CN113189395A - Multiplexing voltage drop test circuit - Google Patents
Multiplexing voltage drop test circuit Download PDFInfo
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- CN113189395A CN113189395A CN202011584875.2A CN202011584875A CN113189395A CN 113189395 A CN113189395 A CN 113189395A CN 202011584875 A CN202011584875 A CN 202011584875A CN 113189395 A CN113189395 A CN 113189395A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
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Abstract
The invention relates to the technical field of automobile wire harness testing, which is used for testing n sample monomers R1-Rn connected in series between a power supply and the ground, wherein the input end of a sample monomer Ri is connected to the input end of a switch Sai through an ith voltage divider monomer, the output end of the sample monomer Ri is connected to the input end of a switch Sbi through an (i + 1) th voltage divider monomer, the output ends of a multi-path analog switch group a and a multi-path analog switch group b are connected with the acquisition signal input end of an MCU through an amplifier, the control signal output end of the MCU is connected with the control signal input end of each switch in the multi-path analog switch group a and the multi-path analog switch group b, and i is any value from 1 to n. And a power supply does not need to be arranged in each channel, so that the cost is low, and the higher sampling frequency is ensured.
Description
Technical Field
The invention relates to the technical field of automobile wire harness testing, in particular to a multiplexing voltage drop testing circuit.
Background
With the progressive development of the automobile test standards, the requirements for the endurance test of various wire harnesses on an automobile are also more and more strict, the test requires that a large current passes through the test, and the change of the voltage drop on the wire harness in the test needs to be detected, but if a programmable power supply is used for simultaneously monitoring the voltage and the current of the wire harness, a large number of power supplies are required, under the condition that the number of samples is particularly large, hundreds of thousands of power supplies are obviously unrealistic, and the operation of engineers is greatly difficult due to the large number of test wires on the spot.
Therefore, the best approach is to connect the same test current in series to supply power, and then measure the voltage drop across each wire, usually by: firstly, with having the instrument of patrolling and examining the function, there is the relay matrix in the instrument for link to each other the sample that will measure the passageway and will differ, but use the relay and brought another problem again, the speed that the relay switches is not enough, leads to the frequency of sampling high inadequately. Secondly, a plurality of voltage sensors are used, so that the sampling frequency is high, but a new problem is caused, when the voltage drop in the middle of a series wiring harness is measured, an isolation power supply is needed to be used for each channel, thus hundreds of isolation power supply modules are added, and meanwhile, the sensors are also in a bus type, because the power supply of signals needs to be isolated by an optical coupler, the purpose of reducing the cost is not achieved. Meanwhile, the structure has low integration level and large volume.
Therefore, a new scheme is needed to implement the task of monitoring multiple voltage drops with low cost, and simultaneously, a certain sampling rate requirement needs to be met.
Disclosure of Invention
The invention aims to provide a multiplexing voltage drop test circuit aiming at the defects of the prior art, which can quickly measure the voltage drop of each sample of a series sample and has high sampling frequency and low cost.
The technical scheme of the invention is as follows: the multi-path analog switch comprises a multi-path analog switch group a, a multi-path analog switch group b, an amplifier, an MCU and a plurality of input terminals, wherein the multi-path analog switch group a and the multi-path analog switch group b respectively comprise a plurality of switches which are arranged in parallel, the switches are arranged in parallel, the second end of the ith output terminal is simultaneously connected to the ith switch of the multi-path analog switch group a and the i-1 switch of the multi-path analog switch group b, the first end of the output terminal is used for connecting the output end of one sample monomer and the input end of the next sample monomer, the output ends of the multi-path analog switch group a and the multi-path analog switch group b are connected with the acquisition signal input end of the MCU through the amplifier, and the control signal output end of the MCU is connected with the control signal input end of each switch in the multi-path analog switch group a and the multi-path analog switch group b, i is any value of 1-n, and n is the number of the sample monomers to be tested which are connected in series.
Preferably, the multi-channel analog switch further comprises a plurality of voltage dividers, wherein first fixed ends of the voltage dividers are connected with the input terminal, sliding ends of the voltage dividers are connected to the ith switch of the multi-channel analog switch group a and the (i-1) th switch of the multi-channel analog switch group b, and second fixed ends of the voltage dividers are grounded.
Preferably, the system further comprises a signal acquisition board and a plurality of multiplexing boards with the same structure, the MCU is integrated on the signal acquisition board, the voltage divider, the multiplexing analog switch group a, the multiplexing analog switch group b and the amplifier are integrated on the multiplexing board, the multiplexing board is connected with the sample through an input terminal, and the multiplexing board is connected with the signal acquisition board through a signal acquisition board input terminal.
Preferably, adjacent multiplexing boards are connected by a cascade jumper.
Preferably, a plurality of the multiplexing boards are arranged in a hierarchy.
Preferably, the output end of the multi-path analog switch group a is connected with the inverted signal input end of the amplifier, and the output end of the multi-path analog switch group b is connected with the positive signal input end of the amplifier.
Preferably, the intelligent control system further comprises a Bluetooth module and an upper computer, wherein the Bluetooth module and the MCU are integrated on one signal acquisition board, the data output end of the MCU is connected with the upper computer through the Bluetooth module, and the control signal output end of the MCU is connected with the control signal input end of each switch in the multi-way analog switch group a and the multi-way analog switch group b through the Bluetooth module.
Preferably, the device further comprises a fine tuning voltage divider, and the fine tuning voltage divider is arranged between the amplifier and the acquisition signal input end of the MCU.
Preferably, the plurality of multiplexing boards arranged in a hierarchical manner are fixed by the upright posts penetrating through four corners of the multiplexing boards, and the signal acquisition board is arranged on the topmost layer.
It is comparatively preferred, input terminal sets up in multiplexing board one side, signal acquisition board input terminal sets up in signal acquisition board homonymy corresponding position department, cascade wire jumper sets up the adjacent side of input terminal on the multiplexing board.
The invention has the beneficial effects that: the voltage of a measuring point is sampled through an input terminal, the same input terminal is not only the output end of the previous resistor but also the input end of the next resistor, the output end of the same input terminal is simultaneously connected with the ith switch of the multi-channel analog switch group a and the ith-1 switch of the multi-channel analog switch group b, a signal entering an instrument amplifier is selected through the multi-channel analog switch, the instrument amplifier amplifies the signal and samples an ADC (analog to digital converter) entering an MCU (micro control unit), the MCU controls the multi-channel analog switch to scan a channel, so that when each channel of switch is switched on, the voltage drop of a corresponding sample monomer can be measured, the data of the ADC is transmitted to an upper computer through Bluetooth to be recorded, the voltage drop of each sample of a serial sample can be rapidly measured, a relay matrix does not need to be arranged, and higher sampling frequency is guaranteed. A voltage divider is provided between the input terminals and the switches to adjust the voltage to the electrical range of the multiple analog switches and the differential instrumentation amplifier. In addition, the number of channels can be adjusted and configured according to the number of the multiplexing plates, and when a single multiplexing plate is insufficient in channel, a plurality of multiplexing plates can be cascaded, so that the method can be applied to the test of more samples. The main devices for testing are all integrated on one multiplex board, and the integration level is high. When needs expand, adopt the mode stack of level arrangement with polylith multiplexing board, realize multiplexing board quick access through input terminal and signal acquisition board input terminal, expand the convenience, the hierarchical mechanism makes the product small in size, easily places.
Drawings
FIG. 1 is a schematic circuit diagram of the present invention;
FIG. 2 is a schematic view of the connection between the multiplexing boards of the present invention;
FIG. 3 is a schematic diagram of an input terminal according to the present invention;
FIG. 4 is a schematic diagram of the input terminal and voltage divider connection of the present invention;
FIG. 5 is a schematic view showing the connection of the components of the signal acquisition board according to the present invention;
FIG. 6 is a schematic view of the input terminal of the signal acquisition board of the present invention;
FIG. 7 is a schematic diagram of the arrangement of the multiplexing board and the signal acquisition board according to the present invention;
FIG. 8 is a schematic diagram of an arrangement of four multiplexing boards and signal acquisition boards according to the present invention;
fig. 9 is a schematic diagram of an arrangement of ten multiplexing boards and a signal collecting board according to the present invention.
In the figure: 1-sample, 2-multiplexing board, 201-first multiplexing board, 202-second multiplexing board, 203-third multiplexing board, 204-fourth multiplexing board, 3-voltage divider, 4-multi-way analog switch group, 5-multi-way analog switch group b, 6-amplifier, 7-fine tuning voltage divider, 8-signal acquisition board, 9-MCU, 10-Bluetooth module, 11-upper computer, 12-input terminal, 13-signal acquisition board input terminal, 14-upright post, 15-cascade selection jump cap, 16-cascade jumper, 17-Bluetooth module connecting terminal
Detailed Description
The invention will be further described in detail with reference to the following drawings and specific examples, which are not intended to limit the invention, but are for clear understanding.
As shown in fig. 1, a multiplexed voltage drop test circuit for testing a sample 1, the sample 1 includes one or more sample groups, each of which includes n sample units R1 to Rn connected in series between a power supply and ground. The test circuit comprises a multiplexing board 2, a signal acquisition board 8 and an upper computer 11. Wherein each sample group is collected by one multiplexing board 2, and when a plurality of sample groups exist, a plurality of multiplexing boards 2 can be accessed and connected to different pins of the same MCU. The MCU9 is integrated on the signal collection board 8, the voltage divider 2, the multi-way analog switch group a4, the multi-way analog switch group b5 and the amplifier 6 are integrated on the multiplexing board 2, the multiplexing board 2 is connected to the sample through the input terminal 12 as shown in fig. 3 and 4, and the multiplexing board 2 is connected to the signal collection board 8 through the signal collection board input terminal 13. Each multiplexing board 2 has a plurality of input terminals 12, 4 in this embodiment, and any one of the input terminals may be used for connection.
The second end of the ith output terminal is simultaneously connected to the ith switch of the multi-path analog switch group a4 and the (i-1) th switch of the multi-path analog switch group b5, the first end of the output terminal is used for connecting the output end of a previous sample monomer and the input end of a next sample monomer, the output ends of the multi-path analog switch group a4 and the multi-path analog switch group b5 are connected with the acquisition signal input end of the MCU9 through the amplifier 6, the control signal output end of the MCU9 is connected with the control signal input end of each switch in the multi-path analog switch group a4 and the multi-path analog switch group b5, i is any value from 1 to n, and n is the number of the sample monomers to be tested connected in series. When i is 1, the second end of the output terminal is not connected to the switch of the multi-path analog switch group b 5. When the output terminal is the last terminal of one multiplexing board 2, in the output terminal connected to the next sample monomer in the scheme, the next sample monomer is the first sample monomer of the next multiplexing board 2.
The voltage divider 3 comprises n +1 voltage divider monomers which are arranged in parallel, a first fixed end of the voltage divider 2 is connected with the input terminal, a sliding end is connected to the ith switch of the multi-path analog switch group a4 and the ith-1 switch of the multi-path analog switch group b5, and a second fixed end is grounded.
The output end of the multi-path analog switch group a4 is connected with the inverted signal input end of the amplifier 6, and the output end of the multi-path analog switch group b5 is connected with the positive signal input end of the amplifier 6. The voltage divider 3 is a sliding resistor, the input end of the sliding resistor is connected with the input end or the output end of each sample monomer, the output end of the sliding resistor is grounded, and the sliding end of the sliding resistor is connected with the input end of the multi-path analog switch group a4 or the multi-path analog switch group b 5. The trimming voltage divider 7 also adopts a sliding resistor, two ends of which are respectively connected with the output end of the amplifier 6 and the ground, as shown in fig. 5 and 6, and the sliding terminal is connected with the acquisition signal input end of the MCU9 through a signal acquisition board input terminal 13.
Example one
Sample monomers R1-Rn in the first sample group are R1-R5, voltage divider monomers are 6, switches Sa 1-San are S1-S5, and switches Sb 1-Sbn are S6-S10. The MCU9 employs an STM32F103C8T6 chip having 10 acquisition terminals, and can acquire voltage data of 10 sample groups through 10 multiplexing boards 2, and the number of sample units in each sample group can be determined according to the maximum number of channels supported by each multiplexing board 2. For example, when one multiplexing plate 2 supports 16 channels, 16 sample cells can be connected in series within a sample group, and voltage drop data of 160 sample cells can be collected in a total of 10 multiplexing plates 2. Meanwhile, different power supplies are adopted for different sample groups, for example, the first sample group is supplied with power by adopting a power supply VCC1, and the second sample group is supplied with power by adopting a power supply VCC 2.
As shown in fig. 7, when a plurality of multiplexing boards 2 are used, the cascade selection jumper 15 is used to connect between adjacent multiplexing boards 2, for example, between a first multiplexing board 201 and a second multiplexing board 202, and between 203-a third multiplexing board and a fourth multiplexing board 204, in cooperation with the cascade jumper 16.
As shown in fig. 8 and 9, a hierarchical arrangement is adopted between the plurality of multiplexing boards 2 and the signal acquisition board 8. A plurality of multi-path boards 2 arranged in a hierarchy pass through the upright posts penetrating the four corners of the multi-path boards 2
The working principle of the circuit is as follows:
the tap in the middle of the sample is adjusted to be in the interval of 0-3.3V after being divided by the voltage divider, the MCU controls the first path (such as S1 and S6) of two multi-path analog switch groups on the multiplexing board to be closed, and the voltage sampled by dividing the voltage by the voltage divider at the two ends of R1 is connected to the differential instrument amplifier through the analog switch. The output of the amplifier is input into the ADC0 through a fine tuning voltage divider, and after the ADC is converted, the MCU reads data and sends the data to the upper computer through the Bluetooth module. The above operation was repeated for each multiplexing panel until all voltage drops of the sample cells were collected.
Those skilled in the art will appreciate that details not described herein are within the skill of those skilled in the art.
Claims (10)
1. A multiplexed voltage drop test circuit, comprising: including multichannel analog switch group a (4), multichannel analog switch group b (5), amplifier (6), MCU (9) and a plurality of input terminal, multichannel analog switch group a (4) and multichannel analog switch group b (5) all include a plurality of switch that parallelly connected set up, and a plurality of parallelly connected setting between the switch, it is ith output terminal's second end is connected to the ith switch of multichannel analog switch group a (4) and the i-1 switch of multichannel analog switch group b (5) simultaneously, output terminal's first end is used for connecting the free output of last sample and the free input of next sample, the collection signal input part that amplifier (6) and MCU (9) were passed through to multichannel analog switch group a (4), the control signal output part of MCU (9) and multichannel analog switch group a (4), The control signal input end of each switch in the multi-path analog switch group b (5) is connected, i is any value of 1-n, and n is the number of the sample monomers to be tested which are connected in series.
2. The multiplexed voltage drop test circuit of claim 1, wherein: the multi-channel analog switch is characterized by further comprising a plurality of voltage dividers (2), wherein the first fixed ends of the voltage dividers (2) are connected with the input terminal, the sliding ends are connected to the ith switch of the multi-channel analog switch group a (4) and the (i-1) th switch of the multi-channel analog switch group b (5), and the second fixed ends are grounded.
3. The multiplexed voltage drop test circuit of claim 1, wherein: the circuit board comprises a signal acquisition board (8) and a plurality of multiplexing boards (2) with the same structure, wherein the MCU (9) is integrated on the signal acquisition board (8), the voltage divider (2), the multiplexing analog switch group a (4), the multiplexing analog switch group b (5) and the amplifier (6) are integrated on the multiplexing boards (2), the multiplexing boards (2) are connected with a sample through input terminals (12), and the multiplexing boards (2) are connected with the signal acquisition board input terminals (13) and the signal acquisition board (8).
4. A multiplexed voltage drop test circuit in accordance with claim 3, wherein: the adjacent multiplexing boards (2) are connected through a cascade jumper (16).
5. A multiplexed voltage drop test circuit in accordance with claim 3, wherein: a plurality of the multiplexing boards (2) are arranged in a hierarchy mode.
6. The multiplexed voltage drop test circuit of claim 1, wherein: the output end of the multi-path analog switch group a (4) is connected with the inverted signal input end of the amplifier (6), and the output end of the multi-path analog switch group b (5) is connected with the positive phase signal input end of the amplifier (6).
7. A multiplexed voltage drop test circuit in accordance with claim 3, wherein: still include bluetooth module (10) and host computer (11), bluetooth module (10) and MCU (9) are integrated on a signal acquisition board (8), the data output end of MCU (9) passes through bluetooth module (10) and is connected with host computer (11), the control signal output end of MCU (9) passes through bluetooth module (10) and is connected with the control signal input of every switch in multichannel analog switch group a (4), multichannel analog switch group b (5).
8. The multiplexed voltage drop test circuit of claim 1, wherein: the device is characterized by further comprising a fine tuning voltage divider (7), wherein the fine tuning voltage divider (7) is arranged between the amplifier (6) and the acquisition signal input end of the MCU (9).
9. The multiplexed voltage drop test circuit of claim 5, wherein: the plurality of multiplexing boards (2) arranged in a hierarchy are fixed through upright posts penetrating through four corners of the multiplexing boards (2), and the signal acquisition board (8) is arranged on the topmost layer.
10. The multiplexed voltage drop test circuit of claim 4, wherein: the input terminal (12) is arranged on one side of the multiplexing board (2), the signal acquisition board input terminal (13) is arranged at the corresponding position on the same side of the signal acquisition board (8), and the cascade jumper (16) is arranged on the adjacent side of the input terminal (12) on the multiplexing board (2).
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| CN202011584875.2A CN113189395A (en) | 2020-12-28 | 2020-12-28 | Multiplexing voltage drop test circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011584875.2A CN113189395A (en) | 2020-12-28 | 2020-12-28 | Multiplexing voltage drop test circuit |
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| CN113189395A true CN113189395A (en) | 2021-07-30 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114354982A (en) * | 2021-12-17 | 2022-04-15 | 北京市科通电子继电器总厂有限公司 | Transient thermal resistance testing method and system and electronic equipment |
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| CN2604693Y (en) * | 2003-05-12 | 2004-02-25 | 瑞统企业股份有限公司 | Long and short needle jig structure |
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