CN113175905B - Micrometer parameter self-adaptive obtaining method and system based on time sequence data fluctuation - Google Patents
Micrometer parameter self-adaptive obtaining method and system based on time sequence data fluctuation Download PDFInfo
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- CN113175905B CN113175905B CN202110472768.9A CN202110472768A CN113175905B CN 113175905 B CN113175905 B CN 113175905B CN 202110472768 A CN202110472768 A CN 202110472768A CN 113175905 B CN113175905 B CN 113175905B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
Abstract
The invention provides a micrometer parameter self-adaptive obtaining method and system based on time sequence data fluctuation, wherein the micrometer parameter self-adaptive obtaining method based on the time sequence data fluctuation obtains measurement data of a micrometer from the beginning of no installation of a standard part and after the standard part is taken down, and obtains the type of a meter frame and corresponding micrometer parameters according to judgment and processing of the measurement data. When the micrometer is arranged on the meter frame to form the bearing detection equipment, the micrometer does not need to be set independently, and the type of the meter frame and the corresponding parameter of the micrometer can be automatically judged by the method.
Description
Technical Field
The invention relates to the field of micrometer measurement, in particular to a micrometer parameter self-adaptive obtaining method and system based on time sequence data fluctuation.
Background
The bearing is an important part in the modern mechanical equipment. In the production of bearings, the accuracy of the bearing needs to be measured.
In the prior art, two types of bearing detection equipment exist for bearing measurement, and in the first type, when a bearing is not installed, a measured value is stabilized at a measured maximum value, the bearing is directly installed, and the measured value is changed to the measured value of the bearing. Secondly, the measured value is stabilized at the maximum value of measurement when the bearing is not installed, when the bearing is installed, the clamp needs to be shifted firstly, the measured value changes to the minimum value of measurement at the moment, then the bearing is placed, the clamp is loosened, and the measured value changes to the measured value of the bearing at the moment. Since the maximum value and the minimum value measured by each detection device are different, the corresponding parameters and types need to be set individually and specifically, and the use is very complicated.
The above problems are currently urgently needed.
Disclosure of Invention
The invention aims to provide a micrometer parameter self-adaptive acquisition method and system based on time sequence data fluctuation.
The technical scheme adopted by the invention for solving the technical problem is as follows: a micrometer parameter adaptive acquisition method based on time series data fluctuation comprises the following steps:
putting the standard component into a meter frame for micrometer calibration, and acquiring measurement data Scal of a micrometer in real time;
judging whether the user takes down the standard component or not according to the measurement data Scal;
after the user takes the standard part down, the type of the meter frame and the corresponding micrometer parameters are obtained through the measurement data Scal.
Further, the step of determining whether the user takes down the standard component according to the measurement data Scal includes:
calculating the difference value of the two latest measurement data by the measurement data Scal according to the time stamp;
if the difference is larger than the threshold d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data, and the difference value is divided by the number of the measurement data collected when the micrometer pointer falls down.
Further, the step of obtaining the type of the frame and the corresponding micrometer parameters through the measurement data Scal after the user takes down the standard component includes:
after the measurement data are stable, obtaining the measurement data S when the micrometer does not measure 1 ；
Continuously waiting for a preset time t, and if the measured data is stable at the other end, obtaining a value S when the other micrometer is not measured 2 Otherwise, the value of the other micrometer when not measured is not present;
judgment S 2 Presence, if any, of a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of gauge stand, S 1 Are micrometer parameters.
Further, after the measurement data are stable, the measurement data S of a micrometer when measurement is not performed is obtained 1 Comprises the following steps:
determining empirical data threshold d from historical data 2 Wherein d is 2 Indicating the difference between the maximum value and the minimum value in the measurement data when one end of the micrometer historical data is stable;
if the preset time t is continued 1 Measured data in Smax-d 2 ,Smax+d 2 ]Or [ Smin-d 2 ,Smin+d 2 ]Is not within [ Scal-d ] or 2 ,Scal+d 2 ]Within, the preset time t is continued at this time 1 Mean of all measured data in 1 。
Further, the step of continuously waiting for the preset time t, and if the measured data is stable at the other end, obtaining a value S of the other micrometer when the other micrometer is not measuring 2 Otherwise, the step of absence of a value not measured by another micrometer comprises:
determining empirical data threshold d from historical data 3 Wherein d is 3 Indicating the difference between the maximum value and the minimum value in the measurement data when the other end of the micrometer historical data is stable;
if the preset time t is continuous 2 Measured data in Smax-d 3 ,Smax+d 3 ]Or [ Smin-d 3 ,Smin+d 3 ]Is not within [ Scal-d ] or 3 ,Scal+d 3 ]Within the preset time t 2 Mean of all measured data in 2 ；
If, S 2 -Scal and S 1 The opposite sign of the Scal indicates that the measured data are stable at the other end, and the value S of the other micrometer is obtained when the measured data are not measured 2 Otherwise, the value at which the other micrometer is not measuring is not present.
The invention also provides a micrometer parameter self-adaptive acquisition system based on time sequence data fluctuation, which comprises:
the time sequence measurement data acquisition module is suitable for putting the standard component into the meter frame to carry out micrometer calibration and acquiring measurement data Scal of the micrometer in real time;
the judging module is suitable for judging whether the user takes down the standard component or not according to the measurement data Scal;
and the micrometer parameter acquisition module is suitable for acquiring the type of the meter frame and the corresponding micrometer parameters through the measurement data Scal after the user takes down the standard component.
Further, the determination module includes:
the first difference calculating unit is suitable for calculating the difference of the measurement data Scal according to the latest two measurement data in the time stamp;
a determination unit adapted to determine if the difference is greater than a threshold d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data divided by the number of the measurement data collected when the micrometer pointer falls down.
Further, the micrometer parameter acquiring module comprises:
a first measurement data acquisition unit adapted to acquire measurement data S when a micrometer is not performing measurement after the measurement data is stabilized 1 ；
A second measurement data acquisition unit adapted to continue to wait for a predetermined time t, and if the measurement data is stable at the other end, obtain a value S of the other micrometer when the measurement is not performed 2 Otherwise, the value of the other micrometer when not measured is not present;
a type and parameter acquisition unit adapted to determine S 2 Presence, if any, of a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of watch holder, S 1 Are micrometer parameters.
The invention also provides a computer readable storage medium, wherein one or more instructions are stored in the computer readable storage medium, and when the one or more instructions are executed by a processor, the one or more instructions realize the method for obtaining the micrometer parameter self-adaption based on the time sequence data fluctuation.
The invention also provides an electronic device, comprising a memory and a processor; at least one program instruction is stored in the memory; the processor is used for realizing the micrometer parameter self-adaptive acquisition method based on the time series data fluctuation by loading and executing the at least one program instruction.
The beneficial effects of the invention are: the invention provides a micrometer parameter self-adaptive obtaining method and system based on time sequence data fluctuation, wherein the micrometer parameter self-adaptive obtaining method based on the time sequence data fluctuation obtains measurement data of a micrometer from the beginning without a standard part and after the standard part is taken down, and obtains the type of a meter frame and corresponding micrometer parameters according to judgment and processing of the measurement data. When the micrometer is arranged on the meter frame to form the bearing detection equipment, the micrometer does not need to be set independently, and the type of the meter frame and the corresponding parameter of the micrometer can be automatically judged by the method.
Drawings
The invention is further illustrated by the following figures and examples.
Fig. 1 is a flowchart of a micrometer parameter adaptive acquisition method based on time series data fluctuation according to an embodiment of the present invention.
FIG. 2 is a schematic block diagram of a micrometer parameter adaptive acquisition system based on time series data fluctuation according to an embodiment of the present invention.
Fig. 3 is a partial functional block diagram of an electronic device provided by an embodiment of the invention.
Detailed Description
The present invention will now be described in detail with reference to the accompanying drawings. This figure is a simplified schematic diagram, and only illustrates the basic structure of the present invention in a schematic manner, and therefore it only shows the constitution related to the present invention.
Example 1
Referring to fig. 1, the present embodiment provides a micrometer parameter adaptive obtaining method based on time series data fluctuation. The method comprises the steps of obtaining measurement data of a micrometer from the beginning of the installation of a standard component and after the standard component is taken down, and obtaining the type of a meter frame and corresponding micrometer parameters according to the judgment and processing of the measurement data. When the micrometer is arranged on the meter frame to form the bearing detection equipment, the micrometer does not need to be set independently, and the type of the meter frame and the corresponding parameter of the micrometer can be automatically judged by the method.
Specifically, the micrometer parameter self-adaptive acquisition method based on time series data fluctuation comprises the following steps:
s110: putting the standard component into a meter frame for micrometer calibration, and acquiring measurement data Scal of a micrometer in real time;
s120: and judging whether the user takes down the standard component or not according to the measurement data Scal.
Wherein, step S120 includes the following steps:
s121: calculating the difference value of the two latest measurement data by the measurement data Scal according to the time stamp;
s122: if the difference is larger than the threshold d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data divided by the number of the measurement data collected when the micrometer pointer falls down.
S130: after the user takes the standard part down, the type of the meter frame and the corresponding micrometer parameters are obtained through the measurement data Scal.
In the present embodiment, step S130 includes the following steps:
s131: after the measured data are stable, obtaining the measured data S when a micrometer does not measure 1 。
Specifically, step S131 includes the steps of:
s1311: determining empirical data threshold d from historical data 2 Wherein d is 2 Indicating the difference between the maximum value and the minimum value in the measurement data when one end of the micrometer historical data is stable;
S1312: if the preset time t is continuous 1 Measured data in Smax-d 2 ,Smax+d 2 ]Or [ Smin-d 2 ,Smin+d 2 ]Is not within [ Scal-d ] or 2 ,Scal+d 2 ]Within, the preset time t is continued at this time 1 Mean of all measured data in 1 。
S132: continuing to wait for a preset time t, and if the measured data is stable at the other end, obtaining a value S when the other micrometer does not measure 2 Otherwise, the value at which the other micrometer is not measuring is not present.
Specifically, step S132 includes the steps of:
s1321: determining empirical data threshold d from historical data 3 Wherein d is 3 Indicating the difference between the maximum value and the minimum value in the measurement data when the other end of the micrometer historical data is stable;
s1322: if the preset time t is continued 2 Measured data in Smax-d 3 ,Smax+d 3 ]Or [ Smin-d 3 ,Smin+d 3 ]Is not within [ Scal-d ] or 3 ,Scal+d 3 ]Within, the preset time t is continued at this time 2 Mean of all measured data in 2 ；
S1323: if, S 2 -Scal and S 1 The opposite sign of the Scal indicates that the measured data are stable at the other end, and the value S of the other micrometer is obtained when the measured data are not measured 2 Otherwise, the value at which the other micrometer is not measuring is not present.
S133: judgment S 2 Presence, if any, of a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of gauge stand, S 1 Are micrometer parameters.
Example 2
Referring to fig. 2, the present embodiment provides a micrometer parameter adaptive acquiring system based on time series data fluctuation, the system includes:
and the time sequence measurement data acquisition module is suitable for putting the standard component into the meter frame to carry out micrometer calibration and acquiring the measurement data Scal of the micrometer in real time.
The judging module is suitable for judging whether the user takes down the standard component or not according to the measurement data Scal; specifically, the determination module includes:
the first difference calculating unit is suitable for calculating the difference of the measurement data Scal according to the latest two measurement data in the time stamp;
a determination unit adapted to determine if the difference is greater than a threshold value d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data divided by the number of the measurement data collected when the micrometer pointer falls down.
The micrometer parameter acquisition module is suitable for acquiring the type of the meter frame and the corresponding micrometer parameters through the measurement data Scal after the user takes down the standard component; specifically, the micrometer parameter acquisition module comprises:
a first measurement data acquisition unit adapted to acquire measurement data S when a micrometer is not measuring after the measurement data is stabilized 1 . Wherein the first measurement data acquisition unit is configured to perform the following steps:
s1311: determining empirical data threshold d from historical data 2 Wherein d is 2 Indicating the difference between the maximum value and the minimum value in the measurement data when one end of the micrometer historical data is stable;
s1312: if the preset time t is continued 1 Measured data in Smax-d 2 ,Smax+d 2 ]Or [ Smin-d 2 ,Smin+d 2 ]Is not within [ Scal-d ] or 2 ,Scal+d 2 ]Within the preset time t 1 Mean of all measured data in 1 。
A second measurement data acquisition unit adapted to continue to wait for a predetermined time t, and if the measurement data is stable at the other end, obtain a value S of the other micrometer when the measurement is not performed 2 Otherwise, the value at which the other micrometer is not measuring is not present. Specifically, for the second measurement data acquisition unitThe following steps are performed:
s1321: determining empirical data threshold d from historical data 3 Wherein d is 3 Indicating the difference between the maximum value and the minimum value in the measurement data when the other end of the micrometer historical data is stable;
s1322: if the preset time t is continuous 2 Measured data in Smax-d 3 ,Smax+d 3 ]Or [ Smin-d 3 ,Smin+d 3 ]Is within and not [ Scal-d 3 ,Scal+d 3 ]Within, the preset time t is continued at this time 2 Mean of all measured data in 2 ；
S1323: if, S 2 -Scal and S 1 The opposite Scal sign indicates that the measured data are stable at the other end, and the value S is obtained when the other micrometer is not measuring 2 Otherwise, the value at which the other micrometer is not measuring is not present.
A type and parameter acquisition unit adapted to determine S 2 Whether or not, if so, a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of gauge stand, S 1 Are micrometer parameters.
Example 3
The present embodiment provides a computer-readable storage medium, in which one or more instructions are stored, and when the one or more instructions are executed by a processor, the method for obtaining adaptive micrometer parameters based on time series data fluctuation provided in embodiment 1 is implemented.
The micrometer parameter self-adaptive obtaining method based on time sequence data fluctuation obtains the measurement data of a micrometer from the time when a standard part is not installed and after the standard part is taken down, and obtains the type of a meter frame and the corresponding micrometer parameters according to the judgment and processing of the measurement data. When the micrometer is arranged on the meter frame to form the bearing detection equipment, the micrometer does not need to be set independently, and the type of the meter frame and the corresponding parameter of the micrometer can be automatically judged by the method.
Example 4
Referring to fig. 3, an embodiment of the present invention further provides an electronic device, including: a memory 502 and a processor 501; the memory 502 has at least one program instruction stored therein; the processor 501 loads and executes the at least one program instruction to implement the method for obtaining micrometer parameter adaptive based on time series data fluctuation as provided in embodiment 1.
The memory 502 and the processor 501 are coupled in a bus that may include any number of interconnected buses and bridges that couple one or more of the various circuits of the processor 501 and the memory 502 together. The bus may also connect various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. A bus interface provides an interface between the bus and the transceiver. The transceiver may be one element or a plurality of elements, such as a plurality of receivers and transmitters, providing a means for communicating with various other apparatus over a transmission medium. The data processed by the processor 501 is transmitted over a wireless medium through an antenna, which further receives the data and transmits the data to the processor 501.
The processor 501 is responsible for managing the bus and general processing and may also provide various functions including timing, peripheral interfaces, voltage regulation, power management, and other control functions. And memory 502 may be used to store data used by processor 501 in performing operations.
In summary, the invention provides a micrometer parameter adaptive acquiring method and system based on time series data fluctuation, wherein the micrometer parameter adaptive acquiring method based on time series data fluctuation acquires measurement data of a micrometer from the beginning of no installation of a standard part and after taking down the standard part, and acquires the type of a meter rack and corresponding micrometer parameters according to judgment and processing of the measurement data. When the micrometer is arranged on the meter frame to form the bearing detection equipment, the micrometer does not need to be set independently, and the type of the meter frame and the corresponding parameter of the micrometer can be automatically judged by the method.
In light of the foregoing description of preferred embodiments in accordance with the invention, it is intended that the appended claims be interpreted as including all such alterations and modifications as fall within the true spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.
Claims (7)
1. A micrometer parameter self-adaptive obtaining method based on time series data fluctuation is characterized by comprising the following steps:
putting the standard component into a meter frame for micrometer calibration, and acquiring measurement data Scal of a micrometer in real time;
judging whether the user takes down the standard component or not according to the measurement data Scal;
after the user takes down the standard component, the type of the meter frame and the corresponding micrometer parameters are obtained through the measurement data Scal;
the step of obtaining the type of the meter frame and the corresponding micrometer parameters through the measurement data Scal after the user takes down the standard component comprises the following steps:
after the measurement data are stable, obtaining the measurement data S when the micrometer does not measure 1 ；
Continuously waiting for a preset time t, and if the measured data is stable at the other end, obtaining a value S when the other micrometer is not measured 2 Otherwise, the value of the other micrometer when not measured is not present;
judgment S 2 Whether or not, if so, a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of gauge stand, S 1 Is a micrometer parameter;
continuing to wait for a preset time t, and if the measured data is stable at the other end, obtaining a value S of the other micrometer when the other micrometer is not measured 2 Otherwise, the step of absence of a value not measured by another micrometer comprises:
determining empirical data threshold d from historical data 3 Wherein d is 3 Indicating the difference between the maximum value and the minimum value in the measurement data when the other end of the micrometer historical data is stable;
if the preset time t is continuous 2 Measured data in Smax-d 3 , Smax+d 3 ]Or [ Smin-d 3 ,Smin+d 3 ]Is within and not [ Scal-d 3 , Scal+d 3 ]Within the preset time t 2 Mean of all measured data in 2 ；
If, S 2 -Scal and S 1 The opposite sign of the Scal indicates that the measured data are stable at the other end, and the value S of the other micrometer is obtained when the measured data are not measured 2 Otherwise, the value at which the other micrometer is not measuring is not present.
2. The method for adaptively acquiring micrometer parameters based on time series data fluctuation according to claim 1, wherein the step of determining whether the user takes down the standard component according to the measurement data Scal comprises:
calculating the difference value of the two latest measurement data according to the time stamp by the measurement data Scal;
if the difference is larger than the threshold d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data, and the difference value is divided by the number of the measurement data collected when the micrometer pointer falls down.
3. The micrometer parameter adaptive acquiring method based on time series data fluctuation according to claim 1, characterized in that after the measurement data is stabilized, the measurement data S of a micrometer when measurement is not performed is acquired 1 Comprises the following steps:
determining empirical data threshold d from historical data 2 Wherein d is 2 Indicating the difference between the maximum value and the minimum value in the measurement data when one end of the micrometer historical data is stable;
if the preset time t is continuous 1 Measured data in [ Sma ] Smax-d 2 , Smax+d 2 ]Or [ Smin-d 2 ,Smin+d 2 ]Is within and not [ Scal-d 2 , Scal+d 2 ]Within the preset time t 1 Mean of all measured data in 1 。
4. A micrometer parameter adaptive acquisition system based on time series data fluctuation, the system comprising:
the time sequence measurement data acquisition module is suitable for putting the standard component into the meter frame to carry out micrometer calibration and acquiring measurement data Scal of the micrometer in real time;
the judging module is suitable for judging whether the user takes down the standard component or not according to the measurement data Scal;
the micrometer parameter acquisition module is suitable for acquiring the type of the meter frame and the corresponding micrometer parameters through the measurement data Scal after the user takes down the standard component;
the micrometer parameter acquisition module comprises:
a first measurement data acquisition unit adapted to acquire measurement data S when a micrometer is not measuring after the measurement data is stabilized 1 ；
A second measurement data acquisition unit adapted to continue waiting for a predetermined time t, and if the measurement data is stable at the other end, obtain a value S of the other micrometer when the measurement is not performed 2 Otherwise, the value of the other micrometer when not measured is not present; specifically, the method comprises the step of determining an empirical data threshold d according to historical data 3 Wherein d is 3 Indicating the difference between the maximum value and the minimum value in the measurement data when the other end of the micrometer historical data is stable; if the preset time t is continued 2 Measured data in Smax-d 3 , Smax+d 3 ]Or [ Smin-d 3 , Smin+d 3 ]Is not within [ Scal-d ] or 3 , Scal+d 3 ]Within, the preset time t is continued at this time 2 Mean of all measured data in 2 (ii) a If, S 2 -Scall and S 1 The opposite sign of-Scal indicates that the measured data are stable at the other end, and that the other micrometer is not measuringValue S of 2 Otherwise, the value at which the other micrometer is not measuring is absent;
a type and parameter acquisition unit adapted to determine S 2 Presence, if any, of a first type of watch holder, S 1 And S 2 For micrometer parameters, if not, a second type of gauge stand, S 1 Are micrometer parameters.
5. The micrometer parameter adaptive acquisition system based on time series data fluctuation according to claim 4, characterized in that the decision module comprises:
the first difference calculating unit is suitable for calculating the difference of the measurement data Scal according to the latest two measurement data in the time stamp;
a determination unit adapted to determine if the difference is greater than a threshold d 1 Then the user is judged to take down the standard component, wherein, the threshold value d 1 The empirical data in the historical data represents the difference value of two measurement data when the standard component is not taken down and is taken down in the historical data divided by the number of the measurement data collected when the micrometer pointer falls down.
6. A computer-readable storage medium having one or more instructions stored therein, wherein the one or more instructions, when executed by a processor, implement the method for obtaining micrometer parameter adaptive based on time series data fluctuation according to any one of claims 1 to 3.
7. An electronic device comprising a memory and a processor; at least one program instruction is stored in the memory; the processor, which is used for loading and executing the at least one program instruction to realize the time-series data fluctuation-based micrometer parameter adaptive acquisition method of any one of claims 1-3.
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