CN113074634B - Rapid phase matching method, storage medium and three-dimensional measurement system - Google Patents
Rapid phase matching method, storage medium and three-dimensional measurement system Download PDFInfo
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- CN113074634B CN113074634B CN202110319931.8A CN202110319931A CN113074634B CN 113074634 B CN113074634 B CN 113074634B CN 202110319931 A CN202110319931 A CN 202110319931A CN 113074634 B CN113074634 B CN 113074634B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
Abstract
The invention provides a rapid phase matching method, a storage medium and a three-dimensional measurement system, wherein the method comprises the steps of obtaining an absolute phase diagram of a reference plane and an object surface through a phase-solving algorithm; traversing the absolute phase diagram of the surface of the object, taking a certain pixel point, determining a corresponding polar line equation according to the pixel coordinate, and obtaining a polar line search range of a phase identical point on the reference phase diagram; roughly searching to obtain the approximate position of the matching point; fine searching to obtain accurate integer pixel coordinates of the matching points; performing interpolation calculation on the sub-pixel matching points to obtain phase identical points of the sub-pixels; and acquiring a sub-pixel parallax map of the whole map, calculating to obtain the parallax of the sub-pixels, and further calculating height information for three-dimensional reconstruction. The method and the system improve the precision of phase matching by calculating the phase matching point of the sub-pixel, and greatly improve the efficiency of three-dimensional reconstruction at the same time.
Description
Technical Field
The invention relates to the field of structured light three-dimensional measurement, in particular to a rapid phase matching method, a storage medium and a three-dimensional measurement system.
Background
In the phase-shift structured light three-dimensional measurement, phase matching is often required, image homonymy points are obtained through the phase matching, and parallax is calculated through the homonymy points, so that three-dimensional point cloud data are reconstructed.
A typical monocular structured light three-dimensional measurement system model is shown in figure 1, OcXcYcZcAs camera coordinate system, OpXpYpZpAs a projector coordinate system, OcOpParallel to the reference plane, ΩwIs a reference plane calibrated in advance, and O is the optical axis of the projector and the reference plane omegawPoint P is a point on the object, the connecting line of the projector optical center, the camera optical center and the point P intersects the reference plane at point A, B, and the point P of the object is on the straight line OcOpAnd the projections on the reference surface are the P 'and P' points. The straight line distance between the optical center of the projector and the optical center of the camera is d, OcOpAnd the reference plane is at a distance l. From similar triangles
Then
Substituting into known conditions to obtain
Available object height expression
Therefore, only the phase is matched between the object surface phase diagram and the reference plane phase diagram, and the phase on the reference plane phase diagram is found
The distance value of AB can be calculated according to the pixel position of the point B, so that the height of the object is calculated, and three-dimensional point cloud data are obtained.
In summary, in monocular structured light three-dimensional measurement, it is often necessary to perform phase matching between a measured object surface phase diagram and a reference plane phase diagram to obtain a parallax of a same phase point, and further calculate three-dimensional point cloud data of the object surface. The phase matching is generally to search for phase identical points on epipolar lines, and if an optimized search strategy is not adopted, the matching of a single pixel point consumes much time, so that the phase matching process of the whole image is very slow, and the overall efficiency of three-dimensional measurement is influenced. In addition, the integer pixel phase matching points often have large errors, and the precision of three-dimensional reconstruction is influenced.
Disclosure of Invention
In order to overcome the disadvantages of the prior art, it is an object of the present invention to provide a fast phase matching method, a storage medium and a three-dimensional measurement system, which can solve the above problems.
The design principle is as follows: according to the continuous distribution characteristic of the phase on the phase diagram, the phase gradient of the diagram to be matched and the topological relation of the phases of the adjacent points are utilized to optimize on the polar line search, and the points with the same phase name can be quickly searched. In addition, on the basis of searching the identical points of the integer pixels, a sub-pixel interpolation model is designed, the sub-pixel parallax is obtained by subtracting the sub-pixel coordinates from the integer pixel coordinates of the object image, and the height information is obtained through rapid calculation.
The design scheme is as follows: the purpose of the invention is realized by adopting the following scheme.
A fast phase matching method for three-dimensional measurements, the method comprising the steps of:
step 1, obtaining an absolute phase diagram of a reference plane and the surface of an object through a phase-solving algorithm.
And 2, traversing the absolute phase diagram of the surface of the object, taking a certain pixel point, determining a corresponding polar line equation according to the pixel coordinate, and obtaining the polar line search range of the phase identical point on the reference phase diagram.
And 3, rough searching, namely performing rough searching of the points with the same bit name on the epipolar line according to the phase gradient and the matching result of the adjacent points to obtain the approximate position of the matching point.
And 4, fine searching, namely performing fine searching according to the rough searching result to obtain the precise integer pixel coordinates of the matching points.
And 5, performing interpolation calculation of sub-pixel matching points, and performing sub-pixel model interpolation according to the matching points of the integer pixels to obtain phase identical points of the sub-pixels.
And 6, acquiring a sub-pixel parallax image of the whole image, calculating to obtain the parallax of the sub-pixels according to the phase same-name points of the sub-pixels, and further calculating height information for three-dimensional reconstruction.
Preferably, in step 3, the phase difference of the point to be searched is divided by the phase gradient to obtain the x coordinate search step distance, and the search direction is determined by the sign of the phase difference to perform the rough search.
Preferably, in step 3, a matching point is searched along the epipolar direction, and the phase difference divided by the phase gradient is searched for a search step until the phase difference of the encountered search point is less than a threshold value. Wherein the phase gradient
The calculation formula is as follows:
in the formula (I), the compound is shown in the specification,
the phase difference between any two points on the reference phase image line is shown, and the delta x is the x coordinate difference between any two points on the reference phase image line.
Preferably, in step 4, the left and right directions of the fine search are determined by the positive or negative phase difference, and therefore the search step is fixed to 1. And judging that the position of the integer pixel matching point is searched until the absolute value of the searching phase difference is changed from small to large. In the same way, the phase matching is carried out on the whole image, and the phase identical points of the two images are found out.
Preferably, in step 5, the formula of the sub-pixel X coordinate to be matched is as follows:
in the formula (I), the compound is shown in the specification,
is the sub-pixel coordinate to be matched,
is the phase value to be matched to,
is the phase value of the first two pixel points of the integer pixel matching point,
is the phase value, X, of two pixel points after the integer pixel matching point-2Is the X integer coordinate of the first two pixels of the integer pixel match point.
Preferably, in step 6, the integer pixel coordinates X of the points to be matched on the phase map of the object surfaceintSubtracting the sub-pixel coordinate X of the matching point on the reference phase mapsubObtaining a sub-pixel parallax Δ X, i.e., Δ X ═ Xint-Xsub. And calculating each pixel point of the object surface phase image in the same way to obtain the sub-pixel parallax image of the whole image.
Preferably, in step 6, for some pixels in the object surface phase map for which no matching point is found, the sub-pixel disparity of the pixel is set to 0, and the corresponding part forms a matching invalid region.
The present invention also provides a computer readable storage medium having stored thereon computer instructions which, when executed, perform the steps of the aforementioned method.
The invention also provides a three-dimensional measuring system with fast phase matching, which comprises a computer, a camera and a projector, wherein the object to be measured is arranged on the reference plane and is positioned below the camera and the projector, and the computer is in telecommunication connection with the camera and the projector.
The computer comprises a pre-storage module, a relay storage module, an image processing module and an image output module.
The system comprises a pre-storage module, a projector and an image processing module, wherein the pre-storage module stores grating stripe images with characteristic information and system parameters, the grating stripe images are sent to the projector for projection, and the system parameters are sent to the image processing module.
And storing the picture of the object to be measured after the image projected by the projector is collected by the camera in the relay storage module.
The image processing module is used for processing image data of the acquired photo of the object to be detected, performing phase matching by operating the method, and calculating a three-dimensional coordinate by combining system parameters to form a three-dimensional point cloud.
The image output module outputs the three-dimensional point cloud obtained by the image processing module.
Compared with the prior art, the invention has the beneficial effects that: the method and the device calculate the phase matching points of the sub-pixels, and improve the accuracy of phase matching. Under the condition of not accelerating any software, the phase matching method can achieve millisecond time for matching the whole image, and greatly improves the precision and the efficiency of three-dimensional reconstruction while improving the precision of phase matching.
Drawings
FIG. 1 is a model of a monocular structured light three-dimensional measurement system;
FIG. 2 is a flow chart of a coarse search for phase matching;
FIG. 3 is a flow chart of fine search for phase matching;
FIG. 4 is a model of sub-pixel interpolation;
FIG. 5 is the phase matching result of the whole graph;
fig. 6 is a schematic view of a three-dimensional measurement system.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
It should be understood that "system", "device", "unit" and/or "module" as used in this specification is a method for distinguishing different components, elements, parts or assemblies at different levels. However, other words may be substituted by other expressions if they accomplish the same purpose.
As used in this specification and the appended claims, the terms "a," "an," "the," and/or "the" are not intended to be inclusive in the singular, but rather are intended to be inclusive in the plural, unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that steps and elements are included which are explicitly identified, that the steps and elements do not form an exclusive list, and that a method or apparatus may include other steps or elements.
Flow charts are used in this description to illustrate operations performed by a system according to embodiments of the present description. It should be understood that the preceding or following operations are not necessarily performed in the exact order in which they are performed. Rather, the various steps may be processed in reverse order or simultaneously. Meanwhile, other operations may be added to the processes, or a certain step or several steps of operations may be removed from the processes.
First embodiment
A fast phase matching method for three-dimensional measurement is used for carrying out phase matching on a nearby point based on gradient calculation and topological relation, and comprises the following steps:
step 1, obtaining an absolute phase diagram of a reference plane and the surface of an object through a phase-solving algorithm. At the same time, the system parameters of the camera and projector are entered. Namely, a calibration file with matched bits is made first.
And 2, traversing the object surface absolute phase diagram, taking a certain pixel point as a phase value to be matched, judging whether the pixel point is a first row of pixel points of the image, if so, the searching starting point is the same position (row 1) of the reference plane phase diagram, otherwise, the searching starting point is the position (adjacent point) of the phase matching point of the previous pixel point. And determining a corresponding polar line equation according to the pixel coordinates to obtain a polar line search range of the phase same-name point on the reference phase diagram.
And searching a phase matching point corresponding to the reference plane phase diagram according to a phase value to be matched of a certain pixel point of the object surface phase diagram. And entering a polar line searching link of a single pixel, wherein the polar line is obtained by coordinates of the point to be matched and a camera calibration result.
And 3, rough searching, namely performing rough searching of the points with the same bit name on the epipolar line according to the phase gradient and the matching result of the adjacent points to obtain the approximate position of the matching point.
Wherein, the epipolar search traverses the corresponding epipolar pixel point on the reference phase map along the x coordinate. Because the reference plane phase diagram is continuously and uniformly changed, the phase gradient is calculated for the polar line of the reference phase diagram, and the phase difference between the adjacent pixels can be obtained. Therefore, the phase difference of the point to be searched is divided by the phase gradient to obtain the searching step distance of the x coordinate, and the searching direction is determined by the sign of the phase difference to carry out rough searching. The process flow diagram of the coarse search is shown in fig. 2.
Specifically, a matching point is searched along the polar line direction, and the phase difference is divided by the phase gradient to be used as a searching step for searching until the phase difference of the searched point is smaller than a threshold value; wherein the phase gradient
The calculation formula is as follows:
in the formula (I), the compound is shown in the specification,
the phase difference between any two points on the reference phase image line is shown, and the delta x is the x coordinate difference between any two points on the reference phase image line. And until the phase difference of the search points is smaller than the threshold value, the search points are very close to the points to be matched, so that the next fine search is carried out.
In summary, in the rough search, the search starting point is determined according to the method of the flowchart in fig. 2, the matching result of the first point or the adjacent point on the polar line is used as the search starting point, the left and right directions of the search are determined according to the ratio of the phase difference to the phase gradient as the search step distance and the positive and negative of the phase difference, and the phase threshold is set as the search ending condition, so as to obtain the rough search result. The roughly searched matching point is very close to the exact integer pixel phase matching point.
And 4, fine searching, namely performing fine searching according to the rough searching result to obtain the precise integer pixel coordinates of the matching points.
Specifically, in step 4, the left and right directions of the fine search are determined by the positive and negative phase differences, and therefore the search step is fixed to 1; until the absolute value of the searched phase difference is changed from small to large (phase difference minimum value point), judging that the position of the integer pixel matching point is searched; in the same way, the phase matching is carried out on the whole image, and the phase identical points of the two images are found out.
And 5, performing interpolation calculation of sub-pixel matching points, and performing sub-pixel model interpolation according to the matching points of the integer pixels to obtain phase identical points of the sub-pixels. The sub-pixel interpolation model is shown in fig. 4, the sub-pixel uses the phase information of the first two pixels and the second two pixels, in the figure, 460.74 is an integer pixel matching point, the phase to be searched is 460.71, and the integer X coordinate is defined as the left edge position of the pixel.
The formula for calculating the X coordinates of the sub-pixels to be matched is as follows:
in the formula (I), the compound is shown in the specification,
is the sub-pixel coordinate to be matched,
is the phase value to be matched to,
is the phase value of the first two pixel points of the integer pixel matching point,
is the phase value, X, of two pixel points after the integer pixel matching point-2Is the X integer coordinate of the first two pixels of the integer pixel match point.
According to the above calculation formula, the X coordinate of the sub-pixel in FIG. 4 is obtained as X-2+1.57, i.e. X460.6Plus 1.57.
And 6, acquiring a sub-pixel parallax map of the whole map, calculating to obtain the parallax of the sub-pixels according to the phase identical points of the sub-pixels, and further calculating height information for three-dimensional reconstruction.
Wherein, the integer pixel coordinate X of the point to be matched on the object surface phase diagramintSubtracting the sub-pixel coordinate X of the matching point on the reference phase mapsubObtaining a sub-pixel parallax Δ X, i.e., Δ X ═ Xint-Xsub(ii) a And calculating each pixel point of the object surface phase image in the same way to obtain the sub-pixel parallax image of the whole image.
In step 6, for some pixels in the object surface phase diagram, which cannot find a matching point, the sub-pixel parallax of the pixel is set to 0, and the part forms a matching invalid region. Referring to fig. 5, assuming that the object surface is a plane, the phase matching effect of the whole graph is as shown in fig. 5 (dark black portions are matching invalid regions).
Finally, the time consumption of the phase matching program of the whole graph is tested, the code program is written in C + +, and the time consumption of matching the whole graph is below 1s under the condition of no multithreading and GPU acceleration.
Second embodiment
The present invention also provides a computer readable storage medium having stored thereon computer instructions which, when executed, perform the steps of the aforementioned method. For a detailed description of the method, reference is made to the foregoing section, which is not repeated herein.
It will be appreciated by those of ordinary skill in the art that all or a portion of the steps of the methods of the embodiments described above may be performed by associated hardware as instructed by a program that may be stored on a computer readable storage medium, which may include non-transitory and non-transitory, removable and non-removable media, to implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
The computer program code represented by the aforementioned computer instructions may be written in any one or more programming languages, including an object oriented programming language such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C + +, C #, VB.NET, Python, and the like, a conventional programming language such as C, Visualbasic, Fortran2003, Perl, COBOL2002, PHP, ABAP, a dynamic programming language such as Python, Ruby, and Groovy, or other programming languages, and the like. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or processing device. In the latter scenario, the remote computer may be connected to the user's computer through any form of network, such as a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet), or in a cloud computing environment, or as a service using, for example, software as a service (SaaS).
Third embodiment
Referring to fig. 6, the three-dimensional measurement system comprises a computer 1, a camera 2 and a projector 3, wherein an object 5 to be measured is arranged on a reference plane 4 and is positioned below the camera 2 and the projector 3, and the computer 1 is in telecommunication connection with the camera 2 and the projector 3.
The computer 1 includes a pre-storage module, a relay storage module, an image processing module, and an image output module.
The pre-storage module stores the grating stripe image with the characteristic information and the system parameters, sends the grating stripe image to the projector 3 for projection, and sends the system parameters to the image processing module.
The system parameters can be obtained by adopting the existing calibration method, comprise internal parameters and external parameters, and form a parameter matrix to the image processing module.
The relay storage module stores the photo of the object to be measured after the camera 2 collects the image projected by the projector.
The image processing module is used for processing image data of the acquired photo of the object to be detected, performing phase matching by operating the method, and calculating a three-dimensional coordinate by combining system parameters to form a three-dimensional point cloud.
The image output module outputs the three-dimensional point cloud obtained by the image processing module.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (9)
1. A fast phase matching method for three-dimensional measurements, characterized in that the method comprises the steps of:
step 1, obtaining an absolute phase diagram of a reference plane and an object surface through a phase-solving algorithm;
step 2, traversing the absolute phase map of the object surface, taking a certain pixel point, determining a corresponding polar line equation according to the pixel coordinate, and obtaining a polar line search range of a phase identical point on the reference phase map;
step 3, rough search, namely according to the matching result of the phase gradient and the adjacent points, taking the matching result of the first point or the adjacent points on the polar line as a search starting point, taking the ratio of the phase difference to the phase gradient as a search step distance, judging the left and right directions of the search according to the positive and negative of the phase difference, setting a phase threshold as a search ending condition, and carrying out rough search on the points with the same position on the polar line to obtain the approximate position of the matching point;
step 4, fine searching, namely performing fine searching according to the rough searching result to obtain the precise integer pixel coordinates of the matching points;
step 5, performing interpolation calculation of sub-pixel matching points, and performing sub-pixel model interpolation according to the matching points of the integer pixels to obtain phase identical points of the sub-pixels;
and 6, acquiring a sub-pixel parallax map of the whole map, calculating to obtain the parallax of the sub-pixels according to the phase identical points of the sub-pixels, and further calculating height information for three-dimensional reconstruction.
2. The fast phase matching method according to claim 1, wherein: in step 3, the phase difference of the point to be searched is divided by the phase gradient to obtain the searching step distance of the x coordinate, the searching direction is determined by the sign of the phase difference, and the rough searching is carried out.
3. The fast phase matching method according to claim 1 or 2, characterized in that: in step 3, searching for a matching point along the polar line direction, and performing searching by taking the phase difference divided by the phase gradient as a searching step pitch until the phase difference of the searched point is smaller than a threshold value; wherein the phase gradient
The calculation formula is as follows:
in the formula (I), the compound is shown in the specification,
the phase difference between any two points on the reference phase image line is shown, and the delta x is the x coordinate difference between any two points on the reference phase image line.
4. The fast phase matching method according to claim 1, wherein: in step 4, the left and right directions of the fine search are judged by the positive and negative of the phase difference, so that the search step is fixed to 1; until the absolute value of the searching phase difference is changed from small to large, the position of the integer pixel matching point is judged to be searched; in the same way, the phase matching is carried out on the whole image, and the phase identical points of the two images are found out.
5. The fast phase matching method according to claim 1, wherein: in step 5, the formula of the sub-pixel X coordinate to be matched is as follows:
in the formula (I), the compound is shown in the specification,
is the sub-pixel coordinate to be matched,
is the phase value to be matched to,
is the phase value of the first two pixel points of the integer pixel matching point,
is the phase value, X, of two pixel points after the integer pixel matching point-2Is the X integer coordinate of the first two pixels of the integer pixel match point.
6. The fast phase matching method according to claim 1, wherein: in step 6, integer pixel coordinate X of point to be matched on the object surface phase diagramintSubtracting the sub-pixel coordinate X of the matching point on the reference phase mapsubObtaining a sub-pixel parallax Δ X, i.e., Δ X ═ Xint-Xsub(ii) a And calculating each pixel point of the object surface phase image in the same way to obtain the sub-pixel parallax image of the whole image.
7. The fast phase matching method according to claim 1 or 6, characterized in that: in step 6, for some pixels in the object surface phase diagram, which cannot find the matching point, the sub-pixel parallax of the pixel is set to 0, and the corresponding part forms a matching invalid region.
8. A computer-readable storage medium having stored thereon computer instructions, characterized in that: the computer instructions when executed perform the steps of the method of any one of claims 1 to 7.
9. A three-dimensional measurement system with fast phase matching is characterized in that: the three-dimensional measurement system comprises a computer (1), a camera (2) and a projector (3), an object to be measured (5) is arranged on a reference plane (4) and is positioned below the camera (2) and the projector (3), and the computer (1) is in telecommunication connection with the camera (2) and the projector (3);
the computer (1) comprises a pre-storage module, a relay storage module, an image processing module and an image output module;
the system comprises a pre-storage module, a projector (3), an image processing module, a pre-storage module and a pre-storage module, wherein the pre-storage module stores grating stripe images with characteristic information and system parameters, the grating stripe images are sent to the projector (3) for projection, and the system parameters are sent to the image processing module;
the relay storage module stores a photo of the object to be measured, which is acquired by a camera (2) and projected by a projector;
the system comprises an image processing module, a phase matching module, a data acquisition module and a data processing module, wherein the image processing module is used for processing image data of an acquired photo of an object to be detected, operating the method of any one of claims 1-7 for phase matching, and calculating three-dimensional coordinates by combining system parameters to form a three-dimensional point cloud;
the image output module outputs the three-dimensional point cloud obtained by the image processing module.
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Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140078264A1 (en) * | 2013-12-06 | 2014-03-20 | Iowa State University Research Foundation, Inc. | Absolute three-dimensional shape measurement using coded fringe patterns without phase unwrapping or projector calibration |
| WO2015194864A1 (en) * | 2014-06-17 | 2015-12-23 | (주)유진로봇 | Device for updating map of mobile robot and method therefor |
| CN104331897B (en) * | 2014-11-21 | 2017-03-29 | 天津工业大学 | Based on the sub-pixel phase place solid matching method that polar curve is corrected |
| CN104596439A (en) * | 2015-01-07 | 2015-05-06 | 东南大学 | Speckle matching and three-dimensional measuring method based on phase information aiding |
| CN105066904B (en) * | 2015-07-16 | 2017-08-29 | 太原科技大学 | Streamline product tri-dimensional facial type detection method based on phase gradient threshold value |
| US11107230B2 (en) * | 2018-09-14 | 2021-08-31 | Toyota Research Institute, Inc. | Systems and methods for depth estimation using monocular images |
| CN109712139B (en) * | 2019-01-02 | 2023-05-26 | 苏州天准科技股份有限公司 | Monocular vision size measurement method based on linear motion module |
| CN111243002A (en) * | 2020-01-15 | 2020-06-05 | 中国人民解放军国防科技大学 | Monocular laser speckle projection system calibration and depth estimation method applied to high-precision three-dimensional measurement |
| CN111536905B (en) * | 2020-06-03 | 2021-08-31 | 北京航空航天大学 | Monocular grating structure optical vision measurement method and system based on reference image |
| CN111473744B (en) * | 2020-06-03 | 2022-01-14 | 北京航空航天大学 | Three-dimensional shape vision measurement method and system based on speckle embedded phase shift stripe |
| CN111563564B (en) * | 2020-07-20 | 2020-10-09 | 南京理工大学智能计算成像研究院有限公司 | Speckle image pixel-by-pixel matching method based on deep learning |
| CN112325798A (en) * | 2020-10-28 | 2021-02-05 | 南京理工大学智能计算成像研究院有限公司 | Binocular telecentric matching method based on phase monotone consistency |
| CN112200203B (en) * | 2020-11-04 | 2022-04-05 | 西安交通大学 | Matching method of weak correlation speckle images in oblique field of view |
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