CN113109499A - Equipment applied to high-temperature ablation test and ablation amount detection method of high-temperature test - Google Patents

Equipment applied to high-temperature ablation test and ablation amount detection method of high-temperature test Download PDF

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Publication number
CN113109499A
CN113109499A CN202110427053.1A CN202110427053A CN113109499A CN 113109499 A CN113109499 A CN 113109499A CN 202110427053 A CN202110427053 A CN 202110427053A CN 113109499 A CN113109499 A CN 113109499A
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sample
distance
ablation
point
image
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黄浦
屈哲
张治�
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Hangzhou Rougu Technology Co Ltd
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Hangzhou Rougu Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N31/00—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods
    • G01N31/12—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods using combustion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/13—Edge detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image

Abstract

The application relates to equipment applied to a high-temperature ablation test and an ablation amount detection method of the high-temperature test. Determining an initial distance and a distance pixel ratio between the front end of the sample and an appointed reference point according to the distance and identification data of the image acquired before the test, wherein the distance pixel ratio represents an actual distance corresponding to the unit pixel distance; calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of the image acquired during the test; and calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance, and further obtaining the ablation amount of the sample. Because the vibration frequencies of the sample fixing device, the mark point and the sample are consistent in the high-temperature test process, the influence of vibration on the detection of the ablation amount is eliminated, and the detection error is small.

Description

Equipment applied to high-temperature ablation test and ablation amount detection method of high-temperature test
Technical Field
The application relates to the technical field of data processing, in particular to equipment applied to a high-temperature ablation test and an ablation amount detection method of the high-temperature test.
Background
The existing ablation amount detection modes mainly comprise a contact mode and a non-contact mode, wherein the contact mode is that a plurality of measuring elements are arranged in a heat-proof layer, the ablation amount change of a sample is detected according to voltage signals of the measuring elements, but only the internal ablation change can be detected, and the surface ablation change cannot be measured. The non-contact type is to analyze the ablation amount by collecting a test model image in the high-temperature ablation process to carry out edge detection under the high-temperature pneumatic loading environment, however, under the high-temperature test environment, due to the influence of high-temperature airflow and equipment operation, a camera and a test sample can vibrate, so that a large error exists in the ablation amount measured by analyzing the image. Therefore, it is necessary to provide an apparatus and a method for detecting ablation amount suitable for high temperature test to meet the requirement of ablation amount detection in high temperature test.
Disclosure of Invention
In order to solve the technical problems, the application provides equipment applied to a high-temperature ablation test and an ablation amount detection method of the high-temperature test, so that the vibration frequencies of a sample fixing device, a mark point and a sample are consistent in the high-temperature test process, the influence of vibration on ablation amount detection is eliminated, and the detection result is more accurate.
In order to solve the technical problem, the present application provides an apparatus applied to a high temperature ablation test, including a sample fixing device, an image collecting device, a distance measuring device and an image processing device, wherein a sample for the high temperature test is fixed on the sample fixing device, the sample fixing device or the sample is provided with a mark point, the distance measuring device is used for measuring a distance between a front end of the sample and the mark point, a collecting direction of the image collecting device faces the sample and the mark point, and can collect an image containing the sample and the mark point at the same time, and the image collecting device is connected with the image processing device;
the image processing device is used for processing the distance between the front end of the sample and the marking point, a first image acquired by the image acquisition device before the test and a second image acquired by the image acquisition device during the test, and determining the ablation condition of the sample.
Optionally, the marker dot is a different color than the sample fixation device or the sample; or the color of the center of the mark point is different from that of the edge of the mark point.
Optionally, the sample is fixed on a side of the sample fixing device facing the high temperature loading device, and the mark point is arranged beside the sample installation side or at the rear end of the sample.
Optionally, the projection of the marker point in the acquisition direction of the image acquisition device is located on an axis in the ablation direction of the sample.
Optionally, the sample is fixed on a side of the sample fixing device facing the high temperature loading device, the sample fixing device is provided with a bracket on a sample installation side, the sample is juxtaposed with the bracket, and the marking point is arranged on a side of the bracket facing the image acquisition device.
Optionally, the image processing apparatus is specifically configured to determine an initial distance and a distance pixel ratio between the front end of the sample and a specified reference point according to the distance between the front end of the sample and the marker point and the identification data of the first image, where a projection of the marker point on an axis in the ablation direction of the sample coincides with the specified reference point, and the distance pixel ratio is used to represent an actual distance corresponding to a unit pixel distance on the image; determining a real-time pixel distance between the front end of the sample and the marking point according to the identification data of the second image; calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance; and calculating the ablation amount of the sample according to the initial distance and the real-time distance.
The application also provides a method for detecting the ablation amount in the high-temperature test, which comprises the following steps:
s10, determining an initial distance and a distance pixel ratio between the front end of the sample and a specified reference point according to the distance between the front end of the sample and the marker point on the sample fixing device or the sample and identification data of a first image collected before a high-temperature test, wherein the first image simultaneously comprises the sample and the marker point, the projection of the marker point on the axis of the sample in the ablation direction coincides with the specified reference point, and the distance pixel ratio is used for representing the actual distance corresponding to the unit pixel distance on the image;
s20, calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of a second image acquired during the high-temperature test, wherein the second image simultaneously comprises the sample and the mark point;
s30, calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance;
and S40, calculating the ablation amount of the sample according to the initial distance and the real-time distance.
Optionally, step S10, includes:
s11, determining the pixel distance between the front end of the sample and the marking point as an initial pixel distance according to the identification data of the first image;
and S12, calculating the distance between the front end of the sample and the marking point and the ratio of the initial pixel distance to obtain the distance pixel ratio.
Optionally, step S10, includes:
s13, when the projection of the mark point in the collecting direction of the image collecting device is positioned on the axis in the ablation direction of the sample, the mark point is used as the designated reference point, and the distance between the front end of the sample and the mark point is determined as the initial distance; or the like, or, alternatively,
s14, when the projection of the mark point in the collection direction of the image collection device is not located on the axis in the ablation direction of the sample, determining an initial included angle between a connecting line between the front end of the sample and the mark point and the axis in the ablation direction of the sample according to the identification data of the first image, taking the intersection point of the mark point making a perpendicular line to the axis in the ablation direction of the sample as the specified reference point, and calculating the initial distance between the front end of the sample and the specified reference point according to the distance between the front end of the sample and the mark point and the initial included angle.
Optionally, step S30, includes:
when the projection of the mark point in the acquisition direction of the image acquisition device is not positioned on the axis in the ablation direction of the sample, determining a real-time included angle between a connecting line between the front end of the sample and the mark point and the axis in the ablation direction of the sample according to the identification data of the second image;
and calculating the real-time distance between the front end of the sample and the specified reference point according to the real-time pixel distance between the front end of the sample and the mark point, the real-time included angle and the distance pixel ratio.
Optionally, step S11 or step S20, comprising:
hough transformation is carried out on a mark point region in an image, Canny edge detection is carried out on the region of the sample, and the central position coordinates of the mark point and the front end edge position coordinates of the sample are respectively obtained;
and calculating the pixel distance between the front end of the sample and the mark point according to the central position coordinates of the mark point and the position coordinates of the edge position of the front end of the sample.
According to the equipment applied to the high-temperature ablation test and the ablation amount detection method applied to the high-temperature ablation test, the sample or the sample fixing device is provided with the mark points, the distance measuring device is used for measuring the distance between the front end of the sample and the mark points, and the image collecting device can collect images containing the sample and the mark points at the same time. Determining an initial distance and a distance pixel ratio between the front end of the sample and an appointed reference point according to the distance and identification data of the image acquired before the test, wherein the distance pixel ratio represents an actual distance corresponding to the unit pixel distance; calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of the image acquired during the test; and calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance, and further obtaining the ablation amount of the sample. Because the vibration frequencies of the sample fixing device, the mark point and the sample are consistent in the high-temperature test process, the influence of vibration on the detection of the ablation amount is eliminated, and the detection error is small.
Drawings
FIG. 1 is a schematic side view of an apparatus for high temperature ablation testing according to a first embodiment;
FIG. 2 is a schematic top view of the sample holding device of FIG. 1;
FIG. 3 is a schematic top view of a sample holding device of an apparatus for high temperature ablation testing according to a second embodiment;
FIG. 4 is one of the flow charts of the ablation amount detection method of the high-temperature test according to the third embodiment;
FIG. 5 is a second flowchart of the ablation amount detection method in the high temperature test according to the third embodiment;
fig. 6 is a third flowchart of the ablation amount detection method in the high-temperature test according to the third embodiment.
Detailed Description
The following description of the embodiments of the present application is provided for illustrative purposes, and other advantages and capabilities of the present application will become apparent to those skilled in the art from the present disclosure.
In the following description, reference is made to the accompanying drawings that describe several embodiments of the application. It is to be understood that other embodiments may be utilized and that mechanical, structural, electrical, and operational changes may be made without departing from the spirit and scope of the present application. The following detailed description is not to be taken in a limiting sense, and the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
Although the terms first, second, etc. may be used herein to describe various elements in some instances, these elements should not be limited by these terms. These terms are only used to distinguish one element from another.
Also, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context indicates otherwise. It will be further understood that the terms "comprises," "comprising," "includes" and/or "including," when used in this specification, specify the presence of stated features, steps, operations, elements, components, items, species, and/or groups, but do not preclude the presence, or addition of one or more other features, steps, operations, elements, components, species, and/or groups thereof. The terms "or" and/or "as used herein are to be construed as inclusive or meaning any one or any combination. Thus, "A, B or C" or "A, B and/or C" means "any of the following: a; b; c; a and B; a and C; b and C; A. b and C ". An exception to this definition will occur only when a combination of elements, functions, steps or operations are inherently mutually exclusive in some way.
First embodiment
Fig. 1 is a schematic side view of an apparatus for high temperature ablation testing according to a first embodiment. As shown in fig. 1, the apparatus for high temperature test of this embodiment includes a sample fixing device 11, an image collecting device 12, a distance measuring device 17 and an image processing device 13, wherein a sample 14 is fixed on a side of the sample fixing device 11 facing a high temperature loading device 16, the distance measuring device 17 and the image collecting device 12 are preferably disposed on the same side of the sample 14, and the image collecting device 12 and the image processing device 13 are connected, and may be connected wirelessly or by wire.
Optionally, the sample 14 is fixed on the side of the sample fixing device 11 facing the high temperature loading device 16, and the side of the sample installation side is provided with the marking point 15. In this embodiment, the sample fixing device 11 includes a supporting column 111 and a fixing head 112, the supporting column 111 is connected to the fixing head 112, a side of the fixing head 112 facing the high temperature loading device 16 is used for fixing the sample 14, and the marking point 15 is disposed beside a sample mounting side of the fixing head 112. In practical implementation, the mark point 15 may be directly disposed at the rear end of the sample 14, and only the position where the mark point is disposed is not ablated before the ablation test is finished. Therefore, the vibration frequencies of the sample fixing device 11, the marking point 15 and the sample 14 are consistent in the high-temperature test process, the relative positions of the three are kept unchanged in the test process, the ablation amount is calculated through the relative position relation of the marking point 15 and the sample 14, and the calculation error caused by the shaking of the sample 14 can be effectively eliminated. The mark point 15 is made of high-temperature-resistant composite materials, the temperature resistance range is larger than the temperature of high-temperature high-speed airflow, and the temperature resistance time is longer than the ablation test time, so that the mark point can not be ablated and deformed in the test process, and the effectiveness of image acquisition in the test process is ensured.
Referring to fig. 1 and fig. 2 together, in an embodiment, the projection of the mark point 14 in the collecting direction of the image collecting device 12 is located on the axis L in the ablation direction of the sample 14, so that the calculation step of the ablation amount can be simplified. Alternatively, the marker 15 is colored differently from the sample holding means 11 or the sample 14, or the center of the marker 15 is colored differently from the edge of the marker 15, and the shape of the marker 15 is preferably a circle or other regular shape. Therefore, the area of the mark point 15 can be conveniently extracted, hough transformation is carried out on the area of the mark point 15, and the central position coordinate of the mark point 15 is obtained through detection. The basic principle of Hough transformation is to transform a curve (including a straight line) in an image space into a parameter space, determine a description parameter of the curve by detecting an extreme point in the parameter space, so as to extract a regular curve in the image, thus, by performing Hough transformation on an area of a mark point 15, an edge shape curve, namely a circular curve, of the shape of the mark point 15 can be detected, and then the coordinates of a dot, namely the coordinates of the center position of the mark point 15, are calculated through the circular curve.
The front end 141 of the sample 14 may be a tip or not, and coordinate information of the edge point of the front end 141 of the sample 14 may be obtained by Canny edge detection on the image area of the sample 14, and the edge point of the front end 141 of the sample 14 may be an end point of the tip or a center point of the edge of the front end 141. Canny edge detection obtains an optimized approximation operator based on measuring the product of the signal-to-noise ratio and the positioning, and can accurately capture as many edges as possible in an image, thereby accurately obtaining the positions of the edge points of the front end 141 of the sample 14. The distance measuring device 17 may be a device suitable for measuring distance, such as a laser distance measuring device or an ultrasonic distance measuring device. The distance measuring device 17 can measure the spatial positions of the front end 141 of the sample 14 and the marker 15, and further obtain the distance between the front end 141 of the sample 14 and the marker 15, where the distance may be the length of a connection line between the front end 141 of the sample 14 and the marker 15, or the horizontal distance between the front end 141 of the sample 14 and the marker 15, and specifically may be selected for use according to the positional relationship between the sample 14 and the marker 15, so that the distance between the two measured by the distance measuring device 17 matches the pixel distance between the two in the image, and the pixel distance is the distance between objects represented by the size of a pixel in the image. In one embodiment, when the projection of the marker point 14 in the acquisition direction of the image acquisition device 12 is located on the axis L in the ablation direction of the specimen 14, the distance measured by the distance measuring device 17 is set to the horizontal distance between the leading end 141 of the specimen 14 and the marker point 15.
The image acquisition device 12 is oriented toward the sample 14 and the mark point 15, and can acquire an image containing both the sample 14 and the mark point 15. The image acquisition device 12 may be provided with a storage unit for storing a first image acquired by the image acquisition device 12 before the high temperature test and a plurality of frames of second images acquired during the high temperature test (i.e., images acquired in a state where the sample 14 vibrates due to high temperature), and a wireless communication unit connected to the storage unit for transmitting the first image and the second image to an external device, such as the image processing device 13 or other device with data processing capability, so as to facilitate image analysis and ablation amount calculation.
In this embodiment, the image processing device 13 is configured to determine an initial distance and a distance pixel ratio between the front end 141 of the sample 14 and the designated reference point according to the distance between the front end 141 of the sample 14 and the marker point 15 and the identification data of the first image acquired before the high-temperature test, and a projection of the marker point 15 on an axis in the ablation direction of the sample 14 coincides with the designated reference point, so that the designated reference point may be the marker point 15 according to the position where the marker point 15 is located, and the distance pixel ratio is used for representing an actual distance corresponding to a unit pixel distance on the image; calculating the real-time pixel distance between the front end 141 of the sample 14 and the marking point 25 according to the identification data of the second image acquired during the high-temperature test; calculating the real-time distance between the front end 141 of the sample 14 and the designated reference point according to the distance pixel ratio and the real-time pixel distance; based on the initial distance and the real-time distance, the amount of ablation of the sample 14 is calculated. The specific operation of the image processing apparatus 13 will be described in detail in the third embodiment.
The equipment applied to the high-temperature ablation test comprises a sample fixing device, an image collecting device, a distance measuring device and an image processing device, wherein the sample fixing device is used for fixing a sample for the high-temperature test, a mark point is arranged on the sample fixing device or the sample, the distance measuring device is used for measuring the distance between the front end of the sample and the mark point, the collecting direction of the image collecting device faces towards the sample and the mark point, an image containing the sample and the mark point can be collected, and the image collecting device is connected with the image processing device. Through the equipment, the vibration frequency of the sample fixing device, the mark points and the sample can be consistent in the high-temperature test process, the image obtained through image acquisition can be better applied to ablation amount detection, the influence of vibration on ablation amount detection is effectively eliminated, the detection error is small, the mark points are reasonable in design, and the structure is simple.
Second embodiment
Fig. 3 is a schematic top view of a sample holding device of an apparatus for high temperature ablation testing according to a second embodiment. As shown in fig. 3, the present embodiment is different from the first embodiment mainly in the structure of the sample holding means 21 and the position of the marker 25. In this embodiment, the sample 14 is fixed on the side of the sample fixing device 21 facing the high temperature loading device, the sample fixing device 21 is provided with a holder 213 on the sample mounting side, the sample 14 is juxtaposed with the holder 213, and the marking point 25 is provided on the side of the holder 213 facing the image pickup device.
Preferably, the end of the bracket 213 facing the high temperature loading device is a tip, and the cross-sectional area of the tip gradually increases from the end to the direction away from the high temperature loading device. In the high-temperature test process, the ablation object continuously flows along the air flow direction to cover the surface of the sample 14 and the sample fixing device 21, and further to cover the mark point 25, so that the mark point 25 is arranged on the bracket 213 by designing the sample 14 and the bracket 213 in parallel, the influence of the ablation object on the imaging effect can be effectively avoided, meanwhile, one end of the bracket 213 facing the high-temperature loading device is a tip, and the cross-sectional area of the tip is gradually increased from the end to the direction far away from the high-temperature loading device, so that the influence of the high-temperature air flow can be reduced, and the vibration frequencies of the bracket 213, the sample fixing device 21 and the sample 14 are basically kept consistent.
With the apparatus of the present embodiment, the projection of the marker point 25 in the acquisition direction of the image acquisition device will not be located on the axis L in the ablation direction of the sample 14, and the intersection point a where the marker point 25 makes a perpendicular to the axis L in the ablation direction of the sample 14 may be used as a specified reference point for the ablation amount, and the relative position of the intersection point a and the marker point 25 is unchanged. Further, when the image pickup device is disposed above the sample fixing device 21, the sample 14 and the mark point 25 are preferably disposed on the same horizontal plane, and when the image pickup device is disposed on the side of the sample fixing device 21, the sample 14 and the mark point 25 are preferably disposed on the same vertical plane, and the distance measured by the distance measuring device is set to the length of the connection line between the front end 141 of the sample 14 and the mark point 25, so that the imaging distance of the sample 14 and the mark point 25 in the image can be matched with the actual distance therebetween, and the distance measuring operation can be simplified. As shown in fig. 3, the distance between the front end 141 of the sample 14 and the specified reference point (intersection a) and the distance between the front end 141 of the sample 14 and the marker 25 have a cosine-converted relationship of the included angle θ, and similarly, the pixel distance between the front end 141 of the sample 14 and the specified reference point (intersection a) and the pixel distance between the front end 141 of the sample 14 and the marker 25 also have a cosine-converted relationship of the included angle θ, and therefore, after the actual distance between the front end 141 of the sample 14 and the marker 25 is measured by the distance measuring device and the pixel distance between the front end 141 of the sample 14 and the marker 25 is obtained by image recognition, the distance between the front end 141 of the sample 14 and the specified reference point (intersection a) and the pixel distance between the front end 141 of the sample 14 and the specified reference point (intersection a) can be obtained. It will be appreciated that the location of the specified reference point may be selected on the basis of different angular conversions, and need only coincide with the projection of the sample 14 on the axis L in the ablation direction.
In this embodiment, the image processing apparatus is configured to determine an initial distance and a distance-to-pixel ratio between the front end 141 of the sample 14 and a designated reference point (e.g., intersection a) according to the distance between the front end 141 of the sample 14 and the mark point 25 and the identification data of the first image acquired before the high-temperature test, where the designated reference point is located on an axis in the ablation direction of the sample 14 and is unchanged from the position of the mark point 25, and the distance-to-pixel ratio is used to represent an actual distance corresponding to a unit pixel distance on the image; calculating the real-time pixel distance between the front end 141 of the sample 14 and the marking point 25 according to the identification data of the second image acquired during the high-temperature test; calculating the real-time distance between the front end 141 of the sample 14 and the designated reference point according to the distance pixel ratio and the real-time pixel distance; based on the initial distance and the real-time distance, the amount of ablation of the sample 14 is calculated. The ablation amount detection process applied to this embodiment will be described in detail in the third embodiment.
Other structures of the device applied to the high-temperature ablation test in this embodiment are the same as those in the first embodiment, and are described in detail in the description of the first embodiment, and are not described again here.
Third embodiment
Fig. 4 is one of the flow charts of the ablation amount detection method of the high-temperature test according to the third embodiment. As shown in fig. 4, the present application further provides a method for detecting ablation amount in a high temperature test, which is applied to the apparatus of the first embodiment or the second embodiment, and includes the following steps:
s10, determining an initial distance and a distance pixel ratio between the front end of the sample and a designated reference point according to the distance between the front end of the sample and the marking point on the sample fixing device or the sample and identification data of a first image collected before a high-temperature test, wherein the first image simultaneously comprises the sample and the marking point, the projection of the marking point on the axis of the sample in the ablation direction coincides with the designated reference point, and the distance pixel ratio is used for representing an actual distance corresponding to the unit pixel distance on the image;
s20, calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of the second image acquired during the high-temperature test, wherein the second image simultaneously comprises the sample and the mark point;
s30, calculating the real-time distance between the front end of the sample and the designated reference point according to the distance pixel ratio and the real-time pixel distance;
and S40, calculating the ablation amount of the sample according to the initial distance and the real-time distance.
Because the vibration frequencies of the sample fixing device, the marking point and the sample are consistent in the high-temperature test process, and the projection of the marking point on the axis of the ablation direction of the sample is coincident with the specified reference point, through the steps, the initial distance between the front end of the sample and the specified reference point and the real-time pixel distance between the front end of the sample and the specified reference point in the ablation process can be calculated by utilizing the marking point, the real-time distance between the front end of the sample and the specified reference point in the ablation process can be calculated by utilizing the distance pixel to convert the real-time pixel distance, and then the ablation amount of the sample can be calculated according to the initial distance and the real-time distance, so that the influence of vibration on the ablation amount detection is eliminated, and the detection result is more accurate.
Optionally, step S10, includes:
s11, determining the pixel distance between the front end of the sample and the mark point as the initial pixel distance according to the identification data of the first image;
and S12, calculating the ratio of the distance between the front end of the sample and the marking point to the initial pixel distance to obtain the distance-pixel ratio.
Wherein, when calculating the pixel distance between the front end of the sample and the mark point and the real-time pixel distance, the method comprises the following steps:
hough transformation is carried out on the mark point region in the image, Canny edge detection is carried out on the region of the sample, and the central position coordinates of the mark point and the edge position coordinates of the front end of the sample are respectively obtained;
and calculating the pixel distance between the front end of the sample and the mark point according to the central position coordinates of the mark point and the position coordinates of the edge point of the front end of the sample.
Referring to fig. 2, when calculating the distance pixel ratio, hough transformation is performed on the region of the mark point 15 in the image, Canny edge detection is performed on the region of the sample 14, and the center position coordinates of the mark point 15 and the edge point position coordinates of the front end 141 of the sample 14 are obtained, so that the initial pixel distance between the front end 141 of the sample 14 and the mark point 15 can be calculated according to the center position coordinates of the mark point 15 and the edge point position coordinates of the front end 141 of the sample 14. Finally, the distance-to-pixel ratio is obtained by calculating the ratio of the distance between the front end 141 of the sample 14 and the marker 15 to the initial pixel distance. Referring to fig. 3, when the projection of the mark point 25 in the collecting direction of the image collecting device is not located on the axis L in the ablation direction of the sample 14, the method for calculating the distance-to-pixel ratio is the same as above, and is not described again. Referring to fig. 2, the projection of the mark point 15 in the collecting direction of the image collecting device is located on the axis L in the ablation direction of the sample 14, and the mark point 15 can be directly used as a designated reference point, and the initial distance (horizontal distance) between the front end 141 of the sample 14 and the mark point 15 is the initial distance between the front end 141 of the sample 14 and the designated reference point.
Referring to fig. 5, when the apparatus according to the first embodiment is used, an initial image is collected before the high-temperature test is started, the initial pixel distance between the center of the mark point and the edge of the front end of the sample is calculated by identifying the center of the mark point and the edge of the front end of the sample, and the distance-to-pixel ratio is calculated by combining the initial distance (horizontal distance) between the center of the mark point and the front end of the sample measured by the distance measuring device. Then, collecting images in the high-temperature test process, similarly identifying the mark point center and the edge point of the front end of the sample, calculating to obtain the real-time pixel distance between the mark point center and the edge point of the front end of the sample, converting the real-time distance between the mark point center and the edge point of the front end of the sample according to the distance pixel ratio, wherein the difference value between the real-time distance and the initial distance is the ablation amount. By acquiring multiple frames of second images during the high temperature test, the change in ablation volume can be known.
Optionally, when the apparatus according to the second embodiment is used, the projection of the mark point in the collection direction of the image collection device is not located on the axis in the ablation direction of the sample, at this time, according to the identification data of the first image, an initial included angle between a connection line between the front end of the sample and the mark point and the axis in the ablation direction of the sample is determined, an intersection point where the mark point makes a perpendicular line to the axis in the ablation direction of the sample is used as a designated reference point, and according to the distance between the front end of the sample and the mark point and the initial included angle, an initial distance between the front end of the sample and the designated reference point is calculated.
Referring to fig. 3, the projection of the mark point 25 in the collecting direction of the image collecting device is not located on the axis L in the ablation direction of the sample 14, and the ablation amount can be calculated by using the intersection point a of the mark point 25 perpendicular to the axis L in the ablation direction of the sample 14 as a designated reference point. First, from the identification data of the first image, an initial angle θ between a line connecting the leading end 141 of the specimen 14 and the marker 25 and the axis L in the ablation direction of the specimen 14 is determined. A straight line parallel to the axis L can be obtained by performing edge recognition on the straight line edge of the bracket 213, and the included angle between the straight line and the connecting line between the front end 141 of the sample 14 and the marker 25 is θ, or the axis L of the sample 14 can be directly determined by recognizing the image of the sample 14, and the included angle between the connecting line between the front end 141 of the sample 14 and the marker 25 and the axis L is θ, and the calculation method of the initial included angle θ is not limited thereto. Next, the distance between the front end 141 of the sample 14 and the marker 25 can be converted using the initial angle θ, and the initial distance between the front end 141 of the sample 14 and the specified reference point is calculated.
Alternatively, when the apparatus according to the second embodiment is adopted, step S30 may include:
determining a real-time included angle between a connecting line between the front end of the sample and the mark point and an axis in the ablation direction of the sample according to the identification data of the second image;
and calculating the real-time distance between the front end of the sample and the specified reference point according to the real-time pixel distance between the front end of the sample and the mark point, the real-time included angle and the distance pixel ratio.
And after the high-temperature test is started, acquiring a second image for image recognition, calculating a real-time included angle between a connecting line between the front end of the sample and the mark point and an axis in the ablation direction of the sample by adopting the same method, and calculating a real-time pixel distance between the front end of the sample and the mark point. And converting the real-time pixel distance between the front end of the sample and the mark point by using the real-time included angle to obtain the real-time pixel distance between the front end of the sample and the specified reference point.
Referring to fig. 6, when the apparatus according to the second embodiment is used, an initial image is collected before the high-temperature test is started, and the initial pixel distance between the center of the mark point and the edge point of the front end of the sample can be calculated by identifying the center of the mark point and the edge point of the front end of the sample, and the initial included angle between the connecting line between the front end of the sample and the mark point in the image and the axis in the ablation direction of the sample can be calculated by identifying the edge of the bracket. The initial distance (connecting line distance) between the center of the marking point and the front end of the sample is measured by using a distance measuring device, and the initial distance is converted by using the initial included angle, so that the initial distance between the front end of the sample and the specified reference point can be obtained. And calculating the ratio of the initial distance between the front end of the sample and the marking point to the initial pixel distance to obtain the distance-pixel ratio. Then, collecting an image in the high-temperature test process, identifying the center of the mark point and the edge point of the front end of the sample, calculating a real-time included angle between a connecting line between the front end of the sample and the mark point in the image and an axis in the ablation direction of the sample to obtain a real-time pixel distance between the appointed reference point and the edge point of the front end of the sample, converting the real-time distance between the appointed reference point and the edge point of the front end of the sample according to a distance pixel ratio, wherein the difference value between the real-time distance and the initial distance between the front end of the sample and the appointed reference point is the ablation amount. By acquiring multiple frames of second images during the high temperature test, the change in ablation volume can be known.
The main difference between the apparatus of the first embodiment and the apparatus of the second embodiment in calculating the ablation amount is that the position of the mark point changes, which causes the change of the included angle between the connecting line between the front end of the sample and the mark point and the axis of the sample in the ablation direction, the apparatus of the first embodiment corresponds to the case that the included angle is zero, and the apparatus of the second embodiment corresponds to the case that the included angle is not zero, based on which, the position of the mark point can be set as required, and the ablation amount can be calculated by specifically selecting the corresponding method according to the position of the mark point, so that the position of the mark point can be selected according to the different sample and sample fixing devices, for example, the position of the mark point 25 in fig. 3 is adjusted to the fixing head (e.g. the fixing head 112 shown in fig. 1) of the sample fixing device 21 and is not located on the axis of the sample 14 in the ablation direction, and the method for calculating the ablation amount is, the flexibility is good, and the application scope is wider.
According to the equipment applied to the high-temperature ablation test and the ablation amount detection method applied to the high-temperature ablation test, the sample fixing device is provided with the mark points, the distance measuring device is used for measuring the distance between the front end of the sample and the mark points, and the image collecting device can collect images containing the sample and the mark points at the same time. Determining an initial distance and a distance pixel ratio between the front end of the sample and an appointed reference point according to the distance and identification data of the image acquired before the test, wherein the distance pixel ratio represents an actual distance corresponding to the unit pixel distance; calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of the image acquired during the test; and calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance, and further obtaining the ablation amount of the sample. Because the vibration frequencies of the sample fixing device, the mark point and the sample are consistent in the high-temperature test process, the influence of vibration on the detection of the ablation amount is eliminated, and the detection result is more accurate.
The above embodiments are merely illustrative of the principles and utilities of the present application and are not intended to limit the application. Any person skilled in the art can modify or change the above-described embodiments without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical concepts disclosed in the present application shall be covered by the claims of the present application.

Claims (11)

1. The equipment applied to the high-temperature ablation test is characterized by comprising a sample fixing device, an image acquisition device, a distance measuring device and an image processing device, wherein a sample for the high-temperature test is fixed on the sample fixing device, a mark point is arranged on the sample fixing device or the sample, the distance measuring device is used for measuring the distance between the front end of the sample and the mark point, the acquisition direction of the image acquisition device faces to the sample and the mark point, an image simultaneously containing the sample and the mark point can be acquired, and the image acquisition device is connected with the image processing device;
the image processing device is used for processing the distance between the front end of the sample and the marking point, a first image acquired by the image acquisition device before the test and a second image acquired by the image acquisition device during the test, and determining the ablation condition of the sample.
2. The apparatus for high temperature ablation testing according to claim 1, wherein the marking point is different from the color of the sample fixing device or the sample; or the color of the center of the mark point is different from that of the edge of the mark point.
3. The apparatus for high-temperature ablation test according to claim 1, wherein the sample is fixed on the side of the sample fixing device facing the high-temperature loading device, and the marking point is arranged on the side of the sample mounting side or the rear end of the sample.
4. The apparatus applied to the high-temperature ablation test according to claim 3, wherein the projection of the mark point in the collection direction of the image collection device is located on the axis in the ablation direction of the sample.
5. The apparatus for high-temperature ablation test according to claim 1, wherein the sample is fixed on the side of the sample fixing device facing the high-temperature loading device, the sample fixing device is provided with a bracket on the sample mounting side, the sample is juxtaposed with the bracket, and the marking point is arranged on the side of the bracket facing the image acquisition device.
6. The apparatus of claim 1, wherein the image processing device is specifically configured to determine an initial distance and a distance-to-pixel ratio between the front end of the sample and a specified reference point according to the distance between the front end of the sample and the marking point and the identification data of the first image, the projection of the marking point on the axis of the sample in the ablation direction coincides with the specified reference point, and the distance-to-pixel ratio is used to represent an actual distance corresponding to a unit pixel distance on the image; determining a real-time pixel distance between the front end of the sample and the marking point according to the identification data of the second image; calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance; and calculating the ablation amount of the sample according to the initial distance and the real-time distance.
7. A method for detecting ablation amount in a high-temperature test is characterized by comprising the following steps:
s10, determining an initial distance and a distance pixel ratio between the front end of the sample and a specified reference point according to the distance between the front end of the sample and the marker point on the sample fixing device or the sample and identification data of a first image collected before a high-temperature test, wherein the first image simultaneously comprises the sample and the marker point, the projection of the marker point on the axis of the sample in the ablation direction coincides with the specified reference point, and the distance pixel ratio is used for representing the actual distance corresponding to the unit pixel distance on the image;
s20, calculating the real-time pixel distance between the front end of the sample and the mark point according to the identification data of a second image acquired during the high-temperature test, wherein the second image simultaneously comprises the sample and the mark point;
s30, calculating the real-time distance between the front end of the sample and the specified reference point according to the distance pixel ratio and the real-time pixel distance;
and S40, calculating the ablation amount of the sample according to the initial distance and the real-time distance.
8. The ablation amount detection method in the high-temperature test according to claim 7, wherein the step S10 includes:
s11, determining the pixel distance between the front end of the sample and the marking point as an initial pixel distance according to the identification data of the first image;
and S12, calculating the distance between the front end of the sample and the marking point and the ratio of the initial pixel distance to obtain the distance pixel ratio.
9. The ablation amount detection method in the high-temperature test according to claim 7, wherein the step S10 includes:
s13, when the projection of the mark point in the collecting direction of the image collecting device is positioned on the axis in the ablation direction of the sample, the mark point is used as the designated reference point, and the distance between the front end of the sample and the mark point is determined as the initial distance; or the like, or, alternatively,
s14, when the projection of the mark point in the collection direction of the image collection device is not located on the axis in the ablation direction of the sample, determining an initial included angle between a connecting line between the front end of the sample and the mark point and the axis in the ablation direction of the sample according to the identification data of the first image, taking the intersection point of the mark point making a perpendicular line to the axis in the ablation direction of the sample as the specified reference point, and calculating the initial distance between the front end of the sample and the specified reference point according to the distance between the front end of the sample and the mark point and the initial included angle.
10. The ablation amount detection method in the high-temperature test according to claim 9, wherein the step S30 includes:
when the projection of the mark point in the acquisition direction of the image acquisition device is not positioned on the axis in the ablation direction of the sample, determining a real-time included angle between a connecting line between the front end of the sample and the mark point and the axis in the ablation direction of the sample according to the identification data of the second image;
and calculating the real-time distance between the front end of the sample and the specified reference point according to the real-time pixel distance between the front end of the sample and the mark point, the real-time included angle and the distance pixel ratio.
11. The ablation amount detection method of the high-temperature test according to claim 7 or 8, wherein the step S11 or the step S20 includes:
hough transformation is carried out on a mark point region in an image, Canny edge detection is carried out on the region of the sample, and the central position coordinates of the mark point and the front end edge position coordinates of the sample are respectively obtained;
and calculating the pixel distance between the front end of the sample and the mark point according to the central position coordinates of the mark point and the position coordinates of the edge position of the front end of the sample.
CN202110427053.1A 2021-04-20 2021-04-20 Equipment applied to high-temperature ablation test and ablation amount detection method of high-temperature test Pending CN113109499A (en)

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