CN113189972A - Single chip microcomputer testing device and method - Google Patents
Single chip microcomputer testing device and method Download PDFInfo
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- CN113189972A CN113189972A CN202110611703.8A CN202110611703A CN113189972A CN 113189972 A CN113189972 A CN 113189972A CN 202110611703 A CN202110611703 A CN 202110611703A CN 113189972 A CN113189972 A CN 113189972A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
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Abstract
The invention relates to the technical field of single chip microcomputer testing, and discloses a single chip microcomputer testing device and a single chip microcomputer testing method, wherein the single chip microcomputer testing device comprises a locking seat, wherein a wiring terminal is arranged on the locking seat, and when the single chip microcomputer is placed on the locking seat, one pin of the single chip microcomputer is electrically connected with one wiring terminal; the test circuit is not electrically connected with the pins of the single chip microcomputer or the wiring terminals electrically connected with the pins of the single chip microcomputer in advance according to a fixed connection circuit, but is arranged separately from the single chip microcomputer.
Description
Technical Field
The invention relates to the technical field of single chip microcomputer testing, in particular to a single chip microcomputer testing device and a single chip microcomputer testing method.
Background
A single-chip computer is a small and perfect microcomputer system formed by integrating a plurality of functional circuits such as a central processing unit CPU with data processing capacity, a random access memory RAM, a read only memory ROM, a plurality of I/O ports, an interrupt system, a timer, a counter, a display driving circuit, a pulse width modulation circuit, a digital-to-analog conversion circuit and the like on a silicon chip by adopting a super-large scale integrated circuit technology, and is widely applied in the field of industrial control. At present, single-chip microcomputers can be divided into 8 bits, 16 bits and 32 bits, after the single-chip microcomputers are produced, specific testing devices are needed to test the single-chip microcomputers with different numbers of bits and different models, testing flexibility is low, and time consumption is high.
Disclosure of Invention
In view of the defects of the background art, the invention provides a single chip microcomputer testing device and a single chip microcomputer testing method, and aims to solve the technical problem that the existing single chip microcomputer testing device is low in testing flexibility during testing.
In order to solve the technical problems, the invention provides the following technical scheme: a single chip microcomputer testing device comprises a locking seat, wherein a wiring terminal is arranged on the locking seat, and when the single chip microcomputer is placed on the locking seat, one pin of the single chip microcomputer is electrically connected with one wiring terminal; the testing device is characterized by further comprising a power supply module and a testing circuit, wherein the power supply module supplies power to the single chip microcomputer and the testing circuit respectively, and the single chip microcomputer is electrically connected with the testing circuit through a wire.
As a further technical scheme, a power supply module outputs two paths of direct current voltages respectively, the power supply module supplies power to the single chip microcomputer and the test circuit through a change-over switch, and the change-over switch is used for selecting one path of direct current voltage to be input to the single chip microcomputer and the test circuit.
Furthermore, the amplitudes of the two direct current voltages are respectively 5V and 3V.
As a further technical scheme, the test circuit comprises one or more circuits of a common anode light-emitting diode circuit, a common cathode light-emitting diode circuit, an LCD1602 liquid crystal circuit, an LCD12864 liquid crystal circuit, a buzzer circuit, a stepping motor driving circuit, a matrix keyboard circuit, a low level trigger key group circuit, a high level trigger key group circuit, a 138 decoder circuit, an external E2PROM circuit, an infrared receiving circuit, a 2.4G wireless transceiver circuit, an LED dot matrix circuit, a temperature sensor circuit, a common anode nixie tube circuit, a common cathode nixie tube circuit, a voltage detection circuit and a current detection circuit; the single chip microcomputer is electrically connected with one or more circuits in the test circuit through a lead.
When in actual use, the single chip microcomputer is placed on the locking seat, and pins of the single chip microcomputer can be electrically connected with part of circuits in the test circuit by using a DuPont wire according to test requirements without designing a specific test device. For example, when the test circuit comprises all the circuits, if the driving capability of the single chip microcomputer is required to be tested, only the DuPont wire is needed to electrically connect the IO pin of the single chip microcomputer with the common anode light-emitting diode circuit and the LCD1602 liquid crystal circuit, the whole test flexibility is high, and the single chip microcomputer and the test circuit can be connected according to different test requirements.
A single chip microcomputer testing method applies the single chip microcomputer testing device and comprises the following steps: s1: placing the singlechip on the locking seat, and electrically connecting a test pin of the singlechip with a test circuit by using a lead according to test requirements; s2: writing a test program into the single chip microcomputer; s3: and observing whether the test circuit responds to the single chip microcomputer when the single chip microcomputer operates.
As a further technical scheme, in step S2, a plurality of test programs are sequentially written into the single chip to implement different performance tests of the single chip.
Compared with the prior art, the invention has the beneficial effects that: the testing circuit is not electrically connected with the pins of the single chip microcomputer or the wiring terminals electrically connected with the pins of the single chip microcomputer in advance according to the fixed connection circuit, but is arranged separately from the single chip microcomputer, so that when the testing is actually carried out, the testing pins of the single chip microcomputer are electrically connected with part of circuits in the testing circuit by using DuPont wires according to the testing requirements, the flexibility is high, and the testing circuit can be used for testing single chip microcomputers of different models and different digits.
Drawings
The invention has the following drawings:
FIG. 1 is a schematic structural diagram of a single chip microcomputer testing device of the invention;
FIG. 2 is a circuit diagram of the DC power supply circuit of the present invention;
FIG. 3 is a circuit diagram of the USB power supply circuit of the present invention;
FIG. 4 is a circuit diagram of an LCD12864 liquid crystal circuit according to the present invention;
FIG. 5 is a circuit diagram of an LCD1602 liquid crystal circuit according to the present invention;
FIG. 6 is a circuit diagram of the 138 decoder circuit of the present invention;
FIG. 7 is a circuit diagram of a buzzer circuit of the present invention;
FIG. 8 is a circuit diagram of a thermistor and a photoresistor of the present invention;
FIG. 9 illustrates a common anode LED circuit and a common cathode LED circuit in accordance with the present invention;
FIG. 10 is a circuit diagram of an E2PROM circuit of the present invention;
FIG. 11 is a circuit diagram of a matrix keyboard circuit of the present invention;
FIG. 12 is a circuit diagram of a stepper motor driving circuit of the present invention;
FIG. 13 is a circuit diagram of the high level trigger key bank circuit of the present invention;
FIG. 14 is a circuit diagram of a common anode nixie tube circuit of the present invention;
FIG. 15 is a circuit diagram of the voltage detection circuit of the present invention;
FIG. 16 is a circuit diagram of the current sensing circuit of the present invention;
FIG. 17 is a circuit diagram of an LED dot matrix circuit of the present invention;
fig. 18 is a circuit diagram of a 2.4G wireless transceiver circuit according to the present invention.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic views illustrating only the basic structure of the present invention in a schematic manner, and thus show only the constitution related to the present invention.
A single chip microcomputer testing device comprises a locking seat 1, wherein a wiring terminal is arranged on the locking seat 1, and when a single chip microcomputer is placed on the locking seat 1, one pin of the single chip microcomputer is electrically connected with one wiring terminal; still include power module 2 and test circuit 3, power module 2 supplies power respectively to singlechip and test circuit 3, and the singlechip passes through the wire and is connected with test circuit 3 electricity.
Referring to fig. 1, in this embodiment, the power module 1 outputs two dc voltages respectively, the amplitudes of the two dc voltages are 5V and 3V, the power module 1 supplies power to the single chip microcomputer and the test circuit through the switch K1, the switch K1 is used to select one dc voltage to be input to the single chip microcomputer and the test circuit, and the switch K1 may select a ship-shaped switch. Referring to fig. 1, a power module 1 in this embodiment includes a dc power supply circuit and a USB power supply circuit, circuit diagrams of the dc power supply circuit and the USB power supply circuit are shown in fig. 2 and fig. 3, respectively, both the dc power supply circuit and the USB power supply circuit can output 5V dc voltage and 3V dc voltage, and power can be flexibly selected by the dc power supply circuit and the USB power supply circuit.
Referring to fig. 1, in this embodiment, the testing circuit 3 includes one or more circuits of a common anode LED circuit, a common cathode LED circuit, an LCD1602 liquid crystal circuit, an LCD12864 liquid crystal circuit, a buzzer circuit, a stepping motor driving circuit, a matrix keyboard circuit, a low level trigger key group circuit, a high level trigger key group circuit, a 138 decoder circuit, an E2PROM circuit, an infrared receiving circuit, a 2.4G wireless transceiver circuit, an LED dot matrix circuit, a temperature sensor circuit, a common anode nixie tube circuit, a common cathode nixie tube circuit, a voltage detection circuit, and a current detection circuit, the buzzer circuit can adopt a passive buzzer circuit, the voltage detection circuit can adopt a voltmeter, the current detection circuit can adopt an ammeter, the common anode nixie tube circuit and the common cathode nixie tube circuit can adopt 7 sections of 6-bit nixie tubes, and the LED lattice circuit can adopt 8 × 8LED lattices; the single chip microcomputer is electrically connected with one or more circuits in the test circuit through a lead.
In practical use, the test circuit 3 may include all the above circuits, and then a plurality of circuits may be selected from the above circuits according to test requirements to test the performance of a certain one of the single chip microcomputer, for example, when testing the driving performance of the single chip microcomputer, a dupont line may be used to make the IO pin of the single chip microcomputer electrically connect the LED dot matrix circuit, the common anode nixie tube circuit and the common cathode nixie tube circuit in sequence, or when testing whether the ic communication protocol of the single chip microcomputer is normal, the dupont line may be used to electrically connect the communication pin of the single chip microcomputer with the E2PROM circuit and the common anode light emitting diode, and when the single chip microcomputer is successfully communicated with the E2 promic, the common anode light emitting diode may be made to emit light for prompting.
In practical use, the test circuit 3 can select part of the circuits to complete one or more performance tests of the single chip microcomputer according to test requirements.
A single chip microcomputer testing method applies the single chip microcomputer testing device and comprises the following steps: s1: placing the singlechip on the locking seat, and electrically connecting a test pin of the singlechip with a test circuit by using a lead according to test requirements; s2: writing a test program into the single chip microcomputer; s3: and observing whether the test circuit responds to the single chip microcomputer or not when the single chip microcomputer operates.
When the testing method is used for detecting the power supply voltage, the grounding end of the power supply module can be respectively connected to the grounding end of the single chip microcomputer and the voltmeter by using the DuPont wire, the positive end of the power supply module is respectively connected to the power supply end of the single chip microcomputer and the voltmeter by using the DuPont wire, and the power supply voltage of the power supply module is detected by using the voltmeter.
The testing method of the invention is that when testing the port characteristic voltage turning point of the single chip, the negative pole of the adjustable stabilized voltage power supply is connected to the grounding end of the single chip, the positive pole of the adjustable stabilized voltage power supply is connected to the power end of the single chip, the ammeter is connected in series between the positive pole of the adjustable stabilized voltage power supply and the power end of the single chip, the testing IO pin of the single chip is connected to the common cathode light emitting diode circuit through the DuPont wire, the left circuit in figure 9 is the common anode light emitting diode circuit, the right circuit is the common cathode light emitting diode circuit, after the single chip is arranged on the locking seat, the testing program is written into the single chip, the testing IO pin of the single chip outputs high level signals, then the output voltage of the adjustable stabilized voltage power supply is adjusted from 0V to 5V in turn, each time 0.1V is added, when the common cathode light emitting diode is lighted, the values of the voltmeter and the ammeter at the time are recorded, then the output voltage of the adjustable stabilized voltage power supply is adjusted from 5V to 0V, every time the voltage is reduced by 0.1V, when the common cathode light-emitting diode is turned off, the values of the voltmeter and the ammeter at the moment are recorded, the port characteristic voltage turning point test of the single chip microcomputer can be completed by repeating more than three times of actions on each IO port of the single chip microcomputer, when the common cathode light-emitting diode is turned on from off or turned off from on, the voltage value displayed by the voltmeter is turning voltage, the value displayed by the ammeter is power consumption current of the single chip microcomputer, and if the value of the ammeter is between 100uA and 1mA, the normal power consumption is realized.
When the driving performance of the single chip microcomputer is tested, a DuPont wire is used for sequentially connecting the power supply module 1, the ammeter and the single chip microcomputer in series, then the DuPont wire is used for sequentially connecting a port of the single chip microcomputer with the LED dot matrix circuit, the common anode nixie tube circuit and the common cathode nixie tube circuit, then a test program is input into the single chip microcomputer, LEDs in the LED array circuit are sequentially lightened, the common anode nixie tube circuit and the common cathode nixie tube circuit are displayed from 000001 to 99999999, when the single chip microcomputer runs the test program, whether the brightness of an LED lamp in the LED array circuit, the brightness of a common anode nixie tube circuit and the brightness of a nixie tube in the common cathode nixie tube circuit are uniform or not is observed, and the value tested by the ammeter is not in a normal test interval.
According to the testing method, when the sleep current of the single chip microcomputer is tested, the power supply module 1 is connected with an ammeter in series through a DuPont wire to supply power to the single chip microcomputer, the voltmeter monitors the power supply voltage of the power supply module, the conventional sleep mode current is below 1uA, the watchdog awakening sleep mode power consumption is below 6uA, RTC (TCC) sleep awakening mode power consumption is normal below 25uA, and a conventional sleep program, a watchdog awakening sleep program and an RTC (TCC) awakening sleep program are written into the single chip microcomputer to test the sleep current of the single chip microcomputer respectively.
When the port of the single chip microcomputer is internally provided with a pull-up, a power supply module 1 supplies power to the single chip microcomputer through a DuPont wire, the port of the single chip microcomputer is connected to a low-level trigger key group circuit through the DuPont wire, a voltmeter is connected to a GND port and a key port of the single chip microcomputer in parallel, a low-level trigger key configuration program is written into the single chip microcomputer, so that one input of the IO port is set to be pulled up, the others are output, the rest are analogized until all the pull-up IO ports of the chip are tested, the voltmeter is displayed as high level when the key is not pressed, the voltmeter is displayed as low level when the key is pressed, and the current value is observed through an ammeter which is connected in series with the pull-up port to the ground: normal is when 2V is 15uA or less, 3V is 40uA or less, 4V is 75uA or less, 5V is 120uA or less, and 6V is 170uA or less.
When the port of the single chip microcomputer is internally pulled down in the test method, the power supply module supplies power to the single chip microcomputer through a DuPont wire, the port of the single chip microcomputer is connected to a high-level trigger key group circuit through the DuPont wire, a voltmeter is connected to a VCC port and a key port of the single chip microcomputer in parallel, a high-level trigger key configuration program is written into the single chip microcomputer, so that the IO port is set to be input on and pulled down at one position, and the others are output. And so on until all the pull-down IO ports of the chip are tested. The voltmeter shows low level when the key is not pressed, and shows high level when the key is pressed. The pull-down port observes the current value for the VCC series ammeter: normal when 2V is 8uA or less, 3V is 20uA or less, 4V is 40uA or less, 5V is 60uA or less, and 6V is 85uA or less;
when the built-in E2PROM is tested, a power supply module is connected with an ammeter in series through a DuPont wire to supply power to a single chip microcomputer, a port of the single chip microcomputer is connected to a high-level trigger key group circuit and a common anode light emitting diode circuit through the DuPont wire, one path of IO port of the single chip microcomputer is set to be key input, 3 paths of IO ports are output to led, when a key is pressed once, 1 path of led lights are on, the single chip microcomputer writes data to the E2PROM, after the key is pressed twice, two paths of led lights are on, the single chip microcomputer writes data to the E2PROM, after the key is pressed three times, three paths of led lights are on, the single chip microcomputer writes data to the E2PROM, when the key is pressed twice, the power failure is re-on to detect whether the key is pressed secondarily pressed, when the key is pressed for three times, the power failure is re-on to detect whether the key is pressed for three times, and whether the value of the ammeter is between 100uA and 2mA during testing.
When testing the LCD section output resource of the single chip, the power module series-connects the ammeter through the DuPont wire and then supplies power to the single chip, the LCD port of the single chip is connected to the LCD1602 LCD circuit and the LCD12864 LCD circuit in turn through the DuPont wire, the io port is connected to the matrix keyboard circuit through the DuPont wire, the matrix keyboard is a 4 x 4 matrix keyboard which is respectively corresponding to 0 to 9, plus, -minus, -plus and-minus, and-plus, and inputs the testing program into the single chip to initialize the white screen, so that the LCD1602 LCD and the LCD12864 LCD screen do not display, then, the matrix keyboard is scanned by the simple computer keyboard scanning program, the random combination operation (example: 1+1 ═ 2) corresponding to the key pressing is displayed on the LCD screen, whether the LCD section output resource of the single chip microcomputer is qualified or not is judged by observing whether the corresponding display of the LCD screen pressed by the key is complete or not, whether the brightness is uniform or not and whether the display value of the ammeter is in a normal interval or not;
when testing square wave pulse signals sent by an IO port of a single chip microcomputer in a time sequence, a power supply module is connected with a voltmeter in parallel through a DuPont wire to supply power to the single chip microcomputer, the IO port of the single chip microcomputer is connected with a stepping motor driving module and a common cathode light emitting diode circuit through the DuPont wire, the common anode light emitting diode circuit comprises a green led lamp, a yellow led lamp and a red led lamp, the IO port is connected to a low level trigger key through the DuPont wire, the single chip microcomputer is placed (an IO port connected with a key is used as an input, an IO port connected with the motor driving module and the common cathode light emitting diode circuit is used as an output, a first key is pressed to rotate forwards, the green led lamp is lightened, a second key is pressed to stop, the yellow led lamp is lightened, a third key is pressed to rotate backwards, the pressing rotating speed of the red led lamp is reduced by one gear, the pressing rotating speed of a fifth key is increased by one gear (5 gears altogether), and whether the corresponding action of pressing the key is normal work or not, observing whether the voltmeter is started directly and fluctuates when the rotating speed is increased, wherein the fluctuation is normal when the voltmeter is not fluctuated;
when the output frequency square wave performance of the single chip microcomputer is tested, a power supply module supplies power to the single chip microcomputer through a DuPont line, an io port of the single chip microcomputer is connected to a buzzer circuit through the DuPont line, the single chip microcomputer (the io port of the single chip microcomputer outputs square wave frequency to play a simple music program) is placed, and when an oscilloscope does not exist, whether the output frequency square wave performance of the single chip microcomputer is qualified or not is judged through the fact that whether sound played by the buzzer is obviously abnormal or not;
when the method is used for testing the LDO reference anti-interference performance of the built-in RC oscillator of the single chip microcomputer, a power supply module supplies power to the single chip microcomputer through a DuPont wire, an io port of the single chip microcomputer is connected to an infrared receiving circuit and a 138 decoder circuit through the DuPont wire, the single chip microcomputer is placed (a remote controller controls an LED in the 138 decoder circuit to act), and the remote controller is pressed down to observe whether the corresponding LED normally works;
when an ic communication protocol of a single chip microcomputer is tested, a power supply module is connected with an ammeter in series through a DuPont wire to supply power to the single chip microcomputer, a port of the single chip microcomputer is connected to an E2PROM circuit, a high-level trigger key group circuit and a common anode light emitting diode circuit through the DuPont wire, one IO port of the single chip microcomputer is set as key input, a three-position IO port is set as LED output, when a key is pressed once, 1 LED lamp is on, the single chip microcomputer writes data to the E2PROM, after the key is pressed twice, two LEDs are on, the single chip microcomputer writes data to the E2PROM, after the key is pressed three times, three LED lamps are on, the single chip microcomputer writes data to the E2PROM, when the key is pressed twice, the power failure is re-on, whether the power failure is re-on detected in a secondary pressing state, and when the key is pressed three times, the power failure is re-on, whether the power failure is detected in a tertiary pressing state; in the whole process, whether the single chip microcomputer can normally carry out ic communication is judged by observing whether the value of the ammeter in the test is in a normal interval;
when the method of the invention is used for testing the serial port resource of the singlechip; the power module supplies power to the single chip microcomputer through a DuPont wire parallel voltmeter, a serial port of the single chip microcomputer is connected to an external 2.4G wireless transceiving circuit through a DuPont wire, an io port of the single chip microcomputer is connected with a stepping motor driving circuit and a common cathode light emitting diode circuit, the common cathode light emitting diode circuit comprises a green led lamp, a yellow led lamp and a red led lamp, the single chip microcomputer is placed, the single chip microcomputer sends motor forward rotation, stop, reverse rotation, acceleration and deceleration instructions by using a remote controller, the green led lamp is turned on when the single chip microcomputer receives the motor forward rotation instructions, the yellow led lamp is turned on when the single chip microcomputer receives the motor stop instructions, and the red led lamp is turned on when the single chip microcomputer receives the motor reverse rotation instructions. When the remote controller is pressed down, whether the serial port resource of the singlechip is qualified or not is judged by observing whether the light-emitting condition of the common cathode light-emitting diode circuit and the display value of the voltmeter fluctuate when the motor increases the rotating speed;
when the adc resource of the single chip microcomputer is tested, the power supply module supplies power to the single chip microcomputer through a DuPont line, the single chip microcomputer is connected to an LCD12864 liquid crystal circuit through the DuPont line, an ad channel of the single chip microcomputer is selected, internal references of 2V, 3V, 4V and VDD are selected, the input voltage of the channel is gradually increased to 5000mV from 5mV, 5mV is increased every time, and the hexadecimal values of eight high bits and four low bits collected by each step are displayed on an LCD12864 liquid crystal screen. And each ad acquisition channel needs to select internal references 2V, 3V, 4V and VDD, each step acquires for 4 times, and the like until each ad acquisition channel of the tested singlechip is tested. And if the error range of the acquired value and the input value is one thousandth, the adc resource of the single chip microcomputer is qualified. In addition, in this embodiment, the test circuit 3 further includes a circuit diagram of the thermistor and the photoresistor as shown in fig. 8, and since the resistance values of the thermistor Rz and the photoresistor Rg change with the temperature and the light intensity, the adc resource of the single chip microcomputer can be tested by outputting two analog signals through the circuit shown in fig. 8.
Therefore, the invention can write a plurality of test programs into the singlechip in sequence to realize different performance tests of the singlechip, and when the different test programs are written, only the DuPont wire is used for electrically connecting the test port corresponding to the singlechip with the related test circuit.
In conclusion, the testing circuit is not electrically connected with the pins of the single chip microcomputer or the wiring terminals electrically connected with the pins of the single chip microcomputer in advance according to the fixed connection circuit, but is arranged separately from the single chip microcomputer, so that when the testing is actually carried out, the testing pins of the single chip microcomputer are electrically connected with part of circuits in the testing circuit by using DuPont wires according to the testing requirements, the flexibility is high, and the testing circuit can be used for testing single chip microcomputers of different models and different digits.
In light of the foregoing, it is to be understood that various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.
Claims (6)
1. A singlechip testing arrangement which characterized in that: the locking device comprises a locking seat, wherein a wiring terminal is arranged on the locking seat, and when the single chip microcomputer is placed on the locking seat, one pin of the single chip microcomputer is electrically connected with one wiring terminal; the testing device is characterized by further comprising a power supply module and a testing circuit, wherein the power supply module supplies power to the single chip microcomputer and the testing circuit respectively, and the single chip microcomputer is electrically connected with the testing circuit through a lead.
2. The single chip microcomputer testing device according to claim 1, wherein: the power supply module respectively outputs two paths of direct current voltages, the power supply module supplies power to the single chip microcomputer and the test circuit through a change-over switch, and the change-over switch is used for selecting one path of direct current voltage to be input to the single chip microcomputer and the test circuit.
3. The single chip microcomputer testing device according to claim 2, wherein: the amplitudes of the two paths of direct-current voltages are respectively 5V and 3V.
4. The single chip microcomputer testing device according to claim 1, wherein: the test circuit comprises one or more circuits of a common anode light-emitting diode circuit, a common cathode light-emitting diode circuit, an LCD1602 liquid crystal circuit, an LCD12864 liquid crystal circuit, a buzzer circuit, a stepping motor drive circuit, a matrix keyboard circuit, a low level trigger key group circuit, a high level trigger key group circuit, a 138 decoder circuit, an external E2PROM circuit, an infrared receiving circuit, a 2.4G wireless transceiver circuit, an LED dot matrix circuit, a temperature sensor circuit, a common anode nixie tube circuit, a common cathode nixie tube circuit, a voltage detection circuit and a current detection circuit; the single chip microcomputer is electrically connected with one or more circuits in the test circuit through a lead.
5. A single chip microcomputer testing method, which applies the single chip microcomputer testing device of any one of claims 1-4, is characterized in that: the method comprises the following steps: s1: placing the singlechip on the locking seat, and electrically connecting a test pin of the singlechip with a test circuit by using a lead according to test requirements; s2: writing a test program into the single chip microcomputer; s3: and observing whether the test circuit responds to the single chip microcomputer when the single chip microcomputer operates.
6. The single chip microcomputer testing method according to claim 5, characterized in that: in step S2, a plurality of test programs are sequentially written into the single chip microcomputer to realize different performance tests of the single chip microcomputer.
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| US20120136607A1 (en) * | 2010-11-26 | 2012-05-31 | Primax Electronics Ltd. | Method and system for testing circuit board of keys |
| CN109118916A (en) * | 2018-11-01 | 2019-01-01 | 四川工商学院 | A kind of single chip computer experiment actual training device |
| CN209499719U (en) * | 2018-12-18 | 2019-10-18 | 浙江大学城市学院 | Novel electronic sphygmomanometer control circuit |
| CN210864693U (en) * | 2019-12-12 | 2020-06-26 | 深圳市晶哲电子科技有限公司 | Simulation board for debugging single chip microcomputer |
| CN214623408U (en) * | 2021-06-02 | 2021-11-05 | 无锡矽杰微电子有限公司 | Singlechip testing arrangement |
-
2021
- 2021-06-02 CN CN202110611703.8A patent/CN113189972A/en active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04131939A (en) * | 1990-09-25 | 1992-05-06 | Tokyo Electron Ltd | Test method for one-chip cpu with built-in rom |
| US20120136607A1 (en) * | 2010-11-26 | 2012-05-31 | Primax Electronics Ltd. | Method and system for testing circuit board of keys |
| CN109118916A (en) * | 2018-11-01 | 2019-01-01 | 四川工商学院 | A kind of single chip computer experiment actual training device |
| CN209499719U (en) * | 2018-12-18 | 2019-10-18 | 浙江大学城市学院 | Novel electronic sphygmomanometer control circuit |
| CN210864693U (en) * | 2019-12-12 | 2020-06-26 | 深圳市晶哲电子科技有限公司 | Simulation board for debugging single chip microcomputer |
| CN214623408U (en) * | 2021-06-02 | 2021-11-05 | 无锡矽杰微电子有限公司 | Singlechip testing arrangement |
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