CN113037370A

CN113037370A - BOSA received power calibration device method and device

Info

Publication number: CN113037370A
Application number: CN201911351226.5A
Authority: CN
Inventors: 徐兆文
Original assignee: Sanechips Technology Co Ltd
Current assignee: Sanechips Technology Co Ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2021-06-25
Anticipated expiration: 2039-12-24
Also published as: WO2021129764A1; CN113037370B

Abstract

The invention provides a BOSA received power calibration method and a device, wherein the BOSA received power calibration method comprises the following steps: determining a calibration type according to the BOSA parameter information; the calibration parameters were determined from the following subjects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measured ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA received power of the bidirectional optical subsystem according to the relation between the optical power information and the ADC information. The invention solves the problem of inaccurate BOSA received power calibration caused by not comprehensively considering factors which possibly influence optical power information and ADC information in the BOSA received power calibration process in the related technology, thereby achieving the effect of improving the BOSA received power calibration accuracy.

Description

BOSA received power calibration device method and device

Technical Field

The invention relates to the field of microelectronics, in particular to a BOSA received power calibration method and device.

Background

With The development of Optical fiber communication technology and The construction of core networks and access networks, Passive Optical Networks (PONs) have continuously shown The capability of providing reliable data, voice and video communication To end users in order To realize full Network Fiber To The Home (FTTH). In the current PON technology, Gigabit Passive Optical Network (GPON) and Ethernet Passive Optical Network (EPON) are two mainstream high-efficiency broadband access technologies at present.

The PON technology can be implemented by using a PON board, and the PON board can be connected to an Optical Line Terminal (OLT) by mounting a Bi-directional Optical Sub-Assembly (BOSA). The BOSA is arranged to replace the traditional optical module scheme, a shell and a control chip are removed, the cost of the single board is reduced, and the performance of the single board is improved. Since the BOSA is directly used for connecting with the OLT, the reception performance of the BOSA directly affects the quality of the optical communication service.

A photoelectric Avalanche Diode (APD) is arranged inside the BOSA; for a PON single board using onboard BOSA, a boost circuit module needs to be provided for BOSA, and due to the use of the boost circuit, temperature compensation needs to be performed on a temperature lookup table of an APD in BOSA, that is, a record of a mapping relation between different temperatures and photocurrent values correspondingly output by the APD, where the temperature compensation process is calibration of BOSA received power.

In the related art, in the process of calibrating the BOSA received power, a two-point determination method or a three-point determination method is generally adopted to establish a model for calibrating the BOSA received power, and then the BOSA received power is calibrated. However, in the process of establishing the BOSA received power calibration model, the BOSA received power calibration model is often inconsistent with the actual situation due to incomplete consideration of many factors in the model establishment, and thus the BOSA received power calibration accuracy is low.

In view of the above problems, in the related art, no effective solution has been proposed yet in the related art, because the factors that may affect the optical power information and the ADC information are not considered comprehensively in the BOSA received power calibration process, and the BOSA received power calibration is inaccurate.

Disclosure of Invention

Embodiments of the present invention provide a method and an apparatus for calibrating BOSA received power, so as to at least solve the problem in the related art that in the BOSA received power calibration process, the BOSA received power calibration is inaccurate due to failure of comprehensive consideration of factors that may affect optical power information and ADC information

According to an embodiment of the present invention, there is provided a BOSA received power calibration method, including:

determining a calibration type according to the BOSA parameter information;

the calibration parameters were determined from the following subjects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point;

and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

According to another embodiment of the present invention, there is also provided a BOSA received power calibration method, including:

acquiring a corresponding relation between temperature information and DAC information of the APD, wherein the DAC information of the APD is used for indicating control information of the APD working in the temperature indicated by the corresponding temperature information;

according to the corresponding relation between the temperature information and the DAC information, determining DAC information corresponding to working temperature information, wherein the working temperature information is used for indicating the working temperature of the BOSA;

and determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

According to another embodiment of the present invention, there is also provided a BOSA received power calibration apparatus, including:

the first determining module is used for determining the calibration type according to the BOSA parameter information;

a second determination module for determining calibration parameters from: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point;

the first calibration module is used for determining the relation between the optical power information and the ADC information according to the calibration parameter, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

an obtaining module, configured to obtain a corresponding relationship between temperature information and DAC information of the APD, where the DAC information of the APD is used to indicate control information that the APD operates at a temperature indicated by the corresponding temperature information;

a corresponding module, configured to determine, according to the corresponding relationship between the temperature information and the DAC information, DAC information corresponding to operating temperature information, where the operating temperature information is used to indicate an operating temperature of the BOSA;

and the second calibration module is used for determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

According to a further embodiment of the present invention, a computer-readable storage medium is also provided, in which a computer program is stored, wherein the computer program is configured to carry out the steps of any of the above-described method embodiments when executed.

According to yet another embodiment of the present invention, there is also provided an electronic device, including a memory in which a computer program is stored and a processor configured to execute the computer program to perform the steps in any of the above method embodiments.

According to the invention, the calibration type can be determined according to the BOSA parameter information; and determining calibration parameters from: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point; thereby, the relation between the optical power information and the ADC information is determined according to the calibration parameter, and BOSA received power calibration is carried out according to the relation between the optical power information and the ADC information. Therefore, the invention can solve the problem of inaccurate BOSA received power calibration caused by not comprehensively considering factors which possibly influence optical power information and ADC information in the BOSA received power calibration process in the related art, so as to effectively improve the accuracy of BOSA received power calibration.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:

fig. 1 is a flowchart (one) of a BOSA received power calibration method according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a board according to an embodiment of the present invention;

FIG. 3 is a flowchart of BOSA received power calibration according to an embodiment of the present invention;

FIG. 4 is a schematic circuit diagram of a boost chip in an on-board BOSA provided in accordance with an embodiment of the present invention;

fig. 5 is a flowchart (ii) of a BOSA received power calibration method according to an embodiment of the present invention;

fig. 6 is a block diagram (one) of a BOSA received power calibration apparatus according to an embodiment of the present invention;

fig. 7 is a block diagram (ii) of a BOSA received power calibration apparatus according to an embodiment of the present invention.

Detailed Description

The invention will be described in detail hereinafter with reference to the accompanying drawings in conjunction with embodiments. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.

It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order.

Example 1

Fig. 1 is a flowchart (one) of a BOSA received power calibration method according to an embodiment of the present invention, and as shown in fig. 1, the BOSA received power calibration method in this embodiment includes:

s102, determining a calibration type according to BOSA parameter information;

s104, determining calibration parameters according to the following objects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measured ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point;

and S106, determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

In the above embodiment, the BOSA parameter information in step S102 is inherent information in the BOSA, and the BOSA parameter information may be obtained by querying related hardware or software information of the BOSA, such as a BOSA driver chip manual, to determine the calibration type. The calibration type is used to indicate a type of a relationship between the optical power information and the ADC information, and may be a specific function type of a corresponding model in a function model between the optical power information and the ADC information, such as a quadratic function model, a cubic function model, and the like.

In the above embodiment, the ADC information in step S104 is used to indicate the output value of the electrical signal converted from the optical power value output by the APD in the BOSA, and in a specific implementation process, the ADC value corresponding to the optical power received by the BOSA measured by the GUI software correspondingly disposed in the BOSA driver chip may be directly read as the ADC information in the above embodiment. Correspondingly, the first sampling information in the above embodiments is an output value of an electrical signal converted from an optical power value output by the APD acquired at one or more sampling points.

The optical power information in step S104 is used to indicate an optical power value obtained by directly measuring the actual optical power value of the APD in the above embodiment by an optical power monitoring device, such as an optical power meter. Correspondingly, the second sampling information in the above embodiment is the actual optical power value received by the optical power monitoring device obtained at one or more sampling points.

It should be further noted that, in the above embodiments, the sampling points in the first sampling information and the second sampling information are in a one-to-one correspondence relationship.

In step S104, the calibration parameter may be a model parameter of a function model between the optical power information and the ADC information, or may be understood as a function coefficient of the function model; on the basis of obtaining the first sampling information and the second sampling information, the calibration parameters may be determined by a calculation method such as fitting. It is further noted that the calibration parameters may include aspects such as one or more locations corresponding in the functional model between the optical power information and the ADC information, and corresponding values at the locations; the specific number and location of the calibration parameters may be determined by the type of calibration in step S102.

In the above embodiment, in step S106, on the basis of determining the calibration parameter, the relationship between the optical power information and the ADC information, specifically, a function model between the optical power information and the ADC information, may be obtained, so that the BOSA received power may be calibrated.

By the BOSA received power calibration method in the embodiment, the calibration type can be determined according to the BOSA parameter information; and determining calibration parameters from: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point; thereby, the relation between the optical power information and the ADC information is determined according to the calibration parameter, and BOSA received power calibration is carried out according to the relation between the optical power information and the ADC information. Therefore, the BOSA received power calibration method in this embodiment can solve the problem of inaccurate BOSA received power calibration due to failure to comprehensively consider factors that may affect optical power information and ADC information in the BOSA received power calibration process in the related art, so as to effectively improve the accuracy of BOSA received power calibration.

Specifically, according to the BOSA received power calibration method in the above embodiment, firstly, the type of the relationship between the optical power information and the ADC information is preliminarily determined in the BOSA received power calibration process according to the BOSA parameter information, so as to specify the type of the function model between the optical power information and the ADC information corresponding to the APD in the BOSA as the calibration object; on the basis, parameters or coefficients corresponding to the function model between the optical power information and the ADC information are determined through the sampling mode of the first sampling information and the second sampling information, and therefore the accurate function model between the optical power information and the ADC information is established. The BOSA received power calibration is carried out by taking the model as a BOSA received power calibration model, so that the accuracy can be obviously improved.

On the other hand, the BOSA received power calibration method in this embodiment is not limited to a single board type corresponding to an on-board BOSA, and has better applicability.

In an optional embodiment, before determining the calibration type according to the BOSA parameter information in step S102, the method further includes:

acquiring type information of a register preset in the BOSA;

and determining BOSA parameter information according to the type information of the register.

It should be further noted that the type information of the register in the BOSA is inherent information of the BOSA, and the type information of the register can be obtained by querying related hardware or software information of the BOSA, such as a BOSA driver chip manual and the like; the type information of the register may specifically indicate the number of registers corresponding to the APD and related information such as the register type, so that the type information of the register may be directly used as BOSA parameter information to determine the BOSA parameter information.

In an alternative embodiment, in step S104, the calibration parameters are determined according to the following subjects: the calibration type, the first sampling information and the second sampling information comprise:

obtaining the fitted optical power information according to the following objects: the calibration type, the first sampling information and the second sampling information; the fitting optical power information is used for indicating optical power information obtained by fitting processing at a preset sampling point;

and determining a calibration parameter according to the fitted optical power information and the received optical power information.

It should be further noted that, in the above optional embodiment, the fitting optical power information indicates a fitting value of optical power corresponding to one or more preset sampling points in the fitting process according to the first sampling information and the second sampling information, and the fitting value may be obtained by least squares fitting. The process of fitting according to the plurality of adopted values to obtain corresponding fitting values is known to those skilled in the art, and therefore, the description thereof is omitted here.

It should be further noted that, since the fitting values obtained in the fitting process have non-uniqueness, that is, the fitting values vary within a certain range, correspondingly, the fitting curve formed by the fitting values also varies within a certain range. In this regard, in the above optional embodiment, after the fitting optical power information is obtained after fitting, the fitting optical power information may be further selected according to the received optical power information to obtain a unique calibration parameter, so as to establish a function model between the optical power information and the ADC information.

In an optional embodiment, the determining the calibration parameter according to the fitted optical power information and the received optical power information includes:

determining a calibration value, wherein the calibration value is a value of a calibration parameter under the condition that an error between fitted optical power information in a sampling point and received optical power information in a corresponding sampling point is a minimum value;

and determining calibration parameters according to the calibration type and the calibration value.

It should be further noted that, in the above alternative embodiment, the calibration value is used to indicate a specific value of the calibration parameter at a corresponding position in the function model between the optical power information and the ADC information; specifically, according to the non-uniqueness of the fitting optical power information, different fitting optical power information is adopted to obtain function models between different optical power information and ADC information so as to correspond to different calibration parameters; in the above optional implementation, the fitting optical power information corresponding to the situation that the error between the fitting optical power information and the received optical power information in the corresponding sampling point is a minimum value is adopted in the plurality of fitting optical power signals to establish a function model between the optical power information and the ADC information, and the corresponding value of the corresponding calibration parameter in the model is the calibration value.

and determining DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA.

It should be further noted that, in the above optional embodiment, the control information is used to indicate the driving voltage/current corresponding to the APD in different temperature environments, so as to drive the APD to normally operate in the corresponding temperature environments; based on this, the corresponding relationship between the temperature information and the DAC information of the APD is obtained, that is, the DAC information that can drive the APD to normally operate under different temperature information is determined. Therefore, the current working temperature of the BOSA, that is, DAC information that the APD can normally work under the working temperature information, can be further determined to drive the APD.

It should be further noted that, the DAC information of the APD corresponding to different temperature information may be referred to as a temperature lookup table of the APD; generally, in the related art, when a board corresponding to an onboard BOSA is powered on, a GUI software corresponding to a BOSA driving chip is used to burn a preset temperature lookup table of an APD. However, the material or processing technique of the PCB in the single board, and the type selection or processing technique of the BOSA device or the chip may affect the photoelectric effect of the APD; that is, single boards of different models or even single boards of the same signal have the photoelectric effect of APD, that is, the actual corresponding relationship between the temperature information and the DAC information in APD may be different.

Therefore, the APD temperature lookup table preset by the APD or single-board manufacturer or user often has a certain error, which is specifically shown in that under a certain temperature information, the DAC information corresponding to the APD temperature lookup table cannot normally drive the APD, and thus the working effect of the APD is not good, and the subsequent receive power calibration of the BOSA is also affected.

Based on this, the optional embodiment may determine the corresponding relationship between the temperature information of the APD and the DAC information again before the received power calibration of the BOSA is performed, so as to calibrate the temperature lookup table of the APD, thereby overcoming the influence of the difference between the single boards on the photoelectric effect of the APD, so that the APD can be ensured to normally operate by determining the DAC information again at the current operating temperature of the BOSA, and the accuracy of the BOSA received power calibration in the embodiment is further improved while the stability of the overall operation of the BOSA is improved.

In an optional embodiment, the obtaining the correspondence between the temperature information and the DAC information of the APD includes:

acquiring a corresponding relation between temperature information and initial DAC information of the APD; the initial DAC information of the APD is used for indicating control information for theoretically working the APD in the temperature indicated by the corresponding temperature information;

acquiring the corresponding relation between the temperature information and the actual DAC information of the APD according to the corresponding relation between the temperature information and the initial DAC information; the actual DAC information of the APD is used for indicating the APD in the temperature indicated by the corresponding temperature information and control information for actually working in the BOSA;

according to the corresponding relation between the temperature information and the DAC information, determining the DAC information corresponding to the working temperature information, wherein the DAC information comprises:

and acquiring actual DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the actual DAC information, and determining the DAC information corresponding to the working temperature information.

It should be further noted that the initial DAC information of the APD indicates DAC information corresponding to a certain temperature information in a preset APD temperature lookup table, that is, DAC information before the APD temperature lookup table is calibrated. Correspondingly, the actual DAC information of the APD is DAC information that can actually drive the APD to normally operate under a certain temperature information, i.e., DAC information in the calibrated APD temperature lookup table.

In an optional embodiment, the obtaining the corresponding relationship between the temperature information and the actual DAC information of the APD according to the corresponding relationship between the temperature information and the initial DAC information includes:

acquiring first initial DAC information and second initial DAC information of the APD corresponding to the temperature information according to the corresponding relation between the temperature information and the initial DAC information; the first initial DAC information is used for indicating DAC information of normal operation of the APD in the temperature indicated by the temperature information, and the second initial DAC information is used for indicating DAC information of critical luminescence of the APD in the temperature indicated by the temperature information;

determining a target difference value between first initial DAC information and second initial DAC information corresponding to the working temperature information according to the working voltage of the BOSA;

selecting first initial DAC information and second initial DAC information corresponding to the target temperature information, wherein the difference value between the first initial DAC information and the second initial DAC information corresponding to the target temperature information meets a target difference value;

and configuring the initial DAC information corresponding to the target temperature information into actual DAC information corresponding to the working temperature information so as to obtain the corresponding relation between the temperature information and the actual DAC information.

In an optional embodiment, the method in this embodiment further includes:

inputting test light to an external optical power measuring unit to obtain first optical power information, wherein the first optical power information is obtained by measuring the test light by the optical power measuring unit;

inputting the test light to the BOSA to acquire second optical power information, wherein the second optical power information is the optical power information of the test light output by the BOSA;

and acquiring the relation between the first optical power information and the second optical power information.

It should be further noted that the optical power measuring unit is independent of the BOSA in this embodiment, that is, the optical power measuring unit and the BOSA respectively obtain the comparison result between the first optical power information and the second optical power information for the same test light, so as to verify the accuracy of the function model established between the optical power information and the ADC information in the above embodiment.

In an optional embodiment, after obtaining the relationship between the first optical power information and the second optical power information, the method includes:

performing BOSA received power calibration according to the relation between the optical power information and the ADC information under the condition that the difference value between the first optical power information and the second optical power information is smaller than or equal to a preset error threshold value; alternatively, the first and second electrodes may be,

in a case that a difference value between the first optical power information and the second optical power information is greater than a preset error threshold, performing the following operations: acquiring a corresponding relation between the temperature information and DAC information of the APD, and determining the DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information; determining a calibration type according to the BOSA parameter information; the calibration parameters were determined from the following subjects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

It should be further noted that, in the above alternative embodiment, when the difference between the first optical power information and the second optical power information is greater than the preset error threshold, that is, the accuracy of the function model established between the optical power information and the ADC information is determined to be low, so that the calibration of the temperature lookup table of the APD may be performed again, and on the basis, the function model between the optical power information and the ADC information is re-established. By this, the accuracy of the function model between the finally established optical power information and the ADC information can be remarkably improved.

To further illustrate the calibration method of BOSA received power in this embodiment, the following further illustrates the calibration method by way of specific embodiments.

DETAILED DESCRIPTION OF EMBODIMENT (S) OF INVENTION

In this embodiment, a 10G PON board is used to calibrate the BOSA received power, and fig. 2 is a schematic structural diagram of a board according to an embodiment of the present invention, where the structure of the board carrying the BOSA is shown in fig. 2. Fig. 3 is a flowchart of performing BOSA received power calibration according to an embodiment of the present invention, where the flowchart of performing BOSA received power calibration by the single board is shown in fig. 3.

S1, the single board is electrified to run and load the version file, the version kernel configures the luminous command and code pattern through the serial port tool, through the USB to IIC interface module, the GUI software of the BOSA driving chip at the PC end writes a plurality of lookup tables for the single board, specifically: the device comprises a lookup table containing information such as SFF-8472 protocol diagnosis, lookup table selection, passwords and the like, a lookup table containing information such as memory space, alarm setting and the like which can be written by a user of the SFF-8472 protocol, an initial APD temperature lookup table and a lookup table containing register setting information.

S2, a calibration process is performed for the initial APD temperature lookup table in S1 described above for differences between singles. The specific method is to determine, through BOSA driver chip GUI software, an APD _ DAC value (i.e., an initial DAC value in the above embodiment) when the APD is critically illuminated at the current operating temperature of the single board, and re-determine, through a temperature compensation method, a corresponding relationship between the temperature in the APD temperature lookup table and the APD _ DAC value, so that the APD _ DAC value corresponding to the current operating temperature environment in the APD temperature lookup table is the APD _ DAC value enabling the APD to normally operate.

The process of adjusting the corresponding relationship between the temperature in the APD temperature lookup table and the APD _ DAC value in step S2 is as follows.

Fig. 4 is a schematic circuit diagram of a boost chip in an on-board BOSA according to an embodiment of the present invention, and a circuit structure of the boost chip in the on-board BOSA is shown in fig. 4. In the boost circuit shown in fig. 4, the APD operating voltage of onboard BOSA in a single board is determined to be Vbr-3V, and thus, according to the reference circuit of the boost chip and a manual, it can be known that:

in the above formula 12, APD _ BIAS is the APD working voltage, APD _ BIAS1 is specifically an ideal value of the working voltage, and APD _ BIAS2 is specifically a critical value of the working voltage. From this equation 12 above, it can be further determined:

the APD _ DAC1 in the above formula 13 is a value of the APD critical lighting state of the BOSA, that is, corresponds to the second initial DAC information in the above embodiment; APD _ DAC2 is a value of BOSA where APD normally operates, that is, corresponds to the first initial DAC information in the above embodiment; r1 and R2 are resistance values in the booster circuit shown in fig. 4. In the calibration process of the APD temperature lookup table, the APD _ DAC1 and the APD _ DAC2 satisfy the relationship of the formula (13) by offsetting the temperature value in the APD temperature lookup table, so that the calibration of the APD temperature lookup table can be realized.

And the S3, 10G OLT module is connected to the single board by a single-mode optical fiber tandem connection variable optical attenuator, and the variable optical attenuator is used for reading ADC values (x) of BOSA received optical power at a plurality of sampling points on GUI software of a BOSA driving chip in a bearable range of a BOSA tube of the single board₁,x₂,…,x_m) As the above-mentioned embodimentSecond sampling information in the example, and reading an optical power meter indication (t) in dBm of a plurality of sampling points₁,t₂,...,t_m) And converted to an indication of uW (y)₁,y₂,...,y_m) As the first sampling information in the above embodiment; the above index conversion process is as follows:

y＝10^0.1tmW＝10^0.1t*1000uW (15)

the corresponding ADC value and optical power value are expressed as (x)_i,y_i) (i ═ 0,1,. and, m), where m is the number of sampling points.

Further, as can be known from the BOSA driver chip manual, the receiving register corresponding to the onboard BOSA has three parameters Rx _ PWR (Slope C2), Rx _ PWR (Slope C1) and Rx _ PWR (Offset C0), that is, BOSA parameter information in the above embodiment, so that the function model between the ADC value and the optical power value can be determined as the following second-order receiving calibration model, and the type of the function model is the calibration type in the above embodiment:

coefficient a in the second-order reception calibration model₀,a₁,a₂I.e. the calibration parameters in the above embodiments; on the basis of the second-order receiving calibration model, calculating a corresponding coefficient by adopting a least square fitting method according to the first sampling information and the second sampling information; in the fitting process, the selected termination fitting condition is that the sum of squared errors of the fitting value and the measured value is minimum, namely:

then there are:

the above formula 17 is a₀，a₁，a₂The multivariate function of (a) is required to further find I ═ I (a)₀，a₁，a₂) Is measured.

Namely:

the above formula 19 is a₀，a₁，a₂A system of linear equations of (c).

List calculation

And

the following set of equations is listed according to the above list:

thereby obtaining the curve parameter a corresponding to the second-order receiving calibration model₀,a₁,a₂And establishing a unique second-order BOSA optical power receiving calibration model according to the parameters:

and S4, further processing the curve parameters of the second-order BOSA optical power receiving calibration model. In order to meet the requirement that an EEPROM register externally hung on a BOSA driving chip can identify the parameters of the receiving model, all the parameters need to be converted into a format which can be read by the register; specifically, right shifting the quadratic term coefficients by 29 bits or 30 bits depends on bit1 of the A2 table lookup table 0xC1 register, and the Offset C0 is in a two's complement manner:

RxPower_{Slope_C2}＝a₂/0.1/2²⁹or RxPower_{Slope_C2}＝a₂/0.1/2³⁰ (21)

RxPower_{Slope_C1}＝a₁/0.1/2¹³ (22)

And receiving the register name, address and range corresponding to the coefficient of the calibration model.

After the calibration parameters are written into the EEPROM, the accuracy of the second-order BOSA optical power receiving calibration model can be verified, specifically, the optical power value of the test light and the optical power value of the PC-side BOSA driver chip software are read and compared by adjusting the optical attenuator, and if the optical power value exceeds the error allowable range, the steps of S2 and S3 are returned and executed again.

Through the above description of the embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.

Example 2

Fig. 5 is a flowchart (ii) of a BOSA received power calibration method according to an embodiment of the present invention, and as shown in fig. 5, the BOSA received power calibration method in this embodiment includes:

s202, acquiring a corresponding relation between the temperature information and DAC information of the APD, wherein the DAC information of the APD is used for indicating control information of the APD working in the temperature indicated by the corresponding temperature information;

s204, determining DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA;

and S206, determining the relation between the optical power information and the ADC information according to the DAC information corresponding to the working temperature information, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

In an optional embodiment, in step S202, the obtaining the corresponding relationship between the temperature information and the DAC information of the APD includes:

It should be further noted that the initial DAC information of the APD indicates DAC information corresponding to a certain temperature information in a preset APD temperature lookup table, that is, DAC information before the APD temperature lookup table is calibrated. Correspondingly, the actual DAC information of the APD is the DAC information that can actually drive the APD to normally operate under a certain temperature information, that is, the DAC information in the calibrated APD temperature lookup table

In an optional embodiment, the method in this embodiment further includes:

and under the condition that the difference value of the first optical power information and the second optical power information is larger than a preset error threshold value, executing the operation of acquiring the corresponding relation between the temperature information and the DAC information of the APD, and determining the DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the DAC information.

It should be further noted that, in the above alternative embodiment, in the case that the difference between the first optical power information and the second optical power information is greater than the preset error threshold, that is, the accuracy of the function model established between the optical power information and the ADC information is determined to be low, so that the calibration of the temperature lookup table of the APD may be performed again. By this, the accuracy of the function model between the finally established optical power information and the ADC information can be remarkably improved.

Example 3

The present embodiment provides a BOSA received power calibration apparatus, which is used to implement the foregoing embodiments and preferred embodiments, and the description of the apparatus is omitted here. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated. Fig. 6 is a block diagram (a) of a BOSA received power calibration apparatus according to an embodiment of the present invention, and as shown in fig. 6, the BOSA received power calibration apparatus in the embodiment includes:

a first determining module 302, configured to determine a calibration type according to BOSA parameter information;

a second determination module 304 for determining the calibration parameters according to the following: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measured ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point;

the first calibration module 306 is configured to determine a relationship between the optical power information and the ADC information according to the calibration parameter, and perform BOSA received power calibration according to the relationship between the optical power information and the ADC information.

The remaining optional embodiments and technical effects of the BOSA received power calibration apparatus in this embodiment correspond to those of the BOSA received power calibration method in embodiment 1, and therefore are not described herein again.

In an optional embodiment, before determining the calibration type according to the BOSA parameter information, the method further includes:

acquiring type information of a register preset in the BOSA;

In an alternative embodiment, the calibration parameters are determined according to the following: the calibration type, the first sampling information and the second sampling information comprise:

In an optional embodiment, the calibrating information according to the preset avalanche photodiode APD includes:

In an optional embodiment, the apparatus is further configured to:

It should be noted that, the above modules may be implemented by software or hardware, and for the latter, the following may be implemented, but not limited to: the modules are all positioned in the same processor; alternatively, the modules are respectively located in different processors in any combination.

Example 4

The present embodiment provides a BOSA received power calibration apparatus, which is used to implement the foregoing embodiments and preferred embodiments, and the description of the apparatus is omitted here. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated. Fig. 7 is a block diagram (ii) of a BOSA received power calibration apparatus according to an embodiment of the present invention, and as shown in fig. 7, the BOSA received power calibration apparatus in the embodiment includes:

an obtaining module 402, configured to obtain a corresponding relationship between temperature information and DAC information of the APD, where the DAC information of the APD is used to indicate control information that the APD operates at a temperature indicated by the corresponding temperature information;

a corresponding module 404, configured to determine, according to a corresponding relationship between the temperature information and the DAC information, DAC information corresponding to the operating temperature information, where the operating temperature information is used to indicate an operating temperature of the BOSA;

and the second calibration module 406 is configured to determine a relationship between the optical power information and the ADC information according to the DAC information corresponding to the operating temperature information, and perform BOSA received power calibration according to the relationship between the optical power information and the ADC information.

The remaining optional embodiments and technical effects of the BOSA received power calibration apparatus in this embodiment correspond to those of the BOSA received power calibration method in embodiment 2, and therefore are not described herein again.

In an optional embodiment, the apparatus is further configured to:

Example 5

Embodiments of the present invention also provide a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to perform the steps of any of the above-mentioned method embodiments when executed.

Alternatively, in this embodiment, the computer-readable storage medium may be configured to store a computer program for executing the method steps recited in the above embodiments:

optionally, in this embodiment, the computer-readable storage medium may include, but is not limited to: various media capable of storing computer programs, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.

Example 6

Embodiments of the present invention also provide an electronic device comprising a memory having a computer program stored therein and a processor arranged to run the computer program to perform the steps of any of the above method embodiments.

Optionally, the electronic apparatus may further include a transmission device and an input/output device, wherein the transmission device is connected to the processor, and the input/output device is connected to the processor.

Alternatively, in this embodiment, the processor may be configured to execute the method steps recited in the above embodiments through a computer program.

Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments and optional implementation manners, and this embodiment is not described herein again.

It will be apparent to those skilled in the art that the modules or steps of the present invention described above may be implemented by a general purpose computing device, they may be centralized on a single computing device or distributed across a network of multiple computing devices, and alternatively, they may be implemented by program code executable by a computing device, such that they may be stored in a storage device and executed by a computing device, and in some cases, the steps shown or described may be performed in an order different than that described herein, or they may be separately fabricated into individual integrated circuit modules, or multiple ones of them may be fabricated into a single integrated circuit module. Thus, the present invention is not limited to any specific combination of hardware and software.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A BOSA received power calibration method for a bidirectional optical subsystem is characterized by comprising the following steps:

determining a calibration type according to the BOSA parameter information;

and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA receiving power of the bidirectional optical subsystem according to the relation between the optical power information and the ADC information.

2. The method of claim 1, wherein prior to determining the calibration type based on BOSA parameter information, further comprising:

acquiring type information of a register preset in the BOSA;

and determining the BOSA parameter information according to the type information of the register.

3. The method of claim 1, wherein the calibration parameters are determined from: the calibration type, the first sampling information and the second sampling information comprise:

obtaining the fitted optical power information according to the following objects: the calibration type, the first sampling information and the second sampling information; the fitting optical power information is used for indicating optical power information obtained by fitting processing at the preset sampling point;

and determining the calibration parameter according to the fitting optical power information and the received optical power information.

4. The method of claim 3, wherein determining the calibration parameter based on the fit optical power information and the received optical power information comprises:

determining a calibration value, wherein the calibration value is a value of the calibration parameter when an error between the fitted optical power information in the sampling point and the received optical power information in the corresponding sampling point is a minimum value;

and determining the calibration parameters according to the calibration type and the calibration value.

5. The method of claim 1, wherein prior to determining the calibration type based on BOSA parameter information, comprising:

and determining DAC information corresponding to working temperature information according to the corresponding relation between the temperature information and the DAC information, wherein the working temperature information is used for indicating the working temperature of the BOSA.

6. The method of claim 5, wherein obtaining the correspondence between the temperature information and the DAC information for the APD comprises:

acquiring a corresponding relation between the temperature information and initial DAC information of the APD; wherein the initial DAC information of the APD is used for indicating control information that the APD theoretically works in the temperature indicated by the corresponding temperature information;

acquiring the corresponding relation between the temperature information and the actual DAC information of the APD according to the corresponding relation between the temperature information and the initial DAC information; the actual DAC information of the APD is used for indicating the control information of actual operation of the APD in the temperature indicated by the corresponding temperature information in BOSA;

the determining, according to the correspondence between the temperature information and the DAC information, DAC information corresponding to operating temperature information includes:

and acquiring the actual DAC information corresponding to the working temperature information according to the corresponding relation between the temperature information and the actual DAC information, and determining the DAC information corresponding to the working temperature information.

7. The method of claim 6, wherein obtaining the correspondence between the temperature information and actual DAC information for the APD based on the correspondence between the temperature information and the initial DAC information comprises:

acquiring first initial DAC information and second initial DAC information of the APD corresponding to the temperature information according to the corresponding relation between the temperature information and the initial DAC information; wherein the first initial DAC information is used for indicating DAC information of the APD which normally works in the temperature indicated by the temperature information, and the second initial DAC information is used for indicating DAC information of the APD which critically emits light in the temperature indicated by the temperature information;

determining a target difference value between the first initial DAC information and the second initial DAC information corresponding to the working temperature information according to the working voltage of the BOSA;

selecting the first initial DAC information and the second initial DAC information corresponding to target temperature information, wherein the difference value between the first initial DAC information and the second initial DAC information corresponding to the target temperature information meets the target difference value;

and configuring the initial DAC information corresponding to the target temperature information as the actual DAC information corresponding to the working temperature information so as to obtain the corresponding relation between the temperature information and the actual DAC information.

8. The method according to any one of claims 5 to 8, further comprising:

inputting the test light to the BOSA to obtain second optical power information, wherein the second optical power information is optical power information of the test light output by the BOSA;

9. The method of claim 8, wherein obtaining the relationship between the first optical power information and the second optical power information comprises:

performing BOSA received power calibration according to the relationship between the optical power information and the ADC information under the condition that the difference value between the first optical power information and the second optical power information is smaller than or equal to a preset error threshold value; alternatively, the first and second electrodes may be,

in a case that a difference value between the first optical power information and the second optical power information is greater than a preset error threshold, performing the following operations:

the corresponding relation between the temperature information and the DAC information of the APD is obtained, and the DAC information corresponding to the working temperature information is determined according to the corresponding relation between the temperature information and the DAC information;

determining a calibration type according to the BOSA parameter information; the calibration parameters were determined from the following subjects: the calibration type, the first sampling information and the second sampling information; the first sampling information is used for indicating measurement ADC information measured in a preset sampling point, and the second sampling information is used for indicating received optical power information corresponding to the preset sampling point; and determining the relation between the optical power information and the ADC information according to the calibration parameters, and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

10. A BOSA received power calibration method is characterized by comprising the following steps:

11. The method of claim 10, wherein obtaining the correspondence between the temperature information and the DAC information for the APD comprises:

12. The method of claim 11, wherein obtaining the correspondence between the temperature information and actual DAC information for the APD based on the correspondence between the temperature information and the initial DAC information comprises:

13. The method according to any one of claims 10 to 11, further comprising:

14. The method of claim 13, wherein obtaining the relationship between the first optical power information and the second optical power information comprises:

15. A BOSA received power calibration apparatus, comprising:

and the first calibration module is used for determining the relation between the optical power information and the ADC information according to the calibration parameter and calibrating the BOSA received power according to the relation between the optical power information and the ADC information.

16. A BOSA received power calibration apparatus, comprising:

17. A computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to perform the method of any one of claims 1 to 9 and 10 to 14 when the computer program is executed.

18. An electronic device comprising a memory and a processor, wherein the memory has stored therein a computer program, and the processor is configured to execute the computer program to perform the method of any one of claims 1 to 9 and 10 to 14.