CN113189959A - Test circuit and test method of drive circuit - Google Patents
Test circuit and test method of drive circuit Download PDFInfo
- Publication number
- CN113189959A CN113189959A CN202110403326.9A CN202110403326A CN113189959A CN 113189959 A CN113189959 A CN 113189959A CN 202110403326 A CN202110403326 A CN 202110403326A CN 113189959 A CN113189959 A CN 113189959A
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- circuit
- voltage
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- feedback voltage
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
Abstract
The invention provides a test circuit of a drive circuit, belonging to the technical field of automobile engine motor controller test; the existing test equipment can not simultaneously complete the test of a voltage acquisition circuit or a resistance acquisition circuit or a switch signal acquisition circuit; the test circuit provided by the invention comprises: the device comprises a singlechip, a digital-to-analog voltage conversion chip, an analog switch, an optional resistor module, an operational amplifier circuit and a feedback voltage acquisition circuit; the test of multiplexing support three kinds of circuits simultaneously is supported, the output impedance value can be adjusted in a self-adaptive mode, and the cost is saved.
Description
Technical Field
The invention relates to the technical field of control and monitoring of automobile starting motors, in particular to a test circuit and a test method of a driving circuit.
Background
When the automobile engine electric control unit is produced and off-line, the hardware of the automobile engine electric control unit needs to be subjected to function detection, wherein the function detection comprises detection of a voltage acquisition circuit, a resistance acquisition circuit and a switching signal acquisition circuit.
At present, most manufacturers can only test a voltage acquisition circuit, a resistance acquisition circuit or a switch signal acquisition circuit independently, and can not multiplex and support the test of three circuits at the same time. Special monitoring equipment is needed for different monitoring objects, and monitoring and maintenance cost is improved.
There is a need for a circuit capable of performing a general test on a voltage acquisition circuit, a resistance acquisition circuit and a switching signal acquisition circuit, which simplifies the equipment and reduces the cost.
Disclosure of Invention
In view of the problems in the prior art, the present invention provides a test circuit for a driving circuit, comprising: the test circuit includes: the device comprises a singlechip, a digital-to-analog voltage conversion chip, an analog switch, an optional resistor module, an operational amplifier circuit and a feedback voltage acquisition circuit;
the chip machine controls the output voltage of the digital-to-analog voltage conversion chip through an SPI bus; the voltage is regulated to a proper output voltage through the operational amplifier circuit;
the proper output voltage is connected with a test point of the test circuit through the impedance and the test port selected by the analog switch and the matching resistance module;
the feedback voltage of the test point is collected by the feedback voltage collecting circuit and is transmitted back to the single chip microcomputer.
Preferably, the single chip microcomputer controls the digital-to-analog voltage conversion chip to output 0-2.5V voltage through an SPI bus, and the operational amplifier circuit regulates and outputs 0-24V voltage.
Preferably, the feedback voltage acquisition circuit includes a buffer and a voltage division circuit.
Preferably, the voltage dividing circuit includes a first resistor, an input end of the first resistor is an input end of the voltage divider, an output end of the first resistor is an output end of the voltage divider, and the output end is grounded through a parallel structure of the second resistor and the capacitor C.
Preferably, the test port includes a level acquisition port and an ADC conversion port.
The invention also provides a test method of the test circuit, which is characterized in that; the method comprises the following steps:
step (1): the single chip microcomputer outputs a specified voltage value through the digital-to-analog voltage conversion chip and the operational amplifier circuit;
step (2): the output impedance is selected through an analog switch and a matching resistor module, and the node voltage connected with the sampling circuit is collected through the feedback voltage collecting circuit;
and (3): the pulling resistance state of the sampling circuit can be measured by combining the feedback voltage value acquired by the feedback voltage acquisition circuit with the output specified voltage value, the output impedance and the circuit state of the sampling circuit;
and (4): and whether the sampling circuit of the ECU works normally can be measured according to the output voltage value of the sampling circuit and the feedback voltage value acquired by the feedback voltage acquisition circuit.
Preferably, in the step (2), when the feedback voltage value is too small or the full scale is reached, the single chip configures the analog switch to select the resistors of other gears until the feedback voltage value is in the range of the scale.
Preferably, in step (2), the impedance with a larger resistance value should be selected first.
Compared with the prior art, the invention at least has the following beneficial effects:
the invention supports the test of multiplexing and supporting three circuits simultaneously by adopting the analog switch, the selection resistor, the level acquisition port and the ADC conversion port, and can adaptively adjust the output impedance value.
Drawings
FIG. 1 is a block diagram of a test of the jet drive circuit of the present invention;
FIG. 2 is a flow chart of the testing of the present invention;
the present invention is described in further detail below. The following examples are merely illustrative of the present invention and do not represent or limit the scope of the claims, which are defined by the claims.
DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION
The technical scheme of the invention is further explained by the specific implementation mode in combination with the attached drawings.
As shown in fig. 1, it is a test block diagram of the injection driving circuit of the present invention, and the right side of the dotted line is a sampling circuit ECU of the measured controller, i.e. an automobile engine motor control unit; the sampling circuit can be an analog voltage quantity acquisition circuit, an analog resistance quantity acquisition circuit or a digital switching value acquisition circuit, the typical circuit of the three circuits is different in voltage and pulling resistance value of the resistance acquisition circuit, the pulling resistance value of resistance sampling is smaller, and the digital switching sampling is characterized in that an ECU acquisition port is mostly a level acquisition port and does not have the ADC function;
the left side of the dotted line is a hardware testing circuit which consists of a voltage output circuit, an impedance selection circuit and a feedback voltage acquisition circuit. The voltage output consists of a single chip microcomputer, a DAC (digital-to-analog voltage conversion chip) and an operational amplifier circuit, wherein the single chip microcomputer controls the DAC to output 0-2.5V voltage output through an SPI bus, and the operational amplifier circuit regulates and outputs 0-24V voltage; the impedance selection consists of an analog switch and a matching resistor, and a proper resistance value is selected by the control of a single chip microcomputer, and the resistance values are discretely distributed from 0R, 10R, 100R, 1k, 10k, 100k, 1M and infinity; the feedback voltage acquisition circuit consists of a buffer and a voltage division circuit, and a single chip microcomputer acquires node feedback voltage.
The output of the buffer is connected with the input of a voltage divider, the voltage divider comprises a first resistor, the input end of the first resistor is the input end of the voltage divider, the output end of the first resistor de is the output end of the voltage divider, and the output end of the voltage divider is grounded through a parallel structure of a second resistor and a capacitor C.
The monitoring circuit provided by the invention can support the test of multiplexing and supporting three circuits at the same time, and can adjust the output impedance value in a self-adaptive manner; and the pull-up resistance state (including pull-up or pull-down) of the measurement sampling circuit is supported.
As shown in fig. 2, which is a test flow chart of the present invention, the sampling circuit and the pull-up resistance state test method are as follows, the test circuit single chip outputs a specified voltage value through the voltage output circuit, selects the output impedance through the impedance selection circuit, and collects the node voltage connected with the ECU through the feedback voltage collection circuit.
Before the sampling circuit ECU tests, under the condition that specific parameters are unclear, impedance with large resistance value, 100k, is selected, and then output voltage and proper impedance are gradually adjusted according to the feedback voltage value, so that the feedback voltage value is located near a half range, and the condition that the sampling circuit ECU is not damaged due to overlarge divided voltage can be ensured.
When the feedback voltage value is too small or in a full range, the singlechip configures the analog switch to select the resistors of other gears until the feedback voltage value is in the range of the full range, and the singlechip configures the analog switch to select the resistor with smaller resistance value when the feedback voltage value is too small, preferably less than 1V; when the feedback voltage value is in full range, the singlechip is provided with an analog switch to select an impedance with larger resistance value, namely a pull-down impedance; in summary, the feedback voltage value should be chosen to be around half the range for easy observation and with relatively small errors.
The pull-up resistance state of the ECU can be measured by the feedback voltage value in combination with the output voltage, the output impedance, and the known ECU circuit state. Meanwhile, according to the output voltage value of the measuring circuit, the ECU can measure whether the sampling circuit of the ECU works normally or not by collecting the voltage value or the level value.
The preferred embodiments of the present invention have been described in detail, however, the present invention is not limited to the specific details of the above embodiments, and various simple modifications may be made to the technical solution of the present invention within the technical idea of the present invention, and these simple modifications are within the protective scope of the present invention.
It should be noted that the various technical features described in the above embodiments can be combined in any suitable manner without contradiction, and the invention is not described in any way for the possible combinations in order to avoid unnecessary repetition.
In addition, any combination of the various embodiments of the present invention is also possible, and the same should be considered as the disclosure of the present invention as long as it does not depart from the spirit of the present invention.
Claims (8)
1. A test circuit for a driver circuit, comprising: the test circuit includes: the device comprises a singlechip, a digital-to-analog voltage conversion chip, an analog switch, an optional resistor module, an operational amplifier circuit and a feedback voltage acquisition circuit;
the chip machine controls the output voltage of the digital-to-analog voltage conversion chip through an SPI bus; the voltage is regulated to a proper output voltage through the operational amplifier circuit;
the proper output voltage is connected with a test point of the test circuit through the impedance and the test port selected by the analog switch and the matching resistance module;
the feedback voltage of the test point is collected by the feedback voltage collecting circuit and is transmitted back to the single chip microcomputer.
2. The test circuit of claim 1, wherein: the single chip microcomputer controls the digital-to-analog voltage conversion chip to output 0-2.5V voltage through the SPI bus, and the operational amplifier circuit regulates and outputs 0-24V voltage.
3. The test circuit of claim 1, wherein: the feedback voltage acquisition circuit comprises a buffer and a voltage division circuit.
4. The test circuit of claim 3, wherein: the voltage division circuit comprises a first resistor, the input end of the first resistor is the input end of the voltage divider, the output end of the first resistor is the output end of the voltage divider, and the output end of the first resistor is grounded through a parallel structure of a second resistor and a capacitor C.
5. The test circuit of claim 1, wherein: the test port comprises a level acquisition port and an ADC conversion port.
6. A test method using the test circuit of any of claims 1-5, characterized by; the method comprises the following steps:
step (1): the single chip microcomputer outputs a specified voltage value through the digital-to-analog voltage conversion chip and the operational amplifier circuit;
step (2): the output impedance is selected through an analog switch and a matching resistor module, and the node voltage connected with the sampling circuit is collected through the feedback voltage collecting circuit;
and (3): the pulling resistance state of the sampling circuit can be measured by combining the feedback voltage value acquired by the feedback voltage acquisition circuit with the output specified voltage value, the output impedance and the circuit state of the sampling circuit;
and (4): and whether the sampling circuit of the ECU works normally can be measured according to the output voltage value of the sampling circuit and the feedback voltage value acquired by the feedback voltage acquisition circuit.
7. The test method according to claim 6, characterized in that; in the step (2), when the feedback voltage value is too small or the full scale is realized, the singlechip configures the analog switch to select the resistors of other gears until the feedback voltage value is in the range of the full scale.
8. The test method according to claim 6, characterized in that; in step (2), the impedance with a larger resistance value should be selected first.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110403326.9A CN113189959B (en) | 2021-04-15 | 2021-04-15 | Test circuit and test method of drive circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110403326.9A CN113189959B (en) | 2021-04-15 | 2021-04-15 | Test circuit and test method of drive circuit |
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| CN113189959A true CN113189959A (en) | 2021-07-30 |
| CN113189959B CN113189959B (en) | 2023-02-17 |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201004072Y (en) * | 2007-02-12 | 2008-01-09 | 上海四达电子仪表有限公司 | An automatic gear conversion and range measurement circuit |
| CN104360165A (en) * | 2014-11-26 | 2015-02-18 | 上海斐讯数据通信技术有限公司 | Multichannel resistance measuring device |
| US20160324393A1 (en) * | 2013-06-05 | 2016-11-10 | Ningbo Fotile Kitchen Ware Co., Ltd. | Rotating spray wall used in washing appartus and application thereof |
| CN206975092U (en) * | 2017-03-31 | 2018-02-06 | 上海新华电子设备有限公司 | A kind of Auto-Test System impedance voltage test device |
| CN108845240A (en) * | 2018-04-27 | 2018-11-20 | 上海电机学院 | A kind of SCM Based automatic testing circuit system |
| CN111781545A (en) * | 2020-07-10 | 2020-10-16 | 迈普通信技术股份有限公司 | Port state management circuit, method, device and readable storage medium |
-
2021
- 2021-04-15 CN CN202110403326.9A patent/CN113189959B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201004072Y (en) * | 2007-02-12 | 2008-01-09 | 上海四达电子仪表有限公司 | An automatic gear conversion and range measurement circuit |
| US20160324393A1 (en) * | 2013-06-05 | 2016-11-10 | Ningbo Fotile Kitchen Ware Co., Ltd. | Rotating spray wall used in washing appartus and application thereof |
| CN104360165A (en) * | 2014-11-26 | 2015-02-18 | 上海斐讯数据通信技术有限公司 | Multichannel resistance measuring device |
| CN206975092U (en) * | 2017-03-31 | 2018-02-06 | 上海新华电子设备有限公司 | A kind of Auto-Test System impedance voltage test device |
| CN108845240A (en) * | 2018-04-27 | 2018-11-20 | 上海电机学院 | A kind of SCM Based automatic testing circuit system |
| CN111781545A (en) * | 2020-07-10 | 2020-10-16 | 迈普通信技术股份有限公司 | Port state management circuit, method, device and readable storage medium |
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| CN113189959B (en) | 2023-02-17 |
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