CN113203555A - Direct-current phase drift parameter testing system of multi-channel Y waveguide device - Google Patents
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- 238000012360 testing method Methods 0.000 title claims abstract description 48
- 239000013307 optical fiber Substances 0.000 claims abstract description 98
- 238000012545 processing Methods 0.000 claims abstract description 29
- 230000002999 depolarising effect Effects 0.000 claims description 31
- 239000000835 fiber Substances 0.000 claims description 21
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- 230000005693 optoelectronics Effects 0.000 claims description 3
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- 230000008859 change Effects 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
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- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
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- 229910021645 metal ion Inorganic materials 0.000 description 1
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- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J2009/0276—Stellar interferometer, e.g. Sagnac
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Abstract
The invention discloses a direct-current phase drift parameter testing system of a multi-channel Y waveguide device, and relates to the technical field of measurement and photoelectric detection, wherein a photoelectric switch unit of the system comprises m photoelectric switch modules; each photoelectric switch module comprises n paths of photoelectric switches, and the n paths of photoelectric switches share one input end; each photoelectric switch module comprises n output ends. In the system, a light source is connected with a first end of an optical fiber coupler, a second end of the optical fiber coupler is connected with an input end of a photoelectric switch module, and input ends of the rest photoelectric switch modules are connected with an optical fiber delay ring; the output ends of all the photoelectric switch modules are used for connecting the multichannel Y waveguide device; and the third end of the optical fiber coupler is connected with the input end of the signal processing modulation module through the photoelectric detector, and the output end of the signal processing modulation module is used for connecting the multichannel Y waveguide device. The invention can achieve the aim of continuously and rapidly measuring the DC phase drift parameter by multiple channels.
Description
Technical Field
The invention relates to the technical field of measurement and photoelectric detection, in particular to a direct-current phase drift parameter testing system of a multi-channel Y waveguide device.
Background
The Y waveguide phase modulator (Y waveguide for short) is a multifunctional integrated optical device, is a core component of an optical path part of a fiber optic gyroscope system, and is also one of typical applications of integrated optics.
Basic working principle of the Y waveguide: electrodes are added on two sides of the waveguide, and the refractive index of the waveguide is changed by changing the electric field applied on the two sides of the waveguide through the electrodes, so that the phase difference is generated between the light waves passing through the waveguide, and the dynamic modulation of the phase of the forward light beam and the reverse light beam is realized. The evaluation parameters mainly include optical parameters (insertion loss of Y branch, splitting ratio, polarization crosstalk and the like) and electrical parameters (half-wave voltage, residual intensity modulation and the like). The direct current phase drift parameter of a deeper level after the half-wave voltage parameter is one of important electro-optical response parameters influencing the accuracy and stability of the high-precision fiber-optic gyroscope system.
The direct current phase drift is also called as waveform slope, and refers to the ratio of the phase difference drift amount of the optical signal to the phase difference of the waveguide device under the action of direct current or a low-frequency modulation electric field. When modulating voltage is applied to the electrodes at both sides of the Y waveguide, free mobile charges (OH) in the lithium niobate substrate and the buffer layer-、K+、Na+Equi-alkaline metal ions) form a space-induced electric field in the opposite direction to the applied voltage, which causes the effective electric field intensity originally applied to the crystal to decrease, and thus causes the effective voltage applied to the waveguide to change with time, which is called dc phase shift.
At present, a relatively mature process is already provided for manufacturing the Y waveguide, and especially in the aspect of how to improve the performance, many scholars also perform experimental research on the half-wave voltage test of the Y waveguide, but the method is still greatly deficient in the aspect of the automatic detection technology of the direct-current phase drift parameter of the Y waveguide.
Disclosure of Invention
The invention aims to provide a direct-current phase drift parameter testing system of a multi-channel Y waveguide device, so as to achieve the aim of continuously and rapidly measuring direct-current phase drift parameters in a multi-channel mode.
In order to achieve the purpose, the invention provides the following scheme:
a direct current phase drift parameter test system of a multi-channel Y waveguide device comprises: the device comprises a light source, an optical fiber coupler, a photoelectric switch unit, an optical fiber delay ring, a photoelectric detector and a signal processing and modulating module; the photoelectric switch unit comprises m photoelectric switch modules; each photoelectric switch module comprises n paths of photoelectric switches, and the n paths of photoelectric switches share one input end; each photoelectric switch module comprises n output ends;
the light source is connected with the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected with the input end of one photoelectric switch module, and the input ends of the rest photoelectric switch modules are connected with the optical fiber delay loop;
the output ends of all the photoelectric switch modules are used for connecting a multi-channel Y waveguide device; the number of channels of the multi-channel Y waveguide device is n; when the multi-channel Y-shaped waveguide device works, the output ends of the photoelectric switch modules are connected with the ports of the multi-channel Y-shaped waveguide device in a one-to-one correspondence mode;
the third end of the optical fiber coupler is connected with the input end of the photoelectric detector, the output end of the photoelectric detector is connected with the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected with the photoelectric switch module, and the second output end of the signal processing modulation module is used for being connected with the multichannel Y waveguide device.
Optionally, the method further includes: a fiber isolator;
the light source is connected with the first end of the optical fiber coupler through the optical fiber isolator.
Optionally, the method further includes: a first depolarizing fiber;
and the second end of the optical fiber coupler is connected with the input end of the photoelectric switch module through the first depolarizing optical fiber.
Optionally, the method further includes: the connecting flange is arranged on the output end of the photoelectric switch module;
when the multi-channel Y-shaped waveguide device works, the output end of the photoelectric switch module is connected with the multi-channel Y-shaped waveguide device through the connecting flange.
Optionally, the method further includes: a second depolarizing fiber;
the optical fiber delay ring is connected with the input end of the photoelectric switch module through the second depolarizing optical fiber.
Optionally, the number of the optical fiber delay loops is one or more.
Optionally, when the number of the optical fiber delay loops is (m-1)/2, the direct-current phase drift parameter testing system of the multi-channel Y waveguide device further includes a second depolarizing optical fiber and a third depolarizing optical fiber; wherein m is more than or equal to 3, and m is the number of the photoelectric switch modules and is an odd number;
the first optical fiber delay ring is connected with the input end of one photoelectric switch module through the second depolarized optical fiber, and the first optical fiber delay ring is connected with the input end of the other photoelectric switch module through the third depolarized optical fiber; the photoelectric switch module and the other photoelectric switch module are adjacent photoelectric switch modules; the first optical fiber delay ring is one of all the optical fiber delay rings.
Optionally, the first output end of the signal processing and modulating module is used for supplying power to the photoelectric switch module; and the second output end of the signal processing and modulating module is used for providing a modulating signal for the multi-channel Y waveguide device.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
the invention adopts the photoelectric switch module to control the on-off of the light path of the multi-channel Y waveguide device to be tested, and does not need to repeatedly carry out experimental plugging and unplugging of a single Y waveguide device.
Compared with a direct-current phase drift parameter testing system of a single Y waveguide device, the direct-current phase drift parameter testing system can effectively reduce testing time, greatly improve testing efficiency, reduce the problems of high manual testing cost, large testing error and the like, and expand the application prospect of the automatic testing system.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
FIG. 1 is a block diagram of a DC phase drift parameter testing system of a multi-channel Y-waveguide device according to the present invention;
FIG. 2 is a schematic structural diagram of a DC phase shift parameter testing system of a multi-channel Y-waveguide device according to the present invention;
fig. 3 is a diagram of an embodiment of a dc phase shift parameter testing system of a multi-channel Y waveguide device according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a direct-current phase drift parameter testing system of a multi-channel Y waveguide device, so as to achieve the aim of continuously and rapidly measuring direct-current phase drift parameters in a multi-channel mode.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
At present, the test channel of the existing test system is single, the efficiency is low, and continuous monitoring cannot be realized; and an automatic testing instrument for continuously and rapidly measuring the direct current phase drift parameters of the Y waveguide device in a multi-channel manner is not available at home and abroad.
In view of this, the invention provides a direct current phase drift parameter testing system of a multi-channel Y waveguide device, relating to the technical field of measurement and photoelectric detection, in particular to the multi-channel half-wave voltage and direct current phase drift parameter measuring direction of the Y waveguide device.
The invention is based on a Sagnac interference light path test scheme, measures the direct current phase drift parameter of a Y waveguide device by using a Sagnac optical fiber interferometer with a reciprocal structure, and develops the research of a multi-channel automatic test system. The invention adopts the photoelectric switch module (for example, 3X 3n paths of photoelectric switches) to control the on-off of the light path of the multi-channel Y waveguide device to be tested, and does not need to repeatedly perform experimental plugging and unplugging of a single Y waveguide device. Compared with a direct-current phase drift parameter test system of a single Y waveguide device, the direct-current phase drift parameter test system can effectively reduce test time, greatly improve test efficiency, reduce the problems of high manual test cost, large test error and the like, and expand the application prospect of the automatic test system.
Example one
As shown in fig. 1, the system for testing dc phase shift parameters of a multi-channel Y waveguide device provided in this embodiment mainly includes: the device comprises a light source, an optical fiber coupler, a photoelectric switch unit, an optical fiber delay ring, a photoelectric detector and a signal processing and modulating module; the photoelectric switch unit comprises m photoelectric switch modules; each photoelectric switch module comprises n paths of photoelectric switches, and the n paths of photoelectric switches share one input end; each photoelectric switch module comprises n output ends.
The light source is connected with the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected with the input end of one photoelectric switch module, and the input ends of the rest photoelectric switch modules are connected with the optical fiber delay ring.
The output ends of all the photoelectric switch modules are used for connecting a multi-channel Y waveguide device; the number of channels of the multi-channel Y waveguide device is n, namely the number of channels of the multi-channel Y waveguide device is the same as the number of paths of the photoelectric switches of each photoelectric switch module; and when the multi-channel Y waveguide device works, the output ends of the photoelectric switch modules are connected with the ports of the multi-channel Y waveguide device in a one-to-one correspondence mode.
The third end of the optical fiber coupler is connected with the input end of the photoelectric detector, the output end of the photoelectric detector is connected with the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected with the photoelectric switch module, and the second output end of the signal processing modulation module is used for being connected with the multichannel Y waveguide device.
The first output end of the signal processing and modulating module is used for supplying power to the photoelectric switch module; and the second output end of the signal processing and modulating module is used for providing a modulating signal for the multi-channel Y waveguide device.
As a preferred implementation manner, the system for testing the dc phase shift parameter of the multi-channel Y waveguide device provided in this embodiment may further include: the optical fiber isolator comprises an optical fiber isolator, a first depolarizing optical fiber and a connecting flange arranged on the output end of the photoelectric switch module.
The light source is connected with the first end of the optical fiber coupler through the optical fiber isolator. And the second end of the optical fiber coupler is connected with the input end of the photoelectric switch module through the first depolarizing optical fiber.
When the multi-channel Y-shaped waveguide device works, the output end of the photoelectric switch module is connected with the multi-channel Y-shaped waveguide device through the connecting flange.
As a preferred implementation manner, the system for testing the dc phase shift parameter of the multi-channel Y waveguide device provided in this embodiment may further include: a second depolarizing fiber.
The number of the optical fiber delay loops can be one; the optical fiber delay rings can be connected with the input ends of the rest photoelectric switch modules through the second depolarizing optical fibers; here, "remaining" means the optoelectronic switch module other than the optoelectronic switch module connected to the optical fiber coupler.
Further, the number of the optical fiber delay loops described in this embodiment may be multiple; the input ends of the rest photoelectric switch modules are only connected with one optical fiber delay ring.
The number of the photoelectric switch modules is the same as that of the multi-channel Y waveguide devices.
One example is: when the number of the optical fiber delay rings is (m-1)/2, the direct-current phase drift parameter test system of the multichannel Y waveguide device further comprises a second depolarizing optical fiber and a third depolarizing optical fiber; wherein m is more than or equal to 3, and m is the number of the photoelectric switch modules and is an odd number.
The first optical fiber delay ring is connected with the input end of one photoelectric switch module through the second depolarized optical fiber, and the first optical fiber delay ring is connected with the input end of the other photoelectric switch module through the third depolarized optical fiber; the photoelectric switch module and the other photoelectric switch module are adjacent photoelectric switch modules; the first optical fiber delay ring is one of all the optical fiber delay rings.
Example two
As shown in fig. 2 and 3, the system for testing the direct-current phase shift parameter of the multi-channel Y waveguide device provided by the present embodiment includes an optical path portion and a circuit portion; the optical path part mainly comprises a high-power wide-spectrum light source 1, an optical fiber isolator 2, an optical fiber coupler 3, a first depolarizing optical fiber 4, a second depolarizing optical fiber 7, a third depolarizing optical fiber 8, a 3 × 3n photoelectric switch 5, a multi-channel Y waveguide device 6 to be tested, an optical fiber delay ring 9 and a connecting flange 12; the circuit part mainly comprises a photodetector 10 and a signal processing and modulating module 11 (and the signal processing and modulating module in the first embodiment). The 3 × 3n photoelectric switches 5 are specifically formed by three 1 × n photoelectric switch devices. The number n of channels of the multi-channel Y waveguide device 6 to be tested is the same as the number n of output ports of each 1 × n photoelectric switch in the 3 × 3n photoelectric switches 5.
The output end of the high-power wide-spectrum light source 1 is connected with the input end of the optical fiber isolator 2, the output end of the optical fiber isolator 2 is connected with the first port of the optical fiber coupler 3, the second port of the optical fiber coupler 3 is connected with one end of the first depolarizing optical fiber 4, the other end of the first depolarizing optical fiber 4 is connected with the P1 port (namely, the input end in the first embodiment) of the 3 x 3n photoelectric switch 5, the right side of the 3 x 3n photoelectric switch 5 is provided with a plurality of groups of output ports, each 3 output ports (An, Bn and Cn) are a group, and n groups are provided; the right side ports An of the 3 × 3n photoelectric switches 5 are correspondingly connected with the input ports An of the multichannel Y waveguide devices 6 to be tested, the right side ports Bn and Cn of the 3 × 3n photoelectric switches 5 are correspondingly connected with the output ports Bn and Cn of the multichannel Y waveguide devices 6 to be tested respectively, and the ports are connected through the connecting flange 12, so that plugging and unplugging are facilitated. The internal light paths of the 3 × 3n photoelectric switches 5 are sequentially communicated in a group of 3 ports (An, Bn, Cn), and sequentially communicated in a dotted line combination sequence as shown in fig. 2; the port P2 of the 3 × 3n photoelectric switch 5 is connected with one end of a second depolarizing fiber 7, the other end of the second depolarizing fiber 7 is connected with one end of a fiber delay ring 9, the other end of the fiber delay ring 9 is connected with one end of a third depolarizing fiber 8, and the other end of the third depolarizing fiber 8 is connected with the port P3 of the 3 × 3n photoelectric switch 5.
The third port of the optical fiber coupler 3 is connected with the input end of a photoelectric detector 10, the output end of the photoelectric detector 10 is connected with the input end of a signal processing and modulating module 11, the signal processing and modulating module 11 is provided with two output ends, one end of the signal processing and modulating module is connected with a photoelectric switch 5 to supply power to the photoelectric switch, and the other end of the signal processing and modulating module is connected with a multi-channel Y waveguide device 6 to be tested to supply a modulating signal to the multi-channel Y waveguide device.
The transmission process of the optical signal is as follows:
the high-power wide-spectrum light source 1 outputs optical signals to an optical fiber isolator 2, the optical signals are transmitted to a first port of an optical fiber coupler 3 through the optical fiber isolator 2, the optical signals are output to a first depolarizing optical fiber 4 from a second port of the optical fiber coupler 3, the optical signals output by the first depolarizing optical fiber 4 are transmitted into a first branch 1 × n photoelectric switch of A3 × 3n photoelectric switch 5 through a port P1, the optical signals are output to an input port A1 of a multi-channel Y waveguide device 6 to be tested through an A1 port of the first branch 1 × n photoelectric switch and a connecting flange 12, the optical signals are output from an output port B1 and an output port C1 after being branched through a Y waveguide to be tested, and then are connected to a B1 port and a C1 port on the right side of a second branch 1 × n photoelectric switch and a third branch 1 × n photoelectric switch of the 3 × 3n photoelectric switch 5 through the connecting flange 12, the optical signals enter a second depolarizing optical fiber 7 and a third depolarizing optical fiber 8 through a port P2 port and a P3 port, and finally enters the optical fiber delay loop 9 to return.
The optical signal returns from the optical fiber delay ring 9, enters a port P2 and a port P3 through the second depolarized fiber 7 and the third depolarized fiber 8, then is output to an input port A of the multichannel Y waveguide device 6 to be tested through the connecting flange 12 from a port B and a port C of the 3 x 3n photoelectric switch 5, then is connected to a port A on the right side of the 3 x 3n photoelectric switch 5 through the connecting flange 12, and finally enters the optical fiber coupler 3 through a port P1 and the first depolarized fiber 4.
Enters the photodetector 10 through the third port of the fiber coupler 3; the photoelectric detector 10 converts the collected optical signals into voltage signals and transmits the voltage signals to the signal processing and modulating module 11, the signal processing and modulating module 11 is provided with two output ports, one port outputs the voltage signals to the 3 × 3n photoelectric switches 5 for power supply, and the other port adds modulation signals to the multichannel Y waveguide device 6 to be tested.
Compared with the prior art, the invention has the innovative parts as follows:
1. the device for testing the direct-current phase drift parameters of the Y waveguide device in a multi-channel manner is designed by adopting a multi-channel photoelectric switch; the specific implementation is that 3-branch 1 × n-path photoelectric switches are adopted, and a reusable test part and a multi-channel Y waveguide part to be tested are connected by virtue of the photoelectric switches.
2. The device combination mode of utilizing multichannel photoelectric switch, flange and signal processing and modulation module to supply power doubly makes things convenient for the multichannel Y waveguide part that awaits measuring can dock with multichannel photoelectric switch fast and separate, and multiplexing test part waits for external multichannel Y waveguide part at any time to test, further promotes efficiency of software testing.
3. The test system can realize multi-channel continuous stable test of direct current phase drift parameters of the Y waveguide part to be tested at the full temperature.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (8)
1. A direct current phase drift parameter test system of a multi-channel Y waveguide device is characterized by comprising: the device comprises a light source, an optical fiber coupler, a photoelectric switch unit, an optical fiber delay ring, a photoelectric detector and a signal processing and modulating module; the photoelectric switch unit comprises m photoelectric switch modules; each photoelectric switch module comprises n paths of photoelectric switches, and the n paths of photoelectric switches share one input end; each photoelectric switch module comprises n output ends;
the light source is connected with the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected with the input end of one photoelectric switch module, and the input ends of the rest photoelectric switch modules are connected with the optical fiber delay loop;
the output ends of all the photoelectric switch modules are used for connecting a multi-channel Y waveguide device; the number of channels of the multi-channel Y waveguide device is n; when the multi-channel Y-shaped waveguide device works, the output ends of the photoelectric switch modules are connected with the ports of the multi-channel Y-shaped waveguide device in a one-to-one correspondence mode;
the third end of the optical fiber coupler is connected with the input end of the photoelectric detector, the output end of the photoelectric detector is connected with the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected with the photoelectric switch module, and the second output end of the signal processing modulation module is used for being connected with the multichannel Y waveguide device.
2. The system of claim 1, further comprising: a fiber isolator;
the light source is connected with the first end of the optical fiber coupler through the optical fiber isolator.
3. The system of claim 1, further comprising: a first depolarizing fiber;
and the second end of the optical fiber coupler is connected with the input end of the photoelectric switch module through the first depolarizing optical fiber.
4. The system of claim 1, further comprising: the connecting flange is arranged on the output end of the photoelectric switch module;
when the multi-channel Y-shaped waveguide device works, the output end of the photoelectric switch module is connected with the multi-channel Y-shaped waveguide device through the connecting flange.
5. The system of claim 1, further comprising: a second depolarizing fiber;
the optical fiber delay ring is connected with the input end of the photoelectric switch module through the second depolarizing optical fiber.
6. The system for testing the DC phase shift parameters of the multi-channel Y-waveguide device according to claim 1, wherein the number of the optical fiber delay loops is one or more.
7. The DC phase shift parametric test system of claim 6, wherein when the number of the fiber delay rings is (m-1)/2, the DC phase shift parametric test system of the multi-channel Y waveguide device further comprises a second depolarizing fiber and a third depolarizing fiber; wherein m is more than or equal to 3, and m is the number of the photoelectric switch modules and is an odd number;
the first optical fiber delay ring is connected with the input end of one photoelectric switch module through the second depolarized optical fiber, and the first optical fiber delay ring is connected with the input end of the other photoelectric switch module through the third depolarized optical fiber; the photoelectric switch module and the other photoelectric switch module are adjacent photoelectric switch modules; the first optical fiber delay ring is one of all the optical fiber delay rings.
8. The system for testing the direct current phase shift parameters of the multi-channel Y waveguide device according to claim 1, wherein the first output end of the signal processing and modulating module is used for supplying power to the optoelectronic switch module; and the second output end of the signal processing and modulating module is used for providing a modulating signal for the multi-channel Y waveguide device.
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