CN113050147B - Batch test method for electromagnetic particle detector readout electronic boards - Google Patents
Batch test method for electromagnetic particle detector readout electronic boards Download PDFInfo
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- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
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Abstract
The application discloses a batch test method for an electromagnetic particle detector readout electronic board, which comprises the following steps: 1) The attenuator control module carries out parameter configuration on the attenuator, and configures the duration of each frame signal and the attenuation multiple of the corresponding frame signal of the input electronics; the test system sends K groups of configuration parameters of the electronics to each electronics to be tested; different electronics specifically different addresses, anode step values and dynode step values; the scale voltages in the different groups of configuration parameters are different; 2) The signal generated by the signal generator is input into an attenuator, the attenuator generates M frames of signals with step change according to parameter configuration and sequentially inputs the signals into each electronic to be tested, and test data under K different scale voltages of each electronic are tested; 3) The test system collects test data of K different scale voltages of each electronic device and processes the test data to generate images so as to test the performance of each electronic device. The application reduces the test time and improves the test precision.
Description
Technical Field
The application belongs to the technical field of accelerators, and relates to a batch test method for an electromagnetic particle detector readout electronic board.
Background
Particle detectors are an indispensable tool and means for nuclear physics, particle physics research and radiation application, wherein electromagnetic particle detectors (ED) are novel detectors for high-energy cosmic ray measurement, are widely applied to LHAASO at present, and for mass-produced electromagnetic particle detector readout electronic boards, performance needs to meet project requirements, so that accurate function and performance tests are required for each piece of electronics. The old version test method for electronics is that the signal generator is connected with the electronics, and the electronics transmits data to the PC to test the data.
The old version test method of the electronic board comprises multiple test steps of electronic test connection, DAQ starting, step adjustment, charge test, time test, step test, scale test, data processing and the like, wherein the manual operation signal generator is required to generate signals with different amplitudes, and meanwhile, the manual timing is required to be performed for one minute, the signal generator is required to be changed for 16 times, so that the manual operation of a tester is always required, the old data processing method is based on an LINUX system, the manual generation and copying of debugging configuration and trigger files are required by the tester, and in the subsequent test steps, code input operation is required for inquiring, modifying, opening, moving, running the test files and the like.
Disclosure of Invention
Aiming at the technical problems in the prior art, the application aims to provide a batch test method for an electromagnetic particle detector readout electronic board. The method can be used for carrying out automatic batch test on the electromagnetic particle detector readout electronic board, comprises three parts of automatic test of attenuator hardware control, data acquisition and data processing, and can carry out nonlinear test of charge resolution, time resolution performance and charge measurement integration on all electromagnetic particle detector array readout electronic boards based on a TCP/IP+WR clock and data fusion transmission mode of an FPGA; the manual control of the test process and the operation instrument is not needed, so that the labor cost is saved, the test time is greatly shortened, and the test precision is improved.
The technical scheme of the application is as follows:
a batch test method for an electromagnetic particle detector readout electronic board comprises the following steps:
1) The attenuator control module carries out parameter configuration on the attenuator, and configures the duration of each frame signal and the attenuation multiple of the corresponding frame signal of the input electronics; the test system sends K groups of configuration parameters of the electronics to each electronics to be tested; each set of configuration parameters of the electronics comprises a threshold value, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, a scale Start, a Start and an end Stop; different electronics specifically different addresses, anode step values and dynode step values; the scale voltages in the different groups of configuration parameters are different;
2) The signal generated by the signal generator is input into the attenuator, the attenuator generates M frame signals with amplitude step change according to parameter configuration and sequentially inputs the M frame signals into each electronics to be tested, and test data under K different scale voltages of each electronics are tested;
3) The test system collects test data of K different scale voltages of each electronic device and processes the test data to generate images so as to test the performance of each electronic device.
Further, the method for the test system to send the K groups of configuration parameters of the electronics to each of the electronics to be tested includes: the test system firstly transmits the invariants in each group of configuration parameters to corresponding electronics; the invariant comprises a threshold value, an anode step, a dynode step, a slow control data updating interval and a data packet interval; then, in the data acquisition stage of the ith scale voltage, sending the scale voltage, starting the scale, starting Start to each electronics, acquiring data, and then sending Stop; wherein each of the electronics transmits the test data for each of the scale voltages to the test system in the form of a data packet.
Further, the test system processes the test data by the following steps:
31 The blank in the test data in each data packet is replaced by a blank character, the line changing character is replaced by an English period character, then after all the data are connected into a character string, the effective data in the character string are extracted, wherein the effective data comprise five test values of an anode Q value, an anode step value, a dynode Q value, a dynode step value and arrival time; the arrival time is the arrival time difference of the front and rear data packets of the current data;
32 Generating a corresponding histogram for each test value corresponding to the same electronics; performing Gaussian fitting on each target test value array corresponding to the same electronics; wherein Gaussian fitting method is well-formedCalculating the difference between the maximum value and the minimum value of the array, dividing the array by taking 0.1 as a scale, taking the dividing value of the maximum value divided by the minimum value as the circulation times, adding 0.1 to the minimum value as the shift parameter of the shift register in the circulation structure, and adding 0.1 to the minimum value as the x element of the Gaussian fitting cluster; then calculating standard deviation sigma and arithmetic mean mu of data in the array, and simultaneously inputting a histogram statistics x value group corresponding to a target test value as input to Gaussian fitting vi to obtain amplitude A and offset C; then through Gaussian functionObtaining y element array, X [ i ]]Is a distribution of x values; combining the y element array and the x element array into Gaussian fitting clusters, combining the Gaussian fitting clusters corresponding to the same electronics and each histogram into two-dimensional array clusters, and outputting the two-dimensional array clusters to an x-y image to obtain a data image corresponding to the electronics; the target test value array comprises an array for storing anode Q values, an array for storing anode step values, an array for storing dynode Q values and an array for storing dynode step values;
33 Straight line fitting is carried out on the anode step value and the dynode step value under K scale voltages respectively.
Further, the method for extracting the effective data comprises the following steps: and searching 01 as a search keyword, intercepting a character string with 01 at the beginning and aa at the end, replacing English period characters in the intercepted character string with blank characters, comparing the lengths of the intercepted character string, and reserving the intercepted character string as effective data if 160bits are met.
Further, the attenuator adopts a laminated sequence structure to store the parameter configuration of the attenuator and is used for generating 16-frame signals with step change from 50mv to 10 v; each frame signal has a duration of 60000ms.
Further, the signal generator generates a constant 10v signal; the attenuator is a mechanical stepping attenuator; the electronics are electromagnetic particle detectors.
The batch test system for the electromagnetic particle detector readout electronics board is characterized by comprising a signal generator, an attenuator, electronics and a test system; the attenuator control module carries out parameter configuration on the attenuator, and configures the duration of each frame signal and the attenuation multiple of the corresponding frame signal of the input electronics; the test system sends K groups of configuration parameters of the electronics to each electronics to be tested; each set of configuration parameters of the electronics comprises a threshold value, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, a scale Start, a Start and an end Stop; different electronics specifically different addresses, anode step values and dynode step values; the scale voltages in the different groups of configuration parameters are different;
a signal generator for generating and transmitting PMT signals for testing electronic performance to the attenuator;
the attenuator is used for generating M frames of signals with amplitude step change after attenuating the received PMT signals according to parameter configuration and sequentially inputting the signals to each electronic to be tested;
the electronics is used for generating test data under K different scale voltages according to the input signals and sending the test data to the test system;
and the testing system is used for collecting the testing data of each electronic device under K different scale voltages and processing the testing data to generate images so as to test the performance of each electronic device.
Compared with the prior art, the application has the following effects:
1. improving automation
The application is created by the LabVIEW platform, and hardware facilities such as an attenuator and a circuit board are combined, so that complex manual operation is removed, the testing process is processed by a computer, and the automation level of the test is improved.
2. Shortening test time
The traditional test can not be synchronously performed by manual operation, and the manual operation step is more time-consuming.
3. Improving the test accuracy
The traditional test can generate a large amount of errors by manual timing in the aspect of timing measurement, the application can realize accurate measurement by automatic timing of a computer, and can extract effective data and skim ineffective data compared with the traditional test in the aspect of data processing, thereby improving the test precision.
Drawings
FIG. 1 is a diagram of a test structure of the present application;
fig. 2 is a software architecture diagram of the present application.
Detailed Description
The application is described in further detail below with reference to the accompanying drawings.
The test environment generally includes a signal generator, a mechanical step (RSC) attenuator, electronics, and a test system. The signal generator uses the Agilent 81150a generator to test electronics, which is used primarily to simulate PMT signals for testing electronic performance. The attenuator uses an R & S RSC step attenuator, is a switchable mechanical step attenuator, has the frequency range of up to 6GHz, 18GHz, 40GHz and 67GHz, the maximum attenuation range of 139.9dB and the minimum step length of 0.1dB, 1dB and 5dB, and can effectively and stably attenuate signals. Electronics the test structure is shown in figure 1 using electromagnetic particle detector (ED) electronics.
The test system mainly completes the test of charge resolution, time resolution and integral nonlinearity of the electronic board through a signal generator and an attenuator, and completes the test of the self-calibration function of the system through configuration of different parameters. The specific test steps are as follows: the signal output port of the signal generator is connected with the signal input port of the RSC attenuator, the tail end of the attenuator is connected to the pc machine through a USB interface, the signal output port of the RSC attenuator is connected to ED electronics, the electronics are connected to the pc machine through a network cable port, a power supply is connected, a test system is operated on the pc machine, and the test system is operated to complete the test.
Integral frame
The ED electronics test system adopts LabVIEW 2018 as a platform for development, and the whole system is divided into three modules, namely an RSC attenuator control module, a data acquisition module and a data processing module. The data acquisition module comprises a parameter configuration module, a data sending module and a data acquisition module, the data processing module comprises a file processing module, a data extraction module, an image generation module and a straight line fitting module, and the whole structure diagram of the software is shown in figure 2.
1. Attenuator control module
The RSC attenuator control module is responsible for controlling automatic jump of attenuation decibels of the attenuator, the amplitude change of 16 input signals from 50mv to 10v is involved in the test, a constant 10v input signal is generated through the signal generator, the attenuation decibels of the attenuator are automatically controlled through a program, further, the signal output to electronics is controlled to change from 50mv to 10v, an initialization.vi in a Rohde & Schwarz RSC Attenuator Controller instrument driver is called for initializing the attenuator, a VISA resource name interface can check the currently connected attenuator VISA resource name for ID confirmation (because a plurality of attenuators can be connected at the same time, corresponding processing programs can be different in function, therefore, the ID confirmation guarantee program is in one-to-one correspondence with the attenuators), the interface has an automatic refreshing function, the USB port number of the currently selectable attenuator can be checked in real time, and an error information prompting function is provided, the VISA resource name output is connected with the configuration actual value vi for parameter transmission and parameter configuration, the corresponding laminated decibels needing attenuation are set under the configuration.vi, a corresponding laminated structure is adopted, and the attenuation multiple is set for 16 frames corresponding to the current attenuation multiple 16 frames, and the attenuation multiple is set for each frame is completed. And outputting possible Error information through Error-Query for a tester to check and debug.
2. Data acquisition module
The ED electronics adopts a transmission method of TCP/IP based on FPGA, the transmission data comprises uplink data (ED is sent to a test system) and downlink data (the test system is sent to the ED), and the functions of the data acquisition module comprise parameter configuration, data sending and data acquisition, and the functions respectively realized are the parameter configuration of the downlink data, the sending of the downlink data and the acquisition of the uplink data transmitted through TCP/IP protocol to the local.
2.1 parameter configuration
After the electronic power-on, register instruction parameter configuration is needed, the parameters are composed of 9 groups of data, namely a threshold value, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, a scale starting, a starting Start and a finishing Stop, each group of data formats are 64bits hexadecimal character strings, the transmission data formats need to be modified in order to meet the transmission data format requirements of the TCP/IP protocol, the parameter configuration module is used for modifying the 16-bit hexadecimal character strings into 8bits for decimal conversion, a one-dimensional array of 8 groups of data is obtained, then characters in the 8 groups of one-dimensional arrays are processed, the data in each array are converted into ASCII values, and then the converted values form a recombined ASCII character string for obtaining the parameters so that the system can carry out subsequent operation.
2.2 data Transmission
The parameters configured by the parameter configuration module are required to be sent to the electronics through a TCP/IP protocol, and each electronics has a unique IP address and different anode step value and dynode step value test requirements, so that the anode step value and the dynode step value are manually input by a tester for each electronics. Meanwhile, each electronic part needs to test data under 14 different scale values in total, then processing and analyzing are carried out, the scale voltage values in the 9 parameters are different in each scale value, the other 8 parameter configurations are not required to be changed under the test condition of different scale values, so that specific values of the configuration parameters with different scale voltage values and remaining fixed except for an anode step value and a dynode step value are automatically input by a background program and are subjected to parameter conversion, a tester does not need to manually configure, 14 scales (14 scale tests are carried out per frame) of each electronic part, 61 groups of parameters are written into TCP in total, and each group of parameters need to be sequentially written in at set time intervals (such as 1000 ms) so as to be read by electronics, and therefore, the writing of each group of parameters is blocked by adopting a sequential structure.
2.3 data acquisition
After the parameters are transmitted to the electronics via the TCP/IP protocol, uplink data transmission is performed. The ED electronics adds the bits and the tails of the bits of the charge information, the time information and the like to the data packet for data identification, and sends the data packet to the TCP/IP module according to a fixed time interval, so that the test system needs to acquire the data transmitted by the ED electronics in real time through the TCP/IP on line to obtain real-time and effective test data. The data acquisition module is internally coupled with a data transmission module aiming at 4 groups of parameters of each scale node, and the specific flow is as follows: and sending scale voltage, sending scale Start, sending Start, collecting data and sending Stop. The data acquisition part is connected with the data transmission module through an ID by reading TCP data, can specify the number of bytes read and the reading time, reads in a format with the width of 2 so as to match the data format transmitted from a network, stores the output hexadecimal shaping character strings in a hard disk of a pc machine in a group of 8bits through a written text file function, and automatically distributes the storage file address by a test system without manual input of a tester.
2.4 data processing
The data acquired by the data acquisition module is required to be processed by the data processing part and an image is generated so as to test the performance of electronics. The data processing part comprises file processing, data extraction, data analysis and straight line fitting, and the functions respectively comprise processing a file stored in a data acquisition module, extracting effective data from the data in the file, analyzing the effective data to obtain an image, and performing straight line fitting on the integral data scale points and two step values to obtain an analysis result.
2.4.1 File processing
The data collected by the data collection module is automatically stored in the hard disk of the pc machine, and the data is firstly required to be extracted into the test system by the file processing module for processing and analyzing. Firstly, the data file is automatically opened through a file dialog box, the data or character strings can be read from a local hard disk through a text processing function, the reading format can be set by itself, and the system adopts default values, namely, all the data or character strings are read by default. Since the data storage format in the local text file is a storage mode in which 8bits are used as one line, the data format in the file needs to be processed. The space in the text is replaced by the blank character and the linefeed character is replaced by the English period character by using the search replacement character string, the storage format in the text document can be replaced by the standard character string format, and every 8bits are separated by one English period character. After all the data are connected into character strings, the effective data in the character strings are extracted, the data sent by the electronics through TCP/IP contain slow control data, updated information data, register read-back data and other invalid data, so that the collected data are extracted for subsequent processing analysis by a program. The packet format is shown in table 1, the header format is shown in table 2, and the trailer format is shown in table 3.
Table 1 packet format
| Data head | Data | Data tail |
| 8bits | 160bits | 8bits |
Table 2 header format
TABLE 3 data tail format
| Length (bits) | Description of the application | |
| Fixed data | 1 | 0xaa |
As can be seen from the combination of table 1, table 2 and table 3, the valid data required for the test, i.e., the hits data, is data starting with hexadecimal character form 01, ending with hexadecimal character form aa, and having a length of 160 bits. Therefore, the method searches 01 as a search keyword through a search splitting character string function, intercepts a character string ending with aa through intercepting the character string, replaces English period characters with blank characters, compares the lengths of the intercepted character strings, and meanwhile, the effective character string meeting the two conditions of 160bits and 01 to aa ending is adopted by the system. The algorithm adopts a while circulation structure, and the circulation ending condition is that the read character is empty, namely the data in the file is completely read by the system. The algorithm can quickly and accurately extract the effective data of the data sent by the electronics through the TCP.
2.4.2 data extraction
After the valid data strings are re-integrated through the file processing, five test values in the extracted valid data are analyzed, and according to table 1, the data head and the data tail and the unnecessary data portion are removed, and the data structure of the data center portion 160bits is shown in table 4.
Table 4 data structure
As can be seen from table 4, the anode Q value, the anode step value, the dynode Q value, and the dynode step value, the arrival time five test values are respectively 6 to 10 bits, 10 to 14 bits, 16 to 20 bits, 20 to 24 bits, and 24 to 40 bits in the hexadecimal string data of 160bits, that is, 40 bytes in length. Therefore, the data extraction module extracts five test values in all the hits data in the file. After processing the data in the file by the file processing module, a character string array containing the 160bits data character string of the hits data center part is obtained, the character string in the character string array is intercepted according to the positions in sequence, the algorithm takes the length of the array as the circulation times by a for circulation, the self-increasing variable as the index of the index array is used as the index of the index array to obtain the character string corresponding to the index, then the character string corresponding to the five test values is intercepted according to the bits, and the character string is transmitted to the hexadecimal character string to the decimal character to be converted and stored in the decimal character string array as a parameter. The arrival time data value requires that each packet calculates the difference in arrival time before and after, so the algorithm calculates the data difference between the index and the index plus 1 by subtracting 1 from the number of cycles. Five arrays of target values in the data file for each scale can be extracted by the data extraction module.
2.4.3 data analysis
For 5 arrays obtained by data extraction (values of each test value of the same electronics in different scales are stored in a corresponding array, for example, values of anode Q values of the same electronics in different scales are stored in an anode Q value array), the time difference array directly adopts a histogram function in LabVIEW to generate an image, and other 4 arrays need to carry out Gaussian fitting on the data to obtain a fitting result besides adopting a histogram to generate the image. For the histogram part, the number of different numbers of the array is used as a histogram interval to be input into a histogram function, the number in the array is used as an x-axis abscissa value of the histogram distribution, the count is used as a y-axis ordinate value to be bundled into clusters, and the clusters obtained through a Gaussian fitting algorithm are combined into a two-dimensional cluster array. For the Gaussian fitting part, the ED electronic board generates and is accepted by a test system, namely the anode Q value, the anode step value, the dynode Q value, the dynode step value and the histogram x value which are all four values except for the time difference, wherein the number of different values, namely the number of the histogram x values, can reach 4 at the minimum, for the image processing function provided by LabVIEW, the Gaussian fitting is carried out on 4 numerical points, the generated x-y image can only be connected with 4 points in sequence, and the generated image can not meet the test requirement, so that the data analysis module carries out algorithm improvement on the LabVIEW Gaussian fitting process, and the specific improvement method comprises the following steps: dividing by taking 0.1 as a scale, dividing the maximum value by the division value of the minimum value to be used as for circulation times, adding 0.1 to the minimum value to be used as a shift parameter of a shift register in a circulation structure, outputting the outside of the circulation body by an automatic index tunnel, adding 0.1 to be used as an x element of a Gaussian fitting cluster, converting an array data type into a dynamic data type which can be used by a statistical function through array-to-dynamic type conversion, connecting the array as a signal to the statistics, calculating to obtain a standard deviation sigma and an arithmetic mean mu of the data, inputting a histogram statistical x value group to the Gaussian fitting function to obtain an amplitude A and an offset C, and obtaining the amplitude A and the offset C through a Gaussian function formula:
obtaining a y element array, combining the y element array with the x element array to form a Gaussian fitting cluster, combining the Gaussian fitting cluster with a histogram cluster to form a two-dimensional array cluster, and outputting the two-dimensional array cluster to an x-y image, so that a data image can be obtained through a test system; wherein, X [ i ] is the distribution of X values. For 4 points, the traditional method can not simulate effective Gaussian images through labview development tools, and the method can simulate smooth and effective Gaussian fitting curves under the condition of the lowest 4 points.
2.4.4 Linear fitting
The method comprises the steps that anode step values and dynode step values under 14 scales are required to be obtained in a test, linear fitting results are obtained, gaussian fitting center values of the anode step values and the dynode step values obtained under 14 scales are respectively stored in a local file, and after the 14 scales are tested by a test system, the linear fitting module respectively carries out linear fitting on values of 28 points in total, so that respective linear fitting results of two data are obtained. The specific implementation method comprises the following steps: the step value array of each scale point obtained through the data processing module is input with a histogram X value and a histogram count value obtained after histogram processing as an X value and a y value of Gaussian fitting respectively, a central value of the step value is obtained through histogram function calculation, and numerical value to decimal character conversion is carried out on the central value so as to facilitate subsequent processing, wherein the specific processing algorithm is as follows: and adding space characters before the central value character string of each scale, adding a line-changing character, storing the character string into a text file in the format, detecting data in the text file in real time by adopting a circulating structure, if 14 numerical values are reached, carrying out data analysis on the file by adopting a for circulating mode, searching the character string at the beginning of the space characters and the end of the line-changing character on the data in the file, storing the obtained step value character string into an array by using an automatic index, binding the step value array and the set scale array into clusters, and outputting the cluster in the format of an x-y diagram.
The foregoing is a further detailed description of the application in connection with specific embodiments, and it is not intended that the application be limited to such description. It will be apparent to those skilled in the art that several simple deductions or substitutions can be made without departing from the inventive concept.
Claims (8)
1. A batch test method for an electromagnetic particle detector readout electronic board comprises the following steps:
1) The attenuator control module carries out parameter configuration on the attenuator, and configures the duration of each frame signal and the attenuation multiple of the corresponding frame signal of the input electronics; the test system sends K groups of configuration parameters of the electronics to each electronics to be tested; wherein the method comprises the steps of
Each set of configuration parameters of the electronics comprises a threshold value, an anode step, a dynode step, a slow control data update interval, a data packet interval, a scale voltage, a scale Start, a Start and an end Stop; different electronics specifically different addresses, anode step values and dynode step values; the scale voltages in the different groups of configuration parameters are different;
2) The signal generated by the signal generator is input into the attenuator, the attenuator generates M frame signals with amplitude step change according to parameter configuration and sequentially inputs the M frame signals into each electronics to be tested, and test data under K different scale voltages of each electronics are tested;
3) The test system collects test data of K different scale voltages of each electronics and processes the test data to generate images so as to test the performance of each electronics; the test system processes test data by the following steps: 31 The blank in the test data in each data packet is replaced by a blank character, the line changing character is replaced by an English period character, then after all the data are connected into a character string, the effective data in the character string are extracted, wherein the effective data comprise five test values of an anode Q value, an anode step value, a dynode Q value, a dynode step value and arrival time; the arrival time is the arrival time difference of the front and rear data packets of the current data; 32 Generating a corresponding histogram for each test value corresponding to the same electronics; performing Gaussian fitting on each target test value array corresponding to the same electronics; dividing by taking 0.1 as a scale, dividing the maximum value by the minimum value to be used as the circulation times, adding 0.1 to the minimum value to be used as the shift parameter of a shift register in a circulation structure, and adding 0.1 to be used as the x element of a Gaussian fitting cluster; then calculating standard deviation sigma and arithmetic mean mu of data in the array, and simultaneously inputting a histogram statistics x value group corresponding to a target test value as input to Gaussian fitting vi to obtain amplitude A and offset C; then through Gaussian functionObtaining y element array, X [ i ]]Is a distribution of x values; combining the y element array and the x element array into Gaussian fitting clusters, combining the Gaussian fitting clusters corresponding to the same electronics and each histogram into two-dimensional array clusters, and outputting the two-dimensional array clusters to an x-y image to obtain a data image corresponding to the electronics; wherein the target test value array packageThe method comprises an array for storing an anode Q value, an array for storing an anode step value, an array for storing a dynode Q value and an array for storing a dynode step value; 33 Straight line fitting is carried out on the anode step value and the dynode step value under K scale voltages respectively.
2. The method of claim 1, wherein the method by which the test system sends K sets of configuration parameters of the electronics to each of the electronics under test is: the test system firstly transmits the invariants in each group of configuration parameters to corresponding electronics; the invariant comprises a threshold value, an anode step, a dynode step, a slow control data updating interval and a data packet interval; then, in the data acquisition stage of the ith scale voltage, sending the scale voltage, starting the scale, starting Start to each electronics, acquiring data, and then sending Stop; wherein each of the electronics transmits the test data for each of the scale voltages to the test system in the form of a data packet.
3. The method of claim 1, wherein the method of extracting valid data is: and searching 01 as a search keyword, intercepting a character string with 01 at the beginning and aa at the end, replacing English period characters in the intercepted character string with blank characters, comparing the lengths of the intercepted character string, and reserving the intercepted character string as effective data if 160bits are met.
4. The method of claim 1, wherein the attenuator stores a parameter configuration of the attenuator in a stacked sequential structure for generating a 16 frame signal in a step change from 50mv to 10 v; each frame signal has a duration of 60000ms.
5. The method of claim 1, wherein the signal generator generates a constant 10v signal; the attenuator is a mechanical stepping attenuator; the electronics are electromagnetic particle detectors.
6. The batch test system for the electromagnetic particle detector readout electronics board is characterized by comprising a signal generator, an attenuator, electronics and a test system; the attenuator control module carries out parameter configuration on the attenuator, and configures the duration of each frame signal and the attenuation multiple of the corresponding frame signal of the input electronics; the test system sends K groups of configuration parameters of the electronics to each electronics to be tested; each set of configuration parameters of the electronics comprises a threshold value, an anode step, a dynode step, a slow control data updating interval, a data packet interval, a scale voltage, a scale Start, a Start and an end Stop; different electronics specifically different addresses, anode step values and dynode step values; the scale voltages in the different groups of configuration parameters are different;
a signal generator for generating and transmitting PMT signals for testing electronic performance to the attenuator;
the attenuator is used for generating M frames of signals with amplitude step change after attenuating the received PMT signals according to parameter configuration and sequentially inputting the signals to each electronic to be tested;
the electronics is used for generating test data under K different scale voltages according to the input signals and sending the test data to the test system;
the test system is used for collecting test data of K different scale voltages of each electronics and processing the test data to generate images so as to test the performance of each electronics; the test system processes test data according to the following steps: firstly, replacing blank spaces in test data in each data packet with blank characters, replacing line-changing characters with English period characters, connecting all data into character strings, and extracting effective data in the character strings, wherein the effective data comprises an anode Q value, an anode step value, a dynode Q value, a dynode step value and an arrival time; the arrival time is the arrival time difference of the front and rear data packets of the current data; then generating a corresponding histogram for each test value corresponding to the same electronics; performing Gaussian fitting on each target test value array corresponding to the same electronics; in the Gaussian fitting method, the difference between the maximum value and the minimum value of the array is calculated, the array is divided by taking 0.1 as a scale, and the dividing value of the maximum value divided by the minimum value is taken asFor the number of cycles, adding 0.1 to the minimum value to be used as a shift parameter of a shift register in a cycle structure body, and adding 0.1 to be used as an x element of a Gaussian fitting cluster; then calculating standard deviation sigma and arithmetic mean mu of data in the array, and simultaneously inputting a histogram statistics x value group corresponding to a target test value as input to Gaussian fitting vi to obtain amplitude A and offset C; then through Gaussian functionObtaining y element array, X [ i ]]Is a distribution of x values; combining the y element array and the x element array into Gaussian fitting clusters, combining the Gaussian fitting clusters corresponding to the same electronics and each histogram into two-dimensional array clusters, and outputting the two-dimensional array clusters to an x-y image to obtain a data image corresponding to the electronics; the target test value array comprises an array for storing anode Q values, an array for storing anode step values, an array for storing dynode Q values and an array for storing dynode step values; and respectively performing straight line fitting on the anode step values and the dynode step values under the K scale voltages.
7. The system of claim 6, wherein the method for extracting valid data is: and searching 01 as a search keyword, intercepting a character string with 01 at the beginning and aa at the end, replacing English period characters in the intercepted character string with blank characters, comparing the lengths of the intercepted character string, and reserving the intercepted character string as effective data if 160bits are met.
8. The system of claim 6, wherein the attenuator stores a parameter configuration of the attenuator in a stacked sequential structure for generating a 16 frame signal in a step change from 50mv to 10 v; each frame signal has a duration of 60000ms.
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