CN113037401A - Chip radio frequency index testing method and system with high link budget - Google Patents
Chip radio frequency index testing method and system with high link budget Download PDFInfo
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- CN113037401A CN113037401A CN202110271793.0A CN202110271793A CN113037401A CN 113037401 A CN113037401 A CN 113037401A CN 202110271793 A CN202110271793 A CN 202110271793A CN 113037401 A CN113037401 A CN 113037401A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
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Abstract
The invention relates to the field of chip testing, in particular to a chip radio frequency index testing method and system with high link budget. The method specifically comprises the following steps: step S1, setting a decay link; step S2, adjusting the attenuation link according to the link attenuation budget; step S3, the chip to be tested transmits the first radio frequency signal to the standard chip through the adjusted attenuation link; step S4, the standard chip generates a second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the attenuation link; and step S5, acquiring a radio frequency index test result of the chip to be tested according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget. The technical scheme of the invention has the beneficial effects that: the method and the system for testing the radio frequency indexes of the chip with the high link budget are provided, the radio frequency index test result is obtained through communication between the chip to be tested and the standard chip, the high link budget can be met, the economic cost is reduced, the test flow is simplified, and the industrial production is facilitated.
Description
Technical Field
The invention relates to the field of chip testing, in particular to a chip radio frequency index testing method and system with high link budget.
Background
In the prior art, for testing a Radio Frequency (RF) chip, corresponding instruments are mainly used for RF index testing, such as signal source testing receiving sensitivity, spectrometer testing transmitting power and other indexes, however, such testing not only involves a large investment in early testing and has a high testing cost, but also has a high difficulty in developing an automation system.
Disclosure of Invention
Aiming at the problems in the prior art, a chip radio frequency index testing method and system with high link budget are provided.
A chip radio frequency index test method with high link budget comprises the following steps:
step S1, providing a chip to be tested and a standard chip, wherein an attenuation link is arranged between the chip to be tested and the standard chip;
step S2, obtaining link attenuation budget, and adjusting the attenuation link according to the link attenuation budget;
step S3, the chip to be tested transmits a first radio frequency signal to the standard chip through the adjusted attenuation link;
step S4, the standard chip generates a second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the attenuation link;
step S5, a radio frequency index test result of the chip to be tested is obtained according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
Preferably, a shielding box is arranged outside the standard chip;
in the step S3, the chip to be tested transmits a first radio frequency signal to the standard chip through the attenuation link and the shielding box;
in step S4, the standard chip generates the second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the shielding box and the attenuation link.
Preferably, the attenuation link comprises a first fixed attenuation link, an adjustable attenuation link and a second fixed attenuation link;
in step S3, the chip to be tested transmits a first radio frequency signal to the standard chip sequentially through the first fixed attenuation link, the adjustable attenuation link, and the second fixed attenuation link;
in step S4, the standard chip generates the second radio frequency signal and feeds back the second radio frequency signal to the chip to be tested sequentially through the second fixed attenuation link, the adjustable attenuation link, and the first fixed attenuation link.
Preferably, the link attenuation budget is greater than 160 dB.
Preferably, the attenuation of the first fixed attenuation link is greater than 60dB and less than the isolation between the chip to be tested and the first fixed attenuation link;
the attenuation of the second fixed attenuation link is more than 60dB and less than the isolation between the standard chip and the second fixed attenuation link.
Preferably, the radio frequency index test result includes a receiving sensitivity;
the step S5 includes:
and subtracting the link attenuation budget from the second radio frequency signal to obtain the receiving sensitivity of the chip to be tested.
Preferably, the radio frequency index test result includes transmission power;
the step S5 includes:
and matching and analyzing the first radio frequency signal and a preset check signal to obtain the transmitting power of the chip to be detected.
Preferably, the method further comprises the following steps:
and step S6, providing an upper computer, and displaying the radio frequency index test result by the upper computer.
A chip radio frequency index test system with high link budget comprises:
a chip to be tested is used for sending a first radio frequency signal;
the standard chip is used for generating a second radio frequency signal according to the first radio frequency signal;
the attenuation link is arranged between the chip to be tested and the standard chip and used for adjusting according to a preset link attenuation budget, transmitting the first radio-frequency signal to the standard chip through the adjusted attenuation link and feeding the second radio-frequency signal back to the chip to be tested;
and the acquisition unit is used for acquiring a radio frequency index test result of the chip to be tested according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
Preferably, the attenuation link comprises a first fixed attenuation link, an adjustable attenuation link and a second fixed attenuation link;
the chip to be tested sequentially passes through the first fixed attenuation link, the adjustable attenuation link and the second fixed attenuation link to transmit a first radio frequency signal to the standard chip;
and the standard chip generates the second radio frequency signal and feeds the second radio frequency signal back to the chip to be tested sequentially through the second fixed attenuation link, the adjustable attenuation link and the first fixed attenuation link.
The technical scheme of the invention has the beneficial effects that: the method and the system for testing the radio frequency indexes of the chip with the high link budget are provided, the radio frequency index test result is obtained through communication between the chip to be tested and the standard chip, the high link budget can be met, the economic cost is reduced, the test flow is simplified, and the industrial production is facilitated.
Drawings
FIG. 1 is a schematic flow chart of a method for testing radio frequency indexes of a chip according to a preferred embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a chip RF index testing system according to a preferred embodiment of the present invention;
FIG. 3 is a schematic flow chart of a method for testing radio frequency indexes of a chip when a shielding box is disposed outside a standard chip according to a preferred embodiment of the present invention;
fig. 4 is a schematic flowchart of a chip radio frequency index testing method when attenuation links include a first fixed attenuation link, an adjustable attenuation link, and a second fixed attenuation link according to a preferred embodiment of the present invention;
FIG. 5 is a schematic flow chart of a method for testing a chip radio frequency index for obtaining a receiving sensitivity according to an embodiment of the present invention;
FIG. 6 is a schematic flow chart of a method for testing radio frequency indexes of a chip for acquiring transmission power according to a preferred embodiment of the present invention;
fig. 7 is a flowchart illustrating a chip rf index testing method for displaying a rf index testing result according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The invention is further described with reference to the following drawings and specific examples, which are not intended to be limiting.
A method for testing a chip radio frequency index with a high link budget, as shown in fig. 1, includes:
step S1, providing a chip to be tested and a standard chip, and arranging an attenuation link between the chip to be tested and the standard chip;
step S2, obtaining link attenuation budget, and adjusting the attenuation link according to the link attenuation budget;
step S3, the chip to be tested transmits the first radio frequency signal to the standard chip through the adjusted attenuation link;
step S4, the standard chip generates a second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the attenuation link;
and step S5, acquiring a radio frequency index test result of the chip to be tested according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
Specifically, considering the problem of high test cost caused by the adoption of an instrument for testing radio frequency indexes in the prior art, as shown in fig. 1, the invention provides a chip radio frequency index test method with high link budget, as shown in fig. 2, an attenuation link is arranged between a chip 1 to be tested and a standard chip 2, the attenuation link is adjusted according to the preset link attenuation budget, then the chip 1 to be tested is controlled to transmit a first radio frequency signal to the standard chip 2 through the attenuation link, the standard chip 2 transmits a second radio frequency signal according to the received first radio frequency signal, and the second radio frequency signal is fed back to the chip 1 to be tested through the attenuation link, so as to realize a radio frequency index test result of the chip 1 to be tested. The invention does not adopt a special instrument to finish the test of the radio frequency index any more, can save the cost of the instrument, and reduce the early investment.
In a preferred embodiment of the present invention, as shown in fig. 2, a shielding box 4 is further disposed outside the standard chip 2;
as shown in fig. 3, in step S3, the chip to be tested transmits the first radio frequency signal to the standard chip through the attenuation link and the shielding box;
and step S4, the standard chip generates a second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the shielding box and the attenuation link.
Specifically, a shielding box 4 is arranged outside the standard chip 2, and the link budget of the attenuation link can be improved by utilizing the isolation degree of the shielding box 4, so that the attenuation requirement is further met.
In a preferred embodiment of the present invention, as shown in fig. 2, the attenuation chain includes a first fixed attenuation chain 31, an adjustable attenuation chain 32, and a second fixed attenuation chain 33;
as shown in fig. 4, in step S3, the chip to be tested sequentially passes through the first fixed attenuation link, the adjustable attenuation link, and the second fixed attenuation link, and transmits the first radio frequency signal to the standard chip;
in step S4, the standard chip generates a second radio frequency signal and feeds back the second radio frequency signal to the chip to be tested sequentially through the second fixed attenuation link, the adjustable attenuation link, and the first fixed attenuation link.
Specifically, in order to meet the high link attenuation budget, the attenuation link may be divided into three parts for design, the first fixed attenuation link 31 is directly connected to the chip 1 to be tested and is disposed on the first test control board 51 to receive the first radio frequency signal sent by the chip 1 to be tested, the adjustable attenuation link 32 is disposed outside the first test control board 51 and is connected to the first fixed attenuation link 31 for transmitting the first radio frequency signal, wherein the chip 1 to be tested may be fixed in the first test control board through the fixture 6; the second fixed attenuation link 33 is directly connected with the standard chip 2 and is arranged on the second test control board 52, and the second fixed attenuation link 33 receives the first radio frequency signal transmitted by the adjustable attenuation link 32 and sends the first radio frequency signal to the standard chip 2. Therefore, the first fixed attenuation link 31, the adjustable attenuation link 32 and the second fixed attenuation link 33 can be designed in advance according to the link attenuation budget, so that the three attenuation links meet the attenuation budget requirement, and the problems that in the prior art, a plurality of shielding boxes 4 are required to meet the high link budget, correspondingly, the complex design of circuits is caused, and further the difficulty of automatic development is increased are solved.
In a preferred embodiment of the invention, the link attenuation budget is greater than 160 dB.
In a preferred embodiment of the present invention, the attenuation of the first fixed attenuation link 31 is greater than 60dB, and is less than the isolation between the chip 1 to be tested and the first fixed attenuation link 31;
the attenuation of the second fixed attenuation link 33 is greater than 60dB and less than the isolation between the standard chip 2 and the second fixed attenuation link 33.
In a preferred embodiment of the present invention, the radio frequency indicator test result includes a reception sensitivity;
as shown in fig. 5, step S5 includes:
and subtracting the link attenuation budget from the second radio frequency signal to obtain the receiving sensitivity of the chip to be detected.
In a preferred embodiment of the present invention, the radio frequency indicator test result includes a transmission power;
as shown in fig. 6, step S5 includes:
and matching and analyzing the first radio frequency signal and a preset check signal to obtain the transmitting power of the chip to be detected.
In a preferred embodiment of the present invention, as shown in fig. 7, the present invention further includes:
and step S6, providing an upper computer, and displaying the radio frequency index test result by the upper computer.
Specifically, as shown in fig. 2, the receiving sensitivity and the transmitting power of the chip 1 to be tested obtained by the test control board can be transmitted to the computer 02 through the USB/UART, so as to be displayed on the upper computer 01.
In a preferred embodiment of the present invention, a chip radio frequency indicator testing system with a high link budget is further provided, as shown in fig. 2, including:
the chip to be tested 1 is used for sending a first radio frequency signal;
the standard chip 2 is used for generating a second radio frequency signal according to the first radio frequency signal;
the attenuation link 3 is arranged between the chip 1 to be tested and the standard chip 2 and is used for adjusting according to a preset link attenuation budget, transmitting the first radio-frequency signal to the standard chip 2 through the adjusted attenuation link and feeding back the second radio-frequency signal to the chip 1 to be tested;
and the acquisition unit is used for acquiring a radio frequency index test result of the chip to be tested according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
In the preferred embodiment of the present invention, the attenuation chain 3 comprises a first fixed attenuation chain 31, an adjustable attenuation chain 32 and a second fixed attenuation chain 33;
the chip 1 to be tested transmits a first radio frequency signal to the standard chip sequentially through the first fixed attenuation link 31, the adjustable attenuation link 32 and the second fixed attenuation link 33;
the standard chip 2 generates a second radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the second fixed attenuation link 33, the adjustable attenuation link 32 and the first fixed attenuation link 31 in sequence.
The technical scheme of the invention has the beneficial effects that: the method and the system for testing the radio frequency indexes of the chip with the high link budget are provided, the radio frequency index test result is obtained through communication between the chip to be tested and the standard chip, the high link budget can be met, the economic cost is reduced, the test flow is simplified, and the industrial production is facilitated.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (10)
1. A chip radio frequency index test method with high link budget is characterized by comprising the following steps:
step S1, providing a chip to be tested and a standard chip, wherein an attenuation link is arranged between the chip to be tested and the standard chip;
step S2, obtaining link attenuation budget, and adjusting the attenuation link according to the link attenuation budget;
step S3, the chip to be tested transmits a first radio frequency signal to the standard chip through the adjusted attenuation link;
step S4, the standard chip generates a second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the attenuation link;
step S5, a radio frequency index test result of the chip to be tested is obtained according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
2. The method for testing the radio frequency index of the chip with high link budget of claim 1, wherein a shielding box is further arranged outside the standard chip;
in the step S3, the chip to be tested transmits a first radio frequency signal to the standard chip through the attenuation link and the attenuation box;
in step S4, the standard chip generates the second radio frequency signal according to the first radio frequency signal and feeds the second radio frequency signal back to the chip to be tested through the attenuation box and the attenuation link.
3. The method for testing the chip radio frequency index with the high link budget according to claim 1, wherein the attenuation link comprises a first fixed attenuation link, an adjustable attenuation link and a second fixed attenuation link;
in step S3, the chip to be tested transmits a first radio frequency signal to the standard chip sequentially through the first fixed attenuation link, the adjustable attenuation link, and the second fixed attenuation link;
in step S4, the standard chip generates the second radio frequency signal and feeds back the second radio frequency signal to the chip to be tested sequentially through the second fixed attenuation link, the adjustable attenuation link, and the first fixed attenuation link.
4. The method for testing the radio frequency index of the chip with the high link budget of claim 3, wherein the link attenuation budget is greater than 160 dB.
5. The method for testing the chip radio frequency index with the high link budget according to claim 4, wherein the attenuation of the first fixed attenuation link is greater than 60dB and less than the isolation between the chip to be tested and the first fixed attenuation link;
the attenuation of the second fixed attenuation link is more than 60dB and less than the isolation between the standard chip and the second fixed attenuation link.
6. The method for testing the radio frequency index of the chip with high link budget of claim 1, wherein the radio frequency index test result comprises a receiving sensitivity;
the step S5 includes:
and subtracting the link attenuation budget from the second radio frequency signal to obtain the receiving sensitivity of the chip to be tested.
7. The method according to claim 1, wherein the rf indicator test result comprises a transmission power;
the step S5 includes:
and matching and analyzing the first radio frequency signal and a preset check signal to obtain the transmitting power of the chip to be detected.
8. The method for testing the radio frequency index of the chip with high link budget according to claim 1, further comprising:
and step S6, providing an upper computer, and displaying the radio frequency index test result by the upper computer.
9. A chip radio frequency index test system with high link budget is characterized by comprising:
a chip to be tested is used for sending a first radio frequency signal;
the standard chip is used for generating a second radio frequency signal according to the first radio frequency signal;
the attenuation link is arranged between the chip to be tested and the standard chip and used for adjusting according to a preset link attenuation budget, transmitting the first radio-frequency signal to the standard chip through the adjusted attenuation link and feeding the second radio-frequency signal back to the chip to be tested;
and the acquisition unit is used for acquiring a radio frequency index test result of the chip to be tested according to the first radio frequency signal, the second radio frequency signal and the link attenuation budget.
10. The high link budget chip radio frequency indicator testing system according to claim 9,
the attenuation link comprises a first fixed attenuation link, an adjustable attenuation link and a second fixed attenuation link;
the chip to be tested sequentially passes through the first fixed attenuation link, the adjustable attenuation link and the second fixed attenuation link to transmit a first radio frequency signal to the standard chip;
and the standard chip generates the second radio frequency signal and feeds the second radio frequency signal back to the chip to be tested sequentially through the second fixed attenuation link, the adjustable attenuation link and the first fixed attenuation link.
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| CN202110271793.0A CN113037401B (en) | 2021-03-12 | 2021-03-12 | Chip radio frequency index testing method and system with high link budget |
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| CN202110271793.0A CN113037401B (en) | 2021-03-12 | 2021-03-12 | Chip radio frequency index testing method and system with high link budget |
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Cited By (1)
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| CN115021832A (en) * | 2022-06-02 | 2022-09-06 | 上海磐启微电子有限公司 | Chip communication test system with low cost and high isolation |
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