CN113092418A - Testing device and testing method for quantum dot product - Google Patents
Testing device and testing method for quantum dot product Download PDFInfo
- Publication number
- CN113092418A CN113092418A CN202110354695.3A CN202110354695A CN113092418A CN 113092418 A CN113092418 A CN 113092418A CN 202110354695 A CN202110354695 A CN 202110354695A CN 113092418 A CN113092418 A CN 113092418A
- Authority
- CN
- China
- Prior art keywords
- quantum dot
- dot product
- light source
- testing
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/559—Determining variation of specular reflection within diffusively reflecting sample
Abstract
The invention discloses a testing device and a testing method of a quantum dot product, wherein the testing device comprises: the integrating sphere is internally provided with a cavity, and an opening and closing door is formed on the integrating sphere; the reflecting module defines an inner cavity, a light source is arranged at the bottom of the inner cavity, and the light incidence direction of the light source faces to the top opening of the inner cavity from the bottom of the inner cavity; and the glass pressing sheet is arranged at the top opening of the inner cavity and used for pressing the quantum dot product to be tested between the reflection module and the glass pressing sheet when the test is carried out. The invention can realize the test of the quantum dot product.
Description
Technical Field
The invention relates to the technical field of quantum dot product processing, in particular to a testing device and a testing method for a quantum dot product.
Background
Quantum dot products include a "sandwich" structure based on quantum dot materials and high stability optical colloid encapsulation, such as quantum dot films, quantum dot plates, quantum dot tubes, and the like. Due to the existence of other non-luminescent substances in the quantum dot product, the absorption of light by these substances needs to be considered when testing the performance (e.g., quantum efficiency, light energy conversion efficiency) of the quantum dot product. Therefore, direct testing can result in inaccurate test results.
Thus, the prior art remains to be improved.
Disclosure of Invention
The embodiment of the invention provides a testing device and a testing method of a quantum dot product, and aims to solve the technical problem that when the quantum dot product is tested in the prior art, the testing result is inaccurate due to direct testing.
The embodiment of the invention provides a testing device of a quantum dot product, which comprises:
the integrating sphere is internally provided with a cavity, and an opening and closing door is formed on the integrating sphere;
the reflecting module defines an inner cavity, a light source is arranged at the bottom of the inner cavity, and the light incidence direction of the light source faces to the top opening of the inner cavity from the bottom of the inner cavity; the glass pressing sheet is arranged at the top opening of the inner cavity and used for pressing the quantum dot product to be tested between the reflection module and the glass pressing sheet when the test is carried out.
In one embodiment, the light source adopts blue light of 380nm to 500 nm; and/or
The light source is positioned at the center of the cavity.
In one embodiment, a reflective sheet is arranged on the inner wall of the inner cavity of the reflective module, the reflectivity of the reflective sheet is greater than or equal to 90%, and the reflective sheet is white or silver.
In one embodiment, the glass pressing sheet is transparent glass, the thickness of the glass pressing sheet is greater than or equal to 2mm, and the transmittance of the glass pressing sheet under 380-780 nm light is greater than or equal to 98%.
In one embodiment, the outer contour of the reflection module is a circular truncated cone, the light source is arranged on one side, close to the upper bottom surface, of the inside of the circular truncated cone, the radius of the upper bottom surface of the circular truncated cone is, the radius of the lower bottom surface of the circular truncated cone is, and the height of the circular truncated cone is 10-20 mm.
In an embodiment, the outline of reflection module is the cuboid, the light source sets up the inside one side that is close to the bottom surface of going up of cuboid, the length of cuboid is more than or equal to 130mm, the wide more than or equal to 140mm of cuboid, the height of cuboid is 10 ~ 20 mm.
The embodiment of the invention also provides a test method of the quantum dot product, which is applied to the test device of the quantum dot product, and the method comprises the following steps:
closing a switch door of the integrating sphere, starting a light source, and recording first test data acquired by the integrating sphere;
opening a switch door of the integrating sphere, and placing a quantum dot product to be tested between the glass pressing sheet and the reflection module, wherein the quantum dot product to be tested completely covers the top opening of the reflection module;
closing a switch door of the integrating sphere and recording second test data obtained by the integrating sphere;
and calculating the test result of the quantum dot product to be tested according to the first test data and the second test data.
In one embodiment, the first test data includes: a first photon number corresponding to an emission spectrum of the light source, first energy carried by the first photon number, a second photon number corresponding to a spectrum range outside the emission spectrum of the light source, and second energy carried by the second photon number;
the second test data includes: a third photon number corresponding to the emission spectrum of the light source, a third energy carried by the third photon number, a fourth photon number corresponding to a spectral range outside the emission spectrum of the light source, and a fourth energy carried by the fourth photon number.
In one embodiment, the emission spectrum of the light source is 380-500 nm, and the spectrum range outside the emission spectrum of the light source is 500-780 nm.
In an embodiment, the step of calculating the test result of the quantum dot product to be tested according to the first test data and the second test data includes:
calculating a first difference between the fourth number of photons and the second number of photons;
calculating a second difference between the first number of photons and the third number of photons;
taking the ratio of the first difference value to the second difference value as the quantum efficiency of the quantum dot product to be measured;
and taking the quantum efficiency as a test result of the quantum dot product to be tested.
In an embodiment, the step of calculating the test result of the quantum dot product to be tested according to the first test data and the second test data further includes:
calculating a third difference between the fourth energy and the second energy;
calculating a fourth difference between the first energy and the third energy;
taking the ratio of the third difference value to the fourth difference value as the light energy conversion efficiency of the quantum dot product to be measured;
and taking the light energy conversion efficiency as a test result of the quantum dot product to be tested.
In the technical scheme of this embodiment, the quantum dot product can be tested according to the test data only by respectively obtaining the test data in the state where the quantum dot product to be tested is not placed in the integrating sphere and the state where the quantum dot product to be tested is placed in the integrating sphere.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic diagram of a hardware architecture in which a quantum dot product to be tested is not placed in a testing apparatus for a quantum dot product according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a hardware architecture in which a quantum dot product to be tested is placed in a testing apparatus for a quantum dot product according to an embodiment of the present invention;
fig. 3 is a schematic flow chart of a testing method of a quantum dot product according to a first embodiment of the invention.
Description of reference numerals:
the implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
The invention provides a testing device of a quantum dot product, which comprises: integrating sphere 1, reflection module 3 and glass pressure piece 4. A cavity is arranged in the integrating sphere 1, and a switch door is formed on the integrating sphere 1; the reflection module 3 defines an inner cavity, the bottom of the inner cavity is provided with the light source 2, and the light incidence direction of the light source 2 faces to the top opening of the inner cavity from the bottom of the inner cavity; the glass pressing sheet 4 is arranged at the opening at the top of the inner cavity and used for pressing a quantum dot product to be tested between the reflection module 3 and the glass pressing sheet 4 when the test is carried out.
As shown in fig. 1, the glass pressing plate 4 is disposed at the top opening of the reflection module 3, and the opening and closing door is used for opening and closing the integrating sphere. When the quantum dot product to be tested is not arranged, after the integrating sphere 1 is closed, a cavity in the integrating sphere 1 is a closed space; the light incident direction of the light source 2 is from the bottom of the inner cavity to the top opening of the reflective module 3, and it is easy to understand that after the light source 2 emits light, the inner wall of the reflective module 3 reflects the light to be collected to the top opening of the reflective module 3.
Further, after the top opening of the reflection module 3 is provided with the quantum dot product 5 to be tested, the testing device of the quantum dot product is as shown in fig. 2, the quantum dot product 5 is pressed between the reflection module 3 and the glass pressing sheet 4, wherein the projection of the top opening of the reflection module 3 on the quantum dot product to be tested is located in the region of the quantum dot product to be tested, that is, the quantum dot product to be tested completely covers the top opening of the reflection module 3.
Alternatively, the light source 2 uses blue light of 380nm to 500 nm. Optionally, the light source 2 is located at the center of the cavity of the integrating sphere 1, and the type of the light source 2 may be an LED lamp, and the like, which is not limited herein.
Optionally, a reflector plate is disposed on an inner wall of the inner cavity of the reflection module 3, and the reflectivity of the reflector plate is greater than or equal to 90%. Optionally, the reflective sheet may be white or silver to reduce light loss.
Optionally, the glass preform 4 is transparent glass. Optionally, the thickness of the glass preform 4 is 2mm or more, preferably 2mm to 10 mm. Optionally, the transmittance of the glass pressing sheet 4 under 380-780 nm light is greater than or equal to 98%.
Optionally, the outer contour of the reflection module 3 is a circular truncated cone, the light source 2 is disposed on one side of the inside of the circular truncated cone, which is close to the upper bottom surface, the radius of the upper bottom surface of the circular truncated cone is greater than or equal to 100mm, preferably 100mm to 120mm, the radius of the lower bottom surface of the circular truncated cone is greater than the radius of the upper bottom surface and greater than or equal to 130mm, preferably 130mm to 140mm, and the height of the circular truncated cone is 10mm to 20.
Optionally, the outer profile of reflection module 3 is the cuboid, and light source 2 sets up the inside one side that is close to the bottom surface of going up of cuboid, and the length of cuboid is greater than or equal to 130mm, and the width of cuboid is greater than or equal to 140mm, and the height of cuboid is 10 ~ 20mm, and wherein, 130mm is preferred to the length of cuboid, 140mm is preferred to the width of cuboid, and 15mm is preferred to the height of cuboid.
For the testing device of the quantum dot product of the embodiment, the quantum dot product can be tested according to the test data only by respectively obtaining the test data in the state that the quantum dot product to be tested is not placed in the integrating sphere and the state that the quantum dot product to be tested is placed in the integrating sphere.
Referring to fig. 3, the present invention provides a method for testing a quantum dot product, which may be based on the testing apparatus for the quantum dot product described above, the method including the following steps:
and step S10, closing the switch door of the integrating sphere, starting the light source, and recording first test data acquired by the integrating sphere.
The integrating sphere is a hollow sphere with the inner wall coated with white or silver diffuse reflection material, and is also called a photometric sphere or a light-passing sphere.
In this embodiment, after a switch gate of the integrating sphere is closed, a photon number corresponding to the integrating sphere in the current state can be obtained as first test data, where the photon number is a photon number when the integrating sphere is not provided with a quantum dot product to be tested, and the photon number is detected and obtained by the integrating sphere and is a photon number corresponding to an emission spectrum of a light source in a cavity of the integrating sphere and a photon number corresponding to a spectrum range outside the emission spectrum of the light source.
Optionally, after the light source is turned on, the test is performed after the light source is stabilized, for example: the test was performed after turning on the light source for 2 minutes.
And S20, opening a switch door of the integrating sphere, and placing the quantum dot product to be tested between the glass pressing sheet and the reflection module, wherein the quantum dot product to be tested completely covers the top opening of the reflection module.
And step S30, closing the switch door of the integrating sphere and recording second test data acquired by the integrating sphere.
In this embodiment, after the switch gate of the integrating sphere is closed for the second time, the number of photons corresponding to the integrating sphere in the current state can be obtained as second test data, where the number of photons is the number of photons when the integrating sphere is placed with a quantum dot product to be tested, and the number of photons detected and obtained by the integrating sphere is the number of photons corresponding to the emission spectrum of the light source in the cavity of the integrating sphere and the number of photons corresponding to the spectrum range outside the emission spectrum of the light source.
Optionally, the quantum dot product is connected with a terminal processor, wherein the integrating sphere can automatically detect the first test data and the second test data and transmit the first test data and the second test data to the terminal processor, and a tester can visually know the first test data and the second test data through the terminal.
Optionally, after the light source is turned on, light is emitted from the top of the reflection module, and the rest positions of the reflection module are free from light leakage.
Optionally, the emission spectrum range corresponding to the light source may be obtained by using preset hardware parameters of the light source. Similarly, the spectral range outside the emission spectrum of the light source can be determined, and then the number of photons corresponding to the emission spectrum of the light source in the cavity of the integrating sphere and the number of photons corresponding to the spectral range outside the emission spectrum of the light source can be determined. In the present embodiment, the spectrum directly generated by the light emitted from the light source is called an emission spectrum (emission spectrum). Atoms or molecules at high energy levels produce radiation when they transition to lower energy levels, emitting excess energy out of the resulting spectrum, which is called excitation, in order for an atom or molecule to be at a higher energy level. The transition of excited atoms and molecules at higher energy levels to lower energy levels to emit photons with frequency n mostly adopts emission spectra in the research of atomic spectra, for example: when the hydrogen atom is in a normal state, the electron moves on a possible orbit with n ═ 1 nearest to the nucleus, and the energy of the electron is stable at least. When an atom is excited by an external factor, an electron absorbs certain energy and jumps to other possible orbitals with higher energy, and the electron is unstable. It can jump to possible orbit with lower energy level spontaneously and emit a photon, the spectral lines emitted when jumping from different possible orbits with higher energy to the same possible orbit with lower energy belong to the same line system, and the spectral lines emitted when electrons jump from possible orbits such as 3, 4, 5, 6 … … to possible orbits with n being 2 belong to the Barl end line system. A large number of atoms in an excited state emit different spectral lines to form all spectral lines of a hydrogen atomic spectrum, and due to different generation conditions, an emission spectrum can be divided into a continuous spectrum and a bright line spectrum.
Optionally, the acquisition of the emission spectrum may be determined according to a device parameter corresponding to the light source, and specifically, the parameter device is a testing device pre-stored in the quantum dot product and is associated with the light source.
In the technical solution of this embodiment, the emission spectrum and the spectrum range outside the emission spectrum are predetermined, for example, the light-emitting wavelength band region in the visible light range and the light-emitting wavelength band region outside the visible light range are predetermined, so that the first photon number, the second photon number, the third photon number, and the fourth photon number can be obtained, and further, the test of the quantum dot product is realized.
And step S40, calculating the test result of the quantum dot product to be tested according to the first test data and the second test data.
In this embodiment, the light energy conversion efficiency and/or the quantum efficiency corresponding to the quantum dot product to be tested can be calculated based on the first test data and the second test data.
Optionally, the first test data includes: a first photon number corresponding to an emission spectrum of a light source, first energy carried by the first photon number, a second photon number corresponding to a spectrum range outside the emission spectrum of the light source, and second energy carried by the second photon number; the second test data includes: the light source comprises a third photon number corresponding to the emission spectrum of the light source, third energy carried by the third photon number, a fourth photon number corresponding to a spectrum range outside the emission spectrum of the light source and fourth energy carried by the fourth photon number.
Furthermore, the invention provides a quantum efficiency concept of the quantum dot product, and the ratio of the number of photons corresponding to the wavelength of the light passing through the quantum dot product to the number of photons corresponding to the wavelength of the original light not passing through the quantum dot product (the quantum dot product to be tested is not placed during the test) is tested, and the ratio is used as the quantum efficiency.
Optionally, when testing is performed, the quantum dot product to be tested is not placed, then the testing device of the quantum dot product is closed, the light source is powered on, after the light source is stabilized, blue light source data in no-load state is tested, and a first photon number F is obtained1And a second number of photons F2. Then, opening the testing device of the quantum dot product, taking down the glass pressing sheet, completely covering the quantum dot product to be tested on the top of the reflection module, and pressing the glass pressing sheet right above the quantum dot product to be tested, wherein optionally, the quantum dot product can exceed the top by 0-2 mm when completely covering the top, so as to reduce the experiment difficulty; after the steps are completed, the integrating sphere is closed, and the data of the quantum dot product to be tested is tested to obtain a third photon number F3And a second number of photons F4。
Optionally, for the acquisition of the first test data and the second test data, multiple measurements may be performed to ensure the accuracy and stability of the data, for example, an average of the multiple measurements may be calculated as a measurement result.
Optionally, calculating a first difference between the fourth photon number and the second photon number; calculating a second difference between the first photon number and the third photon number; taking the ratio of the first difference value to the second difference value as the quantum efficiency of the quantum dot product to be measured; the quantum efficiency is used as a test result of a quantum dot product to be tested, and a calculation formula of the quantum efficiency is as follows:
optionally, calculating a third difference between the fourth energy and the second energy; calculating a fourth difference between the first energy and the third energy; taking the ratio of the third difference value to the fourth difference value as the light energy conversion efficiency of the quantum dot product to be measured; the light energy conversion efficiency is used as a test result of the quantum dot product to be tested, and the calculation formula of the light energy conversion efficiency is as follows:
wherein the first photon number F1The energy carried is E1(ii) a Second number of photons F2The energy carried is E2(ii) a Third number of photons F3The energy carried is E3(ii) a Fourth number of photons F4The energy carried is E4. Specifically, the frequencies corresponding to the first photon number, the second photon number, the third photon number, and the fourth photon number are determined, and optionally, the wavelengths of the light corresponding to the photon numbers may be calculated first, and then the frequencies corresponding to the first photon number, the second photon number, the third photon number, and the fourth photon number are calculated according to the wavelengths; and then calculating the energy value corresponding to the first photon number according to the frequency corresponding to the first photon number, calculating the energy value corresponding to the second photon number according to the frequency corresponding to the second photon number, calculating the energy value corresponding to the third photon number according to the frequency corresponding to the third photon number, and calculating the energy value corresponding to the fourth photon number according to the frequency corresponding to the fourth photon number. The specific formula is as follows:
E＝hv
where E is energy, h is Planckian constant, and v is frequency.
OptionalTaking the common red and green quantum dot product as an example, the light source adopts blue light of 380nm-500 nm. When the quantum dot product to be tested is not placed in the testing device of the quantum dot product, F1The number of photons of the light source in the range of 380nm-500 nm; f2Is the number of photons of the light source in the range of 500nm-780 nm. When the quantum dot product to be tested is placed in the testing device of the quantum dot product, F3The number of photons in the range of 380nm-500nm collected by the testing device of the quantum dot product during the test of the quantum dot product to be tested. F4The number of photons in the range of 500nm-780nm collected by the testing device of the quantum dot product during the testing of the quantum dot product to be tested.
In the technical scheme of this embodiment, the number of photons corresponding to the emission spectrum of the light source in the cavity of the integrating sphere in the testing device of the quantum dot product and the number of photons corresponding to the spectrum range outside the emission spectrum of the light source can be determined by the testing device of the quantum dot product, so that when the first number of photons and the second number of photons corresponding to the quantum dot product to be tested in the testing device of the quantum dot product are obtained, the testing of the quantum dot product can be realized based on the detection data obtained by presetting.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
It should be noted that in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. A device for testing a quantum dot product, comprising:
the integrating sphere is internally provided with a cavity, and an opening and closing door is formed on the integrating sphere;
the reflecting module defines an inner cavity, a light source is arranged at the bottom of the inner cavity, and the light incidence direction of the light source faces to the top opening of the inner cavity from the bottom of the inner cavity;
the glass pressing sheet is arranged at the top opening of the inner cavity and used for pressing the quantum dot product to be tested between the reflection module and the glass pressing sheet when the test is carried out.
2. The device for testing quantum dot products according to claim 1, wherein the light source employs blue light of 380nm to 500 nm; and/or
The light source is positioned at the center of the cavity.
3. The device for testing the quantum dot product according to claim 1, wherein a reflective sheet is arranged on the inner wall of the inner cavity of the reflection module, the reflectivity of the reflective sheet is greater than or equal to 90%, and the reflective sheet is white or silver.
4. The device for testing the quantum dot product according to claim 1, wherein the glass preform is transparent glass, the thickness of the glass preform is greater than or equal to 2mm, and the transmittance of the glass preform under 380-780 nm light is greater than or equal to 98%.
5. The testing device for the quantum dot product according to claim 1, wherein the outer contour of the reflection module is a circular truncated cone, the light source is arranged on one side of the inside of the circular truncated cone close to the upper bottom surface, the radius of the upper bottom surface of the circular truncated cone is greater than or equal to 100mm, the radius of the lower bottom surface of the circular truncated cone is greater than the radius of the upper bottom surface and greater than or equal to 130mm, and the height of the circular truncated cone is 10-20 mm; and/or
The outer contour of reflection module is the cuboid, the light source sets up the inside one side that is close to the bottom surface of cuboid, the length of cuboid is greater than or equal to 130mm, the width of cuboid is greater than or equal to 140mm, the height of cuboid is 10 ~ 20 mm.
6. A method for testing a quantum dot product, which is applied to the device for testing a quantum dot product according to claim 1, the method comprising:
closing a switch door of the integrating sphere, starting a light source, and recording first test data acquired by the integrating sphere;
opening a switch door of the integrating sphere, and placing a quantum dot product to be tested between the glass pressing sheet and the reflection module, wherein the quantum dot product to be tested completely covers the top opening of the reflection module;
closing a switch door of the integrating sphere and recording second test data obtained by the integrating sphere;
and calculating the test result of the quantum dot product to be tested according to the first test data and the second test data.
7. The method of testing a quantum dot product of claim 6, wherein the first test data comprises: a first photon number corresponding to an emission spectrum of the light source, first energy carried by the first photon number, a second photon number corresponding to a spectrum range outside the emission spectrum of the light source, and second energy carried by the second photon number;
the second test data includes: a third photon number corresponding to the emission spectrum of the light source, a third energy carried by the third photon number, a fourth photon number corresponding to a spectral range outside the emission spectrum of the light source, and a fourth energy carried by the fourth photon number.
8. The method for testing a quantum dot product according to claim 6, wherein the emission spectrum of the light source is 380 to 500nm, and the spectral range outside the emission spectrum of the light source is 500 to 780 nm.
9. The method for testing a quantum dot product according to any one of claims 6 to 8, wherein the step of calculating the test result of the quantum dot product to be tested according to the first test data and the second test data comprises:
calculating a first difference between the fourth number of photons and the second number of photons;
calculating a second difference between the first number of photons and the third number of photons;
taking the ratio of the first difference value to the second difference value as the quantum efficiency of the quantum dot product to be measured;
and taking the quantum efficiency as a test result of the quantum dot product to be tested.
10. The method for testing a quantum dot product according to any one of claims 6-8, wherein the step of calculating the test result of the quantum dot product to be tested according to the first test data and the second test data further comprises:
calculating a third difference between the fourth energy and the second energy;
calculating a fourth difference between the first energy and the third energy;
taking the ratio of the third difference value to the fourth difference value as the light energy conversion efficiency of the quantum dot product to be measured;
and taking the light energy conversion efficiency as a test result of the quantum dot product to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110354695.3A CN113092418A (en) | 2021-03-31 | 2021-03-31 | Testing device and testing method for quantum dot product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110354695.3A CN113092418A (en) | 2021-03-31 | 2021-03-31 | Testing device and testing method for quantum dot product |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113092418A true CN113092418A (en) | 2021-07-09 |
Family
ID=76672415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110354695.3A Pending CN113092418A (en) | 2021-03-31 | 2021-03-31 | Testing device and testing method for quantum dot product |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113092418A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001250675A (en) * | 2000-03-03 | 2001-09-14 | Japan Science & Technology Corp | Method for measuring quantum efficiency of electroluminescent element and system used for the same |
| JP2006125940A (en) * | 2004-10-27 | 2006-05-18 | Nippon Hoso Kyokai <Nhk> | Photoluminescence quantum yield measurement method and device used therein |
| US20110271738A1 (en) * | 2008-10-21 | 2011-11-10 | Mcgill R Andrew | Analyte detection with infrared light |
| US20140264073A1 (en) * | 2013-03-12 | 2014-09-18 | Nathan McLaughlin | Photoluminescence quantum yield (plqy) test of quantum dot (qd) films |
| CN104502319A (en) * | 2014-12-25 | 2015-04-08 | 重庆大学 | Measurement device and measurement method of fluorescence quantum efficiency of half integrating spheres |
| CN105738339A (en) * | 2016-03-30 | 2016-07-06 | 东南大学 | Device for measuring quantum efficiency of fluorescent powder |
| CN210294747U (en) * | 2019-09-30 | 2020-04-10 | 惠州视维新技术有限公司 | Quantum dot color filter, liquid crystal display panel and display device |
| CN111077122A (en) * | 2019-12-17 | 2020-04-28 | 浙江光塔节能科技有限公司 | Quantum dot temperature detection device |
-
2021
- 2021-03-31 CN CN202110354695.3A patent/CN113092418A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001250675A (en) * | 2000-03-03 | 2001-09-14 | Japan Science & Technology Corp | Method for measuring quantum efficiency of electroluminescent element and system used for the same |
| JP2006125940A (en) * | 2004-10-27 | 2006-05-18 | Nippon Hoso Kyokai <Nhk> | Photoluminescence quantum yield measurement method and device used therein |
| US20110271738A1 (en) * | 2008-10-21 | 2011-11-10 | Mcgill R Andrew | Analyte detection with infrared light |
| US20140264073A1 (en) * | 2013-03-12 | 2014-09-18 | Nathan McLaughlin | Photoluminescence quantum yield (plqy) test of quantum dot (qd) films |
| CN104502319A (en) * | 2014-12-25 | 2015-04-08 | 重庆大学 | Measurement device and measurement method of fluorescence quantum efficiency of half integrating spheres |
| CN105738339A (en) * | 2016-03-30 | 2016-07-06 | 东南大学 | Device for measuring quantum efficiency of fluorescent powder |
| CN210294747U (en) * | 2019-09-30 | 2020-04-10 | 惠州视维新技术有限公司 | Quantum dot color filter, liquid crystal display panel and display device |
| CN111077122A (en) * | 2019-12-17 | 2020-04-28 | 浙江光塔节能科技有限公司 | Quantum dot temperature detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8415639B2 (en) | Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator | |
| US8119996B2 (en) | Quantum efficiency measurement apparatus and quantum efficiency measurement method | |
| US20110205541A1 (en) | Optical measurement apparatus including hemispherical optical integrator | |
| Rohwer et al. | Measuring the absolute quantum efficiency of luminescent materials | |
| US7663744B2 (en) | Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the same | |
| US4995727A (en) | Compact diffusion light mixing box and colorimeter | |
| JP3682528B2 (en) | Method and apparatus for measuring absolute fluorescence quantum efficiency of solid sample | |
| US7368730B2 (en) | Weathering apparatus with UV radiation sources and radiation sensors containing a double-calibrated UV sensor | |
| JPH09292281A (en) | Method for measuring quantum efficiency of phosphor, and measuring device thereof | |
| WO2015010434A1 (en) | Apparatus and method for measuring reflection characteristic of material | |
| JP2009008509A (en) | Light emission quantum efficiency measuring device | |
| WO2011152082A1 (en) | Solar simulator and solar cell inspection apparatus | |
| JP7412802B2 (en) | Spectroscopic measurement method | |
| CN105738339A (en) | Device for measuring quantum efficiency of fluorescent powder | |
| CN113092418A (en) | Testing device and testing method for quantum dot product | |
| CN101191770B (en) | Luminous diode fluorescent powder emission spectrometry process | |
| Menningen et al. | Radiation trapping of the Hg 185 nm resonance line | |
| CN113390831B (en) | Full-appearance bidirectional reflection distribution characteristic measuring method | |
| Rastello et al. | Luminous-flux measurements by an absolute integrating sphere | |
| Bezman et al. | Construction and calibration of an apparatus for absolute measurement of total luminescence at low levels | |
| van Dam et al. | Quantum yield bias in materials with lower absorptance | |
| CN110132541A (en) | Light supply apparatus and optical mirror slip test macro | |
| CN112577958B (en) | Quantum dot detection device and method | |
| CN103575221B (en) | A kind of measuring method of multialkali photocathode thicknesses of layers measuring system | |
| KR101034716B1 (en) | Quantum efficiency measurement apparatus and quantum efficiency measurement method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |