CN111337052A - Y waveguide parameter measuring instrument, measuring system and measuring method - Google Patents
Y waveguide parameter measuring instrument, measuring system and measuring method Download PDFInfo
- Publication number
- CN111337052A CN111337052A CN202010201236.7A CN202010201236A CN111337052A CN 111337052 A CN111337052 A CN 111337052A CN 202010201236 A CN202010201236 A CN 202010201236A CN 111337052 A CN111337052 A CN 111337052A
- Authority
- CN
- China
- Prior art keywords
- port
- optical
- light
- waveguide
- depolarizer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 28
- 230000003287 optical effect Effects 0.000 claims abstract description 234
- 238000006243 chemical reaction Methods 0.000 claims abstract description 40
- 238000005259 measurement Methods 0.000 claims abstract description 38
- 230000010287 polarization Effects 0.000 claims description 57
- 239000000835 fiber Substances 0.000 claims description 39
- 239000013307 optical fiber Substances 0.000 claims description 26
- 230000009466 transformation Effects 0.000 claims description 21
- 230000008033 biological extinction Effects 0.000 claims description 20
- 230000005540 biological transmission Effects 0.000 claims description 17
- 230000007704 transition Effects 0.000 claims description 2
- 238000012360 testing method Methods 0.000 description 36
- 230000008569 process Effects 0.000 description 13
- 238000012545 processing Methods 0.000 description 10
- 239000000523 sample Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 230000028161 membrane depolarization Effects 0.000 description 7
- 230000005684 electric field Effects 0.000 description 5
- 238000000691 measurement method Methods 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 229910003327 LiNbO3 Inorganic materials 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000002999 depolarising effect Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000004092 self-diagnosis Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
- G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/264—Optical coupling means with optical elements between opposed fibre ends which perform a function other than beam splitting
- G02B6/266—Optical coupling means with optical elements between opposed fibre ends which perform a function other than beam splitting the optical element being an attenuator
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2746—Optical coupling means with polarisation selective and adjusting means comprising non-reciprocal devices, e.g. isolators, FRM, circulators, quasi-isolators
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2753—Optical coupling means with polarisation selective and adjusting means characterised by their function or use, i.e. of the complete device
- G02B6/276—Removing selected polarisation component of light, i.e. polarizers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/27—Optical coupling means with polarisation selective and adjusting means
- G02B6/2753—Optical coupling means with polarisation selective and adjusting means characterised by their function or use, i.e. of the complete device
- G02B6/2773—Polarisation splitting or combining
Abstract
The invention relates to a Y waveguide parameter measuring instrument, a measuring system and a measuring method. The Y waveguide parameter measuring instrument comprises: the device comprises a light source, an adjustable optical attenuator, a circulator, an optical detector, a light path conversion device and an upper computer. The output end of the light source is connected with the input end of the variable optical attenuator, and the output end of the variable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk of the Y waveguide to be tested; the other end of the trunk is connected with one end of a first branch of the Y waveguide to be tested and one end of a second branch of the Y waveguide to be tested; the other end of the first branch is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a second port of the light path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with an upper computer. The invention is based on the traditional Sagnac interferometer measuring method, realizes multi-parameter measurement, has simple measuring steps and low cost, and is full-automatic measurement by one key.
Description
Technical Field
The invention relates to the field of measurement, in particular to a Y waveguide parameter measuring instrument, a Y waveguide parameter measuring system and a Y waveguide parameter measuring method.
Background
The Y-branch optical modulator, also called Y-waveguide phase modulator, is used as special modulation device of optical fiber gyroscope, and has wide application in the fields of optical fiber sensing and photoelectric signal processing. The principle of the Y waveguide is that an external voltage signal generates a modulation electric field through electrodes on two sides of the Y waveguide, so that the effective refractive index of the waveguide is changed, and phase modulation of a transmission optical signal is realized. Key parameters of the Y waveguide include half-wave voltage, waveform slope, splitting ratio, extinction ratio, insertion loss, etc.
The half-wave voltage is the change amount of the bias voltage required to cause the phase retardation to be pi, that is, the modulation voltage required to cause the phase retardation to be pi is the half-wave voltage. The magnitude of the half-wave voltage is closely related to the central wavelength of the used light source and the ambient temperature besides the parameters of the Y waveguide, such as photoelectric coefficient, extraordinary refractive index, modulation electrode width and the like, and the larger the wavelength is, the larger the half-wave voltage value is, and the higher the ambient temperature is, the smaller the half-wave voltage value is. Therefore, the drift of the central wavelength of the light source and the change of the environmental temperature directly influence the stability and the accuracy of the half-wave voltage test result of the Y waveguide.
The waveform slope is also called direct current phase drift, and refers to a normalized value of the direct current drift amount of the output phase difference of the straight waveguide under the action of a low-frequency or static modulation electric field. This phenomenon is caused by LiNbO after an applied voltage is applied to the Y waveguide electrode3Crystal and electrodeSiO between2The film is easily exposed to OH in the device preparation process-And contamination with alkali metal ions, in SiO2A large number of mobile charges are formed in the film, and the charges move under the action of an external electric field and are in LiNbO3An induction electric field is generated in the crystal and is superposed with an external modulation electric field to cause waveform distortion of response output of an interference system, so that the phenomenon of direct current drift appears at a static working point of interference output.
The splitting ratio is a parameter for representing the beam splitting function of the Y waveguide, and the splitting ratio close to 1:1 can reduce the equivalent phase error caused by shot noise and improve the signal-to-noise ratio of the system. The measurement of the splitting ratio can be realized by calculating the ratio of the light intensity of the two light beams output by the Y waveguide.
At present, due to the limitations of measurement methods and devices, the measurement process is very susceptible to the temperature, magnetic field, vibration and the like of the external environment, and the scheme and equipment for measuring various parameters of the Y waveguide mainly stay in the research stage and the starting stage. Due to the imperfect and immature functions of the equipment, the measurement efficiency is low, errors caused by human factors are not negligible, so that the difference between an actual measured value and a true value is large, the accuracy, the stability and the reliability of a measurement result are generally low, and meanwhile, the conventional waveguide tester is complex in test process, single in measurement parameters and high in price.
Disclosure of Invention
The invention aims to provide a Y waveguide parameter measuring instrument, a measuring system and a measuring method so as to realize multi-parameter measurement.
In order to achieve the purpose, the invention provides the following scheme:
a Y-waveguide parameter gauge comprising: the device comprises a light source, an adjustable optical attenuator, a circulator, an optical detector, a light path conversion device and an upper computer;
the output end of the light source is connected with the input end of the variable optical attenuator, and the output end of the variable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk of the Y waveguide to be tested; the other end of the trunk is connected with one end of a first branch of the Y waveguide to be tested and one end of a second branch of the Y waveguide to be tested respectively; the other end of the first branch is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a second port of the optical path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be detected; the Y waveguide to be tested is used for dividing the light power adjusting light into a first light beam and a second light beam; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide to be tested is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed and forming a combined light beam; the circulator is also used for transmitting the combined beam to the optical detector; the light detector is used for sending the detected combined light beam to the upper computer.
Optionally, the optical path conversion device is a single-mode optical fiber sensing ring; the other end of the first branch is connected with a first port of the single-mode optical fiber sensing ring; and the other end of the second fork is connected with a second port of the single-mode optical fiber sensing ring.
Optionally, the method further includes: a first depolarizer, a second depolarizer, and a third depolarizer; the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; a first port of the second depolarizer is connected with the other end of the first branch; a second port of the second depolarizer is connected with a first port of the optical path transformation device; the first port of the third depolarizer is connected with the other end of the second fork; and the second port of the third depolarizer is connected with the second port of the optical path transformation device.
Optionally, the method further includes: the optical power meter comprises a first double-channel optical power meter, a first coupler and a second coupler, wherein the splitting ratios of the first coupler and the second coupler are the same;
the other end of the first branch is connected with a first port of the first coupler, and a second port of the first coupler is connected with a first port of the optical path conversion device; the third port of the first coupler is connected with the first input end of the first dual-channel optical power meter; the other end of the second branch is connected with a first port of the second coupler, and a second port of the second coupler is connected with a second port of the optical path conversion device; and the third port of the second coupler is connected with the second input end of the first dual-channel optical power meter.
Optionally, the method further includes: the device comprises a first polarization beam splitter, a second double-channel optical power meter and a double-channel extinction ratio measuring instrument;
a first port of the first polarization beam splitter is connected with the other end of the first branch, a second port of the first polarization beam splitter is connected with a first port of the optical path conversion device, a third port of the first polarization beam splitter is connected with a first input end of the second dual-channel optical power meter, and a fourth port of the first polarization beam splitter is connected with a first input end of the dual-channel extinction ratio measuring instrument; a first port of the second polarization beam splitter is connected with the other end of the second fork, and a second port of the second polarization beam splitter is connected with a second port of the optical path transformation device; and a third port of the second polarization beam splitter is connected with a second input end of the second dual-channel optical power meter, and a fourth port of the second polarization beam splitter is connected with a second input end of the dual-channel extinction ratio measuring instrument.
Optionally, the method further includes: PBC-PBS polarization beam combiner, beam splitter and wave plate;
the first ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with the other end of the first fork, the second ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with the other end of the second fork, the third ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with one end of the wave plate, and the other end of the wave plate is connected with the light path conversion device.
Optionally, the optical path transformation device is composed of a low birefringent fiber and a fiber mirror; one end of the low-birefringence fiber is connected with the other end of the wave plate, the fiber reflector is arranged at the other end of the low-birefringence fiber, and the fiber reflector is used for reflecting light transmitted from one end of the low-birefringence fiber back to the wave plate.
A Y-waveguide parameter measurement system comprising: the device comprises a first multi-channel optical switch, a second multi-channel optical switch, an optical path conversion device, an upper computer and a plurality of optical path transmission circuits; the optical path transmission circuit includes: the device comprises a light source, an adjustable optical attenuator, a circulator and an optical detector;
the first output end of the optical path transmission circuit is connected with the upper computer, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide to be detected, and the other end of the trunk is respectively connected with one end of a first fork and one end of a second fork of the Y waveguide to be detected; the other end of the first branch is connected with a first port of the first multi-channel optical switch, and a second port of the first multi-channel optical switch is connected with a first port of the optical path conversion device; the other end of the second fork is connected with a first port of the second multi-channel optical switch; a second port of the second multi-channel optical switch is connected with a second port of the optical path conversion device;
the output end of the light source is connected with the input end of the variable optical attenuator, and the output end of the variable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be detected; the Y waveguide to be tested is used for dividing the light power adjusting light into a first light beam and a second light beam; the first multi-channel switch is used for transmitting the first light beam to the light path conversion device; the second multi-channel switch is used for transmitting the second light beam to the light path conversion device; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the first multi-channel switch and the second multi-channel switch are also used for transmitting the first light beam after the light path is changed and the second light beam after the light path is changed to the Y waveguide to be tested; the Y waveguide to be tested is also used for forming the changed first light beam and the changed second light beam into a combined light beam; the circulator is also used for transmitting the combined beam to the optical detector; the light detector is used for sending the detected combined light beam to the upper computer.
Optionally, the optical path transmission apparatus further includes: a first depolarizer, a second depolarizer, and a third depolarizer;
the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; a first port of the second depolarizer is connected with the other end of the first branch; a second port of the second depolarizer is connected with a first port of the first multi-channel optical switch; the first port of the third depolarizer is connected with the other end of the second fork; and the second port of the third depolarizer is connected with the first port of the second multichannel optical switch.
A Y waveguide parameter measuring method is applied to any one Y waveguide parameter measuring instrument;
forming a sawtooth wave with a period of 4 tau according to an optical signal detected by the optical detector, wherein tau is the transition time of the Y waveguide parameter measuring instrument;
adjusting the amplitude of the sawtooth wave to enable the optical signal in the tau time period and the optical signal in the 3 tau time period to be dynamically stable, obtaining the adjusted sawtooth wave amplitude, and obtaining a half-wave voltage according to the adjusted sawtooth wave amplitude;
measuring the adjusted sawtooth amplitude over a 3 τ time period;
generating a square wave signal according to the half-wave voltage;
measuring the amplitude of the square wave signal, wherein the amplitude of the square wave signal is half of the half-wave voltage value, and the period is 4 tau;
and calculating the waveform inclination according to the amplitude of the square wave signal and the adjusted sawtooth wave amplitude.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects: the invention realizes multi-parameter measurement by arranging the variable optical attenuator, the circulator, the optical path conversion device and the upper computer and based on the measurement method of the traditional Sagnac interferometer, and has the advantages of simple measurement steps, greatly low cost and one-key full-automatic measurement.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of a Y waveguide parameter measuring instrument in embodiment 1 of the present invention;
fig. 2 is a schematic structural diagram of a Y waveguide parameter measuring instrument in embodiment 2 of the present invention;
fig. 3 is a schematic structural diagram of a Y waveguide parameter measuring instrument in embodiment 3 of the present invention;
fig. 4 is a schematic structural diagram of a Y waveguide parameter measuring instrument in embodiment 4 of the present invention;
FIG. 5 is a schematic structural diagram of a Y-waveguide parameter measurement system in embodiment 5 of the present invention;
FIG. 6 is a flowchart of a Y-waveguide parameter measurement method according to embodiment 6 of the present invention;
fig. 7 is a schematic structural diagram of the Y waveguide parameter measuring instrument and the measuring system according to the present invention.
Description of the symbols:
the device comprises an I-power supply module, an II-photoelectric component driving circuit, an III-test light path, an IV-test platform, a V-upper computer system, a VI-automatic test software module, a VII-device to be tested, a 1-light source, a 2-adjustable optical attenuator, a 3-circulator, a 4-first depolarizer, a 5-Y waveguide to be tested, a 6-second depolarizer, a 7-third depolarizer, an 8-single mode optical fiber sensing ring, a 9-optical detector, a 10-data acquisition circuit, an 11-upper computer, a 12-1-first dual-channel optical power meter, a 12-2-second dual-channel optical power meter, a 13-1-first coupler, a 13-2-second coupler, a 14-1-first polarization beam splitter, 14-2-a second polarization beam splitter, 15-a two-channel extinction ratio measuring instrument, 16-a first channel, 17-a second channel, 18-a channel N, 19-a first Y waveguide to be measured, 20-a second Y waveguide to be measured, 21-an N Y waveguide to be measured, 22-a first multi-channel optical switch, 23-a second multi-channel optical switch, 24-PBC-PBS polarization beam combiner and beam splitter, 25-a wave plate, 26-a low birefringence fiber, 27-a fiber reflector, 28-0 degree melting point, 29-90 degree melting point, A-a first shared light path and B-a second shared light path.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a Y waveguide parameter measuring instrument, a measuring system and a measuring method. The invention realizes multi-parameter measurement by arranging the variable optical attenuator, the circulator, the light path conversion device and the upper computer with frequency tracking and temperature compensation functions based on the measurement method of the traditional Sagnac interferometer, and has the advantages of simple measurement steps, greatly low cost and one-key full-automatic measurement.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Example 1
As shown in fig. 1, the Y waveguide parameter measuring instrument of the present embodiment includes: the device comprises a light source 1, an adjustable optical attenuator 2, a circulator 3, an optical detector 9, an optical path conversion device and an upper computer 11.
The output end of the light source 1 is connected with the input end of the variable optical attenuator 2, and the output end of the variable optical attenuator 2 is connected with the first port of the circulator 3; a second port of the circulator 3 is connected with one end of a trunk of the Y waveguide 5 to be tested; the other end of the trunk is respectively connected with one end of the first branch of the Y waveguide 5 to be tested and one end of the second branch of the Y waveguide 5 to be tested; the other end of the first branch is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a second port of the optical path conversion device; the third port of the circulator 3 is connected with the input end of the optical detector 9; the output end of the optical detector 9 is connected with the upper computer 11 through the data acquisition circuit 10, the upper computer software in the upper computer 11 is provided with a frequency tracking and temperature compensation system, and the drift of the central wavelength of the light source and the change of the environmental temperature directly influence the stability and the accuracy of the measurement result of the half-wave voltage parameter of the Y waveguide to be measured, so that the stability and the anti-interference capability of the light path can be further enhanced by using the upper computer with the temperature compensation function and the frequency tracking function, and the accuracy of the measurement result is improved.
The variable optical attenuator 2 is used for adjusting the power of the light input by the light source 1 to obtain light power adjusting light; the circulator 3 is used for transmitting the optical power adjusting light to the Y waveguide 5 to be tested; the Y waveguide 5 to be tested is used for dividing the optical power adjusting light into a first light beam and a second light beam; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide 5 to be tested is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed and forming a combined light beam; the circulator 3 is also used for transmitting the combined beam to the optical detector 9; the optical detector 9 is used for sending the detected combined light beam to the data acquisition circuit 10, the data acquisition circuit 10 converts the combined light beam into an electric signal and then sends the electric signal to the upper computer 11, and the upper computer 11 is used for obtaining a half-wave voltage parameter and a waveform slope parameter of the Y waveguide 5 to be detected according to the electric signal.
The optical path transformation device can be a single-mode optical fiber sensing ring 8; the other end of the first branch is connected with a first port of the single-mode optical fiber sensing ring 8; the other end of the second branch is connected with a second port of the single-mode optical fiber sensing ring 8.
The light source 1 may be a superluminescent light emitting diode.
The single mode fiber sensing ring 8 may be a 500m single mode fiber sensing ring.
As an optional implementation, the Y waveguide parameter measuring instrument further includes: a first depolarizer 4, a second depolarizer 6, and a third depolarizer 7; a first port of the first depolarizer 4 is connected with a second port of the circulator 3; a second port of the first depolarizer 4 is connected with one end of the trunk; a first port of the second depolarizer 6 is connected with the other end of the first branch; a second port of the second depolarizer 6 is connected with a first port of the optical path transformation device; a first port of the third depolarizer 7 is connected with the other end of the second branch; a second port of the third depolarizer 7 is connected to a second port of the optical path transformation device.
The measurement principle of the embodiment is as follows:
the light source 1 provides an optical carrier for generating signals, the optical carrier enters the circulator 3 through the adjustable optical attenuator 2, the first depolarizer 4 is connected to the output end of the circulator 3, decorrelation processing is carried out on the light emitted by the light source 1, the light is introduced into the input end of the Y waveguide 5 to be detected, the Y waveguide integrates the functions of polarization (detection), beam splitting and phase modulation, the transmitted light signals form polarized light through the Y waveguide 5 to be detected, the two output ends of the Y waveguide 5 to be detected are respectively connected with the second depolarizer 6 and the third depolarizer 7, coherent processing is carried out on two paths of output polarized light of the Y waveguide 5 to be detected again, and the two paths of output polarized light are transmitted in the single-mode optical fiber sensing ring 8 along opposite directions. Because of the combined beam and the polarization of the Y waveguide 5 to be detected, optical signals oppositely transmitted by the single-mode optical fiber sensing ring 8 meet at the Y waveguide to form interference waves, and the optical signals are sent to the first depolarizer 4 again for decorrelation processing, due to the particularity of the internal structure of the optical fiber circulator 3, the optical signals at the output port connected with one end of the light source 1 are blocked, the optical signals are completely output from the other end of the circulator 3 and transmitted into the detector 9, the detector 9 is used for detecting the interference optical signals and simultaneously converting the interference optical signals into electric signals, and the electric signals converted by the detector are further transmitted to the data acquisition circuit 10 for acquisition and processing of the electric signals and are transmitted to the upper computer 11.
The upper computer 11 is an important content of the whole test system, and the data acquisition and calculation method is a core part in the data processing process, mainly because the accuracy of the measurement precision mainly depends on the judgment and extraction of data in the calculation process, the higher the accuracy of effective data acquisition is, the higher the reliability of the measured result is.
In the embodiment, based on the measurement method of the traditional sagnac interferometer, a depolarizer is added to form a depolarizing light path, a circulator is connected in series to realize the functions of beam splitting and isolation, the influence of a return light signal on a light source is reduced, an adjustable optical attenuator is connected in series to realize the optical power self-adjustment of a system, and a frequency tracking and temperature compensation system of upper computer software is combined, so that the influence of coupling and birefringence inside an optical fiber ring can be greatly reduced, the optical power self-adjustment, the central wavelength of the light path and the like are realized, the stability and the anti-interference capability of the measurement light path are greatly improved, the measurement errors caused by optical power jump, central wavelength drift and frequency change caused by external environmental factors in the measurement process are reduced, the accuracy, the stability and the reliability of the measurement result are improved, and the measurement of the waveform.
Example 2
As shown in fig. 2, the present embodiment is different from the above embodiments in that the present embodiment further includes: the optical power meter comprises a first dual-channel optical power meter 12-1, a first coupler 13-1 and a second coupler 13-2, wherein the splitting ratios of the first coupler 13-1 and the second coupler 13-2 are the same.
The other end of the first branch is connected with a first port of the first coupler 13-1, and a second port of the first coupler 13-1 is connected with a first port of the optical path conversion device; the third port of the first coupler 13-1 is connected with the first input end of the first dual-channel optical power meter 12-1; the other end of the second branch is connected with a first port of the second coupler 13-2, and a second port of the second coupler 13-2 is connected with a second port of the optical path conversion device; the third port of the second coupler 13-2 is connected to the second input terminal of the first dual-channel optical power meter 12-1.
The first coupler 13-1 and the second coupler 13-2 are 2 × 2 couplers.
The test principle of the embodiment is that a Y waveguide splitting ratio measurement function is fused into a waveguide test, when an optical signal is split, polarized and modulated by a Y waveguide 5 to be tested to form two polarized light ① and ①, the two polarized light passes through a second depolarizer 6 and a third depolarizer 7 to remove parasitic interference optical signals to form optical signals ④ and ⑤, and is fused with two ends of a single-mode optical fiber sensing ring 8, the optical signal enters a single-mode optical fiber sensing ring 8 to propagate oppositely, and passes through the second depolarizer 6 and the third depolarizer 7 again to enter a 2 × coupler 13 for splitting, the two optical signals ① and ① enter a first dual-channel optical power meter 12-1 to make a contribution to the measurement of splitting ratio, the two lights entering the first dual-channel optical power meter 12-1 can accurately reflect the splitting ratio of two output lights ① and ① after passing through the Y waveguide 5 to be tested, the splitting ratio of the two output lights ① and 5964 after passing through the Y waveguide 5 to be tested can accurately reflect the same waveform of the two output light signals 5965 and the waveform of the same as the waveform of a signal after passing through a first dual-channel optical power meter 12-1 and a half-channel optical power meter 12-1, the two output light signals can be accurately measured by a half-waveguide 5, the waveform test, the waveform probe 358 and a probe 358, the waveform probe 19 can accurately obtain the same waveform attenuation curve of the waveform of the test, the waveform of the two input optical fiber probe 19, the test, the waveform of the test, the two output light signal, the waveform of the test, the waveform of the test probe 11, the waveform of the test probe 19, the test probe 11, the waveform of the test probe, the test.
The present embodiment adds the function of measuring the splitting ratio parameter on the basis of the above embodiments, so that more parameters are measured.
Example 3
As shown in fig. 3, the present embodiment is different from the above embodiments in that the present embodiment further includes: a first polarization beam splitter 14-1, a second polarization beam splitter 14-2, a second dual-channel optical power meter 12-2 and a dual-channel extinction ratio meter 15.
A first port of the first polarization beam splitter 14-1 is connected to the other end of the first branch, a second port of the first polarization beam splitter 14-1 is connected to a first port of the optical path transformation device, a third port of the first polarization beam splitter 14-1 is connected to a first input end of the second dual-channel optical power meter 12-2, and a fourth port of the first polarization beam splitter 14-1 is connected to a first input end of the dual-channel extinction ratio meter 15; a first port of the second polarization beam splitter 14-2 is connected to the other end of the second branch, and a second port of the second polarization beam splitter 14-2 is connected to a second port of the optical path transformation device; a third port of the second polarization beam splitter 14-2 is connected to the second input end of the second dual-channel optical power meter 12-2, and a fourth port of the second polarization beam splitter 14-2 is connected to the second input end of the dual-channel extinction ratio measuring instrument 15.
The first polarizing beam splitter 14-1 and the second polarizing beam splitter 14-2 are both high extinction ratio 2 × 2 polarizing beam splitters.
The test principle of the embodiment is that based on a depolarization light path scheme, an existing polarization-maintaining light path scheme is optimized and innovated, because of the functions of a Y waveguide integrated polarizer, a beam splitter and a phase modulator, the splitting, polarization and modulation of an input light signal can be realized, an optical signal output by a Y waveguide 5 to be tested enters a first polarization beam splitter 14-1 and a second polarization beam splitter 14-2 through a sum 3 and is respectively divided into 1, 0 and 1, wherein the sum enters a dual-channel extinction ratio measuring instrument 15 for detecting the extinction ratio of the Y waveguide, and 4 enters a 500m single-mode optical fiber sensing ring 8 for opposite propagation, when the optical signal passes through two polarization beam splitters 14 with high extinction ratio 2, the optical beam is divided into 2 and 5 and 6, wherein 7 and 8 enter a dual-channel optical power meter 12 for detecting the extinction ratio of the Y waveguide, returned 9 and 0 optical signals enter the Y waveguide 5 for returning through the original path, enter a detector 9 and enter a signal acquisition circuit 10 and an upper computer 11 through a circulator 3, the demodulation circuit 10 and the upper computer 11 for realizing the demodulation and the final detection of the signals, the waveform attenuation and the final detection of the Y waveguide 5 and extinction ratio of the Y waveguide 5, the waveform of the Y waveguide 5 and the dual-waveguide 5, the waveform of the dual-waveguide, the dual-fiber-based on-fiber-based on the two-fiber-based on-fiber-based on-fiber-based on the two-fiber-based extinction ratio, the two-based on-fiber-based on-fiber-based on-fiber-waveguide extinction ratio test, the two-fiber-waveguide.
The embodiment can simultaneously measure half-wave voltage, waveform slope, splitting ratio and extinction ratio.
Example 4
As shown in fig. 4, the present embodiment is different from the above embodiments in that the present embodiment further includes: PBC-PBS polarizing beam combiner and splitter 24 and waveplate 25.
The first ends of the PBC-PBS polarization beam combiner and the PBC-PBS beam splitter 24 are welded with the other end of the first fork, the second ends of the PBC-PBS polarization beam combiner and the PBC-PBS beam splitter 24 are welded with the other end of the second fork, the third ends of the PBC-PBS polarization beam combiner and the PBC-PBS beam splitter 24 are welded with one end of the wave plate 25, the two output ends of the Y waveguide 5 to be tested and the PBC-PBS polarization beam combiner and the PBC-PBS beam splitter 24 are respectively welded at 0-degree melting point 28 and 90-degree melting point 29 at 0-degree melting point, and the other end of the wave plate 25 is connected with the light path conversion device.
The optical path transformation device can be composed of a low birefringent fiber 26 and a fiber mirror 27; one end of the low birefringent fiber 26 is connected to the other end of the wave plate 25, the fiber mirror 27 is disposed at the other end of the low birefringent fiber 26, and the fiber mirror 27 is configured to reflect light entering from one end of the low birefringent fiber 26 back to the wave plate 25.
The wave plate 25 may be a λ/4 plate while being fusion-spliced at 45 ° to one end of the low birefringent fiber 26.
The low birefringent optical fiber 26 is a 250m low birefringent optical fiber.
The embodiment provides a reflective guide tester, so as to realize a test scheme with strong anti-interference capability and low cost, the optical signal of the embodiment is split, polarized and modulated by a Y waveguide 5 to be tested to form polarized light, but the Y waveguide chip only works in one polarization mode, two orthogonal polarization modes can be obtained after 0-degree welding and 90-degree welding are respectively carried out on the Y waveguide chip, a PBC-PBS polarization beam combiner and a PBC-PBS beam splitter 24, two orthogonal linearly polarized light beams are combined into one beam at the same time, circularly polarized light is formed by a 45-degree welded lambda/4 wave plate and enters a 250m low-birefringence fiber, when the optical signal is transmitted to the optical fiber reflector 27, due to the reflection effect of the optical fiber reflector 27, the optical signal returns along the original path and passes through a 45-degree welded lambda/4 wave plate again, the circularly polarized light optical signal transmitted by the 250m low-birefringence fiber 26 is converted into a circularly polarized light, the linear polarization light enters the PBC-PBS polarization beam combiner and the beam splitter 24 to be divided into two orthogonal polarization modes and is transmitted to the two input ends of the Y waveguide, the two paths of light signals return in the original path, enter the detector 9 through the circulator 3, enter the signal acquisition circuit 10 and the upper computer 11, the acquisition and the processing of the signals are realized, and finally the test of parameters such as half-wave voltage, waveform inclination and the like of the Y waveguide 5 to be tested is realized.
The embodiment can realize the measurement of half-wave voltage parameters and waveform slope parameters, and has strong anti-interference capability and lower cost.
Example 5
As shown in fig. 5, the Y-waveguide parameter measuring system includes: the device comprises a first multi-channel optical switch 22, a second multi-channel optical switch 23, an optical path conversion device, an upper computer 11 and a plurality of optical path transmission circuits; the optical path transmission circuit includes: a light source 1, an adjustable optical attenuator 2, a circulator 3 and a light detector 9.
The first output end of the optical path transmission circuit is connected with the upper computer 11, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide 5 to be detected, and the other end of the trunk is respectively connected with one end of a first fork and one end of a second fork of the Y waveguide 5 to be detected; the other end of the first branch is connected to a first port of the first multi-channel optical switch 22, and a second port of the first multi-channel optical switch 22 is connected to a first port of the optical path transformation device; the other end of the second branch is connected with a first port of the second multi-channel optical switch 23; and a second port of the second multi-channel optical switch 23 is connected with a second port of the optical path conversion device.
The output end of the light source 1 is connected with the input end of the variable optical attenuator 2, and the output end of the variable optical attenuator 2 is connected with the first port of the circulator 3; the second port of the circulator 3 is connected with one end of the trunk; the third port of the circulator 3 is connected with the input end of the optical detector 9; the output end of the optical detector 9 is connected with the upper computer 11 through a data acquisition circuit 10.
The variable optical attenuator 2 is used for adjusting the power of the light input by the light source 1 to obtain light power adjusting light; the circulator 3 is used for transmitting the optical power adjusting light to the Y waveguide 5 to be tested; the Y waveguide 5 to be tested is used for dividing the optical power adjusting light into a first light beam and a second light beam; the first multi-channel switch is used for transmitting the first light beam to the light path conversion device; the second multi-channel switch is used for transmitting the second light beam to the light path conversion device; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the first multichannel switch and the second multichannel switch are also used for transmitting the first light beam after the light path is changed and the second light beam after the light path is changed to the Y waveguide 5 to be tested; the Y waveguide 5 to be tested is also used for forming the changed first light beam and the changed second light beam into a combined light beam; the circulator 3 is also used for transmitting the combined beam to the optical detector 9; the optical detector 9 is used for sending the detected combined light beam to the data acquisition circuit 10, and the data acquisition circuit 10 converts the combined light beam into an electric signal and sends the electric signal to the upper computer 11; the upper computer 11 is used for obtaining a half-wave voltage parameter and a waveform slope parameter of the Y waveguide 5 to be detected according to the electric signal.
The single mode fiber sensing ring 8 may be a 500m single mode fiber sensing ring.
As an optional implementation manner, the optical path transmission device in the Y waveguide parameter measurement system further includes: a first depolarizer 4, a second depolarizer 6, and a third depolarizer 7.
A first port of the first depolarizer 4 is connected with a second port of the circulator 3; a second port of the first depolarizer 4 is connected with one end of the trunk; a first port of the second depolarizer 6 is connected with the other end of the first branch; a second port of the second depolarizer 6 is connected to a first port of the first multi-channel optical switch 22; a first port of the third depolarizer 7 is connected with the other end of the second branch; a second port of the third depolarizer 7 is connected to a first port of the second multi-channel optical switch 23.
The multi-channel waveguide test parameter measuring system provided by the embodiment realizes the rapidness and high efficiency of the measuring process, the multi-channel waveguide tester shares a set of optical fiber sensing ring, a signal acquisition circuit and an upper computer 11 system, the light source 1, the adjustable optical attenuator 2, the circulator 3, the first depolarizer 4, the second depolarizer 6, the third depolarizer 7 and the optical detector 9 of each channel are mutually independent, the multi-channel waveguide tester decorrelates two output ends of each Y waveguide 5 to be tested through the depolarizer and then respectively connects with the first multi-channel optical switch 22 and the second multi-channel optical switch 23, two outputs of the multi-channel optical switch are respectively welded with two ends of the single-mode optical fiber sensing ring 8, because of the switching function of the multi-channel optical switch, the light of each channel can sequentially enter the shared single-mode sensing ring 24 to be oppositely propagated and then returns to each input channel through the multi-channel optical switch again, the optical signal returns in the original path, enters the detector 9 through each channel circulator 3, enters the data acquisition circuit 10 and the upper computer 11, realizes the demodulation and processing of the signal, and finally realizes the test of parameters such as half-wave voltage, waveform inclination and the like of the Y waveguide 5 to be tested of each channel.
The measurement system of this embodiment adds the depolarizer at traditional optical interferometer ring structure and forms the depolarization light path, the function of beam splitting and isolation is realized to the series circulator 3, reduce the influence of return light signal to light source 1, the series adjustable optical attenuator 2 realizes the luminous power self-adjustment of system, simultaneously, combine frequency tracking and temperature compensation system to realize the stability of light path luminous power, and strengthen its interference killing feature, reduce the luminous power jump that causes by external environment factor in the measurement process, central wavelength drift, the measuring error that frequency variation caused, with the accuracy that improves the measuring result, stability and reliability, and utilize multichannel photoswitch to realize can measuring a plurality of Y wave guides that await measuring simultaneously.
Example 6
As shown in fig. 6, the present embodiment provides a method for measuring Y waveguide parameters:
s1: the test system transit time τ.
S2: and outputting the waveform self-diagnosis.
And judging whether the waveform of the optical signal detected by the optical detector is abnormal or not.
S3: if the abnormal condition exists, the test is stopped, and the upper computer software gives an abnormal alarm.
S4: if normal, a 4 τ cycle sawtooth wave is generated, and the process proceeds to S5.
S5: and adjusting the amplitude of the sawtooth wave to align the output voltage stable point in the period tau with the output voltage stable point in the period 3 tau, even if the optical signal in the period tau and the optical signal in the period 3 tau are dynamically stable.
S6: and calculating the half-wave voltage at the moment, measuring the sawtooth wave amplitude v2 in a 3 tau time period, buffering data, and entering S10.
S7: and generating a square wave signal according to the half-wave voltage.
S8: the amplitude v1 of the square wave signal at this time is measured, the amplitude of the square wave signal is half of the half wave voltage, and the period is 4 tau.
S9: the waveform slopes are calculated from v1 and v2, and data buffering is performed, proceeding to S10.
S10: and (6) optimizing the data and entering S11.
S11: and displaying and storing.
The present embodiment can achieve simultaneous measurement of the half-wave voltage and the slope of the waveform by adjusting the waveform of the optical signal detected by the photodetector to a sawtooth wave and calculating the half-wave voltage, the amplitude v2 of the sawtooth wave in the 3 τ period, and the amplitude v1 of the square wave signal.
The technical scheme adopted by the invention is a waveguide tester based on a depolarization light path scheme. Fig. 7 is a schematic diagram of the composition of the Y waveguide parameter measuring instrument and the measuring system of the present invention, and as shown in fig. 7, the present invention mainly includes a power supply module i, a photoelectric component driving circuit ii, a test optical path iii, a test platform iv, an upper computer v, and automatic test software vi. The power supply module I supplies power for the testing system, the light source control circuit II realizes constant current control of light source driving current and constant temperature control of working temperature, the testing light path III and the device to be tested are welded to form an optical interferometer, the testing platform IV realizes original collection of output voltage of a detector in the light path, meanwhile, modulation signals are applied to the device to be tested, and one-key full-automatic measurement of the Y waveguide device to be tested is realized through the upper computer system V and the automatic testing software module VI.
The Y waveguide tester based on the depolarization light path is characterized in that a Y waveguide is connected to a connecting port, equipment is started, a starting key is clicked in an upper computer system, the upper computer system sends an instruction, a control and signal acquisition circuit completes modulation, judgment and acquisition of signals, the signals are transmitted to automatic test software to further complete a data processing process, parameters such as transit time, half-wave voltage and waveform slope of the Y waveguide to be tested are output together, a full-automatic test process of waveguide testing is completed, and the test process is convenient, concise and easy to operate.
The invention has the following innovation points:
innovation points 1: this measuring apparatu combines the depolarization light path in traditional optical interferometer structure, can effectively restrain the polarization error, and compares with existing polarization maintaining light path test scheme, and this scheme need not do the problem of extension processing to original light path tail optical fiber after not involving repetitious usage in the testing process, and the testing process is convenient, and operating procedure is simple.
Innovation points 2: the adjustable optical attenuator is connected in series in the depolarization light path to realize the self-adjustment of the optical power, stabilize the optical power and the center wavelength of the light path and prevent the measurement error caused by the drift of the center wavelength of the light source.
Innovation points 3: and a circulator is connected in series in the depolarization light path to isolate the influence of light returned in the transmission process on the central wavelength of the light source.
Innovation points 4: frequency tracking and temperature compensation functions are added in the upper computer system, real-time monitoring and calibration of all parameters are achieved, stability and anti-interference capability of a light path are further enhanced, and accuracy of a measuring result is improved.
Innovation points 5: on the basis of realizing the function of measuring half-wave voltage by the waveguide tester, the function of measuring the wave form inclination and the splitting ratio is added, so that multifunctional, high-efficiency, low-cost and other one-click full-automatic measurement of the waveguide tester is realized.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (10)
1. A Y-waveguide parameter measuring instrument, comprising: the device comprises a light source, an adjustable optical attenuator, a circulator, an optical detector, a light path conversion device and an upper computer;
the output end of the light source is connected with the input end of the variable optical attenuator, and the output end of the variable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk of the Y waveguide to be tested; the other end of the trunk is connected with one end of a first branch of the Y waveguide to be tested and one end of a second branch of the Y waveguide to be tested respectively; the other end of the first branch is connected with a first port of the optical path conversion device; the other end of the second branch is connected with a second port of the optical path conversion device; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be detected; the Y waveguide to be tested is used for dividing the light power adjusting light into a first light beam and a second light beam; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the Y waveguide to be tested is also used for receiving the first light beam after the light path is changed and the second light beam after the light path is changed and forming a combined light beam; the circulator is also used for transmitting the combined beam to the optical detector; the light detector is used for sending the detected combined light beam to the upper computer.
2. The Y-waveguide parameter measuring instrument according to claim 1, wherein the optical path transformation device is a single-mode fiber sensing ring; the other end of the first branch is connected with a first port of the single-mode optical fiber sensing ring; and the other end of the second fork is connected with a second port of the single-mode optical fiber sensing ring.
3. A Y waveguide parameter gauge according to claim 1, further comprising: a first depolarizer, a second depolarizer, and a third depolarizer; the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; a first port of the second depolarizer is connected with the other end of the first branch; a second port of the second depolarizer is connected with a first port of the optical path transformation device; the first port of the third depolarizer is connected with the other end of the second fork; and the second port of the third depolarizer is connected with the second port of the optical path transformation device.
4. A Y waveguide parameter gauge according to claim 1 or 3, further comprising: the optical power meter comprises a first double-channel optical power meter, a first coupler and a second coupler, wherein the splitting ratios of the first coupler and the second coupler are the same;
the other end of the first branch is connected with a first port of the first coupler, and a second port of the first coupler is connected with a first port of the optical path conversion device; the third port of the first coupler is connected with the first input end of the first dual-channel optical power meter; the other end of the second branch is connected with a first port of the second coupler, and a second port of the second coupler is connected with a second port of the optical path conversion device; and the third port of the second coupler is connected with the second input end of the first dual-channel optical power meter.
5. A Y waveguide parameter gauge according to claim 1, further comprising: the device comprises a first polarization beam splitter, a second double-channel optical power meter and a double-channel extinction ratio measuring instrument;
a first port of the first polarization beam splitter is connected with the other end of the first branch, a second port of the first polarization beam splitter is connected with a first port of the optical path conversion device, a third port of the first polarization beam splitter is connected with a first input end of the second dual-channel optical power meter, and a fourth port of the first polarization beam splitter is connected with a first input end of the dual-channel extinction ratio measuring instrument; a first port of the second polarization beam splitter is connected with the other end of the second fork, and a second port of the second polarization beam splitter is connected with a second port of the optical path transformation device; and a third port of the second polarization beam splitter is connected with a second input end of the second dual-channel optical power meter, and a fourth port of the second polarization beam splitter is connected with a second input end of the dual-channel extinction ratio measuring instrument.
6. A Y waveguide parameter gauge according to claim 1, further comprising: PBC-PBS polarization beam combiner, beam splitter and wave plate;
the first ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with the other end of the first fork, the second ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with the other end of the second fork, the third ends of the PBC-PBS polarization beam combiner and the beam splitter are welded with one end of the wave plate, and the other end of the wave plate is connected with the light path conversion device.
7. The Y waveguide parameter measuring instrument according to claim 6, wherein said optical path changing means is composed of a low birefringence fiber and a fiber mirror; one end of the low-birefringence fiber is connected with the other end of the wave plate, the fiber reflector is arranged at the other end of the low-birefringence fiber, and the fiber reflector is used for reflecting light transmitted from one end of the low-birefringence fiber back to the wave plate.
8. A Y-waveguide parametric measurement system, comprising: the device comprises a first multi-channel optical switch, a second multi-channel optical switch, an optical path conversion device, an upper computer and a plurality of optical path transmission circuits; the optical path transmission circuit includes: the device comprises a light source, an adjustable optical attenuator, a circulator and an optical detector;
the first output end of the optical path transmission circuit is connected with the upper computer, the second output end of the optical path transmission circuit is connected with one end of a trunk of the Y waveguide to be detected, and the other end of the trunk is respectively connected with one end of a first fork and one end of a second fork of the Y waveguide to be detected; the other end of the first branch is connected with a first port of the first multi-channel optical switch, and a second port of the first multi-channel optical switch is connected with a first port of the optical path conversion device; the other end of the second fork is connected with a first port of the second multi-channel optical switch; a second port of the second multi-channel optical switch is connected with a second port of the optical path conversion device;
the output end of the light source is connected with the input end of the variable optical attenuator, and the output end of the variable optical attenuator is connected with the first port of the circulator; the second port of the circulator is connected with one end of the trunk; the third port of the circulator is connected with the input end of the optical detector; the output end of the optical detector is connected with the upper computer;
the adjustable optical attenuator is used for adjusting the power of the light input by the light source to obtain light power adjusting light; the circulator is used for transmitting the optical power adjusting light to the Y waveguide to be detected; the Y waveguide to be tested is used for dividing the light power adjusting light into a first light beam and a second light beam; the first multi-channel switch is used for transmitting the first light beam to the light path conversion device; the second multi-channel switch is used for transmitting the second light beam to the light path conversion device; the light path transformation device is used for changing the propagation directions of the first light beam and the second light beam; the first multi-channel switch and the second multi-channel switch are also used for transmitting the first light beam after the light path is changed and the second light beam after the light path is changed to the Y waveguide to be tested; the Y waveguide to be tested is also used for forming the changed first light beam and the changed second light beam into a combined light beam; the circulator is also used for transmitting the combined beam to the optical detector; the light detector is used for sending the detected combined light beam to the upper computer.
9. The Y-waveguide parametric measurement system of claim 8, wherein the optical path transmission device further comprises: a first depolarizer, a second depolarizer, and a third depolarizer;
the first port of the first depolarizer is connected with the second port of the circulator; the second port of the first depolarizer is connected with one end of the trunk; a first port of the second depolarizer is connected with the other end of the first branch; a second port of the second depolarizer is connected with a first port of the first multi-channel optical switch; the first port of the third depolarizer is connected with the other end of the second fork; and the second port of the third depolarizer is connected with the first port of the second multichannel optical switch.
10. A Y waveguide parameter measuring method, which is applied to the Y waveguide parameter measuring instrument according to any one of claims 1 to 7;
forming a sawtooth wave with a period of 4 tau according to an optical signal detected by the optical detector, wherein tau is the transition time of the Y waveguide parameter measuring instrument;
adjusting the amplitude of the sawtooth wave to enable the optical signal in the tau time period and the optical signal in the 3 tau time period to be dynamically stable, obtaining the adjusted sawtooth wave amplitude, and obtaining a half-wave voltage according to the adjusted sawtooth wave amplitude;
measuring the adjusted sawtooth wave amplitude within a 3 tau time period;
generating a square wave signal according to the half-wave voltage;
measuring the amplitude of the square wave signal, wherein the amplitude of the square wave signal is half of the half-wave voltage, and the period is 4 tau;
and calculating the waveform inclination according to the amplitude of the square wave signal and the adjusted sawtooth wave amplitude in the 3 tau time period.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010201236.7A CN111337052B (en) | 2020-03-20 | 2020-03-20 | Y waveguide parameter measuring instrument, measuring system and measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010201236.7A CN111337052B (en) | 2020-03-20 | 2020-03-20 | Y waveguide parameter measuring instrument, measuring system and measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111337052A true CN111337052A (en) | 2020-06-26 |
| CN111337052B CN111337052B (en) | 2024-03-22 |
Family
ID=71182488
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010201236.7A Active CN111337052B (en) | 2020-03-20 | 2020-03-20 | Y waveguide parameter measuring instrument, measuring system and measuring method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111337052B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109709384A (en) * | 2018-12-13 | 2019-05-03 | 北京航天时代光电科技有限公司 | A kind of current sensor using integrated light channel structure |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004054197A (en) * | 2002-07-23 | 2004-02-19 | Autocloning Technology:Kk | Variable characteristic photonic crystal waveguide |
| CN101571612A (en) * | 2004-02-02 | 2009-11-04 | 中国科学技术大学 | Polarization controlling encoding method, encoder and quantum key dispatching system |
| CN101886925A (en) * | 2010-05-27 | 2010-11-17 | 北京大学 | Multi-wavelength interference type optical fiber gyro based on carrier modulation |
| CN103411600A (en) * | 2013-07-24 | 2013-11-27 | 北京航空航天大学 | Method used for detecting +-pi/2 parameter of double-interference type fiber optic gyroscope based on optical path differencing operation |
| US20140176937A1 (en) * | 2011-08-18 | 2014-06-26 | Tiegen Liu | Distributed disturbance sensing device and the related demodulation method based on polarization sensitive optical frequency domain reflectometry |
| WO2014127654A1 (en) * | 2013-02-20 | 2014-08-28 | 国家电网公司 | Quasi-reciprocal reflective optical voltage sensing unit and sensing system thereof |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| CN205483251U (en) * | 2016-03-31 | 2016-08-17 | 深圳市太阳讯传感科技有限公司 | Optic fibre perimeter security protection system light path structure |
| WO2017086903A1 (en) * | 2015-11-16 | 2017-05-26 | Eospace Inc. | High-rf-frequency analog fiber-optic links using optical signal processing |
-
2020
- 2020-03-20 CN CN202010201236.7A patent/CN111337052B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004054197A (en) * | 2002-07-23 | 2004-02-19 | Autocloning Technology:Kk | Variable characteristic photonic crystal waveguide |
| CN101571612A (en) * | 2004-02-02 | 2009-11-04 | 中国科学技术大学 | Polarization controlling encoding method, encoder and quantum key dispatching system |
| CN101886925A (en) * | 2010-05-27 | 2010-11-17 | 北京大学 | Multi-wavelength interference type optical fiber gyro based on carrier modulation |
| US20140176937A1 (en) * | 2011-08-18 | 2014-06-26 | Tiegen Liu | Distributed disturbance sensing device and the related demodulation method based on polarization sensitive optical frequency domain reflectometry |
| WO2014127654A1 (en) * | 2013-02-20 | 2014-08-28 | 国家电网公司 | Quasi-reciprocal reflective optical voltage sensing unit and sensing system thereof |
| CN103411600A (en) * | 2013-07-24 | 2013-11-27 | 北京航空航天大学 | Method used for detecting +-pi/2 parameter of double-interference type fiber optic gyroscope based on optical path differencing operation |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| WO2017086903A1 (en) * | 2015-11-16 | 2017-05-26 | Eospace Inc. | High-rf-frequency analog fiber-optic links using optical signal processing |
| CN205483251U (en) * | 2016-03-31 | 2016-08-17 | 深圳市太阳讯传感科技有限公司 | Optic fibre perimeter security protection system light path structure |
Non-Patent Citations (3)
| Title |
|---|
| 仝盼盼: "光纤角速度传感器漂移与噪声抑制方法研究", 《中国优秀硕士学位论文全文数据库 信息科技辑》, no. 02, pages 135 - 151 * |
| 朱鹏飞: "一种连续波速调管发射机的设计与实现", 《中国优秀硕士学位论文全文数据库 信息科技辑》, pages 136 - 2601 * |
| 石玮琛等: "基于FPGA的分布式光纤传感器脉冲光源设计", 《数字技术与应用》, no. 12, pages 179 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109709384A (en) * | 2018-12-13 | 2019-05-03 | 北京航天时代光电科技有限公司 | A kind of current sensor using integrated light channel structure |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111337052B (en) | 2024-03-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5834933A (en) | Method for magnetooptic current measurement and magnetooptic current-measuring device | |
| US6144450A (en) | Apparatus and method for improving the accuracy of polarization mode dispersion measurements | |
| JPH026724A (en) | Method and apparatus for testing optical transmission medium | |
| CN206496890U (en) | Polarization maintaining optical fibre time delay ring test system | |
| CN207396588U (en) | A kind of all-fiber electronic current transformer | |
| CN110057544B (en) | Automatic measuring device and method for frequency response of photoelectric conversion module | |
| CN106768867B (en) | LiNbO 3 Performance detection system for phase modulator | |
| CN101968507B (en) | Optical fiber voltage sensor and adjustment method thereof | |
| CN103900680A (en) | Device and detecting method for restraining polarization crosstalk measuring noise by the adoption of light source | |
| CN106932083B (en) | Optical fiber wireless vibration sensor device based on high-intensity magnetic field background | |
| CN209764932U (en) | Polarization-detecting closed-loop all-fiber current transformer | |
| CN111337052A (en) | Y waveguide parameter measuring instrument, measuring system and measuring method | |
| CN101251560A (en) | Coupled type photoelectricity integration sensor for electric field measurement | |
| CN104280215B (en) | Dual-channel optical performance bi-directional multi-alignment-angle automatic testing device for Y waveguide | |
| CN113138302B (en) | Optical current transformer | |
| CN206556842U (en) | LiNbO3 phase-modulator performance detecting systems | |
| CN102262177A (en) | Full-optical fiber pulse current sensor | |
| JPH02118416A (en) | Optical sensor | |
| CN113804938B (en) | Optical current transformer and control method thereof | |
| JP3505669B2 (en) | Electric field sensor | |
| CN210867700U (en) | Optical time domain reflectometer | |
| CN211425818U (en) | Polarizer straight waveguide tail fiber polarization crosstalk test system | |
| CN211123023U (en) | Optical current transformer based on coupler network | |
| JPH01292263A (en) | Optical fiber current measuring apparatus | |
| CN116449078A (en) | Resonance type optical fiber current sensing system and working method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |