CN113176441A - Non-contact voltage measuring device and method - Google Patents
Non-contact voltage measuring device and method Download PDFInfo
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- CN113176441A CN113176441A CN202110657172.6A CN202110657172A CN113176441A CN 113176441 A CN113176441 A CN 113176441A CN 202110657172 A CN202110657172 A CN 202110657172A CN 113176441 A CN113176441 A CN 113176441A
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- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
Abstract
The application relates to a non-contact voltage measuring method and device, and relates to the technical field of electric power testing. The non-contact voltage measuring device comprises a probe and a voltage sensing assembly, wherein the probe comprises a first probe and a second probe, the voltage sensing assembly comprises a processing unit, a voltage division capacitor and a reference signal source which are sequentially connected, and the first probe is used for being coupled with a circuit to be measured to form a first coupling capacitor; the second probe is used for being coupled with the zero line circuit to form a second coupling capacitor; the voltage sensing assembly is respectively connected with the first coupling capacitor and the second coupling capacitor to form an electric loop. The non-contact voltage measuring device has the advantages that the insulating layer of the power transmission line is not required to be damaged in the process of measuring voltage by using the non-contact voltage measuring device, and the non-contact voltage measuring device is not required to be powered off for installation, use and detachment, so that a large number of measuring points can be arranged at low labor cost, and the measuring process is not influenced by line insulation.
Description
Technical Field
The present disclosure relates to power testing technologies, and in particular, to a non-contact voltage measuring device and method.
Background
The voltage measurement is widely applied to the power system, and the accuracy, reliability, convenience and the like of the voltage measurement play an important role in fault detection and fault analysis of the power system.
Currently, the most commonly used voltage measurement technique is a voltage measurement technique based on an electromagnetic voltage transformer. The electromagnetic mutual inductor comprises a primary winding and a secondary winding, and the process of measuring voltage comprises the following steps: firstly, a high-voltage wire is powered off, then a primary winding of the electromagnetic mutual inductor is connected to the high-voltage wire, and finally the high-voltage wire is powered on, so that the primary winding of the electromagnetic mutual inductor generates current, a secondary winding of the electromagnetic mutual inductor also generates current based on the electromagnetic induction principle, and voltage information of the high-voltage wire is obtained based on the current of the secondary winding.
Among them, the primary winding and the secondary winding are both formed by winding copper wires, and thus are very heavy. The high-voltage wire is generally arranged in a high altitude far away from the ground, so a special support pier needs to be built, and then the electromagnetic transformer is hoisted to the support pier through hoisting equipment, so that a primary winding of the electromagnetic transformer can be connected to the high-voltage wire.
Therefore, the voltage measuring method based on the electromagnetic voltage transformer is complex in process and high in construction difficulty.
Disclosure of Invention
In view of the above, it is necessary to provide a non-contact voltage measuring apparatus and method.
In a first aspect:
the utility model provides a non-contact voltage measuring device, includes probe and voltage sensing subassembly, and the probe includes first probe and second probe, and voltage sensing subassembly includes processing unit and the partial pressure electric capacity and the reference signal source that connect gradually, wherein:
the first probe is used for being coupled with a circuit to be tested to form a first coupling capacitor; the second probe is used for being coupled with the zero line circuit to form a second coupling capacitor; the voltage sensing assembly is respectively connected with the first coupling capacitor and the second coupling capacitor to form an electric loop;
the processing unit is connected with the voltage division capacitor and used for acquiring waveform information of voltage on the voltage division capacitor and generating a reference signal generation instruction according to the waveform information;
the reference signal source is connected with the processing unit and used for inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage-dividing capacitor into the electric loop according to a reference signal generation instruction, and the amplitude of the first reference voltage signal is equal to that of the second reference voltage signal;
the processing unit is further used for acquiring a first current of the electric loop in the process that the reference signal source inputs a first reference voltage signal to the electric loop; after the first current is obtained, in the process that a reference signal source inputs a second reference voltage signal to the voltage division capacitor, a second current of the electric loop is obtained, and the voltage of the circuit to be tested is calculated according to the first current and the second current.
In one embodiment, the voltage sensing assembly further comprises a current detection unit, wherein:
and the current detection unit is connected in the electric loop in series, is connected with the processing unit and is used for detecting the current of the electric loop to obtain a first current in the process that the reference signal source inputs a first reference voltage signal to the voltage division capacitor and detecting the current of the electric loop to obtain a second current in the process that the reference signal source inputs a second reference voltage signal to the voltage division capacitor.
In one embodiment, the voltage sensing assembly further comprises a voltage detection unit, wherein:
and the voltage detection unit is connected with the voltage division capacitor and the processing unit and used for detecting the voltage on the voltage division capacitor and sending the voltage on the voltage division capacitor to the processing unit.
In one embodiment, the processing unit comprises an amplifying circuit, an analog-to-digital conversion circuit, a fourier transform module, and a first processing circuit, wherein,
the amplifying circuit is connected with the analog-to-digital conversion circuit, connected to two ends of the voltage dividing capacitor and used for amplifying the voltage on the voltage dividing capacitor;
the analog-to-digital conversion circuit is connected with the Fourier transform module and is used for converting the amplified voltage into a discrete digital signal and sending the discrete digital signal to the Fourier transform module;
the Fourier transform module is connected with the first processing circuit and used for carrying out spectrum analysis on the discrete digital signal to obtain waveform information of voltage on the voltage-dividing capacitor and sending the waveform information to the first processing circuit;
and the first processing circuit is used for generating a reference signal generation instruction according to the waveform information.
In one embodiment, the processing unit includes a phase lock circuit and a second processing circuit, wherein,
the phase-locked circuit is used for acquiring waveform information of the voltage on the voltage-dividing capacitor, and the waveform information comprises frequency and phase information;
and the second processing circuit is used for generating first reference data corresponding to the first reference voltage signal and second reference data corresponding to the second reference voltage signal according to the waveform information and generating a reference signal generation instruction according to the first reference data and the second reference data.
In one embodiment, the phase-lock circuit includes a phase detector, a low-pass filter, a voltage-controlled oscillator, and a feedback circuit, wherein,
the feedback circuit is used for sending a feedback signal output by the voltage-controlled oscillator to the phase detector;
a phase detector for determining a phase difference between the voltage on the voltage-dividing capacitor and the feedback signal and determining an error voltage signal based on the phase difference;
the filter is used for filtering the error voltage signal to obtain a control voltage signal;
and the voltage-controlled oscillator is used for receiving the control voltage signal, outputting a target signal based on the control voltage signal, and acquiring waveform information of the voltage on the voltage-dividing capacitor according to the waveform information of the target signal.
In one embodiment, the reference signal generation instruction carries first reference data corresponding to a first reference voltage signal and second reference data corresponding to a second reference voltage signal, the reference signal source includes a waveform generator and a third processing circuit, wherein,
the third processing circuit is used for analyzing the reference signal generation instruction to acquire the first reference data and the second reference data;
and the waveform generator is used for generating a first reference voltage signal according to the first reference data and generating a second reference voltage signal according to the second reference data after acquiring the first current.
In one embodiment, the probe includes a first surface and a second surface opposite the first surface, the second surface being electrically connected to the voltage sensing assembly.
In one embodiment, the second surface is provided with a substrate, metal traces and a sensor array,
a substrate disposed on the second surface;
the metal routing is arranged on the substrate and is electrically connected with the voltage sensing assembly;
and the sensor array is arranged on the metal wiring.
In a second aspect:
a non-contact voltage measuring method applied to the non-contact voltage measuring apparatus according to any one of the above first aspects, the method comprising:
acquiring waveform information of voltage on a voltage-dividing capacitor, and generating a reference signal generation instruction according to the waveform information;
inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor to the electric loop according to the reference signal generation instruction, and acquiring the current of the electric loop to obtain a first current;
after the first current is obtained, inputting a second reference voltage signal which has the same frequency and phase with the voltage on the voltage-dividing capacitor to the voltage-dividing capacitor according to the reference signal generation instruction, and obtaining the current of the electric loop to obtain a second current;
and calculating the voltage of the circuit to be tested according to the first current and the second current.
The non-contact voltage measuring device comprises a probe and a voltage sensing assembly, wherein the probe comprises a first probe and a second probe, the voltage sensing assembly comprises a processing unit, a voltage division capacitor and a reference signal source which are sequentially connected, and the first probe is used for being coupled with a circuit to be measured to form a first coupling capacitor; the second probe is used for being coupled with the zero line circuit to form a second coupling capacitor; the voltage sensing assembly is respectively connected with the first coupling capacitor and the second coupling capacitor to form an electric loop. The processing unit is connected with the voltage division capacitor and used for acquiring waveform information of voltage on the voltage division capacitor and generating a reference signal generation instruction according to the waveform information; the reference signal source is connected with the processing unit and used for inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage-dividing capacitor into the electric loop according to a reference signal generation instruction, and the amplitude of the first reference voltage signal is equal to that of the second reference voltage signal; the processing unit is further used for acquiring a first current of the electric circuit in the process that the reference signal source inputs a first reference voltage signal to the voltage division capacitor, acquiring a second current of the electric circuit in the process that the reference signal source inputs a second reference voltage signal to the voltage division capacitor, and calculating the voltage of the circuit to be tested according to the first current and the second current. The non-contact voltage measuring device has the advantages that the insulating layer of the power transmission line is not required to be damaged in the process of measuring voltage by using the non-contact voltage measuring device, and the non-contact voltage measuring device is not required to be powered off for installation, use and detachment, so that a large number of measuring points can be arranged at low labor cost, and the measuring process is not influenced by line insulation. The non-contact voltage measuring device has the advantages of economy, safety, whole-course live-line operation and the like, and has great practical significance.
Drawings
FIG. 1 shows a block schematic diagram of a non-contact voltage measuring device;
FIG. 2 shows a schematic electrical connection diagram of a non-contact voltage measuring device;
FIG. 3 shows a schematic diagram of an electrical circuit of the non-contact voltage measuring device during measurement;
FIG. 4 shows an equivalent circuit diagram corresponding to an embodiment of the present application;
fig. 5 is an equivalent circuit diagram of a detection circuit according to an embodiment of the present disclosure;
FIG. 6 is an equivalent circuit diagram of another detection circuit provided in the embodiments of the present application;
fig. 7 is a schematic structural diagram of a phase-locked circuit according to an embodiment of the present disclosure.
Element number description:
a processing unit: 201; second coupling capacitance: c2; a second probe: 102, and (b); first coupling capacitance: c1; a first probe: 101, a first electrode and a second electrode; a voltage sensing component: 20; a probe: 10; reference signal source: 203, voltage dividing capacitance: C.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In the prior art, for voltage detection of a power transmission line of an electric power system, a contact voltage measurement method is generally adopted, wherein the contact voltage measurement method is to connect a probe of an electromagnetic transformer with a metal wire inside the power transmission line and then measure voltage on the power transmission line based on an electromagnetic induction principle. When the probe of the electromagnetic transformer is connected with a metal wire inside a power transmission line, the power transmission line needs to be controlled to stop supplying power, and then an operator cuts an insulating sheet of a reserved measuring point on the power transmission line, so that the probe of the electromagnetic transformer is connected with the power transmission line.
When the power transmission line is erected, a measuring point needs to be reserved on the power transmission line, and an insulating layer of the measuring point is pulled out, so that various measuring devices can be conveniently connected for power measurement at a later stage. The contact voltage measurement method also depends on the reserved measurement points during measurement, so the measurement method is limited by the measurement points, and the flexibility is poor.
Meanwhile, the electromagnetic mutual inductor is formed by winding a copper wire and an electromagnet, so that the electromagnetic mutual inductor is large in size and very heavy. Meanwhile, the power transmission line is generally erected in a high altitude far away from the ground, so that a special support pier needs to be built, and then the electromagnetic transformer can be connected with the power transmission line after being installed on the support pier through hoisting equipment. This process needs a plurality of manpowers and a plurality of equipment cooperation, and the process is loaded down with trivial details, and the construction degree of difficulty is great.
In practical application, the reserved insulation sheet of the measuring point can cause insulation damage of the transmission line due to multiple damages, unsafe accidents are easy to happen, and the safety of the transmission line is reduced.
In view of the above-mentioned problems of the prior art, embodiments of the present application provide a non-contact voltage measuring device that can measure a voltage of a power transmission line without damaging an insulating layer of the power transmission line.
The non-contact voltage measuring device comprises a probe and a voltage sensing assembly, wherein the probe comprises a first probe and a second probe, the voltage sensing assembly comprises a processing unit, a voltage division capacitor and a reference signal source which are sequentially connected, and the first probe is used for being coupled with a circuit to be measured to form a first coupling capacitor; the second probe is used for being coupled with the zero line circuit to form a second coupling capacitor; the voltage sensing assembly is respectively connected with the first coupling capacitor and the second coupling capacitor to form an electric loop. The processing unit is connected with the voltage division capacitor and used for acquiring waveform information of voltage on the voltage division capacitor and generating a reference signal generation instruction according to the waveform information; the reference signal source is connected with the processing unit and used for inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage-dividing capacitor into the electric loop according to a reference signal generation instruction, and the amplitude of the first reference voltage signal is equal to that of the second reference voltage signal; the processing unit is further used for acquiring a first current of the electric circuit in the process that the reference signal source inputs a first reference voltage signal to the voltage division capacitor, acquiring a second current of the electric circuit in the process that the reference signal source inputs a second reference voltage signal to the voltage division capacitor, and calculating the voltage of the circuit to be tested according to the first current and the second current. The non-contact voltage measuring device has the advantages that the insulating layer of the power transmission line is not required to be damaged in the process of measuring voltage by using the non-contact voltage measuring device, and the non-contact voltage measuring device is not required to be powered off for installation, use and detachment, so that a large number of measuring points can be arranged at low labor cost, and the measuring process is not influenced by line insulation. The non-contact voltage measuring device has the advantages of economy, safety, whole-course live-line operation and the like, and has great practical significance.
The following describes the technical solutions of the present application and how to solve the above technical problems with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments. Embodiments of the present application will be described below with reference to the accompanying drawings.
As shown in fig. 1, fig. 1 shows a schematic block diagram of a non-contact voltage measuring apparatus, wherein the non-contact voltage measuring apparatus includes a probe 10 and a voltage sensing assembly 20, the voltage sensing assembly 20 includes a processing unit 201 and a voltage dividing capacitor C and a reference signal source 203 which are connected in sequence, and the processing unit 201 is connected with the voltage dividing capacitor C and the reference signal source 203 respectively.
Fig. 2 shows an electrical connection schematic diagram of the non-contact voltage measuring device, as shown in fig. 2, wherein the probe 10 comprises a first probe 101 and a second probe 102, the first probe being connected to the circuit to be measured, and the second probe being connected to the neutral circuit.
As shown in fig. 3, fig. 3 shows an electrical circuit schematic diagram of the non-contact voltage measuring apparatus during measurement, wherein the first probe 101 is coupled with a circuit to be measured to form a first coupling capacitor C1, the second probe 102 is coupled with a zero line circuit to form a second coupling capacitor C2, and the voltage sensing assembly 20 is connected with the first coupling capacitor C1 and the second coupling capacitor C2 respectively to form an electrical circuit. The reference signal source 203 is connected to the first probe 101, and the voltage dividing capacitor is connected to the second probe.
In the embodiment of the present application, for the first coupling capacitor C1, the metal plate in the first probe 101 is one plate of the first coupling capacitor C1, and the circuit to be tested is the other plate of the first coupling capacitor C1. For the second coupling capacitor C2, the metal plate in the second probe 102 is one plate of the second coupling capacitor C2, and the neutral circuit is the other plate of the second coupling capacitor C2. Based on the circuit principle, the first coupling capacitor C1, the voltage sensing component 20 and the second coupling capacitor C2 are electrically connected to the circuit to be tested, as shown in fig. 3. The voltage of the circuit to be tested is expressed by Us, and the frequency is power frequency and is expressed by fs. In the embodiment of the present application, the voltage sensing component 20 is connected to the first coupling capacitor C1. On the other hand, the voltage sensing component 20 is connected to the ground (neutral/ground) through a second coupling capacitor C2, thereby forming an electrical loop as shown in fig. 3.
The structure of the probe 10 will be described in detail below.
In the present embodiment, the first probe 101 and the second probe 102 have the same configuration, and the configuration of the first probe 101 will be described below by taking the first probe 101 as an example.
The first probe 101 includes a first surface and a second surface, wherein the first surface can be movably sleeved on an insulating layer of a circuit to be tested, and the second surface is disposed opposite to the first surface, electrically connected to the voltage sensing component 20, and configured to form a first coupling capacitor C1 with the first surface.
Optionally, in this embodiment of the application, a substrate, a metal trace and a sensor array are disposed on the second surface, where the substrate is disposed on the second surface; the metal routing is arranged on the substrate and electrically connected with the voltage sensing assembly; and the sensor array is arranged on the metal wiring.
Alternatively, the first probe 101 may be a cylindrical structure formed by two nested rings, and the inner side (i.e. the surface opposite to the circuit to be tested) of the cylindrical probe 10 is provided with a conductive plate, i.e. a metal electrode. The metal electrode is connected to the voltage sensing component 20; the outside of the cylindrical probe 10 may be made of an insulating material;
for the way that the first probe 101 is sleeved on the insulating layer of the circuit to be tested, optionally, the first probe 101 may adopt a clamp structure to clamp the first probe 101 on the insulating layer of the circuit to be tested; other configurations may also be employed, such as: a snap structure, etc.; it should be noted that the connection mode between the first probe 101 and the circuit to be tested is not limited in this embodiment.
The structure of the voltage sensing assembly 20 is explained in detail below.
As shown in fig. 3, in the embodiment of the present application, the first coupling capacitor C1 is connected to the reference signal source 203, the reference signal source 203 is connected to the voltage dividing capacitor C, and the voltage dividing capacitor C is connected to the second coupling capacitor C2, wherein the processing unit 201 is disposed between the reference signal source 203 and the voltage dividing capacitor C.
Optionally, the voltage-dividing capacitor may be one capacitor, or may be a plurality of capacitors connected in series and parallel, and in this embodiment, the form of the capacitor in the voltage-dividing capacitor C is not limited.
The reference signal source 203 may be a voltage signal source with adjustable frequency, or a voltage signal source with fixed output, and the form of the reference signal source 203 is not limited in this embodiment;
the processing unit 201 may be a microprocessor, an embedded processor, a dedicated digital signal processor, and the like, and the type of the processing unit 201 is not limited in this embodiment;
optionally, the voltage sensing assembly 20 in this embodiment further includes a power supply unit, where the power supply unit provides a working voltage for the processing unit 201, and the power supply unit may be a lithium battery, or may be another hardware structure capable of providing a power supply.
Optionally, in this embodiment of the application, the voltage sensing assembly 20 may further include a voltage detection unit 202, where as shown in fig. 3, the voltage detection unit 202 is connected in parallel to two ends of the voltage-dividing capacitor C, and is connected to the processing unit 201, and is configured to detect the voltage across the voltage-dividing capacitor C and send the voltage across the voltage-dividing capacitor C to the processing unit.
Optionally, in this embodiment of the application, the voltage sensing assembly 20 further includes a current detecting unit 204, where the current detecting unit 204 is connected in series in the electrical loop, and is connected to the processing unit 201, and is configured to detect a current of the electrical loop to obtain a first current in a process that the reference signal source inputs the first reference voltage signal to the voltage dividing capacitor, and detect a current of the electrical loop to obtain a second current in a process that the reference signal source inputs the second reference voltage signal to the voltage dividing capacitor.
As shown in fig. 1, the circuit to be tested and the zero line circuit are part of an electric power system, the whole electric power system is grounded, which is equivalent to grounding of one end of the circuit to be tested, and the zero line circuit is also called a ground circuit, which has a grounding protection function, so that fig. 3 can be equivalent to the circuit diagram shown in fig. 4. Wherein, the voltage to be measured of the circuit to be measured is UsFrequency of power frequency fsA first coupling capacitor C1 for dividing voltageA capacitor C, a second coupling capacitor C2, and a reference signal source 203 outputting a voltage UrFrequency of power frequency fs。
In the embodiment of the application, the processing unit is configured to acquire waveform information of a voltage across the voltage-dividing capacitor, and generate a reference signal generation instruction according to the waveform information.
The voltage dividing capacitor C is connected in parallel with the first coupling capacitor C1, and under the condition that the reference signal source 203 does not output a reference signal, the reference signal source 203 is equivalent to a conducting wire, and under the condition, the voltage on the voltage dividing capacitor C is in the same frequency and phase as the voltage of the circuit to be measured. Therefore, it can be known that the waveform information of the voltage on the voltage-dividing capacitor C can be used to reflect the waveform information of the voltage of the circuit under test. Based on this, the processing unit 201 acquires waveform information of the voltage across the voltage-dividing capacitor C, that is, acquires waveform information of the voltage of the circuit to be tested.
Optionally, the waveform information of the voltage across the voltage-dividing capacitor C includes the frequency and the phase of the voltage across the voltage-dividing capacitor C. The frequency of the voltage on the voltage-dividing capacitor is generally the power frequency.
The following describes a process of the processing unit 201 acquiring waveform information of the voltage across the voltage-dividing capacitor C:
in a first optional implementation manner, the processing unit 201 may obtain the voltage across the voltage-dividing capacitor C without the reference signal being output by the reference signal source 203, and analyze the voltage across the voltage-dividing capacitor C based on processing software preset by the processing unit 201, so as to obtain waveform information of the voltage across the voltage-dividing capacitor C.
Wherein, the process of analyzing the voltage on the voltage-dividing capacitor C comprises the following steps: and performing amplification processing and analog-to-digital conversion processing on the voltage-dividing capacitor C to obtain a converted digital signal, performing Fourier transform processing on the digital signal to obtain frequency and phase information of the digital signal, and determining waveform information of the voltage on the voltage-dividing capacitor C according to the frequency and phase information of the digital signal.
Optionally, in this embodiment of the application, the processing unit 201 may include an amplifying circuit, an analog-to-digital conversion circuit, a fourier transform module, and a first processing circuit, which are connected in sequence, where the amplifying circuit is connected to two ends of the voltage-dividing capacitor C, and may amplify the voltage on the voltage-dividing capacitor C, and the amplifying process is only embodied in amplifying the amplitude of the voltage on the voltage-dividing capacitor, and does not change the frequency and the phase. The amplified voltage may be converted from an analog signal to a discrete digital signal via an analog-to-digital conversion circuit after amplification and the discrete digital signal may be sent to a fourier transform module. The fourier transform module may perform spectrum analysis on the discrete digital signal to obtain waveform information of the voltage on the voltage-dividing capacitor, and send the waveform information of the voltage on the voltage-dividing capacitor to the first processing circuit, where the first processing circuit may generate a reference signal generation instruction according to the waveform information of the voltage on the voltage-dividing capacitor.
In a second optional implementation manner, the processing unit 201 may send preset reference data to the reference signal source 203, and optionally, the reference data is a duty ratio array. The reference signal source 203 may generate a target reference voltage signal according to the reference data after receiving the reference data, and input the target reference voltage signal into the electrical circuit. The target reference voltage signal and the voltage on the voltage-dividing capacitor C are different in frequency and phase. The processing unit 201 may then detect the voltage across the voltage dividing capacitor C in this case, resulting in a third voltage. Finally, the processing unit 201 may obtain waveform information of the voltage on the voltage-dividing capacitor C by performing signal analysis on the third voltage.
Optionally, in this embodiment of the application, the processing unit 201 includes a phase-locked circuit and a second processing circuit, where the phase-locked circuit is configured to perform frequency and phase tracking on the voltage across the voltage-dividing capacitor C to obtain waveform information of the voltage across the voltage-dividing capacitor C, and the second processing circuit is configured to generate a reference signal generation instruction according to the waveform information.
Optionally, the second processing circuit is configured to generate first reference data corresponding to the first reference voltage signal and second reference data corresponding to the second reference voltage signal according to the waveform information, and generate a reference signal generation instruction according to the first reference data and the second reference data.
The following describes a process of the processing unit 201 generating a reference signal generation instruction according to the waveform information:
the reference signal generation instruction is used to instruct the reference signal source 203 to generate the first reference voltage signal and the second reference voltage signal. The reference signal generation command also carries frequency and phase information of the voltage on the voltage-dividing capacitor C.
Optionally, in this embodiment of the application, the processing unit 201 may determine the duty ratio parameters of the square waves corresponding to the first reference voltage signal and the second reference voltage signal according to the frequency and the phase information of the voltage across the voltage-dividing capacitor C, and then carry the duty ratio parameters in the reference signal generation instruction.
After obtaining the reference signal generation instruction, the processing unit may send the reference signal generation instruction to the reference signal source.
The reference signal source is used for inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage-dividing capacitor into the electric loop according to a reference signal generation instruction.
The first reference voltage signal and the second reference voltage signal are equal in amplitude.
In the embodiment of the application, the amplitudes of the first reference voltage signal and the second reference voltage signal are smaller than the amplitude of the voltage of the circuit to be tested.
In the embodiment of the present application, an equivalent circuit when the reference signal source 203 inputs the first reference voltage signal into the electrical loop is as shown in fig. 5 (the processing unit and the voltage detection unit are not shown), and after acquiring the first current based on the circuit diagram in fig. 5, an equivalent circuit when the reference signal source 203 inputs the second reference voltage signal into the electrical loop is as shown in fig. 6 (the processing unit and the voltage detection unit are not shown).
In fig. 5, the first reference voltage signal Ur and the voltage Us to be measured have the same phase and the same frequency, and the amplitudes are not equal. In fig. 6, the second reference voltage signal Ur has the same frequency and different amplitude with the opposite phase of the voltage Us to be measured. Wherein the opposite phase means a phase difference of 180 °.
Optionally, the amplitude of the first reference voltage signal Ur is greater than 20 volts and less than or equal to 40 volts. A lower reference voltage signal may be used to measure a higher voltage to be measured, wherein the amplitude of the voltage to be measured may be, for example, 400 v to 10 kv.
In the embodiment of the present application, when the voltage across the voltage-dividing capacitor C crosses zero, the reference signal source 203 inputs the first reference voltage signal into the electrical loop, so that it can be ensured that the first reference voltage signal is in phase with the voltage of the circuit to be measured, and the second reference voltage signal is in phase-opposite to the voltage of the circuit to be measured.
Optionally, after receiving the reference signal generation instruction, the reference signal source 203 may generate the first reference voltage signal in a preset order and keep a preset time duration. And then generating a second reference voltage signal and keeping the second reference voltage signal for a preset time length.
Optionally, in this embodiment of the application, the first reference voltage signal may include a plurality of signal waves, so that the first reference voltage signal lasting in time may be generated, so that the voltage on the voltage-dividing capacitor C can be detected, and the first current can be obtained.
Optionally, in this embodiment of the application, the reference signal generation instruction carries first reference data corresponding to the first reference voltage signal and second reference data corresponding to the second reference voltage signal. The reference signal source 203 comprises a waveform generator and a third processing circuit, wherein the third processing circuit is configured to parse the reference signal generation instruction to obtain the first reference data and the second reference data; and the waveform generator is used for generating a first reference voltage signal according to the first reference data and generating a second reference voltage signal according to the second reference data after acquiring the first current.
The processing unit acquires a first current of the electric loop in the process that the reference signal source inputs a first reference voltage signal to the electric loop, acquires a second current of the electric loop after acquiring the first current in the process that the reference signal source inputs a second reference voltage signal to the voltage division capacitor, and calculates the voltage of the circuit to be measured according to the first current and the second current.
In the embodiment of the application, in the process that the reference signal source inputs the first reference voltage signal to the electrical loop, the current detection unit detects the current in the electrical loop to obtain the first current, and the first current is sent to the processing unit. And in the process that the reference signal source inputs a second reference voltage signal into the electric loop, detecting the current in the electric loop through the current detection unit to obtain a second current, and sending the second current to the processing unit.
In an alternative implementation manner, a mathematical model may be preset in the processing unit 201, and the voltage of the circuit to be tested output by the mathematical model may be obtained by inputting the first current and the second current to the mathematical model.
In another alternative implementation, the ratio of the first current to the second current may be determined as a voltage coefficient. And then calculating the voltage of the circuit to be tested according to the product of the voltage coefficient and the amplitude of the first reference voltage signal (or the second reference voltage signal).
In another alternative implementation, the ratio of the sum of the first current and the second current to the difference between the first current and the second current may be determined as a voltage coefficient. And calculating the voltage of the circuit to be tested according to the voltage coefficient and the amplitude value of the first reference voltage signal (or the second reference voltage signal).
In an alternative implementation, as shown in fig. 5, when the measured voltage Us and the first reference voltage signal U are presentrIn-phase, current of the electrical circuit (i.e. first current) I1Can be expressed as:
wherein C1 is a capacitance parameter of the first coupling capacitor C1, C2 is a capacitance parameter of the second coupling capacitor C2, fs is a common frequency, and C is a coupling parameter of the voltage dividing capacitor C.
As shown in fig. 6, when the measured voltage Us and the second reference voltage signal Ur are in opposite phase, the current of the electrical circuit (i.e. the second current) I2 can be expressed as:
combining formula (1) and formula (2) to obtain:
the first current I1 and the second current I2 are currents in an electric circuit, the capacitors C, C1 and C2 are unknown quantities, and the measured voltage Us is a required quantity.
The simultaneous equations can be further simplified as:
the voltage of the circuit to be measured can be calculated by solving the formula (3).
In the embodiment of the application, U is controlled by generating a first reference voltage signal which is in phase with the voltage on the voltage-dividing capacitor and a second reference voltage signal which is opposite to the voltage on the voltage-dividing capacitorrAnd UsHave a phase difference of 0 degree and 180 degrees, i.e. U can be constructedrAnd UsIn phase and UrAnd UsThe two states are reversed. Then calculate the voltage of the circuit to be measured based on the current in the electric loop measured under these two states, this kind of device need not to destroy the insulating layer of the circuit to be measured when measuring the voltage of the circuit to be measured, and have simple structure, low cost's characteristics, consequently can reduce the cost of carrying out voltage measurement.
In the embodiment of the application, a first reference voltage signal and a second reference voltage signal with the same frequency and phase-opposite amplitudes are sequentially input into an electric loop, so that a corresponding first current and a corresponding second current are obtained, and the voltage of a circuit to be measured is calculated through the first current and the second current. The purpose of detecting the voltage of the high-voltage transmission line through the reference signal with the smaller amplitude can be achieved.
Furthermore, the amplitude of the first reference voltage signal and the amplitude of the second reference voltage signal are smaller, so that the implementation difficulty of the non-contact voltage measurement method is reduced.
Finally, in the embodiment of the application, the voltage at any position in the power transmission line can be measured, so that the method is more flexible and convenient.
In one embodiment of the present application, as shown in fig. 7, a schematic diagram of a phase-locked circuit is shown, the phase-locked circuit includes a phase detector, a low-pass filter, a voltage-controlled oscillator, and a feedback circuit, wherein the feedback circuit is configured to send a feedback signal output by the voltage-controlled oscillator to the phase detector; a phase detector for determining a phase difference between the voltage across the voltage-dividing capacitor C and the feedback signal, and determining an error voltage signal based on the phase difference; the filter is used for filtering the error voltage signal to obtain a control voltage signal; and the voltage-controlled oscillator is used for receiving the control voltage signal and outputting a target signal based on the control voltage signal. Based on the characteristic that the phase-locked circuit has phase lock, the target signal can be used for reflecting the frequency and phase information of the voltage on the voltage-dividing capacitor C, so that the waveform information of the voltage on the voltage-dividing capacitor C can be obtained according to the waveform information of the target signal.
The basic working process of the phase-locked circuit is as follows: the phase detector is used for comparing the phase deviation of the input signal and the feedback signal and generating an error voltage Vc (t). The high frequency components (including the high frequency components in the noise) in the error voltage are filtered by the low pass filter to form the control voltage vd (t). Under the action of the control voltage, the frequency and the phase of the voltage-controlled oscillator gradually approach the frequency and the phase of the loop input signal. If the frequency of the voltage-controlled oscillator can be changed to be the same as the frequency of the input signal, the voltage-controlled oscillator will be stabilized at the frequency under the condition that the stability condition is satisfied. After the circuit is stabilized, the frequency difference between the input signal and the output signal of the voltage-controlled oscillator is zero, the phase difference does not change along with the time, the error voltage is a fixed value, and then the circuit enters a locking state. When locked, the voltage-controlled oscillator enables the frequency of the output signal to follow the frequency change of the input signal, and the input signal and the output signal keep synchronous. This is the process of the signal synchronization circuit.
At present, the frequency of the voltage in the transmission line is generally 50Hz power frequency, but the voltage fluctuates up and down. In order to generate a trigger pulse that is strictly synchronized with the grid frequency, grid frequency tracking must be performed. For this reason, the grid frequency also needs to be tracked.
In one embodiment of the present application, there is provided a non-contact voltage measuring method based on the above non-contact voltage measuring apparatus, the method including:
and acquiring waveform information of the voltage on the voltage-dividing capacitor, and generating a reference signal generation instruction according to the waveform information. And inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage division capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage division capacitor into the electric loop according to the reference signal generation instruction. The first reference voltage signal and the second reference voltage signal are equal in amplitude. The method comprises the steps that a first current of an electric loop is obtained in the process that a reference signal source inputs a first reference voltage signal to the electric loop, a second current of the electric loop is obtained by a processing unit in the process that a reference signal source inputs a second reference voltage signal to a voltage division capacitor, and the voltage of a circuit to be measured is calculated according to the first current and the second current.
In this embodiment of the application, the processing unit may control the reference signal source to input a third reference signal into the electrical loop, and optionally, the third reference signal is a null signal. The amplitude of the third reference signal is 0, and the reference signal source can be considered to be short-circuited, in which case the voltage on the voltage-dividing capacitor can be measured by the voltage detection unit. And then obtaining the waveform information of the voltage on the voltage division capacitor by carrying out signal analysis on the voltage division capacitor. Then, when the phase of the voltage on the voltage-dividing capacitor crosses zero, a first reference voltage signal can be input, and the same-frequency and same-phase amplitude values of the first reference voltage signal and the voltage of the circuit to be tested are not equal. The first reference voltage signal is input into the electric loop and kept for a preset time, and in the process, the current of the electric loop can be obtained to obtain the first current. After the first current is obtained, the reference voltage source may then generate a second reference voltage signal, and input the second reference voltage signal into the electrical loop, and keep for a preset time period, in this process, the current in the electrical loop may be obtained, so as to obtain a second current. And finally, calculating the voltage of the circuit to be tested according to the first current and the second current.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), for example.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. The utility model provides a non-contact voltage measuring device, its characterized in that includes probe and voltage sensing subassembly, the probe includes first probe and second probe, the voltage sensing subassembly includes processing unit and the partial pressure electric capacity and the reference signal source that connect gradually, wherein:
the first probe is used for being coupled with a circuit to be tested to form a first coupling capacitor; the second probe is used for being coupled with the zero line circuit to form a second coupling capacitor; the voltage sensing assembly is respectively connected with the first coupling capacitor and the second coupling capacitor to form an electric loop;
the processing unit is connected with the voltage division capacitor and used for acquiring waveform information of voltage on the voltage division capacitor and generating a reference signal generation instruction according to the waveform information;
the reference signal source is connected with the processing unit and used for inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage division capacitor and a second reference voltage signal with the same frequency and phase opposite to the voltage on the voltage division capacitor to the electric loop according to the reference signal generation instruction, and the amplitude of the first reference voltage signal is equal to that of the second reference voltage signal;
the processing unit is further configured to obtain a first current of the electrical loop in a process that the reference signal source inputs the first reference voltage signal to the electrical loop; after the first current is obtained, in the process that the reference signal source inputs the second reference voltage signal to the voltage division capacitor, the second current of the electric loop is obtained, and the voltage of the circuit to be tested is calculated according to the first current and the second current.
2. The apparatus of claim 1, wherein the voltage sensing assembly further comprises a current detection unit, wherein:
the current detection unit is connected in series in the electrical loop, is connected with the processing unit, and is configured to detect a current of the electrical loop to obtain the first current in a process that the reference signal source inputs the first reference voltage signal to the voltage division capacitor, and detect a current of the electrical loop to obtain the second current in a process that the reference signal source inputs the second reference voltage signal to the voltage division capacitor.
3. The apparatus of claim 1, wherein the voltage sensing component further comprises a voltage detection unit, wherein:
the voltage detection unit is connected with the voltage division capacitor and the processing unit and used for detecting the voltage on the voltage division capacitor and sending the voltage on the voltage division capacitor to the processing unit.
4. The apparatus of claim 1, wherein the processing unit comprises an amplification circuit, an analog-to-digital conversion circuit, a Fourier transform module, and a first processing circuit, wherein,
the amplifying circuit is connected with the analog-to-digital conversion circuit, connected to two ends of the voltage dividing capacitor and used for amplifying the voltage on the voltage dividing capacitor;
the analog-to-digital conversion circuit is connected with the Fourier transform module and is used for converting the amplified voltage on the voltage division capacitor into a discrete digital signal and sending the discrete digital signal to the Fourier transform module;
the Fourier transform module is connected with the first processing circuit and used for carrying out frequency spectrum analysis on the discrete digital signal to obtain waveform information of voltage on the voltage-dividing capacitor and sending the waveform information to the first processing circuit;
the first processing circuit is used for generating a reference signal generation instruction according to the waveform information.
5. The apparatus of claim 1, wherein the processing unit comprises a phase lock circuit and a second processing circuit, wherein,
the phase-locked circuit is used for acquiring waveform information of the voltage on the voltage-dividing capacitor, wherein the waveform information comprises frequency and phase information;
the second processing circuit is configured to generate first reference data corresponding to the first reference voltage signal and second reference data corresponding to the second reference voltage signal according to the waveform information, and generate the reference signal generation instruction according to the first reference data and the second reference data.
6. The apparatus of claim 5, wherein the phase-lock circuit comprises a phase detector, a low-pass filter, a voltage-controlled oscillator, and a feedback circuit, wherein,
the feedback circuit is used for sending a feedback signal output by the voltage-controlled oscillator to the phase detector;
the phase detector is used for determining the phase difference between the voltage on the voltage-dividing capacitor and the feedback signal and determining an error voltage signal based on the phase difference;
the filter is used for filtering the error voltage signal to obtain a control voltage signal;
the voltage-controlled oscillator is used for receiving the control voltage signal, outputting a target signal based on the control voltage signal, and acquiring waveform information of the voltage on the voltage-dividing capacitor according to the waveform information of the target signal.
7. The apparatus of claim 1, wherein the reference signal generation instruction carries first reference data corresponding to the first reference voltage signal and second reference data corresponding to the second reference voltage signal, the reference signal source comprises a waveform generator and a third processing circuit, wherein,
the third processing circuit is configured to parse the reference signal generation instruction to obtain the first reference data and the second reference data;
the waveform generator is configured to generate the first reference voltage signal according to the first reference data, and generate the second reference voltage signal according to the second reference data after acquiring the first current.
8. The apparatus of claim 1, wherein the probe comprises a first surface and a second surface opposite the first surface, the second surface being electrically connected to the voltage sensing component.
9. The device of claim 8, wherein the second surface has disposed thereon a substrate, metal traces, and a sensor array,
the substrate is arranged on the second surface;
the metal wire is arranged on the substrate and is electrically connected with the voltage sensing assembly;
the sensor array is arranged on the metal wiring.
10. A non-contact voltage measuring method applied to the non-contact voltage measuring apparatus according to any one of claims 1 to 9, the method comprising:
acquiring waveform information of the voltage on the voltage-dividing capacitor, and generating a reference signal generation instruction according to the waveform information;
inputting a first reference voltage signal with the same frequency and phase as the voltage on the voltage-dividing capacitor to the electric loop according to the reference signal generation instruction, and acquiring the current of the electric loop to obtain a first current;
after the first current is obtained, inputting a second reference voltage signal which is in the same frequency and opposite phase with the voltage on the voltage-dividing capacitor to the voltage-dividing capacitor according to the reference signal generation instruction, and obtaining the current of the electric loop to obtain a second current;
and calculating the voltage of the circuit to be tested according to the first current and the second current.
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