CN113074667B - Global absolute phase alignment method based on mark points, storage medium and system - Google Patents

Global absolute phase alignment method based on mark points, storage medium and system Download PDF

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CN113074667B
CN113074667B CN202110301467.XA CN202110301467A CN113074667B CN 113074667 B CN113074667 B CN 113074667B CN 202110301467 A CN202110301467 A CN 202110301467A CN 113074667 B CN113074667 B CN 113074667B
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phase
projector
mark
point
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CN113074667A (en
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赵顺顺
田乃鲁
谷孝东
黄煜
曹葵康
刘明星
徐一华
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Suzhou Tztek Precision Co ltd
Tztek Technology Co Ltd
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Tztek Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré

Abstract

The invention discloses a global absolute phase alignment method based on mark points, a storage medium and a system, wherein the method is suitable for the occasion of phase unwrapping by adopting a space phase unwrapping algorithm, the system outputs three-dimensional information by adopting the method, and the problem of aligning the measured plane phase with the global absolute phase of an image plane of a projector is mainly solved. The method mainly comprises the following steps: when the stripe image is projected, additionally projecting a mark point image; extracting the center of the mark point by a threshold segmentation method, an edge extraction method and a minimum circumscribed rectangle method; according to the existing unwrapping phase diagram of the measuring plane, obtaining the phase level k of the mark point position on the measuring plane i (i ═ 1,2,3 …); in the known projector, the global absolute phase level at the mark point is j, Δ k is recorded as j-k, and Δ k is added to the fringe level of all the pixels on the unwrapped phase map of the measurement plane, so that the phase of the measurement plane can be aligned with the global absolute phase. The invention can align the phase of the measuring plane with the global absolute phase only by one mark point image, has high accuracy and has robustness and efficiency.

Description

Global absolute phase alignment method based on mark points, storage medium and system
Technical Field
The invention relates to the field of structured light intelligent three-dimensional measurement, in particular to a global absolute phase alignment method based on mark points, a storage medium and a system.
Background
The structured light measuring system mainly comprises a structured light projecting device, a camera and an image acquisition and processing system. The measuring principle is that a light model with a certain structure, such as a point light source, a line light source, a cross light bar, a sinusoidal grating, coded light and the like, is projected to a measured object, the structured light is modulated by the surface information of the measured object to deform, an image sensor is used for recording the deformed structured light stripe image, and the three-dimensional information of the object is acquired by combining the structural parameters of the system. The structured light measurement system has the advantages of good portability, high controllability, high measurement speed, high measurement precision and the like, and becomes a preferred technology for multi-industry measurement.
Among them, the digital raster Projection Profilometry (FPP) is the most representative structured light Projection technology, and has the advantages of low cost, high detection precision, fast measurement speed, etc. The general measurement procedure is as follows: firstly, a projector projects a stripe image to the surface of a measured object, and a camera collects the stripe image modulated by the object; analyzing the collected image and recovering the absolute phase of the object surface stripe image; and performing three-dimensional reconstruction on the surface of the object according to the triangulation principle. Common fringe analysis methods include fourier transform, wavelet transform, phase shift, and the like. Phase Measurement Profiling (PMP) is a widely used structured light projection measurement technique. However, the fringe analysis method can only obtain the wrapped phase of the fringe, and the wrapped phase image needs to be further unwrapped to recover the absolute phase of the fringe on the surface of the object.
In general, the phase unwrapping method includes both a spatial phase unwrapping method and a temporal phase unwrapping method. The basic idea of the time phase expansion method is to change the frequency of the projected structured light with time to form a sequence on a time axis, and each pixel point is unwrapped along the time axis to realize mutually independent phase expansion among the pixel points. Therefore, the time phase unwrapping method can recover the phase well, but reduces the measurement speed due to the need to capture more images. The spatial phase expansion only needs one wrapped phase diagram, and the expanded continuous phase is obtained by adding or subtracting fringe orders by utilizing the discontinuity of adjacent phase points. The airspace unwrapping algorithm is fast, so the method is very suitable for an online measurement scene with a requirement on the detection speed.
In the structured light measurement system, due to the limitation of the imaging system, the central part of the fringe image projected by the projector has better imaging quality, and the periphery of the fringe image projected by the projector has poorer imaging quality. The field of view of the camera typically covers only a central portion of the projected fringe of the projector. Since the spatial domain unwrapping restores the phase based on the discontinuity of adjacent phase points, the phase obtained by the spatial domain unwrapping method is not a global absolute phase. Therefore, the phase map obtained after spatial unwrapping needs to be re-or further expanded to obtain a global absolute phase matching the fringe order of the projector image plane.
In the digital grating projection Profilometry, a projector (DLP) is mostly used to project a fringe image, and Fourier Transform Profilometry (FTP) or Phase Measurement Profilometry (PMP) is used to solve the wrapping Phase. Due to the limitation of the digital projection equipment, the fringe imaging quality center projected on the measuring plane is good, and the periphery is poor. To improve the measurement accuracy of the structured light measurement system, the imaging range of the camera is usually limited to the central part of the projected fringe. However, since the spatial unwrapping restores the phase according to the discontinuity of the adjacent phase points, the phase obtained by the spatial unwrapping method is not a global absolute phase, as shown in fig. 1. In order to obtain the global absolute phase, the phase after space unwrapping needs to be further unwrapped.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention aims to provide a global absolute phase alignment method, a storage medium and a system based on mark points, which can solve the problem of how to align the phase of a measuring plane with the global absolute phase of an image plane of a projector.
The purpose of the invention is realized by adopting the following technical scheme:
a global absolute phase alignment method based on mark points comprises the following steps:
step 1: and projecting a grating fringe image by using a projector, and measuring a planar airspace unwrapping phase diagram.
Step 2: the projector projects a mark point image consistent with the stripe direction of the grating stripe image, and all the mark points are located in the same phase level.
And step 3: the camera captures an image of a landmark point projected on the surface of the object by the projector.
And 4, step 4: and (4) processing the marker point images collected in the step (3) to obtain the central coordinate positions of all the marker points.
And 5: extracting the central positions of all the mark points, and recording as (x) i ,y i ),(i=1,2,3…)。
Step 6: according to the existing measurement plane airspace unwrapping phase diagram in the step 1, phase levels k at the central positions of all the mark points are solved i (i is 1,2,3 …), and since the stripe direction of the index dot image and the raster stripe image is the same, there is k 1 =k 2 =k 3 =…=k i And (i ═ 1,2,3 …), denoted as k. And the global absolute phase order of the location of the landmark point should be j.
And 7: and (4) recording delta k as j-k, and adding delta k to the fringe order of all pixel points on the unwrapped phase diagram of the measurement plane, so that the phase of the measurement plane can be aligned with the global absolute phase.
Preferably, all the mark points of the mark point image have the same shape and size, and the maximum outer diameter of the mark points does not exceed one wrapping phase period of the projector image plane.
Preferably, the shape of the mark point is circular, diamond, square, rectangle, triangle or star.
Preferably, in step 4, the method for obtaining the coordinate positions of the centers of all the mark points includes:
and S41, extracting the marker point region through a threshold segmentation algorithm.
And S42, extracting the outline of the mark point through an edge detection algorithm.
And S43, finding the minimum bounding rectangle of the outline to obtain the central point of the minimum bounding rectangle, namely the central position of the mark point.
Preferably, in step 1, the grating stripe image is controlled and transmitted by the computer to the projector for projection, and the number of the projected grating stripe images is N, where N is a positive integer greater than or equal to 2.
The present invention also provides a computer-readable storage medium having stored thereon computer instructions which, when run on a computer, cause the computer to perform the aforementioned method.
The invention also provides a structured light measuring system based on the mark points, which comprises a computer, a camera and a projector, wherein the computer is in telecommunication connection with the camera and the projector. The computer comprises a pre-storage module, a relay storage module, an image processing module and an image output module.
The system comprises a pre-storage module, a projector and an image processing module, wherein the pre-storage module stores a grating stripe image, a mark point image, an RGB color image and system parameters, the grating stripe image, the mark point image and the RGB color image are sent to the projector for projection, and the system parameters are sent to the image processing module.
And the relay storage module stores the picture of the object to be measured after the image is projected by the projector and collected by the camera.
The image processing module carries out image data processing on the acquired photo of the object to be detected, the method is operated to carry out global absolute phase alignment, and then the three-dimensional coordinate is calculated by combining system parameters to form three-dimensional point cloud.
The image output module outputs the three-dimensional point cloud obtained by the image processing module.
Preferably, the image processing module of the system further comprises a step of projecting the RGB color image to obtain a color picture, extracting RGB values at corresponding points, and assigning the RGB values to three-dimensional coordinates to obtain color textures to form a color three-dimensional point cloud.
Preferably, the computer further comprises a point cloud filtering module, and the point cloud filtering module is used for carrying out point cloud filtering on the formed three-dimensional point cloud so as to reconstruct a point cloud curved surface and output the filtered three-dimensional point cloud.
Preferably, the system filters the three-dimensional point cloud by denoising and redundancy elimination.
Compared with the prior art, the invention has the beneficial effects that: the method and the system have the advantages of wide application range, high efficiency and good robustness. The problem of how to align the phase of the measuring plane and the global absolute phase of the image plane of the projector is solved.
Drawings
FIG. 1 is a schematic diagram of image plane spatial unwrapped phase and global absolute phase;
FIG. 2 is a fringe image on the projector image plane;
FIG. 3 is a landmark image of a design;
FIG. 4 is a landmark image captured by a camera;
FIG. 5 is a camera unwrapping phase before alignment;
FIG. 6 is the global absolute phase after alignment;
FIG. 7 is a schematic view of a structured light measurement system based on marker points according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
The design principle is as follows: a global phase alignment method based on mark points. Marker points as shown in fig. 3, the marker points should be less than one phase period in diameter and all marker point locations should be in the same phase order. The absolute level of the mark point on the image plane of the projector is recorded as j, the absolute level of the mark point on the image plane of the camera can be calculated as k, the difference value between the two is calculated, and the unwrapping phase is aligned according to the difference value to obtain the global absolute phase.
Example one
A global absolute phase alignment method based on mark points comprises the following steps.
Step 1: the projector projects a grating fringe image (see fringe image of fig. 2) and measures the planar spatial unwrapped phase map.
The grating stripe images are controlled by a computer and transmitted to a projector for projection, the number of the projected grating stripe images is N, and N is a positive integer greater than or equal to 2. In one embodiment, three sets of 12 grating stripe images are preferred, each set of 4 grating stripe images.
Step 2: the projector projects a mark point image consistent with the stripe direction of the grating stripe image, and all the mark points are located in the same phase level. Fig. 3 is an image of landmark points on the projector image plane, all of which are located at the same global absolute phase order, as shown in fig. 3.
Because all the mark points are located in the same phase order, the phase orders of all the mark point areas are equal, and the global absolute phase order of the mark points on the stripe image of the projector image plane is j.
Furthermore, all the mark points of the mark point image have the same shape and size, and the maximum outer diameter of the mark points does not exceed one wrapping phase period of the projector image plane.
The shape of the mark point can be circular, diamond, square, rectangle, triangle or star, and is preferably a circular outline shape.
And step 3: the camera captures an image of a landmark point projected on the surface of the object by the projector. The image of the marker point obtained by the photographing is shown in fig. 4.
And 4, step 4: and (4) processing the marker point images collected in the step (3) to obtain the central coordinate positions of all the marker points.
In step 4, the method for obtaining the coordinate positions of the centers of all the mark points comprises the following steps:
and S41, extracting the marker point region through a threshold segmentation algorithm.
And S42, extracting the outline of the mark point by an edge detection algorithm.
And S43, finding the minimum bounding rectangle of the outline to obtain the central point of the minimum bounding rectangle, namely the central position of the mark point.
The method of extracting the region of the marker point, extracting the contour of the marker point, and obtaining the center position of the marker point is not limited to the above-described algorithm and method, and any available algorithm and method that can be obtained in the prior art may be used.
And 5: extracting the central positions of all the mark points, and recording as (x) i ,y i ),(i=1,2,3…)。
And 6: according to the existing measurement plane airspace unwrapping phase diagram in the step 1, phase levels k at the central positions of all the mark points are solved i (i is 1,2,3 …), since the stripe direction of the marker dot image and the raster stripe image are aligned, there is k 1 =k 2 =k 3 =…=k i And (i ═ 1,2,3 …), denoted as k. And the global absolute phase order of the location of the landmark point should be j.
And 7: and (4) recording delta k as j-k, and adding delta k to the fringe order of all pixel points on the unwrapped phase diagram of the measurement plane, so that the phase of the measurement plane can be aligned with the global absolute phase.
As shown in fig. 5, the phase value after being unwrapped by the pre-alignment space domain is obviously zero in starting point. Fig. 6 shows the aligned global absolute phase values.
Example two
A computer readable storage medium having stored thereon computer instructions which, when run on a computer, cause the computer to perform the aforementioned method. For a detailed description of the method, reference is made to the foregoing section, which is not repeated herein.
It will be understood by those of ordinary skill in the art that all or a portion of the steps of the various methods of the embodiments described above may be performed by associated hardware as instructed by a program that may be stored on a computer readable storage medium, which may include permanent and non-permanent, removable and non-removable media, that may implement the storage of information by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
The foregoing instructions may be coded in any computer program code in any one or more programming languages, including an object oriented programming language such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C + +, C #, VB.NET, Python, and the like, a conventional procedural programming language such as C, Visualbasic, Fortran2003, Perl, COBOL2002, PHP, ABAP, a dynamic programming language such as Python, Ruby, and Groovy, or other programming languages, and the like. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or processing device. In the latter scenario, the remote computer may be connected to the user's computer through any form of network, such as a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet), or in a cloud computing environment, or as a service using, for example, software as a service (SaaS).
EXAMPLE III
A structured light measurement system based on marker points comprises a computer 1, a camera 2 and a projector 3, wherein the computer is in telecommunication connection with the camera and the projector. The computer comprises a pre-storage module, a relay storage module, an image processing module and an image output module.
The system comprises a pre-storage module, an image processing module, a projector and an image processing module, wherein the pre-storage module stores a grating stripe image, a mark point image, an RGB color image and system parameters, the grating stripe image, the mark point image and the RGB color image are sent to the projector for projection, and the system parameters are sent to the image processing module.
The system parameters are obtained by pre-calibrating the camera 2, and can be obtained by adopting the existing calibration method, including internal parameters and external parameters, to form a parameter matrix for the image processing module.
And storing the picture of the object to be measured after the image projected by the projector is collected by the camera in the relay storage module.
The image processing module carries out image data processing on the acquired photo of the object to be detected, global absolute phase alignment is carried out by operating the method, and then the three-dimensional coordinate is calculated by combining system parameters to form three-dimensional point cloud.
The image output module outputs the three-dimensional point cloud obtained by the image processing module.
Example four
The image processing module of the system also comprises a step of projecting the RGB color image to obtain a color picture, extracting RGB values at corresponding points, and giving the RGB values to three-dimensional coordinates so as to obtain color textures and form a colored three-dimensional point cloud.
EXAMPLE five
The computer also comprises a point cloud filtering module, and the point cloud filtering module is used for carrying out point cloud filtering on the formed three-dimensional point cloud so as to reconstruct a point cloud curved surface and output the filtered three-dimensional point cloud.
Preferably, the system filters the three-dimensional point cloud by denoising and redundancy elimination.
Example six
The image processing module of the system also comprises a system precision evaluation unit which calculates a calibrated three-dimensional coordinate by using the calibrated system parameters, compares the calibrated three-dimensional coordinate with the three-dimensional coordinate calculated by measurement to obtain a plane measurement error and a sphere space error (a sphere center distance and a spherical surface error of a single sphere), and carries out precision evaluation on the output result of the previous three-dimensional point cloud.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A global absolute phase alignment method based on a mark point is characterized by comprising the following steps:
step 1: projecting grating fringe images by a projector, and measuring a planar airspace unwrapping phase diagram;
step 2: the projector projects a mark point image which is consistent with the stripe direction of the grating stripe image, all mark points are positioned in the same phase level, and the diameter of each mark point is smaller than one phase period of a planar airspace unwrapping phase projected by the projector;
and step 3: shooting a mark point image shot on the surface of an object by a projector by a camera;
and 4, step 4: processing the marker point image collected in the step (3) to obtain the central coordinate positions of all the marker points;
and 5: extracting the central positions of all the mark points, and recording as (x) i ,y i ),(i=1,2,3…);
Step 6: according to the existing measurement plane airspace unwrapping phase diagram in the step 1, the phase level k at the central positions of all the mark points is calculated i (i is 1,2,3 …), since the stripe direction of the marker dot image and the raster stripe image are aligned, there is k 1 =k 2 =k 3 =…=k i (i ═ 1,2,3 …) denoted k; the global absolute phase level of the position of the mark point is j;
and 7: and (4) recording delta k as j-k, and adding delta k to the fringe order of all pixel points on the unwrapped phase diagram of the measurement plane, so that the phase of the measurement plane can be aligned with the global absolute phase.
2. The landmark point-based global absolute phase alignment method according to claim 1, wherein:
all the mark points of the mark point image have the same shape and size, and the maximum outer diameter of the mark points does not exceed one wrapping phase period of the projector image plane.
3. The landmark point-based global absolute phase alignment method according to claim 2, wherein: the shape of the mark points is circular, rhombic, square, rectangular, triangular or star-shaped.
4. The landmark point-based global absolute phase alignment method according to claim 1, wherein:
in step 4, the method for obtaining the coordinate positions of the centers of all the mark points comprises the following steps:
s41, extracting a mark point region through a threshold segmentation algorithm;
s42, extracting the outline of the mark point through an edge detection algorithm;
and S43, finding the minimum bounding rectangle of the outline to obtain the central point of the minimum bounding rectangle, namely the central position of the mark point.
5. The landmark point-based global absolute phase alignment method according to claim 1, wherein:
in step 1, the grating stripe image is controlled by a computer and transmitted to a projector for projection, and the number of the projected grating stripe images is N, wherein N is a positive integer greater than or equal to 2.
6. A computer-readable storage medium characterized by: on a computer readable storage medium, computer instructions are stored which, when run on a computer, cause the computer to perform the method of any one of claims 1-5.
7. A structured light measurement system based on a marker point is characterized in that: the system comprises a computer, a camera and a projector, wherein the computer is in telecommunication connection with the camera and the projector;
the computer comprises a pre-storage module, a relay storage module, an image processing module and an image output module;
the system comprises a pre-storage module, an image processing module, a projector and an image processing module, wherein the pre-storage module stores a grating stripe image, a mark point image, an RGB color image and system parameters, sends the grating stripe image, the mark point image and the RGB color image to the projector for projection, and sends the system parameters to the image processing module;
the relay storage module stores a photo of the object to be measured, which is acquired by a camera and projected by a projector;
the system comprises an image processing module, a data acquisition module and a data acquisition module, wherein the image processing module is used for processing image data of an acquired photo of an object to be detected, operating the method of claims 1-5 to carry out global absolute phase alignment, and then calculating three-dimensional coordinates by combining system parameters to form a three-dimensional point cloud;
the image output module outputs the three-dimensional point cloud obtained by the image processing module.
8. The system of claim 7, wherein:
the image processing module of the system also comprises a step of projecting the RGB color image to obtain a color picture, extracting RGB values at corresponding points, and giving the RGB values to three-dimensional coordinates so as to obtain color textures and form a colored three-dimensional point cloud.
9. The system according to claim 7 or 8, characterized in that: the computer also comprises a point cloud filtering module, and the point cloud filtering module is used for carrying out point cloud filtering on the formed three-dimensional point cloud so as to reconstruct a point cloud curved surface and output the filtered three-dimensional point cloud.
10. The system of claim 9, wherein: the system filters the three-dimensional point cloud by denoising and redundancy elimination.
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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2200377A1 (en) * 1996-03-20 1997-09-20 Atlantis Scientific Inc. Method for Iterative Disk Masking and Automatic Error Repair for Phase Unwrapping
CN102937425A (en) * 2012-10-18 2013-02-20 北京航空航天大学 Measuring system of three-dimensional shape of strong reflecting surface based on high dynamic strip projector
CN105093893A (en) * 2015-05-20 2015-11-25 北京信息科技大学 Space-time three-dimensional phase unwrapping method and device
KR101733228B1 (en) * 2016-04-28 2017-05-08 주식회사 메디트 Apparatus for three dimensional scanning with structured light
CN110345882A (en) * 2019-06-28 2019-10-18 浙江大学 A kind of adaptive structure light three-dimension measuring system and method based on geometrical constraint
CN110849268A (en) * 2019-12-10 2020-02-28 南昌航空大学 Quick phase-height mapping calibration method
CN111242990A (en) * 2020-01-06 2020-06-05 西南电子技术研究所(中国电子科技集团公司第十研究所) 360-degree three-dimensional reconstruction optimization method based on continuous phase dense matching
CN112070842A (en) * 2020-07-28 2020-12-11 安徽农业大学 Multi-camera global calibration method based on orthogonal coding stripes

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9349174B2 (en) * 2013-05-31 2016-05-24 Microsoft Technology Licensing, Llc Absolute phase measurement with secondary pattern-embedded fringe
US10360693B2 (en) * 2017-03-01 2019-07-23 Cognex Corporation High speed structured light system

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2200377A1 (en) * 1996-03-20 1997-09-20 Atlantis Scientific Inc. Method for Iterative Disk Masking and Automatic Error Repair for Phase Unwrapping
CN102937425A (en) * 2012-10-18 2013-02-20 北京航空航天大学 Measuring system of three-dimensional shape of strong reflecting surface based on high dynamic strip projector
CN105093893A (en) * 2015-05-20 2015-11-25 北京信息科技大学 Space-time three-dimensional phase unwrapping method and device
KR101733228B1 (en) * 2016-04-28 2017-05-08 주식회사 메디트 Apparatus for three dimensional scanning with structured light
CN110345882A (en) * 2019-06-28 2019-10-18 浙江大学 A kind of adaptive structure light three-dimension measuring system and method based on geometrical constraint
CN110849268A (en) * 2019-12-10 2020-02-28 南昌航空大学 Quick phase-height mapping calibration method
CN111242990A (en) * 2020-01-06 2020-06-05 西南电子技术研究所(中国电子科技集团公司第十研究所) 360-degree three-dimensional reconstruction optimization method based on continuous phase dense matching
CN112070842A (en) * 2020-07-28 2020-12-11 安徽农业大学 Multi-camera global calibration method based on orthogonal coding stripes

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
基于新的系统数学模型的三维形貌测量法;曲学军等;《机械工程学报》;20120720(第14期);全文 *
基于条纹相位解调的三维面形动静态测量技术的研究;李路;《中国优秀博硕士学位论文全文数据库(硕士)信息科技辑》;20081115;全文 *
基于相位辅助的三维数字成像与测量;彭翔等;《光学学报》;20110910(第09期);全文 *
基于编码光栅的空间不连续三维物体表面的绝对相位获取方法;肖素枝等;《光学学报》;20160819(第12期);全文 *
用于非均匀条纹的二值时空编码相位展开方法;冀红彬等;《红外与激光工程》;20170425(第04期);全文 *
适用于快速三维形貌测量的二元结构光编码优化方法;石磊等;《光电子.激光》;20170515(第05期);全文 *

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