CN113093265A - Method for calibrating field angle of electronic detector - Google Patents
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- CN113093265A CN113093265A CN202110459112.3A CN202110459112A CN113093265A CN 113093265 A CN113093265 A CN 113093265A CN 202110459112 A CN202110459112 A CN 202110459112A CN 113093265 A CN113093265 A CN 113093265A
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Abstract
The invention discloses a method for calibrating a field angle of an electronic detector, which is realized based on calibration equipment, wherein the calibration equipment comprises: the electron detector is placed on a rotary table of the vacuum target chamber, and the electron accelerator is used for emitting electron beam current to the vacuum target chamber; the method comprises the following steps: testing and calibrating the view field of the electronic detector; testing and calibrating the field resolution of the electronic detector; and testing and calibrating the directional flux response factor of the electronic detector. The method realizes the calibration test of the field of view and the field resolution of the electronic detector through the electronic accelerator and the turntable; the flux response factor of the sub-field-of-view detector can correct the accurate response of the sub-probes in different directions to the flux of the environmental particles.
Description
Technical Field
The invention relates to the field of electronic detection, in particular to a method for calibrating a field angle of an electronic detector.
Background
Electrons in the space are important particle radiation sources in the space radiation environment, and are important bases for developing forecasting and alarming of disastrous time such as magnetic storms and the like, monitoring and evaluation of spacecraft radiation effects such as charging and discharging and the like and radiation-resistant reinforcement design. The detection of electrons in space is typically achieved by an electron detector.
When a new electronic detector is developed, various indexes of the new electronic detector need to be tested and verified to judge whether the electronic detector meets the design requirements.
The field angle is an important index of the electronic detector, and an effective field angle calibration method of the electronic detector is lacked at present.
Disclosure of Invention
The invention aims to overcome the technical defects and provides a method for calibrating the field angle of an electronic detector, which adopts the following technical scheme:
a method for calibrating a field angle of an electronic detector is realized based on a calibration device, and the calibration device comprises: the electronic detector is placed on a rotary table of the vacuum target chamber, and the center of a small hole of the electronic detector is positioned on a rotary axis of the rotary table; the electron accelerator is used for emitting electron beam current to the vacuum target chamber; the method comprises the following steps:
testing and calibrating the view field of the electronic detector;
testing and calibrating the field resolution of the electronic detector;
and testing and calibrating the directional flux response factor of the electronic detector.
As an improvement of the above method, the test calibration of the field of view of the electronic detector includes:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output an electron beam with a stable flux rate according to the selected electron beam energy point, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
controlling the rotary table to rotate anticlockwise, and recording a rotation angle theta 1 of the rotary table at the moment when the output count of the electronic detector is not 0;
continuing to control the rotary table to rotate anticlockwise, and recording the rotation angle theta 2 of the rotary table at the moment when the output count of the electronic detector is 0 again;
the maximum field of view θ of the electronic detector is θ 2 — θ 1.
As an improvement of the above method, the test calibration is performed on the field resolution of the electronic detector; the method comprises the following steps:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output an electron beam with a stable flux rate according to the selected electron beam energy point, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
controlling the rotary table to rotate anticlockwise, and sequentially recording the maximum counting rate N of the ith sub-field of view of the electronic detector in the rotating processi，1≤i≤M；
Sequentially recording the output count of the electronic detector as N when the rotary table rotatesiAt/2, the rotation angles theta i1 and theta i2 of the turntable are equal, and the ith sub-field resolution FWHMθiComprises the following steps:
FWHMθi＝θi2-θi1。
as an improvement of the above method, the test calibration of the directional flux response factor of the electronic detector includes:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output electron beams with stable flux rate according to the selected energy points, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
setting the rotary table to rotate anticlockwise at a constant speed of 0.1 degree/s, and sequentially recording by ground inspection equipment to obtain an electronic flux response curve of M sub-fields of the electronic detector;
respectively integrating the ith curve to obtain the total count A of the ith sub-field of view of the electronic detectori；
Calculate the maximum Total count Amax＝max(Ai)；
A is to bemaxTaking the flux response correction factor mu of the ith sub-visual field as a reference to be normalizedi：
μi＝Amax/Ai。
The invention has the advantages that:
1. the method realizes the calibration test of the field of view and the field resolution of the electronic detector through the electronic accelerator and the turntable;
2. the method of the invention can correct the accurate response of the sub-probes in different directions to the environmental particle flux through the flux response factor of the sub-field detector.
Drawings
FIG. 1 is a connection diagram of a targeting device of the present invention;
FIG. 2 is a flow chart of a method for calibrating the field angle of the electronic detector according to the present invention;
fig. 3 is a schematic diagram of the count rate of three central subfields during rotation.
Detailed Description
The technical solution of the present invention will be described in detail below with reference to the accompanying drawings.
An important work after the electronic detector is developed is to use beam current to test and calibrate a prototype. The accelerator test is the best means for checking the performance and indexes of a prototype, and the main calibration contents comprise a measurement range, energy resolution and measurement precision.
As shown in fig. 1, the constructed scaling apparatus includes: the electron beam detector comprises an electron accelerator, a vacuum target chamber and ground detection equipment, wherein an electron detector is arranged on a rotary turntable of the vacuum target chamber, and the electron accelerator is used for emitting electron beam current to the vacuum target chamber. The calibration of the field angle and the angular resolution can also use the single-energy electron beam of the electron accelerator, and the target chamber turntable drives the medium-high energy electron detector to rotate to respond to the incident electron beam.
As shown in fig. 2, based on the above calibration apparatus, the present invention provides a method for calibrating a field angle of an electronic detector, including:
step 1) testing and calibrating the view field of the electronic detector, comprising the following steps:
fixing an electronic detector on a turntable of an accelerator target chamber, wherein the center of a small hole imaging detector is positioned on a rotating axis of the turntable;
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output electron beams with stable flux rate according to the selected energy points, and irradiating an electron detector;
the turntable is controlled to rotate clockwise by the console until the output count of the detector is 0;
controlling the rotary table to rotate anticlockwise through the control console, and recording a rotation angle theta 1 of the rotary table at the moment when the output count of the detector is not 0;
the rotary table continues to rotate, and the maximum counting rates N1, N2 and N3 of the three central sub-fields in the rotating process are recorded in sequence; as shown in fig. 3; in this embodiment, the electron detector has 3 central subfields;
when the output counts of all the detectors are 0, recording the rotation angle theta 2 of the rotary table at the moment;
the maximum field of view of the detector is θ 2 — θ 1.
Step 2) testing and calibrating the field angle resolution of the electronic detector; the method comprises the following steps:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output electron beams with stable flux rate according to the selected energy points, and irradiating an electron detector;
the turntable is controlled to rotate clockwise by the console until the output count of the detector is 0;
controlling the rotary table to rotate anticlockwise through the control console, and recording a rotation angle theta 1 of the rotary table at the moment when the output count of the detector is not 0;
the rotary table continues to rotate, and the maximum counting rates N1, N2 and N3 of the three central sub-fields in the rotating process are recorded in sequence;
recording the rotation angles theta 11, theta 12, theta 21, theta 22, theta 31 and theta 32 of the rotary table when the output counts of the three direction detectors are respectively N1/2, N2/2 and N3/2 when the rotary table rotates, and calculating the resolution of three sub-fields of view as follows:
FWHMθ1＝θ12-θ11
FWHMθ2＝θ22-θ21
FWHMθ3＝θ32-θ31
step 3) testing and calibrating the directional flux response factor of the electronic detector,
since the accelerator flux intensity is unchanged, theoretically the individual sub-field angle counts should be the same, but since the peripheral field of view is tilted with respect to the intermediate field of view, the effective detection area requires an angle of x cos, and for correction, a correction factor is introduced. And the counting consistency of the corrected detection data of all the sub-fields is ensured for any fixed flux output.
The method comprises the following steps:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output electron beams with stable flux rate according to the selected energy points, and irradiating an electron detector;
the turntable is controlled to rotate clockwise by the console until the output count of the detector is 0;
setting the rotary table to rotate anticlockwise at a constant speed of 0.1 degree/s, and sequentially recording by ground detection equipment to obtain electronic flux response curves of the detectors in the three directions in the upper figure;
respectively integrating the three curves to obtain the total counts of the three detectors, namely N1, N2 and N3;
and carrying out normalization processing by taking the middle sub-view field as a reference to obtain flux response correction factors of the left sub-view field and the right sub-view field, wherein the flux response correction factors are respectively as follows:
μ1＝N2/N1
μ2＝1
μ3＝N2/N3
finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present invention and are not limited. Although the present invention has been described in detail with reference to the embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (4)
1. A method for calibrating a field angle of an electronic detector is realized based on a calibration device, and the calibration device comprises: the electronic detector is placed on a rotary table of the vacuum target chamber, and the center of a small hole of the electronic detector is positioned on a rotary axis of the rotary table; the electron accelerator is used for emitting electron beam current to the vacuum target chamber; the method comprises the following steps:
testing and calibrating the view field of the electronic detector;
testing and calibrating the field resolution of the electronic detector;
and testing and calibrating the directional flux response factor of the electronic detector.
2. The method for calibrating the field angle of an electronic detector according to claim 1, wherein the test calibration of the field angle of the electronic detector comprises:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output an electron beam with a stable flux rate according to the selected electron beam energy point, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
controlling the rotary table to rotate anticlockwise, and recording a rotation angle theta 1 of the rotary table at the moment when the output count of the electronic detector is not 0;
continuing to control the rotary table to rotate anticlockwise, and recording the rotation angle theta 2 of the rotary table at the moment when the output count of the electronic detector is 0 again;
the maximum field of view θ of the electronic detector is θ 2 — θ 1.
3. The method for calibrating the field angle of an electronic detector according to claim 1, wherein the test calibration is performed on the resolution of the field of view of the electronic detector; the method comprises the following steps:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output an electron beam with a stable flux rate according to the selected electron beam energy point, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
controlling the rotary table to rotate anticlockwise, and sequentially recording the maximum counting rate N of the ith sub-field of view of the electronic detector in the rotating processi，1≤i≤M；
Sequentially recording the output count of the electronic detector as N when the rotary table rotatesiAt/2, the rotation angles theta i1 and theta i2 of the turntable are equal, and the ith sub-field resolution FWHMθiComprises the following steps:
FWHMθi＝θi2-θi1。
4. the method for calibrating the field angle of an electronic detector according to claim 3, wherein the test calibration of the directional flux response factor of the electronic detector comprises:
selecting an electron beam energy point of the electron accelerator according to the index requirement;
controlling an electron accelerator to output electron beams with stable flux rate according to the selected energy points, and irradiating an electron detector;
controlling the rotary table to rotate clockwise until the output count of the electronic detector is 0;
setting the rotary table to rotate anticlockwise at a constant speed of 0.1 degree/s, and sequentially recording by ground inspection equipment to obtain an electronic flux response curve of M sub-fields of the electronic detector;
respectively integrating the ith curve to obtain the total count A of the ith sub-field of view of the electronic detectori；
Calculate the maximum Total count Amax＝max(Ai)；
A is to bemaxTaking the flux response correction factor mu of the ith sub-visual field as a reference to be normalizedi：
μi＝Amax/Ai。
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