CN113092385B - 中高层大气折射率测量装置及测量方法 - Google Patents
中高层大气折射率测量装置及测量方法 Download PDFInfo
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- CN113092385B CN113092385B CN202110504149.3A CN202110504149A CN113092385B CN 113092385 B CN113092385 B CN 113092385B CN 202110504149 A CN202110504149 A CN 202110504149A CN 113092385 B CN113092385 B CN 113092385B
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
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CN202110504149.3A CN113092385B (zh) | 2021-05-10 | 2021-05-10 | 中高层大气折射率测量装置及测量方法 |
LU500859A LU500859B1 (en) | 2021-05-10 | 2021-11-16 | Device and method for measuring refractive index of middle and upper atmosphere |
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CN202110504149.3A CN113092385B (zh) | 2021-05-10 | 2021-05-10 | 中高层大气折射率测量装置及测量方法 |
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CN115325943B (zh) * | 2022-08-18 | 2025-05-13 | 山东大学 | 高分辨率位移测量装置及测量方法 |
CN115615600B (zh) * | 2022-10-28 | 2025-05-02 | 山东大学 | 玻璃材料应力双折射测量装置及方法 |
Citations (6)
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---|---|---|---|---|
US5838485A (en) * | 1996-08-20 | 1998-11-17 | Zygo Corporation | Superheterodyne interferometer and method for compensating the refractive index of air using electronic frequency multiplication |
US6493090B1 (en) * | 1998-01-23 | 2002-12-10 | Torsana A/S | Detection of a substance by refractive index change |
WO2012002720A2 (ko) * | 2010-06-29 | 2012-01-05 | 서강대학교 산학협력단 | 편광 다이버시티 광 간섭계 및 이를 이용한 현미경 |
CN102507450A (zh) * | 2011-11-02 | 2012-06-20 | 中国人民解放军国防科学技术大学 | 基于y型腔正交偏振激光器的透明介质折射率测量方法及装置 |
CN102735646A (zh) * | 2012-06-20 | 2012-10-17 | 清华大学 | 透明介质折射率的测量装置及测量方法 |
CN104237164A (zh) * | 2014-08-28 | 2014-12-24 | 华北水利水电大学 | 非线性光学晶体在太赫兹波段折射率的测量装置及方法 |
Family Cites Families (3)
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CN102033053B (zh) * | 2010-11-12 | 2012-06-20 | 浙江理工大学 | 基于激光合成波长干涉的空气折射率测量方法及装置 |
US8902425B2 (en) * | 2012-04-08 | 2014-12-02 | University Of Zagreb | Temperature-stable incoherent light source |
US11448596B2 (en) * | 2017-11-16 | 2022-09-20 | Consiglio Nazionale Delle Ricerche—Cnr | Method to measure the refractive index of a sample using surface plasmon polaritons |
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- 2021-05-10 CN CN202110504149.3A patent/CN113092385B/zh active Active
- 2021-11-16 LU LU500859A patent/LU500859B1/en active IP Right Grant
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5838485A (en) * | 1996-08-20 | 1998-11-17 | Zygo Corporation | Superheterodyne interferometer and method for compensating the refractive index of air using electronic frequency multiplication |
US6493090B1 (en) * | 1998-01-23 | 2002-12-10 | Torsana A/S | Detection of a substance by refractive index change |
WO2012002720A2 (ko) * | 2010-06-29 | 2012-01-05 | 서강대학교 산학협력단 | 편광 다이버시티 광 간섭계 및 이를 이용한 현미경 |
CN102507450A (zh) * | 2011-11-02 | 2012-06-20 | 中国人民解放军国防科学技术大学 | 基于y型腔正交偏振激光器的透明介质折射率测量方法及装置 |
CN102735646A (zh) * | 2012-06-20 | 2012-10-17 | 清华大学 | 透明介质折射率的测量装置及测量方法 |
CN104237164A (zh) * | 2014-08-28 | 2014-12-24 | 华北水利水电大学 | 非线性光学晶体在太赫兹波段折射率的测量装置及方法 |
Non-Patent Citations (4)
Title |
---|
A novel orthogonal polarized dual-frequency laser using a Y-shaped cavity;Xiao Guangzong;《Optics & Laser Technology》;20110413;第43卷(第7期);第1315页 * |
Precise force measurement method by a Y-shaped cavity dual-frequency laser;Xiao Guangzong;《CHINESE OPTICS LETTERS》;20110711;第9卷(第10期);第1-4页 * |
Zeeman双频激光器频率分裂与纵模间隔变动一致性分析;刘维新;《物理学报》;20201211;第70卷(第7期);第146-152页 * |
小型化空气折射率测量装置的精度修正;吴炳阳;《激光与光电子学进展》;20171123;第55卷(第4期);第28-34页 * |
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LU500859B1 (en) | 2022-05-17 |
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