A CN113203941A (en) | 2021-05-06 | 2021-05-06 | ICT test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113203941A true CN113203941A (en) | 2021-08-03 |
Family
ID=77028499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110488237.9A Pending CN113203941A (en) | 2021-05-06 | 2021-05-06 | ICT test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113203941A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1194906A (en) * | 1997-09-19 | 1999-04-09 | Chuo Denshi System Kk | Incircuit tester |
| US20030179006A1 (en) * | 2000-09-21 | 2003-09-25 | Hannu Seppala | Testing system in a circuit board manufacturing line for a automatic testing of circuit boards |
| CN104597388A (en) * | 2013-10-31 | 2015-05-06 | 纬创资通股份有限公司 | Automation testing system for testing mainboard |
| CN107037353A (en) * | 2017-05-24 | 2017-08-11 | 安徽博泰电路科技有限公司 | A kind of PCB testing jigs |
| CN207020281U (en) * | 2017-07-27 | 2018-02-16 | 东莞市冠佳电子设备有限公司 | A kind of functional test equipment |
| CN207086377U (en) * | 2017-07-27 | 2018-03-13 | 东莞市冠佳电子设备有限公司 | One kind automation power panel p-wire |
| CN208125879U (en) * | 2018-04-11 | 2018-11-20 | 深圳市捷思特电子设备有限公司 | ICT, FCT one automated test device |
-
2021
- 2021-05-06 CN CN202110488237.9A patent/CN113203941A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1194906A (en) * | 1997-09-19 | 1999-04-09 | Chuo Denshi System Kk | Incircuit tester |
| US20030179006A1 (en) * | 2000-09-21 | 2003-09-25 | Hannu Seppala | Testing system in a circuit board manufacturing line for a automatic testing of circuit boards |
| CN104597388A (en) * | 2013-10-31 | 2015-05-06 | 纬创资通股份有限公司 | Automation testing system for testing mainboard |
| CN107037353A (en) * | 2017-05-24 | 2017-08-11 | 安徽博泰电路科技有限公司 | A kind of PCB testing jigs |
| CN207020281U (en) * | 2017-07-27 | 2018-02-16 | 东莞市冠佳电子设备有限公司 | A kind of functional test equipment |
| CN207086377U (en) * | 2017-07-27 | 2018-03-13 | 东莞市冠佳电子设备有限公司 | One kind automation power panel p-wire |
| CN208125879U (en) * | 2018-04-11 | 2018-11-20 | 深圳市捷思特电子设备有限公司 | ICT, FCT one automated test device |
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Application publication date: 20210803 |
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